JPH03287045A - Impact test method - Google Patents
Impact test methodInfo
- Publication number
- JPH03287045A JPH03287045A JP8984490A JP8984490A JPH03287045A JP H03287045 A JPH03287045 A JP H03287045A JP 8984490 A JP8984490 A JP 8984490A JP 8984490 A JP8984490 A JP 8984490A JP H03287045 A JPH03287045 A JP H03287045A
- Authority
- JP
- Japan
- Prior art keywords
- impact
- plate
- waveform
- test method
- impact test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
Ｅ産業上の利用分野］
この発明は、電子機器の衝撃試験法に関するものである
。[Detailed Description of the Invention] E-Industrial Application Field] This invention relates to an impact testing method for electronic equipment.
Ｆ従来の技術］
第３図に従来の衝撃試験法の例を示す。（１）はプレー
ト、（２）はアイボルトでプレート（１）に結合されて
いる。（３）は吊り下げ点、（４）はスリングでアイボ
ルト（２）を介してプレート（１）を吊り下げ点（３）
と結合している。（５）は電子機器で、（６）はノ・ン
マ、（７）は加速度センサー、（８）は解析装置、（９
）はローノイズケーブルであり、加速度センサー（７）
と解析装置（８）とを接続している。F. Prior Art] FIG. 3 shows an example of a conventional impact test method. (1) is a plate, and (2) is connected to the plate (1) with an eye bolt. (3) is the hanging point, and (4) is the hanging point (3) of the plate (1) via the eye bolt (2) with a sling.
is combined with (5) is an electronic device, (6) is a computer, (7) is an acceleration sensor, (8) is an analysis device, (9)
) is a low noise cable, and the acceleration sensor (7)
and an analysis device (8).
次に動作について説明する。ハンマ（６）によってプレ
ート（１）に打撃を与え、その時に生じる衝撃波かプレ
ート（１）を伝播して、電子機器（５）に負荷される。Next, the operation will be explained. The plate (1) is struck by the hammer (6), and the shock wave generated at that time propagates through the plate (1) and is loaded on the electronic device (5).
電子機器（５）に負荷された衝撃力はプレー）（＋）と
電子機器（５）とのインターフェイス点に取付けられた
加速度センサー（７）によって取り込んだ加速度データ
を解析装置（８）によって解析したＳＲ３波形で評価さ
れる。プレートに与える打撃力を調整することによって
、規定のＳＲ３波形を有する衝撃入力を負荷していた。The impact force applied to the electronic device (5) was measured by the acceleration sensor (7) installed at the interface point between the play (+) and the electronic device (5), and the acceleration data was analyzed by the analyzer (8). Evaluated with SR3 waveform. By adjusting the impact force applied to the plate, an impact input having a prescribed SR3 waveform was applied.
［発明が解決しようとする課題］
従来の衝撃試験装置は以上のようになっているので、電
子機器に負荷される衝撃力はハンマによる打撃力、プレ
ートの特性によって決まってしまっていた。従って、規
定のＳ［ｉＳ波形を実現するためには、プレートの特性
、ハンマの特性、打撃力をパラメータとして変えなけれ
ばならず、数多くのプレート、ハンマを用意する必要が
あり、 ＳＲ８の全周波数において加速度レベルを上げ
たり下げたりすることはできるが、特定の周波数帯に限
って加速度レベルを調整することによってＳＲＳの波形
を変えることが困難なため、規定のＳＲ３波形が達成で
きないという課題があった。この発明は上記のような課
題を解消するためになされたもので、任意のＳＲ５波形
を有する衝撃入力を実現することを目的としている。[Problems to be Solved by the Invention] Since the conventional impact testing apparatus is configured as described above, the impact force applied to the electronic device is determined by the impact force by the hammer and the characteristics of the plate. Therefore, in order to achieve the specified S [iS waveform, the characteristics of the plate, the characteristics of the hammer, and the striking force must be changed as parameters, and it is necessary to prepare a large number of plates and hammers. Although it is possible to raise or lower the acceleration level in a specific frequency band, it is difficult to change the SRS waveform by adjusting the acceleration level only in a specific frequency band, so there is a problem that the specified SR3 waveform cannot be achieved. Ta. This invention was made to solve the above-mentioned problems, and aims to realize an impact input having an arbitrary SR5 waveform.
