TW202136355A - Underfill material, semiconductor package and method of manufacturing semiconductor package - Google Patents
Underfill material, semiconductor package and method of manufacturing semiconductor package Download PDFInfo
- Publication number
- TW202136355A TW202136355A TW110102030A TW110102030A TW202136355A TW 202136355 A TW202136355 A TW 202136355A TW 110102030 A TW110102030 A TW 110102030A TW 110102030 A TW110102030 A TW 110102030A TW 202136355 A TW202136355 A TW 202136355A
- Authority
- TW
- Taiwan
- Prior art keywords
- mass
- underfill material
- epoxy resin
- compound
- group
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/02—Polycondensates containing more than one epoxy group per molecule
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/50—Amines
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/54—Silicon-containing compounds
- C08K5/541—Silicon-containing compounds containing oxygen
- C08K5/5415—Silicon-containing compounds containing oxygen containing at least one Si—O bond
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Organic Chemistry (AREA)
- Polymers & Plastics (AREA)
- Medicinal Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Epoxy Resins (AREA)
Abstract
Description
本揭示是有關於一種底部填充材料、半導體封裝以及半導體封裝的製造方法。The present disclosure relates to an underfill material, a semiconductor package, and a manufacturing method of the semiconductor package.
於電晶體、積體電路(Integrated Circuit,IC)等半導體裝置中所使用的各種半導體元件的密封領域中,就生產性、製造成本等方面而言,利用樹脂的密封成為主流。作為密封用的樹脂,廣泛使用環氧樹脂。其原因在於:環氧樹脂於作業性、成形性、電氣特性、耐濕性、耐熱性、機械特性、與嵌入品的接著性等各種特性方面平衡性優異。In the field of sealing various semiconductor elements used in semiconductor devices such as transistors and integrated circuits (IC), sealing with resin has become the mainstream in terms of productivity and manufacturing cost. As the resin for sealing, epoxy resin is widely used. The reason is that the epoxy resin has an excellent balance of various properties such as workability, moldability, electrical properties, moisture resistance, heat resistance, mechanical properties, and adhesion with embedded products.
近年來,於半導體裝置的領域中,為了應對封裝的小型化及薄型化,基於將裸晶片直接封裝於配線基板上的所謂的裸晶片封裝所得的半導體裝置成為主流。作為基於裸晶片封裝所得的半導體裝置,例如可列舉板上晶片(Chip on Board,COB)、玻璃上晶片(Chip on Glass,COG)、輸送膠帶封裝(Tape Carrier Package,TCP)等。In recent years, in the field of semiconductor devices, in order to cope with the miniaturization and thinning of packages, semiconductor devices based on so-called bare chip packaging in which bare chips are directly packaged on wiring substrates have become mainstream. Examples of semiconductor devices obtained by bare chip packaging include, for example, chip on board (COB), chip on glass (COG), tape carrier package (TCP), and the like.
於將半導體元件凸塊連接於配線基板上而成的倒裝晶片型半導體裝置中,作為填充於凸塊連接的半導體元件與基板的間隙(gap)中的底部填充材料,使用液狀樹脂組成物。例如,於專利文獻1中記載有使用多官能環氧樹脂、以及包含酚系化合物及酸酐的硬化劑的底部填充材料。底部填充材料起到保護電子零件免受溫濕度及機械外力的影響的作用。In a flip-chip type semiconductor device formed by bump-connecting a semiconductor element to a wiring board, a liquid resin composition is used as an underfill material filled in the gap between the bump-connected semiconductor element and the substrate . For example, Patent Document 1 describes an underfill material using a polyfunctional epoxy resin and a hardener containing a phenolic compound and an acid anhydride. The underfill material protects electronic parts from temperature, humidity and mechanical external forces.
於倒裝晶片型半導體裝置中,先前,於半導體元件與基板的連接中主要使用焊料球。另一方面,隨著由半導體裝置的小型化及高積體化引起的端子數量的增加,採用前端封有焊料的銅柱來代替先前的焊料球的情況逐漸增加。因此,於為了將半導體裝置安裝於主板等上,而使用回焊爐於高溫下(例如260℃)進行連接這一步驟時,會產生底部填充材料自銅柱剝離的不良情況。In flip-chip type semiconductor devices, previously, solder balls were mainly used in the connection between the semiconductor element and the substrate. On the other hand, with the increase in the number of terminals caused by the miniaturization and high integration of semiconductor devices, the use of copper pillars with solder sealed at the tip instead of the previous solder balls has gradually increased. Therefore, when a reflow furnace is used to connect the semiconductor device at a high temperature (for example, 260° C.) in order to mount the semiconductor device on a motherboard or the like, there may be a problem that the underfill material is peeled from the copper pillar.
作為提高環氧樹脂組成物與銅的接著的方法,例如於專利文獻2~專利文獻6中記載有含有與銅的密接性優異的化合物的環氧樹脂組成物。 [現有技術文獻] [專利文獻]As a method of improving the adhesion between the epoxy resin composition and copper, for example, Patent Document 2 to Patent Document 6 describe an epoxy resin composition containing a compound having excellent adhesion to copper. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本專利特開2004-256646號公報 [專利文獻2]日本專利特開2007-2170號公報 [專利文獻3]日本專利特開2012-188629 [專利文獻4]日本專利特開2016-169300號公報 [專利文獻5]日本專利特開2016-34906號公報 [專利文獻6]日本專利特開2017-2289號公報[Patent Document 1] Japanese Patent Laid-Open No. 2004-256646 [Patent Document 2] Japanese Patent Laid-Open No. 2007-2170 [Patent Document 3] Japanese Patent Laid-Open No. 2012-188629 [Patent Document 4] Japanese Patent Laid-Open No. 2016-169300 [Patent Document 5] Japanese Patent Laid-Open No. 2016-34906 [Patent Document 6] Japanese Patent Laid-Open No. 2017-2289
[發明所欲解決之課題] 然而,於通常將與銅的密接性優異的化合物應用於底部填充材料中的情況下,大多情況是與環氧樹脂、硬化劑等樹脂成分反應,而使適用期、即室溫下的保管穩定性惡化。進而,迄今為止,底部填充材料於高溫下(例如260℃)的與銅的接著力尚未得到驗證。[The problem to be solved by the invention] However, when a compound with excellent adhesion to copper is generally applied to an underfill material, it often reacts with resin components such as epoxy resin and hardener to stabilize storage during the pot life, that is, at room temperature. Sexual deterioration. Furthermore, until now, the adhesion of the underfill material to copper at high temperatures (for example, 260°C) has not been verified.
鑑於所述情況,本揭示的課題在於提供一種適用期優異且製成硬化物時的相對於銅的高溫接著性優異的底部填充材料、以及包括該底部填充材料的硬化物的半導體封裝及其製造方法。 [解決課題之手段]In view of the foregoing circumstances, the subject of the present disclosure is to provide an underfill material with excellent pot life and excellent high-temperature adhesion to copper when made into a cured product, and a semiconductor package including the cured product of the underfill material and its manufacture method. [Means to solve the problem]
用以解決所述課題的手段包含以下實施態樣。 <1> 一種底部填充材料,含有:環氧樹脂、芳香族胺硬化劑、無機填充材料、以及具有三嗪環與烷氧基矽烷基的化合物。 <2> 如<1>所述的底部填充材料,其中,所述具有三嗪環與烷氧基矽烷基的化合物的熔點為200℃以下。 <3> 如<1>或<2>所述的底部填充材料,其中,所述具有三嗪環與烷氧基矽烷基的化合物更具有一級胺基。 <4> 一種底部填充材料,含有:環氧樹脂、芳香族胺硬化劑、無機填充材料、以及具有三嗪環及一級胺基且熔點為200℃以下的化合物。 <5> 一種半導體封裝,包括:基板、配置於所述基板上的半導體元件、以及密封所述半導體元件的如<1>至<4>中任一項所述的底部填充材料的硬化物。 <6> 一種半導體封裝的製造方法,包括:利用如<1>至<5>中任一項所述的底部填充材料填充基板與配置於所述基板上的半導體元件之間的空隙的步驟;以及將所述底部填充材料硬化的步驟。 [發明的效果]The means to solve the problem include the following implementation aspects. <1> An underfill material containing: epoxy resin, aromatic amine hardener, inorganic filler, and a compound having a triazine ring and an alkoxysilyl group. <2> The underfill material according to <1>, wherein the melting point of the compound having a triazine ring and an alkoxysilyl group is 200° C. or less. <3> The underfill material according to <1> or <2>, wherein the compound having a triazine ring and an alkoxysilyl group further has a primary amino group. <4> An underfill material containing: an epoxy resin, an aromatic amine hardener, an inorganic filler, and a compound having a triazine ring and a primary amine group and having a melting point of 200°C or less. <5> A semiconductor package including: a substrate, a semiconductor element arranged on the substrate, and a cured product of the underfill material according to any one of <1> to <4> that seals the semiconductor element. <6> A method for manufacturing a semiconductor package, including the step of filling a gap between a substrate and a semiconductor element arranged on the substrate with the underfill material described in any one of <1> to <5>; And the step of hardening the underfill material. [Effects of the invention]
根據本揭示,可提供一種適用期優異且製成硬化物時的相對於銅的高溫接著性優異的底部填充材料、以及包括該底部填充材料的硬化物的半導體封裝及其製造方法。According to the present disclosure, it is possible to provide an underfill material having excellent pot life and excellent high-temperature adhesion to copper when made into a cured product, and a semiconductor package including a cured product of the underfill material, and a manufacturing method thereof.
以下,對本揭示的實施形態進行詳細說明。但是,本揭示的實施形態並不限定於以下的實施形態。於以下的實施形態中,其構成要素(亦包括要素步驟等)除特別明示的情況外,並非必須。關於數值及其範圍亦同樣如此,並不限制本揭示的實施形態。Hereinafter, an embodiment of the present disclosure will be described in detail. However, the embodiment of this disclosure is not limited to the following embodiment. In the following embodiments, its constituent elements (including element steps, etc.) are not essential unless otherwise specified. The same is true for the numerical value and its range, and does not limit the embodiment of the present disclosure.
