KR100943707B1 - 나노 구조물을 포함하는 3차원 나노 소자 - Google Patents
나노 구조물을 포함하는 3차원 나노 소자 Download PDFInfo
- Publication number
- KR100943707B1 KR100943707B1 KR1020070100350A KR20070100350A KR100943707B1 KR 100943707 B1 KR100943707 B1 KR 100943707B1 KR 1020070100350 A KR1020070100350 A KR 1020070100350A KR 20070100350 A KR20070100350 A KR 20070100350A KR 100943707 B1 KR100943707 B1 KR 100943707B1
- Authority
- KR
- South Korea
- Prior art keywords
- nanostructure
- substrate
- vibrating
- dimensional
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B1/00—Nanostructures formed by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0009—Structural features, others than packages, for protecting a device against environmental influences
- B81B7/0025—Protection against chemical alteration
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
- H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/402—Single electron transistors; Coulomb blockade transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/43—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having 1D charge carrier gas channels, e.g. quantum wire FETs or transistors having 1D quantum-confined channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/121—Nanowire, nanosheet or nanotube semiconductor bodies oriented parallel to substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0214—Biosensors; Chemical sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0271—Resonators; ultrasonic resonators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
- G01N2291/0257—Adsorption, desorption, surface mass change, e.g. on biosensors with a layer containing at least one organic compound
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02244—Details of microelectro-mechanical resonators
- H03H2009/02283—Vibrating means
- H03H2009/02291—Beams
- H03H2009/02314—Beams forming part of a transistor structure
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Toxicology (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
- Thin Film Transistor (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
Claims (20)
- 기판 상부에 부양된 진동부와 상기 진동부의 길이 방향의 양단부를 지지하는 지지부를 구비하는 하나이상의 나노 구조물;상기 나노 구조물의 지지부를 지지하기 위해 상기 기판 상에 형성되는 지지대;상기 기판 상부 또는 하부 또는 상하부 양측에 형성되어 상기 나노 구조물을 제어하는 하나이상의 제어부; 및상기 진동부 상에 형성되어 외부에서 유입되는 물질을 감지하는 감지부를 포함하는 3차원 나노 소자.
- 제1항에 있어서,상기 기판 하부에 형성되는 외부 진동부를 더 포함하는 3차원 나노 소자.
- 제1항 또는 제2항에 있어서,상기 제어부는 상기 나노 구조물의 진동부 상부 및 하부 중 적어도 하나에 상기 나노 구조물과 교차되도록 형성되어 상기 진동부의 진동을 유발하는 압전 물질 또는 금속 물질을 포함하는 3차원 나노 소자.
- 제1항 또는 제2항에 있어서,상기 제어부는 상기 기판 상부의 상기 진동부 하부에 상기 나노 구조물과 교차되도록 형성되어 상기 진동부의 진동을 유발하는 하나이상의 전극을 포함하는 3차원 나노 소자.
- 제1항에 있어서,상기 진동부의 폭은 수 나노미터 내지 1마이크로미터 범위이고, 상기 진동부의 높이는 수 나노미터 내지 1마이크로미터 범위이며, 상기 진동부의 길이는 100나노미터 내지 100마이크로미터 범위인 3차원 나노 소자.
- 제1항에 있어서,상기 진동부 및 상기 기판은 Si, Ge, Sn, Se, Te, B, C, P, B-C, B-P(BP6), B-Si, Si-C, Si-Ge, Si-Sn 및 Ge-Sn, SiC, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, ZnO/ZnS/ZnSe/ZnTe, CdS/CdSe/CdTe, HgS/HgSe/HgTe, BeS/BeSe/BeTe/MgS/MgSe, GeS, GeSe, GeTe, SnS, SnSe, SnTe, PbO, PbS, PbSe, PbTe, CuF, CuCl, CuBr, CuI, AgF, AgCl, AgBr, AgI, BeSiN2, CaCN2ZnGeP2, CdSnAs2, ZnSnSb2, CuGeP3, CuSi2P3, (Cu, Ag)(Al, Ga, In, Ti, Fe)(S, Se, Te)2, SiO2, Si3N4, Ge3N4, Al2O3, (Al, Ga, In)2(S, Se, Te)3, 및 Al2CO 중 하나의 재료를 이용하거나 상기 재료 중 적어도 2개 이상을 조합한 조합물 중 하나의 재료를 이용하는 3차원 나노 소자.
