JPH1073668A - X-ray detector constant temperature device - Google Patents
X-ray detector constant temperature deviceInfo
- Publication number
- JPH1073668A JPH1073668A JP8245478A JP24547896A JPH1073668A JP H1073668 A JPH1073668 A JP H1073668A JP 8245478 A JP8245478 A JP 8245478A JP 24547896 A JP24547896 A JP 24547896A JP H1073668 A JPH1073668 A JP H1073668A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- detector
- heater
- case
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010438 heat treatment Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 claims description 6
- 230000003028 elevating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 238000000605 extraction Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 4
- 230000002123 temporal effect Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 238000009529 body temperature measurement Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、X線計測に用いら
れるX線検出器の恒温化装置に係り、特に外気温変化に
伴ってリングアーチファクトが発生しやすい医療用X線
CT装置のX線検出器の特性改善に好適なX線検出器恒
温化装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermostat for an X-ray detector used for X-ray measurement, and more particularly, to an X-ray of a medical X-ray CT apparatus in which ring artifacts are likely to be generated due to a change in outside air temperature. The present invention relates to an X-ray detector thermostat suitable for improving the characteristics of a detector.
【0002】[0002]
【従来の技術】医療用X線CT装置のX線検出器(以
下、単に検出器ともいう)では500ch以上もの多数
の検出素子を有しており、検出器外気温の変化によって
各chを構成する部品の熱膨張により個々のchピッチ
間隔が微妙に変わってしまう。そして、この微妙なピッ
チ間隔ずれが個々のch感度特性を変化させてしまいリ
ングアーチファクトを発生させる問題があった。2. Description of the Related Art An X-ray detector (hereinafter, also simply referred to as a detector) of a medical X-ray CT apparatus has a large number of detection elements of 500 channels or more, and each channel is constituted by a change in outside temperature of the detector. Due to the thermal expansion of the components, the pitch pitch between the individual channels is slightly changed. Then, there is a problem that the subtle pitch interval shift changes the sensitivity characteristic of each channel and causes ring artifacts.
【0003】従来から、この問題を解決するために検出
器の恒温化技術が知られている。図8にそのような恒温
化技術の代表的な例(電離箱型検出器への適用例)を示
す。図示するように、恒温化ヒータ9と温度センサ10
は検出器ケース3の一部に組み込まれている。温度制御
ユニット11は、温度センサ10によって温度を読み込
み、図9に示すような設定温度TH以下の場合にヒータ
9に電源を供給(ON)し、設定温度TH以上の場合に
ヒータ9の電源供給を遮断(OFF)する温度制御を行
うことで検出器ケース3の温度を一定に保つ働きをして
いる。[0003] Conventionally, a technique for keeping the detector at a constant temperature has been known to solve this problem. FIG. 8 shows a typical example of such a constant temperature technique (an example of application to an ionization chamber type detector). As shown in the figure, a constant temperature heater 9 and a temperature sensor 10
Is incorporated in a part of the detector case 3. The temperature control unit 11 reads the temperature by the temperature sensor 10 and supplies power (ON) to the heater 9 when the temperature is equal to or lower than the set temperature TH as shown in FIG. 9, and supplies power to the heater 9 when the temperature is equal to or higher than the set temperature TH. The temperature of the detector case 3 is kept constant by performing the temperature control for shutting off (OFF).
【0004】[0004]
【発明が解決しようとする課題】上記従来技術では、次
のような問題点があった。図10は従来装置におけるヒ
ータ9のON後の検出器ケース3の温度の代表的な時間
的変化を示している。この図10において、最適なヒー
タ熱容量の選択をした場合を曲線イで示す。この場合
は、ヒータON後、検出器ケース温度は徐々に上昇し設
定温度TH近くで飽和傾向を示す。そして温度THに達
した時点でヒータ9はOFFになり、温度が低下した際
には再度ヒータON動作となる。そのため、設定温度T
H付近で緩やかな温度変化を示しながらほぼ一定の温度
を保つことができる。The above prior art has the following problems. FIG. 10 shows a typical temporal change in the temperature of the detector case 3 after the heater 9 is turned on in the conventional apparatus. In FIG. 10, the case where the optimum heater heat capacity is selected is shown by a curve A. In this case, after the heater is turned on, the detector case temperature gradually rises and shows a saturation tendency near the set temperature TH. When the temperature reaches the temperature TH, the heater 9 is turned off, and when the temperature decreases, the heater 9 is turned on again. Therefore, the set temperature T
Nearly constant temperature can be maintained while showing a gradual temperature change near H.
【0005】曲線ロは、検出器外気温がより低い条件で
使用した場合の例である。この場合は、ヒータ熱容量不
足となって目標とした設定温度THに検出器を保つこと
ができない。そこで、ヒータ9を複数個配置して検出器
恒温化制御する場合があるが、この場合には個々の制御
装置設定検出器ケース部間での温度不均一を生じ、検出
器での感度変化がより顕著になってしまい、顕著なリン
グアーチファクトを発生させてしまう。また、外気温が
低い時間で感度補正計測(キャリブレーション)を行う
ことによる対処法も考えられるが、この方法では、その
後、外気温が上がり本来の正常な検出器温度状態で計測
した場合に感度補正の不一致で逆にリングアーチファク
トを発生させてしまうという問題があった。[0005] Curve (b) is an example in the case where the temperature outside the detector is lower. In this case, the heat capacity of the heater becomes insufficient and the detector cannot be maintained at the target set temperature TH. Therefore, there is a case where a plurality of heaters 9 are arranged to control the temperature of the detector to be constant. In this case, temperature non-uniformity occurs between the individual control device setting detector case parts, and a change in sensitivity at the detector occurs. It becomes more noticeable and causes noticeable ring artifacts. It is also conceivable to perform a sensitivity correction measurement (calibration) at a time when the outside air temperature is low. However, this method requires a sensitivity when the outside air temperature rises and the measurement is performed in the original normal detector temperature state. On the contrary, there is a problem that the ring artifact is generated due to the mismatch of the correction.