於本揭示中,「步驟」的用語中,除與其他步驟獨立的步驟以外,即便於無法與其他步驟明確區別的情況下,只要達成該步驟的目的,則亦包含該步驟。 於本揭示中,於使用「~」所表示的數值範圍中包含「~」的前後所記載的數值分別作為最小值及最大值。 於本揭示中階段性記載的數值範圍中,一個數值範圍內所記載的上限值或下限值亦可置換為其他階段性記載的數值範圍的上限值或下限值。另外,於本揭示中所記載的數值範圍中,該數值範圍的上限值或下限值亦可置換為實施例中所示的值。 於本揭示中,各成分亦可包含多種相當的物質。於在組成物中存在多種相當於各成分的物質的情況下,只要無特別說明,則各成分的含有率或含量是指組成物中所存在的該多種物質的合計含有率或含量。 於本揭示中,亦可包含多種相當於各成分的粒子。於在組成物中存在多種相當於各成分的粒子的情況下,只要無特別說明,則各成分的粒子徑是指與組成物中所存在的該多種粒子的混合物相關的值。In the present disclosure, in the term "step", in addition to a step independent of other steps, even if it cannot be clearly distinguished from other steps, as long as the purpose of the step is achieved, the step is also included. In the present disclosure, the numerical values described before and after "~" are included in the numerical range indicated by "~" as the minimum value and the maximum value, respectively. In the numerical ranges described stepwise in this disclosure, the upper limit or lower limit described in one numerical range may be replaced with the upper limit or lower limit of another numerical range described stepwise. In addition, in the numerical range described in the present disclosure, the upper limit or lower limit of the numerical range may be replaced with the values shown in the examples. In the present disclosure, each component may also include multiple equivalent substances. When there are multiple types of substances corresponding to each component in the composition, unless otherwise specified, the content or content of each component refers to the total content or content of the multiple types of substances present in the composition. In the present disclosure, a plurality of particles corresponding to each component may also be included. When there are multiple types of particles corresponding to each component in the composition, unless otherwise specified, the particle diameter of each component refers to a value related to a mixture of the multiple types of particles present in the composition.
<<底部填充材料>> 本揭示的第一實施形態的底部填充材料含有環氧樹脂、芳香族胺硬化劑、無機填充材料以及具有三嗪環與烷氧基矽烷基的化合物(以下,亦稱為「第一含三嗪環的化合物」)。 本揭示的第二實施形態的底部填充材料含有環氧樹脂、芳香族胺硬化劑、無機填充材料、以及具有三嗪環及一級胺基且熔點為200℃以下的化合物(以下,亦稱為「第二含三嗪環的化合物」)。 以下,有時將第一實施形態的底部填充材料及第二實施形態的底部填充材料統稱為「本揭示的底部填充材料」或簡稱為「底部填充材料」。<<Underfill material>> The underfill material of the first embodiment of the present disclosure contains an epoxy resin, an aromatic amine hardener, an inorganic filler, and a compound having a triazine ring and an alkoxysilyl group (hereinafter, also referred to as "the first triazine-containing Ring compound"). The underfill material of the second embodiment of the present disclosure contains an epoxy resin, an aromatic amine hardener, an inorganic filler, and a compound having a triazine ring and a primary amine group and having a melting point of 200°C or less (hereinafter, also referred to as " The second compound containing a triazine ring"). Hereinafter, the underfill material of the first embodiment and the underfill material of the second embodiment may be collectively referred to as "underfill material of the present disclosure" or simply referred to as "underfill material" in some cases.
本揭示的底部填充材料的適用期優異且製成硬化物時的相對於銅的高溫接著性優異。於本揭示中,所謂高溫接著性,是指260℃下的接著性。本揭示的底部填充材料的適用期及製成硬化物時的相對於銅的高溫接著性優異的詳細理由未必明確,但推測如下。 第一實施形態的底部填充材料含有具有三嗪環與烷氧基矽烷基的化合物(第一含三嗪環的化合物)。認為三嗪環中的氮原子有助於相對於銅的高溫接著性。另外,藉由烷氧基矽烷基的存在,第一含三嗪環的化合物與環氧樹脂的相容性優異,並良好地分散於底部填充材料中,因此認為遍及底部填充材料整體高溫接著性良好。進而,於使用第一含三嗪環的化合物並使用芳香族胺化合物作為硬化劑的情況下,由於第一含三嗪環的化合物及芳香族胺化合物相對於環氧基的反應性不太高,因此認為凝膠化的進展相對較緩慢,可獲得優異的適用期。 第二實施形態的底部填充材料含有具有三嗪環及一級胺基且熔點為200℃以下的化合物(第二含三嗪環的化合物)。認為三嗪環中的氮原子及一級胺基有助於與銅的高溫接著性。另外,由於該化合物的熔點為200℃以下,因此認為混練時(例如約25℃~80℃)、向元件與基板的間隙中填充時(例如約100℃~120℃)及底部填充材料的硬化時(例如約80℃~200℃)的於環氧樹脂中的分散性優異,遍及底部填充材料整體高溫接著性良好。進而,於使用第二含三嗪環的化合物並使用芳香族胺化合物作為硬化劑的情況下,由於第二含三嗪環的化合物及芳香族胺化合物相對於環氧樹脂的反應性不太高,因此認為凝膠化的進展相對較緩慢,可獲得優異的適用期。The underfill material of the present disclosure has excellent pot life and excellent high-temperature adhesion to copper when it is made into a hardened product. In this disclosure, the high-temperature adhesiveness refers to adhesiveness at 260°C. The detailed reason why the pot life of the underfill material of the present disclosure and the high-temperature adhesiveness with respect to copper when used as a hardened product are not necessarily clear, but it is estimated as follows. The underfill material of the first embodiment contains a compound having a triazine ring and an alkoxysilyl group (the first triazine ring-containing compound). It is considered that the nitrogen atom in the triazine ring contributes to the high-temperature adhesion to copper. In addition, due to the presence of the alkoxysilyl group, the first triazine ring-containing compound has excellent compatibility with epoxy resin and is well dispersed in the underfill material. Therefore, it is considered that it has high temperature adhesion throughout the entire underfill material. good. Furthermore, when the first triazine ring-containing compound is used and the aromatic amine compound is used as the hardener, the reactivity of the first triazine ring-containing compound and the aromatic amine compound with respect to the epoxy group is not too high. Therefore, it is believed that the progress of gelation is relatively slow, and an excellent pot life can be obtained. The underfill material of the second embodiment contains a compound having a triazine ring and a primary amine group and having a melting point of 200° C. or lower (a second triazine ring-containing compound). It is considered that the nitrogen atom and the primary amine group in the triazine ring contribute to the high-temperature adhesion to copper. In addition, since the melting point of this compound is 200°C or less, it is considered that it will harden the underfill material during kneading (for example, about 25°C to 80°C), when filling the gap between the device and the substrate (for example, about 100°C to 120°C), and When (for example, about 80°C to 200°C), the dispersibility in the epoxy resin is excellent, and the high-temperature adhesiveness is good throughout the entire underfill material. Furthermore, when the second triazine ring-containing compound is used and the aromatic amine compound is used as the hardener, the reactivity of the second triazine ring-containing compound and the aromatic amine compound with respect to the epoxy resin is not too high. Therefore, it is believed that the progress of gelation is relatively slow, and an excellent pot life can be obtained.
底部填充材料較佳為於25℃下為液體。於本揭示中,所謂「液體」,是指表現出流動性與黏性且表現出黏性的尺度即黏度為0.0001 Pa·s~100 Pa·s的物質。另外,所謂「液狀」,是指液體的狀態。The underfill material is preferably liquid at 25°C. In the present disclosure, the so-called "liquid" refers to a substance that exhibits fluidity and viscosity and exhibits viscosity, that is, a viscosity of 0.0001 Pa·s to 100 Pa·s. In addition, the term "liquid" refers to the state of liquid.
於本揭示中,黏度設為使EHD型旋轉黏度計(例如東京計器股份有限公司製造,威斯克(VISCONIC)EHD型(商品名))於25℃下以1分鐘、10轉每分鐘(10 rpm)旋轉時的測定值。所述測定值是針對保持為25±1℃的液體,使用裝有圓錐角度3°、圓錐半徑14 mm的圓錐轉子的EHD型旋轉黏度計而獲得。In the present disclosure, the viscosity is such that an EHD type rotary viscometer (for example, manufactured by Tokyo Keiki Co., Ltd., VISCONIC EHD type (trade name)) at 25°C for 1 minute, 10 revolutions per minute (10 rpm) ) Measured value during rotation. The measured value is obtained by using an EHD type rotary viscometer equipped with a cone rotor with a cone angle of 3° and a cone radius of 14 mm for a liquid kept at 25±1°C.
底部填充材料的黏度並無特別限制。其中,就高流動性的觀點而言,25℃下的底部填充材料的黏度較佳為0.1 Pa·s~100.0 Pa·s,更佳為0.1 Pa·s~50.0 Pa·s,進而佳為0.1 Pa·s~30.0 Pa·s。The viscosity of the underfill material is not particularly limited. Among them, from the viewpoint of high fluidity, the viscosity of the underfill material at 25°C is preferably 0.1 Pa·s to 100.0 Pa·s, more preferably 0.1 Pa·s to 50.0 Pa·s, and still more preferably 0.1 Pa·s~30.0 Pa·s.
另外,作為於100℃~120℃附近向數十μm~數百μm的狹窄間隙間填充底部填充材料時的填充容易度的指標,底部填充材料於110℃下的黏度較佳為0.20 Pa·s以下,更佳為0.15 Pa·s以下。再者,110℃下的底部填充材料的黏度可藉由流變儀(例如TA儀器(TA Instrument)製造,AR2000,圓錐半徑20 mm、剪切速度32.5/sec)來測定。In addition, as an index of the ease of filling when filling an underfill material in a narrow gap of tens to hundreds of μm at around 100°C to 120°C, the viscosity of the underfill material at 110°C is preferably 0.20 Pa·s Below, it is more preferably 0.15 Pa·s or less. Furthermore, the viscosity of the underfill material at 110°C can be measured by a rheometer (such as TA Instrument, AR2000, cone radius 20 mm, shear rate 32.5/sec).
