JPH027582U - - Google Patents
Info
- Publication number
- JPH027582U JPH027582U JP8600188U JP8600188U JPH027582U JP H027582 U JPH027582 U JP H027582U JP 8600188 U JP8600188 U JP 8600188U JP 8600188 U JP8600188 U JP 8600188U JP H027582 U JPH027582 U JP H027582U
- Authority
- JP
- Japan
- Prior art keywords
- current
- group
- under test
- integrated circuits
- circuits under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案の一実施例のブロツク図、第２
図は第１図のブロツク図の動作を説明するための
被試験ＩＣ群の電流波形図、第３図ａ及びｂは第
１図の回路の動作を説明するための良品のみを含
んだＩＣ群及び不良品ＩＣを含んだＩＣ群のそれ
ぞれ直流電流―交流電流の相関関係図、第４図は
本実施例を使用した集積回路実装基板の試験工程
の流れ図、第５図は従来の集積回路実装基板の試
験装置の一例を使用した試験工程の流れ図である
。
１……ＢＴボード、２……被試験ＩＣ群、３…
…集積回路実装基板の試験装置、４……電流検出
部、６……信号発生器、７……ＡＣ電流計、８…
…ＤＣ電流計、９……コネクタ部、１０……相関
判定部、ＣＬＫ……クロツク信号、Ｄ……下側管
理限界線、ＩＤＣ……直流電流、ｉＡＣ……動作
電流、ｉｐｎ……第ｎのＩＣ動作電流、Ｇ……良
品相関直線、Ｎ……不良品相関直線、Ｕ……上側
管理限界線。
Fig. 1 is a block diagram of an embodiment of the present invention;
The figure is a current waveform diagram of a group of ICs under test to explain the operation of the block diagram in Figure 1, and Figures 3a and b are a group of ICs containing only non-defective products to explain the operation of the circuit in Figure 1. FIG. 4 is a flowchart of the test process for an integrated circuit mounting board using this embodiment, and FIG. 5 is a diagram showing the relationship between direct current and alternating current for IC groups including defective ICs. 3 is a flowchart of a testing process using an example of a board testing device. 1...BT board, 2...IC group under test, 3...
...Testing device for integrated circuit mounting board, 4...Current detection unit, 6...Signal generator, 7...AC ammeter, 8...
...DC ammeter, 9...Connector section, 10...Correlation judgment section, CLK...Clock signal, D...Lower control limit line, IDC...Direct current, iAC...Operating current, i pn ...No. n IC operating current, G...good product correlation straight line, N...defective product correlation straight line, U...upper control limit line.
Claims (1)
群にバイアス電圧を供給する直流電源と、前記被
試験集積回路群に動作信号を供給する信号発生器
と、前記被試験集積回路群の直流電流を検出する
直流電流計及び前記信号発生器の出力する同期信
号に連動して動作電流の総和値を検出する交流電
流計とを有する電流検出部と、前記直流電流及び
交流電流を入力して予め設定していた所定の直流
電流及び交流電流間の相関関係に対応する管理限
界線内かを判断する相関判断部を含むことを特徴
とする集積回路実装基板の試験装置。 A DC power supply that supplies a bias voltage to a group of integrated circuits under test mounted on an integrated circuit mounting board, a signal generator that supplies operating signals to the group of integrated circuits under test, and a DC current source of the group of integrated circuits under test. a current detection unit having a DC ammeter for detection and an AC ammeter for detecting a total value of operating current in conjunction with a synchronization signal output from the signal generator; and inputting the DC current and AC current to preset. 1. A testing device for an integrated circuit mounting board, comprising a correlation determination unit that determines whether the correlation between a predetermined direct current and an alternating current is within a control limit line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8600188U JPH027582U (en) | 1988-06-28 | 1988-06-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8600188U JPH027582U (en) | 1988-06-28 | 1988-06-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH027582U true JPH027582U (en) | 1990-01-18 |
Family
ID=31310655
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8600188U Pending JPH027582U (en) | 1988-06-28 | 1988-06-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH027582U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09262316A (en) * | 1996-10-21 | 1997-10-07 | Mitsuharu Nozawa | Bridge structure for swimming goggle |
| WO2007029463A1 (en) * | 2005-09-06 | 2007-03-15 | Advantest Corporation | Test equipment and test method |
-
1988
- 1988-06-28 JP JP8600188U patent/JPH027582U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09262316A (en) * | 1996-10-21 | 1997-10-07 | Mitsuharu Nozawa | Bridge structure for swimming goggle |
| WO2007029463A1 (en) * | 2005-09-06 | 2007-03-15 | Advantest Corporation | Test equipment and test method |
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