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KR940022483A - Light emitting position detection method of light emitting device - Google Patents

Light emitting position detection method of light emitting device Download PDF

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Publication number
KR940022483A
KR940022483A KR1019940004527A KR19940004527A KR940022483A KR 940022483 A KR940022483 A KR 940022483A KR 1019940004527 A KR1019940004527 A KR 1019940004527A KR 19940004527 A KR19940004527 A KR 19940004527A KR 940022483 A KR940022483 A KR 940022483A
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KR
South Korea
Prior art keywords
light emitting
emitting element
light
imaging device
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019940004527A
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Korean (ko)
Inventor
고키 오카와우치
Original Assignee
오오가 노리오
소니 가부시끼가이샤
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Publication date
Application filed by 오오가 노리오, 소니 가부시끼가이샤 filed Critical 오오가 노리오
Publication of KR940022483A publication Critical patent/KR940022483A/en
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/95—Circuit arrangements
    • H10F77/953—Circuit arrangements for devices having potential barriers
    • H10F77/957—Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

본 발명은 1대의 촬상장치를 이용하여 기준점과 발광점을 동시에 정도 좋게 검출하는 것이 가능한 발광소자의 발광위치 검출방법을 제공하는 것을 목적으로 한다. 본 발명에 의하면, 지지대상에 놓여진 발광소자의 발광위치 검출방법에 있어서, 활영장치를 상기 발광소자의 발광면에 대하여 수직방향으로 배치하여 상기 발광면에서의 광을 촬상하고, 상기 촬상장치에 의해 촬상한 화상을 화상처리하여 상기 발광소자의 발광위치를 검출하는 것을 특징으로 하는 발광소자의 발광위치 검출방법에 의해 해결되도록 구성되어 있다.An object of the present invention is to provide a light emitting position detecting method of a light emitting element which can detect a reference point and a light emitting point at the same time with high accuracy using one imaging device. According to the present invention, in the method for detecting the light emitting position of a light emitting element placed on a supporting object, the lubricating device is arranged in a direction perpendicular to the light emitting surface of the light emitting element to pick up the light at the light emitting surface, and And a light emitting position detecting method of the light emitting element, characterized by detecting the light emitting position of the light emitting element by performing image processing on the captured image.

Description

발광소자의 발광위치 검출방법Light emitting position detection method of light emitting device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 제1실시예에 의한 레이저 다이오드의 발광위치 검출방법을 설명하기 위한 구성도이다.1 is a configuration diagram for explaining a method of detecting a light emitting position of a laser diode according to the first embodiment.

제2도는 화상처리장치의 모니터화면에 출력된 디지털 화상을 나타내는 도면이다.2 is a diagram showing a digital image output on the monitor screen of the image processing apparatus.

제3도는 샘플링라인상에서 광강도분포를 나타내는 도면이다.3 is a diagram showing light intensity distribution on a sampling line.

제4도는 윈도우영역에서의 광강도분포를 나타내는 도면이다.4 is a diagram showing the light intensity distribution in the window region.

Claims (6)