【0006】曲線ハは、ヒータ容量をより大きくした場
合の例である。この場合は、より外気温が低いときでも
充分設定温度THに達する能力はあるが、逆にTH温度
に達してヒータOFFにしても検出器温度上昇はすぐに
は止らないため、ヒータON/OFF動作での時遅れと
恒温化温度変動幅が大きくなり、充分な恒温化制御がで
きないという問題が生じた。A curve C shows an example in which the heater capacity is further increased. In this case, even when the outside air temperature is lower, there is a sufficient ability to reach the set temperature TH, but conversely, when the temperature reaches the TH temperature and the heater is turned off, the detector temperature rise does not stop immediately. The time delay in the operation and the temperature fluctuation range of the temperature increase become large, causing a problem that sufficient temperature control cannot be performed.
【0007】本発明の目的は、より広範囲の外気温変化
条件でも迅速,高精度に検出器ケースを恒温化でき、リ
ングアーチファクト発生のない高画質なX線CT画像が
得られるX線検出器となし得るX線検出器恒温化装置を
提供することにある。An object of the present invention is to provide an X-ray detector capable of rapidly and accurately maintaining the temperature of a detector case even in a wider range of outside air temperature change conditions, and obtaining a high-quality X-ray CT image free of ring artifacts. An object of the present invention is to provide an X-ray detector thermostat that can be performed.
【0008】[0008]
【課題を解決するための手段】上記目的は、検出器ケー
スの一部に取り付けられた1個以上の第1恒温化ヒータ
と、前記検出器ケースの外方近傍位置に配置された1個
以上の第1温度センサと、この第1温度センサによる検
出器周囲外気温の測定値に応じて前記第1恒温化ヒータ
に供給する電源をON/OFF制御して検出器ケース温
度を第1設定温度まで上昇させる第1温度制御ユニット
と、前記検出器ケースの一部に取り付けられた1個以上
の第2恒温化ヒータと、前記検出器ケースの一部に取り
付けられた1個以上の第2温度センサと、この第2温度
センサによる検出器ケース温度を測定値に応じて前記第
2恒温化ヒータに供給する電源をON/OFF制御して
検出器ケース温度を前記第1設定温度と第2設定温度の
範囲内に保持させる第2温度制御ユニットとを設けるこ
とにより達成される。SUMMARY OF THE INVENTION It is an object of the present invention to provide at least one first constant temperature heater attached to a part of a detector case, and at least one first constant temperature heater arranged at a position near the outside of the detector case. ON / OFF control of the first temperature sensor and the power supply to the first constant temperature heater in accordance with the measurement value of the ambient temperature around the detector by the first temperature sensor to set the detector case temperature to the first set temperature A first temperature control unit for raising the temperature, one or more second constant temperature heaters attached to a part of the detector case, and one or more second temperatures attached to a part of the detector case. ON / OFF control of a sensor and a power supply to the second constant temperature heater according to a measured value of a detector case temperature by the second temperature sensor to control the detector case temperature to the first set temperature and the second set temperature. Keep it within the temperature range It is achieved by providing a second temperature control unit.
【0009】検出器周辺外気温測定用の第1設定温度を
検出器ケース温度測定用の第2設定温度より低く設定す
ることにより、外気温が低い場合、第1,第2恒温化ヒ
ータは共にON動作する。すなわち高い熱容量で動作
し、したがってより低外気温の状態でも迅速に検出器ケ
ースの温度を上昇させて、第2恒温化ヒータが機能を果
たす最低限の下限温度を確実に確保する。第1設定温度
に達した後、検出器の温度飽和に最適な熱容量である第
2恒温化ヒータのみがON動作になり、この第2恒温化
ヒータのON/OFF制御は検出器ケースの温度飽和領
域に達する直前の第2設定温度に設定される。このた
め、検出器ケース温度は第2恒温化ヒータにより緩やか
に第2設定温度に達し、その後の第2恒温化ヒータのO
N/OFF動作時でも検出器温度変動が少なく高精度な
恒温化制御が可能になる。By setting the first set temperature for measuring the ambient temperature around the detector to be lower than the second set temperature for measuring the temperature of the detector case, when the external temperature is low, both the first and second constant temperature heaters are used. ON operation. That is, it operates with a high heat capacity, so that the temperature of the detector case is quickly raised even in a state of a lower outside air temperature, so that the minimum lower limit temperature at which the second constant temperature heater functions is ensured. After reaching the first set temperature, only the second constant temperature heater, which has the optimal heat capacity for the temperature saturation of the detector, is turned ON, and the ON / OFF control of the second constant temperature heater is performed by the temperature saturation of the detector case. The temperature is set to the second set temperature immediately before reaching the region. For this reason, the detector case temperature gradually reaches the second set temperature by the second constant temperature heater, and the O 2 of the second constant temperature heater thereafter.
Even at the time of the N / OFF operation, the temperature fluctuation of the detector is small and the constant temperature control can be performed with high accuracy.
【0010】[0010]
【発明の実施の形態】以下、図面を参照して本発明の実
施形態を説明するが、その前に、本発明装置が適用され
るX線検出器を備えたX線CTスキャナの一例を図7を
参照して説明しておく。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described with reference to the drawings, but before that, an example of an X-ray CT scanner provided with an X-ray detector to which the present invention is applied will be described. This will be described with reference to FIG.
【0011】図7は上記X線CTスキャナの一例を寝台
側から示す正面図で、この図7に示すように、X線CT
スキャナ100の内部は次のように構成されている。す
なわち、X線管球101の対向位置にはX線検出器10
4が配置され、X線管球101から照射されたX線は、
コリメータユニット102によりスライス方向(スキャ
ナ奥行方向)厚さに狭められたX線ビーム103とされ
る。FIG. 7 is a front view showing an example of the X-ray CT scanner from the bed side. As shown in FIG.
The inside of the scanner 100 is configured as follows. That is, the X-ray detector 10 is located at a position facing the X-ray tube 101.
