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JPS59226805A - Inclination angle detector - Google Patents

Inclination angle detector

Info

Publication number
JPS59226805A
JPS59226805A JP10122183A JP10122183A JPS59226805A JP S59226805 A JPS59226805 A JP S59226805A JP 10122183 A JP10122183 A JP 10122183A JP 10122183 A JP10122183 A JP 10122183A JP S59226805 A JPS59226805 A JP S59226805A
Authority
JP
Japan
Prior art keywords
inclination angle
measured
variation
luminous flux
laser light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10122183A
Other languages
Japanese (ja)
Inventor
Masayuki Iwazuka
岩塚 昌幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP10122183A priority Critical patent/JPS59226805A/en
Publication of JPS59226805A publication Critical patent/JPS59226805A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To take an accurate measurement of inclination angle over a wide range by irradiating an objective surface with laser light which is parallel luminous flux and photodetecting its reflected light by an image sensor, and detecting the inclination angle as variation in the apparent width of the parallel luminous flux. CONSTITUTION:The laser light from a laser light source 1 is collimated by a collimator 8 into parallel luminous flux to illuminate a surface 3 to be measured, and its irregularly reflected light is photodetected by the image sensor 10. In this case, the spot width on the sensor 10 narrows down when the objective surface 3 slants to left and widens when slanting to right to the contrary. This variation in the spot width on the sensor 10 is processed by a processing circuit 6 and converted into a signal corresponding to the inclination angle, which is displayed on a display circuit 7. Consequently, the variation in inclination angle is detected as variation in the apparent width of the parallel luminous flux, so the inclination angle is measured accurately over a wide range without reference to whether the inclination is large or small.

Description

【発明の詳細な説明】 〔技術分野〕 本発明は、測定対象面の傾斜角の変化を投光系により照
射された平行光束の見かけ上の巾の変化としてイメージ
セシtを用いて測定する傾斜角測定装置に関するもので
ある。
Detailed Description of the Invention [Technical Field] The present invention relates to an inclination method in which a change in the inclination angle of a surface to be measured is measured as a change in the apparent width of a parallel light beam irradiated by a projection system using an image sensor. This invention relates to an angle measuring device.

〔背景技術〕[Background technology]

従来、測定対象面の傾斜角の測定は、第1図のように、
レーザ光#、tllから放射さt″したレーザ光をミラ
ー(2)によって測定対象111j t31に入射角θ
で照射し、この正反射収分全党位置検出素子(4)で受
光し、その出力信号を電流、電圧変換回路(6)で電圧
に変換し、処理回路(6)により測定対象面(3)の傾
斜角を算出して表示回路(7)で表示するようにしてい
た。ここで、測定対象面(3)が基準面を維持している
ときに第2図(b)のように、光位置検出素子(4)の
中央に正反射光が入るように光学系を配置する。そこで
、測定対象面(3)が第2図(a)のように左側に傾斜
した場8−には、光位置検出素子(4)の表面上のスポ
ットは左方向に移動し、右側に傾斜した場合には、第2
図(c)のように右方向に移動する。このスポットの位
置のずfl、を検出することにより測定対象面(3)の
傾斜角が測定できる。即ち、光位置検出素子(4)の表
面上のスポットの位置Xと傾斜角αとの関係は第5図の
ようになり、傾斜角αとの関係は第3図のようになり、
傾斜角αが測定できる。
Conventionally, the inclination angle of the surface to be measured is measured using the following method, as shown in Figure 1.
The laser beam t'' emitted from the laser beam #, tll is applied to the measuring object 111j t31 by the mirror (2) at an incident angle θ.
The specular reflection collecting all-party position detection element (4) receives the light, the output signal is converted to voltage by the current/voltage conversion circuit (6), and the processing circuit (6) converts the light to the measurement target surface (3). ) is calculated and displayed on the display circuit (7). Here, the optical system is arranged so that the specularly reflected light enters the center of the optical position detection element (4) as shown in Figure 2 (b) when the measurement target surface (3) maintains the reference surface. do. Therefore, when the surface to be measured (3) is tilted to the left as shown in FIG. 2(a), the spot on the surface of the optical position detection element (4) moves to the left and tilts to the right. If so, the second
Move to the right as shown in figure (c). By detecting the position of this spot, fl, the inclination angle of the surface to be measured (3) can be measured. That is, the relationship between the position X of the spot on the surface of the optical position detection element (4) and the inclination angle α is as shown in FIG. 5, and the relationship with the inclination angle α is as shown in FIG.
The tilt angle α can be measured.

しかるに、このものにあっては、傾斜角が大きい場合に
は、正反射光が光位置検出素子(4)の表面上からはず
れてしまうため、傾斜角の測定範囲が狭くなるという欠
点を有していた。
However, this method has the disadvantage that when the tilt angle is large, the specularly reflected light is deviated from the surface of the optical position detection element (4), resulting in a narrow measurement range of the tilt angle. was.

