JPH01205428A - Vapor phase epitaxial growth equipment - Google Patents
Vapor phase epitaxial growth equipmentInfo
- Publication number
- JPH01205428A JPH01205428A JP2925688A JP2925688A JPH01205428A JP H01205428 A JPH01205428 A JP H01205428A JP 2925688 A JP2925688 A JP 2925688A JP 2925688 A JP2925688 A JP 2925688A JP H01205428 A JPH01205428 A JP H01205428A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- epitaxial growth
- reaction tube
- substrate
- tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔概 要〕
光照射型気相エピタギノヤル成長装置に関し、エピタキ
シャル成長用反応管の内壁にエピタキシャル成長用ガス
の分解生成物がイ;]着してエピタキシャル成長用光源
の光が反応管内に透過し難くなるのを防止した装置の提
供を目的とし、エピタキシャル成長用基板を設置するザ
セプクを収容する反応管と、該反応管に連なりエピタキ
シャル成長用ガスを導入するガス導入管と、エピタキシ
ャル成長後のガスを排出するガス排出管と、反応管の外
部から基板」−を照射しエピタキシャル成長用ガスを分
解する光源と、前記反応管内に収容され、長手方向の両
端部が反応管の垂直方向の壁面に対して所定の間隔を有
し、導入されるガス流に対してほぼ平行で、かつ基板上
より所定の間隔を有する仕切り板を設け、
前記エピタキシャル成長用ガスを基板と仕切り板との間
に導入するとともに、エビクキシャル成長後のガスが仕
切り板上を通過し、光源が照射される反応管の内壁に沿
って流れるようなテーパーを反応管の壁面に設けたこと
で構成する。[Detailed description of the invention] [Summary] Regarding a light irradiation type vapor phase epitaxial growth apparatus, decomposition products of an epitaxial growth gas are deposited on the inner wall of a reaction tube for epitaxial growth, and light from a light source for epitaxial growth enters the reaction tube. The aim is to provide an apparatus that prevents the epitaxial growth from becoming difficult to pass through the system. a light source that irradiates the substrate from outside the reaction tube and decomposes the epitaxial growth gas; A partition plate is provided at a predetermined interval from above the substrate, substantially parallel to the introduced gas flow, and at a predetermined interval from above the substrate, and the epitaxial growth gas is introduced between the substrate and the partition plate. , the wall of the reaction tube is tapered so that the gas after evixaxial growth passes over the partition plate and flows along the inner wall of the reaction tube that is irradiated with the light source.
本発明は光照射型気相エピタキシャル成長装置に関する
。The present invention relates to a light irradiation type vapor phase epitaxial growth apparatus.
赤外線検知素子形成材料としてエネルギーバンドギャッ
プの狭い水銀・力ISミウム・テルル(l1g 1−
xCclゆTe)の化合物半導体結晶が用いられており
、このような11g1−x CdXTeの結晶を素子形
成用に都合か良いように大面積で、かつ薄膜で得ること
が必要となる。Mercury/ISmium/tellurium (l1g 1-
A compound semiconductor crystal of 11g1-xCdXTe is used, and it is necessary to obtain such a crystal of 11g1-xCdXTe in a large area and in a thin film for convenient device formation.
このような要求を満たず方法として反応管内に収容され
たカドミウムテルノ喧cdTe)の基板」二にシノチル
カI・ミウム((CIl:l) zcd ) 、ジエチ
ルテルル((Cllzll、)zTe)のようなエピタ
:)−ンヤル成長用ガスを導入し、基板を加熱して前記
エピタキシャル成長用ガスを分解し、この分解した成分
を基板に被着させるM OCV D (Metal O
rganic ChemicalVapor Depo
sition;有機金属化学気相成長)方法が用いられ
ている。As a method that does not meet these requirements, a substrate of cadmium telluride (cdTe) housed in a reaction tube is used, such as cynochloride ((CIl:l)zcd) or diethyltellurium ((Cllzll,)zTe). Epitaxial growth gas is introduced, the substrate is heated to decompose the epitaxial growth gas, and the decomposed components are deposited on the substrate.
rganic Chemical Vapor Depo
A metal-organic chemical vapor deposition (organic metal chemical vapor deposition) method is used.