4 are arranged, and the X-ray emitted from the X-ray tube 101 is
The X-ray beam 103 is narrowed by the collimator unit 102 in the slice direction (the depth direction of the scanner).
【0012】検出器104は被検体(図示せず)を透過
したX線ビーム103を各ch毎に電気信号に変換す
る。そして、これらの電気信号は検出回路ユニット10
5によって各ch毎増幅され、そのアナログ信号はA/
D変換回路によりデジタル信号に順次変換される。The detector 104 converts the X-ray beam 103 transmitted through the subject (not shown) into an electric signal for each channel. These electric signals are transmitted to the detection circuit unit 10
5 and the analog signal is amplified by A /
The signals are sequentially converted into digital signals by a D conversion circuit.
【0013】このX線管球101、コリメータユニット
102、検出器104及び検出回路ユニット105は回
転ベース106上に配置固定され、この回転ベース10
6はベアリング構造をもった回転軸受け107によりス
キャナベース108に固定されている。The X-ray tube 101, collimator unit 102, detector 104 and detection circuit unit 105 are arranged and fixed on a rotating base 106.
Reference numeral 6 is fixed to the scanner base 108 by a rotating bearing 107 having a bearing structure.
【0014】以上により、回転ベース106は自由に回
転することが可能となり、したがってX線管球101、
コリメータユニット102、検出器104及び検出回路
ユニット105が一体となって回転して被検体全周方向
からの計測ができる。そしてこれらの計測データは図示
しない画像処理装置に順次送られ、画像再構成がなされ
る。なお、109はスキャナスタンドである。As described above, the rotation base 106 can freely rotate, and therefore, the X-ray tube 101,
The collimator unit 102, the detector 104, and the detection circuit unit 105 rotate integrally, and can measure from the entire circumference of the subject. These measurement data are sequentially sent to an image processing device (not shown) to perform image reconstruction. Reference numeral 109 denotes a scanner stand.
【0015】図1は、本発明によるX線検出器恒温化装
置の第1実施形態が適用されたX線検出器を示す構成図
である。ここでは、X線検出器として代表的な電離箱型
検出器を例に採り、そのX線スライス方向の断面を示し
ている。FIG. 1 is a configuration diagram showing an X-ray detector to which a first embodiment of an X-ray detector thermostat according to the present invention is applied. Here, a representative ionization chamber type detector is taken as an example of the X-ray detector, and a cross section in the X-ray slice direction is shown.
【0016】この図1において、X線ビーム103は検
出器ケース3のX線入射口から入射され、検出器ケース
3内の信号電極板6に到達する。この信号電極板6と信
号電極板6の両側面に平行して配置された高圧電極板
(図示せず)は、電極板サポート用絶縁板5により固定
されている。これら電極板及び絶縁板5は複数の検出素
子の集合体である検出器ブロックとして固定台4に固定
され、この固定台4が信号取出し基板2を共締めの形で
検出器ケース蓋1に固定されている。よって、この検出
器ケース蓋1と検出器ケース3が完全にねじ等で固定さ
れるとこの検出器ケース3内の空間は密閉状態になり、
この空間にキセノン等の不活性ガスが充填されている。In FIG. 1, an X-ray beam 103 enters from an X-ray entrance of a detector case 3 and reaches a signal electrode plate 6 in the detector case 3. The signal electrode plate 6 and a high-voltage electrode plate (not shown) arranged parallel to both side surfaces of the signal electrode plate 6 are fixed by an insulating plate 5 for supporting the electrode plate. The electrode plate and the insulating plate 5 are fixed to a fixed base 4 as a detector block which is an aggregate of a plurality of detection elements, and the fixed base 4 is fixed to the detector case lid 1 in a form of fastening the signal extraction board 2 together. Have been. Therefore, when the detector case lid 1 and the detector case 3 are completely fixed with screws or the like, the space in the detector case 3 becomes a sealed state,
This space is filled with an inert gas such as xenon.
【0017】これにより、信号電極板6に達したX線ビ
ーム103は上記キセノンガスを電離分解させることか
ら、この時の電離イオン群が上記高圧電極板に印加され
た電圧により信号電極板6に到達し電流信号として検出
される。これら各検出chの電離信号は信号取出し線7
により信号取出し基板2上の導電体パターンに導かれ、
個々に検出器コネクタ(信号取出しコネクタ)8によっ
て検出器外部に電流信号が取り出される構成となってい
る。As a result, the x-ray beam 103 that has reached the signal electrode plate 6 ionizes and decomposes the xenon gas, so that the ionized ions at this time are applied to the signal electrode plate 6 by the voltage applied to the high voltage electrode plate. It reaches and is detected as a current signal. The ionization signal of each of these detection channels is supplied to a signal extraction line 7.
Is led to the conductor pattern on the signal extraction board 2 by
A current signal is extracted to the outside of the detector by the detector connector (signal extraction connector) 8 individually.
【0018】ここで、第1温度センサ13は外気温測定
に用いるため検出器に接しない周辺空間に配置され、ま
た第1恒温化ヒータ12、第2恒温化ヒータ9及び第2
温度センサ10は検出器ケース3の一部に取り付けられ
る(検出器ケース蓋1又は固定台4の一部でも取付け
可)。また、恒温化能力をより向上させるためには断熱
材14を検出器蓋1と検出器ケース3を覆うように配置
してもよい。これら恒温化ヒータ12,9と温度センサ
10には個々に独立した第1温度制御ユニット11−b
と第2温度制御ユニット11−aが接続され、ヒータ1
2,9の電源である商用電源(100V交流電源)や直
流電源が供給される。ここで、恒温化ヒータ9,12と
してはシート状態で折曲げ性に優れた例えばオーエム社
製のシリコンラバーヒータが、温度制御ユニット11−
a,11−bとしては例えばオムロン社製E5CS−Q
1G等の温度コントローラ等が好適である。Here, the first temperature sensor 13 is disposed in a peripheral space which is not in contact with the detector for use in measuring the outside air temperature, and the first constant temperature heater 12, the second constant temperature heater 9 and the second constant temperature heater 9 are provided.
