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JPS61198650A - Master slice semiconductor integrated circuit - Google Patents

Master slice semiconductor integrated circuit

Info

Publication number
JPS61198650A
JPS61198650A JP60037857A JP3785785A JPS61198650A JP S61198650 A JPS61198650 A JP S61198650A JP 60037857 A JP60037857 A JP 60037857A JP 3785785 A JP3785785 A JP 3785785A JP S61198650 A JPS61198650 A JP S61198650A
Authority
JP
Japan
Prior art keywords
gate
cells
input
semiconductor integrated
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60037857A
Other languages
Japanese (ja)
Inventor
Fusao Tsubokura
坪倉 富左雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60037857A priority Critical patent/JPS61198650A/en
Publication of JPS61198650A publication Critical patent/JPS61198650A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/998Input and output buffer/driver structures

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To enable a large degree of freedom to be given to circuit construction, by a method wherein cells in the gate region of I/O circuits can be utilized as inner gate cells. CONSTITUTION:In I/O gate cell arrangement, the gate regions of I/O circuits A1-An+2 and C1-Cn+2 have cells each disposed in parallel in the same structural array as the inner gate cell array I1 or In outside it, and the gate regions of I/O circuits B1-Bn+2 and D1-Dn+2 have cells each disposed in succession at both ends of this parallel-disposed I/O circuit gate cell arrays or at both ends of the inner gate cell arrays. Those cells which can adopt such an arrangement are obtained by eliminating the necessary minimum numbers of cells satisfying the I/O circuit function: for example, cells constituting the Schmitt circuit, tri-state circuit, etc.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は論理回路構成のためのマスター舎スライス中導
体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a conductor integrated circuit in a master slice for logic circuit configuration.

(従来の技術) 論理回路の作成を目的としたマスター・スライス半導体
集積回路#−1″1通常、!a理ゲート・セル配列と配
線チャネル領域とが基板の内部領域に、また入出力回路
が周辺領域にそれぞれ配置される。
(Prior art) Master slice semiconductor integrated circuit #-1''1 for the purpose of creating logic circuits Normally, the gate cell array and the wiring channel region are in the internal area of the substrate, and the input/output circuit is Each is placed in the surrounding area.

ここで論理ゲート・セル配列(以下、内部ゲート・セル
配列という)は、想定される配線チャネル軸域の配線格
子と整合するよう和、同一構造同一寸法のセルが規則的
に配列されているが、入出力回路のゲート領域内圧配置
されるゲート・セルは、入出力回路部の制御のみを目的
として設計されているので、その構造寸法および配線格
子Fi何れも内部ゲートφセル配列および配線チャネル
領域のものとは異なる。
Here, in the logic gate cell array (hereinafter referred to as internal gate cell array), cells with the same structure and the same dimensions are regularly arranged to match the wiring grid of the assumed wiring channel axis area. , Internal pressure in the gate region of the input/output circuit Since the gate cell arranged is designed only for the purpose of controlling the input/output circuit section, its structural dimensions and wiring grid Fi are both internal gate φ cell arrangement and wiring channel region. different from that of

(発明が解決しようとする問題点) しかしながら、!スター中スライス半導体集積回路は、
その性格上攬々異なるゲート数を持つ論理回路の構成に
使用される。従って、成る場合は内部ゲート−セルに余
りが出、また他の場合には一部に不足が生ずる。内部ゲ
ート−セルは132ビ/のもので4104個が配列され
ているマスター・スライス半導体集積回路の例があるが
、構成すべき論理回路の規模によってはなおゲート数が
不足する場合があシ1回路構成に好ましからざる制限を
与える。この場合1回路設計者が不足と考えるゲート数
は、−回路当シ僅か数ゲートから多くても数十ゲートを
超えない、勿論これら不足分を予かしめ内部ゲート・セ
ル配列のなかに含めて準備しておけば解決するが、ゲー
ト数に余シを生ずる回路構成が行なわれる場合には益々
セルの利用効率を低下せしめる。また、他の使用形態の
一つく、例えば40ビンだけを使用するが必要とするゲ
ート数に一部不足を生ずる場合も起こる。この場合には
入出力回路に余シが生じ、そのゲート領域内のゲート・
セルは全く利用されない、すなわち、折角準備されてい
るKも拘わらずゲート数の不足に対応することができず
、回路設計に対し全く自由度を持たず柔軟性に欠ける。
(Problem to be solved by the invention) However! Slice semiconductor integrated circuits in star
Due to their nature, they are used to construct logic circuits with different numbers of gates. Therefore, in some cases, there will be a surplus in the internal gate cells, and in other cases, there will be a shortage in some parts. There is an example of a master slice semiconductor integrated circuit in which 4104 internal gate cells are arranged at 132 bits per cell, but depending on the scale of the logic circuit to be constructed, the number of gates may still be insufficient1. This imposes undesirable restrictions on circuit configuration. In this case, the number of gates that a circuit designer considers to be insufficient per circuit ranges from just a few gates to at most several dozen gates.Of course, these shortages must be prepared in advance and included in the internal gate/cell arrangement. However, if a circuit configuration that causes an excess in the number of gates is used, the efficiency of cell utilization is further reduced. Furthermore, in another usage mode, for example, only 40 bins are used, but there may be a case where the required number of gates is partially insufficient. In this case, there will be excess space in the input/output circuit, and the gates and
The cells are not used at all, that is, despite the painstaking preparation of K, it is not possible to cope with the shortage of gates, and the circuit design has no degree of freedom and lacks flexibility.

