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KR101228093B1 - Etching glass - Google Patents

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KR101228093B1
KR101228093B1 KR1020100117003A KR20100117003A KR101228093B1 KR 101228093 B1 KR101228093 B1 KR 101228093B1 KR 1020100117003 A KR1020100117003 A KR 1020100117003A KR 20100117003 A KR20100117003 A KR 20100117003A KR 101228093 B1 KR101228093 B1 KR 101228093B1
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oxide
etching
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glass
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KR20120097446A (en
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오정근
안명진
남금희
이성찬
최호삼
박지은
김선기
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삼성코닝정밀소재 주식회사
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/083Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/083Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
    • C03C3/085Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal
    • C03C3/087Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal containing calcium oxide, e.g. common sheet or container glass

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Glass Compositions (AREA)

Abstract

본 발명은 에칭 속도와 투과율을 높이면서 기판 표면에 다공성층(Porous Layer)을 균질하게 형성되는 에칭 유리에 관한 것으로, 본 발명에 따른 에칭 유리는 글라스기판 표면에 에칭을 통해 다공성층(Porous Layer)이 형성되며, 여기서 글라스기판은 산화규소(SiO2)와 산화알루미늄(Al2O3)를 주성분으로 포함하되, 규소(Si) 대비 알루미늄(Al)의 중량비가 0.3 이상, 0.8 이하이고, 에칭 반응시간이 10분 이하인 것을 특징으로 한다.The present invention relates to an etching glass in which a porous layer is homogeneously formed on the surface of a substrate while increasing the etching rate and transmittance. The etching glass according to the present invention is a porous layer through etching on a surface of a glass substrate. Wherein, the glass substrate includes silicon oxide (SiO 2 ) and aluminum oxide (Al 2 O 3 ) as a main component, the weight ratio of aluminum (Al) to silicon (Si) is 0.3 or more, 0.8 or less, etching reaction The time is characterized in that less than 10 minutes.

Description

에칭 유리{Etching glass}Etching glass

본 발명은 에칭 유리에 관한 것으로, 좀 더 상세하게는 에칭 속도와 투과율을 높이면서 기판 표면에 다공성층(Porous Layer)을 균질하게 형성된 에칭 유리에 관한 것이다.
The present invention relates to etched glass, and more particularly, to an etched glass in which a porous layer is homogeneously formed on the surface of a substrate while increasing the etching rate and transmittance.

최근 에너지 자원 부족과 환경오염의 대책으로 고효율 광전지 모듈의 개발이 대규모로 이루어지고 있다. 광전지 모듈은 광에너지, 예컨대 태양에너지를 직접 전기로 변환시키는 광 발전의 핵심소자이다. Recently, development of high efficiency photovoltaic modules has been carried out on a large scale in order to prevent energy resources and environmental pollution. Photovoltaic modules are key elements in photovoltaic power generation that directly convert light energy, such as solar energy, into electricity.

결정계 광전지 모듈(Photovoltaic Module)의 보호를 위한 목적으로 사용되는 커버기판과 박막형 광전지 모듈의 슈퍼스트레이트(Superstrate) 기판, 예컨대 글라스기판의 투과율이 광전지 모듈의 전체 효율에 영향을 준다. 종래에는, 글라스기판 표면에 에칭을 통해 다공성층(Porous Layer)을 형성하여 반사율을 최소화하여 투과율을 향상시키는 등 투과율 향상을 위하여 많은 개발이 진행되고 있었다. The transmittance of the cover substrate used for the protection of the crystalline photovoltaic module and the superstrate substrate of the thin film photovoltaic module, such as the glass substrate, affects the overall efficiency of the photovoltaic module. Conventionally, many developments have been made to improve transmittance such as forming a porous layer through etching on a glass substrate surface to minimize reflectance to improve transmittance.