The temperature sensor 10 is attached to a part of the detector case 3 (a part of the detector case cover 1 or the fixing base 4 can be attached). Further, in order to further improve the constant temperature capability, the heat insulating material 14 may be disposed so as to cover the detector lid 1 and the detector case 3. Each of these constant temperature heaters 12 and 9 and the temperature sensor 10 has an independent first temperature control unit 11-b.
And the second temperature control unit 11-a are connected, and the heater 1
A commercial power supply (100 V AC power supply) or a DC power supply as the power supplies 2 and 9 is supplied. Here, as the constant temperature heaters 9 and 12, for example, a silicon rubber heater made by OM Co., which is excellent in bendability in a sheet state, is a temperature control unit 11-.
As a and 11-b, for example, E5CS-Q manufactured by OMRON Corporation
A 1G or other temperature controller is suitable.
【0019】この温度制御ユニット11−a,11−b
は、温度センサ10,13での温度を検知して、予め個
々に設定した設定温度より低い場合はヒータ9,12に
電源を供給(ON)し、設定温度より高い場合はヒータ
9,12への電源供給をストップ(OFF)する動作を
繰り返す。ここでは両者個別にヒータON/OFF制御
設定温度が設定され、図2に示すような温度制御がなさ
れる。The temperature control units 11-a and 11-b
Detects the temperatures of the temperature sensors 10 and 13 and supplies power (ON) to the heaters 9 and 12 when the temperature is lower than a preset temperature individually set, and supplies power to the heaters 9 and 12 when the temperature is higher than the preset temperature. The operation of stopping (OFF) the power supply is repeated. Here, the heater ON / OFF control set temperature is set individually for both, and the temperature control as shown in FIG. 2 is performed.
【0020】すなわち、第1温度制御ユニット11−b
には第1設定温度TLが設定され、第2温度制御ユニッ
ト11−aには第1設定温度TLより高い第2設定温度
THが設定されている。かつ、第2温度制御ユニット1
1−aでの設定温度THは第2恒温化ヒータ9のON動
作によって検出器ケース3の温度上昇が飽和状態に至る
温度より若干低い値又は飽和温度より確実に低い温度に
設定され、かつ第1,第2恒温化ヒータ12,9の両者
がON動作でも第2設定温度THを超えないことが重要
である。よって、個々の検出器形状と検出器の使用外気
温に応じて第1及び第2恒温化ヒータ容量と第1及び第
2設定温度値が最適化されている。That is, the first temperature control unit 11-b
Is set to the first set temperature TL, and the second set temperature TH higher than the first set temperature TL is set to the second temperature control unit 11-a. And the second temperature control unit 1
The set temperature TH in 1-a is set to a value slightly lower than the temperature at which the temperature rise of the detector case 3 reaches the saturation state or to a temperature definitely lower than the saturation temperature by the ON operation of the second constant temperature heater 9, and It is important that the first set temperature TH does not exceed the second set temperature TH even when both the first and second constant temperature heaters 12 and 9 are ON. Therefore, the first and second constant temperature heater capacities and the first and second set temperature values are optimized according to the shape of each detector and the outside air temperature of the detector.
【0021】このような恒温化構造における詳細動作に
ついて以下に説明する。まず、ヒータON動作前の検出
器ケース蓋1、検出器ケース3及び固定台4の温度は外
気温とほぼ同じ値になっている。よって恒温化制御にお
ける動作状態としては以下のパターンA〜Eの5状態が
ある。The detailed operation of the constant temperature structure will be described below. First, the temperatures of the detector case lid 1, the detector case 3, and the fixed base 4 before the heater ON operation are substantially the same as the outside air temperature. Therefore, there are the following five states of patterns A to E as operating states in the temperature control.
【0022】パターンA状態:外気温が絶えず第1設定
温度TL以下の場合 第1,第2恒温化ヒータ12,9の両者がON動作にな
り、これによる高容量ヒータで素速く検出器ケース温度
が上昇するが、検出器ケース温度が第2設定温度THに
近づくと温度上昇が緩やかになり、第2設定温度TH温
度に達した後は第2恒温化ヒータ9のみON/OFF動
作を繰り返す。Pattern A state: when the outside air temperature is constantly below the first set temperature TL, both the first and second constant temperature heaters 12 and 9 are turned on, and the detector case temperature is rapidly increased by the high capacity heater. However, when the detector case temperature approaches the second set temperature TH, the temperature rise becomes gentle, and after reaching the second set temperature TH, only the second constant temperature heater 9 repeats the ON / OFF operation.
【0023】パターンB状態:最初外気温が第1設定温
度TL以下で、その後、第1設定温度TL以上第2設定
温度TH以下になる場合 第1,第2恒温化ヒータ12,9の両者がON動作にな
り、これによる高容量ヒータで素速く検出器ケース温度
が上昇するが、検出器ケース温度が第2設定温度THに
近づくと温度上昇が緩やかになり、第2設定温度TH温
度に達した後は第2恒温化ヒータ9のみON/OFF動
作を繰り返す。その後、外気温が第1設定温度TL以上
になると第1恒温化ヒータ12はOFF動作、第2恒温
化ヒータ9のみON/OFF動作を繰り返す。Pattern B state: First, when the outside air temperature is equal to or lower than the first set temperature TL, and then becomes equal to or higher than the first set temperature TL and equal to or lower than the second set temperature TH. Both the first and second constant temperature heaters 12 and 9 are turned on. The detector case temperature is quickly increased by the high-capacity heater due to the ON operation. However, when the detector case temperature approaches the second set temperature TH, the temperature rise becomes gentle and reaches the second set temperature TH temperature. After that, only the second constant temperature heater 9 repeats the ON / OFF operation. Thereafter, when the outside air temperature becomes equal to or higher than the first set temperature TL, the first constant temperature heater 12 repeats the OFF operation, and only the second constant temperature heater 9 repeats the ON / OFF operation.