(発明の目的) 本発明の目的は、上記の情況に鑑み、種々の使用形態に
柔軟に対応し回路構成に大きな自由度を与え得るゲート
・セル配列を備えたマスター・スライス半導体集積回路
を提供することである。
(Object of the Invention) In view of the above circumstances, an object of the present invention is to provide a master slice semiconductor integrated circuit equipped with a gate cell arrangement that can flexibly accommodate various usage forms and provide a large degree of freedom in circuit configuration. It is to be.

(発明の構成) 本発明のマスタm−スライス半導体集積回路は、半導体
基板上に配線チャネル領域をそれぞれ介し並列配置され
た複数個の内部ゲート・セル配列と、入出力回路部を制
御するゲート領域内の少くとも一部のゲート・セルを前
記内部ゲート・セル配列のセルと同一構造寸法に設定し
且つ前記配線チャネル領域の想定配線格子K[合させて
、前記内部ゲート−セル配列領域の周辺にそれぞれ配置
する入出力回路とを含む。
(Structure of the Invention) A master m-slice semiconductor integrated circuit of the present invention includes a plurality of internal gate cell arrays arranged in parallel on a semiconductor substrate via wiring channel regions, and a gate region that controls an input/output circuit section. At least some of the gate cells in the internal gate cell array are set to have the same structural dimensions as the cells in the internal gate cell array, and the assumed wiring grid K of the wiring channel region [along with the periphery of the internal gate cell array region] and input/output circuits placed in each.

(問題点を解決するための手段) すなわち、本発明によれば、入出力回路のゲート領域内
に配置されるゲート・セルは1例えば、入力2771回
路の初段および出力バッファ回路の最終段の如く、ゲー
ト・しきい値電圧7丁IC1ll!格さが要求されるも
のや静電耐圧が十分高くすることが要求されるものを除
1!−1その大部分は内部ゲート・セル配列のセルと同
一構造寸法、すなわち、同一チャネル長、同一チャネル
幅を備えるよう設定され、且つ配線チャネル領域の想定
配線格子のピッチ間隔と揃うよう整合されたうえ、内部
ゲート・セル配列領域の周辺にそれぞれ配列される。
(Means for solving the problem) That is, according to the present invention, the number of gate cells arranged in the gate region of the input/output circuit is one, for example, the first stage of the input 2771 circuit and the last stage of the output buffer circuit. , gate/threshold voltage 7 IC1ll! Except for those that require high quality or sufficiently high electrostatic withstand voltage! -1 Most of them are set to have the same structural dimensions as the cells of the internal gate cell array, that is, the same channel length and channel width, and are aligned to match the pitch spacing of the expected wiring grid in the wiring channel region. Moreover, they are arranged around the internal gate cell arrangement area.

