JPH0244223A - Contact force judging apparatus for ic socket - Google Patents

Abstract

PURPOSE:To judge the propriety of a contact force directly and accurately by inserting a piezo-electric element with the thickness the same as an IC lead suited to a contact section into the contact section to display the size of a contact force with respect to a standard value with the detection of a voltage of thereof. CONSTITUTION:A body 8 the same in shape and size as a package body of ICs suited to the IC socket 1 as object to be judged having contacts 21-214 and piezo-electric elements 31-314 which are the same in shape and size as a group of IC leads suited to the IC socket 1 with one end thereof fixed so as to have a pin-to-pin dimension and a pitch the same as the lead group are inserted into the contact sections 21-214 of the IC socket 1. The piezo-electric elements 31-314 receive contact forces from the contact sections 21-214 to detect voltages of the piezo-electric elements 31-314 proportional to the contact forces with detecting sections 51-514. Then, the contact forces of the contact sections 21-214 corresponding to detection values are shown on display devices 61-614 thereby enabling judgement of the propriety of a contact force directly and accurately.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a contact force determination device for an IC socket that determines the quality of the contact force of a contact portion of an IC socket.

[Conventional technology]

Generally, the decrease in contact force of the contact part of an IC socket is
This causes poor contact between the contact portion and the IC lead inserted into the contact portion, and significantly reduces the reliability of devices using the IC socket. Therefore, it is very important to accurately measure the contact force of the contact portion of an IC socket and determine whether the contact force is good or bad.

Conventionally, this type of contact force measuring device for IC sockets has mainly used a metal cage that has the same thickness as the IC lead that fits into the contact part, can be inserted into the contact part, and has a hard plating on the surface. It consists of a pin and a measuring device such as a tension cage that measures the pulling force when the cage pin is pulled out from the contact part. Based on the pulling force measured by the measuring device, the user calculates the formula: Contact force The contact force was derived from -(pulling force)/(friction coefficient between the cage pin and the contact portion), and the quality of the contact force was judged.

[Problem to be solved by the invention]

The conventional IC socket contact force determination device described above uses the formula: contact force - (handling force)/(rIJr! between the cage bin and the contact part) based on the handling force when the cage bin is pulled out from the contact part. Since the contact force was derived from the contact force (A coefficient) and the quality of the contact force was judged, the friction coefficient in the above formula varies greatly depending on the surface condition such as the degree of dirt on the cage bin and the contact part. This method has disadvantages in that accurate contact force cannot be obtained, it is difficult to judge whether the contact force is good or bad, and it is time-consuming.

(Means for Solving the Problems) A contact force determination device for an IC socket of the present invention comprises: a piezoelectric element that has the same thickness as an IC lead that fits into a contact part and can be inserted into the contact part; an indicator; The voltage of the piezoelectric element is detected, and the display shows the contact force of the contact part corresponding to the detected value or the magnitude of the contact force with respect to the standard value according to the preset characteristics of the voltage of the piezoelectric element and the contact force of the contact part. and a detection section that displays the information.

[Effect]

When the piezoelectric element is inserted into the contact part of the LG socket,
The piezoelectric element receives a contact force from the contact portion, and a voltage proportional to the contact force is detected by the detection portion. Then, on the display, the contact force of the contact section corresponding to the detected value of the detection section or the magnitude of the contact force with respect to the standard value is displayed.

Therefore, it is possible to directly and accurately determine whether the contact force of the contact portion is good or bad, regardless of the surface condition of the piezoelectric element or the contact portion.

[Example] Next, an example of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic configuration diagram of an embodiment of a contact force determination device for an IC socket according to the present invention, and FIG. 2 is a perspective view of an embodiment of the present invention.

This IC socket contact force determination device has a contact force determination device for contact portion 2.
1 to 214, which is the same type and size as the package body of the IC that fits the IC socket 1, which is the object to be determined; A piezoelectric element 31 whose -end is fixed to the main body 8 so as to have the same inter-bin dimension and bidge as the group.
to 314, all of which are numerical displays, are provided on the top surface of the main body 8, and the voltages of the piezoelectric elements 31 to 314 provided within the main body 8 are shown through electrically conductive conductors 41 to 414, respectively. Detects the voltage of the piezoelectric elements 31 to 314 set in advance and the contact portion 21
The contact force of the contact portions 21 to 214 corresponding to the detected value is displayed on the display 61 to 214 according to the characteristics of the contact force of
614, and an internal power source 7 that is provided in the main body 8 and supplies current to the detectors 51 to 514 and the indicators 61 to 614.

Next, the operation of this embodiment will be explained.

When the piezoelectric elements 31 to 314 are respectively inserted into the contact parts 21 to 214 of the IC socket 1, the piezoelectric elements 31 to 314
31b receives contact force from the contact parts 21 to 214,
The voltages of the piezoelectric elements 31 to 314 that are proportional to the contact force are detected by the detection units 51 to 514.

Then, the display devices 61 to 614 display the contact forces of the contact parts 21 to 214 corresponding to the detected values by the detection parts 51 to 514.

Therefore, the pressure 1ffi1! - Regardless of the surface conditions of the children 31 to 314 and the contact parts 21 to 214,
The contact forces of the contact portions 21 to 214 can be directly and accurately determined, and the quality of the entire IC socket 1 can be determined.

Note that the indicators 61 to 614 may use ED instead of numerical displays, and a simple display such as a dot when the contact force of the contact portions 21 to 214 is equal to or greater than the standard 1iff may be used.

〔Effect of the invention〕

As explained above, the present invention has a piezoelectric element that fits into the contact part of the IC socket to be determined, and the detection part detects the voltage of the piezoelectric element when the piezoelectric element is inserted into the contact part. By displaying the contact force of the contact part corresponding to the detected value or the magnitude of the contact force relative to the standard value on the display, the contact part can be measured directly and accurately without being affected by the surface condition of the piezoelectric element or the contact part. Since it is possible to judge whether the contact force is good or bad, it has the effect of improving workability and reliability.

[Brief explanation of the drawing]

FIG. 1 is a schematic configuration diagram of an embodiment of a contact determination device for an IC socket according to the present invention, and FIG. 2 is a perspective view of an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... IC socket, 21-214... Contact part, 31-314... Piezoelectric element, 41-414... Good electrical conductor, 51-514... Detection part, 61-614... Display 7...Internal power supply, 8...Main body.

Claims (1)

[Scope of Claims] 1. A contact force determination device for an IC socket that determines the quality of the contact force of a contact part of an IC socket, which an insertable piezoelectric element, an indicator, detecting the voltage of the piezoelectric element, and detecting the contact force of the contact part corresponding to the detected value according to the preset characteristics of the voltage of the piezoelectric element and the contact force of the contact part. Alternatively, a contact force determination device for an IC socket, comprising a detection unit that displays the magnitude of the contact force with respect to a standard value on the display device.