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KR970077467A - Device transfer method of horizontal handler - Google Patents

Device transfer method of horizontal handler Download PDF

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Publication number
KR970077467A
KR970077467A KR1019960018043A KR19960018043A KR970077467A KR 970077467 A KR970077467 A KR 970077467A KR 1019960018043 A KR1019960018043 A KR 1019960018043A KR 19960018043 A KR19960018043 A KR 19960018043A KR 970077467 A KR970077467 A KR 970077467A
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South Korea
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carrier module
holding means
loaded
test tray
releasing
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KR1019960018043A
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Korean (ko)
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KR100194325B1 (en
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김두철
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정문술
미래산업 주식회사
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Publication of KR970077467A publication Critical patent/KR970077467A/en
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Abstract

본 발명은 수평식핸들러의 소자이송방법에 관한 것으로써, 좀더 구체적으로는 생산공정에서 제조완료된 소자의 전기적특성을 검사하기 위해 소자를 테스트트레이의 저면에 매다린상태로 로딩하여 공정간에 이송시킬 수 있도록 한 것이다.The present invention relates to a device transfer method of a horizontal handler, and more specifically, in order to examine the electrical characteristics of the device manufactured in the manufacturing process, the device can be loaded in the state of being loaded on the bottom of the test tray and transferred between processes. It would be.

이를 위해, 소자(38)가 로딩되는 테스트트레이(6)의 직하방으로 소자가 위치결정된 위치결정블록(35)을 이송시키는 단계와, 상기 위치결정블럭(35)이 테스트트레이(6)의 직하방으로 이송되는 옴에 따라 캐리어모듈(34)의 홀딩수단을 해제시키는 단계와, 상기 캐리어모퓰의 홀딩수단이 해제된 상태에서 소자(28)를 캐리어모듈(34)의 캐비티(36)내에 수용하고 홀딩수단을 복원시켜 소자를 홀딩하여 로딩하는 단계와, 상기 소자(28)의 리드(28a)가 하방으로 노출되도록 각 캐리어모듈(34)의 캐비티(36)내에 홀딩된 상태로 각 공정을 순차적으로 이송하면서 전기적인 특성을 테스트하는 단계와, 소자(28)가 캐리어모듈(34)에 매달려 홀딩된 상태에서 테스트완료되고 언로더부로 송출됨에 따라 홀딩수단을 해제하고 고객트레이내에 분류적재하는 단계를 순차적으로 진행하도록 된 것이다.For this purpose, the positioning block 35 in which the element is positioned is moved directly under the test tray 6 in which the element 38 is loaded, and the positioning block 35 is directly under the test tray 6. Releasing the holding means of the carrier module 34 as the ohmic is conveyed to the room, and receiving and holding the element 28 in the cavity 36 of the carrier module 34 while the holding means of the carrier morph is released. Restoring the means to hold and load the elements, and sequentially transfer each process in the state held in the cavity 36 of each carrier module 34 so that the lid 28a of the element 28 is exposed downward. While the electrical characteristics are tested, and the step of releasing the holding means and sorting them in the customer tray as the device 28 is tested and sent to the unloader while being held by the carrier module 34 is sequentially Progress So will the.

Description

수평식헨들러의 소자이송방법Device transfer method of horizontal handler

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 종래의 수평식핸들러에 적용되는 테스트트레이의 캐리어모듈을 나타낸 사시도 및 종단면도.Figure 3 is a perspective view and a longitudinal sectional view showing a carrier module of the test tray applied to a conventional horizontal handler.

Claims (1)

소자(28)가 로딩되는 테스트트레이(6)의 직하방으로 소자가 위치결정된 위치결정블럭(35)을 이송시키는 단계와, 상기 위치결정블럭(35)이 테스트트레이(6)의 직하방으로 이송되는 옴에 따라 캐리어모듈(34)의 홀딩수단을 해제시키는 단계와, 상기 캐리어모듈의 홀딩수단이 해제된 상태에서 소자(28)를 캐리어모듈(34)의 캐비티(36)내에 수용하고 홀딩수단을 복원시켜 소자를 홀딩하여 로딩하는 단계와, 상기 소자(28)의 리드(28a)가 하방으로 노출되도록 각 캐리어모듈(34)의 캐비티(36)내에 홀딩된 상태로 각 공정를 순차적으로 이송하면서 전기적인 특성을 테스트하는 단계와, 소자(28)가 캐리어모듈(34)에 매달려 홀딩된 상태에서 테스트완료되고 언로더부로 송출됨에 따라 홀딩수단을 해제하여 고객트레이내에 분류적재하는 단계를 순차적으로 진행함을 특징으로 하는 수평식핸들러의 소자이송방법.Transferring the positioning block 35 in which the element is positioned, directly under the test tray 6 in which the element 28 is loaded, and the positioning block 35 transferring directly under the test tray 6; Releasing the holding means of the carrier module 34 according to the ohm, and accommodating the element 28 in the cavity 36 of the carrier module 34 and restoring the holding means with the holding means of the carrier module released. And holding and loading the device, and sequentially transferring each process while being held in the cavity 36 of each carrier module 34 so that the lid 28a of the device 28 is exposed downward. The test step is performed, and the step of releasing the holding means and classifying and loading in the customer tray as the device 28 is completed in the state of being held on the carrier module 34 and sent to the unloader part is sequentially carried out. Ugh Element transferring method horizontal handler. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019960018043A 1996-05-27 1996-05-27 Device transfer method of horizontal handler Expired - Fee Related KR100194325B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019960018043A KR100194325B1 (en) 1996-05-27 1996-05-27 Device transfer method of horizontal handler

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Application Number Priority Date Filing Date Title
KR1019960018043A KR100194325B1 (en) 1996-05-27 1996-05-27 Device transfer method of horizontal handler

Publications (2)

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KR970077467A true KR970077467A (en) 1997-12-12
KR100194325B1 KR100194325B1 (en) 1999-06-15

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100442671B1 (en) * 2002-01-21 2004-08-02 미래산업 주식회사 Apparatus for clearing jammed semiconductor in vertical type handler
US6995414B2 (en) 2001-11-16 2006-02-07 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
KR100777619B1 (en) * 2007-06-16 2007-11-21 이한석 Test handler feeder

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100901523B1 (en) 2007-07-16 2009-06-08 (주)테크윙 Opener and buffer table for test handler

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6995414B2 (en) 2001-11-16 2006-02-07 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
US7115930B2 (en) 2001-11-16 2006-10-03 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
US8017467B2 (en) 2001-11-16 2011-09-13 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
US8202774B2 (en) 2001-11-16 2012-06-19 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
US8324674B2 (en) 2001-11-16 2012-12-04 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
US8647940B2 (en) 2001-11-16 2014-02-11 Kabushiki Kaisha Toshiba Semiconductor memory device including multi-layer gate structure
KR100442671B1 (en) * 2002-01-21 2004-08-02 미래산업 주식회사 Apparatus for clearing jammed semiconductor in vertical type handler
KR100777619B1 (en) * 2007-06-16 2007-11-21 이한석 Test handler feeder

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