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JPH0498848A - Wafer replacing machine - Google Patents

Wafer replacing machine

Info

Publication number
JPH0498848A
JPH0498848A JP21609290A JP21609290A JPH0498848A JP H0498848 A JPH0498848 A JP H0498848A JP 21609290 A JP21609290 A JP 21609290A JP 21609290 A JP21609290 A JP 21609290A JP H0498848 A JPH0498848 A JP H0498848A
Authority
JP
Japan
Prior art keywords
wafers
wafer
carrier
dummy
product
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21609290A
Other languages
Japanese (ja)
Inventor
Toshihide Kudo
工藤 敏秀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP21609290A priority Critical patent/JPH0498848A/en
Publication of JPH0498848A publication Critical patent/JPH0498848A/en
Pending legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To eliminate the need to perform a replacing work of wafers by men and to reduce the man-hour by a method wherein a wafer transfer robot for transferring mixedly or separately the wafers to a dummy wafer carrier and a product wafer carrier or from a mixing carrier to the dummy and product wafer carriers is driven while being controlled. CONSTITUTION:Product wafers and dummy wafers are respectively transferred from a product wafer carrier 1 and a dummy wafer carrier 2 to a mixing carrier 3 by a wafer transfer robot 4 and the replacement of the wafers is performed. At this case, a replacement pattern is previously stored in a storage part. The robot 4 is driven while being controlled on the basis of a signal from this storage part and replace the wafers according to the replacement pattern. Then, in the separation replacement of the dummy wafers, the wafers are transferred from the carrier 3 to a dummy wafer discrimination part 5 by the robot 4 and here, the dummy wafers are discriminated by a sensor 6 and in the case of the product wafers or in the case of the dummy wafers, the product wafers or the dummy wafers are transferred to the carrier 1 or the carrier 2 by the robot 4 and the replacement of the wafers is performed. Thereby, the need that operators perform the replacing work of the wafers is eliminated and the man-hour can be sharply reduced.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はウェーハ立替機に関し、特にダミーウェーハと
製品ウェーハとの混合立替及び分離立替を行なうウェー
ハ立替機に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wafer advance machine, and more particularly to a wafer advance machine that performs mixed advance and separate advance of dummy wafers and product wafers.

〔従来の技術〕[Conventional technology]

従来、ウェーハの熱処理等を行なう際はバッチ処理で行
なっており、1バッチ当りの製品ウェーへの枚数が足り
ない場合は、この足りない分をダミーウェーハで補うこ
とが行なわれている。この製品ウェーハとダミーウェー
ハの混合および分離をウェーハ立替機により行なおうと
すると、従来のウェーハ立替機では、キャリアからキャ
リアへとウェーハを移し替える機能しか有していないた
め、ダミーウェーハと製品ウェーハとをキャリアの任意
の位置に混合させて立替えることはできなかった。また
ダミーウェーハの識別機能も設けられていなかったので
、混合キャリアからダミーウェーハと製品ウェーハとを
分離して立替えることもできなかった。従って、この様
な混合及び分離のウェーハ立替え作業は1人間がピンセ
ット等を用いて行っていた。
Conventionally, wafer heat treatment and the like have been carried out in batch processing, and if the number of product wafers per batch is insufficient, this shortage is compensated for by using dummy wafers. When trying to mix and separate product wafers and dummy wafers using a wafer transfer machine, conventional wafer transfer machines only have the function of transferring wafers from one carrier to another, so dummy wafers and product wafers cannot be mixed and separated. It was not possible to mix and replace it at any position in the carrier. Furthermore, since a dummy wafer identification function was not provided, it was not possible to separate the dummy wafers and product wafers from the mixed carrier and replace them. Therefore, such wafer preparation work for mixing and separation was performed by one person using tweezers or the like.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来のウェーハ立替機では、ダミーウェーハと製品ウェ
ーハとを混合及び分離する立替えを行う機能を備えてい
ないため、人間が立替え作業を行なわなければならず、
多大な工数が必要であった。また、立替え作業に伴う製
品ウェーハへのごみの付着や、ウェーハ同志の接触によ
る傷の発生等があり、歩留りの低下要因となっていると
いう問題があった。
Conventional wafer advance machines do not have the function of mixing and separating dummy wafers and product wafers, so humans must perform the advance work.
This required a large amount of man-hours. Further, there are problems in that dust adheres to the product wafers during the preparation work and scratches occur due to contact between the wafers, which causes a decrease in yield.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のウェーハ立替機は、ダミーウェーハキャリア及
び製品ウェーハキャリアから混合キャリアへ、または混
合キャリアからダミーウェーハキャリア及び製品ウェー
ハキャリアへとウェーハを混合または分離搬送するため
のウェーハ搬送ロボットと、ウェーハを混合搬送する前
記混合キャリアへのウェーハの立替え順番を記憶させる
ための立替えパターン記憶部と、前記混合キャリアから
ウェーハを分離搬送する際ダミーウェーハと製品ウェー
ハとを識別するためのセンサーを備えたダミーウェーハ
識別部と、前記立替えパターン記憶部及びダミーウェー
ハ識別部からの信号に基づいてウェーハ搬送ロボットを
駆動制御する制御部とを有している。
The wafer transfer machine of the present invention mixes wafers with a wafer transfer robot for mixing or separating wafers from a dummy wafer carrier and a product wafer carrier to a mixing carrier, or from a mixing carrier to a dummy wafer carrier and a product wafer carrier. a dummy comprising a replenishment pattern storage unit for storing the order of replenishment of wafers to the mixed carrier to be transported; and a sensor for identifying dummy wafers and product wafers when separating and transporting wafers from the mixed carrier; The wafer identification unit includes a wafer identification unit, and a control unit that drives and controls a wafer transfer robot based on signals from the replacement pattern storage unit and the dummy wafer identification unit.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例の平面図、第2図はダミーウ
ェーハと製品ウェーハとの混合立替えパターンの一例を
示す図表で、混合キャリア3の1〜25の収納位置に製
品ウェーハ(○印)及びダミーウェーハ(×印)を立替
えるパターンを示している。
FIG. 1 is a plan view of an embodiment of the present invention, and FIG. 2 is a chart showing an example of a mixing and reloading pattern of dummy wafers and product wafers. The pattern for replacing dummy wafers (marked with ○) and dummy wafers (marked with x) is shown.