【0024】パターンC状態:最初外気温が第1設定温
度TL前後で変動する場合 第1,第2恒温化ヒータ12,9の両者がON/OFF
動作を繰り返す。Pattern C state: First, when the outside air temperature fluctuates around the first set temperature TL, both the first and second constant temperature heaters 12 and 9 are turned on / off.
Repeat the operation.
【0025】パターンD状態:最初から外気温が第1設
定温度TL以上第2設定温度TH以下で変動する場合 第1恒温化ヒータ12は絶えずOFF動作。第2恒温化
ヒータ9のみON動作で検出器ケース温度を上昇させ、
検出器ケース温度が第2設定温度THに近づくと温度上
昇が緩やかになり、第2設定温度TH温度に達した後は
第2恒温化ヒータ9のみON/OFF動作を繰り返す。Pattern D state: When the outside air temperature fluctuates from the first set temperature TL to the second set temperature TH from the beginning, the first constant temperature heater 12 is constantly turned off. Only the second constant temperature heater 9 is turned ON to raise the detector case temperature,
When the detector case temperature approaches the second set temperature TH, the temperature rise becomes gentle, and after reaching the second set temperature TH, only the second constant temperature heater 9 repeats the ON / OFF operation.
【0026】パターンE状態:最初から外気温が第2設
定温度TH以上で変動する場合 第1,第2恒温化ヒータ12,9共、OFF動作。検出
器ケース温度は外気温と共に変動する。Pattern E state: when the outside air temperature fluctuates above the second set temperature TH from the beginning Both the first and second constant temperature heaters 12 and 9 are turned off. The detector case temperature fluctuates with the outside air temperature.
【0027】一般には検出器恒温化における第2設定温
度THは外気温の最大値より大きい値に設定することに
より、原則的には上記パターンEの動作状態をなくすこ
とが可能である。以上の動作によって、より広範囲の外
気温変化条件でも迅速,高精度に検出器ケースた恒温化
される。Generally, by setting the second set temperature TH in the constant temperature detector to a value larger than the maximum value of the outside air temperature, the operation state of the pattern E can be basically eliminated. With the above operation, the temperature of the detector case can be quickly and accurately adjusted even under a wider range of outside temperature change conditions.
【0028】図3は、本発明装置の第2実施形態が適用
されたX線検出器を示す構成図である。この図3におい
て、図2と同一符号は同一又は相当部分を示す。図1の
例では、第1温度制御ユニット11−b及び第2温度制
御ユニット11−aとして市販品を用い独立に温度制御
していた。ここでの温度制御ユニット(ヒータ給電削減
切替型温度制御ユニット)11−1は、各種温度センサ
増幅回路と温度判定回路並びにヒータ給電用リレー回路
等の制御回路を組み込んで図1の例での温度制御を可能
とした点で図1の例とは異なる。ロジック的なハード制
御の他、温度センサを組み込んだ工業用マイクロコンピ
ュータ(日立社製SHマイコン等)でのプログラムによ
る温度制御にも対応可能である。FIG. 3 is a configuration diagram showing an X-ray detector to which the second embodiment of the present invention is applied. 3, the same reference numerals as those in FIG. 2 indicate the same or corresponding parts. In the example of FIG. 1, a commercially available product is used as the first temperature control unit 11-b and the second temperature control unit 11-a, and the temperature is controlled independently. The temperature control unit (heater feed reduction switching type temperature control unit) 11-1 here incorporates various temperature sensor amplifier circuits, a temperature determination circuit, and a control circuit such as a heater power supply relay circuit and the like. It differs from the example of FIG. 1 in that control is enabled. In addition to logic-based hardware control, temperature control by a program using an industrial microcomputer (such as an SH microcomputer manufactured by Hitachi, Ltd.) incorporating a temperature sensor can be supported.
【0029】ここでは、第1,第2温度センサ13,1
0の両者で温度検知して個々に、すなわち、第1温度セ
ンサ13の温度測定値に応じて第1恒温化ヒータ12の
ON/OFF制御を、また第2温度センサ10の温度測
定値に応じて第2恒温化ヒータ9へのON/OFF制御
を行う温度制御機能をもたせてある。すなわち温度制御
ユニット11−1は、第1設定温度TLと第2設定温度
THが設定されており、第1,第2温度センサ13,1
0による温度測定値が第1設定温度TL,第2設定温度
THより低い場合はヒータ12,9に電源を供給(O
N)し、第1設定温度TL,第2設定温度THより高い
場合はヒータ12,9への電源供給をストップ(OF
F)する動作を繰り返す(図2参照)。よって本例でも
図1の例と全く同じ温度制御が可能である。Here, the first and second temperature sensors 13, 1
0, the temperature is detected individually by both of them, that is, ON / OFF control of the first constant temperature heater 12 according to the temperature measurement value of the first temperature sensor 13, and according to the temperature measurement value of the second temperature sensor 10. In addition, a temperature control function for controlling ON / OFF of the second constant temperature heater 9 is provided. That is, in the temperature control unit 11-1, the first set temperature TL and the second set temperature TH are set, and the first and second temperature sensors 13, 1 are set.
When the measured temperature value of 0 is lower than the first set temperature TL and the second set temperature TH, power is supplied to the heaters 12 and 9 (O
N), and when the temperature is higher than the first set temperature TL and the second set temperature TH, the power supply to the heaters 12 and 9 is stopped (OF).
F) Repeat the operation (see FIG. 2). Therefore, in this embodiment, the same temperature control as in the embodiment of FIG. 1 is possible.