이러한 에칭 유리는 디스플레이용 커버유리로 사용되어 휘도를 증가시킨다. 일반적으로 투과율과 휘도는 비례 관계를 갖는다. 즉 에칭 유리를 통과한 각 파장의 투과율은 통과한 각 파장의 휘도를 각 파장의 베어(bare) 휘도로 나눈 값과 같다. 또한 재생률이 120Hz에서 480Hz까지 가능해야 하고 3D TV가 등장하는 시점에서 고투과율 에칭 유리의 개발은 고휘도 디스플레이의 성능 향상에 큰 도움이 될 것이다.Such etched glass is used as cover glass for display to increase the brightness. In general, the transmittance and luminance have a proportional relationship. That is, the transmittance of each wavelength passing through the etching glass is equal to the value obtained by dividing the luminance of each wavelength passed by the bare luminance of each wavelength. In addition, refresh rates must be available from 120Hz to 480Hz, and the development of high-transmittance etched glass at the time of the introduction of 3D TVs will greatly improve the performance of high brightness displays.

그런데, 글라스기판 표면에 에칭을 통해 다공성층(Porous Layer)을 형성하는 경우 반응시간이 오래 걸리는 문제점이 있었다. 이러한 문제점을 해결하기 위해 반응온도를 약 60℃ 이상으로 올리는 경우, 반응시간이 줄어들기는 하지만 기판의 표면에 다공성층(Porous Layer)이 균일하지 못하고 얼룩이 발생하고, 이는 투과율을 떨어뜨리는 문제점이 있었다.
However, when forming a porous layer (etched) on the surface of the glass substrate has a problem that takes a long time. In order to solve this problem, if the reaction temperature is raised to about 60 ° C. or more, the reaction time is reduced, but the porous layer is not uniform on the surface of the substrate, and staining occurs, which causes a problem of lowering the transmittance.

본 발명은 상기와 같은 배경에서 제안된 것으로, 본 발명의 목적은 에칭 속도와 투과율이 높고 기판 표면에 다공성층(Porous Layer)이 균질하게 형성된 에칭 유리를 제공하는 것이다.
The present invention has been proposed in the above background, and an object of the present invention is to provide an etching glass having a high etching rate and a high transmittance and a homogeneous porous layer formed on the substrate surface.

상기와 같은 목적을 달성하기 위하여, 본 발명의 일 양상에 따른 에칭 유리는 글라스기판 표면에 에칭을 통해 다공성층(Porous Layer)이 형성되며, 여기서 글라스기판은 산화규소(SiO2)와 산화알루미늄(Al2O3)를 주성분으로 포함하되, 규소(Si) 대비 알루미늄(Al)의 중량비가 0.3 이상, 0.8 이하이고, 에칭 반응시간이 10분 이하인 것을 특징으로 한다.In order to achieve the above object, the etching glass according to an aspect of the present invention is a porous layer (Porous Layer) is formed on the surface of the glass substrate, wherein the glass substrate is silicon oxide (SiO 2 ) and aluminum oxide ( Al 2 O 3 ) as a main component, the weight ratio of aluminum (Al) to silicon (Si) is 0.3 or more, 0.8 or less, characterized in that the etching reaction time is 10 minutes or less.

본 발명의 부가적인 양상에 따른 에칭 유리는, 글라스기판이 적어도 산화마그네슘(MgO), 산화칼슘(CaO), 산화나트륨(Na2O), 산화칼륨(K2O), 또는 산화안티몬(Sb2O3) 중 어느 하나를 보조성분으로 포함하되, 산화규소(SiO2)의 함량이 53.0 wt.% 이상, 63.0 wt.% 이하이고, 산화알루미늄(Al2O3)의 함량이 10.0 wt.% 이상, 20.0 wt.% 이하이고, 산화마그네슘(MgO)의 함량이 0.0 wt.% 이상, 6.50 wt.% 이하이고, 산화칼슘(CaO)의 함량이 6.8 wt.% 이상, 9.81 wt.% 이하이고, 산화나트륨(Na2O)의 함량이 13.4 wt.% 이상, 18.23 wt.% 이하이고, 산화칼륨(K2O)의 함량이 0.0 wt.% 이상, 0.38 wt.% 이하이고, 산화안티몬(Sb2O3)의 함량이 0.0 wt.% 이상, 0.16 wt.% 이하인 것을 특징으로 한다.Etched glass according to an additional aspect of the invention, the glass substrate is at least magnesium oxide (MgO), calcium oxide (CaO), sodium oxide (Na 2 O), potassium oxide (K 2 O), or antimony oxide (Sb 2 O 3 ) as an auxiliary component, the content of silicon oxide (SiO 2 ) is more than 53.0 wt.%, 63.0 wt.% Or less, the content of aluminum oxide (Al 2 O 3 ) is 10.0 wt.% 20.0 wt.% Or less, magnesium oxide (MgO) content of 0.0 wt.% Or more, 6.50 wt.% Or less, calcium oxide (CaO) content of 6.8 wt.% Or more and 9.81 wt.% Or less , The content of sodium oxide (Na 2 O) is 13.4 wt.% Or more, 18.23 wt.% Or less, the content of potassium oxide (K 2 O) is 0.0 wt.% Or more, 0.38 wt.% Or less, and antimony oxide ( Sb 2 O 3 ) is characterized in that the content of more than 0.0 wt.%, 0.16 wt.% Or less.