このようなM OCV I)法に於いてエピタキシャル
成長用基板に紫外線を照射して、エピクキシャル成長ガ
スが分解して基板に付着する分解速度を促進し、基板の
成長温度を低下さ−Uた光気相成長方法が最近用いられ
ている。In such MOCV I) method, the epitaxial growth substrate is irradiated with ultraviolet rays to accelerate the decomposition rate at which the epitaxial growth gas decomposes and adheres to the substrate, thereby lowering the growth temperature of the substrate. Phase growth methods have recently been used.
通常このような光気相成長装置は、反応管の内壁にエピ
タキシャル成長用ガスの分解生成物が付着し、この生成
物が光源からの光の透過を妨げ、基板上に光が到達する
効率が悪くなる。Normally, in such a photo-vapor phase growth apparatus, decomposition products of the epitaxial growth gas adhere to the inner wall of the reaction tube, and this product obstructs the transmission of light from the light source, reducing the efficiency with which light reaches the substrate. Become.
そこで従来、このような分解生成物が反応管の内壁に付
着するのを防止した装置が提案されていた。Therefore, devices have been proposed that prevent such decomposition products from adhering to the inner wall of the reaction tube.
第2閃は反応管の内壁面にエピタキシャル成長用カスの
反応生成物のイ」着を防止した装置で、図示するように
反応管1内にエピタキシャル成長用基板2を設置したサ
セプタ3を設け、反応管1の外部に基板に紫外線を照射
する光a4を設置する。The second method is a device that prevents the reaction products of epitaxial growth residue from adhering to the inner wall surface of the reaction tube.As shown in the figure, a susceptor 3 with a substrate 2 for epitaxial growth installed inside the reaction tube 1 is installed. A light a4 for irradiating the substrate with ultraviolet rays is installed outside of 1.
更に反応管1の直径方向よりみて基板2が設置されてい
る中央の領域にはエピタキシャル成長用ガスが流れるよ
うなガス導入管5を設け、更に反応管の上部方向に沿っ
て高温の水素ガスが流れるようなガス導入管6を設け、
更に反応管の下部方向に’t9って低温の水素ガスが流
れるようなガス導入管7を設ける。Furthermore, a gas introduction pipe 5 through which epitaxial growth gas flows is provided in the central region where the substrate 2 is installed when viewed from the diameter direction of the reaction tube 1, and furthermore, high temperature hydrogen gas flows along the upper direction of the reaction tube. A gas introduction pipe 6 is provided,
Furthermore, a gas introduction pipe 7 is provided at the bottom of the reaction tube through which low-temperature hydrogen gas flows.
このようにエピタキシャル成長用ガスの上下を成長用ガ
スの成分を含まない別個のガスを層状に流すことで、反
応管の内壁にエピタキシャル成長用ガスが接触しないよ
うにして、エピタキシャル成長用ガスの分解生成物が反
応管の内壁面に付着しないようにしている。In this way, by flowing a separate gas that does not contain the components of the growth gas above and below the epitaxial growth gas, the epitaxial growth gas is prevented from coming into contact with the inner wall of the reaction tube, and the decomposition products of the epitaxial growth gas are prevented. Prevent it from adhering to the inner wall of the reaction tube.
