KR100223747B1 - 고속 저잡음 출력 버퍼 - Google Patents
고속 저잡음 출력 버퍼 Download PDFInfo
- Publication number
- KR100223747B1 KR100223747B1 KR1019950062119A KR19950062119A KR100223747B1 KR 100223747 B1 KR100223747 B1 KR 100223747B1 KR 1019950062119 A KR1019950062119 A KR 1019950062119A KR 19950062119 A KR19950062119 A KR 19950062119A KR 100223747 B1 KR100223747 B1 KR 100223747B1
- Authority
- KR
- South Korea
- Prior art keywords
- input data
- transistor
- terminal
- pull
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1057—Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/106—Data output latches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
- H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Logic Circuits (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Abstract
Description
Claims (9)
- 입력데이터를 게이트단으로 입력받아 풀업구동하는 풀업트랜지스터와, 상기 입력데이터를 게이트단으로 입력받아 풀다운구동하는 풀다운트랜지스터를 구비하는 반도체메모리소자의 출력버퍼에 있어서; 공급전원단과 상기 풀업트랜지스터의 게이트단 사이에 차례로 직렬 접속된 제1 및 제2 스위칭수단; 접지전원단과 상기 풀다운트랜지스터의 게이트단 사이에 차례로 직렬 접속된 제3 및 제4 스위칭수단; 상기 입력데이터에 응답하여 상기 입력데이터가 천이할 때 상기 제1스위칭수단을 일시적으로 턴온시키기 위한 제1입력데이터천이검출수단; 상기 입력데이터에 응답하여 상기 입력데이터가 천이할 때 상기 제3스위칭수단을 일시적으로 턴온시키기 위한 제2입력데이터천이검출수단; 불안정한 높은 공급전압이 공급될 때 상기 제2스위칭수단을 턴온시키고 안정된 낮은 공급전원이 공급될 때 상기 제2스위칭수단을 턴오프시키기 위한 전압을 출력하는 제1전압발생수단; 및 불안정한 높은 공급전압이 공급될 때 상기 제2스위칭수단을 턴온시키고 안정된 낮은 공급전원이 공급될 때 상기 제4스위칭수단을 턴오프시키기 위한 전압을 출력하는 제2전압발생수단을 포함하여 이루어진 출력버퍼.
- 제1항에 있어서, 상기 제1스위칭수단을 제1피모스트랜지스터이며, 상기 제2스위칭수단은 제2피모스트랜지스터 임을 특징으로 하는 출력버퍼.
- 제1항에 있어서, 상기 제3스위칭수단은 제1엔모스트랜지스터이며, 상기 제4스위칭수단은 제2엔모스트랜지스터 임을 특징으로 하는 출력버퍼.
- 제1항에 있어서, 상기 풀업트랜지스터는 피모스트랜지스터이며, 상기 제1입력데이터천이검출수단은 상기 입력데이터가 논리 하이에서 로우로 천이되는 것을 검출하여 로우 펄스를 발생시키도록 구성됨을 특징으로 하는 출력버퍼.
- 제1항에 있어서, 상기 풀다운트랜지스터는 엔모스트랜지스터이며, 상기 제2입력데이터천이검출수단은 상기 입력데이터가 논리 로우에서 하이로 천이되는 것을 검출하여 하이 펄스를 발생시키도록 구성됨을 특징으로 하는 출력버퍼.
- 제2항에 있어서; 상기 제1전압발생수단은, 상기 제2피모스트랜지스터의 게이트단과 상기 공급전원단과 사이에 채널이 형성되고, 게이트는 접지전원을 공급받는 제3피모스트랜지스터; 및 상기 제2피모스트랜지스터의 게이트단과 상기 접지전원단 사이에 직렬연결된 다수의 다이오드형 엔모스트랜지스터를 포함하여 이루어짐을 특징으로 하는 출력버퍼.
