JPS58146866A - Conductive pattern inspection method - Google Patents
Conductive pattern inspection methodInfo
- Publication number
- JPS58146866A JPS58146866A JP57030236A JP3023682A JPS58146866A JP S58146866 A JPS58146866 A JP S58146866A JP 57030236 A JP57030236 A JP 57030236A JP 3023682 A JP3023682 A JP 3023682A JP S58146866 A JPS58146866 A JP S58146866A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- conductive
- signal
- inspected
- power source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/312—Contactless testing by capacitive methods
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Gas-Filled Discharge Tubes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(6) 発明の!1w分舒
本発明はガス放電表示パネルの電極やプリント板の配線
等のような絶縁基板上に近接配置された多数の導電パタ
ーンの断線を検査する方法に関するものである。[Detailed description of the invention] (6) Invention! The present invention relates to a method for inspecting disconnections in a large number of conductive patterns disposed close to each other on an insulating substrate, such as electrodes of a gas discharge display panel or wiring of a printed circuit board.
(b)従来技術と間履点
一般にガス放電表示パネルの電極のような導電体パター
ンの新編検査には目視、顕微鏡観察、直流による導通テ
スシ等の方法が採られている。しかし目視、顕微鏡観察
による方法では、多大の作業時間と人手を安し、作業者
の視覚の疲労も激しく、見逃し賜の検査ミスを招くとい
う間層がある。(b) Prior Art and Comparison Points Generally, methods such as visual inspection, microscopic observation, and continuity testing using direct current are used to inspect new conductive patterns such as electrodes of gas discharge display panels. However, methods using visual inspection or microscopic observation require a lot of work time and labor, and the operator's visual fatigue is severe, leading to inspection errors due to oversights.
また直流による導通テスシでは、例えばガラス基板上に
並設された多数の線状電極の一端な共遥接続して、その
共通接続部に直流電圧を印加し、各電極の他端に直流電
圧検出用のプローブを直接接触させて導通の有無を検出
する方法が採られている。ところでこのような方法では
、各電極とプ璽−プ先端との接触状態を極めて真好に保
つ必要があるが、数百本以上にもなる電極のうちの何本
かが接触不良を起こし、断纏不皇とWAIIされること
があった・この接触不良の一つの原因は電極上に殉った
異物、例えばホトレジストによる場合もあリ、その対策
として電極端を損傷しない程度に研磨を行なっているが
確実な防止策にはなっていない。さらに電極材料やその
太さ、厚さによっては研磨等が不可能になり、蝮時間に
確実な検査を行なうことが困離であった。また電極上に
薄く誘電体膜を被覆した状態で断線検査を行なう必要が
しばしばあるが、このような場合、直流による導通テス
ト法では誘電体膜を除去しない限り不可能であった。そ
こで、電極の一端に交流電圧を印加し他端から誘電体層
を介して交流電圧を検出するような交流による導通検査
方法も提案されている。In addition, in a DC conduction tester, for example, one end of a large number of linear electrodes arranged in parallel on a glass substrate is connected together, a DC voltage is applied to the common connection, and the DC voltage is detected at the other end of each electrode. A method has been adopted in which the presence or absence of continuity is detected by directly contacting the probe with a probe. By the way, in this method, it is necessary to maintain a very good contact state between each electrode and the tip of the seal, but some of the hundreds of electrodes may develop poor contact. It was sometimes said that the contact was broken. One cause of this poor contact could be foreign matter, such as photoresist, on the electrode. As a countermeasure, polish the electrode end to the extent that it does not damage it. However, it is not a reliable preventive measure. Furthermore, depending on the electrode material and its thickness, polishing or the like may not be possible, making it difficult to conduct reliable inspections during downtime. Furthermore, it is often necessary to perform a disconnection test with the electrode covered with a thin dielectric film, but in such cases, continuity testing using direct current is not possible unless the dielectric film is removed. Therefore, a continuity testing method using alternating current has also been proposed in which alternating current voltage is applied to one end of the electrode and the alternating voltage is detected from the other end through a dielectric layer.
