KR102536311B1 - Display device and its testing method - Google Patents

Abstract

An example of the present invention is to provide a display device that can be driven at a low frequency using a column inversion method, thereby reducing the size of an auto-probe transistor and preventing screen flickering, and an inspection method thereof. A display device according to an embodiment of the present invention includes a display panel for displaying an image, a source drive IC for supplying a data voltage to the display panel, a timing controller for controlling the source drive IC, and an inspection unit for performing color inspection on the display panel. do. In the inspection unit of the present invention, a red test line connected to red pixel columns, a green test line connected to green pixel columns, a blue test line connected to blue pixel columns, and any one of red, green, or blue are set. It is connected with the setting color inspection line to inspect the color.

Description

Display device and its inspection method {DISPLAY DEVICE AND ITS TESTING METHOD}

An example of the present invention relates to a display device and an inspection method thereof.

In the information society, many related technologies are being developed in the field of a display device for displaying visual information as an image or image. The display device includes a display panel having a display area provided with pixels displaying an image and a non-display area disposed outside the display area and not displaying an image, a gate driver supplying a gate signal to the pixels, and a data voltage to the pixels. It includes a data driver to supply and a timing controller to supply signals for controlling the gate driver and the data driver.

Also, the pixels of the display device have a red sub-pixel, a green sub-pixel, and a blue sub-pixel to represent RGB colors. In addition, in order to inspect whether or not driving is abnormal for each sub-pixel, an auto probe (AP) test is performed to check whether the sub-pixel is driven by applying a test signal to each sub-pixel.

In the case of the existing auto probe inspection, inspection is performed by applying inspection signals in a frame inversion method using three lines, a red inspection line, a green inspection line, and a blue inspection line. . When the test signals are applied in a frame inversion method, the screen flicker can be prevented by driving at a high frequency of 120 Hz or more. In order to be able to drive the frame inversion at a high frequency of 120 Hz or more, and considering image quality, a length in the vertical direction of the auto probe transistor must be designed to be larger than a designable length.

An example of the present invention is to provide a display device capable of being driven at a low frequency using a column inversion method, thereby reducing the length of an auto probe transistor in a vertical direction and preventing screen flickering, and an inspection method thereof.

A display device according to an embodiment of the present invention includes a display panel for displaying an image, a source drive IC for supplying a data voltage to the display panel, a timing controller for controlling the source drive IC, and an inspection unit for performing color inspection on the display panel. do. In the inspection unit of the present invention, a red test line connected to red pixel columns, a green test line connected to green pixel columns, a blue test line connected to blue pixel columns, and any one of red, green, or blue are set. It is connected with the setting color inspection line to inspect the color.

The present invention can reduce the length of the source drive IC in the vertical direction and reduce screen flicker by performing the auto probe test at a lower frequency than the conventional frame inversion method.

1 is a block diagram of a display device according to an exemplary embodiment of the present invention.
2 is a circuit diagram of a pixel according to an exemplary embodiment of the present invention.
3 is a circuit diagram illustrating pixels and inspection lines of a conventional display device.
4 is a plan view illustrating a display panel and a pad part of a conventional display device.
5 is a plan view showing the pad part of FIG. 4 in detail.
6 is a circuit diagram illustrating pixels and inspection lines of a display device according to an exemplary embodiment of the present invention.
7A and 7B are comparison tables showing positive polarity test signals and negative polarity test signals for each frame and each color according to the display device and its driving method according to the first embodiment of the present invention.
8 is a circuit diagram illustrating pixels and inspection lines of a display device according to a second exemplary embodiment of the present invention.
9A and 9B are comparison tables showing positive polarity test signals and negative polarity test signals for each frame and each color according to the display device and its driving method according to the second embodiment of the present invention.
10 is a circuit diagram illustrating pixels and inspection lines of a display device according to a third exemplary embodiment of the present invention.
11A and 11B are comparison tables showing positive polarity test signals and negative polarity test signals for each frame and each color according to a display device and a driving method thereof according to a third embodiment of the present invention.
12 is a circuit diagram illustrating sub-pixels, an inspection unit, and inspection lines of a display device according to an exemplary embodiment of the present invention in detail.
13 is a plan view illustrating a pad part in detail according to an example of the present invention.

Advantages and features of the present invention, and methods of achieving them, will become clear with reference to the detailed description of the following embodiments taken in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in various different forms, only these embodiments make the disclosure of the present invention complete, and common knowledge in the art to which the present invention belongs. It is provided to fully inform the holder of the scope of the invention, and the present invention is only defined by the scope of the claims.

The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining the embodiments of the present invention are illustrative, so the present invention is not limited to the details shown. Like reference numbers designate like elements throughout the specification. In addition, in describing the present invention, if it is determined that a detailed description of related known technologies may unnecessarily obscure the subject matter of the present invention, the detailed description will be omitted.