〔発明の目的〕[Purpose of the invention]

本発明の目的とするところは、測定対象面の傾斜角の大
小に左右されることなく、広い測定範囲に対して測定対
象面の傾斜角を正f4に測定できるようにすることKあ
る。
An object of the present invention is to make it possible to measure the inclination angle of a surface to be measured at a positive f4 over a wide measurement range, regardless of the magnitude of the inclination angle of the surface to be measured.

〔発明の開示〕[Disclosure of the invention]

実施例 第4図において%111ヴレーザ光源で、このレーザ光
源il+から放射されたレーザ光は、コリメータ(8)
により平行光束に変換さ?′1.、ミラーf21 i介
して測定対象面(3)に照射される。その乱反射成分を
受光レシズ(9)を介してイメージセシサ(101で受
光する。(11)はイメージセシサ駆動回路である。イ
メージセシサ(101@の出力信号は、処理回路(6)
で傾斜角に対応した信号に変換さ?′L1表示回諸(7
)に導かれる。第5図(a)〜(c)は測定対象面(3
)の傾斜角とイメージtシt(10)表面上のスポット
の巾との関係を示すもので、第5図(b)Fi測定対象
面(3)が基試面となっている場合で、測定対象面(3
)が左側に傾いた場合には、第5図(a)のようにイメ
ージtシサ(101表面上のスポット中は狭くなる。逆
に、測定対象面が右側に傾いた場合には、第5図(C)
のように、スポ・シト巾は広がる。このイメージ℃シサ
(1o)表面上のスポット中の増減を処理回路(6)で
検出する。処理回路(6)は、第0図のように、コシパ
レータ02)、AND回路03)、カラシタ04)およ
び補正回路051により構成しており、イメージe :
/ t (lotの出力をコシパレータα匂の正の入力
端子に入カレ、一方、負の入力端子にはしきい値電圧が
設定されている。]コシパレータ喝の出力は、AND回
路州に入力され、AND回路03)の池の入力端子には
イメージt 、7t (10)の駆動パルスが入力され
る。AND回路(13)の出力はカラシタ(1弔に入力
され、その出力は補正回路(15)に入力される。
In the example shown in FIG. 4, the laser light emitted from the laser light source il+ is transmitted through a collimator (8).
Converted into parallel light flux by ? '1. , is irradiated onto the surface to be measured (3) via the mirror f21i. The diffused reflection component is received by the image sensor (101) via the light receiving lens (9). (11) is an image sensor drive circuit.The output signal of the image sensor (101@) is sent to the processing circuit (6).
Is it converted to a signal corresponding to the tilt angle? 'L1 display times (7
). Figures 5(a) to (c) show the surface to be measured (3
) and the width of the spot on the surface of the image t (10). Figure 5(b) shows the relationship between the inclination angle of the image t (10) and the width of the spot on the surface (3). Surface to be measured (3
) tilts to the left, the spot on the image surface (101) becomes narrower as shown in FIG. Diagram (C)
Like this, the width of the seat spreads. A processing circuit (6) detects an increase or decrease in the spot on the surface of this image C.C. sensor (1o). As shown in Fig. 0, the processing circuit (6) is composed of a cosiparator 02), an AND circuit 03), a calacitor 04), and a correction circuit 051, and the image e:
/t (The output of the lot is input to the positive input terminal of the cossiparator α, while a threshold voltage is set to the negative input terminal.) The output of the cossiparator α is input to the AND circuit state. , 7t (10) are input to the input terminal of the AND circuit 03). The output of the AND circuit (13) is input to the karashita (1), and its output is input to the correction circuit (15).

動 作 今、イメージtシt t+o+ ア出力が第7図(a)
の状鯵であるとき、コシパレータ(lりの出力は、$7
図(b)のように、イメージ℃シサ(+01の出力電圧
がしきい値電圧を越えたときだけ1H1の信号ケ出力す
る。
Operation Now, the image t + o + a output is shown in Figure 7 (a)
When the horse mackerel is in the shape of
As shown in Figure (b), the signal 1H1 is output only when the output voltage of the image ℃shisa (+01) exceeds the threshold voltage.

このコシパレータ02)の出力と第7図(C)のような
イメージセシサ駆動パルスと1iAND回路(13)に
入力することにより、AND回路03)から第7図(d
)のような出力が出る。この出力をカラシタ(14)に
よりパルスカラシトし、補正回路θ5)で傾斜角に対応
した信号に変換して測定対象面(5)の傾斜角を測定で
きる。
By inputting the output of this cosiparator 02) and the image sensor drive pulse as shown in FIG. 7(C) to the 1iAND circuit (13), the AND circuit 03) as shown in FIG.
) will produce output like this. This output is pulsed by a calacitor (14) and converted into a signal corresponding to the tilt angle by a correction circuit θ5), thereby making it possible to measure the tilt angle of the surface to be measured (5).

