JPS60123666U - Inspection equipment for circuit boards, etc. - Google Patents
Inspection equipment for circuit boards, etc.Info
- Publication number
- JPS60123666U JPS60123666U JP1984011326U JP1132684U JPS60123666U JP S60123666 U JPS60123666 U JP S60123666U JP 1984011326 U JP1984011326 U JP 1984011326U JP 1132684 U JP1132684 U JP 1132684U JP S60123666 U JPS60123666 U JP S60123666U
- Authority
- JP
- Japan
- Prior art keywords
- conductor
- proximal
- tip
- movable
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/72—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures
- H01R12/73—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
- H01R24/50—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency mounted on a PCB [Printed Circuit Board]
Landscapes
- Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
- Multi-Conductor Connections (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は本考案の回路基板等の検査装置の正面図、第2
図は第1図の同軸型可動接触プローブの部分の拡大縦断
面図、第3吋は第2図に示す接触プローブの基端部と同
軸ケーブルとの接続の詳細を示す縦断面図、第4図は接
触プローブの基端部の他の接譚態様を示す縦断面図であ
る。
2・・・回路基板支承フレーム、3・・・接触プローブ
支持板、4・・・コネクタ保持板、6・・・コネクタ、
5・・・同軸ケーブル、B・・・回路基板、P・・・同
軸型可動接触プローブ、10・・・中心導体、11・・
・外部導体、12・・・絶縁筒、13・・・貫通孔、1
4・・・外筒、19・・・凹入部、17・・・挿通孔、
20・・・外部導体光、端可動部1,20′・・・・基
端可動部、2′1・・・コイノ、しば・ね、24・・・
中心導体主体、25・・・先端ピン、2。
5′・・・基端ピン、40・・・芯線、41・・・網線
、43・・・外被、50′、60・・・第1接続導体、
5’4,61’・・、・箸2接続導体。Figure 1 is a front view of the inspection device for circuit boards, etc. of the present invention;
The figure is an enlarged vertical cross-sectional view of the coaxial movable contact probe shown in Figure 1, the third figure is a vertical cross-sectional view showing the details of the connection between the proximal end of the contact probe and the coaxial cable shown in Figure 2, and the fourth figure is The figure is a longitudinal cross-sectional view showing another connection mode of the proximal end of the contact probe. 2... Circuit board support frame, 3... Contact probe support plate, 4... Connector holding plate, 6... Connector,
5... Coaxial cable, B... Circuit board, P... Coaxial type movable contact probe, 10... Center conductor, 11...
・External conductor, 12... Insulating cylinder, 13... Through hole, 1
4... Outer cylinder, 19... Recessed part, 17... Insertion hole,
20... External conductor light, end movable part 1, 20'... base end movable part, 2'1... Koino, Shiba-ne, 24...
Center conductor main body, 25...Tip pin, 2. 5'... Base end pin, 40... Core wire, 41... Network wire, 43... Outer cover, 50', 60... First connection conductor,
5'4,61'...Chopstick 2 connection conductor.
Claims (3)
に設けられた支持板にJ筒状の外部導体の内部に中心導
体を絶縁状興で設けた同軸型可動接触プロニブを回路基
板に向かって貫通状態で支持り支持板の回路基板に対す
る相対移動養子より接触プローブの尖端を回路基板の検
査点に接触させて電気的な測定検査を缶なう回路基板等
の検査装置tあって、前記同軸型可動接触プローブの外
部導体の先端および基端に、弾力に、抗して後退可能に
接轄部材としての先蝉可動部材および基端可動部材を電
気的接続状態で装着し、中心導体の先端および基端にも
、弾力に抗しモ後退ツ能に接触部材としての先端ピンお
よび基端ピンを同軸的に装着し、同軸型可動接触プロー
ブの基端側には支持板と一定の距離をおいて、外部導体
の基端可動部材の先端に接する第1の接続導体および中
心導体の基端ピンの先端に接する第2の接続導体を設け
、両接続導体により測定器への接続装置を構成してなる
回路基板等の検査装置。(1) A coaxial type movable contact pronib with a center conductor provided inside a J-cylindrical outer conductor with an insulating hole is attached to a supporting plate that is relatively movable facing the circuit board to be inspected. There is an inspection device for circuit boards, etc., which enables electrical measurement and inspection by bringing the tip of a contact probe into contact with an inspection point on the circuit board from a support plate that moves relative to the circuit board in a penetrating state. , a proximal movable member and a proximal movable member as connecting members are electrically connected to the distal and proximal ends of the outer conductor of the coaxial movable contact probe so as to be retractable against elasticity. A tip pin and a proximal pin as contact members are coaxially attached to the tip and base ends of the conductor to resist elasticity and have the ability to retreat, and a support plate and a fixed pin are attached to the proximal end of the coaxial movable contact probe. A first connection conductor that contacts the tip of the proximal movable member of the outer conductor and a second connection conductor that contacts the tip of the proximal pin of the center conductor are provided at a distance of Inspection equipment for circuit boards, etc. that constitute the equipment.