When 'includes', 'has', 'consists', etc. mentioned in this specification is used, other parts may be added unless 'only' is used. In the case where a component is expressed in the singular, the case including the plural is included unless otherwise explicitly stated.

In interpreting the components, even if there is no separate explicit description, it is interpreted as including the error range.

In the case of a description of a positional relationship, for example, 'on top of', 'on top of', 'at the bottom of', 'next to', etc. Or, unless 'directly' is used, one or more other parts may be located between the two parts.

In the case of a description of a temporal relationship, for example, 'immediately' or 'directly' when a temporal precedence relationship is described in terms of 'after', 'following', 'next to', 'before', etc. It can also include non-continuous cases unless is used.

Although first, second, etc. are used to describe various components, these components are not limited by these terms. These terms are only used to distinguish one component from another. Therefore, the first component mentioned below may also be the second component within the technical spirit of the present invention.

"X-axis direction", "Y-axis direction", and "Z-axis direction" should not be interpreted only as a geometric relationship in which the relationship between each other is made upright, and may be broader within the range in which the configuration of the present invention can function functionally. It can mean having a direction.

The term “at least one” should be understood to include all possible combinations from one or more related items. For example, "at least one of the first item, the second item, and the third item" means not only the first item, the second item, or the third item, respectively, but also two of the first item, the second item, and the third item. It may mean a combination of all items that can be presented from one or more.

Each feature of the various embodiments of the present invention can be partially or entirely combined or combined with each other, technically various interlocking and driving are possible, and each embodiment can be implemented independently of each other or can be implemented together in a related relationship. may be

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram of a display device 100 according to an embodiment of the present invention. A display device 100 according to an example of the present invention includes a display panel 110, a data driver 120, a gate driver 130, a timing controller 140, a system board 150, a backlight unit 210, and A backlight unit driver 220 is included. The display device 100 according to an example of the present invention may be a display device using the backlight unit 210 or a display device capable of self-emitting light from the display panel 110 . Accordingly, the backlight unit 210 and the backlight unit driver 220 are optional components.

A representative example of display devices using the backlight unit 210 is a liquid crystal display. Accordingly, a case in which the display device 100 according to an exemplary embodiment of the present invention is implemented as a liquid crystal display will be described below. However, the present invention is not limited thereto, and the display device according to an example of the present invention is an electrophoretic display device (EPD), a plasma display device (PDP), or a pixel P on the display panel 110. ) may be an Organic Light Emitting Diode Device (OLED) capable of emitting light on its own. In particular, in the case of an organic light emitting display device, the backlight unit 210 and the backlight unit driver 220 are not required. .

The display panel 110 displays an image using the pixels P. The display panel 110 includes a lower substrate, an upper substrate, and a liquid crystal layer interposed between the lower substrate and the upper substrate. Data lines D and gate lines G are disposed on the lower substrate of the display panel 110 . Data lines (D) are disposed to cross each other with gate lines (G).

2 is a circuit diagram of a pixel P according to an example of the present invention. Pixels P are disposed at intersections of data lines D and gate lines G, respectively. Each of the pixels P is connected to a data line D and a gate line G. Each of the pixels P includes a transistor T, a pixel electrode 11, a common electrode 12, a liquid crystal layer 13, and a storage capacitor Cst. The transistor T is turned on by the gate signal of the gate line G. The turned-on transistor T supplies the data voltage of the data line D to the pixel electrode 11 . The common electrode 12 is connected to a common line and receives a common voltage from the common line.

Each of the pixels P drives the liquid crystal of the liquid crystal layer 13 by an electric field generated by a potential difference between the data voltage supplied to the pixel electrode 11 and the common voltage supplied to the common electrode 12 . The arrangement of liquid crystals is changed according to the presence or absence of an electric field and the intensity of the electric field, so that the transmission amount of light incident from the backlight unit 210 can be adjusted. As a result, the pixels P can display images in the set grayscale. The storage capacitor Cst is disposed between the pixel electrode 11 and the common electrode 12 . The storage capacitor Cst maintains a constant potential difference between the pixel electrode 11 and the common electrode 12 .

The common electrode 12 is disposed on the upper substrate in a vertical electric field driving method such as a TN (Twisted Nematic) mode or a VA (Vertical Alignment) mode. The common electrode 12 is disposed on the lower substrate together with the pixel electrode 11 in a horizontal electric field driving method such as an in plane switching (IPS) mode or a fringe field switching (FFS) mode. The liquid crystal mode of the display panel 110 may be realized in any liquid crystal mode as well as the aforementioned TN mode, VA mode, IPS mode, and FFS mode.

A black matrix and a color filter may be disposed on the upper substrate of the display panel 110 . Color filters may be disposed in openings not covered by the black matrix. When the display panel 110 has a color filter on TFT (COT) structure, the black matrix and color filters may be disposed on a lower substrate of the display panel 110 .

