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JPS60123666U - Inspection equipment for circuit boards, etc. - Google Patents

Inspection equipment for circuit boards, etc.

Info

Publication number
JPS60123666U
JPS60123666U JP1984011326U JP1132684U JPS60123666U JP S60123666 U JPS60123666 U JP S60123666U JP 1984011326 U JP1984011326 U JP 1984011326U JP 1132684 U JP1132684 U JP 1132684U JP S60123666 U JPS60123666 U JP S60123666U
Authority
JP
Japan
Prior art keywords
conductor
proximal
tip
movable
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1984011326U
Other languages
Japanese (ja)
Other versions
JPH0127101Y2 (en
Inventor
中島 鋼
斉田 勝利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd filed Critical Yokowo Co Ltd
Priority to JP1984011326U priority Critical patent/JPS60123666U/en
Publication of JPS60123666U publication Critical patent/JPS60123666U/en
Application granted granted Critical
Publication of JPH0127101Y2 publication Critical patent/JPH0127101Y2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/91Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • H01R12/72Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures
    • H01R12/73Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/50Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency mounted on a PCB [Printed Circuit Board]

Landscapes

  • Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
  • Multi-Conductor Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の回路基板等の検査装置の正面図、第2
図は第1図の同軸型可動接触プローブの部分の拡大縦断
面図、第3吋は第2図に示す接触プローブの基端部と同
軸ケーブルとの接続の詳細を示す縦断面図、第4図は接
触プローブの基端部の他の接譚態様を示す縦断面図であ
る。 2・・・回路基板支承フレーム、3・・・接触プローブ
支持板、4・・・コネクタ保持板、6・・・コネクタ、
5・・・同軸ケーブル、B・・・回路基板、P・・・同
軸型可動接触プローブ、10・・・中心導体、11・・
・外部導体、12・・・絶縁筒、13・・・貫通孔、1
4・・・外筒、19・・・凹入部、17・・・挿通孔、
20・・・外部導体光、端可動部1,20′・・・・基
端可動部、2′1・・・コイノ、しば・ね、24・・・
中心導体主体、25・・・先端ピン、2。 5′・・・基端ピン、40・・・芯線、41・・・網線
、43・・・外被、50′、60・・・第1接続導体、
5’4,61’・・、・箸2接続導体。
Figure 1 is a front view of the inspection device for circuit boards, etc. of the present invention;
The figure is an enlarged vertical cross-sectional view of the coaxial movable contact probe shown in Figure 1, the third figure is a vertical cross-sectional view showing the details of the connection between the proximal end of the contact probe and the coaxial cable shown in Figure 2, and the fourth figure is The figure is a longitudinal cross-sectional view showing another connection mode of the proximal end of the contact probe. 2... Circuit board support frame, 3... Contact probe support plate, 4... Connector holding plate, 6... Connector,
5... Coaxial cable, B... Circuit board, P... Coaxial type movable contact probe, 10... Center conductor, 11...
・External conductor, 12... Insulating cylinder, 13... Through hole, 1
4... Outer cylinder, 19... Recessed part, 17... Insertion hole,
20... External conductor light, end movable part 1, 20'... base end movable part, 2'1... Koino, Shiba-ne, 24...
Center conductor main body, 25...Tip pin, 2. 5'... Base end pin, 40... Core wire, 41... Network wire, 43... Outer cover, 50', 60... First connection conductor,
5'4,61'...Chopstick 2 connection conductor.

