KR100715054B1 - 진공 처리 장치 - Google Patents
진공 처리 장치 Download PDFInfo
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- KR100715054B1 KR100715054B1 KR1020057015823A KR20057015823A KR100715054B1 KR 100715054 B1 KR100715054 B1 KR 100715054B1 KR 1020057015823 A KR1020057015823 A KR 1020057015823A KR 20057015823 A KR20057015823 A KR 20057015823A KR 100715054 B1 KR100715054 B1 KR 100715054B1
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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Abstract
Description
Claims (10)
- 바닥부를 갖는 동시에 진공 가능한 처리용기와,상기 처리용기 내에 설치되어, 기판이 탑재될 수 있는 탑재대와,상기 처리용기 내에 처리가스를 공급할 수 있는 처리가스공급부와,상기 탑재대와 상기 처리용기의 바닥부 사이의 공간을 둘러싸서, 당해 공간을 상기 처리용기 내의 처리공간으로부터 구획하는 구획부와,상기 구획부에 의해 둘러싸인 공간 내에 퍼지가스를 공급하는 퍼지가스공급부와,상기 구획부에 의해 둘러싸인 공간 내로부터 퍼지가스를 배기하는 퍼지가스배기부와,상기 구획부에 의해 둘러싸인 공간 내의 압력을 조정하도록, 퍼지가스공급부 및 퍼지가스배기부의 적어도 한쪽을 제어하는 제어부를 구비하고,상기 구획부는, 상기 처리용기의 바닥부와 면 접촉하는 하단부를 갖고 있으며,상기 제어부는, 상기 구획부에 의해 둘러싸인 공간 내의 압력을, 상기 처리용기 내의 처리공간 내의 압력보다 높게 조정하도록 되어 있으며,상기 처리용기는 측벽부를 갖고 있고,상기 구획부와 상기 측벽부 사이에 걸쳐, 상기 처리용기 내의 처리공간을 처리측 공간과 배기측 공간으로 분리하도록 버퍼판이 마련되며,상기 구획부에 의해 둘러싸인 공간내로부터 퍼지가스가 누설되는 극간부가, 상기 버퍼판에 의해 분리된 배기측 공간에 배치되고,상기 측벽부에는, 상기 배기측 공간 내로부터 처리가스를 배기할 수 있는 처리가스배기구가 설치되어 있는 것을 특징으로 하는진공 처리 장치.
- 제 1 항에 있어서,상기 탑재대 상에 탑재되는 기판을 가열할 수 있는 가열부를 더 구비하고,상기 가열부는 상기 탑재대에 마련된 저항 발열체를 갖고 있고,상기 가열부에 전력을 공급하기 위한 급전로부재가 상기 처리용기의 바닥부를 관통하여 상기 구획부에 의해 둘러싸인 공간 내에 삽입되어 있는 것을 특징으로 하는진공 처리 장치.
- 제 1 항에 있어서,상기 제어부는, 상기 구획부에 의해 둘러싸인 공간 내의 압력을 승압시키는 것이 가능한 것을 특징으로 하는진공 처리 장치.
- 바닥부를 갖는 동시에 진공 가능한 처리용기와,상기 처리용기 내에 설치되어, 기판이 탑재될 수 있는 탑재대와,상기 처리용기 내에 처리가스를 공급할 수 있는 처리가스공급부와,상기 탑재대와 상기 처리용기의 바닥부 사이의 공간을 둘러싸서, 당해 공간을 상기 처리용기 내의 처리공간으로부터 구획하는 구획부와,상기 구획부에 의해 둘러싸인 공간 내에 퍼지가스를 공급하는 퍼지가스공급부와,상기 구획부에 의해 둘러싸인 공간 내로부터 퍼지가스를 배기하는 퍼지가스배기부와,상기 구획부에 의해 둘러싸인 공간 내의 압력을 조정하도록, 퍼지가스공급부 및 퍼지가스배기부의 적어도 한쪽을 제어하는 제어부와,상기 퍼지가스를 냉각하는 퍼지가스냉각부를 구비하고,상기 구획부는 상기 처리용기의 바닥부와 면 접촉하는 하단부를 갖고 있으며,상기 제어부는, 상기 구획부에 의해 둘러싸인 공간 내의 압력을 상기 처리용기 내의 처리공간 내의 압력보다 높게 조정하도록 되어 있는것을 특징으로 하는진공 처리 장치.