［課題を解決するための手段］
この発明に係わる衝撃試験装置は、固有振動数を調整で
きる。ウェイトとバネからなる振動系をプレートに付加
することにより、打撃後のプレートに自由振動を残すも
のである。[Means for Solving the Problems] The impact testing device according to the present invention can adjust the natural frequency. By adding a vibration system consisting of weights and springs to the plate, free vibrations remain in the plate after impact.
［作用コ
この発明においては、ウェイトとバネからなる振動系の
固有振動数を変えることによって、）＼ンマによる打撃
の後にプレートに残る自由振動の振動数を調整し２任意
のＳＲ３波形を有する衝撃人力を供試体に負荷すること
が可能となる。[Operation] In this invention, by changing the natural frequency of the vibration system consisting of a weight and a spring, the frequency of the free vibrations remaining on the plate after being hit by the hammer is adjusted, and the shock having an arbitrary SR3 waveform is produced. It becomes possible to apply human power to the specimen.
Ｊ実施例］
第１間及び第２図はこの発明の一実施例を示す図である
。J Embodiment] Figures 1 and 2 are diagrams showing an embodiment of the present invention.
第１図はこの発明に係る衝撃試験装置の構成を示す図で
あり、第２図は衝撃試験装置の見取り図である。各図に
おいて、（］）〜（９）はｌ−、記従宋の試験装置と全
く同じものである。（１ｏ）はバネであり第２図に示す
ように板バネになっている。（１１）はウェイトであり
、バネ（１０）を介してプレート（１）に結合されてい
る。FIG. 1 is a diagram showing the configuration of an impact testing device according to the present invention, and FIG. 2 is a sketch of the impact testing device. In each figure, (]) to (9) are exactly the same as the test equipment of l-, Ji Cong and Song Dynasty. (1o) is a spring, and as shown in FIG. 2, it is a leaf spring. (11) is a weight, which is connected to the plate (1) via a spring (10).
上記のように構成された衝撃試験装置は７ ブレー ）
（１）とバネ（］】）及びウェイト（１ｏ）か１目出
度の振動系を構成するため、その振動系の固有振動数に
相当する自由振動がプレート（１）に残る。従って、加
速度センサー（７）によって計測される加速度のＳ！？
Ｓ波形は前記振動系の固有振動数に相当する周波数にお
ける加速度レベルを上げることがてきる。このバネ及び
ウェイトを調整することによって振動系の固有振動数を
加速度レベルを上げる必要のある周波数に設定すること
か可能である。The impact test apparatus configured as above is 7 Brays)
(1), the spring (]]) and the weight (1o) constitute a vibration system with a degree of 1, so free vibrations corresponding to the natural frequency of the vibration system remain in the plate (1). Therefore, S! of the acceleration measured by the acceleration sensor (7)! ?
The S waveform can increase the acceleration level at a frequency corresponding to the natural frequency of the vibration system. By adjusting these springs and weights, it is possible to set the natural frequency of the vibration system to a frequency that is necessary to increase the acceleration level.
また１以上の説明はｌ自由度の振動系を構成する場合で
あるが、多自由度の系にすれば、−度にいくつもの周波
数でのＳＲ５の調整が可能となり、調整能力はさらに拡
大する。In addition, the explanation above is for the case where a vibration system with l degrees of freedom is constructed, but if it is made into a system with multiple degrees of freedom, it becomes possible to adjust SR5 at several frequencies in − degrees, and the adjustment ability is further expanded. .