A polarizer may be attached to each of the lower substrate and the upper substrate of the display panel 110 and an alignment layer for setting a pre-tilt angle of liquid crystal may be provided. A column spacer may be provided between the lower substrate and the upper substrate of the display panel 110 to maintain a cell gap of the liquid crystal layer.

The data driver 120 receives the data driver control signal DCS and digital video data DATA from the timing controller 140 . The data driver 120 generates analog data voltages by converting the digital video data DATA into positive or negative gamma compensation voltages according to the data driver control signal DCS. The data driver outputs analog data voltages. Analog data voltages output from the data driver 120 are supplied to the data lines D of the display panel 110 . The data driver 120 includes at least one source drive integrated circuit (IC) 121 .

The gate driver 130 receives the gate driver control signal GCS from the timing controller 140 . The gate driver 130 generates gate signals according to the gate driver control signal GCS. The gate driver 130 sequentially supplies gate signals to the gate lines G of the display panel 110 . Accordingly, the data voltage of the data line D may be supplied to the pixel P to which the gate signals are supplied.

The timing controller 140 receives digital video data DATA and timing signals TS from the system board 150 . The timing signals TS include a horizontal synchronization signal (Hsync), a vertical synchronization signal (Vsync), a data enable signal (DE), and a dot clock (Dclk). can include

The timing controller 140 generates a gate driver control signal GCS and a data driver control signal DCS based on the timing signals TS. The timing controller 140 supplies the gate driver control signal GCS to the gate driver 130 . The timing controller 140 supplies the data driver control signal DCS and digital video data DATA to the data driver 120 .

The system board 150 transmits digital video data (DATA) to the timing controller 140 through an interface such as a Low Voltage Differential Signaling (LVDS) interface or a Transition Minimized Differential Signaling (TMDS) interface. supply to The system board 150 supplies timing signals TS to the timing controller 140 . The system board 150 supplies the backlight unit control signal BCD to the backlight driver 220 . The backlight unit control signal BCD sets the level of the driving voltage DV supplied to the backlight unit 210 by the backlight driver 220 for each region on the display panel 110 . The backlight unit control signal BCD may be transmitted in a serial peripheral interface (SPI) data format.

The backlight unit 210 receives a driving voltage DV from the backlight driver 220 . The backlight unit 210 emits backlight perpendicular to the surface of the display panel 110 with brightness corresponding to the driving voltage DV for each area on the display panel 110 . The backlight unit 210 may be implemented with any light source capable of emitting light. In general, the recent backlight unit 210 is implemented as a light emitting diode array (LED Array), but can also be implemented as a fluorescent lamp or UV LED.

The backlight driver 220 receives the backlight unit control signal BCD from the system board 150 . Based on the information included in the backlight unit control signal (BCD), the backlight driver 220 supplies the backlight unit 210 with a driving voltage (DV) corresponding to the brightness of an image to be displayed for each region on the display panel 110. ) is supplied.

3 is a circuit diagram illustrating pixels and inspection lines of a conventional display device.

A red sub-pixel RP, a green sub-pixel GP, and a blue sub-pixel BP are disposed on the display panel 110 . The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel BP may express RGB colors in a row direction. The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel The pixels BP are repeatedly arranged in order. The red sub-pixels RP, green sub-pixels GP, and blue sub-pixels BP are disposed while forming pixel columns of the same color in the column direction. A red test line (RED), a green test line (GREEN), and a blue test line (BLUE) are disposed in an integrated circuit (IC) outside the display panel 110 .

The red inspection line RED is connected to the red sub-pixels RP. The red check line RED supplies a red check signal to the red sub-pixels RP to check whether the red sub-pixels RP are normally driven. The red inspection line RED may simultaneously supply a red inspection signal to one column of red sub-pixels RP or may individually supply red inspection signals to the red sub-pixels RP.

The green inspection line GREEN is connected to the green sub-pixels GP. The green test line GREEN supplies a green test signal to the green sub-pixels GP to check whether the green sub-pixels GP are normally driven. The green inspection line GREEN may simultaneously supply the green inspection signal to one green sub-pixel GP column or may individually supply the green inspection signal to the green sub-pixel GPs.

The blue check line BLUE is connected to the blue sub-pixels BP. The blue check line BLUE supplies a blue test signal to check whether the blue sub-pixels BP are normally driven to the blue sub-pixels BP. The blue inspection line BLUE may simultaneously supply the blue inspection signal to one blue sub-pixel BP column, or may individually supply the blue inspection signal to the blue sub-pixels BP.

4 is a plan view illustrating a display panel 110, a pad unit 200, and a source drive IC 121 of a conventional display device.