- 제3항에 있어서; 상기 제2전압발생수단은, 상기 접지전원단과 상기 제2엔모스트랜지스터의 게이트단 사이에 채널이 형성되고, 게이트로 공급전원을 공급받는 제3엔모스트랜지스터; 및 상기 공급전원단과 상기 제2엔모스트랜지스터의 게이트단 사이에 직렬연결된 다수의 다이오드형 엔모스트랜지스터를 포함하여 이루어짐을 특징으로 하는 출력버퍼.
- 제4항에 있어서; 상기 제1입력데이터천이검출수단은, 일입력단으로 상기 입력데이터의 반전된 신호를 입력받으며, 타입력단으로 상기 입력데이터의 지연된 신호를 입력받는 낸드게이트를 포함하여 이루어짐을 특징으로 하는 출력버퍼.
- 제5항에 있어서; 상기 제2입력데이터천이검출수단은; 일입력단으로 상기 입력데이터의 반전된 신호를 입력받으며, 타입력단으로 상기 입력데이터의 지연된 신호를 입력받는 노아게이트를 포함하여 이루어짐을 특징으로 하는 출력버퍼.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950062119A KR100223747B1 (ko) | 1995-12-28 | 1995-12-28 | 고속 저잡음 출력 버퍼 |
| GB9626914A GB2308698B (en) | 1995-12-28 | 1996-12-24 | High-speed and low-noise output buffer |
| US08/773,563 US5708608A (en) | 1995-12-28 | 1996-12-27 | High-speed and low-noise output buffer |
| TW085116226A TW371346B (en) | 1995-12-28 | 1996-12-28 | High-speed and low-noise output buffer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950062119A KR100223747B1 (ko) | 1995-12-28 | 1995-12-28 | 고속 저잡음 출력 버퍼 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970055504A KR970055504A (ko) | 1997-07-31 |
| KR100223747B1 true KR100223747B1 (ko) | 1999-10-15 |
Family
ID=19446125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950062119A Expired - Fee Related KR100223747B1 (ko) | 1995-12-28 | 1995-12-28 | 고속 저잡음 출력 버퍼 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5708608A (ko) |
| KR (1) | KR100223747B1 (ko) |
| GB (1) | GB2308698B (ko) |
| TW (1) | TW371346B (ko) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100206926B1 (ko) * | 1996-07-26 | 1999-07-01 | 구본준 | 반도체 메모리의 라이트 오동작 방지회로 |
| KR100238247B1 (ko) * | 1997-05-16 | 2000-01-15 | 윤종용 | 고속 저전력 신호라인 드라이버 및 이를 이용한 반도체메모리장치 |
| KR100298182B1 (ko) * | 1997-06-24 | 2001-08-07 | 박종섭 | 반도체메모리소자의출력버퍼 |
| US6768165B1 (en) * | 1997-08-01 | 2004-07-27 | Saifun Semiconductors Ltd. | Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping |
| JP3206737B2 (ja) * | 1998-03-27 | 2001-09-10 | 日本電気株式会社 | ラッチ回路 |
| US6584017B2 (en) | 2001-04-05 | 2003-06-24 | Saifun Semiconductors Ltd. | Method for programming a reference cell |
| US6791396B2 (en) * | 2001-10-24 | 2004-09-14 | Saifun Semiconductors Ltd. | Stack element circuit |
| US7098107B2 (en) * | 2001-11-19 | 2006-08-29 | Saifun Semiconductor Ltd. | Protective layer in memory device and method therefor |
| US6700818B2 (en) * | 2002-01-31 | 2004-03-02 | Saifun Semiconductors Ltd. | Method for operating a memory device |
| US6917544B2 (en) * | 2002-07-10 | 2005-07-12 | Saifun Semiconductors Ltd. | Multiple use memory chip |
| US7136304B2 (en) | 2002-10-29 | 2006-11-14 | Saifun Semiconductor Ltd | Method, system and circuit for programming a non-volatile memory array |
| US20040151032A1 (en) * | 2003-01-30 | 2004-08-05 | Yan Polansky | High speed and low noise output buffer |
| US6842383B2 (en) | 2003-01-30 | 2005-01-11 | Saifun Semiconductors Ltd. | Method and circuit for operating a memory cell using a single charge pump |
| US7178004B2 (en) * | 2003-01-31 | 2007-02-13 | Yan Polansky | Memory array programming circuit and a method for using the circuit |
| US6885244B2 (en) | 2003-03-24 | 2005-04-26 | Saifun Semiconductors Ltd. | Operational amplifier with fast rise time |