［発明の効果］
この発明は以上説明したとおり、打撃伝播型の衝撃試験
において、任意のＳＲ８波形を有する衝撃人力の負荷が
実現できるため、電子機器に対する打撃伝播型衝撃試験
法の適用範囲が拡大する効果がある。[Effects of the Invention] As explained above, the present invention can realize a human impact load having an arbitrary SR8 waveform in the impact propagation type impact test, and thus expands the scope of application of the impact propagation type impact testing method to electronic devices. It has the effect of
第１図はこの発明の一実施例を示す構成図２第２図は見
取り図、第３図は従来の衝撃試験法を示す構成図である
。
図において、（１）はプレート、（２）はアイボルト（
３）は吊り下げ点、（４）はスリング、（５）は電子Ｒ
器〈６）はハンマ、（７）は加速度センサー、（８）は
解析装置、（９）はローノイズケーブル、（１０）はバ
ネ、 （１１）はウェイトである。
なお、各図中同一符号は同一または相当部分を示す。FIG. 1 is a block diagram showing an embodiment of the present invention; FIG. 2 is a schematic diagram; and FIG. 3 is a block diagram showing a conventional impact test method. In the figure, (1) is the plate, (2) is the eye bolt (
3) is the hanging point, (4) is the sling, and (5) is the electronic R.
The device (6) is a hammer, (7) is an acceleration sensor, (8) is an analysis device, (9) is a low noise cable, (10) is a spring, and (11) is a weight. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
レベルを負荷する衝撃試験において、プレートに生じる
残留振動の固有振動数を変化させることによって、任意
のＳＲＳ（Ｓｈｏｃｋ Ｒｅｓｐｏｎｓｅ Ｓｐｅｃｔ
ｒｕｍ）の波形を有する衝撃入力の負荷を可能にしたこ
とを特徴とする衝撃試験法。In a shock test in which a plate carrying electronic equipment is struck and subjected to a specified shock level, by changing the natural frequency of the residual vibration that occurs in the plate, it is possible to create an arbitrary SRS (Shock Response Spectrum).
An impact test method characterized in that it enables loading of an impact input having a waveform of .rum).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8984490A JPH03287045A (en) | 1990-04-04 | 1990-04-04 | Impact test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8984490A JPH03287045A (en) | 1990-04-04 | 1990-04-04 | Impact test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03287045A true JPH03287045A (en) | 1991-12-17 |
Family
ID=13982075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8984490A Pending JPH03287045A (en) | 1990-04-04 | 1990-04-04 | Impact test method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03287045A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0577748U (en) * | 1992-03-26 | 1993-10-22 | 豊田工機株式会社 | Bracket for measuring device characteristics |
| WO2007069336A1 (en) * | 2005-12-16 | 2007-06-21 | Fujitsu Limited | Impact test device |
| JP2016061702A (en) * | 2014-09-19 | 2016-04-25 | 日本電気株式会社 | Vibration analysis device and vibration analysis method |
| JP2016173337A (en) * | 2015-03-18 | 2016-09-29 | 日本電気株式会社 | Impact testing machine and impact testing method |
| WO2020049675A1 (en) * | 2018-09-06 | 2020-03-12 | 神栄テクノロジー株式会社 | Horizontal shock testing device |
| DE102024201565A1 (en) * | 2024-02-21 | 2025-08-21 | Robert Bosch Gesellschaft mit beschränkter Haftung | Shock test device |
-
1990
- 1990-04-04 JP JP8984490A patent/JPH03287045A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0577748U (en) * | 1992-03-26 | 1993-10-22 | 豊田工機株式会社 | Bracket for measuring device characteristics |
| WO2007069336A1 (en) * | 2005-12-16 | 2007-06-21 | Fujitsu Limited | Impact test device |
| JPWO2007069336A1 (en) * | 2005-12-16 | 2009-05-21 | 富士通株式会社 | Impact test equipment |
| US7596985B2 (en) | 2005-12-16 | 2009-10-06 | Fujitsu Limited | Impact test apparatus |
| JP2016061702A (en) * | 2014-09-19 | 2016-04-25 | 日本電気株式会社 | Vibration analysis device and vibration analysis method |
| JP2016173337A (en) * | 2015-03-18 | 2016-09-29 | 日本電気株式会社 | Impact testing machine and impact testing method |
| WO2020049675A1 (en) * | 2018-09-06 | 2020-03-12 | 神栄テクノロジー株式会社 | Horizontal shock testing device |
| DE102024201565A1 (en) * | 2024-02-21 | 2025-08-21 | Robert Bosch Gesellschaft mit beschränkter Haftung | Shock test device |
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