JPS6461061A - A-si thin film transistor - Google Patents
A-si thin film transistorInfo
- Publication number
- JPS6461061A JPS6461061A JP62219347A JP21934787A JPS6461061A JP S6461061 A JPS6461061 A JP S6461061A JP 62219347 A JP62219347 A JP 62219347A JP 21934787 A JP21934787 A JP 21934787A JP S6461061 A JPS6461061 A JP S6461061A
- Authority
- JP
- Japan
- Prior art keywords
- film
- approx
- source
- thin film
- thick
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
Landscapes
- Thin Film Transistor (AREA)
Abstract
PURPOSE:To reduce a current between a drain and a source at the time of nonapplying a gate voltage by employing as a gate insulating film of a thin film transistor having an a-Si layer an Al2O3 film between source, drain electrodes S, D and a gate electrode G. CONSTITUTION:A drain electrode D and a source electrode S are formed in thickness of approx. 1000Angstrom on a glass substrate 1. To form an ohmic contact between an a-Si thin film 3 and source, drain electrodes S, D, ohmic contact layers 2s, 2d made of n<+> type a-Si film are laminated approx. 300-500Angstrom thick. Further, the film 3 as an active layer is formed approx. 1000Angstrom thick. An Al2O3 film is formed as a gate insulating film 4 approx. 1000-1500Angstrom thick on the film 3. A gate electrode G is formed on the film 4. Then, in order to diffuse aluminum in the film 3, it is annealed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219347A JPS6461061A (en) | 1987-09-01 | 1987-09-01 | A-si thin film transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219347A JPS6461061A (en) | 1987-09-01 | 1987-09-01 | A-si thin film transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6461061A true JPS6461061A (en) | 1989-03-08 |
Family
ID=16734027
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62219347A Pending JPS6461061A (en) | 1987-09-01 | 1987-09-01 | A-si thin film transistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6461061A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5208476A (en) * | 1990-06-08 | 1993-05-04 | Seiko Epson Corporation | Low leakage current offset-gate thin film transistor structure |
| US5347146A (en) * | 1991-12-30 | 1994-09-13 | Goldstar Co., Ltd. | Polysilicon thin film transistor of a liquid crystal display |
| CN100442532C (en) * | 1992-07-06 | 2008-12-10 | 株式会社半导体能源研究所 | Active Matrix Display Devices |
-
1987
- 1987-09-01 JP JP62219347A patent/JPS6461061A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5208476A (en) * | 1990-06-08 | 1993-05-04 | Seiko Epson Corporation | Low leakage current offset-gate thin film transistor structure |
| US5347146A (en) * | 1991-12-30 | 1994-09-13 | Goldstar Co., Ltd. | Polysilicon thin film transistor of a liquid crystal display |
| CN100442532C (en) * | 1992-07-06 | 2008-12-10 | 株式会社半导体能源研究所 | Active Matrix Display Devices |
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