본 발명의 다른 부가적인 양상에 따른 에칭 유리는, 투과율이 97% 이상이고, 밀도가 2.5 이상, 2.6 이하이고, 열팽창 계수(CTE)가 90 이상, 112 이하인 것을 특징으로 한다.
The etched glass according to another additional aspect of the present invention is characterized by having a transmittance of 97% or more, a density of 2.5 or more, 2.6 or less, and a coefficient of thermal expansion (CTE) of 90 or more and 112 or less.

상기와 같이 구성된 본 발명의 에칭 유리는, 에칭에 사용되는 글라스기판의 산화규소(SiO2) 함량을 감소시키고 산화알루미늄(Al2O3)의 함량을 늘리되, 산화나트륨(Na2O), 산화칼륨(K2O), 산화마그네슘(MgO), 산화칼슘(CaO), 산화안티몬(Sb2O3)의 함량을 변화시킴으로써, 에칭속도를 높이면서 글라스기판 표면에 다공성층(Porous Layer)을 균질하게 형성하며 에칭 유리의 기본 물성을 만족시킬 수 있는 유용한 효과가 있다.
Etching glass of the present invention configured as described above, the silicon oxide (SiO 2 ) content of the glass substrate used for etching and increase the content of aluminum oxide (Al 2 O 3 ), sodium oxide (Na 2 O), By changing the contents of potassium oxide (K 2 O), magnesium oxide (MgO), calcium oxide (CaO), and antimony oxide (Sb 2 O 3 ), a porous layer is formed on the surface of the glass substrate while increasing the etching rate. It forms a homogeneously and has a useful effect that can satisfy the basic physical properties of the etched glass.

이하, 첨부된 도면을 참조하여 전술한, 그리고 추가적인 양상을 기술되는 바람직한 실시예를 통하여 본 발명을 당업자가 용이하게 이해하고 재현할 수 있도록 상세히 설명하기로 한다.DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Reference will now be made in detail to the present embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the like elements throughout.

본 발명에서 글라스기판은 산화규소(SiO2)와 산화알루미늄(Al2O3)를 주성분으로 하되, 선택적으로 산화마그네슘(MgO), 산화칼슘(CaO), 산화나트륨(Na2O), 산화칼륨(K2O), 산화안티몬(Sb2O3)을 포함하여 구현된다. In the present invention, the glass substrate is mainly composed of silicon oxide (SiO 2 ) and aluminum oxide (Al 2 O 3 ), optionally magnesium oxide (MgO), calcium oxide (CaO), sodium oxide (Na 2 O), potassium oxide (K 2 O), and antimony oxide (Sb 2 O 3 ) is implemented.

산화규소(SiO2)를 주성분으로 하는 글라스기판은 결합력이 가장 강한 ≡Si-O 결합의 파괴가 에칭 속도를 결정하게 된다. 즉, ≡Si-O의 결합력이 감소하게 되면 글라스기판의 에칭 속도가 증가하게 된다. 산화규소(SiO2)의 함량이 감소하고, 산화나트륨(Na2O), 산화칼륨(K2O)와 산화마그네슘(MgO), 산화칼슘(CaO)의 함량이 증가하게 되면 에칭 속도가 증가한다. 또한 글라스기판 구조 내에 Non Bridging Oxygen(NBO)가 증가하게 되면 ≡Si-O-Si≡의 Ring 구조가 깨지기 때문에 구조의 연결성(Network Connectivity)이 감소하게 되어 에칭 속도가 증가하게 된다.In a glass substrate mainly composed of silicon oxide (SiO 2 ), the breakdown of the ≡Si-O bond having the strongest bonding force determines the etching rate. That is, when the bonding force of Si-O is reduced, the etching rate of the glass substrate is increased. As the content of silicon oxide (SiO 2 ) decreases and the content of sodium oxide (Na 2 O), potassium oxide (K 2 O), magnesium oxide (MgO) and calcium oxide (CaO) increases, the etching rate increases. . In addition, when Non Bridging Oxygen (NBO) is increased in the glass substrate structure, the ring structure of Si-O-Si is broken, thereby reducing the network connectivity and increasing the etching rate.