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)検査すべき回路基板に対向して相対的に移動自在
に設けられた支持板にJ筒状の外部導体の内部に中心導
体を絶縁状興で設けた同軸型可動接触プロニブを回路基
板に向かって貫通状態で支持り支持板の回路基板に対す
る相対移動養子より接触プローブの尖端を回路基板の検
査点に接触させて電気的な測定検査を缶なう回路基板等
の検査装置tあって、前記同軸型可動接触プローブの外
部導体の先端および基端に、弾力に、抗して後退可能に
接轄部材としての先蝉可動部材および基端可動部材を電
気的接続状態で装着し、中心導体の先端および基端にも
、弾力に抗しモ後退ツ能に接触部材としての先端ピンお
よび基端ピンを同軸的に装着し、同軸型可動接触プロー
ブの基端側には支持板と一定の距離をおいて、外部導体
の基端可動部材の先端に接する第1の接続導体および中
心導体の基端ピンの先端に接する第2の接続導体を設け
、両接続導体により測定器への接続装置を構成してなる
回路基板等の検査装置。
(1) A coaxial type movable contact pronib with a center conductor provided inside a J-cylindrical outer conductor with an insulating hole is attached to a supporting plate that is relatively movable facing the circuit board to be inspected. There is an inspection device for circuit boards, etc., which enables electrical measurement and inspection by bringing the tip of a contact probe into contact with an inspection point on the circuit board from a support plate that moves relative to the circuit board in a penetrating state. , a proximal movable member and a proximal movable member as connecting members are electrically connected to the distal and proximal ends of the outer conductor of the coaxial movable contact probe so as to be retractable against elasticity. A tip pin and a proximal pin as contact members are coaxially attached to the tip and base ends of the conductor to resist elasticity and have the ability to retreat, and a support plate and a fixed pin are attached to the proximal end of the coaxial movable contact probe. A first connection conductor that contacts the tip of the proximal movable member of the outer conductor and a second connection conductor that contacts the tip of the proximal pin of the center conductor are provided at a distance of Inspection equipment for circuit boards, etc. that constitute the equipment.
(2)第1の接続導体を平たんな接触端面を有する筒状
導体とし、第2の接続導体を筒状導体の内側に同軸的に
配した芯導体とし、筒状導体と芯導体の間に絶縁体を配
してコネクタを構成してなる実用新案登録請求の範自第
1項記載の回路基板等の検査装置。
(2) The first connecting conductor is a cylindrical conductor with a flat contact end surface, the second connecting conductor is a core conductor arranged coaxially inside the cylindrical conductor, and the second connecting conductor is a core conductor arranged coaxially inside the cylindrical conductor, and between the cylindrical conductor and the core conductor. An inspection device for circuit boards, etc., as set forth in claim 1 of the utility model registration claim, which comprises a connector by disposing an insulator on the substrate.
(3)第1の接続導体を複数の動軸堅稼動接触プローブ
の外部導体の基端可動部材について共通の導体として形
成してなる実用新案登録請求の範−間第1項記載の回路
基板等の検査装置。
(3) The circuit board, etc. as set forth in paragraph 1 of the claims for registration of a utility model, in which the first connecting conductor is formed as a common conductor for the proximal movable members of the outer conductors of a plurality of movable shaft fixedly operating contact probes. inspection equipment.
JP1984011326U 1984-01-30 1984-01-30 Inspection equipment for circuit boards, etc. Granted JPS60123666U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1984011326U JPS60123666U (en) 1984-01-30 1984-01-30 Inspection equipment for circuit boards, etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1984011326U JPS60123666U (en) 1984-01-30 1984-01-30 Inspection equipment for circuit boards, etc.

Publications (2)

Publication Number Publication Date
JPS60123666U true JPS60123666U (en) 1985-08-20
JPH0127101Y2 JPH0127101Y2 (en) 1989-08-14

Family

ID=30493342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1984011326U Granted JPS60123666U (en) 1984-01-30 1984-01-30 Inspection equipment for circuit boards, etc.

Country Status (1)

Country Link
JP (1) JPS60123666U (en)

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03203342A (en) * 1989-12-29 1991-09-05 Internatl Business Mach Corp <Ibm> Testing of integration circuit and device therefor
JP2002228682A (en) * 2001-02-02 2002-08-14 Tokyo Electron Ltd probe
JP2005321211A (en) * 2004-05-06 2005-11-17 Nidec-Read Corp Substrate inspection contact, substrate inspection fixture and substrate inspection device using the contact
EP1623238A1 (en) * 2003-05-13 2006-02-08 3M Innovative Properties Company Coaxial probe interface
JP2009109438A (en) * 2007-10-31 2009-05-21 Toyo Denshi Giken Kk Probe for measurement
WO2010042926A3 (en) * 2008-10-10 2010-06-03 Molex Incorporated Probe connector
WO2010075336A1 (en) 2008-12-25 2010-07-01 Molex Incorporated Coaxial connector
WO2010075325A1 (en) 2008-12-25 2010-07-01 Molex Incorporated Coaxial connector
WO2010075246A1 (en) 2008-12-22 2010-07-01 Molex Incorporated Coaxial connector
WO2010075285A1 (en) 2008-12-24 2010-07-01 Molex Incorporated Coaxial connector
EP2124296A3 (en) * 2008-05-21 2010-10-27 ITT Manufacturing Enterprises, Inc. Coax connector
JP2012154670A (en) * 2011-01-24 2012-08-16 Nidec-Read Corp Inspection jig, electrode structure of inspection jig, and manufacturing method of the same
JP2014521951A (en) * 2011-08-30 2014-08-28 Leeno工業株式会社 Coaxial probe
JP2015075370A (en) * 2013-10-08 2015-04-20 日本電産リード株式会社 Inspection jig, electrode part, probe, and manufacturing method of inspection jig
JP2016125841A (en) * 2014-12-26 2016-07-11 ヒロセ電機株式会社 Coaxial probe
JP2017096646A (en) * 2015-11-18 2017-06-01 株式会社日本マイクロニクス Inspection probe and probe card
FR3086108A1 (en) * 2018-09-19 2020-03-20 Radiall LOW-STEP MINIATURE COAXIAL HYPERFREQUENCY CONNECTOR, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM
FR3086111A1 (en) * 2018-09-19 2020-03-20 Radiall MINIATURE LOW STEP COAXIAL HYPERFREQUENCY CONNECTOR WITH MEANS FOR RECALLING EXTERNAL MASS CONTACTS, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM
CN111162419A (en) * 2018-11-08 2020-05-15 上海雷迪埃电子有限公司 Radio frequency connector and radio frequency connection structure between two circuit boards
CN111653909A (en) * 2019-03-04 2020-09-11 泰科电子(上海)有限公司 Connector
EP3809521A4 (en) * 2018-06-12 2022-06-22 KMW Inc. CAVITY FILTER AND CONNECTION STRUCTURE INSIDE
JP2022096563A (en) * 2020-12-17 2022-06-29 日本発條株式会社 Measuring unit

