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JPS5659700A - Forming method for gallium nitride single crystal thin film - Google Patents

Forming method for gallium nitride single crystal thin film

Info

Publication number
JPS5659700A
JPS5659700A JP13459279A JP13459279A JPS5659700A JP S5659700 A JPS5659700 A JP S5659700A JP 13459279 A JP13459279 A JP 13459279A JP 13459279 A JP13459279 A JP 13459279A JP S5659700 A JPS5659700 A JP S5659700A
Authority
JP
Japan
Prior art keywords
gan
thin film
substrate
growth
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13459279A
Other languages
Japanese (ja)
Other versions
JPS612635B2 (en
Inventor
Yoshimasa Oki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP13459279A priority Critical patent/JPS5659700A/en
Publication of JPS5659700A publication Critical patent/JPS5659700A/en
Publication of JPS612635B2 publication Critical patent/JPS612635B2/ja
Granted legal-status Critical Current

Links

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE: To obtain a GaN thin film with high crystallizability suitable for use as a substrate by carrying out the vapor phase growth of GaN on an insulating substrate while adding an impurity atom such as Zn or Cd to the atmosphere at the time of starting the growth and peeling the resulting GaN from the substrate.
CONSTITUTION: In the vapor phase growth of GaN on an insulating substrate of α-Al2O3 or the like the growth is carried out while adding at least one of impurity atoms such as Zn, Cd, As, P, S, Se and Te to the atmosphere at the time of starting the growth to weaken the bonding of GaN to the substrate. Epitaxially grown GaN is then peeled from the substrate to obtain a GaN thin film having a smooth surface and high crystallizability. This thin film is suitable for use as the 2nd substrate in a process of further epitaxially growing GaN.
COPYRIGHT: (C)1981,JPO&Japio
JP13459279A 1979-10-17 1979-10-17 Forming method for gallium nitride single crystal thin film Granted JPS5659700A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13459279A JPS5659700A (en) 1979-10-17 1979-10-17 Forming method for gallium nitride single crystal thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13459279A JPS5659700A (en) 1979-10-17 1979-10-17 Forming method for gallium nitride single crystal thin film

Publications (2)

Publication Number Publication Date
JPS5659700A true JPS5659700A (en) 1981-05-23
JPS612635B2 JPS612635B2 (en) 1986-01-27

Family

ID=15131980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13459279A Granted JPS5659700A (en) 1979-10-17 1979-10-17 Forming method for gallium nitride single crystal thin film

Country Status (1)

Country Link
JP (1) JPS5659700A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6765240B2 (en) 1994-01-27 2004-07-20 Cree, Inc. Bulk single crystal gallium nitride and method of making same
US6958093B2 (en) 1994-01-27 2005-10-25 Cree, Inc. Free-standing (Al, Ga, In)N and parting method for forming same
JP2009161436A (en) * 2009-02-26 2009-07-23 Sumitomo Electric Ind Ltd Group III nitride semiconductor crystal substrate, group III nitride semiconductor device and manufacturing method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6765240B2 (en) 1994-01-27 2004-07-20 Cree, Inc. Bulk single crystal gallium nitride and method of making same
US6958093B2 (en) 1994-01-27 2005-10-25 Cree, Inc. Free-standing (Al, Ga, In)N and parting method for forming same
US6972051B2 (en) 1994-01-27 2005-12-06 Cree, Inc. Bulk single crystal gallium nitride and method of making same
JP2009161436A (en) * 2009-02-26 2009-07-23 Sumitomo Electric Ind Ltd Group III nitride semiconductor crystal substrate, group III nitride semiconductor device and manufacturing method thereof

Also Published As

Publication number Publication date
JPS612635B2 (en) 1986-01-27

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