KR100284559B1 - 처리방법 및 처리장치 - Google Patents
처리방법 및 처리장치 Download PDFInfo
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- KR100284559B1 KR100284559B1 KR1019950007866A KR19950007866A KR100284559B1 KR 100284559 B1 KR100284559 B1 KR 100284559B1 KR 1019950007866 A KR1019950007866 A KR 1019950007866A KR 19950007866 A KR19950007866 A KR 19950007866A KR 100284559 B1 KR100284559 B1 KR 100284559B1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Coating Apparatus (AREA)
Abstract
Description
Claims (15)
- 직사각형의 LCD용 기판에 레지스트를 도포하고, 도포한 레지스트의 일부를 제거하는 레지스트 처리방법에 있어서, 기판을 스핀회전시키면서 기판에 레지스트액을 공급하고, 기판의 적어도 한쪽면에 레지스트막을 형성하는 레지스트 도포공정과, 상기 레지스트 도포공정을 실행한 곳으로부터 떨어진 장소에 기판을 반송하는 반송공정과, 적어도 기판의 둘레부로부터 바깥방향을 향하는 기류가 발생하도록 기판의 둘레부의 근방영역을 배기하면서 레지스트를 용해할 수 있는 제거액을 기판양면의 둘레부에 분사하고, 기판양면의 둘레부로부터 레지스트막을 제거하는 레지스트 제거공정을 가지는 것을 특징으로 하는 직사각형 기판의 레지스트 처리방법.
- 제1항에 있어서, 레지스트 제거공정에서는 기판의 4변 근방의 양면으로부터 동시 진행적으로 레지스트막을 제거하는 것을 특징으로 하는 처리방법.
- 제1항에 있어서, 레지스트 제거공정은, 기판의 마주보는 2변 근방의 양면으로부터 동시 진행적으로 레지스트막을 제거하는 제 1 제거공정과, 기판의 다른 2변 근방의 양면으로부터 동시 진행적으로 레지스트막을 제거하는 제 2 제거공정을 구비하는 것을 특징으로 하는 처리방법.
- 제1항에 있어서, 레지스트 제거공정은 보조 세정공정을 더욱 포함하며, 이 보조 세정공정에서, 기판 코너부의 뒷면을 향하여 레지스트를 용해할 수 있는 제거액을 뿜어대고, 기판 코너부의 이면으로 부터 레지스트막을 제거하는 것을 특징으로 하는 처리방법.
- 제1항에 있어서, 레지스트 제거공정에서는 기판의 표면측보다도 기판의 이면측 쪽을 폭넓게 레지스트막을 제거하는 것을 특징으로 하는 처리방법.
- 제1항에 있어서, 레지스트 제거롱정에서는 기판의 모서리 끝단부로부터 5∼ 10mm 의 영역으로부터 레지스트막을 제거하는 것을 특징으로 하는 처리방법.
- 제1항에 있어서, 레지스트 제거공정에서는 제거액으로서 신나를 이용하는 것을 특징으로 하는 처리방법.
- 기판을 스핀 회전시켜서 기판에 레지스트액을 도포하는 레지스트 도포수단과, 이 레지스트 도포수단으로부터 간격을 두고 설치되어, 도포된 레지스트를 기판에서 제거하는 레지스트 제거수단과, 상기 레지스트 도포수단과 레지스트 제거수단의 사이에서 기판을 반송하기 위한 반송수단을 구비하고, 상기 레지스트 제거수단은, 레지스트를 용해할 수 있는 제거액을 기판의 둘레부에 뿜어대는 노즐수단과, 이 노즐수단을 기판의 둘레부를 따라서 이동시키는 이동수단과, 기판의 둘레부로부터 기판의 외부로의 기류가 형성되도록 기판의 둘레부로 공기를 방출하기 위하여 상기 레지스트 제거수단과 연이어 통하는 배기수단을 포함하며, 상기 노즐수단으로부터 뿜어내진 제거액이 기판의 둘레부의 레지스트를 벗겨내고 상기 기류에 의하여 그 레지스트를 기판의 외부로 배출하는 것을 특징으로 하는 직사각형 기판의 레지스트 처리장치.