まず、ダミーウェーハと製品ウェーハの混合立替えでは
、第2図の立替えパターンに従い、第1図示す製品ウェ
ーハキャリア1とダミーウェーハキャリア2とから混合
キャリア3へ、製品ウェーハとダミーウェーハをそれぞ
れウェーハ搬送ロボ・ソト4により搬送し、立替えを行
う。この際、立替えパターンはあらかじめ記憶部に記憶
させておき、ウェーハ搬送ロボット4はこの記憶部がら
の信号に基づき制御部に駆動制御され、ウェーハを立替
えパターンに従って立替えて行く。
First, in the mixed advance of dummy wafers and product wafers, according to the advance pattern of FIG. 2, product wafers and dummy wafers are transferred from product wafer carrier 1 and dummy wafer carrier 2 shown in FIG. 1 to mixed carrier 3, respectively. Transported by transport robot Soto 4 and paid for. At this time, the transfer pattern is stored in advance in the storage section, and the wafer transfer robot 4 is driven and controlled by the control section based on signals from the storage section, and transfers the wafers according to the transfer pattern.

次に、ダミーウェーハの分離立替えでは、混合キャリア
3からダミーウェーハ識別部5ヘウエーハを搬送ロボッ
ト4により搬送し、ここでセンサー6によりダミーウェ
ーハを識別し、製品ウェーハの場合は製品ウェーハキャ
リア1へ、ダミーウェーハの場合はダミーウェーハキャ
リア2へとそれぞれ搬送ロボット4により搬送し立替え
を行う。なお、ダミーウェーハと製品ウェーハを識別す
る為の差違としては、ダミーウェーハにオリエンテーシ
ョンフラットの無いウェーハを用いる、裏面にマーキン
グを施したウェーハを用いる、等の方法が挙げられる。
Next, in the separation and preparation of the dummy wafer, the wafer is transferred from the mixed carrier 3 to the dummy wafer identification unit 5 by the transfer robot 4, where the dummy wafer is identified by the sensor 6, and if it is a product wafer, it is transferred to the product wafer carrier 1. In the case of dummy wafers, the wafers are transported to the dummy wafer carrier 2 by the transport robot 4, and the dummy wafers are transferred in advance. Note that methods for distinguishing between dummy wafers and product wafers include using a wafer without an orientation flat as the dummy wafer, using a wafer with markings on the back surface, and the like.

なお、第2図に示したような製品ウェーハとダミーウェ
ーハとを立替えるパターンは任意に設定ができる。
Note that the pattern for replacing product wafers and dummy wafers as shown in FIG. 2 can be set arbitrarily.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、ダミーウェーハと製品ウ
ェーハとの混合及び分離立替えを自動的に行うので、作
業者は立替え作業を行う必要がなくなり、工数を大幅に
低減できる。また、立替え作業に伴なう製品ウェーハへ
のごみの付着や、ウェーハ同志の接触による傷の発生等
を防止することができ、歩留りを向上させることができ
るという効果を有する。
As described above, the present invention automatically mixes and separates dummy wafers and product wafers, and therefore does not require the operator to carry out preparation work, which can significantly reduce the number of man-hours. In addition, it is possible to prevent dust from adhering to product wafers and damage caused by contact between wafers due to the preparation work, and it is possible to improve the yield.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の平面図、第2図は混合立替
えの場合の立替えパターンの一例を示す図表である。 1・・・製品ウェーハキャリア、2・・・ダミーウェー
ハキャリア、3・・・混合キャリア、4・・・ウェーハ
搬送ロボット、5・・・ダミーウェーへ識別部、6・・
・センサー
FIG. 1 is a plan view of an embodiment of the present invention, and FIG. 2 is a chart showing an example of a prepayment pattern in the case of mixed prepayment. DESCRIPTION OF SYMBOLS 1...Product wafer carrier, 2...Dummy wafer carrier, 3...Mixing carrier, 4...Wafer transfer robot, 5...Dummy wafer identification unit, 6...
·sensor