Alkali Silicate 글라스기판의 경우 산화나트륨(Na2O), 산화칼륨(K2O), 산화마그네슘(MgO), 산화칼슘(CaO)은 Non Bridging Oxygen(NBO)과 결합하지만 그 구조에 알루미늄(Al)이 첨가되면 알루미늄(Al)은 규소(Si)와 같이 사면체 배위를 갖고 구조 수식체로 작용하여 [AlO4]-의 잉여 전자를 생성하게 된다. 이때 산화나트륨(Na2O), 산화칼륨(K2O)와 산화마그네슘(MgO), 산화칼슘(CaO)은 Non Bridging Oxygen(NBO) 보다는 결합력이 더 강한 [AlO4]-와 결합하게 되고 따라서 알루미늄(Al)이 1개 첨가되면 Non Bridging Oxygen(NBO)가 1개 파괴되는 작용을 하게 된다. In the case of Alkali Silicate glass substrates, sodium oxide (Na 2 O), potassium oxide (K 2 O), magnesium oxide (MgO), and calcium oxide (CaO) combine with non-bridging oxide (NBO), but aluminum (Al) in its structure When added, aluminum (Al) has a tetrahedral configuration like silicon (Si) and acts as a structural modifier to generate [AlO 4 ]-excess electrons. At this time, sodium oxide (Na 2 O), potassium oxide (K 2 O), magnesium oxide (MgO) and calcium oxide (CaO) are combined with [AlO 4 ]-which is stronger than Non Bridging Oxygen (NBO). When one aluminum (Al) is added, one non-bridging oxygen (NBO) is destroyed.

이에 일반적인 염기성이나 중성의 조건에서는 글라스기판 성분 중 이동성(Mobility)이 가장 큰 나트륨(Na)이나 칼륨(K)의 이동을 막게 되고, 알루미늄(Al)의 첨가로 떨어져 있던 ≡Si-O 간을 결합시켜 구조를 더 조밀하게 하여 에칭액의 확산을 불리하게 하여 화학적 내구성을 증가시키는 작용을 한다. In general basic or neutral conditions, the movement of sodium (Na) or potassium (K), which has the largest mobility among glass substrate components, is prevented, and ≡Si-O is separated by the addition of aluminum (Al). In order to make the structure more dense, the diffusion of the etching solution is disadvantageous and the chemical durability is increased.

그러나 산성의 조건에서, 특히 본 발명의 에칭액과 같이 pH 1의 강산의 조건에서는 알루미늄(Al)은 전혀 다른 특성을 보이는데 H+에 의해 Al-O-Si의 가수분해가 촉진되어 ≡Si-O-Si≡를 제외한 모든 성분이 선택적으로 에칭되어 오히려 에칭 속도를 증가시키는 작용을 한다. 이와 같은 산화알루미늄(Al2O3) 첨가에 의한 에칭 속도 증가는 Ring 구조가 파괴되면서 구조 내 틈이 생겨 주요 에칭 성분인 H+와 불화물의 확산이 용이해지기 때문이다.However, under acidic conditions, especially under strong acid conditions such as the etching solution of the present invention, aluminum (Al) exhibits a completely different property, and hydrolysis of Al-O-Si is promoted by H + to give ≡Si-O-Si. All components except for VIII are selectively etched to act to increase the etch rate. The increase in the etching rate due to the addition of aluminum oxide (Al 2 O 3 ) is because the ring structure is broken and a gap is formed in the structure, which facilitates the diffusion of H + and fluoride, which are the main etching components.

