JPS62294167A - Copper film manufacturing method - Google Patents
Copper film manufacturing methodInfo
- Publication number
- JPS62294167A JPS62294167A JP13490086A JP13490086A JPS62294167A JP S62294167 A JPS62294167 A JP S62294167A JP 13490086 A JP13490086 A JP 13490086A JP 13490086 A JP13490086 A JP 13490086A JP S62294167 A JPS62294167 A JP S62294167A
- Authority
- JP
- Japan
- Prior art keywords
- copper film
- copper
- glass substrate
- weight
- film manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】 3、発明の詳細な説明 [産業上の利用分野コ 本発明は、銅膜の製造方法に関する。[Detailed description of the invention] 3. Detailed description of the invention [Industrial application fields] The present invention relates to a method for manufacturing a copper film.
[従来の技術]
一般にガラス基板に金属元素を真空蒸着した場合、その
接着力はAu、Ag等の酸化され難い金属では小さく、
Cr 、N1−Cr XT 1 、N1 n等の酸化さ
れ易い金属では大きい。銅はこれらの元素の中間の接着
強度を有している。このためガラス基板に銅を高い強度
で接着したい場合、ガラス基板の表面に一旦接着力の大
きいC「蒸着層等の下地層を形成し、その上に銅を蒸着
することが行なわれている。しかしながら、このような
方法によるものでは下地層を余分に形成するため、生産
性、経済性が悪い欠点が有る。[Prior Art] Generally, when a metal element is vacuum-deposited on a glass substrate, the adhesive force is small for metals that are difficult to oxidize, such as Au and Ag.
It is large for metals that are easily oxidized such as Cr, N1-CrXT1, and N1n. Copper has an adhesive strength intermediate between these elements. For this reason, when it is desired to bond copper to a glass substrate with high strength, a base layer such as a C vapor deposition layer with a strong adhesive force is formed on the surface of the glass substrate, and copper is vapor-deposited thereon. However, this method has the disadvantage of poor productivity and economy because an extra underlayer is formed.
そこで、余分な下地層を形成せずに銅蒸着層の接着強度
を高める手段として、基板温度を高くして抵抗加熱や電
子銃による銅の真空蒸着が行なわれている。Therefore, as a means of increasing the adhesion strength of the copper vapor deposited layer without forming an extra underlayer, the substrate temperature is increased and copper is vacuum vapor deposited using resistance heating or an electron gun.
[発明が解決しようとする問題点]
しかしながら、抵抗加熱や電子銃によって銅を蒸発させ
て真空蒸着を行なうものでは、排気ガスの流量の変化に
よって真空度が変動し、均一な膜厚の銅膜を安定して形
成することが難しい。また、基板温度を高くして蒸着を
行なうものは、基板構。[Problems to be Solved by the Invention] However, when vacuum deposition is performed by evaporating copper using resistance heating or an electron gun, the degree of vacuum fluctuates due to changes in the flow rate of exhaust gas, making it difficult to form a copper film with a uniform thickness. difficult to form stably. Also, those that perform vapor deposition at a high substrate temperature have a substrate structure.
酸物質に十分な耐熱性がない場合は採用できない。It cannot be used if the acid substance does not have sufficient heat resistance.
更に、真空蒸着プロセスの観点から蒸着の際の温度は低
い方が好ましい。Furthermore, from the viewpoint of the vacuum evaporation process, it is preferable that the temperature during evaporation be lower.
本発明は、かかる点に鑑みてなされたものであリ、ガラ
ス基板上に全く下地層を形成せずに、しかも、低温で銅
を十分に高い接着力の下に容易に蒸着させることができ
る銅膜の製造方法を提供するものである。The present invention has been made in view of these points, and allows copper to be easily vapor-deposited at low temperatures with sufficiently high adhesion strength without forming any base layer on the glass substrate. A method for manufacturing a copper film is provided.
