KR101639786B1 - 기판 상에 적어도 하나의 전기 전도성 막을 퇴적하는 방법 - Google Patents
기판 상에 적어도 하나의 전기 전도성 막을 퇴적하는 방법 Download PDFInfo
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- KR101639786B1 KR101639786B1 KR1020117018957A KR20117018957A KR101639786B1 KR 101639786 B1 KR101639786 B1 KR 101639786B1 KR 1020117018957 A KR1020117018957 A KR 1020117018957A KR 20117018957 A KR20117018957 A KR 20117018957A KR 101639786 B1 KR101639786 B1 KR 101639786B1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K99/00—Subject matter not provided for in other groups of this subclass
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/101—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by casting or moulding of conductive material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3468—Applying molten solder
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/162—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using laser ablation
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- Chemical Kinetics & Catalysis (AREA)
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- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Chemical Vapour Deposition (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
도 1은 그 안에 슬롯이 생성되는 층의 예이다.
도 2는 슬롯을 포함하는 마스크를 구비하는 도 1의 층의 예이다.
도 3은 표면에 도포되는 층을 나타낸 것이다.
도 4는 절단 에지를 분명하게 볼 수 있는, 도 3의 수직 단면도이다.
도 5는 본 발명의 방법의 단계들의 개략도이다.
도 6은 기판 상에 도포된 막의 개략적인 상면도 및 단면도이다.
11 층의 앞면
12 뒷면
20 전기 전도성 막
30 기판
40 마스크
45 슬롯
46 슬롯 폭
100 용융조
110 용융 액적들
120 레이저 펄스
125 레이저 빔 직경
130 절단 에지
131 절단 각도
140 기계적 도구
150 충격파
155 압력파
Claims (14)
- 기판(30) 상에 적어도 하나의 전기 전도성 막(20)을 퇴적하는 방법으로서,
막 재료의 층(10)을 선택하는 단계 - 상기 층(10)은 앞면(front side)(11) 상에 마스크(40)를 포함하고, 상기 층(10) 및 상기 마스크(40)는 일체부(one piece)임 -;
상기 층(10)의 상기 앞면(11)을 상기 기판(30) 상에 배치하는 단계;
상기 층(10)의 적어도 일부분들이 용융(melt)하고 기화(vaporize)하여, 용융 액적들(melt droplets)(110)이 상기 기판(30)을 향해 나아가게 되고 상기 기판(30) 상에 퇴적되어 막(20)을 형성하도록, 상기 층(10)의 뒷면(12)에 적어도 하나의 레이저 펄스(120)를 인가하는 단계
를 포함하고, 상기 마스크(40)의 적어도 하나의 슬롯(45)이 상기 용융 액적들(110)의 분포(distribution)를 제한하고,
상기 층(10)의 뒷면 상에서의 레이저 빔 직경(125) 및/또는 레이저 출력은 상기 기판의 직접적인 조사(irradiation)가 방지되는 방식으로 조절되는 방법. - 제1항에 있어서,
상기 인가하는 단계는,
상기 층(10)의 적어도 일부분들을 용융시키고 기화시키는 단계;
상기 기판(30)을 향해 확장하는 충격파(shockwave)(150)를 발생시키는 단계;
상기 층(10)을 향하는 내부 압력파(155)가 형성되는 단계; 및
상기 용융 액적들(110)을 상기 기판(30)을 향해 추진시키는 단계
를 더 포함하는 것을 특징으로 하는 방법. - 제2항에 있어서,
상기 충격파(150)는 기화된 상기 막 재료의 층에 의해 형성되는 것을 특징으로 하는 방법. - 제1항 또는 제2항에 있어서,
복수의 레이저 펄스(120)가 순차적으로 인접하여 인가되고, 상기 복수의 레이저 펄스(120)가 상기 슬롯(45) 위에서 상기 층(10)을 따라 이동하는 것을 특징으로 하는 방법. - 제1항 또는 제2항에 있어서,
상기 층(10)에 레이저 펄스(120)를 인가하는 단계는 절단 에지(cutting edge)(130)를 형성하고, 상기 절단 에지(130)는 상기 층(10)의 상기 뒷면(12)에 대하여 30°≤θ≤70°의 절단 각도(cut angle) θ(131)를 포함하는 것을 특징으로 하는 방법. - 제1항 또는 제2항에 있어서,
상기 마스크(40) 및/또는 상기 슬롯(45)은 기계적 도구(140)를 이용하여 상기 층(10)의 상기 앞면(11) 내에 생성되는 것을 특징으로 하는 방법. - 제1항 또는 제2항에 있어서,
상기 마스크(40) 및/또는 상기 슬롯(45)은 직사각형 단면을 포함하는 것을 특징으로 하는 방법. - 제1항 또는 제2항에 있어서,