〔発明が解決しようとする課題]
ところでこのようにエピタキシャル成長用ガスの他に、
反応管の内壁の分解生成物除去用のガスを別個に反応管
内に導入する従来の装置では、ごの導入されたガスによ
ってエピタキシャル成長用ガスの濃度を精度良く制御す
ることが困難で所望の組成のエピタキシャル結晶が精度
良く形成できない問題点がある。[Problem to be solved by the invention] In addition to the above epitaxial growth gas,
With conventional equipment in which a gas for removing decomposition products from the inner wall of the reaction tube is separately introduced into the reaction tube, it is difficult to precisely control the concentration of the epitaxial growth gas by the introduced gas, and it is difficult to achieve the desired composition. There is a problem that epitaxial crystals cannot be formed with high precision.
また反応管に生成物が付着しないようなガスの導入管を
別個に設ける必要があり、装置が複雑な構造となる。Furthermore, it is necessary to separately provide a gas introduction pipe to prevent products from adhering to the reaction tube, resulting in a complicated structure of the apparatus.
本発明は一上記した問題点を除去し、反応生成物が反応
管の内壁面に((着しないようにした気相エピタキシャ
ル成長装置の提供を目的とする。The present invention aims to eliminate the above-mentioned problems and provide a vapor phase epitaxial growth apparatus in which reaction products do not adhere to the inner wall surface of a reaction tube.
〔課題を解決するための手段]
上記目的を達成する本発明の気相エピタキシャル成長装
置は、第1回に示すようにエピタキシャル成長用基板1
1を設置するザセブタ12を収容する反応管13と、該
反応管13に連なりエピタキシャル成長用ガスを導入す
るガス導入管14と、エピタキシャル成長後のガスを排
出するガス排出管15と、反応管の外部から基板1−、
を照射しエピタキシャル成長用ガスを分解する光rA+
6と、前記反応管内に収納され、長手方向の両端部が反
応管の垂直方向の壁面に対して所定の間隔を有し、基板
−1,より所定の間隔を有する仕切り板17とを設Jl
、前記エピタキシャル成長用カスを基板と仕切り板との
間に導入するとともに、エピタキシャル成長後のカスが
仕切り板上を通過し、光源が照射される反応管の内壁に
沿って流れるようなテーパー(18A、 1f311.
18C)を反応管の内壁面に設げたことて柘成する。[Means for Solving the Problems] The vapor phase epitaxial growth apparatus of the present invention that achieves the above object has an epitaxial growth substrate 1 as shown in the first part.
1, a gas introduction tube 14 connected to the reaction tube 13 and introducing gas for epitaxial growth, and a gas exhaust tube 15 discharging the gas after epitaxial growth. Substrate 1-,
rA+ light that irradiates and decomposes the epitaxial growth gas
6, and a partition plate 17 which is housed in the reaction tube and whose longitudinal ends have a predetermined distance from the vertical wall surface of the reaction tube, and which has a predetermined distance from the substrate-1.
, the epitaxial growth residue is introduced between the substrate and the partition plate, and the epitaxial growth residue passes over the partition plate and is tapered (18A, 1f311) so that it flows along the inner wall of the reaction tube that is irradiated with the light source. ..
18C) was provided on the inner wall of the reaction tube.
本発明の装置は反応生成物の付着防止用のガスを、エピ
タキシャル成長用ガスとは別個のガスを反応管内に導入
することなく、エピタキシャル成長用ガスの一部を反応
管の光が照射される内壁面に沿って還流さ−U、ごの還
流ガスと反応管に導入されるエピタキシャル成長用ガス
とが基板」−で互し料こガス流の方向か変わるような状
態とし、この相互にガス流の異なるガスによって反応管
の内壁に基板、或いはサセプタからの熱が伝達しないよ
うにする。The apparatus of the present invention uses a gas for preventing reaction products from adhering to the inner wall surface of the reaction tube that is irradiated with light, without introducing a gas separate from the epitaxial growth gas into the reaction tube. The reflux gas is refluxed along the substrate and the epitaxial growth gas introduced into the reaction tube is in such a state that the direction of the gas flow changes as they interact with each other at the substrate. The gas prevents heat from the substrate or susceptor from being transferred to the inner wall of the reaction tube.