The pad unit 200 is disposed outside the display area AA on the display panel 110 . The source drive IC 121 is disposed on the pad unit 200 on which pads or bumps for receiving or supplying electrical signals are formed. The display device according to the present invention is designed in a chip on glass (COG) form, and the source drive IC 121 is directly bonded to the pad unit 200 .

FIG. 5 is a plan view showing the pad unit 200 of FIG. 4 in detail. The pad unit 200 includes a source drive IC 121, an auto probe transistor unit 300, an enable signal supply unit 310, a red inspection signal supply unit 320, a green inspection signal supply unit 330, and a blue inspection signal supply unit. (340).

The source drive IC 121 is directly bonded to the pad unit 200 . The source drive IC 121 has an input bump (IB) for receiving digital video data DATA and a data driver control signal DCS from the system board 150 . The source drive IC 121 has an output bump (OB) that supplies electrical signals necessary for driving the display panel 110 , such as a common voltage and data voltages, to the display panel 110 .

In addition, the source drive IC 121 includes an auto probe transistor unit 300 to perform an auto probe test. The auto probe transistor unit 300 is composed of a plurality of transistors. A gate terminal of each transistor is connected to the enable signal supply unit 310 . A drain terminal or source terminal of each transistor is connected to the input bump IB. When the drain terminal is connected to the input bump IB, the source terminal is connected to the output bump OB. Also, when the source terminal is connected to the input bump IB, the drain terminal is connected to the output bump OB.

In addition, a terminal connected to the input bump IB of the auto probe transistor unit 300 is connected to the red inspection signal supply unit 320 , the green inspection signal supply unit 330 , and the blue inspection signal supply unit 340 . At this time, each transistor is sequentially connected to the red test signal supply unit 320 , the green test signal supply unit 330 , and the blue test signal supply unit 340 .

In the case of the conventional auto-probe inspection, three red inspection lines, green inspection lines, and blue inspection lines connected to the red inspection signal supply unit 320, the green inspection signal supply unit 330, and the blue inspection signal supply unit 340, respectively. Inspection is performed by applying inspection signals in a frame inversion method using a line. When the test signals are applied in a frame inversion method, the screen flicker can be prevented by driving at a high frequency of 120 Hz or more. In order to enable frame inversion driving at a high frequency of 120 Hz or more, an auto probe transistor unit 300 having a length between a source terminal and a drain terminal of a predetermined length or more is required. In general, the source terminal and the drain terminal of the transistor of the auto probe transistor unit 300 are disposed in a vertical direction, so that the length between the source terminal and the drain terminal will be defined as the vertical length.

That is, the length of the auto probe transistor unit 300 in the vertical direction is increased in order to perform frame inversion driving while considering image quality. In addition, the length of the source drive IC 121 in which the auto probe transistor unit 300 is built in is also increased. Accordingly, the length of the source drive IC 121 in the vertical direction becomes the first length L1. The first length L1 is about 80 μm, which is greater than the designable length of the IC chip. Accordingly, a problem arises in that the length of the source drive IC 121 in the vertical direction becomes larger than the designable length.

Here, when the test signals are applied in a column inversion method, screen flickering does not occur even when driven at a relatively low frequency of 60 Hz, for example. Therefore, since low-frequency driving is possible, it is possible to reduce the size of the source drive IC 121 by reducing the size of the auto probe transistor unit 300 . However, in order to apply inspection signals in the conventional column inversion method, two inspection lines are required to supply positive polarity voltage (+) and negative polarity voltage (-) for each color, resulting in a total of six inspection lines. was needed In this case, since the number of inspection lines increases, there is no effect of substantially reducing the design area of the auto probe transistor unit 300 .

6 is a circuit diagram illustrating pixels and inspection lines of a display device according to an exemplary embodiment of the present invention.

A red sub-pixel RP, a green sub-pixel GP, and a blue sub-pixel BP are disposed on the display panel 110 . The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel BP may express RGB colors in a row direction. The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel The pixels BP are repeatedly arranged in order. The red sub-pixels RP, green sub-pixels GP, and blue sub-pixels BP are disposed while forming pixel columns of the same color in the column direction. A red test line (RED), a green test line (GREEN), a blue test line (BLUE), and a red set color test line (RED1) are disposed in the integrated circuit (IC) of the outer portion of the display panel 110. .

The red inspection line RED is connected to the red sub-pixels RP. The red check line RED supplies a red check signal to the red sub-pixels RP to check whether the red sub-pixels RP are normally driven. The red inspection line RED may simultaneously supply a red inspection signal to one column of red sub-pixels RP or may individually supply red inspection signals to the red sub-pixels RP.

At this time, the red check line RED is connected to the red sub-pixels RP in any one of the odd-numbered pixel columns and the even-numbered pixel columns among the red sub-pixels RP.