【0030】なお、図1及び図3の例では恒温化ヒータ
として別個独立の複数(ここでは2個)の恒温化ヒータ
12,10を用いたが、これのみに限定されることはな
い。例えば、図4に示すように、共通の1枚のヒータシ
ート9−1内に複数(ここでは2回路)の発熱体9−
2,9−3を配置し、個々の発熱体9−2,9−3に独
立した供給電源路9−4,9−4が配置された1個の発
熱体切替型ヒータ91を用いてもよい。この場合は、第
1恒温化ヒータ12の代わりに発熱体9−2を用い、第
2恒温化ヒータ9の代わりに発熱体9−3を用いること
になる。基本動作としては、温度制御ユニット11−1
は第1温度センサ13により外気温を検知してそれが第
1設定温度TLより低い場合に発熱体9−2に給電を行
い(ONし)、逆に第1設定温度TLより高い場合に発
熱体9−2への給電をストップ(OFF)する動作を繰
り返す。また、同様に第2温度センサ10により検出器
ケース温度を検知してそれが第2設定温度THより低い
場合に発熱体9−3に給電を行い(ONし)、逆に第2
設定温度THより高い場合に発熱体9−3への給電をス
トップ(OFF)する動作を繰り返す。よって本例でも
図1の例と全く同じ温度制御が可能である。In the examples shown in FIGS. 1 and 3, a plurality (two in this case) of constant temperature heaters 12 and 10 are used as constant temperature heaters, but the invention is not limited thereto. For example, as shown in FIG. 4, a plurality of (here, two circuits) heating elements 9-9 are provided in one common heater sheet 9-1.
2, 9-3, and a single heating element switching type heater 91 in which individual heating elements 9-2, 9-3 are provided with independent power supply paths 9-4, 9-4. Good. In this case, a heating element 9-2 is used instead of the first constant temperature heater 12, and a heating element 9-3 is used instead of the second constant temperature heater 9. As a basic operation, the temperature control unit 11-1
Detects the outside air temperature by the first temperature sensor 13 and supplies power to the heating element 9-2 when it is lower than the first set temperature TL (ON), and generates heat when it is higher than the first set temperature TL. The operation of stopping (OFF) the power supply to the body 9-2 is repeated. Similarly, the detector case temperature is detected by the second temperature sensor 10, and when it is lower than the second set temperature TH, power is supplied to the heating element 9-3 (ON), and conversely, the second case is turned on.
When the temperature is higher than the set temperature TH, the operation of stopping (OFF) the power supply to the heating element 9-3 is repeated. Therefore, in this embodiment, the same temperature control as in the embodiment of FIG. 1 is possible.
【0031】図5は、本発明置の第3実施形態が適用さ
れたX線検出器を示す構成図である。この図5におい
て、図2と同一符号は同一又は相当部分を示す。ここで
は、温度制御ユニット(ヒータ給電電力切替型温度制御
ユニット)11−2は温度センサ10により検出器ケー
ス温度を検知して個々の設定温度条件下で恒温化ヒータ
9への供給電源電力(給電電力)を制御し恒温化ヒータ
9に給電を行う。給電電力の制御方法については、電源
電圧又は電源電流、あるいは両者共制御する方法であっ
てもよい。FIG. 5 is a configuration diagram showing an X-ray detector to which the third embodiment of the present invention is applied. 5, the same reference numerals as those in FIG. 2 indicate the same or corresponding parts. Here, the temperature control unit (heater power supply power switching type temperature control unit) 11-2 detects the detector case temperature by the temperature sensor 10 and supplies power supply power (power supply) to the constant temperature heater 9 under each set temperature condition. Power) to supply power to the constant temperature heater 9. The power supply power may be controlled by a method of controlling the power supply voltage or the power supply current, or both.
【0032】すなわち温度制御ユニット11−2は、基
本動作として、最初恒温化ヒータ9の給電電力を高電力
のWHにし、ヒータ9の高熱量により素速く検出器ケー
ス温度を上昇させる。検出器ケース温度が第1設定温度
TL温度に達した後は給電電力をWLに下げ、緩やかな
温度上昇に変える。検出器ケース温度が第2設定温度T
Hに達した後はヒータ9の給電を完全に0とし、その
後、第2設定温度TH付近でのON/OFF動作(HL
給電)を繰り返す。That is, as a basic operation, the temperature control unit 11-2 first sets the power supplied to the constant temperature heater 9 to high power WH, and quickly raises the temperature of the detector case due to the high calorific value of the heater 9. After the detector case temperature reaches the first set temperature TL, the power supply is reduced to WL and changed to a gradual rise in temperature. The detector case temperature is equal to the second set temperature T
H, the power supply of the heater 9 is completely set to 0, and then the ON / OFF operation (HL) near the second set temperature TH is performed.
Power supply) is repeated.
【0033】図11は、本発明装置における恒温化ヒー
タON後の検出器ケース温度の時間的変化の例を示すグ
ラフである。FIG. 11 is a graph showing an example of a temporal change of the detector case temperature after the constant temperature heater is turned on in the apparatus of the present invention.
【0034】なお、上述例では本発明装置が適用される
X線検出器として電離箱型検出器を例に採ったが、固体
検出器にも同様に本発明装置を適用することができる。
また、温度設定及び供給電力制御(切替)方法も単純化
のため2値しきい値制御としたが、これを複数に設定し
たり、あるいは段階的制御でなく曲線温度対応にしても
よく、これによれば、種々の温度に対してより緻密な温
度制御が可能になる。In the above example, an ionization chamber type detector is taken as an example of an X-ray detector to which the present invention is applied. However, the present invention can be applied to a solid state detector as well.
In addition, the temperature setting and the supply power control (switching) method are binary threshold control for simplicity. However, the threshold value control may be set to a plurality of values, or a curve temperature may be used instead of stepwise control. According to this, more precise temperature control for various temperatures becomes possible.
【0035】[0035]
【発明の効果】以上説明したように本発明によれば、よ
り広範囲の外気温変化条件でも迅速,高精度に検出器ケ
ースを恒温化でき、リングアーチファクト発生のない高
画質なX線CT画像が得られるX線検出器になし得ると
いう効果がある。As described above, according to the present invention, the temperature of the detector case can be quickly and accurately adjusted even under a wider range of outside air temperature change, and a high-quality X-ray CT image free from ring artifacts can be obtained. There is an effect that the X-ray detector can be obtained.
