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NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
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Filing date
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Application filed by NEC Corp, Nippon Electric Co LtdfiledCriticalNEC Corp
Priority to JP9969577ApriorityCriticalpatent/JPS5432980A/en
Publication of JPS5432980ApublicationCriticalpatent/JPS5432980A/en
Testing Of Individual Semiconductor Devices
(AREA)
Abstract
PURPOSE: To calibrate a devide by using a delay-time and polarity inverting methode composed of a delay-time-known passive element a calibrating method when discriminator at the start side and at stop side are selected with both polarities opposite.
COPYRIGHT: (C)1979,JPO&Japio
JP9969577A1977-08-191977-08-19Calibrating method for testing device for switching time
PendingJPS5432980A
(en)