底部填充材料的利用以下方法所測定的於25℃下放置24小時後的適用期較佳為100%以下,更佳為90%以下,進而佳為80%以下,特佳為60%以下。適用期的下限並無特別限制,數值越低越佳。 將底部填充材料於25℃下放置24小時,然後使用E型黏度計(例如東京計器股份有限公司製造,威斯克(VISCONIC)EHD型(商品名))(圓錐角度3°、轉速10轉每分鐘(rpm))來測定25℃下的黏度(放置後黏度)。其中,針對因高黏度而無法以轉速10轉每分鐘(rpm)進行測定的試樣,以2.5轉每分鐘(rpm)進行測定。適用期(%)根據下述式而作為放置24小時後的黏度增加率來算出。 適用期(%)={(放置後黏度-初始黏度)/初始黏度}×100The pot life of the underfill material measured by the following method after being placed at 25°C for 24 hours is preferably 100% or less, more preferably 90% or less, still more preferably 80% or less, particularly preferably 60% or less. The lower limit of the pot life is not particularly limited, and the lower the value, the better. Place the underfill material at 25°C for 24 hours, and then use an E-type viscometer (for example, manufactured by Tokyo Keiki Co., Ltd., VISCONIC EHD type (trade name)) (cone angle 3°, rotation speed 10 revolutions per minute) (Rpm)) to determine the viscosity at 25°C (viscosity after storage). Among them, for a sample that cannot be measured at 10 revolutions per minute (rpm) due to high viscosity, the measurement is performed at 2.5 revolutions per minute (rpm). The pot life (%) is calculated according to the following formula as the viscosity increase rate after being left for 24 hours. Pot life (%)={(Viscosity after placement-initial viscosity)/initial viscosity}×100
底部填充材料的利用以下方法所測定的相對於銅(Cu)的高溫接著力較佳為0.70 kgf以上,更佳為0.80 kgf以上,進而佳為0.90 kgf以上。高溫接著力越高越佳。The high-temperature adhesive strength of the underfill material to copper (Cu) measured by the following method is preferably 0.70 kgf or more, more preferably 0.80 kgf or more, and still more preferably 0.90 kgf or more. The higher the high temperature adhesive force, the better.
相對於銅的接著力例如可以如下方式進行測定。製作將底部填充材料以直徑3 mm、高度3 mm成形於銅板表面而成的試驗片,使用黏結強度試驗機(bond tester)(例如DAGE製造的DS100型),於頭速度50 μm/sec的條件下施加剪切應力,測定成形品自銅板剝離的強度。具體而言,可藉由實施例中記載的方法來測定。The adhesive force with respect to copper can be measured as follows, for example. Prepare a test piece formed by forming an underfill material with a diameter of 3 mm and a height of 3 mm on the surface of a copper plate. Use a bond tester (such as DS100 manufactured by DAGE) at a head speed of 50 μm/sec. Shear stress is applied downward, and the strength of the molded product peeling from the copper plate is measured. Specifically, it can be measured by the method described in the examples.
<環氧樹脂> 環氧樹脂的種類並無特別限制。作為環氧樹脂,較佳為1分子中具有兩個以上的環氧基的環氧樹脂。<Epoxy resin> The type of epoxy resin is not particularly limited. The epoxy resin is preferably an epoxy resin having two or more epoxy groups in one molecule.
環氧樹脂於常溫下可為固體亦可為液狀,亦可併用固體環氧樹脂與液狀環氧樹脂。就底部填充材料的低黏度化的觀點而言,較佳為使用常溫下為液狀的環氧樹脂。就成形時的流動性的觀點而言,相對於環氧樹脂總量,固體環氧樹脂的含有率較佳為設為20質量%以下。The epoxy resin may be solid or liquid at room temperature, and a solid epoxy resin and a liquid epoxy resin may be used in combination. From the viewpoint of lowering the viscosity of the underfill material, it is preferable to use an epoxy resin that is liquid at room temperature. From the viewpoint of fluidity during molding, the content of the solid epoxy resin is preferably 20% by mass or less with respect to the total epoxy resin.
環氧樹脂的種類並無特別限制。作為環氧樹脂,具體而言可列舉:苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂等酚醛清漆型環氧樹脂;雙酚A型環氧樹脂、雙酚F型環氧樹脂等雙酚型環氧樹脂;N,N-二縮水甘油苯胺、N,N-二縮水甘油甲苯胺、二胺基二苯基甲烷型縮水甘油胺、胺基苯酚型縮水甘油胺等縮水甘油胺型環氧樹脂;具有選自由伸苯基骨架及伸聯苯基骨架所組成的群組中的至少一者的苯酚芳烷基型環氧樹脂;具有選自由伸苯基骨架及伸聯苯基骨架所組成的群組中的至少一者的萘酚芳烷基型環氧樹脂等芳烷基型環氧樹脂;對苯二酚型環氧樹脂;聯苯型環氧樹脂;二苯乙烯型環氧樹脂;三苯酚甲烷型環氧樹脂;三苯酚丙烷型環氧樹脂;烷基改質三苯酚甲烷型環氧樹脂;含三嗪核的環氧樹脂;二環戊二烯改質苯酚型環氧樹脂;萘酚型環氧樹脂;萘型環氧樹脂;乙烯基環己烯二氧化物、二環戊二烯氧化物、脂環族二環氧-己二酸酯(alicyclic diepoxy-adipate)等脂環式環氧樹脂;烷二醇二縮水甘油醚、聚(烷二醇)二縮水甘油醚、烯二醇二縮水甘油醚等分子內具有兩個環氧基的二官能脂肪族環氧化合物等。環氧樹脂可單獨使用一種,亦可組合使用兩種以上。The type of epoxy resin is not particularly limited. Specific examples of epoxy resins include novolac type epoxy resins such as phenol novolac type epoxy resins and cresol novolac type epoxy resins; bisphenol A type epoxy resins and bisphenol F type epoxy resins. Bisphenol-type epoxy resin; N,N-diglycidyl aniline, N,N-diglycidyl toluidine, diaminodiphenylmethane type glycidylamine, aminophenol type glycidylamine and other glycidylamines Type epoxy resin; a phenol aralkyl type epoxy resin having at least one selected from the group consisting of a phenylene skeleton and a biphenylene skeleton; having a phenylene skeleton and a biphenylene skeleton Aralkyl type epoxy resins such as naphthol aralkyl type epoxy resins of at least one of the group consisting of skeletons; hydroquinone type epoxy resins; biphenyl type epoxy resins; stilbene type epoxy resins Epoxy resin; triphenol methane type epoxy resin; triphenol propane type epoxy resin; alkyl modified triphenol methane type epoxy resin; epoxy resin containing triazine nucleus; dicyclopentadiene modified phenol type Epoxy resin; naphthol type epoxy resin; naphthalene type epoxy resin; vinyl cyclohexene dioxide, dicyclopentadiene oxide, alicyclic diepoxy-adipate (alicyclic diepoxy-adipate) ) And other alicyclic epoxy resins; alkanediol diglycidyl ether, poly(alkylene glycol) diglycidyl ether, alkene glycol diglycidyl ether and other difunctional aliphatic rings with two epoxy groups in the molecule Oxygen compounds, etc. One type of epoxy resin may be used alone, or two or more types may be used in combination.
於使用兩種以上的環氧樹脂的情況下,可預先混合該兩種以上的環氧樹脂,然後與其他成分混合,亦可不預先混合地與其他成分混合。In the case of using two or more epoxy resins, the two or more epoxy resins may be mixed in advance and then mixed with other components, or may be mixed with other components without mixing in advance.
環氧樹脂的環氧當量並無特別限制。環氧樹脂的環氧當量可為60 g/eq以上,亦可為70 g/eq以上,還可為90 g/eq以上。環氧樹脂的環氧當量可為500 g/eq以下,亦可為300 g/eq以下,還可為200 g/eq以下。就成形性、耐回焊性、電氣可靠性等各種特性平衡的觀點而言,較佳為60 g/eq~500 g/eq,更佳為70 g/eq~300 g/eq,進而佳為90 g/eq~200 g/eq。環氧樹脂的環氧當量設為利用依據日本工業標準(Japanese Industrial Standards,JIS)K 7236:2009的方法進行測定所得的值。The epoxy equivalent of the epoxy resin is not particularly limited. The epoxy equivalent of the epoxy resin may be 60 g/eq or more, 70 g/eq or more, or 90 g/eq or more. The epoxy equivalent of the epoxy resin may be 500 g/eq or less, 300 g/eq or less, or 200 g/eq or less. From the viewpoint of the balance of various characteristics such as formability, reflow resistance, and electrical reliability, it is preferably 60 g/eq to 500 g/eq, more preferably 70 g/eq to 300 g/eq, and still more preferably 90 g/eq~200 g/eq. The epoxy equivalent of an epoxy resin shall be the value measured by the method based on Japanese Industrial Standards (Japanese Industrial Standards, JIS) K 7236:2009.
環氧樹脂相對於底部填充材料的總質量的含有率並無特別限定。環氧樹脂相對於底部填充材料的總質量的含有率可為0.5質量%以上,亦可為2質量%以上。環氧樹脂相對於底部填充材料的總質量的含有率可為50質量%以下,亦可為40質量%以下,還可為30質量%以下。就黏度、玻璃轉移溫度、耐熱性等觀點而言,相對於底部填充材料的總質量,環氧樹脂的含有率較佳為0.5質量%~50質量%,更佳為2質量%~40質量%,進而佳為5質量%~30質量%。The content rate of the epoxy resin with respect to the total mass of the underfill material is not particularly limited. The content rate of the epoxy resin with respect to the total mass of the underfill material may be 0.5% by mass or more, or 2% by mass or more. The content rate of the epoxy resin with respect to the total mass of the underfill material may be 50% by mass or less, 40% by mass or less, or 30% by mass or less. From the viewpoints of viscosity, glass transition temperature, heat resistance, etc., relative to the total mass of the underfill material, the epoxy resin content is preferably 0.5% by mass to 50% by mass, more preferably 2% by mass to 40% by mass , More preferably, it is 5 mass%-30 mass %.
於一態樣中,就注入性及製成硬化物時的熱膨脹係數的減低的觀點而言,底部填充材料較佳為含有選自由雙酚型環氧樹脂、縮水甘油胺型環氧樹脂及萘型環氧樹脂所組成的群組中的至少一種。另外,底部填充材料更佳為含有雙酚型環氧樹脂、縮水甘油胺型環氧樹脂及萘型環氧樹脂的任一種。In one aspect, from the viewpoints of injectability and reduction of the thermal expansion coefficient when the cured product is made, the underfill material preferably contains selected from the group consisting of bisphenol-type epoxy resin, glycidylamine-type epoxy resin and naphthalene. At least one of the group consisting of type epoxy resin. In addition, the underfill material more preferably contains any one of a bisphenol type epoxy resin, a glycidylamine type epoxy resin, and a naphthalene type epoxy resin.