The red set color check line RED1 is connected to the red sub-pixels RP. The red set color test line RED1 supplies a red test signal to the red sub-pixels RP to check whether the red sub-pixels RP are normally driven. The red set color inspection line RED1 may simultaneously supply a red inspection signal to one red sub-pixel RP column, or may individually supply a red inspection signal to the red sub-pixels RP.

At this time, the red set color inspection line RED1 is applied to the red sub-pixels RP in the pixel columns not connected to the red inspection line RED among the even-numbered pixel columns or the odd-numbered pixel columns among the red sub-pixels RP. connected with the That is, the red test line RED and the red set color test line RED1 are alternately connected to the pixel columns of the red sub-pixel RP.

The green inspection line GREEN is connected to the green sub-pixels GP. The green test line GREEN supplies a green test signal to the green sub-pixels GP to check whether the green sub-pixels GP are normally driven. The green inspection line GREEN may simultaneously supply the green inspection signal to one green sub-pixel GP column or may individually supply the green inspection signal to the green sub-pixel GPs.

The blue check line BLUE is connected to the blue sub-pixels BP. The blue check line BLUE supplies a blue test signal to check whether the blue sub-pixels BP are normally driven to the blue sub-pixels BP. The blue inspection line BLUE may simultaneously supply the blue inspection signal to one blue sub-pixel BP column, or may individually supply the blue inspection signal to the blue sub-pixels BP.

At this time, each test line supplies a test signal to the connected pixels by alternating a positive test signal (+) and a negative test signal (-) in a column inversion method.

7A and 7B are comparison tables showing positive polarity test signals (+) and negative polarity test signals (-) for each frame and each color according to the display device and its driving method according to the first embodiment of the present invention.

In the first frame (1st frame), positive test signals (+) are supplied to the red test line (RED) and the green test line (GREEN), and to the blue test line (BLUE) and the red set color test line (RED1). A negative polarity test signal (-) is supplied. Accordingly, based on 12 sub-pixels, in the first frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In the second frame, a negative test signal (-) is supplied to the red test line (RED) and the green test line (GREEN), and to the blue test line (BLUE) and the red set color test line (RED1). A positive polarity test signal (+) is supplied. Accordingly, based on 12 sub-pixels, in the second frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In addition, the sub-pixel supplied with the positive polarity test signal (+) in the first frame (1st frame) receives the negative polarity test signal (-) in the 2nd frame, and in the 1st frame (1st frame). Sub-pixels receiving the negative inspection signal (-) are supplied with the positive inspection signal (+) in the second frame. Accordingly, the column inversion drive can be perfectly implemented using four inspection lines: red inspection line (RED), green inspection line (GREEN), blue inspection line (BLUE), and red set color inspection line (RED1). there is.

8 is a circuit diagram illustrating pixels and inspection lines of a display device according to a second exemplary embodiment of the present invention.

A red sub-pixel RP, a green sub-pixel GP, and a blue sub-pixel BP are disposed on the display panel 110 . The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel BP may express RGB colors in a row direction. The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel The pixels BP are repeatedly arranged in order. The red sub-pixels RP, green sub-pixels GP, and blue sub-pixels BP are disposed while forming pixel columns of the same color in the column direction. A red test line (RED), a green test line (GREEN), a blue test line (BLUE), and a green set color test line (GREEN1) are disposed in the integrated circuit (IC) of the outer portion of the display panel 110. .

The red inspection line RED is connected to the red sub-pixels RP. The red check line RED supplies a red check signal to the red sub-pixels RP to check whether the red sub-pixels RP are normally driven. The red inspection line RED may simultaneously supply a red inspection signal to one column of red sub-pixels RP or may individually supply red inspection signals to the red sub-pixels RP.

The green inspection line GREEN is connected to the green sub-pixels GP. The green test line GREEN supplies a green test signal to the green sub-pixels GP to check whether the green sub-pixels GP are normally driven. The green inspection line GREEN may simultaneously supply the green inspection signal to one green sub-pixel GP column or may individually supply the green inspection signal to the green sub-pixel GPs.

At this time, the green check line GREEN is connected to the green sub-pixels GP in any one of the odd-numbered pixel columns and the even-numbered pixel columns among the green sub-pixels GP.

The green setting color check line GREEN1 is connected to the green sub-pixels GP. The green setting color test line GREEN1 supplies a green test signal to the green sub-pixels GP to check whether the green sub-pixels GP are normally driven. The green set color test line GREEN1 may simultaneously supply the green test signal to one green sub-pixel GP column or may individually supply the green test signal to the green sub-pixel GPs.

At this time, the green set color inspection line GREEN1 is applied to the green sub-pixel GP in a pixel column not connected to the green inspection line GREEN among the even-numbered pixel columns or the odd-numbered pixel columns among the green sub-pixels GP. connected with the That is, the green test line GREEN and the green set color test line GREEN1 are alternately connected to the pixel columns of the green sub-pixel GP.