この方法ではm接電極相瓦間の静電結合による誤検査を
防止する目的で、例えば一本おきの電極に交流電圧を印
加し、その他の*極を接地する方法が採られるので、偶
数および奇数の電極検査を2回繰り返す必要があった。In this method, in order to prevent erroneous inspections due to capacitive coupling between m-electrode phase tiles, for example, an AC voltage is applied to every other electrode and the other * electrodes are grounded. It was necessary to repeat the odd-numbered electrode test twice.
また電極の一本おきに交流電圧印加と接地とを行なう特
別のコネクタを必要とし、さらにもともと各電極の一端
が共通接続されたような電極群に対しては適用できない
等の1IIii11があった。Furthermore, it requires a special connector for applying alternating current voltage and grounding to every other electrode, and furthermore, it cannot be applied to a group of electrodes in which one end of each electrode is originally connected in common.
(C)発明の目的
本発明は前述の点に鉱みなされたもので、絶縁基板上に
配設された多数の導電パターンの断線を容易かつ確実、
知時間に検査することのできる導電パターンの検査方法
の提供を目的とするものである。(C) Purpose of the Invention The present invention is based on the above-mentioned points, and is capable of easily and reliably disconnecting a large number of conductive patterns arranged on an insulating substrate.
The object of the present invention is to provide a method for inspecting a conductive pattern that can be inspected in a short period of time.
(両 発明の構成
本発明による導電パターンの検査方法は、絶縁基板上に
近接配置された多数の被検査導電パターンの一端に交流
(j号を印加する第1の電源と、被検査導電パターン上
に当該被検査導電パターンに対して静電結合するよう配
置された静電結合用導電部材と、該静電結合用導電部材
に前記第1の電源の交流信号とは異なるモードを有する
交流信号を印加する絶2の電源と、前記被検査導電パタ
ーンの他端から交Wt葡号を検出する手段とを設け、該
検出手段で検出された交流信号のモードにもと1こ
づき、前■被検査導電パターンの断線を検知するように
したことを特做とするものである。(Both Structures of the Invention The method for inspecting a conductive pattern according to the present invention includes a first power source that applies an alternating current (J) to one end of a large number of conductive patterns to be inspected that are arranged close to each other on an insulating substrate, and a a conductive member for capacitive coupling disposed to be electrostatically coupled to the conductive pattern to be inspected; and an AC signal having a mode different from the AC signal of the first power source to the conductive member for capacitive coupling. It is provided with a power supply of 2 to 1 and a means for detecting an alternating current signal from the other end of the conductive pattern to be inspected, and according to the mode of the AC signal detected by the detection means, The feature is that a disconnection of the conductive pattern is detected.
(−)発明の実施例
以下本発明の実施例をガス放電表示パネルの電極検査に
適用した場合について図面を参照して説明する・
第1図は本発明による導電パターンの検査方法を説明す
るための要部概念図であり、1はガス放電表示パネルを
構成する一方のガラス基鈑である。(-) Embodiments of the Invention Below, the application of embodiments of the present invention to the electrode inspection of gas discharge display panels will be explained with reference to the drawings. Figure 1 is for explaining the method of inspecting conductive patterns according to the present invention. 1 is a conceptual diagram of the main parts of the gas discharge display panel, and 1 is one of the glass substrates constituting the gas discharge display panel.