雙酚型環氧樹脂的種類並無特別限制,可列舉:雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AD型環氧樹脂等。雙酚型環氧樹脂可單獨使用一種,亦可組合使用兩種以上。就以液狀使用底部填充材料的觀點而言,雙酚型環氧樹脂較佳為於常溫(25℃)下為液狀。就減低黏度的觀點而言,雙酚型環氧樹脂較佳為雙酚F型環氧樹脂。The type of bisphenol epoxy resin is not particularly limited, and examples thereof include bisphenol A epoxy resin, bisphenol F epoxy resin, and bisphenol AD epoxy resin. Bisphenol-type epoxy resin may be used individually by 1 type, and may be used in combination of 2 or more types. From the viewpoint of using the underfill material in a liquid form, the bisphenol-type epoxy resin is preferably liquid at normal temperature (25° C.). From the viewpoint of reducing the viscosity, the bisphenol-type epoxy resin is preferably a bisphenol-F-type epoxy resin.
於底部填充材料含有雙酚型環氧樹脂的情況下,雙酚型環氧樹脂的含量並無特別限制,可根據底部填充材料的所期望的特性來選擇。例如,相對於環氧樹脂的總質量,雙酚F型環氧樹脂的含有率可為20質量%以上,亦可為30質量%以上,還可為40質量%以上。相對於環氧樹脂的總質量,雙酚F型環氧樹脂的含有率可未滿90質量%,亦可為80質量%以下,還可為70質量%以下。相對於環氧樹脂的總質量,雙酚F型環氧樹脂的含有率可為20質量%以上且未滿90質量%,亦可為30質量%~80質量%,還可為40質量%~70質量%。When the underfill material contains a bisphenol type epoxy resin, the content of the bisphenol type epoxy resin is not particularly limited, and can be selected according to the desired characteristics of the underfill material. For example, relative to the total mass of the epoxy resin, the content of the bisphenol F type epoxy resin may be 20% by mass or more, 30% by mass or more, or 40% by mass or more. With respect to the total mass of the epoxy resin, the content of the bisphenol F type epoxy resin may be less than 90% by mass, 80% by mass or less, or 70% by mass or less. Relative to the total mass of the epoxy resin, the content of the bisphenol F epoxy resin may be 20% by mass or more and less than 90% by mass, or 30% to 80% by mass, or 40% to 40% by mass. 70% by mass.
縮水甘油胺型環氧樹脂的種類並無特別限制。縮水甘油胺型環氧樹脂較佳為二官能以上,就提高硬化後的耐熱性的觀點而言,較佳為三官能以上(即1分子中具有三個以上的環氧基)的縮水甘油胺型環氧樹脂。作為二官能的縮水甘油胺型環氧樹脂,可列舉N,N-二縮水甘油苯胺、N,N-二縮水甘油基-鄰甲苯胺等。作為三官能以上的縮水甘油胺型環氧樹脂,可列舉三縮水甘油基-對胺基苯酚、4,4'-亞甲基雙[N,N-雙(氧雜環丙基甲基)苯胺]等。縮水甘油胺型環氧樹脂可單獨使用一種,亦可組合使用兩種以上。其中,就常溫(25℃)下的黏度的觀點而言,較佳為三縮水甘油基-對胺基苯酚。The type of glycidylamine type epoxy resin is not particularly limited. The glycidylamine type epoxy resin is preferably bifunctional or higher, and from the viewpoint of improving the heat resistance after curing, it is preferably trifunctional or higher (that is, having three or more epoxy groups in a molecule) glycidylamine Type epoxy resin. Examples of the bifunctional glycidylamine epoxy resin include N,N-diglycidylaniline, N,N-diglycidyl-o-toluidine, and the like. Examples of trifunctional or higher glycidylamine epoxy resins include triglycidyl-p-aminophenol, 4,4'-methylenebis[N,N-bis(oxocyclopropylmethyl)aniline ]Wait. The glycidylamine type epoxy resin may be used alone or in combination of two or more. Among them, from the viewpoint of the viscosity at normal temperature (25° C.), triglycidyl-p-aminophenol is preferred.
就減低底部填充材料的黏度的觀點而言,縮水甘油胺型環氧樹脂的分子量較佳為300以下。From the viewpoint of reducing the viscosity of the underfill material, the molecular weight of the glycidylamine epoxy resin is preferably 300 or less.
於底部填充材料含有縮水甘油胺型環氧樹脂的情況下,縮水甘油胺型環氧樹脂的含量並無特別限制。例如,相對於環氧樹脂的總質量,縮水甘油胺型環氧樹脂的含有率可為10質量%以上,亦可為20質量%以上,還可為25質量%以上。相對於環氧樹脂的總質量,縮水甘油胺型環氧樹脂的含有率可為60質量%以下,亦可為50質量%以下,還可為40質量%以下。相對於環氧樹脂的總質量,縮水甘油胺型環氧樹脂的含有率可為10質量%~60質量%,亦可為20質量%~50質量%,還可為25質量%~40質量%。In the case where the underfill material contains a glycidylamine-type epoxy resin, the content of the glycidylamine-type epoxy resin is not particularly limited. For example, with respect to the total mass of the epoxy resin, the content rate of the glycidylamine type epoxy resin may be 10% by mass or more, 20% by mass or more, or 25% by mass or more. Relative to the total mass of the epoxy resin, the content of the glycidylamine-type epoxy resin may be 60% by mass or less, 50% by mass or less, or 40% by mass or less. Relative to the total mass of the epoxy resin, the content of the glycidylamine epoxy resin may be 10% by mass to 60% by mass, or 20% by mass to 50% by mass, or 25% by mass to 40% by mass. .
萘型環氧樹脂的種類並無特別限制。就減低熱膨脹係數的觀點而言,較佳為1,6-雙(縮水甘油氧基)萘。The type of naphthalene type epoxy resin is not particularly limited. From the viewpoint of reducing the coefficient of thermal expansion, 1,6-bis(glycidyloxy)naphthalene is preferred.
於底部填充材料含有萘型環氧樹脂的情況下,萘型環氧樹脂的含量並無特別限制。例如,相對於環氧樹脂的總質量,萘型環氧樹脂的含有率可為10質量%以上,亦可為15質量%以上。相對於環氧樹脂的總質量,萘型環氧樹脂的含有率可為30質量%以下,亦可為25質量%以下。相對於環氧樹脂的總質量,萘型環氧樹脂的含有率可為10質量%~30質量%,亦可為15質量%~25質量%。In the case where the underfill material contains a naphthalene-type epoxy resin, the content of the naphthalene-type epoxy resin is not particularly limited. For example, with respect to the total mass of the epoxy resin, the content rate of the naphthalene-type epoxy resin may be 10% by mass or more, or 15% by mass or more. The content rate of the naphthalene type epoxy resin may be 30% by mass or less, or 25% by mass or less with respect to the total mass of the epoxy resin. The content rate of the naphthalene type epoxy resin may be 10% by mass to 30% by mass, or 15% by mass to 25% by mass relative to the total mass of the epoxy resin.
<芳香族胺硬化劑> 芳香族胺硬化劑的種類並無特別限制,較佳為1分子中具有兩個以上的選自由一級胺基及二級胺基所組成的群組中的至少一種的芳香族胺化合物,更佳為1分子中具有兩個~四個選自由一級胺基及二級胺基所組成的群組中的至少一種的芳香族胺化合物,進而佳為1分子中具有兩個選自由一級胺基及二級胺基所組成的群組中的至少一種的芳香族胺化合物。芳香族胺硬化劑較佳為於25℃下為液體。<Aromatic amine hardener> The type of the aromatic amine hardener is not particularly limited, but it is preferably an aromatic amine compound having two or more of at least one selected from the group consisting of a primary amino group and a secondary amino group in one molecule, and more preferably It is an aromatic amine compound having two to four at least one selected from the group consisting of primary amine groups and secondary amine groups in one molecule, and more preferably two to four selected from primary amine groups and At least one aromatic amine compound in the group consisting of secondary amine groups. The aromatic amine hardener is preferably liquid at 25°C.
作為芳香族胺硬化劑,可列舉:3,5-二乙基甲苯-2,4-二胺、3,5-二乙基甲苯-2,6-二胺等二乙基甲苯二胺;1,3,5-三乙基-2,6-二胺基苯等三乙基二胺基苯;3,3'-二乙基-4,4'-二胺基二苯基甲烷、3,5,3',5'-四甲基-4,4'-二胺基二苯基甲烷等二胺基二苯基甲烷等。芳香族胺硬化劑可單獨使用一種,亦可組合使用兩種以上。Examples of aromatic amine hardeners include diethyltoluene diamine such as 3,5-diethyltoluene-2,4-diamine and 3,5-diethyltoluene-2,6-diamine; 1 ,3,5-Triethyl-2,6-diaminobenzene and other triethyldiaminobenzene; 3,3'-diethyl-4,4'-diaminodiphenylmethane, 3, Diaminodiphenylmethane such as 5,3',5'-tetramethyl-4,4'-diaminodiphenylmethane, etc. The aromatic amine hardener may be used alone or in combination of two or more.
其中,就保存穩定性的觀點而言,較佳為選自由二胺基二苯基甲烷及二乙基甲苯二胺所組成的群組中的至少一種,更佳為將該些加以併用。Among them, from the viewpoint of storage stability, it is preferably at least one selected from the group consisting of diaminodiphenylmethane and diethyltoluenediamine, and it is more preferable to use these in combination.
芳香族胺硬化劑的活性氫當量並無特別限制。芳香族胺硬化劑的活性氫當量可為20 g/eq以上,亦可為30 g/eq以上,還可為40 g/eq以上。芳香族胺硬化劑的活性氫當量可為200 g/eq以下,亦可為100 g/eq以下,還可為80 g/eq以下。就兼顧硬化物的熱應力減低與高玻璃轉移溫度(Tg)的觀點而言,較佳為20 g/eq~200 g/eq,更佳為30 g/eq~100 g/eq,進而佳為40 g/eq~80 g/eq。The active hydrogen equivalent of the aromatic amine hardener is not particularly limited. The active hydrogen equivalent of the aromatic amine hardener may be 20 g/eq or more, 30 g/eq or more, or 40 g/eq or more. The active hydrogen equivalent of the aromatic amine hardener may be 200 g/eq or less, 100 g/eq or less, or 80 g/eq or less. From the viewpoint of taking into account the reduction in thermal stress of the cured product and the high glass transition temperature (Tg), it is preferably 20 g/eq to 200 g/eq, more preferably 30 g/eq to 100 g/eq, and still more preferably 40 g/eq~80 g/eq.
底部填充材料除芳香族胺硬化劑以外,亦可含有其他硬化劑。作為芳香族胺硬化劑以外的硬化劑,可列舉:脂肪族胺硬化劑、酚硬化劑、酸酐硬化劑、咪唑化合物、咪唑啉化合物、聚硫醇硬化劑、聚胺基醯胺硬化劑、異氰酸酯硬化劑、嵌段異氰酸酯硬化劑等。In addition to the aromatic amine hardener, the underfill material may also contain other hardeners. Examples of hardeners other than aromatic amine hardeners include: aliphatic amine hardeners, phenol hardeners, acid anhydride hardeners, imidazole compounds, imidazoline compounds, polythiol hardeners, polyaminoamide hardeners, isocyanates Hardener, blocked isocyanate hardener, etc.