| US7142464B2 (en) | 2003-04-29 | 2006-11-28 | Saifun Semiconductors Ltd. | Apparatus and methods for multi-level sensing in a memory array |
| US6906966B2 (en) | 2003-06-16 | 2005-06-14 | Saifun Semiconductors Ltd. | Fast discharge for program and verification |
| US7123532B2 (en) * | 2003-09-16 | 2006-10-17 | Saifun Semiconductors Ltd. | Operating array cells with matched reference cells |
| US7050319B2 (en) * | 2003-12-03 | 2006-05-23 | Micron Technology, Inc. | Memory architecture and method of manufacture and operation thereof |
| US8339102B2 (en) * | 2004-02-10 | 2012-12-25 | Spansion Israel Ltd | System and method for regulating loading on an integrated circuit power supply |
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| WO2005094178A2 (en) * | 2004-04-01 | 2005-10-13 | Saifun Semiconductors Ltd. | Method, circuit and systems for erasing one or more non-volatile memory cells |
| US7190212B2 (en) * | 2004-06-08 | 2007-03-13 | Saifun Semiconductors Ltd | Power-up and BGREF circuitry |
| US7187595B2 (en) * | 2004-06-08 | 2007-03-06 | Saifun Semiconductors Ltd. | Replenishment for internal voltage |
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| US7317633B2 (en) | 2004-07-06 | 2008-01-08 | Saifun Semiconductors Ltd | Protection of NROM devices from charge damage |
| US7095655B2 (en) * | 2004-08-12 | 2006-08-22 | Saifun Semiconductors Ltd. | Dynamic matching of signal path and reference path for sensing |
| US20060068551A1 (en) * | 2004-09-27 | 2006-03-30 | Saifun Semiconductors, Ltd. | Method for embedding NROM |
| US7638850B2 (en) * | 2004-10-14 | 2009-12-29 | Saifun Semiconductors Ltd. | Non-volatile memory structure and method of fabrication |
| US20060146624A1 (en) * | 2004-12-02 | 2006-07-06 | Saifun Semiconductors, Ltd. | Current folding sense amplifier |
| US7535765B2 (en) | 2004-12-09 | 2009-05-19 | Saifun Semiconductors Ltd. | Non-volatile memory device and method for reading cells |
| EP1684307A1 (en) * | 2005-01-19 | 2006-07-26 | Saifun Semiconductors Ltd. | Method, circuit and systems for erasing one or more non-volatile memory cells |
| US8053812B2 (en) | 2005-03-17 | 2011-11-08 | Spansion Israel Ltd | Contact in planar NROM technology |
| US20070141788A1 (en) * | 2005-05-25 | 2007-06-21 | Ilan Bloom | Method for embedding non-volatile memory with logic circuitry |
| US8400841B2 (en) * | 2005-06-15 | 2013-03-19 | Spansion Israel Ltd. | Device to program adjacent storage cells of different NROM cells |
| US7184313B2 (en) * | 2005-06-17 | 2007-02-27 | Saifun Semiconductors Ltd. | Method circuit and system for compensating for temperature induced margin loss in non-volatile memory cells |
| US7804126B2 (en) * | 2005-07-18 | 2010-09-28 | Saifun Semiconductors Ltd. | Dense non-volatile memory array and method of fabrication |
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| US7668017B2 (en) | 2005-08-17 | 2010-02-23 | Saifun Semiconductors Ltd. | Method of erasing non-volatile memory cells |
| US20070096199A1 (en) * | 2005-09-08 | 2007-05-03 | Eli Lusky | Method of manufacturing symmetric arrays |