- 제 4 항에 있어서,상기 제어부는, 상기 퍼지가스냉각부의 내부를 흐르고 있는 냉각액의 흐름을 제어하는 것을 특징으로 하는진공 처리 장치.
- 제 1 항에 있어서,상기 버퍼판에는 상기 처리측 공간과 상기 배기측 공간을 연통시키는 구멍부가 형성되어 있는 것을 특징으로 하는진공 처리 장치.
- 제 6 항에 있어서,상기 버퍼판에는, 온도조절부가 설치되어 있는 것을 특징으로 하는진공 처리 장치.
- 바닥부를 갖는 동시에 진공 가능한 처리용기와,상기 처리용기 내에 설치되어 기판이 탑재될 수 있는 탑재대와,상기 처리용기 내에 처리가스를 공급할 수 있는 처리가스공급부와,상기 탑재대와 상기 처리용기의 바닥부 사이의 공간을 둘러싸서, 당해 공간을 상기 처리용기 내의 처리공간으로부터 구획하는 구획부와,상기 구획부에 의해 둘러싸인 공간 내에 퍼지가스를 공급하는 퍼지가스공급부와,상기 구획부에 의해 둘러싸인 공간 내로부터 퍼지가스를 배기하는 퍼지가스배기부와,상기 구획부에 의해 둘러싸인 공간 내의 압력을 조정하도록 퍼지가스공급부 및 퍼지가스배기부의 적어도 한쪽을 제어하는 제어부를 구비하고,상기 구획부는, 상기 처리용기의 바닥부와 면 접촉하는 하단부를 갖고 있는 것을 특징으로 하는 진공 처리 장치를 이용하여 진공 처리를 실시하는 방법에 있어서,상기 구획부에 의해 둘러싸인 공간 내의 압력을 상기 처리용기 내의 처리공간 내의 압력보다 높게 조정한 상태로, 상기 기판에 소정의 진공 처리를 실시하는 처리 공정과,상기 진공 처리의 실시 후에, 상기 구획부에 의해 둘러싸인 공간 내의 압력을 더 높게 승압한 상태로 상기 탑재대의 온도를 강온시키는 강온 공정을 구비한 것을 특징으로 하는방법.
- 제 8 항에 있어서,상기 강온 공정 후에, 상기 처리용기 내를 클리닝하는 클리닝 공정을 더 포함한 것을 특징으로 하는진공 처리 방법.