芳香族胺硬化劑相對於硬化劑的總質量的含有率並無特別限制,就使適用期及製成硬化物時的相對於銅的高溫接著性特別良好的觀點而言,較佳為50質量%以上,更佳為70質量%以上,進而佳為80質量%以上。其中,相對於硬化劑的總質量,選自由二胺基二苯基甲烷及二乙基甲苯二胺所組成的群組中的至少一種的合計含有率較佳為50質量%以上,更佳為70質量%以上,進而佳為80質量%以上。The content of the aromatic amine hardener with respect to the total mass of the hardener is not particularly limited, but from the viewpoint of making the pot life and the high-temperature adhesion to copper particularly good when the hardened product is made, it is preferably 50 mass % Or more, more preferably 70% by mass or more, and still more preferably 80% by mass or more. Among them, the total content of at least one selected from the group consisting of diaminodiphenylmethane and diethyltoluenediamine relative to the total mass of the hardener is preferably 50% by mass or more, more preferably 70% by mass or more, more preferably 80% by mass or more.
環氧樹脂與硬化劑(包含芳香族胺硬化劑)的當量比、即硬化劑中的官能基(於胺硬化劑的情況下為活性氫)數相對於環氧樹脂中的環氧基數的比(硬化劑中的官能基數/環氧樹脂中的環氧基數)並無特別限制。就將各自的未反應成分抑制得少的觀點而言,較佳為設定為0.5~2.0的範圍內,更佳為設定為0.6~1.3的範圍內。就成形性與耐回焊性的觀點而言,進而佳為設定為0.8~1.2的範圍內。The equivalent ratio of epoxy resin to hardener (including aromatic amine hardener), that is, the ratio of the number of functional groups (active hydrogen in the case of an amine hardener) in the hardener to the number of epoxy groups in the epoxy resin (The number of functional groups in the hardener/the number of epoxy groups in the epoxy resin) is not particularly limited. From the viewpoint of minimizing the respective unreacted components, it is preferably set to be in the range of 0.5 to 2.0, and more preferably set to be in the range of 0.6 to 1.3. From the viewpoint of formability and reflow resistance, it is more preferable to set it in the range of 0.8 to 1.2.
就使底部填充材料於常溫(25℃)下為液體的觀點而言,較佳為以使硬化劑整體於常溫下成為液體的方式選擇硬化劑。即,於僅使用一種硬化劑的情況下,較佳為所述硬化劑於常溫下為液體。於使用兩種以上的硬化劑的組合的情況下,兩種以上的硬化劑於常溫下可均為液狀,亦可使用一部分於常溫下為固體的硬化劑,且於將兩種以上的硬化劑混合時於常溫下成為液體的組合。於使用常溫下為固體的硬化劑作為硬化劑的情況下,就流動性的觀點而言,所述常溫下為固體的硬化劑的含有率較佳為相對於硬化劑的總質量而為20質量%以下。From the viewpoint of making the underfill material liquid at normal temperature (25° C.), it is preferable to select the hardener so that the entire hardener becomes liquid at normal temperature. That is, in the case of using only one kind of hardening agent, it is preferable that the hardening agent is liquid at normal temperature. In the case of using a combination of two or more hardeners, the two or more hardeners can be liquid at room temperature, or a part of the hardener that is solid at room temperature can also be used, and the two or more hardeners can be hardened When the agent is mixed, it becomes a liquid combination at room temperature. In the case of using a hardening agent that is solid at room temperature as the hardening agent, from the viewpoint of fluidity, the content of the hardening agent that is solid at room temperature is preferably 20 mass relative to the total mass of the hardening agent %the following.
<無機填充材料> 無機填充材料的種類並無特別限制,例如可列舉:二氧化矽、玻璃、氧化鋁、碳酸鈣、矽酸鋯、矽酸鈣、氮化矽、氮化鋁、氮化硼、氧化鈹、氧化鋯、鋯石、鎂橄欖石(fosterite)、凍石(steatite)、尖晶石、富鋁紅柱石、二氧化鈦、滑石、黏土、雲母等無機材料。亦可使用具有阻燃效果的無機填充材料。作為具有阻燃效果的無機填充材料,可列舉:氫氧化鋁、氫氧化鎂、鎂與鋅的複合氫氧化物等複合金屬氫氧化物、硼酸鋅等。無機填充材料可單獨使用一種,亦可組合使用兩種以上。其中,就減低熱膨脹係數的觀點而言,較佳為二氧化矽,就提高熱傳導性的觀點而言,較佳為氧化鋁。<Inorganic fillers> The type of inorganic filler is not particularly limited, for example, silicon dioxide, glass, alumina, calcium carbonate, zirconium silicate, calcium silicate, silicon nitride, aluminum nitride, boron nitride, beryllium oxide, oxide Zirconium, zircon, forsterite, steatite, spinel, mullite, titanium dioxide, talc, clay, mica and other inorganic materials. Inorganic fillers with flame retardant effects can also be used. Examples of inorganic fillers having a flame retardant effect include composite metal hydroxides such as aluminum hydroxide, magnesium hydroxide, composite hydroxides of magnesium and zinc, and zinc borate. One kind of inorganic filler may be used alone, or two or more kinds may be used in combination. Among them, from the viewpoint of reducing the thermal expansion coefficient, silica is preferred, and from the viewpoint of improving thermal conductivity, alumina is preferred.
無機填充材料的含量並無特別限制。相對於底部填充材料的總質量,無機填充材料的含有率可為30質量%以上,亦可為40質量%以上,還可為50質量%以上。相對於底部填充材料的總質量,無機填充材料的含有率可為90質量%以下,亦可為80質量%以下,還可為75質量%以下。就兼顧良好的流動性及由無機填充材料帶來的所期望的效果的觀點而言,相對於底部填充材料的總質量,無機填充材料的含有率較佳為30質量%~90質量%,更佳為40質量%~80質量%,進而佳為50質量%~75質量%。The content of the inorganic filler is not particularly limited. Relative to the total mass of the underfill material, the content of the inorganic filler may be 30% by mass or more, 40% by mass or more, or 50% by mass or more. Relative to the total mass of the underfill material, the content of the inorganic filler may be 90% by mass or less, 80% by mass or less, or 75% by mass or less. From the viewpoint of both good fluidity and the desired effect brought by the inorganic filler, the content of the inorganic filler is preferably 30% to 90% by mass relative to the total mass of the underfill material. It is preferably 40% by mass to 80% by mass, and more preferably 50% by mass to 75% by mass.
於無機填充材料為粒子狀的情況下,其平均粒子徑並無特別限制。例如,無機填充材料的體積平均粒子徑可為0.2 μm以上,亦可為0.5 μm以上。無機填充材料的體積平均粒子徑可為20 μm以下,亦可為15 μm以下。無機填充材料的體積平均粒子徑較佳為0.2 μm~20 μm,更佳為0.5 μm~15 μm。若體積平均粒子徑為0.2 μm以上,則有進一步抑制底部填充材料的黏度的上升的傾向。若體積平均粒子徑為20 μm以下,則有進一步提高對於狹小的縫隙的填充性的傾向。無機填充材料的體積平均粒子徑可作為藉由雷射散射繞射法粒度分佈測定裝置而獲得的體積基準的粒度分佈中自小粒徑側起的體積的累計成為50%時的粒子徑(D50)來測定。When the inorganic filler is particulate, the average particle diameter is not particularly limited. For example, the volume average particle diameter of the inorganic filler may be 0.2 μm or more, or 0.5 μm or more. The volume average particle diameter of the inorganic filler may be 20 μm or less, or 15 μm or less. The volume average particle diameter of the inorganic filler is preferably 0.2 μm to 20 μm, more preferably 0.5 μm to 15 μm. If the volume average particle diameter is 0.2 μm or more, there is a tendency to further suppress the increase in the viscosity of the underfill material. If the volume average particle diameter is 20 μm or less, there is a tendency to further improve the filling properties for narrow gaps. The volume average particle diameter of the inorganic filler can be used as the particle diameter (D50 ) To determine.
<含三嗪環的化合物> -第一含三嗪環的化合物- 第一含三嗪環的化合物具有三嗪環與烷氧基矽烷基。 三嗪環中的氮的位置並無特別限制。即,作為骨架的三嗪可為1,2,3-三嗪、1,2,4-三嗪及1,3,5-三嗪的任一種。<Compounds containing triazine ring> -The first compound containing a triazine ring- The first triazine ring-containing compound has a triazine ring and an alkoxysilyl group. The position of the nitrogen in the triazine ring is not particularly limited. That is, the triazine as a skeleton may be any of 1,2,3-triazine, 1,2,4-triazine, and 1,3,5-triazine.
第一含三嗪環的化合物具有如下結構:三嗪(C3 H3 N3 )上的三個碳原子上所鍵結的氫原子的至少一個經具有烷氧基矽烷基的一價基取代的結構。該一價基的取代位置可為三個碳原子中的任一者。該一價基的取代個數可為一個~三個的任一者,較佳為一個或兩個,更佳為一個。The first triazine ring-containing compound has the following structure: at least one of the hydrogen atoms bonded to the three carbon atoms on the triazine (C 3 H 3 N 3) is substituted with a monovalent group having an alkoxysilyl group Structure. The substitution position of the monovalent group may be any of three carbon atoms. The number of substitutions of the monovalent group may be any one to three, preferably one or two, and more preferably one.
於第一含三嗪環的化合物中的具有烷氧基矽烷基的一價基的取代個數為1或2的情況下,於三嗪環上的、該具有烷氧基矽烷基的一價基未進行鍵結的碳原子上可鍵結該具有烷氧基矽烷基的一價基以外的取代基,亦可不鍵結取代基。When the number of substitutions of the monovalent group having an alkoxysilyl group in the first triazine ring-containing compound is 1 or 2, the monovalent group having an alkoxysilyl group on the triazine ring A substituent other than the monovalent group having an alkoxysilyl group may be bonded to the carbon atom to which the group is not bonded, or the substituent may not be bonded.