이에, 본 발명자는 글라스기판의 조성 중 산화규소(SiO2)의 함량을 감소시키고 산화알루미늄(Al2O3)의 함량을 증가시키되, 투과율을 향상시키고 에칭 속도를 증가시면서 기존 소다라임(Soda-lime) 글라스기판 수준의 물성을 만족시키는 조성범위를 개발하였다. 즉, 산화규소(SiO2)의 함량을 감소시키고 산화알루미늄(Al2O3)의 함량을 늘리되, 산화나트륨(Na2O), 산화칼륨(K2O)와 산화마그네슘(MgO), 산화칼슘(CaO), 산화안티몬(Sb2O3)의 함량을 변화시켰다. 에칭 유리 조성 내 산화알루미늄(Al2O3)의 함량은 에칭액 조건에서 선택적 에칭이 되기 쉬운 Si-O 외 Si-O-Al, Al-O-Al 결합의 비율을 증가시키도록 조절되었다. Thus, the present inventors reduce the content of silicon oxide (SiO 2 ) in the composition of the glass substrate and increase the content of aluminum oxide (Al 2 O 3 ), while improving the transmittance and increase the etching rate of the existing soda lime (Soda- lime) A composition range was developed to satisfy the properties of glass substrate level. That is, the content of silicon oxide (SiO 2 ) is reduced and the content of aluminum oxide (Al 2 O 3 ) is increased, but sodium oxide (Na 2 O), potassium oxide (K 2 O) and magnesium oxide (MgO), and oxidation The contents of calcium (CaO) and antimony oxide (Sb 2 O 3 ) were changed. The content of aluminum oxide (Al 2 O 3 ) in the etching glass composition was adjusted to increase the ratio of Si-O-Al and Al-O-Al bonds other than Si-O, which is liable to be selectively etched under etching solution conditions.

본 발명의 산화규소(SiO2)와 산화알루미늄(Al2O3)를 주성분으로 하는 글라스기판 조성 시뮬레이션에 의한 에칭 효율 증가정도를 파악하기 위해, 글라스기판의 조성별로 에칭액 침지 실험을 실시하여 각 조성별로 에칭 속도 증가 여부를 확인하였다. 본 발명에서 사용한 에칭방법은 불화규산(H2SiF6) 용액에 산화규소(SiO2)를 과포화시켜 H2SiF6ㆍSiF4를 생성한 후 이를 이용하여 산화규소(SiO2)와 산화알루미늄(Al2O3)를 주성분으로 하는 글라스기판 구조 중 결합력이 강한 ≡Si-O-Si≡를 제외한 나머지 성분을 선택적으로 에칭시키는 방법을 사용하였다. In order to determine the degree of etching efficiency increase by the glass substrate composition simulation mainly comprising silicon oxide (SiO 2 ) and aluminum oxide (Al 2 O 3 ) of the present invention, an etching solution immersion experiment was carried out for each composition of the glass substrate. It was confirmed whether the etching rate increased. In the etching method used in the present invention, silicon oxide (SiO 2 ) and aluminum oxide (Al 2 O 3 ) are produced by supersaturating silicon oxide (SiO 2 ) in a solution of silicic acid fluoride (H 2 SiF 6 ) to produce H 2 SiF 6 · SiF 4. The method of selectively etching the remaining components except for the strong bonding strength of the glass substrate structure having the main component as ≡Si-O-Si≡ was used.

