JPS5685858A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5685858A JPS5685858A JP16252379A JP16252379A JPS5685858A JP S5685858 A JPS5685858 A JP S5685858A JP 16252379 A JP16252379 A JP 16252379A JP 16252379 A JP16252379 A JP 16252379A JP S5685858 A JPS5685858 A JP S5685858A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- film
- region
- type
- collector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/62—Electrodes ohmically coupled to a semiconductor
Landscapes
- Electrodes Of Semiconductors (AREA)
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To obtain a semiconductor having preferable characteristics by doping impurity in high density in a semiconductor layer at the portion to be mounted with aluminum electrode when mounting the electrode on the semiconductor layer, thereby preventing the deposition of silicon in aluminum. CONSTITUTION:An oxide film 7 is coated on an N type epitaxial layer 3 being a collector having an N type collector contact region 5 and a P type base region 6, and windows for forming base, emitter and collector terminals are opened thereat. Then, a polycrystalline Si layer 8 and a PSG film 9 are laminated on the entire surface and are grown thereon, the film 9 on the base terminal is removed, it is heat treated, P in the film 9 is diffused thereby, an N type emitter region 10 is formed in the N type emitter region 10, and an N<+> type region 11 is formed also in the region 5. Thereafter, the film 9 is removed, the base terminal is covered with the resist film 12, P ions are implanted to the whole surface, the layer 8 is converted into high impurity density layer 8', the layer 8 is retained only on the regions 10 and 11, and aluminum electrodes for the emitter and the collector are mounted thereon.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16252379A JPS5685858A (en) | 1979-12-14 | 1979-12-14 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16252379A JPS5685858A (en) | 1979-12-14 | 1979-12-14 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5685858A true JPS5685858A (en) | 1981-07-13 |
Family
ID=15756234
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16252379A Pending JPS5685858A (en) | 1979-12-14 | 1979-12-14 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5685858A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57102070A (en) * | 1980-12-17 | 1982-06-24 | Nec Corp | Semiconductor device |
| JPH0897226A (en) * | 1994-09-26 | 1996-04-12 | Nec Corp | PNP transistor, semiconductor integrated circuit, semiconductor device manufacturing method, and semiconductor integrated circuit manufacturing method |
| WO2001088994A1 (en) * | 2000-05-12 | 2001-11-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method of manufacture thereof |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5219082A (en) * | 1975-08-05 | 1977-01-14 | Fujitsu Ltd | Production method of semiconductor |
-
1979
- 1979-12-14 JP JP16252379A patent/JPS5685858A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5219082A (en) * | 1975-08-05 | 1977-01-14 | Fujitsu Ltd | Production method of semiconductor |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57102070A (en) * | 1980-12-17 | 1982-06-24 | Nec Corp | Semiconductor device |
| JPH0897226A (en) * | 1994-09-26 | 1996-04-12 | Nec Corp | PNP transistor, semiconductor integrated circuit, semiconductor device manufacturing method, and semiconductor integrated circuit manufacturing method |
| WO2001088994A1 (en) * | 2000-05-12 | 2001-11-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method of manufacture thereof |
| US6674149B2 (en) | 2000-05-12 | 2004-01-06 | Matsushita Electric Industrial Co., Ltd. | Bipolar transistor device having phosphorous |
| US6893934B2 (en) | 2000-05-12 | 2005-05-17 | Matsushita Electric Industrial Co., Ltd. | Bipolar transistor device having phosphorous |
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