상기 기판(30)은 OLED 기판(30)인 것을 특징으로 하는 방법. - 기판(30) 상에 적어도 하나의 전기 전도성 막(20)을 퇴적하기 위한 시스템으로서,
레이저 및 막 재료의 층(10)을 포함하고,
상기 층(10)은 앞면(11) 상에 마스크(40)를 포함하고, 상기 층(10)과 상기 마스크(40)는 일체(one piece)로 되어 있으며,
상기 시스템은, 제1항 또는 제2항에 따른 방법에 따라 작동하는 시스템. - 제9항에 있어서,
상기 레이저는 펄스식(pulsed) Nd:YVO4 레이저인 것을 특징으로 하는 시스템. - 제9항에 있어서,
상기 레이저는 10 내지 100와트의 출력을 포함하는 것을 특징으로 하는 시스템. - 제9항에 있어서,
상기 레이저는 20 내지 200㎑의 레이저 펄스(120) 반복 레이트(repetition rate)를 포함하며, 상기 레이저는 10 내지 100㎛의 레이저 빔 직경(125)을 포함하는 것을 특징으로 하는 시스템. - 삭제
- 삭제
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP09150520 | 2009-01-14 | ||
| EP09150520.6 | 2009-01-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20110114666A KR20110114666A (ko) | 2011-10-19 |
| KR101639786B1 true KR101639786B1 (ko) | 2016-07-15 |
Family
ID=42025751
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020117018957A Expired - Fee Related KR101639786B1 (ko) | 2009-01-14 | 2010-01-11 | 기판 상에 적어도 하나의 전기 전도성 막을 퇴적하는 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8809192B2 (ko) |
| EP (1) | EP2387803B1 (ko) |
| JP (1) | JP5731400B2 (ko) |
| KR (1) | KR101639786B1 (ko) |
| CN (1) | CN102282693B (ko) |
| TW (1) | TWI538277B (ko) |
| WO (1) | WO2010082151A1 (ko) |
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| DE102012212279A1 (de) | 2012-07-13 | 2014-01-16 | Robert Bosch Gmbh | Verfahren zum Ausbilden einer elektrisch leitenden Schicht auf einem Trägerelement und Verwendung des Verfahrens |
| DE102012212283A1 (de) | 2012-07-13 | 2014-01-16 | Robert Bosch Gmbh | Verfahren zum Ausbilden einer elektrisch leitenden Schicht auf einem Trägerelement und Verwendung des Verfahrens |
| DE102012219063A1 (de) | 2012-10-19 | 2014-04-24 | Robert Bosch Gmbh | Verfahren und Vorrichtung zur Erzeugung einer Metallschicht auf einem Substrat |
| US9812592B2 (en) | 2012-12-21 | 2017-11-07 | Sunpower Corporation | Metal-foil-assisted fabrication of thin-silicon solar cell |
| US9437756B2 (en) | 2013-09-27 | 2016-09-06 | Sunpower Corporation | Metallization of solar cells using metal foils |
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| US9947812B2 (en) | 2014-03-28 | 2018-04-17 | Sunpower Corporation | Metallization of solar cells |
| US9231129B2 (en) | 2014-03-28 | 2016-01-05 | Sunpower Corporation | Foil-based metallization of solar cells |
| US9257575B1 (en) | 2014-09-18 | 2016-02-09 | Sunpower Corporation | Foil trim approaches for foil-based metallization of solar cells |
| US9620661B2 (en) | 2014-12-19 | 2017-04-11 | Sunpower Corporation | Laser beam shaping for foil-based metallization of solar cells |
| US20160380127A1 (en) | 2015-06-26 | 2016-12-29 | Richard Hamilton SEWELL | Leave-In Etch Mask for Foil-Based Metallization of Solar Cells |
| US9620655B1 (en) | 2015-10-29 | 2017-04-11 | Sunpower Corporation | Laser foil trim approaches for foil-based metallization for solar cells |
