JPS5914056A - Device for testing system function - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a functional test of a system having a lower-level computer that receives command signals from a higher-level computer and sends control signals to a controlled object.

In this case, the lower computer is DDC (Direct D
It is also called a controller.

Configuration of conventional technology and its operation When controlling a plant, many types of status signals are input from each point of the plant, these status signals are processed, and control signals are output. To perform a functional test of a control computer system, a simulator is used to schedule events that occur during typical plant operations to determine the functionality of the system. Testing fC8 Disadvantages of the conventional technology However, in a system equipped with a host computer and a DDC controller as its lower-order computer, the host computer and the DD
In some cases, signals are exchanged with the C controller in a closed loop configuration.

For example, a DDC controller performs APC (Automatic Po5i) based on a command signal from a host computer.
When performing control operations such as
In a sequence control system where a control completion signal is input from the DDC controller to the host computer, and the host computer outputs the next command signal, it is not possible to perform sufficient functional tests using a simulator that generates events. There was a drawback. Particularly, when APC control involves transporting a table, it has not been possible to sufficiently test the software to be tested in the host computer using a simulator alone.

Purpose of the Invention The present invention has been made to eliminate the drawbacks of the conventional ones as described above, and is a control system in which the transmission and reception of signals between a higher-level computer and a lower-level DDC controller has a closed-loop configuration. The purpose of this project is to provide test equipment that enables efficient system function testing.

Configuration of the present invention Hereinafter, the present invention will be described in detail with reference to the drawings.

The drawing is a block diagram showing an embodiment of the present invention. In the figure, (1) is a host computer, (2) is a group of lower controllers, and (31 is a plant to be controlled). (41 is a printing device; (41 is a printing device;
5) is a display device, +61.

+71 and 181 are the parts in the host computer (1), and (6
1 is system software, f7) U test target application software, and (8) is a simulator on the host computer side. (9) is a simulator on the lower DDC side, and when the single VC simulator is referred to in this specification, it refers to simulator (9). Also, 圓～α→represent signals, 11 is a status signal generated in the simulator (9) and input to the host computer (1), and 0■ is generated in the simulator (9) and input to the DDC controller signal. status signals, (one is the DDC controller signal and the simulator (
9), α4 is a completion signal input from the DDC controller 1101 to the host computer (1), and a control signal is output from the αυUDDC controller 11α to the controlled plant (3). These signals are transmitted by a dataway device or the like.

Simulator (9) 1 of lower controller group (2)
It can be easily configured using the hardware of a single DDC controller, and when it is assumed that the control signal corresponding to the command signal (-) is output, the control target plant (31) is output by the operation of Generates a signal (111, H) that simulates the state signal.

Functional testing of the system shown in the operational drawings of the present invention is carried out according to the same procedure as in actual online operation.

That is, at the startup timing of the controlled plant (3), a command signal (13i) is output from the host computer (1) to the simulator +91 and DDC controller α. There are signals such as instructions to transport materials.The DDC controller receives command signal 03 and outputs control signal 0!19 to the controlled plant (3).For example, command signal 0 instructs transport of materials. control signal (g)
Although the table, which is the controlled plant (31), is driven, it is moved emptyly without moving the material.

The simulator (9) starts the simulation with the command signal 0'5, and simulates the case where the material is moving on the controlled device (3). αBu upper level computer 11+ ToD
Send to the DC controller. The DDC controller (lI) outputs a control signal (c) according to the control algorithm based on this status signal 0, and sends a control sequence completion signal C14 to the host computer (1).

The host computer (1) sends a status signal (11) and a completion signal (1
4, the new command signal (131) is sent to the simulator (
9) and output to the DDC controller.

The results of the functional test are confirmed by the movement of the plant to be controlled (3) or by the printing device (41) or display device (61).

Other Embodiments of the Invention In some cases, it is possible to incorporate the upper computer side simulator (8:) into the upper computer (1) in a manner that supports the lower DDC side simulator (9).

Effects of the present invention As described above, according to the present invention, the upper computer and the lower DD
By incorporating a simulator that simulates and generates status signals even when the signal transmission and reception between the C controllers is in a closed-loop configuration, it is possible to efficiently conduct functional tests in a form close to online. .

[Brief explanation of the drawing]

The drawing is a block diagram showing an embodiment of the present invention. (1)...Host computer, (3)...Controlled plant, (9)...Simulator, 1101 ・D D
C near: y troller, (+, 11, (tl...
Status signal, 0 fathom...command signal, α→...completion signal,
(c)...Control signal. Agent Shin Kuzuno −

Claims (1)

[Claims] In a system function test device that tests the function of a system having a lower-level computer that receives command signals from a higher-level computer and sends control signals to a controlled object, the command signals input from the higher-level computer to the lower-level computer are input in parallel. The input simulator and the state signal generated by simulating the state signal output from the controlled object when it is assumed that the control signal corresponding to the command signal is outputted to the controlled object in the above simulator, and the state signal generated by this simulation. to the lower-level computer and the higher-level computer; and means for transmitting a control completion signal indicating that the control corresponding to the command signal has been completed in the lower-level computer in relation to the simulated status signal. A system function testing device comprising: means for sending data from a computer to the host computer.