- 제1항에 있어서,상기 진동부의 길이가 같거나 다른 나노 구조물이 복수 개 설치되거나 상기 진동부의 길이 중 일부는 같고 일부는 다른 나노 구조물이 복수 개 설치되는 3차원 나노 소자.
- 제7항에 있어서,상기 진동부는 상기 진동부의 길이에 따른 기본 진동수 및 비선형 진동수를 이용하는 3차원 나노 소자.
- 제8항에 있어서,상기 감지부는 상기 기본 진동수의 최대 진폭 영역에 형성되며, 상기 최대 진폭 영역에는 물질의 흡착을 위한 프로브가 형성되는 3차원 나노 소자.
- 제9항에 있어서,상기 감지부는 금속 또는 실리콘 또는 산화물로 이루어진 3차원 나노 소자.
- 제10항에 있어서,상기 감지부 상에는 유기물 프로브가 더 형성되는 3차원 나노 소자.
- 제11항에 있어서,상기 유기물 프로브는 티올(thiol)그룹, 아민 및 실란 그룹을 포함하는 그룹, 및 이들과 결합하는 DNA 및 항체를 포함하는 바이오 물질을 포함하며, 유입되는 물질과 화학적으로 결합하는 3차원 나노 소자.
- 제1항에 있어서,상기 기판의 둘레를 따라 형성된 측면부와, 상기 측면부의 일영역에 형성된 유체 유입구, 상기 측면부의 다른 일영역에 형성된 유체 유출구 및 상기 측면부의 상부에 형성되는 상면부를 포함하는 3차원 나노 소자.
- 제13항에 있어서,상기 나노 구조물의 진동부 영역으로 레이저 광원을 제공하는 레이저와, 상기 레이저로부터 제공된 상기 레이저 광원을 수광하는 레이저 감지부를 더 포함하는 3차원 나노 소자.
- 기판 상부에 부양된 진동부와 상기 진동부의 길이 방향의 양단부를 지지하는 지지부를 구비하는 하나이상의 나노 구조물;상기 나노 구조물의 지지부를 지지하기 위해 상기 기판 상에 형성되는 지지대;상기 나노 구조물의 진동부 하부에 상기 나노 구조물과 교차되도록 형성되는 하나 이상의 전극; 및상기 진동부 상에 형성되어 외부에서 유입 및 흡착되는 물질을 감지하는 감지부를 포함하는 3차원 나노 소자.
- 제15항에 있어서,상기 나노 구조물은 게이트 전극 역할을 수행하는 3차원 나노 소자.
- 제16항에 있어서,상기 전극은 소스 전극과 드레인 전극을 포함하며, 상기 소스 전극과 상기 드레인 전극 사이에는 갭이 형성되는 3차원 나노 소자.
- 제17항에 있어서,상기 소스 전극과 드레인 전극 사이에 형성된 갭 상부 영역의 상기 나노 구조물에는 양자점이 형성되어 있는 3차원 나노 소자.
- 제17항에 있어서,상기 소스 전극과 드레인 전극 사이에 형성된 갭 상부 영역의 상기 나노 구조물에는 양자점이 형성되어 있으며, 상기 소스 전극과 상기 드레인 전극이 자성물질인 3차원 나노 소자.
- 제17항에 있어서,상기 기판 상부에 다수 개의 게이트가 형성되어 있는 3차원 나노 소자.