- 바닥부를 갖는 동시에 진공 가능한 처리용기와,상기 처리용기 내에 설치되어, 기판이 탑재될 수 있는 탑재대와,상기 탑재대상에 탑재되는 기판을 가열할 수 있는 가열부와,상기 처리용기 내에 처리가스를 공급할 수 있는 처리가스공급부와,상기 탑재대와 상기 처리용기의 바닥부 사이의 공간을 둘러싸서, 당해 공간을 상기 처리용기 내의 처리공간으로부터 구획하는 구획부와,상기 구획부에 의해 둘러싸인 공간 내에 퍼지가스를 공급하는 퍼지가스공급부와,상기 퍼지가스를 냉각하는 퍼지가스냉각부와,상기 구획부에 의해 둘러싸인 공간 내로부터 퍼지가스를 배기하는 퍼지가스배기부와,상기 구획부에 의해 둘러싸인 공간 내의 압력을 조정하도록, 퍼지가스공급부 및 퍼지가스배기부의 적어도 한쪽을 제어하는 제어부와,상기 처리용기의 바닥부를 관통하여, 상기 구획부에 의해 둘러싸인 공간 내에 삽입되는 동시에, 상기 탑재대에 접촉하는 선단부를 갖는 온도검출부를 구비하며,상기 구획부는, 상기 처리용기의 바닥부와 면 접촉하는 하단부를 갖고 있는 것을 특징으로 하는 진공 처리 장치를 이용하여 진공 처리를 실시하는 방법에 있어서,상기 구획부에 의해 둘러싸인 공간 내의 압력을 상기 처리용기 내의 처리공간 내의 압력보다 높게 조정한 상태로, 상기 기판에 소정의 진공 처리를 실시하는 처리 공정과,상기 진공 처리의 실시 후에, 상기 퍼지가스냉각부에 의해서 상기 퍼지가스를 냉각시키면서, 상기 탑재대의 온도를 강온시키는 강온 공정을 구비한 것을 특징으로 하는방법.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2003-00049632 | 2003-02-26 | ||
| JP2003049632A JP4251887B2 (ja) | 2003-02-26 | 2003-02-26 | 真空処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20050105249A KR20050105249A (ko) | 2005-11-03 |
| KR100715054B1 true KR100715054B1 (ko) | 2007-05-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020057015823A Expired - Fee Related KR100715054B1 (ko) | 2003-02-26 | 2004-02-12 | 진공 처리 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20060160359A1 (ko) |
| JP (1) | JP4251887B2 (ko) |
| KR (1) | KR100715054B1 (ko) |
| CN (1) | CN1742113B (ko) |
| WO (1) | WO2004076715A1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101452318B1 (ko) * | 2012-06-29 | 2014-10-22 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0106410D0 (en) | 2001-03-15 | 2001-05-02 | Ucb Sa | Labels |
| JP4597894B2 (ja) * | 2006-03-31 | 2010-12-15 | 東京エレクトロン株式会社 | 基板載置台および基板処理装置 |
| JP5105396B2 (ja) * | 2006-04-12 | 2012-12-26 | 東京応化工業株式会社 | 加熱処理装置 |
| JP4913695B2 (ja) * | 2007-09-20 | 2012-04-11 | 東京エレクトロン株式会社 | 基板処理装置及びそれに用いる基板載置台 |
| JP5171969B2 (ja) * | 2011-01-13 | 2013-03-27 | 東京エレクトロン株式会社 | 基板処理装置 |
| JP5832173B2 (ja) * | 2011-07-11 | 2015-12-16 | 株式会社ニューフレアテクノロジー | 気相成長装置および気相成長方法 |
| KR101804128B1 (ko) * | 2011-12-26 | 2017-12-05 | 주식회사 원익아이피에스 | 기판처리장치 |
| KR20130086806A (ko) * | 2012-01-26 | 2013-08-05 | 삼성전자주식회사 | 박막 증착 장치 |
| US10385448B2 (en) | 2012-09-26 | 2019-08-20 | Applied Materials, Inc. | Apparatus and method for purging gaseous compounds |
| JP6107327B2 (ja) * | 2013-03-29 | 2017-04-05 | 東京エレクトロン株式会社 | 成膜装置及びガス供給装置並びに成膜方法 |
| DE102013020106A1 (de) * | 2013-12-06 | 2015-06-11 | Oliver Feddersen-Clausen | Reaktionskammer insbesondere für Atomic Laver Deposition |
| CN106367731A (zh) * | 2015-07-20 | 2017-02-01 | 广东昭信半导体装备制造有限公司 | 一种氧化物化学气相沉积装置和方法 |
| US10607817B2 (en) | 2016-11-18 | 2020-03-31 | Applied Materials, Inc. | Thermal repeatability and in-situ showerhead temperature monitoring |
| JP6863041B2 (ja) * | 2017-04-21 | 2021-04-21 | 東京エレクトロン株式会社 | 基板加熱装置 |
| US10923375B2 (en) * | 2018-11-28 | 2021-02-16 | Brooks Automation, Inc. | Load port module |
| CN111968901B (zh) * | 2020-08-25 | 2022-08-16 | 北京北方华创微电子装备有限公司 | 半导体反应腔室及半导体加工设备 |