以下、図面を用いて本発明の一実施例につき詳細に説明
する。Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.
第1図は本発明の気相エピタキシャル成長装置の説明図
である。FIG. 1 is an explanatory diagram of a vapor phase epitaxial growth apparatus of the present invention.
図示するように反応管13の内部にエピタキシャル成長
用のCdTeの基板11を設置した石英或いはグラファ
イト製のサセプタ12を収容する。反応管13の一端部
には水平方向にガス導入管14が設けられ、該反応管1
3の他端部には垂直方向にガス排出管15が設けられて
いる。この基板12上には所定の間隔iを隔てて、ガス
導入管14より導入されるガスの流れに対してほぼ平行
な方向に、かつ反応管13の両端部の内壁面より所定の
間隔dを設け、かつ基板上部か開口された石英製の仕切
り板17を設ける。As shown in the figure, a susceptor 12 made of quartz or graphite on which a CdTe substrate 11 for epitaxial growth is installed is housed inside a reaction tube 13 . A gas introduction tube 14 is provided horizontally at one end of the reaction tube 13.
A gas exhaust pipe 15 is provided at the other end of the gas discharge pipe 3 in a vertical direction. The substrate 12 is placed on the substrate 12 at a predetermined distance i, in a direction substantially parallel to the flow of gas introduced from the gas introduction tube 14, and at a predetermined distance d from the inner wall surfaces of both ends of the reaction tube 13. A partition plate 17 made of quartz and having an opening at the top of the substrate is provided.
また反応管13の両端部の上部及び下部の隅の部分C3
1導入されたエピタキシャル成長用ガスが仕切り板17
の+を通過して還流できるよ・うなテーパー12(A、
181+、 113cを設ける。更に導入されたエピ
タキシャル成長用ガスがサセプタ12の端面に衝突して
その部分てカスの渦流が発生しないようにするため、゛
リーセプタの端面に連なるように石英部材19を設置す
る。また反応管]3の外部に基板11と対向して基板1
1の紫外線照射用光源】6を設ける。Also, the upper and lower corner portions C3 of both ends of the reaction tube 13
1. The epitaxial growth gas introduced into the partition plate 17
Taper 12 (A,
181+ and 113c are provided. Furthermore, in order to prevent the introduced epitaxial growth gas from colliding with the end face of the susceptor 12 and generating a vortex of debris in that area, a quartz member 19 is installed so as to be continuous with the end face of the susceptor. Also, a substrate 1 is placed outside the reaction tube] 3 facing the substrate 11.
A light source for ultraviolet irradiation (1) is provided.
このような本発明の装置を用いてCdTeの基板上るこ
I1g+−XCdx Teの結晶をエピタキシャル成長
する場合について述べる。A case will be described in which a crystal of I1g+-XCdx Te is epitaxially grown on a CdTe substrate using the apparatus of the present invention.
前記したサセプタ■2にCdT[4の基板11を設置し
、該−リーセプタ12を反応管13内に挿入した後、該
反応管内を1O−5LOrr程度の真空度に成る迄排気
する。A substrate 11 of CdT[4 is placed in the susceptor 2 described above, and the receptor 12 is inserted into a reaction tube 13, and then the inside of the reaction tube is evacuated to a degree of vacuum of about 10-5 LOrr.
次いてガス導入管14よりキャリアガスとしての水素ガ
スに担持されたジノチルカドミウムガスを5X]0’気
圧の分圧で、前記水素カスに担持されたジエチルテルル
ガスを4 Xl0−’気圧の分圧で、更にその他に水素
カスを単独の状態でカス導入管14に導入し、全体のエ
ピタキシャル成長用ガスの流量が8ρ/minの値にな
るようにする。Next, dinotyl cadmium gas supported on hydrogen gas as a carrier gas was introduced through the gas introduction pipe 14 at a partial pressure of 5X]0' atm, and diethyl tellurium gas supported on the hydrogen gas was injected at a partial pressure of 4 Xl0-' atm. In addition, hydrogen sludge is introduced into the sludge inlet pipe 14 in its own state, so that the total flow rate of the epitaxial growth gas becomes a value of 8 ρ/min.