- 제8항에 있어서, 레지스트 제거수단은, 기판을 유지하는 유지수단과, 이 유지수단을 기판과 함께 회전시키는 회전수단을 더욱 포함하는 것을 특징으로하는 처 리장치.
- 제8항에 있어서, 노즐수단은, 기판의 둘레부를 따라서 이동가능하게 설치되고, 기판양면의 둘레부에 제거액을 뿜어대는 주 세정노즐과, 기판뒷면의 코너부에 제거액을 뿜어대는 보조세정 노즐을 갖는 것을 특징으로 하는 처리장치.
- 제10항에 있어서, 주 세정노즐은, 둘레부에서 기판의 표면측 및 뒷면측에 대면하도록 배치된 다수개의 노즐부재를 포함하며, 상기 노즐부재들은 각 노즐부재들로부터 분사된 제거액이 다른 노즐부재와 간섭하지 않도록 그들 사이에 간격을 두고 어긋나게 배치되는 것을 특징으로 하는 처리장치.
- 직사각형의 LCD용 기판에 레지스트를 도포하는 레지스트 처리방법에 있어서, 기판을 유지하여 회전시키는 스핀척과, 이 스핀척을 둘러싸는 회전가능한 회전컵과, 이 회전컵의 적어도 바깥둘레를 둘러싸는 드레인컵을 구비하며, 상기 스핀척으로 기판을 유지하고, 기판을 상기 스핀척에 의해 회전시킴과 동시에 상기 회전컵을 회전시켜 상기 회전컵내의 기판을 향하여 레지스트액을 공급하며, 상기 회전컵내를 배기함과 동시에 외기를 상기 회전컵내에 도입함으로써 레지스트 도포중인 기판의 주위에 기판의 둘레부로부터 기판의 바깥방향으로 향하는 기류를 발생시켜 이 기류에 의해 상기 회전컵내에 부유하는 레지스트를 상기 회전컵내로부터 드레인컵쪽으로 배출하고, 레지스트 도포 종료후에 상기 회전컵내의 분위기를 외기와 치환하는 것을 특징으로 하는 직사각형 기판의 레지스트 처리방법.
- 기판을 유지 및 회전하기 위한 스핀척과; 스핀척상의 기판에 레지스트액을 공급하기 위한 공급수단과; 스핀척상의 기판을 수납하도록 회전가능하게 배치되며, 기판으로부터 레지스트액을 원심력에 의하여 제거되도록 방출하고 상부보다 하부에서의 외경이 더 크게 형성되는 방출구를 가지며, 이 방출구는 회전컵의 하부에 형성되는 회전컵과; 방출구를 통하여 회전컵으로부터 배출된 레지스트액을 수납하기 위하여 회전컵의 방출둘레를 둘러싸는 드레인컵과, 드레인컵을 방출하기 위하여 상기 드레인컵에 접속된 배기수단과, 회전컵내로 외기를 도입하기 위하여 회전컵의 상부에 마련되는 수단을 포함하여 구성되며, 기판의 중앙으로부터 바깥둘레로 향하여 레지스트 도포된 기판의 위쪽에서 흐르고 회전컵으로부터 드레인컵으로 회전컵내에서 흐르는 레지스트를 배출하는 기류를 형성하기 위하여 외기를 회전컵의 내부로 도입하면서 회전컵이 배기되는 것을 특징으로 하는 직사각형 기판의 레지스트 처리장치.
- 제13항에 있어서, 회전컵의 상부에, 이 회전컵의 회전에 따라서 회전컵내에 외기를 도입하는 나사홈 형상 또는 나선형상의 바깥공기 도입통로를 설치하고 있는 것을 특징으로 하는 처리장치.
- 제8항에 있어서, 상기 노즐수단은 제거액으로서 신나를 기판의 둘레부에 뿜어대는 것을 특징으로 하는 처리장치.
