JPH0444243A - Test substrate control system of bar-in testing device - Google Patents

Abstract

PURPOSE:To enable abnormality due to voltage noise, that of wiring resistance, that due to leak current, and that due to high temperature to be confirmed by providing a device for recognizing an individual BT substrate at a bar-in testing device and a monitor device and by providing a bar code for displaying the BT substrate individually at the BT substrate. CONSTITUTION:A recognition device detects a bar code which is provided at a BT substrate when inserting the BT substrate into bar-in testing device and the data is transferred to a monitor device. Then, when characteristics of an IC deteriorate rapidly and the IC is damaged due to abnormality in voltage noise which is produced on the BT substrate, abnormality of wiring resistance, abnormality due to leak current, and abnormality due to high temperature, a detection device of the bar-in testing device detects BT input abnormality and transfers its detection signal to a monitor device, thus enabling the BT substrate where the BT input abnormality occurred to be recognized and the number of BT input abnormalities to be counted. A BT substrate where abnormalities tend to occur easily can be found by collecting data obtained by counting the number of BT input abnormalities and by performing its statistical analysis.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a burn-in test device, and more particularly to a system for individually managing abnormalities in test boards (hereinafter referred to as BT boards) used in the burn-in test device.

[Conventional technology]

A burn-in test device is a device that applies high temperature and high voltage to a semiconductor integrated circuit (hereinafter referred to as an IC) for a long period of time, thereby applying stress to the IC and accelerating the deterioration of the characteristics of the IC.
The board into which an IC is inserted and placed in the burn-in test equipment is a BT board. Conventionally, this BT board has been managed by an operator periodically checking the BT board visually or using a jig to check for short circuits or damage to the BT board.

Furthermore, in a burn-in test device, if an IC is destroyed due to temperature or voltage stress during a burn-in test and an abnormal current flows through the IC, the IC socket and BT board may be destroyed. As a countermeasure technology, the burn-in test equipment detects the voltage level of the input signal and input power supply applied to the IC, and if an abnormality is detected in the voltage level, it is displayed on the monitor lamp of the burn-in test equipment and the BT that has the abnormality is displayed. There is a function to turn off the power of the board, and the abnormal phenomenon can be prevented by BT.
This is called an input error.

[Problem to be solved by the invention]

In the conventional BT board management described above, the operator regularly checks the BT board.
By visually checking the board or checking using a jig, B
Since we were only able to confirm simple defects such as short circuits and damage to the T board, it was extremely difficult to confirm abnormalities caused by voltage noise occurring on the BT board, abnormalities in wiring resistance, abnormalities due to leakage current, abnormalities due to high temperature, etc. There was a drawback.

[Differences between the invention and the prior art]

In contrast to the conventional BT board management described above, the present invention includes a burn-in test device that includes a device and a monitor device for recognizing individual BT boards, and a bar code for displaying each BT board individually on the BT board. The difference is that it is possible to confirm abnormalities caused by voltage noise of the BT board, abnormalities in wiring resistance, abnormalities caused by leakage current, etc., which were difficult to confirm in the past.

[Means for solving the problem] The BT board management system of the burn-in test device of the present invention includes the following:
It has a function and a monitor device for making the burn-in test device recognize the individual BT boards, and has a bar code on the BT board for individually displaying the BT boards.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a side view of one embodiment of the burn-in test device. 1 is a BT substrate, 2 is a burn-in test equipment furnace, and 3 is a recognition device for recognizing individual BT substrates, which is provided for each groove into which a BT substrate is inserted.

4 is a monitor device which has a built-in computer and is connected to each recognition device. Reference numeral 5 denotes a BT input abnormality detection device, which is provided for each zone corresponding to the BT board of the burn-in test device in a one-to-one relationship, and each BT input abnormality detection device is connected to a monitor device.

FIG. 2 is a top view of one embodiment of the BT board, and 1 is a top view of an embodiment of the BT board.
The board 6 is a barcode, and each BT board is provided with a different barcode.

Next, we will explain its operation.

When the BT board is inserted into the burn-in test equipment, a recognition device detects the barcode provided on the BT board, and the data is transferred to the monitor device. Next, if the characteristics of the IC suddenly deteriorate due to abnormalities caused by voltage noise generated on the BT board, abnormalities in wiring resistance, abnormalities due to leakage current, or abnormalities due to high temperature, the burn-in test equipment will be used. The abnormality detection device detects a BT input abnormality and sends the pressure detection signal to the monitor device, so that the monitor device can
It is possible to recognize the BT board on which the BT input abnormality has occurred and count the number of times the BT input abnormality has occurred. By collecting and statisticizing the data that counts the number of occurrences of the BT input abnormality, it is possible to find BT boards that are prone to abnormalities, and thus the voltage noise of the BT board, which has been difficult to confirm in the past, can be confirmed.

It becomes possible to check abnormal T substrates with wiring resistance, II flow leakage, and temperature dependence. In addition, in the above embodiment, a barcode was provided for each BT board and displayed individually, but as a substitute for the barcode, it is possible to provide the same function as described above by providing a magnetic tape or the like and displaying it individually. becomes.

FIG. 3 is a side view of another embodiment of the burn-in test device connected to a recognition device and a monitor device.

2 to 5 are the same as the embodiment shown in FIG. In the embodiment shown in FIG. 1, the recognition device was provided in the burn-in test equipment furnace, but in this embodiment, the recognition device is separate from the burn-in test equipment, and before inserting the BT board into the burn-in test equipment, Alternatively, after the BT board is discharged, the operator causes the recognition device to detect the barcode of the BT board and recognizes the individual BT board. The rest is exactly the same as the above embodiment. In this second embodiment, since the recognition device is located outside the burn-in test equipment furnace, there is an advantage that even a recognition device with poor heat resistance can be used.

〔Effect of the invention〕

As explained above, the present invention includes a burn-in test device equipped with a function and a monitor device for recognizing individual BT boards, and a bar code for displaying individual BT boards on the BT boards. This has the effect of being able to confirm abnormalities caused by voltage noise on the BT board, abnormalities in wiring resistance, abnormalities due to current leaks, abnormalities due to temperature changes, etc., which have been difficult to recognize in the past.

[Brief explanation of drawings]

1 and 3 are side views of a burn-in test apparatus according to an embodiment of the present invention, respectively. FIG. 2 is a top view of the BT substrate. 1...BT board, 2...Burn-in test equipment furnace, 3...Recognition device, 4...Monitor device, 5...BT Input abnormality detection device, 6...
····barcode. Agent Patent Attorney Susumu Uchihara

Claims (1)

[Claims] By applying high temperature and high voltage to semiconductor integrated circuits,
When the burn-in test device having the function of accelerating characteristic deterioration of the semiconductor integrated circuit is used to manage the test substrates to be loaded into the burn-in test device with the semiconductor integrated circuit mounted thereon, the burn-in test device recognizes individual test substrates. 1. A test board management system for a burn-in test equipment, comprising: a test board management system for a burn-in test equipment, comprising: a test board management system for a burn-in test equipment;