そのガラス基鈑1の表面には例えば線状の電極2が等間
隔で多数並設され、それら各電極2の一端は基板10片
側(図の下側端部)に取出されている。そして各電極2
の一端は接続線8に共通接続されて検査用の第1の電源
4に接続される0図に示す状態は各電極意が被検査電極
となり、それら極2上には絶縁シート6(例えば〆リエ
ステルシ−)あるいは!イラーシーF等)を介して例え
ば導電ゴムシートや金属メツシュシートあるいは金属板
等の静電結合用導電部材6が配置され1その静電結合用
導電部材6と各電極2とは静電結合している。そして静
電結合用導電部材6には検査用の第2の電源7が接続さ
れ、その静電結合用導電部材6に電圧V、%周波数/1
の交流信号が印加されるようになっている。すなわち第
1の電#14と第2のIIt源7とから送出される信号
は例えば電圧ならびに周波数が各々異なるモードの交流
信号となっており、本実施例の場合、第1の電源4の電
圧Zブ書噛tル9汽へζ)賢1えばV、<いIs<ft
に設定しである。また点線で匪んで示した部分8は各被
検査電極2の他端から交流信号を検出する手段であって
、本実施例の場合、その検出手段8は交流プローブ8@
、増幅器赫、周波数弁別器8Cおよびレコーダ8I!か
らなる。なお交流プローブ徊の先端部は導体を例えばプ
ラスチックやガラス等の滑り易いtsi!体層で被覆し
である。For example, a large number of linear electrodes 2 are arranged side by side at equal intervals on the surface of the glass substrate 1, and one end of each electrode 2 is taken out on one side of the substrate 10 (lower end in the figure). and each electrode 2
One end is commonly connected to the connecting wire 8 and connected to the first power source 4 for inspection.In the state shown in Figure 0, each electrode becomes the electrode to be inspected, and an insulating sheet 6 (for example, a (Reestercy) Or! A conductive member 6 for electrostatic coupling, such as a conductive rubber sheet, a metal mesh sheet, or a metal plate, is disposed via a conductive material 6 (e.g. conductive rubber sheet, metal mesh sheet, metal plate, etc.), and the conductive member 6 for electrostatic coupling and each electrode 2 are electrostatically coupled. . A second power source 7 for inspection is connected to the electrostatic coupling conductive member 6, and a voltage V, % frequency/1 is applied to the electrostatic coupling conductive member 6.
AC signals are applied. That is, the signals sent from the first power source 14 and the second IIt source 7 are, for example, AC signals with different modes of voltage and frequency, and in the case of this embodiment, the voltage of the first power source 4 is Z booklet 9 train ζ) Ken 1 is V, <Is<ft
It is set to . Also, a portion 8 indicated by a dotted line is a means for detecting an AC signal from the other end of each electrode 2 to be inspected, and in the case of this embodiment, the detection means 8 is an AC probe 8@
, amplifier 赫, frequency discriminator 8C and recorder 8I! Consisting of Note that the tip of the AC probe should not be connected to a conductor made of slippery material such as plastic or glass. It is covered with a body layer.
さて以上のような構成において、各電極2の他端上を実
線矢印Aで示す方向に交流プローブ徊を搦鋤させるので
ある。いま電極2のDで示す箇所が#線しているものと
すれば、交流プローブ−が非断線電極2上にある時は、
その交流プローブ86には第1の電源4から交流信号が
強く検出きれる。Now, in the above configuration, the AC probe is moved over the other end of each electrode 2 in the direction shown by the solid arrow A. Assuming that the point indicated by D on the electrode 2 is a # line, when the AC probe is on the non-disconnected electrode 2,
The AC probe 86 can detect a strong AC signal from the first power source 4 .
しかし交流プ四−186が断線している電11g上にあ
る時には、jllの電114の交流信号はS*電極相互
間の浮遊容量結合を通してしか現われず、むしろ静電結
合用導電部材6からの結合容量を通し第2の電源7から
の交流信号が強く検出される。However, when the AC pin 4-186 is on the disconnected line 11g, the AC signal on the jll line 114 appears only through the stray capacitance coupling between the S* electrodes, but rather through the stray capacitive coupling from the capacitive coupling conductive member 6. The AC signal from the second power source 7 is strongly detected through the coupling capacitance.
したがって、交流プν−186が各非断線電極2上にあ
る時よりも、断―電極2上にある時の方が、周波数弁別
器νの出力レベルが高くなり、レコーダUに記録された
電圧レベルにもとづき、断線電極を検知することができ
るのである。Therefore, the output level of the frequency discriminator ν is higher when the AC pulse ν-186 is on the disconnected electrode 2 than when it is on each non-disconnected electrode 2, and the voltage recorded on the recorder U is higher. Based on the level, disconnected electrodes can be detected.