[問題点を解決するための手段〕
本発明は、被蒸着体のガラス基板に1重量%以上のAI
を含有した銅からなるターゲットを使用してスパッタ蒸
着によって銅膜を形成することを特徴とする銅膜の製造
方法である。[Means for Solving the Problems] The present invention provides that 1% by weight or more of AI is applied to a glass substrate as an object to be deposited.
This is a method for producing a copper film, characterized in that the copper film is formed by sputter deposition using a target made of copper containing .
ここで、本発明は、各種電極及び導体配線、印刷回路や
フレキシブル印刷回路の形成等に適用できるものである
。Here, the present invention can be applied to the formation of various electrodes, conductor wiring, printed circuits, flexible printed circuits, and the like.
また、ターゲットを構成する鋼中のAlの量は、1〜1
0重量%の範囲に設定するのがが好ましい。In addition, the amount of Al in the steel constituting the target is 1 to 1
It is preferable to set it in the range of 0% by weight.
Alの量を1重量%以上とするのは、図に示す銅膜の接
着強度とCu中のAlの量との関係の特性線Iから明ら
かなように、AIの量が1重量%を越える当りから十分
な接着強度が得られることが実験的に確認されているか
らである。AIの量を10重量%未満とするのは、この
値を越えると銅膜としての性質(例えば表面反射率、エ
ツチング液に対する溶解性)が失なわれるという実情を
考慮したものである。かかる銅膜の性質の変化を十分に
考慮したものであれば、10重量%以上の値であっても
良いことは勿論である。The reason for setting the amount of Al to be 1% by weight or more is that the amount of Al exceeds 1% by weight, as is clear from the characteristic line I of the relationship between the adhesive strength of the copper film and the amount of Al in Cu shown in the figure. This is because it has been experimentally confirmed that sufficient adhesive strength can be obtained from contact. The reason why the amount of AI is less than 10% by weight is to take into consideration the fact that if this value is exceeded, the properties of the copper film (eg, surface reflectance, solubility in etching solution) are lost. Of course, the value may be 10% by weight or more as long as such changes in the properties of the copper film are sufficiently taken into account.
[作用コ
本発明にかかる銅膜の製造方法によれば、ガラス基板に
1重量%以上のAIを含有した銅からなるターゲットを
使用してスパッタ蒸着によって銅膜を形成するので、銅
膜を結晶組織が緻密な状態で高い接着強度によって成膜
することができる。また、膜が緻密なので水、やチッ素
が吸着するような欠陥も発生せず接着強度の向上を助長
する。その結果、ガラス基板上に全く下地層を形成せず
に、しかも、低温で銅を十分に高い接着力の下に容易に
蒸着させることができる。[Function] According to the method for manufacturing a copper film according to the present invention, a copper film is formed on a glass substrate by sputter deposition using a target made of copper containing 1% by weight or more of AI. It is possible to form a film with a dense structure and high adhesive strength. Furthermore, since the film is dense, defects such as adsorption of water or nitrogen do not occur, which helps improve adhesive strength. As a result, copper can be easily vapor-deposited at low temperatures and with sufficiently high adhesive strength without forming any underlayer on the glass substrate.
[実施例] 以下、本発明の実施例について説明する。[Example] Examples of the present invention will be described below.
3インチΦX1.6Mの高ガラス転移点ガラス(コーニ
ング社商品名、ソーダーライム705B、)からなるガ
ラス基板をクロム酸混合液に浸漬後、純水ですすぎ純水
を注水しながらスポンジで擦って洗浄して自動乾燥した
。このように前処理を施したガラス基板を回転式のドー
ム状基板ホルダを備えたスパッタ装置(CNC社商品名
AST−601,DC平板2極スパッタ装置)に設置し
、通常の排気操作で8x 10−6Torrの減圧状態
に設定して下記の条件でスパッタリングを行ない、厚さ
1μの銅膜を形成した。A glass substrate made of 3 inch Φ x 1.6 M high glass transition point glass (Corning's product name, Soder Lime 705B) was immersed in a chromic acid mixture, then rinsed with pure water and cleaned by rubbing with a sponge while pouring pure water. and dried automatically. The glass substrate pretreated in this way was placed in a sputtering device equipped with a rotating dome-shaped substrate holder (CNC Co., Ltd. product name: AST-601, DC flat plate bipolar sputtering device), and an 8×10 Sputtering was performed under the following conditions under a reduced pressure of -6 Torr to form a copper film with a thickness of 1 μm.