導体とし、第2の接続導体を筒状導体の内側に同軸的に
配した芯導体とし、筒状導体と芯導体の間に絶縁体を配
してコネクタを構成してなる実用新案登録請求の範自第
1項記載の回路基板等の検査装置。(2) The first connecting conductor is a cylindrical conductor with a flat contact end surface, the second connecting conductor is a core conductor arranged coaxially inside the cylindrical conductor, and the second connecting conductor is a core conductor arranged coaxially inside the cylindrical conductor, and between the cylindrical conductor and the core conductor. An inspection device for circuit boards, etc., as set forth in claim 1 of the utility model registration claim, which comprises a connector by disposing an insulator on the substrate.
の外部導体の基端可動部材について共通の導体として形
成してなる実用新案登録請求の範−間第1項記載の回路
基板等の検査装置。(3) The circuit board, etc. as set forth in paragraph 1 of the claims for registration of a utility model, in which the first connecting conductor is formed as a common conductor for the proximal movable members of the outer conductors of a plurality of movable shaft fixedly operating contact probes. inspection equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984011326U JPS60123666U (en) | 1984-01-30 | 1984-01-30 | Inspection equipment for circuit boards, etc. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984011326U JPS60123666U (en) | 1984-01-30 | 1984-01-30 | Inspection equipment for circuit boards, etc. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60123666U true JPS60123666U (en) | 1985-08-20 |
| JPH0127101Y2 JPH0127101Y2 (en) | 1989-08-14 |
Family
ID=30493342
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984011326U Granted JPS60123666U (en) | 1984-01-30 | 1984-01-30 | Inspection equipment for circuit boards, etc. |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60123666U (en) |
Cited By (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03203342A (en) * | 1989-12-29 | 1991-09-05 | Internatl Business Mach Corp <Ibm> | Testing of integration circuit and device therefor |
| JP2002228682A (en) * | 2001-02-02 | 2002-08-14 | Tokyo Electron Ltd | probe |
| JP2005321211A (en) * | 2004-05-06 | 2005-11-17 | Nidec-Read Corp | Substrate inspection contact, substrate inspection fixture and substrate inspection device using the contact |
| EP1623238A1 (en) * | 2003-05-13 | 2006-02-08 | 3M Innovative Properties Company | Coaxial probe interface |
| JP2009109438A (en) * | 2007-10-31 | 2009-05-21 | Toyo Denshi Giken Kk | Probe for measurement |
| WO2010042926A3 (en) * | 2008-10-10 | 2010-06-03 | Molex Incorporated | Probe connector |
| WO2010075336A1 (en) | 2008-12-25 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075325A1 (en) | 2008-12-25 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075246A1 (en) | 2008-12-22 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075285A1 (en) | 2008-12-24 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| EP2124296A3 (en) * | 2008-05-21 | 2010-10-27 | ITT Manufacturing Enterprises, Inc. | Coax connector |
| JP2012154670A (en) * | 2011-01-24 | 2012-08-16 | Nidec-Read Corp | Inspection jig, electrode structure of inspection jig, and manufacturing method of the same |
| JP2014521951A (en) * | 2011-08-30 | 2014-08-28 | Leeno工業株式会社 | Coaxial probe |
| JP2015075370A (en) * | 2013-10-08 | 2015-04-20 | 日本電産リード株式会社 | Inspection jig, electrode part, probe, and manufacturing method of inspection jig |
| JP2016125841A (en) * | 2014-12-26 | 2016-07-11 | ヒロセ電機株式会社 | Coaxial probe |
| JP2017096646A (en) * | 2015-11-18 | 2017-06-01 | 株式会社日本マイクロニクス | Inspection probe and probe card |
| FR3086108A1 (en) * | 2018-09-19 | 2020-03-20 | Radiall | LOW-STEP MINIATURE COAXIAL HYPERFREQUENCY CONNECTOR, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM |
| FR3086111A1 (en) * | 2018-09-19 | 2020-03-20 | Radiall | MINIATURE LOW STEP COAXIAL HYPERFREQUENCY CONNECTOR WITH MEANS FOR RECALLING EXTERNAL MASS CONTACTS, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM |
| CN111162419A (en) * | 2018-11-08 | 2020-05-15 | 上海雷迪埃电子有限公司 | Radio frequency connector and radio frequency connection structure between two circuit boards |
| CN111653909A (en) * | 2019-03-04 | 2020-09-11 | 泰科电子(上海)有限公司 | Connector |
| EP3809521A4 (en) * | 2018-06-12 | 2022-06-22 | KMW Inc. | CAVITY FILTER AND CONNECTION STRUCTURE INSIDE |
| JP2022096563A (en) * | 2020-12-17 | 2022-06-29 | 日本発條株式会社 | Measuring unit |
-
1984
- 1984-01-30 JP JP1984011326U patent/JPS60123666U/en active Granted
Cited By (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03203342A (en) * | 1989-12-29 | 1991-09-05 | Internatl Business Mach Corp <Ibm> | Testing of integration circuit and device therefor |