なお本夷總例においては、各電極型がガテス基板1表面
に露出した形で配設された場合について述べているが、
もし各電極2表面が膜厚の薄い誘電体膜で被覆されてい
る際には、絶縁シート器を省略してもよいし、交流プ四
−ブーの先端部は露出した導体であってもよい。このよ
うに導体が露出した先端部を有する交流プ四−プを用い
る際には、電極やその表面を被覆した誘電体膜等に損傷
を与えないよう、ポリエチレンシーシ略を敷いた状態で
交流プリー1を摺動さてもよいし、あるいは各電極2の
他端と静電納会するよう髄かなギャプで浮かせて移動さ
せても同様の効果を得ることができる。また絶縁シー)
6を用いないで、前記静電結合用導電部材6を各電極2
上方に儀かなギャップで浮かせて配置することにより、
静電結合用導電部材6と各電極2とを静電的に結合させ
ることもできる。Note that this example describes the case where each electrode type is arranged in an exposed manner on the surface of the Gates substrate 1.
If the surface of each electrode 2 is coated with a thin dielectric film, the insulating sheet may be omitted, and the tip of the AC power supply may be an exposed conductor. . When using an AC conductor with an exposed conductor tip, place a polyethylene sheath on the AC conductor to prevent damage to the electrode or the dielectric film covering its surface. 1 may be slid, or the same effect can be obtained by floating the electrode 2 with a slight gap so as to electrostatically engage the other end of each electrode 2. Also insulation sheet)
6, the electrostatic coupling conductive member 6 is connected to each electrode 2.
By placing it floating above with a gap,
The electrostatic coupling conductive member 6 and each electrode 2 can also be electrostatically coupled.
さらにf#電結合用導電部材は前述のように固定してお
いてもよいが、第2図および第854に示すように、被
検査電極上を交流プローブと共に移動する移動式にする
こともできる。すなわち第2図における8番は交流プワ
ープ、9は例えば導電ゴムからなるローラである。その
導電リーラ9は導電枠組lOならびに支持部11および
絶縁支持体12によって、交流プローブ81と一体的に
組立てられている。そして各被検金電極!上を交流プロ
ーブ−と共に導電ローフ9が移動する。なおこの際、被
検査電極2が誘電体膜で被覆されていれば、その誘電体
膜上を前記導1ル−テ9を回転移動させればよい。しか
し各電極2が露出している時は、それら各電iig上に
ポリエステルシートやマイチーシー)等の絶縁シート(
図示省略)を敷いて、その上を前記導電−−ラ9を回転
移動させてもよいし、場合によっては導電製−テ9表面
を絶縁被覆しておいてもよい。また第1図における13
は例えば燐青銅の薄板バネからなる導電たれ幕であって
、その導電たれ幕13は絶縁支持体12によって交流プ
ローブ86と一体的に組立てられている。そして各電極
2上を交流プ田−プーの移動と共に前記導電たれ幕13
が移動する。この際も必要に応じて導電たれ幕13表面
を絶縁被覆することもできる・なお前記導電たれ幕13
の代りに弾力性のある針金の集合体からなる導電ブラシ
を用いることもできる。また前述の実施例では嬉1およ
び第意の電源の交流信号の電圧ならびに周波数を異なら
せて交流信号のモードを変えた場合について述べたが、
それに限らず、電圧、周波数あるいは位相等の交流信号
モードな個★に異ならせたり、あるいはそれらの中の2
種類以上を同時に変えてもよい。なお本発明においては
第!の電源の交流信号を第1の電源の交流信号のモード
と^ならせる際に、第2の電源の交流信号を零ボルト、
つまり静電結合用導電部材の電位を接地電位に保持する
ことも可能であり、また逆に第2の電源に対し第1の電
源を零ボルトとすることも含むものとする。重た被検査
電極表面が誘電体膜で被覆されている際には、静電結合
用導電部材として電解液のような液状導電体を用いるこ
ともできる。さらにまた検出手段によって検出された交
流信号のモードの指示はレコーダに限らずランプ、ブザ
ー、電圧針を用いる等任意の方法が可能であり、さらに
検出モードを利用して自動的に不良電極にインク等で不
良マークを付することも可能である。また各電極を共通
接続する方法としては圧着コネクタ、導電ペーストある
いは導電ゴムシー)勢を用いることができるしもともと
各電極の一端が共通jii!Mされたものではそのまま
の状態で検査が可能である。Further, the conductive member for f# electrical coupling may be fixed as described above, but it may also be movable so that it moves along with the AC probe over the electrode to be tested, as shown in FIG. 2 and 854. . That is, number 8 in FIG. 2 is an AC pwerp, and number 9 is a roller made of conductive rubber, for example. The conductive reeler 9 is integrally assembled with the AC probe 81 by a conductive framework 1O, a support portion 11, and an insulating support body 12. And each gold electrode to be tested! A conductive loaf 9 moves along with the AC probe above. At this time, if the electrode 2 to be inspected is covered with a dielectric film, the conductor 1 route 9 may be rotated over the dielectric film. However, when each electrode 2 is exposed, an insulating sheet (such as a polyester sheet or
(not shown) may be laid and the conductive wire 9 may be rotated thereon, or the surface of the conductive wire 9 may be coated with an insulator depending on the case. Also, 13 in Figure 1
is a conductive curtain made of a thin plate spring made of phosphor bronze, for example, and the conductive curtain 13 is integrally assembled with the AC probe 86 by an insulating support 12. The conductive curtain 13 moves over each electrode 2 as the AC puden-pu moves.
