JPS5796766A - Semiconductor wafer edge polishing device - Google Patents
Semiconductor wafer edge polishing deviceInfo
- Publication number
- JPS5796766A JPS5796766A JP55168887A JP16888780A JPS5796766A JP S5796766 A JPS5796766 A JP S5796766A JP 55168887 A JP55168887 A JP 55168887A JP 16888780 A JP16888780 A JP 16888780A JP S5796766 A JPS5796766 A JP S5796766A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor wafer
- dish
- lapping
- polishing device
- wafer edge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
PURPOSE:To polish an edge of a semiconductor wafer uniformly and with accuracy by combining the rotary motion of a lapping dish and the reciprocating motion of the semiconductor wafer. CONSTITUTION:A palling dish 2 is rotated by a motor, and the semiconductor wafter 1 held by a holder 3 which moves up and down by means of a cylinder is pressed against the lapping dish 2. By this lapping dish 2 and lapping powder supplied from a nozzle 6, the semiconductor wafer 1 is polished. At the same time, a reciprocating motion is provided to the holder 3 by a sliding mechanism 5 through an arm 4, bringing the semiconductor wafer 1 in uniform contact with the lapping dish 2. As a result, uniform polishing of the periphery of the semiconductor wafer and uniform wear of the lapping dish are attained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55168887A JPS5796766A (en) | 1980-11-27 | 1980-11-27 | Semiconductor wafer edge polishing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55168887A JPS5796766A (en) | 1980-11-27 | 1980-11-27 | Semiconductor wafer edge polishing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5796766A true JPS5796766A (en) | 1982-06-16 |
Family
ID=15876401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55168887A Pending JPS5796766A (en) | 1980-11-27 | 1980-11-27 | Semiconductor wafer edge polishing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5796766A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6722964B2 (en) | 2000-04-04 | 2004-04-20 | Ebara Corporation | Polishing apparatus and method |
| KR100825562B1 (en) * | 2006-12-19 | 2008-04-25 | 주식회사 포스코 | Specimen processing equipment |
| US7559825B2 (en) | 2006-12-21 | 2009-07-14 | Memc Electronic Materials, Inc. | Method of polishing a semiconductor wafer |
| CN102229078A (en) * | 2011-05-23 | 2011-11-02 | 锦州市锦利电器有限公司 | Multistation automatic angle grinder |
| KR101140930B1 (en) | 2010-03-29 | 2012-05-15 | 현대제철 주식회사 | Horizontal position grinding device for removing welding defects on welded plate |
| CN109702637A (en) * | 2019-02-28 | 2019-05-03 | 郑州工程技术学院 | Optimization and manufacturing method of superhard bonded abrasive grinding parameters based on Adams simulation |
-
1980
- 1980-11-27 JP JP55168887A patent/JPS5796766A/en active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6722964B2 (en) | 2000-04-04 | 2004-04-20 | Ebara Corporation | Polishing apparatus and method |
| US6935932B2 (en) | 2000-04-04 | 2005-08-30 | Ebara Corporation | Polishing apparatus and method |
| US7108589B2 (en) | 2000-04-04 | 2006-09-19 | Ebara Corporation | Polishing apparatus and method |
| KR100825562B1 (en) * | 2006-12-19 | 2008-04-25 | 주식회사 포스코 | Specimen processing equipment |
| US7559825B2 (en) | 2006-12-21 | 2009-07-14 | Memc Electronic Materials, Inc. | Method of polishing a semiconductor wafer |
| KR101140930B1 (en) | 2010-03-29 | 2012-05-15 | 현대제철 주식회사 | Horizontal position grinding device for removing welding defects on welded plate |
| CN102229078A (en) * | 2011-05-23 | 2011-11-02 | 锦州市锦利电器有限公司 | Multistation automatic angle grinder |
| CN102229078B (en) | 2011-05-23 | 2013-01-16 | 锦州市锦利电器有限公司 | Multi-station automatic angle grinding machine |
| CN109702637A (en) * | 2019-02-28 | 2019-05-03 | 郑州工程技术学院 | Optimization and manufacturing method of superhard bonded abrasive grinding parameters based on Adams simulation |
| CN109702637B (en) * | 2019-02-28 | 2020-10-02 | 郑州工程技术学院 | Adams simulation based superhard consolidation abrasive grinding parameter optimization and manufacturing method |
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