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020070100350A KR100943707B1 (ko) | 2007-10-05 | 2007-10-05 | 나노 구조물을 포함하는 3차원 나노 소자 |
| PCT/KR2008/002792 WO2009044983A1 (en) | 2007-10-05 | 2008-05-19 | Three-dimensional nanodevices including nanostructures |
| US12/672,995 US8263964B2 (en) | 2007-10-05 | 2008-05-19 | Three-dimensional nanodevices including nanostructures |
| EP08753588.6A EP2193098B1 (en) | 2007-10-05 | 2008-05-19 | Three-dimensional nanodevices including resonant nanostructures with sensing units |
| JP2010527872A JP2011501702A (ja) | 2007-10-05 | 2008-05-19 | ナノ構造物を含む3次元ナノ素子 |
| CN200880110362A CN101821195A (zh) | 2007-10-05 | 2008-05-19 | 包括纳米结构的三维纳米器件 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020070100350A KR100943707B1 (ko) | 2007-10-05 | 2007-10-05 | 나노 구조물을 포함하는 3차원 나노 소자 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20090035209A KR20090035209A (ko) | 2009-04-09 |
| KR100943707B1 true KR100943707B1 (ko) | 2010-02-23 |
Family
ID=40526379
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020070100350A Expired - Fee Related KR100943707B1 (ko) | 2007-10-05 | 2007-10-05 | 나노 구조물을 포함하는 3차원 나노 소자 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8263964B2 (ko) |
| EP (1) | EP2193098B1 (ko) |
| JP (1) | JP2011501702A (ko) |
| KR (1) | KR100943707B1 (ko) |
| CN (1) | CN101821195A (ko) |
| WO (1) | WO2009044983A1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20210142946A (ko) | 2020-05-19 | 2021-11-26 | 서강대학교산학협력단 | 동적 슬링샷 기반의 저전압 전기기계 스위치 및 이의 구동 방법 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9147755B1 (en) * | 2013-05-22 | 2015-09-29 | The United States of America as represented by the Administrator of the National Aeronautics & Space Administration (NASA) | Nanostructure-based vacuum channel transistor |
| DE102014112597B4 (de) * | 2013-09-03 | 2016-10-06 | Electronics And Telecommunications Research Institute | Vibrationsvorrichtung und Verfahren zur Herstellung einer Vibrationsvorrichtung |
| US10197793B2 (en) * | 2016-05-12 | 2019-02-05 | The Chinese University Of Hong Kong | Light modulator using total internal reflection at an interface with a tunable conductive layer |
| CN109791924A (zh) * | 2016-09-29 | 2019-05-21 | 英特尔公司 | 量子计算组件 |
| US10573482B2 (en) | 2017-01-30 | 2020-02-25 | International Business Machines Corporation | Piezoelectric vacuum transistor |
| CN111116201B (zh) * | 2020-01-07 | 2021-01-15 | 北京科技大学 | 一种GeS基热电材料的制备方法 |
| WO2022260992A2 (en) * | 2021-06-08 | 2022-12-15 | The Regents Of The University Of California | Three-dimensional transistor arrays for intra- and inter-cellular recording |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020035836A (ko) * | 1999-07-16 | 2002-05-15 | 가와사키 마사히로 | 나노미터 오더의 기계 진동자, 그 제조방법, 및 이를이용한 측정장치 |
| US6529277B1 (en) | 2000-07-07 | 2003-03-04 | California Institute Of Technology | Optical devices based on resonant configurational effects |
| KR20050055456A (ko) * | 2003-12-08 | 2005-06-13 | 학교법인 포항공과대학교 | 산화아연계 나노막대를 이용한 바이오센서 및 이의 제조방법 |
| US20070023621A1 (en) | 2005-07-27 | 2007-02-01 | Blick Robert H | Nanoelectromechanical and Microelectromechanical Sensors and Analyzers |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5424241A (en) * | 1992-08-21 | 1995-06-13 | Smiths Industries Aerospace & Defense Systems, Inc. | Method of making a force detecting sensor |