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8913894 | 1994-04-04 | ||
| JP94-89138 | 1994-04-04 | ||
| JP6143841A JP3033008B2 (ja) | 1994-06-02 | 1994-06-02 | 処理方法及び処理装置 |
| JP94-143841 | 1994-06-02 | ||
| JP94-174797 | 1994-07-04 | ||
| JP06174797A JP3114084B2 (ja) | 1994-04-04 | 1994-07-04 | 処理方法及び処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR950034475A KR950034475A (ko) | 1995-12-28 |
| KR100284559B1 true KR100284559B1 (ko) | 2001-04-02 |
Family
ID=27306041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950007866A Expired - Fee Related KR100284559B1 (ko) | 1994-04-04 | 1995-04-04 | 처리방법 및 처리장치 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US5718763A (ko) |
| KR (1) | KR100284559B1 (ko) |
| TW (1) | TW399104B (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100341009B1 (ko) * | 1996-04-09 | 2002-11-29 | 동경 엘렉트론 주식회사 | 기판의레지스트처리장치및레지스트처리방법 |
| KR100740239B1 (ko) * | 1999-10-19 | 2007-07-18 | 동경 엘렉트론 주식회사 | 도포처리장치 및 도포처리방법 |
| KR101042666B1 (ko) | 2006-06-16 | 2011-06-20 | 도쿄엘렉트론가부시키가이샤 | 액 처리 장치 및 액 처리 방법 |
| KR101062253B1 (ko) * | 2006-06-16 | 2011-09-06 | 도쿄엘렉트론가부시키가이샤 | 액 처리 장치 |
Families Citing this family (81)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3069945B2 (ja) * | 1995-07-28 | 2000-07-24 | 東京エレクトロン株式会社 | 処理装置 |
| US6350319B1 (en) | 1998-03-13 | 2002-02-26 | Semitool, Inc. | Micro-environment reactor for processing a workpiece |
| US6413436B1 (en) | 1999-01-27 | 2002-07-02 | Semitool, Inc. | Selective treatment of the surface of a microelectronic workpiece |
| US6264752B1 (en) * | 1998-03-13 | 2001-07-24 | Gary L. Curtis | Reactor for processing a microelectronic workpiece |
| US5993552A (en) * | 1996-08-08 | 1999-11-30 | Tokyo Electron Ltd | Processing apparatus |
| JP3202929B2 (ja) * | 1996-09-13 | 2001-08-27 | 東京エレクトロン株式会社 | 処理システム |
| TW357389B (en) * | 1996-12-27 | 1999-05-01 | Tokyo Electric Ltd | Apparatus and method for supplying process solution to surface of substrate to be processed |
| JP3300624B2 (ja) * | 1997-01-24 | 2002-07-08 | 東京エレクトロン株式会社 | 基板端面の洗浄方法 |
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- 1995-04-04 KR KR1019950007866A patent/KR100284559B1/ko not_active Expired - Fee Related
- 1995-04-15 TW TW084103709A patent/TW399104B/zh not_active IP Right Cessation
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1997
- 1997-11-05 US US08/964,608 patent/US5853803A/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100341009B1 (ko) * | 1996-04-09 | 2002-11-29 | 동경 엘렉트론 주식회사 | 기판의레지스트처리장치및레지스트처리방법 |
| KR100740239B1 (ko) * | 1999-10-19 | 2007-07-18 | 동경 엘렉트론 주식회사 | 도포처리장치 및 도포처리방법 |
| KR101042666B1 (ko) | 2006-06-16 | 2011-06-20 | 도쿄엘렉트론가부시키가이샤 | 액 처리 장치 및 액 처리 방법 |
| KR101062253B1 (ko) * | 2006-06-16 | 2011-09-06 | 도쿄엘렉트론가부시키가이샤 | 액 처리 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| US5718763A (en) | 1998-02-17 |
| US5853803A (en) | 1998-12-29 |
| TW399104B (en) | 2000-07-21 |
| KR950034475A (ko) | 1995-12-28 |
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