【図1】本発明装置の第1実施形態が適用されたX線検
出器を示す構成図である。FIG. 1 is a configuration diagram showing an X-ray detector to which a first embodiment of the device of the present invention is applied.
【図2】図1に示した本発明装置の動作説明図である。FIG. 2 is an operation explanatory view of the apparatus of the present invention shown in FIG. 1;
【図3】本発明装置の第2実施形態が適用されたX線検
出器を示す構成図である。FIG. 3 is a configuration diagram illustrating an X-ray detector to which a second embodiment of the device of the present invention is applied.
【図4】図1及び図3の例における恒温化ヒータの他の
例を示す平面図である。FIG. 4 is a plan view showing another example of the constant temperature heater in the examples of FIGS. 1 and 3.
【図5】本発明装置の第3実施形態が適用されたX線検
出器を示す構成図である。FIG. 5 is a configuration diagram showing an X-ray detector to which a third embodiment of the device of the present invention is applied.
【図6】図5に示した本発明装置の動作説明図である。6 is an operation explanatory view of the device of the present invention shown in FIG. 5;
【図7】本発明装置が適用されるX線検出器を備えたX
線CTスキャナの一例を示す正面図である。FIG. 7 shows an X-ray having an X-ray detector to which the apparatus of the present invention is applied.
It is a front view showing an example of a line CT scanner.
【図8】従来装置を備えてなるX線検出器を示す構成図
である。FIG. 8 is a configuration diagram showing an X-ray detector including a conventional device.
【図9】図8に示した従来装置の動作説明図である。FIG. 9 is an operation explanatory diagram of the conventional device shown in FIG. 8;
【図10】従来装置における恒温化ヒータON後の検出
器ケース温度の時間的変化を示すグラフである。FIG. 10 is a graph showing a temporal change of a detector case temperature after a constant temperature heater is turned on in a conventional apparatus.
【図11】本発明装置における恒温化ヒータON後の検
出器ケース温度の時間的変化を示すグラフである。FIG. 11 is a graph showing a temporal change of a detector case temperature after the constant temperature heater is turned on in the apparatus of the present invention.
1 検出器ケース蓋 2 信号取出し基板 3 検出器ケース 4 固定台 5 絶縁板 6 信号電極板 7 信号取出し線 8 検出器コネクタ(信号取出しコネクタ) 9 第2恒温化ヒータ 91 発熱体切替型ヒータ 9−1 ヒータシート 9−2,9−3 発熱体 10 第2温度センサ 11 温度制御ユニット 11−a 第2温度制御ユニット 11−b 第1温度制御ユニット 11−1 ヒータ給電削減切替型温度制御ユニット 11−2 ヒータ給電電力切替型温度制御ユニット 12 第1恒温化ヒータ 13 第1温度センサ 14 断熱材 100 X線CTスキャナ 101 X線管球 102 コリメータユニット 103 X線ビーム 104 X線検出器 105 検出回路ユニット 106 回転ベース 107 回転軸受け 108 スキャナベース 109 スキャナスタンド DESCRIPTION OF SYMBOLS 1 Detector case cover 2 Signal extraction board 3 Detector case 4 Fixing stand 5 Insulating plate 6 Signal electrode plate 7 Signal extraction line 8 Detector connector (signal extraction connector) 9 Second constant temperature heater 91 Heating element switching type heater 9- DESCRIPTION OF SYMBOLS 1 Heater sheet 9-2, 9-3 Heating element 10 2nd temperature sensor 11 Temperature control unit 11-a 2nd temperature control unit 11-b 1st temperature control unit 11-1 Heater feed reduction switching type temperature control unit 11- 2 Heater power supply switching type temperature control unit 12 First constant temperature heater 13 First temperature sensor 14 Insulation material 100 X-ray CT scanner 101 X-ray tube 102 Collimator unit 103 X-ray beam 104 X-ray detector 105 Detection circuit unit 106 Rotation base 107 Rotation bearing 108 Scanner base 109 Scanner stand
Claims (3)
個以上の第1恒温化ヒータと、前記検出器ケースの外方
近傍位置に配置された1個以上の第1温度センサと、こ
の第1温度センサによる検出器周囲外気温の測定値に応
じて前記第1恒温化ヒータに供給する電源をON/OF
F制御して検出器ケース温度を第1設定温度まで上昇さ
せる第1温度制御ユニットと、前記検出器ケースの一部
に取り付けられた1個以上の第2恒温化ヒータと、前記
検出器ケースの一部に取り付けられた1個以上の第2温
度センサと、この第2温度センサによる検出器ケース温
度を測定値に応じて前記第2恒温化ヒータに供給する電
源をON/OFF制御して検出器ケース温度を前記第1
設定温度と第2設定温度の範囲内に保持させる第2温度
制御ユニットとを具備することを特徴とするX線検出器
恒温化装置。1. A device mounted on a part of a detector case.
One or more first temperature-maintaining heaters, one or more first temperature sensors arranged at positions near the outside of the detector case, and a detector ambient temperature measured by the first temperature sensor. Turn ON / OF the power supplied to the first constant temperature heater
A first temperature control unit for performing F control to raise the detector case temperature to a first set temperature; one or more second constant temperature heaters attached to a part of the detector case; One or more second temperature sensors attached to a part thereof and a detector case temperature detected by the second temperature sensor detected by ON / OFF control of a power supply to the second constant temperature heater in accordance with a measured value. Vessel case temperature to the first
An X-ray detector thermostat, comprising: a set temperature and a second temperature control unit for maintaining the set temperature within a range between the set temperature and the second set temperature.