(作用) 従りて、内部ゲート・セル配列と直交するよう配置され
た複数個の入出力回路の各ゲート領域のケート・セルは
、内部ゲート・セル配列の外側にこれと同一構造配列で
それぞれ一列に並列配置され、また平行するよう配置さ
れた複数個の入出力回路の各ゲート領域のゲート・セル
は、内部ゲート・セル配列の両端にそれぞれ連続して配
置される。また、必要に応じ配線チャネル”領域と平行
する位rltKIjJ定配締格子のピッチ@に整合され
て配置される。入出力回路のゲート領域内のゲートやセ
ルの斯かる配列構造は、恰かも内部ゲート・セル配列の
セル数が見掛は上増加したように作用し、種々の使用形
態に対応しそれぞれの配線液ect−施すだけで、不足
するゲート数を補なう目的にも或いは本来の入出力回路
制御ゲート・セルとして使用することもできる。以下図
面を#照して本発明の詳細な説明する。
(Function) Therefore, the gate cells in each gate region of the plurality of input/output circuits arranged perpendicularly to the internal gate cell array are arranged in the same structure outside the internal gate cell array. The gate cells of each gate region of the plurality of input/output circuits arranged in parallel and parallel to each other are arranged consecutively at both ends of the internal gate cell array. In addition, if necessary, the wiring channel area is arranged in parallel with the pitch of the rltKIjJ constant grid grid. Such an array structure of gates and cells in the gate area of the input/output circuit may be arranged in parallel with the wiring channel area. The number of cells in the gate cell array appears to have increased, and by simply applying the respective wiring solution to correspond to various usage patterns, it can be used to compensate for the insufficient number of gates or to solve the original problem. It can also be used as an input/output circuit control gate cell.The present invention will be described in detail below with reference to the drawings.

(芙施例) 第1図は本発明の一実施例を示す入出力回路ゲート領域
内の配置図でおる。本笑施例では、半導体基板1と、こ
の半導体基板1の内部領域〈それぞれ配置されたN個の
内部ゲート・セル配列I。
(Embodiment) FIG. 1 is a layout diagram of an input/output circuit gate area showing an embodiment of the present invention. In this embodiment, a semiconductor substrate 1 and an internal region of this semiconductor substrate 1 (N internal gate cell arrays I arranged respectively) are described.

〜1.および想定配線格子を有するM個の配線チャネル
領域り、、Llllと、周辺@域に配置されたそれぞれ
(N+2)個の入出力回路’ 1−An+ 2 *B 
1 ′−Bn+2 +  CI ”’−Cn+2 + 
 およびD I−D n + 2と、そのゲート領域内
に内部ゲート・セルと同一チャネル長く設定され、配線
チャネル領域L1〜L1の想定配線格子のピッチ間隔に
それぞれ整合されて配置された入出力ゲート・セル配列
ai1〜”nil + b1+++bn+2 、 Cl
〜’n+4およびd12d0+2とを含む。
~1. and M wiring channel regions with assumed wiring grids, , Lllll, and (N+2) input/output circuits arranged in the surrounding @ area' 1-An+ 2 *B
1 '-Bn+2 + CI ''-Cn+2 +
and D I-D n + 2, and input/output gates set in the gate region to have the same channel length as the internal gate cells, and arranged to match the pitch interval of the assumed wiring grid in the wiring channel regions L1 to L1.・Cell array ai1~”nil + b1+++bn+2, Cl
~'n+4 and d12d0+2.

本実施例の入出力ゲート−セル配列では、入出力回路A
 I ” A n+ 2およびc1〜Cn+2のゲート
領域内では内部グー)−セル配列工!または工。の外側
にこれと同一構造配列でそれぞれ一列に並列配置され、
また入出力回路Bl−Bn44およびD1〜Dn+4の
ゲート領域内では、この並列配置された入出力回路ゲー
ト・セル配列の両端または内部ゲートΦセル配列の両端
にそれぞれ連続して配置される。このような配列をとシ
得るセルは、入出力回路機能を満たす必要最小限のセル
を除いたもので5例えばシェミット回路およびトライス
テート回路などを構成するセルでおる。従って、入力バ
ラフッ回路の初段および出力バラフッ回路の最終段を構
成するセルなどKは適用されない。本実施例に従って、
内部ゲート・セル配列のセル数は見掛は上2配列以上増
加したように作用し1種々の使用形態に対応して不足す
るゲート数を補なう目的にも或いはシ晶ミツト回路また
はトライステート回路の構成の目的にも多面的に使用す
ることができる。
In the input/output gate-cell arrangement of this embodiment, the input/output circuit A
In the gate regions of I'' A n+ 2 and c1 to Cn+2, the internal cells are arranged in parallel in a row in the same structural arrangement on the outside of the internal cell array structure! or cell array structure.
Further, in the gate regions of the input/output circuits Bl-Bn44 and D1 to Dn+4, they are successively arranged at both ends of the parallelly arranged input/output circuit gate cell array or at both ends of the internal gate Φ cell array. Cells that can be arranged in this manner are cells that constitute, for example, Shemit circuits and tri-state circuits, excluding the minimum necessary cells that satisfy the input/output circuit function. Therefore, K, such as the cells forming the first stage of the input balancing circuit and the final stage of the output balancing circuit, is not applied. According to this example,
The number of cells in the internal gate cell array appears to have increased by more than the two arrays above, and may be used to compensate for the insufficient number of gates in response to various usage patterns, or to use a crystalline circuit or tri-state circuit. It can also be used for many purposes in circuit configuration.