具有烷氧基矽烷基的一價基可為烷氧基矽烷基自身,亦可為連結基與烷氧基矽烷基的矽原子鍵結而成的一價基。於具有烷氧基矽烷基的一價基是連結基與烷氧基矽烷基的矽原子鍵結而成的一價基的情況下,連結基例如可為烴基,亦可為具有氮原子、氧原子等雜原子的烴基。連結基的長度、即烷氧基矽烷基的矽原子與三嗪環上的碳原子之間所存在的原子鏈上的原子(不含氫原子、分支鏈或取代基)的數量例如可為2~13,亦可為3~11。The monovalent group having an alkoxysilyl group may be the alkoxysilyl group itself, or a monovalent group formed by bonding a linking group and a silicon atom of the alkoxysilyl group. In the case where the monovalent group having an alkoxysilyl group is a monovalent group formed by bonding a linking group to a silicon atom of the alkoxysilyl group, the linking group may be, for example, a hydrocarbon group, or may have a nitrogen atom, oxygen Hydrocarbyl of heteroatoms such as atoms. The length of the linking group, that is, the number of atoms in the chain of atoms (without hydrogen atoms, branched chains or substituents) existing between the silicon atoms of the alkoxysilyl group and the carbon atoms on the triazine ring can be, for example, 2. ~13, can also be 3~11.
烷氧基矽烷基具有-Si(OR)3 所表示的結構。此處,R分別獨立地表示氫原子或烷基,三個R中的至少一個為烷基。三個R中,較佳為兩個以上為烷基,更佳為三個均為烷基。作為R所表示的烷基,分別獨立地較佳為碳數1~4的烷基,更佳為乙基或甲基,進而佳為乙基。The alkoxysilyl group has a structure represented by -Si(OR) 3. Here, R each independently represents a hydrogen atom or an alkyl group, and at least one of the three Rs is an alkyl group. Among the three Rs, preferably two or more are alkyl groups, and more preferably three are all alkyl groups. As the alkyl group represented by R, each independently is preferably an alkyl group having 1 to 4 carbon atoms, more preferably an ethyl group or a methyl group, and still more preferably an ethyl group.
可與三嗪環鍵結的、具有烷氧基矽烷基的一價基以外的取代基並無特別限制,可列舉:鹵素原子、胺基、羥基、芳基胺基、烷基胺基等。其中,較佳為胺基,更佳為一級胺基或二級胺基,進而佳為一級胺基。具有烷氧基矽烷基的一價基以外的取代基的個數並無特別限制,較佳為具有烷氧基矽烷基的一價基的數量與具有烷氧基矽烷基的一價基以外的取代基的數量合計為三。The substituents other than the monovalent group having an alkoxysilyl group that can be bonded to the triazine ring are not particularly limited, and examples thereof include a halogen atom, an amino group, a hydroxyl group, an arylamino group, and an alkylamino group. Among them, an amine group is preferred, a primary amine group or a secondary amine group is more preferred, and a primary amine group is still more preferred. The number of substituents other than the monovalent group having an alkoxysilyl group is not particularly limited, but preferably the number of the monovalent group having an alkoxysilyl group and the number of the monovalent group having an alkoxysilyl group other than the monovalent group The total number of substituents is three.
作為第一含三嗪環的化合物的較佳例,可列舉下述通式(I)所表示的化合物。Preferred examples of the first triazine ring-containing compound include compounds represented by the following general formula (I).
[化1] [化1]
於式(I)中,X表示具有烷氧基矽烷基的一價基。X中的具有烷氧基矽烷基的一價基的詳細情況與所述態樣相同。In the formula (I), X represents a monovalent group having an alkoxysilyl group. The details of the monovalent group having an alkoxysilyl group in X are the same as the above-mentioned aspect.
含三嗪環的化合物的分子量並無特別限制,例如可為100~800,亦可為200~700,還可為300~600。The molecular weight of the triazine ring-containing compound is not particularly limited, and may be, for example, 100-800, 200-700, or 300-600.
第一含三嗪環的化合物的熔點並無特別限制,就高溫接著性及適用期的觀點而言,較佳為200℃以下,更佳為175℃以下,進而佳為150℃以下。就操作性及分散性的觀點而言,第一含三嗪環的化合物的熔點較佳為0℃以上,更佳為10℃以上,進而佳為25℃以上。就以上的觀點而言,第一含三嗪環的化合物的熔點較佳為0℃~200℃,更佳為10℃~175℃,進而佳為25℃~150℃。The melting point of the first triazine ring-containing compound is not particularly limited. From the viewpoint of high-temperature adhesion and pot life, it is preferably 200°C or lower, more preferably 175°C or lower, and still more preferably 150°C or lower. From the viewpoint of handleability and dispersibility, the melting point of the first triazine ring-containing compound is preferably 0°C or higher, more preferably 10°C or higher, and still more preferably 25°C or higher. From the above viewpoints, the melting point of the first triazine ring-containing compound is preferably 0°C to 200°C, more preferably 10°C to 175°C, and still more preferably 25°C to 150°C.
就良好地兼顧相對於銅的高溫接著力與優異的適用期的觀點而言,第一含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為0.05質量%以上,更佳為0.10質量%以上,進而佳為0.20質量%以上。 另外,就抑制底部填充材料自身的黏度上升的觀點而言,第一含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為3.0質量%以下,更佳為2.0質量%以下,進而佳為1.5質量%以下。 就以上的觀點而言,第一含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為0.05質量%~3.0質量%,更佳為0.10質量%~2.0質量%,進而佳為0.20質量%~1.5質量%。From the viewpoint of a good balance of high-temperature adhesion to copper and excellent pot life, the content of the first triazine ring-containing compound relative to the total mass of the underfill material is preferably 0.05% by mass or more, and more preferably It is 0.10% by mass or more, more preferably 0.20% by mass or more. In addition, from the viewpoint of suppressing the increase in the viscosity of the underfill material itself, the content of the first triazine ring-containing compound relative to the total mass of the underfill material is preferably 3.0% by mass or less, more preferably 2.0% by mass or less , And more preferably 1.5% by mass or less. From the above viewpoints, the content of the first triazine ring-containing compound relative to the total mass of the underfill material is preferably 0.05% by mass to 3.0% by mass, more preferably 0.10% by mass to 2.0% by mass, and more preferably It is 0.20% by mass to 1.5% by mass.
-第二含三嗪環的化合物- 第二含三嗪環的化合物具有三嗪環及一級胺基且熔點為200℃以下。-Second compound containing triazine ring- The second triazine ring-containing compound has a triazine ring and a primary amino group and has a melting point of 200° C. or less.
就高溫接著性及適用期的觀點而言,第二含三嗪環的化合物的熔點較佳為175℃以下,更佳為150℃以下。就操作性及分散性的觀點而言,第二含三嗪環的化合物的熔點較佳為0℃以上,更佳為10℃以上,進而佳為25℃以上。就以上的觀點而言,第二含三嗪環的化合物的熔點較佳為0℃~200℃,更佳為10℃~175℃,進而佳為25℃~150℃。 含三嗪環的化合物的熔點可藉由熔點測定器等來測定。From the viewpoint of high-temperature adhesion and pot life, the melting point of the second triazine ring-containing compound is preferably 175°C or lower, more preferably 150°C or lower. From the viewpoint of handleability and dispersibility, the melting point of the second triazine ring-containing compound is preferably 0°C or higher, more preferably 10°C or higher, and still more preferably 25°C or higher. From the above viewpoints, the melting point of the second triazine ring-containing compound is preferably 0°C to 200°C, more preferably 10°C to 175°C, and still more preferably 25°C to 150°C. The melting point of the triazine ring-containing compound can be measured by a melting point analyzer or the like.
三嗪環中的氮的位置並無特別限制。即,作為骨架的三嗪可為1,2,3-三嗪、1,2,4-三嗪及1,3,5-三嗪的任一種。The position of the nitrogen in the triazine ring is not particularly limited. That is, the triazine as a skeleton may be any of 1,2,3-triazine, 1,2,4-triazine, and 1,3,5-triazine.
第二含三嗪環的化合物具有如下結構:三嗪(C3 H3 N3 )上的三個碳原子上所鍵結的氫原子的至少一個經具有一級胺基的一價基取代的結構。該一價基的取代位置可為三個碳原子中的任一者。該一價基的取代個數可為一個~三個的任一者。The second triazine ring-containing compound has the following structure: a structure in which at least one of the hydrogen atoms bonded to three carbon atoms on the triazine (C 3 H 3 N 3) is substituted with a monovalent group having a primary amino group . The substitution position of the monovalent group may be any of three carbon atoms. The number of substitutions of the monovalent group may be any one to three.
於第二含三嗪環的化合物中的具有一級胺基的一價基的取代個數為1或2的情況下,於三嗪環上的、該具有一級胺基的一價基未進行鍵結的碳原子上可鍵結該具有一級胺基的一價基以外的取代基,亦可不鍵結取代基。When the number of substitutions of the monovalent group having a primary amine group in the second triazine ring-containing compound is 1 or 2, the monovalent group having a primary amine group on the triazine ring is not bonded A substituent other than the monovalent group having the primary amino group may be bonded to the bonded carbon atom, or the substituent may not be bonded.
具有一級胺基的一價基可為一級胺基自身,亦可為連結基與一級胺基的氮原子鍵結而成的一價基。於具有一級胺基的一價基是連結基與一級胺基的氮原子鍵結而成的一價基的情況下,連結基例如可為烴基,亦可為具有氮原子、氧原子等雜原子的烴基。連結基的長度、即一級胺基的氮原子與三嗪環上的碳原子之間所存在的原子鏈上的原子(不含氫原子、分支鏈或取代基)的數量例如可為1~10,亦可為1~5。具有一級胺基的一價基較佳為一級胺基自身。The monovalent group having a primary amine group may be the primary amine group itself, or may be a monovalent group formed by bonding a linking group to the nitrogen atom of the primary amine group. In the case where the monovalent group having a primary amine group is a monovalent group formed by bonding a linking group to the nitrogen atom of the primary amine group, the linking group may be, for example, a hydrocarbon group, or may have a heteroatom such as a nitrogen atom and an oxygen atom的hydrocarbyl. The length of the linking group, that is, the number of atoms in the chain of atoms (excluding hydrogen atoms, branch chains or substituents) existing between the nitrogen atom of the primary amino group and the carbon atom on the triazine ring can be, for example, 1-10 , Can also be 1~5. The monovalent group having a primary amine group is preferably the primary amine group itself.