지지대상에 놓여진 발광소자의 발광위치 검출방법에 있어서, 활상장치를 상기 발광소자의 발광면에 대하여 수직방향으로 배치하여 상기 발광면에서의 광을 촬상하고, 상기 촬상장치에 의해 촬상한 화상을 화상처리하여 상기 발광소자의 발광위치를 검출하하는 것을 특징으로 하는 발광소자의 발광위치 검출방법.In the method for detecting the light emitting position of a light emitting element placed on a supporting object, the slide device is arranged in a direction perpendicular to the light emitting surface of the light emitting element to pick up the light on the light emitting surface, and the image picked up by the imaging device is an image. Processing to detect the light emitting position of the light emitting element. 지지대상에 놓여지고, 대향한 발광면에 제1발광점과 제2발광점을 가지는 발광소자의 발광위치 검출방법에 있어서, 상기 발광소자의 발광면에 평행으로 배치되는 상기 지지대상의 소정의 면에 의하여 수직방향으로 촬상장치를 배치하여 상기 대향한 발광면에서의 광을 촬상하고, 상기 촬상장치에 의해 촬상한 화상을 화상처리하여 상기 제1발광점 및 제2발광점의 위치를 검출하고, 검출된 상기 제1발광점 및 제2발광점의 위치에서 상기 발광소자의 발광면의 상기 지지대의 소정면에서의 위치엇갈림을 확인하는 것을 특징으로 하는 발광소자의 발광위치 검출방법.A light emitting position detecting method of a light emitting element placed on a supporting object and having a first light emitting point and a second light emitting point on opposite light emitting surfaces, wherein the predetermined surface of the supporting object is disposed parallel to the light emitting surface of the light emitting element. By placing the image pickup device in the vertical direction to pick up the light from the opposite light emitting surface, and image processing the image picked up by the image pickup device to detect the positions of the first light emitting point and the second light emitting point, And detecting a positional shift of a predetermined surface of the support of the light emitting surface of the light emitting device at the detected positions of the first light emitting point and the second light emitting point. 제1항 또는 제2항의 어느 것에 있어서, 상기 촬상장치의 초점을 상기 발광소자의 활성층에 맞추는 것을 특징으로 하는 발광소자의 발광위치 검출방법.The light emitting position detecting method according to any one of claims 1 to 3, wherein the focus of the imaging device is focused on the active layer of the light emitting element. 제1항~제3항의 어느 것에 있어서, 상기 발광소자의 발광위치의 기준이 되는 상기 지지대상의 패턴을 촬상할 수 있도록 상기 촬상장치를 배치하여 상기 패턴을 촬상하고, 상기 촬상장치에 의해 촬상한 화상을 화상처리하고, 상기 발광소자의 발광위치의 기준의 되는 기준점을 검출하는 것을 특징으로 하는 발광소자의 발광위치 검출방법.The imaging device according to any one of claims 1 to 3, wherein the imaging device is arranged so that the pattern of the supporting object, which is a reference for the light emitting position of the light emitting element, can be imaged, and the image is taken by the imaging device. And a reference point serving as a reference for the light emitting position of the light emitting element. 제1항~제4항의 어느 것에 있어서, 상기 발광소자의 광량을 상기 촬상장치의 감도범위내에 받아들이기 위해 광량조정에 광학필터를 이용하는 것을 특징으로 하는 발광소자의 발광위치 검출방법.The light emitting position detecting method according to any one of claims 1 to 4, wherein an optical filter is used to adjust the amount of light in order to receive the amount of light of the light emitting element within a sensitivity range of the imaging device. 제1항~제5항의 어느 것에 있어서, 상기 촬상장치에 의한 화상을 디지털화상으로 변화하고, 상기 발광소자의 발광방향에 대응하는 상기 디지털화상을 연산처리하여 광의 강도분포파형을 얻음으로써 상기 발광소자의 발광위치 검출을 행하는 것을 특징으로 하는 발광소자의 발광위치 검출방법.The light emitting device according to any one of claims 1 to 5, wherein the image obtained by the imaging device is changed into a digital image, and the digital image corresponding to the light emitting direction of the light emitting device is processed to obtain an intensity distribution waveform of light. A light emitting position detecting method of a light emitting element, characterized in that the light emitting position is detected. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940004527A 1993-03-11 1994-03-09 Light emitting position detection method of light emitting device Withdrawn KR940022483A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP93-050738 1993-03-11
JP5073893A JPH06268261A (en) 1993-03-11 1993-03-11 Light emitting point detection method of light emitting device

Publications (1)

Publication Number Publication Date
KR940022483A true KR940022483A (en) 1994-10-21

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KR1019940004527A Withdrawn KR940022483A (en) 1993-03-11 1994-03-09 Light emitting position detection method of light emitting device

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JP (1) JPH06268261A (en)
KR (1) KR940022483A (en)
TW (1) TW273027B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101276924B1 (en) * 2009-10-07 2013-06-19 세이코 엡슨 가부시키가이샤 Projection type projection apparatus having position detection function

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005235955A (en) * 2004-02-18 2005-09-02 Sharp Corp Optical element position inspection method, position inspection apparatus, die bonding method, and die bonding apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101276924B1 (en) * 2009-10-07 2013-06-19 세이코 엡슨 가부시키가이샤 Projection type projection apparatus having position detection function

Also Published As

Publication number Publication date
TW273027B (en) 1996-03-21
JPH06268261A (en) 1994-09-22

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Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19940309

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