第2図は本発明の他の実施例を示す入出力回路ゲート−
セルの部分配置図である0本実施例では、1個の入出力
回路のゲート領域内圧都合よく整数個のセル配列ができ
ない場合の配列構造を示す。
FIG. 2 is an input/output circuit gate showing another embodiment of the present invention.
This embodiment shows an arrangement structure in the case where an integer number of cells cannot be arranged conveniently due to the internal pressure of the gate region of one input/output circuit.

この場合には互いVC@接する入出力回路、例えばλl
とA2の各ゲート領域にわたって1個のセルを形成せし
める。すなわち、一方の入出力回路人=を裏返しの形く
形成し点線で示したように、2個のゲート領域を利用し
て1個のセルを形成せしめる。ここで1F″およびww
は一方の入出力回路人=が他方のA!に対して長返しの
形にあることを表わす記号である。
In this case, input/output circuits that are in contact with each other, such as λl
One cell is formed over each gate region of A2 and A2. That is, one input/output circuit is formed upside down and two gate regions are used to form one cell, as shown by the dotted line. Here 1F'' and lol
is one input/output circuit person = is the other A! This symbol indicates that it is in the form of a long return.

また、第3図は本発明のその他の実施例を示す入出力回
路グー)−セルの部分配置図でおる0本  ・実施例で
は、ゲート領域内のセルが2配列に分たれて配置されそ
の一つが配線チャネル領域り、〜L、llの想定格子配
列のピッチ間隔にそれぞれ整合されて配置されたもので
ある。第3図にはその一つが配列b1′として示されて
いる0本実施例の場合は、配列できるセル数は数個程度
に制限されるので、僅か数ゲートが不足するだけの使用
形態の回路構成に利用し得る。
FIG. 3 is a partial layout diagram of input/output circuit cells showing another embodiment of the present invention. In the embodiment, the cells in the gate region are arranged in two arrays. One is the wiring channel region, which is arranged to match the pitch interval of the assumed lattice arrangement of ~L and 11, respectively. In the case of this embodiment, one of which is shown as array b1' in FIG. Can be used for configuration.

(発明の効果) 以上詳細に説明したように1本発明Yこよれば、マスタ
ーやスライス半導体集積回路の基本設計理念および製造
技術には何等の変更をすることなく、入出力回路のゲー
ト領域内のセルを内部ゲート−セルとしても利用し得る
ようにしたので、回路設計に大きな自由度を与えること
ができ、檀々の使用形態に柔軟り対応を求められふマス
ター・スライス半導体集積回路にあって、設計技術上き
わめて顕著な効果をあげ得る。
(Effects of the Invention) As described in detail above, according to the present invention, the gate area of the input/output circuit can be easily removed without any change in the basic design philosophy or manufacturing technology of the master or slice semiconductor integrated circuit. The cell can also be used as an internal gate cell, giving greater flexibility in circuit design and making it ideal for master-slice semiconductor integrated circuits, which require flexibility in adapting to various usage patterns. This can bring about extremely significant effects in terms of design technology.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す入出力回路ゲート領域
内の配置図、第2図は本発明の他の実施例を示す入出力
ゲート・セルの部分配置図、第3    ・図は本発明
のその他の実施例を示す入出力回路ゲート・セルの部分
配置図である。 l・・・・・・半導体基板、  I1%I、・・・・・
・内部ゲート・セル配列、Ll−LI!l・・・・・・
配線チャネル領域、Al〜人n+t+  B1−Bts
+2m  C1〜Cn+z、 1)1〜Da44 ””
”入出力回路、a 1〜afl−H、b l 〜bn+
2゜’ l −’n+2 y  dl 〜dn+2 *
  b1’ ”””入出力回路のゲート領域内の入出力
ブート帝セル配列。
FIG. 1 is a layout diagram of an input/output circuit gate area showing one embodiment of the present invention, FIG. 2 is a partial layout diagram of an input/output gate cell showing another embodiment of the invention, and FIG. FIG. 7 is a partial layout diagram of an input/output circuit gate cell showing another embodiment of the present invention. l...Semiconductor substrate, I1%I,...
・Internal gate cell arrangement, Ll-LI! l...
Wiring channel region, Al~person n+t+ B1-Bts
+2m C1~Cn+z, 1)1~Da44 ""
"Input/output circuit, a 1 ~ afl-H, b l ~ bn+
2゜' l -'n+2 y dl ~dn+2 *
b1'"""I/O boot cell array in the gate area of the I/O circuit.