The blue check line BLUE is connected to the blue sub-pixels BP. The blue check line BLUE supplies a blue test signal to check whether the blue sub-pixels BP are normally driven to the blue sub-pixels BP. The blue inspection line BLUE may simultaneously supply the blue inspection signal to one blue sub-pixel BP column, or may individually supply the blue inspection signal to the blue sub-pixels BP.

At this time, each test line supplies a test signal to the connected pixels by alternating a positive test signal (+) and a negative test signal (-) in a column inversion method.

9A and 9B are comparison tables showing positive polarity test signals and negative polarity test signals for each frame and each color according to the display device and its driving method according to the second embodiment of the present invention.

In the first frame (1st frame), positive test signals (+) are supplied to the red test line (RED) and the green test line (GREEN), and to the blue test line (BLUE) and the green setting color test line (GREEN1). A negative polarity test signal (-) is supplied. Accordingly, based on 12 sub-pixels, in the first frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In the 2nd frame, a negative test signal (-) is supplied to the red test line (RED) and the green test line (GREEN), and to the blue test line (BLUE) and the green setting color test line (GREEN1). A positive polarity test signal (+) is supplied. Accordingly, based on 12 sub-pixels, in the second frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In addition, the sub-pixel supplied with the positive polarity test signal (+) in the first frame (1st frame) receives the negative polarity test signal (-) in the 2nd frame, and in the 1st frame (1st frame). Sub-pixels receiving the negative inspection signal (-) are supplied with the positive inspection signal (+) in the second frame. Accordingly, the column inversion drive can be perfectly implemented by using four inspection lines: red inspection line (RED), green inspection line (GREEN), blue inspection line (BLUE), and green setting color inspection line (GREEN1). there is.

10 is a circuit diagram illustrating pixels and inspection lines of a display device according to a third exemplary embodiment of the present invention.

A red sub-pixel RP, a green sub-pixel GP, and a blue sub-pixel BP are disposed on the display panel 110 . The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel BP may express RGB colors in a row direction. The red sub-pixel RP, the green sub-pixel GP, and the blue sub-pixel The pixels BP are repeatedly arranged in order. The red sub-pixels RP, green sub-pixels GP, and blue sub-pixels BP are disposed while forming pixel columns of the same color in the column direction. A red test line (RED), a green test line (GREEN), a blue test line (BLUE), and a green set color test line (GREEN1) are disposed in the integrated circuit (IC) of the outer portion of the display panel 110. .

The red inspection line RED is connected to the red sub-pixels RP. The red check line RED supplies a red check signal to the red sub-pixels RP to check whether the red sub-pixels RP are normally driven. The red inspection line RED may simultaneously supply a red inspection signal to one column of red sub-pixels RP or may individually supply red inspection signals to the red sub-pixels RP.

The green inspection line GREEN is connected to the green sub-pixels GP. The green test line GREEN supplies a green test signal to the green sub-pixels GP to check whether the green sub-pixels GP are normally driven. The green inspection line GREEN may simultaneously supply the green inspection signal to one green sub-pixel GP column or may individually supply the green inspection signal to the green sub-pixel GPs.

The blue check line BLUE is connected to the blue sub-pixels BP. The blue check line BLUE supplies a blue test signal to check whether the blue sub-pixels BP are normally driven to the blue sub-pixels BP. The blue inspection line BLUE may simultaneously supply the blue inspection signal to one blue sub-pixel BP column, or may individually supply the blue inspection signal to the blue sub-pixels BP.

At this time, the blue check line BLUE is connected to the blue sub-pixels BP in any one of the odd-numbered pixel columns and the even-numbered pixel columns among the blue sub-pixels BP.

The blue setting color check line BLUE1 is connected to the blue sub-pixels BP. The blue set color check line BLUE1 supplies a blue check signal to the blue sub-pixels BP to check whether the blue sub-pixels BP are normally driven. The blue set color inspection line BLUE1 may simultaneously supply a blue inspection signal to one blue sub-pixel BP column or may individually supply a blue inspection signal to the blue sub-pixels BP.

At this time, the blue set color check line BLUE1 is applied to the blue sub-pixels BP in the pixel columns not connected to the blue check line BLUE among the even-numbered pixel columns or the odd-numbered pixel columns among the blue sub-pixels BP. connected with the That is, the blue check line BLUE and the blue set color check line BLUE1 are alternately connected to the pixel columns of the blue sub-pixel BP.

At this time, each test line supplies a test signal to the connected pixels by alternating a positive test signal (+) and a negative test signal (-) in a column inversion method.

11A and 11B are comparison tables showing positive polarity test signals and negative polarity test signals for each frame and each color according to a display device and a driving method thereof according to a third embodiment of the present invention.