| US7221138B2 (en) | 2005-09-27 | 2007-05-22 | Saifun Semiconductors Ltd | Method and apparatus for measuring charge pump output current |
| US20070120180A1 (en) * | 2005-11-25 | 2007-05-31 | Boaz Eitan | Transition areas for dense memory arrays |
| US7352627B2 (en) * | 2006-01-03 | 2008-04-01 | Saifon Semiconductors Ltd. | Method, system, and circuit for operating a non-volatile memory array |
| US7808818B2 (en) * | 2006-01-12 | 2010-10-05 | Saifun Semiconductors Ltd. | Secondary injection for NROM |
| US20070173017A1 (en) * | 2006-01-20 | 2007-07-26 | Saifun Semiconductors, Ltd. | Advanced non-volatile memory array and method of fabrication thereof |
| US7760554B2 (en) * | 2006-02-21 | 2010-07-20 | Saifun Semiconductors Ltd. | NROM non-volatile memory and mode of operation |
| US8253452B2 (en) * | 2006-02-21 | 2012-08-28 | Spansion Israel Ltd | Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same |
| US7692961B2 (en) * | 2006-02-21 | 2010-04-06 | Saifun Semiconductors Ltd. | Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection |
| US7638835B2 (en) | 2006-02-28 | 2009-12-29 | Saifun Semiconductors Ltd. | Double density NROM with nitride strips (DDNS) |
| US7701779B2 (en) * | 2006-04-27 | 2010-04-20 | Sajfun Semiconductors Ltd. | Method for programming a reference cell |
| US7768221B2 (en) * | 2006-06-02 | 2010-08-03 | Power Efficiency Corporation | Method, system, and apparatus for controlling an electric motor |
| US7605579B2 (en) * | 2006-09-18 | 2009-10-20 | Saifun Semiconductors Ltd. | Measuring and controlling current consumption and output current of charge pumps |
| US20080239599A1 (en) * | 2007-04-01 | 2008-10-02 | Yehuda Yizraeli | Clamping Voltage Events Such As ESD |
| JP5921996B2 (ja) * | 2012-09-12 | 2016-05-24 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4806794A (en) * | 1987-07-22 | 1989-02-21 | Advanced Micro Devices, Inc. | Fast, low-noise CMOS output buffer |
| KR900007214B1 (ko) * | 1987-08-31 | 1990-10-05 | 삼성전자 주식회사 | 고임피던스를 이용한 스태틱램의 데이타 출력버퍼 |
| JPH03147418A (ja) * | 1989-11-02 | 1991-06-24 | Hitachi Ltd | 半導体集積回路,半導体メモリ及びマイクロプロセツサ |
| JP2530055B2 (ja) * | 1990-08-30 | 1996-09-04 | 株式会社東芝 | 半導体集積回路 |
| KR930008656B1 (ko) * | 1991-07-19 | 1993-09-11 | 삼성전자 주식회사 | 노이즈가 억제되는 데이타 출력 버퍼 |
| KR950010567B1 (ko) * | 1992-10-30 | 1995-09-19 | 삼성전자주식회사 | 반도체장치의 출력단회로 |
| KR960004567B1 (ko) * | 1994-02-04 | 1996-04-09 | 삼성전자주식회사 | 반도체 메모리 장치의 데이타 출력 버퍼 |
| US5602783A (en) * | 1996-02-01 | 1997-02-11 | Micron Technology, Inc. | Memory device output buffer |
-
1995
- 1995-12-28 KR KR1019950062119A patent/KR100223747B1/ko not_active Expired - Fee Related
-
1996
- 1996-12-24 GB GB9626914A patent/GB2308698B/en not_active Expired - Fee Related
- 1996-12-27 US US08/773,563 patent/US5708608A/en not_active Expired - Lifetime
- 1996-12-28 TW TW085116226A patent/TW371346B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR970055504A (ko) | 1997-07-31 |
| GB2308698A (en) | 1997-07-02 |
| TW371346B (en) | 1999-10-01 |
| US5708608A (en) | 1998-01-13 |
| GB2308698B (en) | 2000-03-01 |
| GB9626914D0 (en) | 1997-02-12 |
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