moves. In this case, the surface of the conductive curtain 13 can also be coated with an insulator if necessary.
Instead, a conductive brush made of a collection of elastic wires can also be used. Furthermore, in the above-mentioned embodiment, a case was described in which the voltage and frequency of the AC signal of the first and second power supplies were varied to change the mode of the AC signal.
Not limited to this, it is possible to vary AC signal modes such as voltage, frequency or phase, or two of them.
You may change more than one type at the same time. In addition, in the present invention, No. 1! When making the AC signal of the power source match the mode of the AC signal of the first power source, the AC signal of the second power source is set to zero volts,
In other words, it is possible to maintain the potential of the conductive member for electrostatic coupling at the ground potential, and conversely, it also includes setting the first power source to zero volts with respect to the second power source. When the surface of the overlapping electrode to be inspected is covered with a dielectric film, a liquid conductor such as an electrolytic solution can also be used as the conductive member for electrostatic coupling. Furthermore, the mode of the AC signal detected by the detection means can be indicated not only by a recorder but also by any method such as using a lamp, a buzzer, or a voltage needle. It is also possible to mark the product as defective. In addition, as a method for commonly connecting each electrode, a crimp connector, conductive paste, or conductive rubber band can be used, and originally one end of each electrode is common! Those that have undergone M can be inspected as they are.
また前述の実施例では静電結合用導電部材を交流プロー
ブと被検査「を極の一端、つまり給電点との間に配置し
たが、そのような配置に限らす、被材の順で配置しても
よい・つまり前述の実施例における交流プ豐−プと静電
結合用導電部材との位置関係を逆にすることもできる。Furthermore, in the above-mentioned embodiment, the conductive member for electrostatic coupling was placed between the AC probe and the object to be inspected at one end of the pole, that is, the feeding point. In other words, the positional relationship between the AC pump and the conductive member for electrostatic coupling in the above-described embodiments can be reversed.
なお本発明の要旨とするところはガス放電表示パネルに
限らず、液晶表示パネル等その他の表示パネルの電極検
査やプリント板の配線検査等に適用しても同様の効果を
得ることができる。The gist of the present invention is not limited to gas discharge display panels, but similar effects can be obtained even when applied to electrode inspections of other display panels such as liquid crystal display panels, wiring inspections of printed boards, etc.
ω 発明の効果
以上の説明から明らかなように本発明は絶縁基板上に近
接配置された多数の電極の断線を容易かつ確実、短時間
に検知することができ、検査効率の向上、検査に対する
信頼性の向上環にきわめて有効である。ω Effects of the Invention As is clear from the above explanation, the present invention can easily, reliably, and quickly detect disconnection of a large number of electrodes arranged close to each other on an insulating substrate, improving inspection efficiency and improving reliability of inspection. It is extremely effective in improving sexual performance.