In the first frame (1st frame), the positive test signal (+) is supplied to the red test line (RED) and the blue test line (BLUE), and to the green test line (GREEN) and the blue setting color test line (BLUE1). A negative polarity test signal (-) is supplied. Accordingly, based on 12 sub-pixels, in the first frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In the 2nd frame, a negative test signal (-) is supplied to the red test line (RED) and the blue test line (BLUE), and to the green test line (GREEN) and the blue setting color test line (BLUE1). A positive polarity test signal (+) is supplied. Accordingly, based on 12 sub-pixels, in the second frame (1st frame), the positive polarity inspection signal (+) is supplied to 6 sub-pixels, and the negative polarity inspection signal (-) is also supplied to 6 sub-pixels. are supplied

In addition, the sub-pixel supplied with the positive polarity test signal (+) in the first frame (1st frame) receives the negative polarity test signal (-) in the 2nd frame, and in the 1st frame (1st frame). Sub-pixels receiving the negative inspection signal (-) are supplied with the positive inspection signal (+) in the second frame. Accordingly, column inversion driving can be perfectly implemented using four inspection lines: red inspection line (RED), green inspection line (GREEN), blue inspection line (BLUE), and blue setting color inspection line (BLUE1). there is.

12 is a circuit diagram illustrating sub-pixels RP, GP, and BP, an auto-probe transistor unit 300, and test lines RED, GREEN, BLUE, and BLUE1 of a display device according to an exemplary embodiment of the present invention in detail. .

The auto probe transistor unit 300 is composed of a plurality of transistors. A gate terminal of each transistor is connected in common with an enable signal terminal. A drain terminal of each transistor is connected to sub-pixels of a set color among the sub-pixels RP, GP, and BP. A source terminal of each transistor is connected to test lines of a set color among the test lines RED, GREEN, BLUE, and BLUE1.

At this time, when an enable signal is applied, all transistors in the auto probe transistor unit 300 are turned on. When test signals corresponding to a predetermined color are supplied to each of the test lines RED, GREEN, BLUE, and BLUE1, the auto probe transistor unit 300 generates signals corresponding to a predetermined color to the sub-pixels RP, GP, and BP. Test signals may be supplied.

At this time, the auto probe transistor unit 300 includes a red test line (RED) connected to red pixel (RP) columns, a green test line (GREEN) connected to green pixel (GP) columns, and blue pixel (BP) columns. It is connected to a connected blue inspection line (BLUE) and a set color inspection line for inspecting a set color of any one of red, green, or blue. Although FIG. 12 illustrates the case where there is a blue set color check line BLUE1, as described above in the first to third embodiments, there is a red set color check line RED1 or a green set color check line GREEN1. The case can also be explained by the same principle.

In the case of supplying test signals by adding only one set color test line, as described above, the vertical length of the auto probe transistor unit 300 is reduced while minimizing the addition of the test line, so that the source drive IC 121 is There is an effect of reducing the direction length.

13 is a plan view illustrating a pad part in detail according to an example of the present invention. The pad unit 200 includes a source drive IC 121, an auto probe transistor unit 300, an enable signal supply unit 310, a red inspection signal supply unit 320, a green inspection signal supply unit 330, and a blue inspection signal supply unit ( 340), and a set color test signal supply unit 350.

The source drive IC 121 is directly bonded to the pad unit 200 . The source drive IC 121 has an input bump (IB) for receiving digital video data DATA and a data driver control signal DCS from the system board 150 . The source drive IC 121 has an output bump (OB) that supplies electrical signals necessary for driving the display panel 110 , such as a common voltage and data voltages, to the display panel 110 .

In addition, the source drive IC 121 includes an auto probe transistor unit 300 to perform an auto probe test. The auto probe transistor unit 300 is composed of a plurality of transistors. A gate terminal of each transistor is connected to the enable signal supply unit 310 . A drain terminal or a source terminal of each transistor is connected to the input bump IB. When the drain terminal is connected to the input bump IB, the source terminal is connected to the output bump OB. Also, when the source terminal is connected to the input bump IB, the drain terminal is connected to the output bump OB.

In addition, terminals connected to the input bump (IB) of the auto probe transistor unit 300 include a red inspection signal supply unit 320, a green inspection signal supply unit 330, a blue inspection signal supply unit 340, and a set color inspection signal supply unit ( 350) is connected. At this time, each transistor is sequentially connected to the red inspection signal supply unit 320, the green inspection signal supply unit 330, the blue inspection signal supply unit 340, and the set color inspection signal supply unit 350.

Taken together based on FIGS. 12 and 13 , in the case of an auto probe test according to an example of the present invention, a column check is performed using four lines of a red test line, a green test line, a blue test line, and a set color test line. Inspection is performed by applying inspection signals in a column inversion method. When the test signals are applied in a column inversion method, screen flickering does not occur even when driven at a relatively low frequency, for example, 60 Hz. Therefore, since low-frequency driving is possible, the length between the source terminal and the drain terminal of the auto probe transistor unit 300, that is, the length in the vertical direction, can be reduced.