またサセプタ12に内蔵されているヒータ(図示せず)
の温度を300°Cに保ぢ、基板11の上部より光源1
6から紫外線を照射する。Additionally, a heater (not shown) built into the susceptor 12
The temperature of the light source 1 is maintained at 300°C, and the light source 1 is
Irradiate ultraviolet light from step 6.
するとガス導入管14より導入されたエピタキシャル成
長用ガスは、サセプタの加熱による基板の加熱によって
基板−ヒで分解するとともに、紫外線照射による光化学
反応によって更にその反応が促進され、分解されたエピ
タキシャル成長用ガスの成分が基板上にエビクキンヤル
結晶として付着する。Then, the epitaxial growth gas introduced from the gas introduction pipe 14 is decomposed on the substrate by the heating of the susceptor, and the reaction is further promoted by a photochemical reaction caused by ultraviolet irradiation, and the decomposed epitaxial growth gas is The components adhere to the substrate as crystals.
更にエピタキシャル成長に与からない未反応ガスは矢印
へ方向に沿っ゛ζ反応管13の端部に当たってテーパー
18Bに沿って移動し、一部はガス排出管15より排出
されるが、排出されなかったガスは矢印Bに示すように
基板11上に到達する。この基板11上ではガス導入管
14より導入されたエピタキシャル成長用ガスの矢印C
に示すガス流の方向に対し、前記仕切り板の下部を通過
し、反応管の端部に衝突して仕切り板の上部に還流して
きたガスの流の方向BとυJガス流の方向が異なる。Further, unreacted gas that does not participate in epitaxial growth moves along the taper 18B by hitting the end of the ζ reaction tube 13 in the direction of the arrow, and some of it is exhausted from the gas exhaust tube 15, but the unexhausted gas reaches the substrate 11 as shown by arrow B. On this substrate 11, an arrow C of the epitaxial growth gas introduced from the gas introduction pipe 14 is shown.
With respect to the direction of the gas flow shown in , the direction B of the gas flow that has passed through the lower part of the partition plate, collided with the end of the reaction tube, and refluxed to the upper part of the partition plate is different from the direction of the υJ gas flow.
このガス流の方向か4’ll互に異なるガスによって、
2、(板或いはサセプタからの熱が上部のL壁Gこ到達
するのか困難となり、基板の上部ではカスの温度か高温
にならず、従って未反応のガスがその部分で分解するこ
とがなく管壁を通過するのてその部分−ζi;Jガスの
反応生成物が反応管に付着しなくなり、光源からの光が
基板上に充分到達するので反応が遅くなる現象が除去さ
れ、K111成の安定したエピタキシャル結晶が基板ト
に形成される。The direction of this gas flow is 4'll due to mutually different gases,
2. (It becomes difficult for the heat from the plate or susceptor to reach the upper L wall G, and the upper part of the substrate does not reach the temperature of the scum, so the unreacted gas does not decompose in that area and the tube By passing through the wall, the reaction products of J gas no longer adhere to the reaction tube, and the light from the light source reaches the substrate sufficiently, eliminating the slow reaction phenomenon and stabilizing the K111 formation. An epitaxial crystal is formed on the substrate.
以トの説明から明らかなように本発明によれば、反応管
の内壁面にエビタギシャル成長ガスの分解生成物か(;
1着せず、従って分解生成物の付着で反応管に曇を生し
ることが無いので光化学反応が阻害されることがないた
め、組成変動を生しないエピクー1−ノヤル結晶が得ら
れる効果がある。As is clear from the following explanation, according to the present invention, decomposition products of the evitaginal growth gas (;
Since the reaction tube does not become cloudy due to the adhesion of decomposition products, the photochemical reaction is not inhibited, so it is possible to obtain Epicure 1-Noyal crystals that do not cause compositional fluctuations. .