| JP2005504260A (ja) * | 2000-08-09 | 2005-02-10 | カリフォルニア インスティテュート オブ テクノロジー | 生化学的解析のための能動nemsアレイ |
| JP3892292B2 (ja) * | 2001-12-20 | 2007-03-14 | 富士通株式会社 | 生体高分子検出デバイス及び生体高分子検出方法、それに用いるカーボンナノチューブ構造体、並びに、疾病診断装置 |
| WO2004041998A2 (en) * | 2002-05-07 | 2004-05-21 | California Institute Of Technology | Nanomechanichal energy, force, and mass sensors |
| US6928877B2 (en) * | 2002-05-24 | 2005-08-16 | Symyx Technologies, Inc. | High throughput microbalance and methods of using same |
| JP2004058267A (ja) * | 2002-06-03 | 2004-02-26 | Japan Science & Technology Corp | シリコン微小細線からなる3次元構造体、その製造方法及びそれを利用した装置 |
| JP4186727B2 (ja) * | 2002-07-26 | 2008-11-26 | 松下電器産業株式会社 | スイッチ |
| WO2005108966A1 (ja) * | 2004-03-23 | 2005-11-17 | Japan Science And Technology Agency | バイオセンサ |
| JP4611127B2 (ja) * | 2004-06-14 | 2011-01-12 | パナソニック株式会社 | 電気機械信号選択素子 |
| US20080063566A1 (en) * | 2004-09-03 | 2008-03-13 | Mitsubishi Chemical Corporation | Sensor Unit and Reaction Field Cell Unit and Analyzer |
| US7683746B2 (en) * | 2005-01-21 | 2010-03-23 | Panasonic Corporation | Electro-mechanical switch |
| JP2007010518A (ja) * | 2005-06-30 | 2007-01-18 | Canon Inc | カンチレバーセンサを利用するターゲット物質の検出方法及び検出装置 |
| KR100714924B1 (ko) * | 2005-09-29 | 2007-05-07 | 한국전자통신연구원 | 나노갭 전극소자의 제작 방법 |
| WO2007110928A1 (ja) * | 2006-03-28 | 2007-10-04 | Fujitsu Limited | 可動素子 |
| WO2008049122A2 (en) * | 2006-10-19 | 2008-04-24 | The Regents Of The University Of California | High frequency nanotube oscillator |
-
2007
- 2007-10-05 KR KR1020070100350A patent/KR100943707B1/ko not_active Expired - Fee Related
-
2008
- 2008-05-19 JP JP2010527872A patent/JP2011501702A/ja active Pending
- 2008-05-19 WO PCT/KR2008/002792 patent/WO2009044983A1/en active Application Filing
- 2008-05-19 EP EP08753588.6A patent/EP2193098B1/en not_active Not-in-force
- 2008-05-19 US US12/672,995 patent/US8263964B2/en not_active Expired - Fee Related
- 2008-05-19 CN CN200880110362A patent/CN101821195A/zh active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020035836A (ko) * | 1999-07-16 | 2002-05-15 | 가와사키 마사히로 | 나노미터 오더의 기계 진동자, 그 제조방법, 및 이를이용한 측정장치 |
| US6529277B1 (en) | 2000-07-07 | 2003-03-04 | California Institute Of Technology | Optical devices based on resonant configurational effects |
| KR20050055456A (ko) * | 2003-12-08 | 2005-06-13 | 학교법인 포항공과대학교 | 산화아연계 나노막대를 이용한 바이오센서 및 이의 제조방법 |
| US20070023621A1 (en) | 2005-07-27 | 2007-02-01 | Blick Robert H | Nanoelectromechanical and Microelectromechanical Sensors and Analyzers |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20210142946A (ko) | 2020-05-19 | 2021-11-26 | 서강대학교산학협력단 | 동적 슬링샷 기반의 저전압 전기기계 스위치 및 이의 구동 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2193098A1 (en) | 2010-06-09 |
| WO2009044983A1 (en) | 2009-04-09 |
| US20110193052A1 (en) | 2011-08-11 |
| US8263964B2 (en) | 2012-09-11 |
| JP2011501702A (ja) | 2011-01-13 |
| KR20090035209A (ko) | 2009-04-09 |
| EP2193098A4 (en) | 2014-05-07 |
| CN101821195A (zh) | 2010-09-01 |