Also, when the length of the auto probe transistor unit 300 is reduced in the vertical direction, it is possible to reduce the length of the source drive IC 121 in the vertical direction. The longitudinal length of the source drive IC 121 according to an example of the present invention is the second length L2. The second length L2 is smaller than the first length L1, and is preferably about 20 μm. Accordingly, there is an effect of reducing the length of the source drive IC 121 in the vertical direction compared to the prior art.

Preferably, the set color inspection line is alternately connected to the pixel columns of the set color with the inspection line corresponding to the set color. In this case, the positive polarity detection signal (+) and the negative polarity detection signal (-) are equally applied to each color of the pixel column and for each frame according to the inspection method as described above in the first to third embodiments. Therefore, it is possible to prevent a problem in which polarities are unbalancedly supplied to a pixel column of a specific color.

In addition, the auto probe transistor unit 300 alternately supplies a positive test signal (+) and a negative test signal (-) to the test lines RED, GREEN, BLUE, and BLUE1 in a column inversion method. Accordingly, it is possible to perform an auto probe test in a column inversion method in which a screen flicker problem does not occur easily even at a low frequency, and thus image quality is improved.

Preferably, the alternating frequency of the positive polarity test signal (+) and the negative polarity test signal (-) is the same as the driving frequency of the source drive IC 121. Accordingly, low-frequency driving of the source drive IC 121 is possible, thereby reducing the size of the source drive IC 121 .

Also, preferably, the ratio of the positive test signal (+) to the negative test signal (-) is 1:1 for all colors and 1:1 for each color. This is possible when using the same inspection method as the first to third embodiments as described above. Accordingly, there is an effect that it is possible to specifically explain that the auto probe inspection can be perfectly performed in the column inversion method using the four inspection lines continuously described in the present invention.

In summary, the present invention performs an auto-probe test in a column inversion method using red, green, blue, and a set color test line set to any color among the three colors, a total of four test lines. Accordingly, the present invention can reduce the length of the source drive IC in the vertical direction and reduce screen flicker by performing the auto probe test at a lower frequency than the conventional frame inversion method.

Through the above description, those skilled in the art will know that various changes and modifications are possible without departing from the technical spirit of the present invention. Therefore, the technical scope of the present invention is not limited to the contents described in the detailed description of the specification, but should be defined by the claims.

100: display device 110: display panel
120: data driver 121: source drive IC
130: gate driver 140: timing controller
150: system board 200: pad part
210: backlight unit 220: backlight unit driving unit
300: auto probe transistor unit 310: enable signal supply unit
320: red test signal supply unit 330: green test signal supply unit
340: blue inspection signal supply unit 350: set color inspection signal supply unit
IB: Input bump OB: Output bump
RP: red sub-pixel GP: green sub-pixel
BP: blue sub-pixel RED: red check line
GREEN: green inspection line BLUE: blue inspection line
RED1, GREEN1, BLUE1: set color inspection line

Claims (10)

a display panel displaying images;
a source driver IC supplying a data voltage to the display panel;
a timing controller controlling the source drive IC; and
An inspection unit for performing a color inspection on the display panel;
The inspection unit detects a red test line connected to red pixel columns, a green test line connected to green pixel columns, a blue test line connected to blue pixel columns, and a set color of red, green, or blue. It is connected to the set color inspection line to be inspected,
The set color check line alternates with a check line corresponding to the set color to be connected to pixel columns of the set color. delete According to claim 1,
The display device of claim 1 , wherein the inspection unit alternately supplies a positive polarity inspection signal and a negative polarity inspection signal to the inspection lines in a column inversion method. According to claim 3,
The alternating frequency of the positive polarity test signal and the negative polarity test signal is the same frequency as the driving frequency of the source drive IC. According to claim 3,
The ratio of the positive polarity test signal and the negative polarity test signal is 1:1 for all colors and 1:1 for each color. The timing controller controls the source drive IC;
supplying, by the source driver IC, a data voltage to a display panel;
displaying an image on the display panel;
Including performing a color inspection on the display panel by an inspection unit,
The inspection unit detects a red test line connected to red pixel columns, a green test line connected to green pixel columns, a blue test line connected to blue pixel columns, and a set color of red, green, or blue. It is connected to the set color inspection line to be inspected,
The test line of the set color is connected to the pixel columns of the set color by alternating with the check line corresponding to the set color. delete According to claim 6,
The inspection unit supplies a positive polarity inspection signal and a negative polarity inspection signal to the inspection lines in a column inversion method. According to claim 8,
The alternating frequency of the positive polarity test signal and the negative polarity test signal is the same frequency as the driving frequency of the source drive IC. According to claim 8,
The ratio of the positive polarity test signal and the negative polarity test signal is 1:1 for all colors and 1:1 for each color.

Images