Claims (1)

【特許請求の範囲】 1、ダミーウェーハキャリア及び製品ウェーハキャリア
へ、または混合キャリアからダミーウェーハキャリア及
び製品ウェーハキャリアへとウェーハを混合または分離
搬送するためのウェーハ搬送ロボットと、このウェーハ
搬送ロボットを駆動制御する制御部とを有することを特
徴とするウェーハ立替機。 2、ダミーウェーハキャリア及び製品ウェーハキャリア
から混合キャリアへとウェーハを混合搬送する際、混合
キャリアへの立替え順番を記憶させるための立替えパタ
ーン記憶部を有する請求項1記載のウェーハ立替機。 3、混合キャリアからダミーウェーハキャリア及び製品
ウェーハキャリアへとウェーハを分離搬送する際、ダミ
ーウェーハと製品ウェーハとを識別するためのセンサー
を備えたダミーウェーハ識別部を有する請求項1記載の
ウェーハ立替機。 4、制御部は立替えパターン記憶部及びダミーウェーハ
識別部からの信号に基づいてウェーハ搬送ロボットの駆
動制御を行なう請求項1記載のウェーハ立替機。
[Claims] 1. A wafer transfer robot for mixing or separating and transferring wafers to a dummy wafer carrier and a product wafer carrier, or from a mixed carrier to a dummy wafer carrier and a product wafer carrier, and driving this wafer transfer robot. A wafer advance machine, comprising: a control section for controlling the wafer. 2. The wafer tipping machine according to claim 1, further comprising a tipping pattern storage section for storing the tipping order to the mixed carrier when wafers are mixed and transported from the dummy wafer carrier and the product wafer carrier to the mixed carrier. 3. The wafer advance machine according to claim 1, further comprising a dummy wafer identification section equipped with a sensor for identifying dummy wafers and product wafers when the wafers are separated and transported from the mixed carrier to the dummy wafer carrier and the product wafer carrier. . 4. The wafer transfer machine according to claim 1, wherein the control section controls the drive of the wafer transfer robot based on signals from the transfer pattern storage section and the dummy wafer identification section.
JP21609290A 1990-08-16 1990-08-16 Wafer replacing machine Pending JPH0498848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21609290A JPH0498848A (en) 1990-08-16 1990-08-16 Wafer replacing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21609290A JPH0498848A (en) 1990-08-16 1990-08-16 Wafer replacing machine

Publications (1)

Publication Number Publication Date
JPH0498848A true JPH0498848A (en) 1992-03-31

Family

ID=16683125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21609290A Pending JPH0498848A (en) 1990-08-16 1990-08-16 Wafer replacing machine

Country Status (1)

Country Link
JP (1) JPH0498848A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5818139A (en) * 1994-07-25 1998-10-06 Daikin Industries, Ltd. Brushless DC motor
US6450750B1 (en) 1997-07-28 2002-09-17 Applied Materials, Inc. Multiple loadlock system
US7105463B2 (en) 2000-09-15 2006-09-12 Applied Materials, Inc. Load lock chamber having two dual slot regions
US7207766B2 (en) 2003-10-20 2007-04-24 Applied Materials, Inc. Load lock chamber for large area substrate processing system
US7316966B2 (en) 2001-09-21 2008-01-08 Applied Materials, Inc. Method for transferring substrates in a load lock chamber
US7497414B2 (en) 2004-06-14 2009-03-03 Applied Materials, Inc. Curved slit valve door with flexible coupling

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5818139A (en) * 1994-07-25 1998-10-06 Daikin Industries, Ltd. Brushless DC motor
US6450750B1 (en) 1997-07-28 2002-09-17 Applied Materials, Inc. Multiple loadlock system
US7105463B2 (en) 2000-09-15 2006-09-12 Applied Materials, Inc. Load lock chamber having two dual slot regions
US7316966B2 (en) 2001-09-21 2008-01-08 Applied Materials, Inc. Method for transferring substrates in a load lock chamber
US7207766B2 (en) 2003-10-20 2007-04-24 Applied Materials, Inc. Load lock chamber for large area substrate processing system
US7497414B2 (en) 2004-06-14 2009-03-03 Applied Materials, Inc. Curved slit valve door with flexible coupling

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