wt.%wt.% 비교예Comparative example 실시예Example 1One 22 33 44 55 66 1One 22 33 44 SiO2 SiO 2 72.6772.67 68.0668.06 67.0667.06 66.0666.06 65.0665.06 64.0664.06 63.0663.06 62.0662.06 61.0661.06 60.0660.06 Al2O3 Al 2 O 3 0.540.54 5.005.00 6.006.00 7.007.00 8.008.00 9.009.00 10.0010.00 11.0011.00 12.0012.00 13.0013.00 MgOMgO 4.314.31 5.315.31 5.215.21 5.125.12 6.016.01 7.847.84 6.506.50 5.945.94 4.624.62 3.843.84 CaOCaO 8.868.86 7.867.86 7.917.91 7.827.82 6.946.94 7.847.84 6.866.86 6.926.92 7.817.81 5.435.43 Na2ONa 2 O 13.2313.23 13.6113.61 13.6613.66 13.8413.84 13.8313.83 14.7314.73 13.4213.42 13.9213.92 14.3514.35 17.5117.51 K2OK 2 O 0.380.38 -- -- -- -- -- -- -- -- -- Sb2O3 Sb 2 O 3 -- 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 온도Temperature 1358.51358.5 1358.61358.6 1358.51358.5 1358.41358.4 1358.91358.9 1358.71358.7 1358.81358.8 1358.41358.4 1358.21358.2 1358.81358.8 왜곡점Distortion point 506.3506.3 524.8524.8 527.2527.2 531.1531.1 540.8540.8 543.8543.8 545.7545.7 540.5540.5 540.2540.2 538.8538.8 밀도density 2.4892.489 2.5032.503 2.5112.511 2.5192.519 2.5212.521 2.5242.524 2.5262.526 2.5372.537 2.5422.542 2.5482.548 CTECTE 85.5985.59 89.7989.79 89.6289.62 90.1290.12 90.4590.45 90.1290.12 90.1190.11 92.5892.58 95.4495.44 100.89100.89 Al/SiAl / Si 0.0150.015 0.1470.147 0.1790.179 0.2120.212 0.2460.246 0.2810.281 0.3170.317 0.3540.354 0.3930.393 0.4330.433 NBO
유무
NBO
The presence or absence
투과율Transmittance 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 에칭
시간
etching
time

45분

45 minutes

30분

30 minutes

22분

22 minutes

18분

18 minutes

14분

14 minutes

11분

11 minutes

9분

9 minutes

7분

7 minutes

5분

5 minutes

3분

3 minutes
wt.%wt.% 실시예Example 55 66 77 88 99 1010 1111 SiO2 SiO 2 59.0659.06 58.0658.06 57.0657.06 56.0656.06 55.0655.06 54.0654.06 53.0653.06 Al2O3 Al 2 O 3 14.0014.00 15.0015.00 16.0016.00 17.0017.00 18.0018.00 19.0019.00 20.0020.00 MgOMgO 1.871.87 0.090.09 0.050.05 -- -- -- -- CaOCaO 6.906.90 8.088.08 8.138.13 9.129.12 9.549.54 9.359.35 9.819.81 Na2ONa 2 O 18.0118.01 18.2318.23 18.2218.22 17.2817.28 16.8616.86 17.0517.05 16.5916.59 K2OK 2 O -- 0.380.38 0.380.38 0.380.38 0.380.38 0.380.38 0.380.38 Sb2O3 Sb 2 O 3 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 0.160.16 온도Temperature 1358.91358.9 1358.21358.2 1358.51358.5 1358.11358.1 1358.91358.9 1358.71358.7 1358.51358.5 왜곡점Distortion point 536.4536.4 535.4535.4 530.7530.7 526.2526.2 511.9511.9 503.4503.4 492.7492.7 밀도density 2.5522.552 2.5592.559 2.542.54 2.5342.534 2.5312.531 2.5272.527 2.5232.523 CTECTE 105.11105.11 107.18107.18 108.45108.45 109.54109.54 110.81110.81 111.54111.54 111.95111.95 Al/SiAl / Si 0.4740.474 0.5170.517 0.5610.561 0.6060.606 0.6540.654 0.7030.703 0.7540.754 NBO
유무
NBO
The presence or absence
투과율Transmittance 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 97%97% 에칭
시간
etching
time

2분

2 minutes

30초

30 seconds

15초

15 seconds

15초

15 seconds

5초

5 seconds

5초

5 seconds

5초

5 seconds

표 1의 실시예 1 내지 11에 나타난 바와 같이, 산화규소(SiO2)의 함량(wt.%)은 1.0 wt.% 씩 감소시키고, 산화알루미늄(Al2O3)의 함량(wt.%)은 1.0 wt.% 씩 늘리되, 조성 변경에 따른 글라스기판의 원래 물성을 유지하기 위해 산화나트륨(Na2O), 산화칼륨(K2O)와 산화마그네슘(MgO), 산화칼슘(CaO), 산화안티몬(Sb2O3)의 함량(wt.%)을 변화시켰다. As shown in Examples 1 to 11 of Table 1, the content (wt.%) Of silicon oxide (SiO 2 ) is reduced by 1.0 wt.%, And the content (wt.%) Of aluminum oxide (Al 2 O 3 ). Is increased by 1.0 wt.%, And sodium oxide (Na 2 O), potassium oxide (K 2 O), magnesium oxide (MgO), calcium oxide (CaO), The content (wt.%) Of antimony oxide (Sb 2 O 3 ) was changed.