第1wJは本発明をガス放電表示パネルの電極断線検査
に適用した場合の実施例を説明するための要部概念図、
第8図および第8図は本発明に用いる静電結合用導電部
材の他の実施例の構造を説明するための概念的に示した
要部斜視図である。
図において、lはガラス基板、2は被検査電極4は第1
のW源、bは絶縁シート、6は静電結合用導電部材、7
は第2の電源、8は交流信号検出手段、84j交流プワ
ーブ、8bは増幅器、シは周波数弁別器、斜はレフーダ
、9は導電ローラ、13は導電たれ幕をそれぞれ示す。
第1図
第2図
N′
第3e21The first wJ is a conceptual diagram of main parts for explaining an embodiment in which the present invention is applied to an electrode disconnection inspection of a gas discharge display panel,
FIGS. 8 and 8 are perspective views conceptually showing essential parts for explaining the structure of another embodiment of the electrostatic coupling conductive member used in the present invention. In the figure, l is the glass substrate, 2 is the electrode to be inspected 4 is the first
b is an insulating sheet, 6 is a conductive member for electrostatic coupling, 7 is a W source,
8 is a second power source, 8 is an AC signal detection means, 84j is an AC converter, 8b is an amplifier, C is a frequency discriminator, diagonal is a refuder, 9 is a conductive roller, and 13 is a conductive curtain. Figure 1 Figure 2 N' 3e21
Claims (1)
の一端に交流信号を印加する第1の電源と、被検査導電
パターン上に当該被検査導電パターンに対して―電結合
するよう配置された静電結合用導電部材と、該静電結合
用導電部材に前記第1の電源の交流信号とは興なるモー
ドを有する交流信号を印加する第8の電源と、前記被検
査導電パターンの他端から交流信号を検出する手段とを
設け、該検出手段で検出された交流信号の毫−ドにもと
ず會、前記被検査導電パターンの断線を検知するように
したことを特徴とする導電パターンの検査方法。A first power supply that applies an alternating current signal to one end of a large number of conductive patterns to be inspected that are arranged close to each other on an insulating substrate; a conductive member for capacitive coupling, an eighth power source that applies an AC signal having a mode different from that of the AC signal of the first power source to the conductive member for capacitive coupling, and the other end of the conductive pattern to be inspected. means for detecting an alternating current signal from the detecting means, and a disconnection of the conductive pattern to be inspected is detected based on the waveform of the alternating current signal detected by the detecting means. inspection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57030236A JPS58146866A (en) | 1982-02-25 | 1982-02-25 | Conductive pattern inspection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57030236A JPS58146866A (en) | 1982-02-25 | 1982-02-25 | Conductive pattern inspection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58146866A true JPS58146866A (en) | 1983-09-01 |
Family
ID=12298074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57030236A Pending JPS58146866A (en) | 1982-02-25 | 1982-02-25 | Conductive pattern inspection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58146866A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62170573U (en) * | 1986-04-21 | 1987-10-29 | ||
| JPS62280657A (en) * | 1986-05-29 | 1987-12-05 | Hitachi Cable Ltd | In-line disconnection detector for flat cable |
| US6201398B1 (en) | 1996-03-28 | 2001-03-13 | Oht Inc. | Non-contact board inspection probe |
| KR100491987B1 (en) * | 2002-09-25 | 2005-05-30 | 마이크로 인스펙션 주식회사 | Apparatus for inspecting insulation layer of pdp panel |
| WO2010136330A1 (en) * | 2009-05-28 | 2010-12-02 | Siemens Aktiengesellschaft | Measuring a substrate having electrically conductive structures |
-
1982
- 1982-02-25 JP JP57030236A patent/JPS58146866A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62170573U (en) * | 1986-04-21 | 1987-10-29 | ||
| JPS62280657A (en) * | 1986-05-29 | 1987-12-05 | Hitachi Cable Ltd | In-line disconnection detector for flat cable |
| US6201398B1 (en) | 1996-03-28 | 2001-03-13 | Oht Inc. | Non-contact board inspection probe |
| US6373258B2 (en) | 1996-03-28 | 2002-04-16 | Naoya Takada | Non-contact board inspection probe |
| KR100491987B1 (en) * | 2002-09-25 | 2005-05-30 | 마이크로 인스펙션 주식회사 | Apparatus for inspecting insulation layer of pdp panel |
| WO2010136330A1 (en) * | 2009-05-28 | 2010-12-02 | Siemens Aktiengesellschaft | Measuring a substrate having electrically conductive structures |
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