第1図は本発明の気相エピタキシャル成長装置の説明図
、
第2図は従来の気相エビクキシャル成長装置の説明図で
ある。
図において、
11はエピタキシャル成長用裁板、12は・す゛セブタ
、13は反応管、14ばエピタキシャル成長用ガス導入
管、15ばガス排出管、16は光源、17は仕切り板、
18A、 18B、 18Gはテーパー、19は石英部
拐を示す。FIG. 1 is an explanatory diagram of a vapor phase epitaxial growth apparatus of the present invention, and FIG. 2 is an explanatory diagram of a conventional vapor phase epitaxial growth apparatus. In the figure, 11 is a cutting plate for epitaxial growth, 12 is a suction plate, 13 is a reaction tube, 14 is a gas introduction tube for epitaxial growth, 15 is a gas exhaust tube, 16 is a light source, 17 is a partition plate,
18A, 18B, and 18G are tapered, and 19 is a quartz part.
Claims (1)
タ(12)を収容する反応管(13)と、該反応管に連
なりエピタキシャル成長用ガスを導入するガス導入管(
14)と、エピタキシャル成長後のガスを排出するガス
排出管(15)と、反応管の外部から基板上を照射しエ
ピタキシャル成長用ガスを分解する光源(16)と、前
記反応管(13)内に収容され、長手方向の両端部が反
応管(13)の垂直方向の壁面に対して所定の隙間を有
し、導入されるガス流に対してほぼ平行で、かつ基板上
より所定の間隔を有する仕切り板(17)とを設け、 前記エピタキシャル成長用ガスを基板(11)と仕切り
板(17)との間に導入するとともに、エピタキシャル
成長後のガスが仕切り板上を通過し、光が照射される反
応管(13)の内壁に沿って流れるようなテーパー(1
8A、18B、18C)を反応管の内壁面に設けたこと
を特徴とする気相エピタキシャル成長装置。[Scope of Claims] A reaction tube (13) that accommodates a susceptor (12) on which a substrate (11) for epitaxial growth is placed, and a gas introduction tube (13) that is connected to the reaction tube and that introduces a gas for epitaxial growth.
14), a gas exhaust pipe (15) for discharging the gas after epitaxial growth, a light source (16) for irradiating the substrate from outside the reaction tube and decomposing the epitaxial growth gas, and a light source (16) housed in the reaction tube (13). a partition whose longitudinal ends have a predetermined gap with respect to the vertical wall surface of the reaction tube (13), are substantially parallel to the gas flow to be introduced, and have a predetermined distance from the substrate. A reaction tube is provided with a plate (17), the epitaxial growth gas is introduced between the substrate (11) and the partition plate (17), and the gas after epitaxial growth passes over the partition plate and is irradiated with light. Taper (13) flowing along the inner wall of (13)
8A, 18B, 18C) on the inner wall surface of a reaction tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2925688A JPH01205428A (en) | 1988-02-10 | 1988-02-10 | Vapor phase epitaxial growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2925688A JPH01205428A (en) | 1988-02-10 | 1988-02-10 | Vapor phase epitaxial growth equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01205428A true JPH01205428A (en) | 1989-08-17 |
Family
ID=12271196
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2925688A Pending JPH01205428A (en) | 1988-02-10 | 1988-02-10 | Vapor phase epitaxial growth equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01205428A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5587019A (en) * | 1992-02-26 | 1996-12-24 | Nec Corporation | Apparatus for use in epitaxial crystal growth |
-
1988
- 1988-02-10 JP JP2925688A patent/JPH01205428A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5587019A (en) * | 1992-02-26 | 1996-12-24 | Nec Corporation | Apparatus for use in epitaxial crystal growth |
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