그 결과 글라스기판 조성 내 산화알루미늄(Al2O3)의 함량(wt.%)이 10wt.% 이상, 규소(Si) 대비 알루미늄(Al)의 중량비가 0.317 이상일 때, 45℃의 에칭 조건에서 반응 속도 10분 이내의 결과를 보였다. 그러나 글라스기판 조성 내 산화알루미늄(Al2O3)의 함량이 지나치게 증가하면 에칭 유리의 고온 점성이 높아져 용융이 어려워지므로, 10.0 wt.% 이상, 20.0 wt.% 이하의 범위를 갖는 것이 바람직하다. As a result, when the content (wt.%) Of aluminum oxide (Al 2 O 3 ) in the glass substrate composition is 10 wt.% Or more and the weight ratio of aluminum (Al) to silicon (Si) is 0.317 or more, the reaction is performed under an etching condition of 45 ° C. The results were within 10 minutes. However, when the content of aluminum oxide (Al 2 O 3 ) in the glass substrate composition is excessively increased, the high temperature viscosity of the etched glass becomes high, so that melting becomes difficult. Therefore, it is preferable to have a range of 10.0 wt.% Or more and 20.0 wt.% Or less.

표 1에 나타난 바와 같이 바람직하게는, 글라스기판은 산화규소(SiO2)의 함량이 53.0 wt.% 이상, 63.0 wt.% 이하이고, 산화알루미늄(Al2O3)의 함량이 10.0 wt.% 이상, 20.0 wt.% 이하이고, 산화마그네슘(MgO)의 함량이 0.0 wt.% 이상, 6.50 wt.% 이하이고, 산화칼슘(CaO)의 함량이 6.8 wt.% 이상, 9.81 wt.% 이하이고, 산화나트륨(Na2O)의 함량이 13.4 wt.% 이상, 18.23 wt.% 이하이고, 산화칼륨(K2O)의 함량이 0.0 wt.% 이상, 0.38 wt.% 이하이고, 산화안티몬(Sb2O3)의 함량이 0.0 wt.% 이상, 0.16 wt.% 이하의 범위로 구현된다.As shown in Table 1, preferably, the glass substrate has a silicon oxide (SiO 2 ) content of at least 53.0 wt.%, 63.0 wt.% Or less, and an aluminum oxide (Al 2 O 3 ) content of 10.0 wt.%. 20.0 wt.% Or less, magnesium oxide (MgO) content of 0.0 wt.% Or more, 6.50 wt.% Or less, calcium oxide (CaO) content of 6.8 wt.% Or more and 9.81 wt.% Or less , The content of sodium oxide (Na 2 O) is 13.4 wt.% Or more, 18.23 wt.% Or less, the content of potassium oxide (K 2 O) is 0.0 wt.% Or more, 0.38 wt.% Or less, and antimony oxide ( Sb 2 O 3 ) is implemented in the range of 0.0 wt.% Or more and 0.16 wt.% Or less.

또한, 표 1에서 실시예 1 내지 11에 따른 에칭 유리는, 비교예 1 내지 6에 따른 에칭 유리와 투과율, 밀도, 열팽창 계수(CTE), on Bridging Oxygen(NBO) 유무 등 물성이 유사한 범위를 보이고 있다. In addition, in Table 1, the etched glass according to Examples 1 to 11 shows similar ranges of physical properties such as the etched glass according to Comparative Examples 1 to 6, such as transmittance, density, thermal expansion coefficient (CTE), and presence or absence of on bridging oxide (NBO). have.

지금까지, 본 명세서에는 본 발명이 속하는 기술 분야에서 통상의 지식을 지닌 자가 본 발명을 용이하게 이해하고 재현할 수 있도록 도면에 도시한 실시예들을 참고로 설명되었으나 이는 예시적인 것에 불과하며, 당해 기술분야에 통상의 지식을 지닌 자라면 본 발명의 실시예들로부터 다양한 변형 및 균등한 타 실시예가 가능하다는 점을 이해할 것이다. 따라서 본 발명의 진정한 기술적 보호범위는 첨부된 특허청구범위에 의해서만 정해져야 할 것이다.While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention as defined by the appended claims. Accordingly, the true scope of the present invention should be determined only by the appended claims.