| EP2193098B1 (en) | 2015-11-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100943707B1 (ko) | 나노 구조물을 포함하는 3차원 나노 소자 | |
| US9234872B2 (en) | Chemical sensing and/or measuring devices and methods | |
| US9793417B2 (en) | Nanowire nanoelectromechanical field-effect transistors | |
| US8421052B2 (en) | Transverse force, pressure and vibration sensors using piezoelectric nanostructures | |
| US20100173422A1 (en) | Method of sensing chemical and bio-molecular analytes and sensing system using a microcantilever | |
| US20110183438A1 (en) | Method for Sensing a Substance to be Detected in a Sample | |
| US20100176822A1 (en) | Nanowire sensor | |
| CN105474006B (zh) | 场效应晶体管和包括多个场效应晶体管的气体检测器 | |
| JP5393555B2 (ja) | 流動媒体内の特定粒子を原位置で検出するための微小デバイスと動作方法 | |
| Constantinou et al. | Simultaneous tunable selection and self-assembly of Si nanowires from heterogeneous feedstock | |
| WO2008127314A1 (en) | High-sensitivity nanoscale wire sensors | |
| US9823218B2 (en) | Integrated circuit with nanowire ChemFET-sensors, sensing apparatus, measuring method and manufacturing method | |
| US8236569B2 (en) | Multi-dimensional integrated detection and analysis system (MIDAS) based on microcantilvers | |
| US20240120389A1 (en) | Method for fabricating wafer scale/nano submicron gap electrodes and arrays via photolithography | |
| Lynall et al. | Nonlinear chemical sensitivity enhancement of nanowires in the ultralow concentration regime | |
| Demami et al. | Silicon nanowires synthesis for chemical sensor applications | |
| Balestra | Beyond-CMOS Nanodevices 1 | |
| KR101624638B1 (ko) | 측면 게이트를 구비하는 나노와이어 공진기 | |
| Wang et al. | Piezotronic Effect on Gas, Chemical, and Biological Nanosensors | |
| Krupenin et al. | Journal Radioengineering № 3 for 2009 г. Article in number: Field-Effect Transistor on the Basis of Silicon Nanowire | |
| Actuation | Multifunctional Nanomechanical Systems via | |
| Yaish | Ultra-Sensitive Mass Sensors Based on Suspended Carbon Nanotubes | |
| Liu | Study of electron transport in semiconductor nanodevices by Scanning Gate Microscopy |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| L13-X000 | Limitation or reissue of ip right requested |
St.27 status event code: A-2-3-L10-L13-lim-X000 |
|
| U15-X000 | Partial renewal or maintenance fee paid modifying the ip right scope |
St.27 status event code: A-4-4-U10-U15-oth-X000 |
|
| FPAY | Annual fee payment |
Payment date: 20130205 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| FPAY | Annual fee payment |
Payment date: 20140123 Year of fee payment: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| FPAY | Annual fee payment |
Payment date: 20150126 Year of fee payment: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| FPAY | Annual fee payment |
Payment date: 20160127 Year of fee payment: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| FPAY | Annual fee payment |
Payment date: 20170124 Year of fee payment: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| FPAY | Annual fee payment |
Payment date: 20180129 Year of fee payment: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20190125 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20200217 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20200217 |