Cited By (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03203342A (en) * 1989-12-29 1991-09-05 Internatl Business Mach Corp <Ibm> Testing of integration circuit and device therefor
JP2002228682A (en) * 2001-02-02 2002-08-14 Tokyo Electron Ltd probe
EP1623238A1 (en) * 2003-05-13 2006-02-08 3M Innovative Properties Company Coaxial probe interface
JP2007503591A (en) * 2003-05-13 2007-02-22 スリーエム イノベイティブ プロパティズ カンパニー Coaxial probe interface
JP2005321211A (en) * 2004-05-06 2005-11-17 Nidec-Read Corp Substrate inspection contact, substrate inspection fixture and substrate inspection device using the contact
JP2009109438A (en) * 2007-10-31 2009-05-21 Toyo Denshi Giken Kk Probe for measurement
EP2124296A3 (en) * 2008-05-21 2010-10-27 ITT Manufacturing Enterprises, Inc. Coax connector
WO2010042926A3 (en) * 2008-10-10 2010-06-03 Molex Incorporated Probe connector
WO2010075246A1 (en) 2008-12-22 2010-07-01 Molex Incorporated Coaxial connector
WO2010075285A1 (en) 2008-12-24 2010-07-01 Molex Incorporated Coaxial connector
WO2010075336A1 (en) 2008-12-25 2010-07-01 Molex Incorporated Coaxial connector
WO2010075325A1 (en) 2008-12-25 2010-07-01 Molex Incorporated Coaxial connector
JP2012154670A (en) * 2011-01-24 2012-08-16 Nidec-Read Corp Inspection jig, electrode structure of inspection jig, and manufacturing method of the same
JP2014521951A (en) * 2011-08-30 2014-08-28 Leeno工業株式会社 Coaxial probe
JP2015075370A (en) * 2013-10-08 2015-04-20 日本電産リード株式会社 Inspection jig, electrode part, probe, and manufacturing method of inspection jig
JP2016125841A (en) * 2014-12-26 2016-07-11 ヒロセ電機株式会社 Coaxial probe
JP2017096646A (en) * 2015-11-18 2017-06-01 株式会社日本マイクロニクス Inspection probe and probe card
EP3809521A4 (en) * 2018-06-12 2022-06-22 KMW Inc. CAVITY FILTER AND CONNECTION STRUCTURE INSIDE
US12027740B2 (en) 2018-06-12 2024-07-02 Kmw Inc. Cavity filter comprising a terminal portion having first and second conductive terminals with an elastic member disposed there between
FR3086111A1 (en) * 2018-09-19 2020-03-20 Radiall MINIATURE LOW STEP COAXIAL HYPERFREQUENCY CONNECTOR WITH MEANS FOR RECALLING EXTERNAL MASS CONTACTS, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM
EP3627628A1 (en) * 2018-09-19 2020-03-25 Radiall Low-pitch miniature hyperfrequency coaxial connector, intended in particular for mutually connecting two printed circuit boards
FR3086108A1 (en) * 2018-09-19 2020-03-20 Radiall LOW-STEP MINIATURE COAXIAL HYPERFREQUENCY CONNECTOR, IN PARTICULAR FOR CONNECTING TWO PRINTED CIRCUIT BOARDS BETWEEN THEM
CN111162419A (en) * 2018-11-08 2020-05-15 上海雷迪埃电子有限公司 Radio frequency connector and radio frequency connection structure between two circuit boards
CN111162419B (en) * 2018-11-08 2022-07-12 上海雷迪埃电子有限公司 Radio frequency connector and radio frequency connection structure between two circuit boards
CN111653909A (en) * 2019-03-04 2020-09-11 泰科电子(上海)有限公司 Connector
JP2022096563A (en) * 2020-12-17 2022-06-29 日本発條株式会社 Measuring unit

Also Published As

Publication number Publication date
JPH0127101Y2 (en) 1989-08-14

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