数個の恒温化ヒータと、前記検出器ケースの外方近傍位
置に配置された1個以上の第1温度センサと、前記検出
器ケースの一部に取り付けられた1個以上の第2温度セ
ンサと、前記第1温度センサによる検出器周囲外気温の
測定値に応じて前記複数個の恒温化ヒータに供給する電
源をON/OFF制御して検出器ケース温度を第1設定
温度まで上昇させ、第1設定温度到達後前記複数個の恒
温化ヒータのうちの所定の恒温化ヒータへの電源供給路
を遮断して動作ヒータ数を少なくし、この間前記第2温
度センサによる検出器ケース温度の測定値に応じて前記
恒温化ヒータに供給する電源をON/OFF制御して検
出器ケース温度を前記第1設定温度と第2設定温度の範
囲内に保持させるヒータ給電削減切替型温度制御ユニッ
トとを具備することを特徴とするX線検出器恒温化装
置。2. A plurality of constant temperature heaters attached to a part of a detector case, one or more first temperature sensors arranged at a position near the outside of the detector case, and the detector case. ON / OFF control of power supply to one or more second temperature sensors attached to a part of the heater and power supply to the plurality of constant temperature heaters in accordance with a measurement value of the ambient temperature around the detector by the first temperature sensor. The detector case temperature is raised to a first set temperature, and after reaching the first set temperature, the power supply path to a predetermined constant temperature heater among the plurality of constant temperature heaters is cut off to reduce the number of operating heaters. During this time, the power supply to the constant temperature heater is controlled to be ON / OFF in accordance with the measured value of the detector case temperature by the second temperature sensor to control the detector case temperature between the first set temperature and the second set temperature. To keep it within the range An X-ray detector thermostat comprising: a power supply reduction switching type temperature control unit.
に複数個の発熱体が配置され、個々の発熱体に独立に電
源供給路が形成され、個々の電源供給路への電源切替制
御で複数種の発熱容量を組み合せることが可能な発熱体
切替型ヒータである請求項1又は2に記載のX線検出器
恒温化装置。3. A constant temperature heater includes a plurality of heating elements arranged on a single heater sheet, a power supply path formed independently for each heating element, and power supply switching control for each power supply path. The X-ray detector thermostat according to claim 1 or 2, wherein the heater is a heating element switching type heater capable of combining a plurality of types of heating capacities.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24547896A JP3816992B2 (en) | 1996-08-29 | 1996-08-29 | X-ray detector thermostat |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24547896A JP3816992B2 (en) | 1996-08-29 | 1996-08-29 | X-ray detector thermostat |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1073668A true JPH1073668A (en) | 1998-03-17 |
| JP3816992B2 JP3816992B2 (en) | 2006-08-30 |
Family
ID=17134266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24547896A Expired - Fee Related JP3816992B2 (en) | 1996-08-29 | 1996-08-29 | X-ray detector thermostat |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3816992B2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004057834A (en) * | 2002-07-30 | 2004-02-26 | Ge Medical Systems Global Technology Co Llc | Thermoelectrically controlled x-ray detector array |
| JP2007263804A (en) * | 2006-03-29 | 2007-10-11 | Toshiba Corp | Radiation measurement apparatus and radiation measurement method |
| JP2012034848A (en) * | 2010-08-06 | 2012-02-23 | Toshiba Corp | X-ray detector and x-ray ct scanner |
| CN102688047A (en) * | 2011-03-24 | 2012-09-26 | 佳能株式会社 | Image pickup apparatus, image pickup system, and method for controlling the same |
| JP2013158448A (en) * | 2012-02-03 | 2013-08-19 | Toshiba Corp | X-ray ct apparatus |
| GB2501516A (en) * | 2012-04-26 | 2013-10-30 | Vision Rt Ltd | Climate controlled stereoscopic camera system |
| JP2015164483A (en) * | 2014-03-03 | 2015-09-17 | 三田理化工業株式会社 | Mother milk sterilizer |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101724138B1 (en) * | 2016-06-20 | 2017-04-07 | (주)디엠티 | Radiation detection instrument for non-destructive inspection |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5643932A (en) * | 1979-09-14 | 1981-04-22 | Tokyo Shibaura Electric Co | Computer tomography apparatus |
| JPS61201182A (en) * | 1985-03-04 | 1986-09-05 | Hitachi Medical Corp | Multi-element detector for x-ray ct device |
| JPS623684A (en) * | 1985-06-29 | 1987-01-09 | Hitachi Medical Corp | Detector for x-ray ct equipment |
-
1996
- 1996-08-29 JP JP24547896A patent/JP3816992B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5643932A (en) * | 1979-09-14 | 1981-04-22 | Tokyo Shibaura Electric Co | Computer tomography apparatus |
| JPS61201182A (en) * | 1985-03-04 | 1986-09-05 | Hitachi Medical Corp | Multi-element detector for x-ray ct device |
| JPS623684A (en) * | 1985-06-29 | 1987-01-09 | Hitachi Medical Corp | Detector for x-ray ct equipment |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004057834A (en) * | 2002-07-30 | 2004-02-26 | Ge Medical Systems Global Technology Co Llc | Thermoelectrically controlled x-ray detector array |
| JP2007263804A (en) * | 2006-03-29 | 2007-10-11 | Toshiba Corp | Radiation measurement apparatus and radiation measurement method |
| JP2012034848A (en) * | 2010-08-06 | 2012-02-23 | Toshiba Corp | X-ray detector and x-ray ct scanner |
| CN102688047A (en) * | 2011-03-24 | 2012-09-26 | 佳能株式会社 | Image pickup apparatus, image pickup system, and method for controlling the same |
| JP2013158448A (en) * | 2012-02-03 | 2013-08-19 | Toshiba Corp | X-ray ct apparatus |
| GB2501516A (en) * | 2012-04-26 | 2013-10-30 | Vision Rt Ltd | Climate controlled stereoscopic camera system |
| US9736465B2 (en) | 2012-04-26 | 2017-08-15 | Vision Rt Limited | 3D camera system |
| GB2501516B (en) * | 2012-04-26 | 2017-11-29 | Vision Rt Ltd | 3D Camera system |
| JP2015164483A (en) * | 2014-03-03 | 2015-09-17 | 三田理化工業株式会社 | Mother milk sterilizer |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3816992B2 (en) | 2006-08-30 |
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