| JP7102478B2 (ja) | 2020-09-24 | 2022-07-19 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法、プログラム及び基板処理方法 |
| US12365985B2 (en) * | 2020-12-03 | 2025-07-22 | Tokyo Electron Limited | Deposition apparatus with pressure sensor and shower head on same plane and deposition method |
| KR102621848B1 (ko) * | 2020-12-18 | 2024-01-09 | 세메스 주식회사 | 지지 유닛 및 기판 처리 장치 |
| JP7317083B2 (ja) | 2021-09-01 | 2023-07-28 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、プログラム及び基板処理方法 |
| JP7641258B2 (ja) * | 2022-09-14 | 2025-03-06 | 株式会社Kokusai Electric | 基板処理装置、クリーニング方法、半導体装置の製造方法及びプログラム |
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| JPH07153706A (ja) * | 1993-05-27 | 1995-06-16 | Applied Materials Inc | サセプタ装置 |
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| US5592581A (en) * | 1993-07-19 | 1997-01-07 | Tokyo Electron Kabushiki Kaisha | Heat treatment apparatus |
| CN1137296A (zh) * | 1993-12-17 | 1996-12-04 | 布鲁克斯自动化公司 | 加热或冷却晶片的设备 |
| US5849076A (en) * | 1996-07-26 | 1998-12-15 | Memc Electronic Materials, Inc. | Cooling system and method for epitaxial barrel reactor |
| JP4236329B2 (ja) * | 1999-04-15 | 2009-03-11 | 日本碍子株式会社 | プラズマ処理装置 |
| JP2001053030A (ja) * | 1999-08-11 | 2001-02-23 | Tokyo Electron Ltd | 成膜装置 |
| JP4592856B2 (ja) * | 1999-12-24 | 2010-12-08 | 東京エレクトロン株式会社 | バッフル板及びガス処理装置 |
| KR100881786B1 (ko) * | 2000-12-27 | 2009-02-03 | 도쿄엘렉트론가부시키가이샤 | 처리 장치 |
| JP4009100B2 (ja) * | 2000-12-28 | 2007-11-14 | 東京エレクトロン株式会社 | 基板加熱装置および基板加熱方法 |
| WO2003049173A1 (en) * | 2001-12-07 | 2003-06-12 | Tokyo Electron Limited | Nitriding method for insulation film, semiconductor device and production method for semiconductor device, substrate treating device and substrate treating method |
| JP2003253449A (ja) * | 2002-02-27 | 2003-09-10 | Sumitomo Electric Ind Ltd | 半導体/液晶製造装置 |
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- 2003-02-26 JP JP2003049632A patent/JP4251887B2/ja not_active Expired - Fee Related
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2004
- 2004-02-12 US US10/546,803 patent/US20060160359A1/en not_active Abandoned
- 2004-02-12 KR KR1020057015823A patent/KR100715054B1/ko not_active Expired - Fee Related
- 2004-02-12 WO PCT/JP2004/001479 patent/WO2004076715A1/ja active Search and Examination
- 2004-02-12 CN CN2004800027367A patent/CN1742113B/zh not_active Expired - Fee Related
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| JPH07153706A (ja) * | 1993-05-27 | 1995-06-16 | Applied Materials Inc | サセプタ装置 |
| JPH0778766A (ja) * | 1993-06-24 | 1995-03-20 | Tokyo Electron Ltd | ガス処理装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101452318B1 (ko) * | 2012-06-29 | 2014-10-22 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20060160359A1 (en) | 2006-07-20 |
| KR20050105249A (ko) | 2005-11-03 |
| WO2004076715A1 (ja) | 2004-09-10 |
| CN1742113B (zh) | 2010-05-05 |
| JP4251887B2 (ja) | 2009-04-08 |
| JP2004263209A (ja) | 2004-09-24 |
| CN1742113A (zh) | 2006-03-01 |
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