JPS5513924A - Semiconductor photoelectronic conversion device - Google Patents
Semiconductor photoelectronic conversion deviceInfo
- Publication number
- JPS5513924A JPS5513924A JP8657278A JP8657278A JPS5513924A JP S5513924 A JPS5513924 A JP S5513924A JP 8657278 A JP8657278 A JP 8657278A JP 8657278 A JP8657278 A JP 8657278A JP S5513924 A JPS5513924 A JP S5513924A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- substrate
- incident light
- gate region
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006243 chemical reaction Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- 238000001514 detection method Methods 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 230000006698 induction Effects 0.000 abstract 1
- 238000005192 partition Methods 0.000 abstract 1
- 230000003068 static effect Effects 0.000 abstract 1
Landscapes
- Junction Field-Effect Transistors (AREA)
- Light Receiving Elements (AREA)
Abstract
PURPOSE: To derive the intensity of the incident light as an electric signal by varying an effective gate voltage with storing a carrier inonized by the incident light in the gate region of a static induction transistor SIT used for a light senser.
CONSTITUTION: A n- epi-layer 2 and a p+ gate region 3 are provided on a n+Si substrate 1 and a n- epi-layer 4 and a thin n+-layer 5 are laminated on the substrate 1. An electrode 15 and 11 are formed on the full back surface of the substrate 1 and the upper circumference face of the layer 5. The n+-layer 5 is drained to the substrate 1. The n+-layer 5 having the thickness of 0.5μm about is used to prevent attenuation of the incident light, the n--layer 4 having a high resistance against a tension by reducing the density of the impurity, has the thickness of 10μm about to permit the major of the positive holes inonized by the incident light to reach to the gate region. The distance between the meshes on the gate region is set less than 5μm about to form the partition having the sufficient potential by the deflation layer in a multichannel. According to such a composition, the gate is made in a capacity bonding type particularly, the operational range is extended, the device can be operated effective for the light detection over a wide range of intensity.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8657278A JPS5513924A (en) | 1978-07-14 | 1978-07-14 | Semiconductor photoelectronic conversion device |
| US06/039,445 US4427990A (en) | 1978-07-14 | 1979-05-15 | Semiconductor photo-electric converter with insulated gate over p-n charge storage region |
| US07/332,441 US5019876A (en) | 1978-07-14 | 1989-04-04 | Semiconductor photo-electric converter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8657278A JPS5513924A (en) | 1978-07-14 | 1978-07-14 | Semiconductor photoelectronic conversion device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5513924A true JPS5513924A (en) | 1980-01-31 |
| JPS6250992B2 JPS6250992B2 (en) | 1987-10-28 |
Family
ID=13890720
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8657278A Granted JPS5513924A (en) | 1978-07-14 | 1978-07-14 | Semiconductor photoelectronic conversion device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5513924A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5893386A (en) * | 1981-11-30 | 1983-06-03 | Semiconductor Res Found | Semiconductor photoelectric conversion device |
| JPS5895877A (en) * | 1981-12-01 | 1983-06-07 | Semiconductor Res Found | Semiconductor photoelectric conversion device |
| DE3344637A1 (en) * | 1982-12-11 | 1984-06-14 | Nishizawa, Jun-Ichi, Sendai, Miyagi | PHOTOELECTRIC SEMICONDUCTOR CONVERTER |
| JPS59207640A (en) * | 1983-05-11 | 1984-11-24 | Hitachi Ltd | Semiconductor device |
| JP2011040445A (en) * | 2009-08-07 | 2011-02-24 | Hitachi Ltd | Semiconductor photodiode device, and manufacturing method thereof |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4988492A (en) * | 1972-09-22 | 1974-08-23 |
-
1978
- 1978-07-14 JP JP8657278A patent/JPS5513924A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4988492A (en) * | 1972-09-22 | 1974-08-23 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5893386A (en) * | 1981-11-30 | 1983-06-03 | Semiconductor Res Found | Semiconductor photoelectric conversion device |
| JPS5895877A (en) * | 1981-12-01 | 1983-06-07 | Semiconductor Res Found | Semiconductor photoelectric conversion device |
| DE3344637A1 (en) * | 1982-12-11 | 1984-06-14 | Nishizawa, Jun-Ichi, Sendai, Miyagi | PHOTOELECTRIC SEMICONDUCTOR CONVERTER |
| JPS59207640A (en) * | 1983-05-11 | 1984-11-24 | Hitachi Ltd | Semiconductor device |
| JP2011040445A (en) * | 2009-08-07 | 2011-02-24 | Hitachi Ltd | Semiconductor photodiode device, and manufacturing method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6250992B2 (en) | 1987-10-28 |
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