〔発明の効果〕〔Effect of the invention〕

上述のように本発明は、レーザ光源から放射されるレー
ザー光を平行光束に変換するコリメータと、前記平行光
東金測定対象面に照射しその乱反射光成分を受光するイ
メージセシサと、前記イメー、;セシサの出力全測定対
象面の傾斜角に対応した信号に変換する処理回路とを具
備し、測定対象面の傾斜角を平行光束の見かけ上の巾の
変化として検出する如くしたから、測定対象面の傾斜角
の大小に左右されることなく、広い測定範囲に対して測
定対象面の傾斜角を正確に測定できるという効果を奏す
るものである。
As described above, the present invention includes: a collimator that converts laser light emitted from a laser light source into a parallel beam; an image sensor that irradiates the parallel light onto the measurement target surface of the Togane and receives its diffusely reflected light component; It is equipped with a processing circuit that converts the output into a signal corresponding to the inclination angle of the surface to be measured, and the inclination angle of the surface to be measured is detected as a change in the apparent width of the parallel light beam. This has the effect that the inclination angle of the surface to be measured can be accurately measured over a wide measurement range, regardless of the magnitude of the inclination angle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の傾斜角測定装置の構成図、第2図(a)
〜(C)は同上の動作説明図%第5図は同上の特性図、
第4図は本発明の一実施例の構成図、第5図(a)〜(
e)は同上の動作説1力図、第6図は同上の処理回路の
ブロック回路図、第7図模x噌丼は同上の要部信号波形
図である。 Il+・・・レーザ光源%(3)・・・測定対象面、(
6)・・・処理回路、 (81−・・コリメータ、 (
101・・・イメージt、7す。 代理人 弁理士  石 1)長 七
Figure 1 is a configuration diagram of a conventional inclination angle measuring device, Figure 2 (a)
- (C) is an explanatory diagram of the same operation as above. Figure 5 is a characteristic diagram of the same as above.
FIG. 4 is a block diagram of an embodiment of the present invention, and FIG. 5(a) to (
e) is a power diagram of the same operation theory as above, FIG. 6 is a block circuit diagram of the same processing circuit as above, and FIG. 7 is a diagram of main part signal waveforms as above. Il+...Laser light source% (3)...Measurement target surface, (
6)...Processing circuit, (81-...Collimator, (
101...Image t, 7. Agent Patent Attorney Ishi 1) Choshichi

Claims (1)

【特許請求の範囲】[Claims] (1)レーザ光源から放射されたレーザ光を平行光束に
変換するコリメータと、前記平行光束を測定対象面に照
射しその乱反射光成分を受光するイメージセシサと、前
記イメージセシサの出力を測定対象面の傾斜角に対応し
た信号に変換する処理回路とを具備し、測定対象面の傾
斜角を平行光束の見かけ上の巾の変化として検出する如
くして収ることを特徴とする傾斜角測定装置。
(1) A collimator that converts the laser beam emitted from the laser light source into a parallel beam, an image sensor that irradiates the parallel beam onto the surface to be measured and receives its diffusely reflected light component, and converts the output of the image sensor into the slope of the surface to be measured. 1. An inclination angle measuring device, comprising a processing circuit for converting into a signal corresponding to an angle, and detecting an inclination angle of a surface to be measured as a change in the apparent width of a parallel beam of light.
JP10122183A 1983-06-07 1983-06-07 Inclination angle detector Pending JPS59226805A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10122183A JPS59226805A (en) 1983-06-07 1983-06-07 Inclination angle detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10122183A JPS59226805A (en) 1983-06-07 1983-06-07 Inclination angle detector

Publications (1)

Publication Number Publication Date
JPS59226805A true JPS59226805A (en) 1984-12-20

Family

ID=14294840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10122183A Pending JPS59226805A (en) 1983-06-07 1983-06-07 Inclination angle detector

Country Status (1)

Country Link
JP (1) JPS59226805A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2634015A1 (en) * 1988-07-08 1990-01-12 Thomson Csf Optical device for locating the direction of a mobile support
GB2418486A (en) * 2004-09-28 2006-03-29 Hewlett Packard Development Co Automatic image plane detection system and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2634015A1 (en) * 1988-07-08 1990-01-12 Thomson Csf Optical device for locating the direction of a mobile support
GB2418486A (en) * 2004-09-28 2006-03-29 Hewlett Packard Development Co Automatic image plane detection system and method
US7253427B2 (en) 2004-09-28 2007-08-07 Hewlett-Packard Development Company, L.P. Automatic object plane detection system and method

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