このように形成した銅膜の接着強度を調べるためにセロ
テープによる剥離テストを行ったところ、基板温度が1
00℃、200℃のいずれの場合も膜剥がれを起こさず
十分に高い接着力を有していることが分った。In order to investigate the adhesive strength of the copper film formed in this way, we performed a peel test using cellophane tape and found that the substrate temperature was 1.
It was found that the film did not peel off at both temperatures of 00°C and 200°C and had sufficiently high adhesive strength.
また、前述の銅膜を580の微細パターンにして加重テ
ストを行なったところ、第1図に示すようにCoo
CKg/d>以上の値であり極めて良好な結果であるこ
とが分った。In addition, when a weight test was conducted using the aforementioned copper film as a 580-meter fine pattern, as shown in Fig.
It was found that the value was greater than or equal to CKg/d, which was an extremely good result.
作業時の真空度 4xlO’ Torr回
転 数 20/分RPM設
定 温 度 90℃ 1
0分スパッタリング時間 30〜35分タ −
ゲ ッ ト 8インチx 8mmターゲ
ツト材質 Cu+AI(1〜10%)[発明
の効果]
以上説明した如く、本発明にかかる銅膜の製造方法によ
れば、ガラス基板上に何ら下地層を形成せずに、しかも
、低温で銅を十分に高い接着力の下に容易に蒸着させる
ことができるものである。Vacuum level during work: 4xlO' Torr times
Rotation speed 20/min RPM setting Temperature 90℃ 1
0 minute sputtering time 30-35 minutes
Target: 8 inches x 8 mm Target material: Cu+AI (1 to 10%) [Effects of the invention] As explained above, according to the method for producing a copper film according to the present invention, no base layer is formed on the glass substrate. Furthermore, copper can be easily deposited at low temperatures with sufficiently high adhesion.
第1図は、銅膜の接着強度とCu中のAIの量との関係
を示す特性図である。FIG. 1 is a characteristic diagram showing the relationship between the adhesive strength of a copper film and the amount of AI in Cu.
Claims (2)
有した銅からなるターゲットを使用してスパッタ蒸着に
よって銅膜を形成することを特徴とする銅膜の製造方法
。(1) A method for producing a copper film, which comprises forming a copper film on a glass substrate as a deposition target by sputter deposition using a target made of copper containing 1% by weight or more of Al.
lが含有していることを特徴とする特許請求の範囲第1
項記載の銅膜の製造方法。(2) 1 to 10% by weight of A in the copper constituting the target
Claim 1 characterized in that l contains
The method for producing a copper film described in Section 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13490086A JPH07831B2 (en) | 1986-06-12 | 1986-06-12 | Copper film manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13490086A JPH07831B2 (en) | 1986-06-12 | 1986-06-12 | Copper film manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62294167A true JPS62294167A (en) | 1987-12-21 |
| JPH07831B2 JPH07831B2 (en) | 1995-01-11 |
Family
ID=15139145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13490086A Expired - Lifetime JPH07831B2 (en) | 1986-06-12 | 1986-06-12 | Copper film manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07831B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008030368A1 (en) * | 2006-09-08 | 2008-03-13 | Tosoh Smd, Inc. | Copper sputtering target with fine grain size and high electromigration resistance and methods of making the same |
-
1986
- 1986-06-12 JP JP13490086A patent/JPH07831B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008030368A1 (en) * | 2006-09-08 | 2008-03-13 | Tosoh Smd, Inc. | Copper sputtering target with fine grain size and high electromigration resistance and methods of making the same |
| JP2010502841A (en) * | 2006-09-08 | 2010-01-28 | トーソー エスエムディー,インク. | Copper sputtering target having very small crystal grain size and high electromigration resistance and method for producing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH07831B2 (en) | 1995-01-11 |
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