| JP2002228682A (en) * | 2001-02-02 | 2002-08-14 | Tokyo Electron Ltd | probe |
| EP1623238A1 (en) * | 2003-05-13 | 2006-02-08 | 3M Innovative Properties Company | Coaxial probe interface |
| JP2007503591A (en) * | 2003-05-13 | 2007-02-22 | スリーエム イノベイティブ プロパティズ カンパニー | Coaxial probe interface |
| JP2005321211A (en) * | 2004-05-06 | 2005-11-17 | Nidec-Read Corp | Substrate inspection contact, substrate inspection fixture and substrate inspection device using the contact |
| JP2009109438A (en) * | 2007-10-31 | 2009-05-21 | Toyo Denshi Giken Kk | Probe for measurement |
| EP2124296A3 (en) * | 2008-05-21 | 2010-10-27 | ITT Manufacturing Enterprises, Inc. | Coax connector |
| WO2010042926A3 (en) * | 2008-10-10 | 2010-06-03 | Molex Incorporated | Probe connector |
| WO2010075246A1 (en) | 2008-12-22 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075285A1 (en) | 2008-12-24 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075336A1 (en) | 2008-12-25 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| WO2010075325A1 (en) | 2008-12-25 | 2010-07-01 | Molex Incorporated | Coaxial connector |
| JP2012154670A (en) * | 2011-01-24 | 2012-08-16 | Nidec-Read Corp | Inspection jig, electrode structure of inspection jig, and manufacturing method of the same |
| JP2014521951A (en) * | 2011-08-30 | 2014-08-28 | Leeno工業株式会社 | Coaxial probe |
| JP2015075370A (en) * | 2013-10-08 | 2015-04-20 | 日本電産リード株式会社 | Inspection jig, electrode part, probe, and manufacturing method of inspection jig |
| JP2016125841A (en) * | 2014-12-26 | 2016-07-11 | ヒロセ電機株式会社 | Coaxial probe |
| JP2017096646A (en) * | 2015-11-18 | 2017-06-01 | 株式会社日本マイクロニクス | Inspection probe and probe card |
| EP3809521A4 (en) * | 2018-06-12 | 2022-06-22 | KMW Inc. | CAVITY FILTER AND CONNECTION STRUCTURE INSIDE |
| US12027740B2 (en) | 2018-06-12 | 2024-07-02 | Kmw Inc. | Cavity filter comprising a terminal portion having first and second conductive terminals with an elastic member disposed there between |
| FR3086111A1 (en) * | 2018-09-19 | 2020-03-20 | Radiall | MINIATURE LOW STEP COAXIAL HYPERFREQUENCY CONNECTOR WITH MEANS FOR RECALLING EXTERNAL MASS CONTACTS, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM |
| EP3627628A1 (en) * | 2018-09-19 | 2020-03-25 | Radiall | Low-pitch miniature hyperfrequency coaxial connector, intended in particular for mutually connecting two printed circuit boards |
| FR3086108A1 (en) * | 2018-09-19 | 2020-03-20 | Radiall | LOW-STEP MINIATURE COAXIAL HYPERFREQUENCY CONNECTOR, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM |
| CN111162419A (en) * | 2018-11-08 | 2020-05-15 | 上海雷迪埃电子有限公司 | Radio frequency connector and radio frequency connection structure between two circuit boards |
| CN111162419B (en) * | 2018-11-08 | 2022-07-12 | 上海雷迪埃电子有限公司 | Radio frequency connector and radio frequency connection structure between two circuit boards |
| CN111653909A (en) * | 2019-03-04 | 2020-09-11 | 泰科电子(上海)有限公司 | Connector |
| JP2022096563A (en) * | 2020-12-17 | 2022-06-29 | 日本発條株式会社 | Measuring unit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0127101Y2 (en) | 1989-08-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS60123666U (en) | Inspection equipment for circuit boards, etc. | |
| JPS5932740B2 (en) | Coaxial array space converter | |
| KR950006472A (en) | Probe card, coaxial probe beam for probe card and manufacturing method thereof | |
| JPS58144215U (en) | Capacitance probe of displacement meter | |
| JPH0521020Y2 (en) | ||
| JPS60123665U (en) | Coaxial type contact probe and coaxial cable connection device for circuit board inspection equipment, etc. | |
| JPS6143854B2 (en) | ||
| JPH048379Y2 (en) | ||
| JP3133872B2 (en) | Rotary probe, printed board and connection device | |
| JP3042181B2 (en) | IC socket to supply power to IC | |
| JPS60185263U (en) | Contact probe for inspection equipment for circuit boards, etc. | |
| JPS5828360Y2 (en) | IC clip | |
| JPH0668920A (en) | Cable connector | |
| JP2601680Y2 (en) | Contact board for auto handler with ground board | |
| JPS60109056U (en) | Terminal connection mechanism | |
| JPH0128466Y2 (en) | ||
| JPS63279179A (en) | Measurement socket for integrated circuit apparatus | |
| JPS61197577U (en) | ||
| JPS6011077U (en) | probe device | |
| JPH04126175U (en) | Insulated contact pin | |
| JPS60109279U (en) | connector | |
| JPS6430458U (en) | ||
| JPS5832475U (en) | Handling device electrode | |
| JPS58116677U (en) | Inspection equipment for mounted printed circuit boards | |
| JPH01144875U (en) |