| US11424373B2 (en) | 2016-04-01 | 2022-08-23 | Sunpower Corporation | Thermocompression bonding approaches for foil-based metallization of non-metal surfaces of solar cells |
| US10290763B2 (en) | 2016-05-13 | 2019-05-14 | Sunpower Corporation | Roll-to-roll metallization of solar cells |
| US9882071B2 (en) | 2016-07-01 | 2018-01-30 | Sunpower Corporation | Laser techniques for foil-based metallization of solar cells |
| US10115855B2 (en) | 2016-09-30 | 2018-10-30 | Sunpower Corporation | Conductive foil based metallization of solar cells |
| WO2018106784A2 (en) | 2016-12-07 | 2018-06-14 | Djg Holdings, Llc | Preparation of large area signage stack |
| US11908958B2 (en) | 2016-12-30 | 2024-02-20 | Maxeon Solar Pte. Ltd. | Metallization structures for solar cells |
| US11276785B2 (en) | 2018-04-06 | 2022-03-15 | Sunpower Corporation | Laser assisted metallization process for solar cell fabrication |
| EP3776669A4 (en) | 2018-04-06 | 2021-04-28 | Sunpower Corporation | LOCAL METALLIZATION FOR SEMICONDUCTOR SUBSTRATES THANKS TO A LASER BEAM |
| US11362234B2 (en) | 2018-04-06 | 2022-06-14 | Sunpower Corporation | Local patterning and metallization of semiconductor structures using a laser beam |
| WO2019195793A1 (en) | 2018-04-06 | 2019-10-10 | Sunpower Corporation | Laser assisted metallization process for solar cell stringing |
| WO2019195804A1 (en) | 2018-04-06 | 2019-10-10 | Sunpower Corporation | Laser assisted metallization process for solar cell circuit formation |
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| JP2007294863A (ja) | 2006-03-31 | 2007-11-08 | Sanyo Electric Co Ltd | 回路装置 |
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2010
- 2010-01-11 EP EP10701733.7A patent/EP2387803B1/en active Active
- 2010-01-11 US US13/143,940 patent/US8809192B2/en active Active
- 2010-01-11 WO PCT/IB2010/050083 patent/WO2010082151A1/en active Application Filing
- 2010-01-11 JP JP2011544961A patent/JP5731400B2/ja not_active Expired - Fee Related
- 2010-01-11 TW TW099100601A patent/TWI538277B/zh not_active IP Right Cessation
- 2010-01-11 CN CN201080004658XA patent/CN102282693B/zh active Active
- 2010-01-11 KR KR1020117018957A patent/KR101639786B1/ko not_active Expired - Fee Related
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| JP2007294863A (ja) | 2006-03-31 | 2007-11-08 | Sanyo Electric Co Ltd | 回路装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20110114666A (ko) | 2011-10-19 |
| CN102282693A (zh) | 2011-12-14 |
| JP5731400B2 (ja) | 2015-06-10 |
| EP2387803B1 (en) | 2016-07-13 |
| US8809192B2 (en) | 2014-08-19 |
| US20110318924A1 (en) | 2011-12-29 |
| WO2010082151A1 (en) | 2010-07-22 |
| CN102282693B (zh) | 2013-10-23 |
| TWI538277B (zh) | 2016-06-11 |
| TW201036228A (en) | 2010-10-01 |
| JP2012515256A (ja) | 2012-07-05 |
| EP2387803A1 (en) | 2011-11-23 |
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