Claims (3)

【特許請求の範囲】[Claims] (1)半導体基板上に並列配置された複数個の内部ゲー
ト・セル配列と、入出力回路部を制御するゲート領域内
の少くとも一部のゲート・セルを前記内部ゲート・セル
配列のセルと同一構造寸法に設定し且つ配線チャネル領
域の想定配線格子に整合させて、前記内部ゲート・セル
配列領域の周辺に配置された入出力回路とを備えること
を特徴とするマスター・スライス半導体集積回路。
(1) A plurality of internal gate cell arrays arranged in parallel on a semiconductor substrate, and at least some of the gate cells in the gate region that controls the input/output circuit section as cells of the internal gate cell array. A master slice semiconductor integrated circuit comprising: an input/output circuit arranged around the internal gate/cell arrangement region, set to the same structural dimensions and aligned with an assumed wiring grid of the wiring channel region.
(2)前記ゲート領域内の入出力回路ゲート・セルが、
前記内部ゲート・セル配列に対し並列または連続の2つ
の配列構造で周辺配置されることを特徴とする特許請求
の範囲第(1)項記載のマスター・スライス半導体集積
回路。
(2) The input/output circuit gate cell in the gate region is
The master slice semiconductor integrated circuit according to claim 1, wherein the master slice semiconductor integrated circuit is arranged around the internal gate cell array in two array structures in parallel or in series.
(3)前記ゲート領域内の入出力回路ゲート・セルの一
部が、前記並列配置された2つの内部ゲート・セル配列
の間に配置され前記配線チャネル領域の想定配線格子の
ピッチ幅に一致させて配列されることを特徴とする特許
請求の範囲第(1)項記載のマスター・スライス半導体
集積回路。
(3) A portion of the input/output circuit gate cells in the gate region are arranged between the two parallelly arranged internal gate cell arrays and are arranged to match the pitch width of the assumed wiring grid in the wiring channel region. The master slice semiconductor integrated circuit according to claim 1, wherein the master slice semiconductor integrated circuit is arranged in a manner that the master slice semiconductor integrated circuit is arranged in a manner that the master slice semiconductor integrated circuit is arranged as follows.
JP60037857A 1985-02-27 1985-02-27 Master slice semiconductor integrated circuit Pending JPS61198650A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60037857A JPS61198650A (en) 1985-02-27 1985-02-27 Master slice semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60037857A JPS61198650A (en) 1985-02-27 1985-02-27 Master slice semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS61198650A true JPS61198650A (en) 1986-09-03

Family

ID=12509211

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60037857A Pending JPS61198650A (en) 1985-02-27 1985-02-27 Master slice semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS61198650A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5459085A (en) * 1994-05-13 1995-10-17 Lsi Logic Corporation Gate array layout to accommodate multi angle ion implantation
US5563446A (en) * 1994-01-25 1996-10-08 Lsi Logic Corporation Surface mount peripheral leaded and ball grid array package

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5563446A (en) * 1994-01-25 1996-10-08 Lsi Logic Corporation Surface mount peripheral leaded and ball grid array package
US5789811A (en) * 1994-01-25 1998-08-04 Lsi Logic Corporation Surface mount peripheral leaded and ball grid array package
US5933710A (en) * 1994-01-25 1999-08-03 Lsi Logic Corporation Method of providing electrical connection between an integrated circuit die and a printed circuit board
US5459085A (en) * 1994-05-13 1995-10-17 Lsi Logic Corporation Gate array layout to accommodate multi angle ion implantation
US5936285A (en) * 1994-05-13 1999-08-10 Lsi Logic Corporation Gate array layout to accommodate multi-angle ion implantation

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