可與三嗪環鍵結的、具有一級胺基的一價基以外的取代基並無特別限制,可列舉鹵素原子、胺基、羥基、芳基胺基、烷基胺基、具有烷氧基矽烷基的一價基等,就適用期的觀點而言,較佳為具有烷氧基矽烷基的一價基。具有烷氧基矽烷基的一價基的詳細情況與於第一含三嗪環的化合物中所說明的具有烷氧基矽烷基的一價基相同。具有一級胺基的一價基以外的取代基的個數並無特別限制,較佳為具有一級胺基的一價基的數量與具有一級胺基的一價基以外的取代基的數量合計為三。The substituents other than the monovalent group having a primary amino group that can be bonded to the triazine ring are not particularly limited, and examples include halogen atoms, amino groups, hydroxyl groups, arylamino groups, alkylamino groups, and alkoxy groups. From the viewpoint of pot life, the monovalent group of the silyl group and the like are preferably a monovalent group having an alkoxysilyl group. The details of the monovalent group having an alkoxysilyl group are the same as the monovalent group having an alkoxysilyl group described in the first triazine ring-containing compound. The number of substituents other than the monovalent group having a primary amino group is not particularly limited, and it is preferable that the sum of the number of the monovalent group having a primary amino group and the number of substituents other than the monovalent group having a primary amino group is three.
作為第二含三嗪環的化合物的較佳例,可列舉所述通式(I)所表示的化合物。As a preferable example of the second triazine ring-containing compound, the compound represented by the general formula (I) can be cited.
就良好地兼顧相對於銅的高溫接著力與優異的適用期的觀點而言,第二含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為0.05質量%以上,更佳為0.10質量%以上,進而佳為0.20質量%以上。 另外,就抑制底部填充材料自身的黏度上升的觀點而言,第二含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為3.0質量%以下,更佳為2.0質量%以下,進而佳為1.5質量%以下。 就以上的觀點而言,第二含三嗪環的化合物相對於底部填充材料的總質量的含有率較佳為0.05質量%~3.0質量%,更佳為0.10質量%~2.0質量%,進而佳為0.20質量%~1.5質量%。From the viewpoint of a good balance of high-temperature adhesion to copper and excellent pot life, the content of the second triazine ring-containing compound relative to the total mass of the underfill material is preferably 0.05% by mass or more, more preferably It is 0.10% by mass or more, more preferably 0.20% by mass or more. In addition, from the viewpoint of suppressing the increase in the viscosity of the underfill material itself, the content of the second triazine ring-containing compound relative to the total mass of the underfill material is preferably 3.0% by mass or less, more preferably 2.0% by mass or less , And more preferably 1.5% by mass or less. From the above point of view, the content of the second triazine ring-containing compound relative to the total mass of the underfill material is preferably 0.05% by mass to 3.0% by mass, more preferably 0.10% by mass to 2.0% by mass, and more preferably It is 0.20% by mass to 1.5% by mass.
<各種添加劑> 底部填充材料除所述成分以外,亦可含有硬化促進劑、應力緩和劑、偶合劑、離子捕捉劑、滲出抑制劑、著色劑等各種添加劑。底部填充材料除以下例示的添加劑以外,亦可視需要而含有該技術領域中周知的各種添加劑。<Various additives> In addition to the above-mentioned components, the underfill material may also contain various additives such as a hardening accelerator, a stress reliever, a coupling agent, an ion scavenger, an exudation inhibitor, and a coloring agent. In addition to the additives exemplified below, the underfill material may also contain various additives known in the technical field as necessary.
(硬化促進劑) 底部填充材料亦可含有硬化促進劑。硬化促進劑的種類並無特別限制,可根據環氧樹脂及硬化劑的種類、底部填充材料的所期望的特性等來選擇。具體而言可列舉:1,8-二氮雜-雙環[5.4.0]十一烯-7、1,5-二氮雜-雙環[4.3.0]壬烯、5,6-二丁基胺基-1,8-二氮雜-雙環[5.4.0]十一烯-7等環脒化合物;對環脒化合物加成馬來酸酐、1,4-苯醌、2,5-甲苯醌、1,4-萘醌、2,3-二甲基苯醌、2,6-二甲基苯醌、2,3-二甲氧基-5-甲基-1,4-苯醌、2,3-二甲氧基-1,4-苯醌、苯基-1,4-苯醌等醌化合物、重氮苯基甲烷、酚樹脂等具有π鍵的化合物而成的具有分子內極化的化合物;苄基二甲基胺、三乙醇胺、二甲基胺基乙醇、三(二甲基胺基甲基)苯酚等三級胺化合物;三級胺化合物的衍生物;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-乙基-4-甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2-苯基-4,5-二羥基甲基咪唑等咪唑化合物;咪唑化合物的衍生物;三丁基膦、甲基二苯基膦、三苯基膦、三(4-甲基苯基)膦、二苯基膦、苯基膦等有機膦化合物;對有機膦化合物加成馬來酸酐、所述醌化合物、重氮苯基甲烷、酚樹脂等具有π鍵的化合物而成的具有分子內極化的磷化合物;四苯基鏻四苯基硼酸鹽、三苯基鏻四苯基硼酸鹽、2-乙基-4-甲基咪唑四苯基硼酸鹽、N-甲基嗎啉四苯基硼酸鹽等四苯基硼酸鹽;四苯基硼酸鹽的衍生物;三苯基膦-三苯基硼烷錯合物、嗎啉-三苯基硼烷錯合物等四苯基硼烷錯合物等。硬化促進劑可單獨使用一種,亦可組合使用兩種以上。(Hardening accelerator) The underfill material may also contain a hardening accelerator. The kind of hardening accelerator is not particularly limited, and it can be selected according to the kind of epoxy resin and hardening agent, the desired characteristics of the underfill material, and the like. Specific examples include: 1,8-diaza-bicyclo[5.4.0]undecene-7, 1,5-diaza-bicyclo[4.3.0]nonene, 5,6-dibutyl Amino-1,8-diaza-bicyclo[5.4.0]undecene-7 and other cyclic amidine compounds; addition of p-cyclic amidine compounds to maleic anhydride, 1,4-benzoquinone, 2,5-toluquinone , 1,4-Naphthoquinone, 2,3-Dimethylbenzoquinone, 2,6-Dimethylbenzoquinone, 2,3-Dimethoxy-5-methyl-1,4-benzoquinone, 2 ,3-Dimethoxy-1,4-benzoquinone, phenyl-1,4-benzoquinone and other quinone compounds, diazophenylmethane, phenol resins and other compounds with π bonds that have intramolecular polarization Compounds; tertiary amine compounds such as benzyldimethylamine, triethanolamine, dimethylaminoethanol, tris(dimethylaminomethyl)phenol; derivatives of tertiary amine compounds; 2-methylimidazole , 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-ethyl-4-methylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2-phenyl -4,5-Dihydroxymethylimidazole and other imidazole compounds; derivatives of imidazole compounds; tributylphosphine, methyldiphenylphosphine, triphenylphosphine, tris(4-methylphenyl)phosphine, diphenyl Organic phosphine compounds such as phosphine and phenylphosphine; phosphorus with intramolecular polarization formed by adding maleic anhydride, the quinone compound, diazophenylmethane, phenol resin and other compounds with π bond to the organic phosphine compound Compound; Tetraphenylphosphonium tetraphenylborate, triphenylphosphonium tetraphenylborate, 2-ethyl-4-methylimidazole tetraphenylborate, N-methylmorpholine tetraphenylborate, etc. Tetraphenylborate; derivatives of tetraphenylborate; tetraphenylborane complexes such as triphenylphosphine-triphenylborane complexes, morpholine-triphenylborane complexes, etc. . One type of hardening accelerator may be used alone, or two or more types may be used in combination.
於底部填充材料含有硬化促進劑的情況下,硬化促進劑的含量並無特別限制,相對於環氧樹脂100質量份,較佳為0.1質量份~15質量份,更佳為0.5質量份~10質量份,進而佳為0.8質量份~5質量份。In the case where the underfill material contains a hardening accelerator, the content of the hardening accelerator is not particularly limited. With respect to 100 parts by mass of the epoxy resin, it is preferably 0.1 parts by mass to 15 parts by mass, more preferably 0.5 parts by mass to 10 parts by mass. Parts by mass, more preferably 0.8 parts by mass to 5 parts by mass.
(應力緩和劑) 底部填充材料亦可含有應力緩和劑。應力緩和劑的種類並無特別限制,可列舉:熱塑性彈性體、天然橡膠(Natural Rubber,NR)、丙烯腈-丁二烯橡膠(Acrylonitrile Butadiene Rubber,NBR)、丙烯酸橡膠、胺基甲酸酯橡膠、矽酮橡膠等的粒子等。應力緩和劑可單獨使用一種,亦可組合使用兩種以上。(Stress reliever) The underfill material may also contain a stress reliever. The type of stress reliever is not particularly limited. Examples include: Thermoplastic elastomer, Natural Rubber (NR), Acrylonitrile Butadiene Rubber (NBR), Acrylic rubber, Urethane rubber , Silicone rubber and other particles. One kind of stress reliever may be used alone, or two or more kinds may be used in combination.
於底部填充材料含有應力緩和劑的情況下,應力緩和劑的含量並無特別限制,相對於環氧樹脂100質量份,較佳為0.1質量份~30質量份,更佳為1質量份~15質量份。In the case where the underfill material contains a stress reliever, the content of the stress reliever is not particularly limited. It is preferably 0.1 to 30 parts by mass, more preferably 1 to 15 parts by mass relative to 100 parts by mass of the epoxy resin. Mass parts.
(偶合劑) 底部填充材料亦可含有偶合劑。偶合劑的種類並無特別限制,可列舉:環氧基矽烷、巰基矽烷、胺基矽烷、烷基矽烷、脲基矽烷、乙烯基矽烷等矽烷化合物;鈦化合物;鋁螯合物化合物;鋁/鋯化合物等。偶合劑可單獨使用一種,亦可組合使用兩種以上。(Coupling agent) The underfill material may also contain a coupling agent. The type of coupling agent is not particularly limited, and examples include: epoxy silane, mercapto silane, amino silane, alkyl silane, ureido silane, vinyl silane and other silane compounds; titanium compounds; aluminum chelate compounds; aluminum/ Zirconium compounds, etc. One type of coupling agent may be used alone, or two or more types may be used in combination.
於底部填充材料含有偶合劑的情況下,偶合劑的含量並無特別限制,相對於環氧樹脂100質量份,較佳為0.01質量份~5質量份,更佳為0.02質量份~2.5質量份。In the case where the underfill material contains a coupling agent, the content of the coupling agent is not particularly limited. Relative to 100 parts by mass of the epoxy resin, it is preferably 0.01 parts by mass to 5 parts by mass, more preferably 0.02 parts by mass to 2.5 parts by mass .