Claims (5)

글라스기판 표면에 에칭을 통해 다공성층(Porous Layer)이 형성되는 에칭 유리로서,
상기 글라스기판이 산화규소(SiO2)와 산화알루미늄(Al2O3)를 포함하되,
상기 산화규소(SiO2)의 함량이, 53.0 wt.% 이상, 63.0 wt.% 이하이고,
상기 산화알루미늄(Al2O3)의 함량이, 10.0 wt.% 이상, 20.0 wt.% 이하이며,
상기 글라스기판의 에칭 반응시간이 10분 이하인 것을 특징으로 하는 에칭 유리.
An etching glass in which a porous layer is formed on the surface of a glass substrate through etching,
The glass substrate includes silicon oxide (SiO 2 ) and aluminum oxide (Al 2 O 3 ),
The content of the silicon oxide (SiO 2 ) is 53.0 wt.% Or more, 63.0 wt.% Or less,
The content of the aluminum oxide (Al 2 O 3 ) is 10.0 wt.% Or more, 20.0 wt.% Or less,
Etching glass, characterized in that the etching reaction time of the glass substrate is less than 10 minutes.
제 1 항에 있어서,
상기 글라스기판이 적어도 산화마그네슘(MgO), 산화칼슘(CaO), 산화나트륨(Na2O), 산화칼륨(K2O), 또는 산화안티몬(Sb2O3) 중 어느 하나를 보조성분으로 포함하되,
상기 산화마그네슘(MgO)의 함량이, 0.0 wt.% 이상, 6.50 wt.% 이하이고,
상기 산화칼슘(CaO)의 함량이, 6.8 wt.% 이상, 9.81 wt.% 이하이고,
상기 산화나트륨(Na2O)의 함량이, 13.4 wt.% 이상, 18.23 wt.% 이하이고,
상기 산화칼륨(K2O)의 함량이, 0.0 wt.% 이상, 0.38 wt.% 이하이고,
상기 산화안티몬(Sb2O3)의 함량이, 0.0 wt.% 이상, 0.16 wt.% 이하인 것을 특징으로 하는 에칭 유리.
The method of claim 1,
The glass substrate includes at least one of magnesium oxide (MgO), calcium oxide (CaO), sodium oxide (Na 2 O), potassium oxide (K 2 O), or antimony oxide (Sb 2 O 3 ) as an auxiliary component. But
The content of magnesium oxide (MgO) is 0.0 wt.% Or more, 6.50 wt.% Or less,
The content of calcium oxide (CaO) is 6.8 wt.% Or more, 9.81 wt.% Or less,
The content of sodium oxide (Na 2 O) is 13.4 wt.% Or more, 18.23 wt.% Or less,
The content of potassium oxide (K 2 O) is 0.0 wt.% Or more, 0.38 wt.% Or less,
The content of the antimony oxide (Sb 2 O 3 ) is 0.0 wt.% Or more, 0.16 wt.% Or less, etching glass.
제 1 항에 있어서,
상기 에칭 유리의 투과율이 97% 이상인 것을 특징으로 하는 에칭 유리.
The method of claim 1,
The transmittance | permeability of the said etching glass is 97% or more, The etching glass characterized by the above-mentioned.
제 1 항에 있어서,
상기 에칭 유리의 밀도가 2.5 이상, 2.6 이하인 것을 특징으로 하는 에칭 유리.
The method of claim 1,
Density of the said etching glass is 2.5 or more and 2.6 or less, The etching glass characterized by the above-mentioned.
제 1 항에 있어서,
상기 에칭 유리의 열팽창 계수(CTE)가 90×10-7/℃ 이상, 112×10-7/℃ 이하인 것을 특징으로 하는 에칭 유리.
The method of claim 1,
The thermal expansion coefficient (CTE) of the said etching glass is 90 * 10 <-7> / degreeC or more, and 112 * 10 <-7> / degrees C or less, The etching glass characterized by the above-mentioned.
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KR20010070135A (en) * 1999-11-09 2001-07-25 이즈하라 요조 Plasma display device and front glass board the same
KR101145749B1 (en) 2007-08-03 2012-05-16 니폰 덴키 가라스 가부시키가이샤 Hardened glass substrate and method for manufacturing the same

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