(離子捕捉劑) 底部填充材料亦可含有離子捕捉劑。離子捕捉劑的種類並無特別限制,例如可列舉下述通式(VI-1)或下述通式(VI-2)所表示的化合物。(Ion trap) The underfill material may also contain an ion trap. The type of ion trapping agent is not particularly limited, and examples thereof include compounds represented by the following general formula (VI-1) or the following general formula (VI-2).
Mg1-a Ala (OH)2 (CO3 )a/2 ·uH2 O (VI-1) (通式(VI-1)中,a為0<a≦0.5,u為正數) BiOb (OH)c (NO3 )d (VI-2) (通式(VI-2)中,b為0.9≦b≦1.1,c為0.6≦c≦0.8,d為0.2≦d≦0.4)Mg 1-a Al a (OH) 2 (CO 3 ) a/2 ·uH 2 O (VI-1) (In the general formula (VI-1), a is 0<a≦0.5, u is a positive number) BiO b (OH) c (NO 3 ) d (VI-2) (In the general formula (VI-2), b is 0.9≦b≦1.1, c is 0.6≦c≦0.8, and d is 0.2≦d≦0.4)
離子捕捉劑可以市售品的形式獲取。作為通式(VI-1)所表示的化合物,例如,「DHT-4A」(協和化學工業股份有限公司製造,商品名)可以市售品的形式獲取。另外,作為通式(VI-2)所表示的化合物,例如,「IXE500」(東亞合成股份有限公司製造,商品名)可以市售品的形式獲取。The ion scavenger can be obtained in the form of a commercially available product. As the compound represented by the general formula (VI-1), for example, "DHT-4A" (manufactured by Kyowa Chemical Industry Co., Ltd., trade name) can be obtained as a commercially available product. In addition, as the compound represented by the general formula (VI-2), for example, "IXE500" (manufactured by Toagosei Co., Ltd., trade name) can be obtained as a commercially available product.
另外,作為所述以外的離子捕捉劑,可列舉選自鎂、鋁、鈦、鋯、銻等中的元素的含水氧化物等。離子捕捉劑可單獨使用一種,亦可組合使用兩種以上。In addition, examples of ion scavengers other than those described above include hydrated oxides of elements selected from magnesium, aluminum, titanium, zirconium, antimony, and the like. One kind of ion scavenger may be used alone, or two or more kinds may be used in combination.
於底部填充材料含有離子捕捉劑的情況下,離子捕捉劑的含量並無特別限制,就實現充分的耐濕可靠性的觀點而言,相對於環氧樹脂100質量份,較佳為1質量份以上,更佳為2質量份以上。就充分發揮其他成分的效果的觀點而言,相對於環氧樹脂100質量份,離子捕捉劑的含量較佳為15質量份以下,更佳為10質量份以下,進而佳為5質量份以下。就以上的觀點而言,相對於環氧樹脂100質量份,離子捕捉劑的含量較佳為1質量份~15質量份,更佳為1質量份~10質量份,進而佳為2質量份~5質量份。In the case where the underfill material contains an ion scavenger, the content of the ion scavenger is not particularly limited. From the viewpoint of achieving sufficient moisture resistance reliability, it is preferably 1 part by mass relative to 100 parts by mass of epoxy resin Above, more preferably 2 parts by mass or more. From the viewpoint of fully exerting the effects of other components, the content of the ion scavenger is preferably 15 parts by mass or less, more preferably 10 parts by mass or less, and still more preferably 5 parts by mass or less relative to 100 parts by mass of the epoxy resin. From the above viewpoints, the content of the ion scavenger is preferably 1 part by mass to 15 parts by mass, more preferably 1 part by mass to 10 parts by mass, and still more preferably 2 parts by mass to 100 parts by mass of epoxy resin. 5 parts by mass.
另外,離子捕捉劑的平均粒子徑較佳為0.1 μm~3.0 μm,最大粒子徑較佳為10 μm以下。離子捕捉劑的平均粒子徑可與無機填充材料的情況同樣地進行測定。In addition, the average particle diameter of the ion scavenger is preferably 0.1 μm to 3.0 μm, and the maximum particle diameter is preferably 10 μm or less. The average particle diameter of the ion scavenger can be measured in the same manner as in the case of the inorganic filler.
(滲出抑制劑) 底部填充材料亦可含有滲出抑制劑。滲出抑制劑的種類並無特別限制,可列舉非離子性的界面活性劑、矽酮改質環氧樹脂等。滲出抑制劑可單獨使用一種,亦可組合使用兩種以上。(Exudation inhibitor) The underfill material may also contain an exudation inhibitor. The type of bleed inhibitor is not particularly limited, and examples include nonionic surfactants, silicone-modified epoxy resins, and the like. One kind of exudation inhibitor may be used alone, or two or more kinds may be used in combination.
滲出抑制劑的含量並無特別限制,相對於環氧樹脂100質量份,較佳為0.1質量份~5質量份,更佳為0.2質量份~2質量份,進而佳為0.3質量份~1質量份。The content of the exudation inhibitor is not particularly limited. With respect to 100 parts by mass of the epoxy resin, it is preferably 0.1 parts by mass to 5 parts by mass, more preferably 0.2 parts by mass to 2 parts by mass, and still more preferably 0.3 parts by mass to 1 part by mass. share.
(著色劑) 底部填充材料亦可含有著色劑。著色劑的種類並無特別限制,可列舉:碳黑、有機染料、有機顏料、氧化鈦、鉛丹、氧化鐵紅(Bengala)等。著色劑可單獨使用一種,亦可組合使用兩種以上。(Colorant) The underfill material may also contain colorants. The type of coloring agent is not particularly limited, and examples thereof include carbon black, organic dyes, organic pigments, titanium oxide, red lead, and red iron oxide (Bengala). A coloring agent may be used individually by 1 type, and may be used in combination of 2 or more types.
於底部填充材料含有著色劑的情況下,著色劑的含量並無特別限制,相對於底部填充材料總量,較佳為0.001質量份~1質量份,更佳為0.02質量份~0.5質量份。When the underfill material contains a colorant, the content of the colorant is not particularly limited, and it is preferably 0.001 part by mass to 1 part by mass, and more preferably 0.02 part by mass to 0.5 part by mass relative to the total amount of the underfill material.
[底部填充材料的製備方法] 底部填充材料例如可藉由如下方式來獲得:一邊視需要對各成分一併或分別施加加熱處理,一邊進行攪拌、熔融、混合、分散等。用於該些成分的混合、攪拌、分散等的裝置並無特別限定,可列舉:包括攪拌裝置、加熱裝置等的擂潰機、三輥磨機、球磨機、行星式混合機、珠磨機等。使用該些裝置將各成分混合、混練、視需要進行脫泡,藉此可獲得底部填充材料。[Preparation method of underfill material] The underfill material can be obtained, for example, by performing stirring, melting, mixing, dispersing, etc., while applying heat treatment to each component collectively or separately as necessary. The device used for mixing, stirring, dispersing, etc. of these components is not particularly limited, and examples include a crushing machine, three-roll mill, ball mill, planetary mixer, bead mill, etc., including a stirring device, heating device, etc. . Using these devices, the components are mixed, kneaded, and defoamed as necessary, thereby obtaining an underfill material.
[底部填充材料的用途] 底部填充材料可用於各種封裝技術中。特別是,本揭示的底部填充材料可較佳地用作倒裝晶片型封裝技術中使用的底部填充材料,即可較佳地用於填充利用凸塊等而受到接合的半導體元件與基板之間的縫隙的用途。另外,本揭示的底部填充材料可較佳地用作使用了銅柱的倒裝晶片型封裝技術中使用的底部填充材料。[Use of underfill material] Underfill materials can be used in various packaging technologies. In particular, the underfill material of the present disclosure can be preferably used as the underfill material used in flip-chip packaging technology, that is, it can be preferably used to fill the gap between the semiconductor element and the substrate that are bonded by bumps or the like. The purpose of the crevice. In addition, the underfill material of the present disclosure can be preferably used as the underfill material used in the flip-chip packaging technology using copper pillars.
半導體元件與基板的種類並無特別限制,可自半導體封裝的領域中通常使用者中適宜選擇。使用底部填充材料來填充半導體元件與基板之間的縫隙的方法並無特別限制。The types of semiconductor elements and substrates are not particularly limited, and can be appropriately selected from among ordinary users in the field of semiconductor packaging. The method of using the underfill material to fill the gap between the semiconductor element and the substrate is not particularly limited.
<<半導體封裝>> 本揭示的半導體封裝包括:基板、配置於所述基板上的半導體元件、以及密封所述半導體元件的本揭示的底部填充材料的硬化物。<<Semiconductor Package>> The semiconductor package of the present disclosure includes a substrate, a semiconductor element arranged on the substrate, and a cured product of the underfill material of the present disclosure that seals the semiconductor element.
於半導體封裝中,半導體元件與基板的種類並無特別限制,可自半導體封裝的領域中通常使用者中適宜選擇。就本揭示的底部填充材料特別有用的觀點而言,半導體封裝較佳為倒裝晶片封裝型的半導體封裝,更佳為使用銅柱作為連接半導體元件與基板的凸塊的倒裝晶片封裝型的半導體封裝。In semiconductor packaging, the types of semiconductor elements and substrates are not particularly limited, and can be appropriately selected from general users in the field of semiconductor packaging. From the viewpoint that the underfill material of the present disclosure is particularly useful, the semiconductor package is preferably a flip-chip package type semiconductor package, and more preferably a flip-chip package type that uses copper pillars as bumps for connecting semiconductor elements and substrates. Semiconductor packaging.
<<半導體封裝的製造方法>> 本揭示的半導體封裝的製造方法包括:利用本揭示的底部填充材料填充基板與配置於所述基板上的半導體元件之間的空隙的步驟;以及將所述底部填充材料硬化的步驟。<<Method of manufacturing semiconductor package>> The manufacturing method of the semiconductor package of the present disclosure includes: using the underfill material of the present disclosure to fill the gap between the substrate and the semiconductor element disposed on the substrate; and the step of hardening the underfill material.
半導體封裝的詳細情況如上所述。關於使用底部填充材料來填充半導體元件與基板之間的縫隙的方法、及於填充後將底部填充材料硬化的方法,並無特別限制。例如,可列舉:於將半導體元件與基板連接後,利用毛細管現象對半導體元件與基板的間隙賦予底部填充材料,繼而,進行底部填充材料的硬化反應的後加入方式;以及先對半導體元件及基板的至少一者的表面賦予底部填充材料,於進行熱壓接而將半導體元件與基板連接時,一併進行半導體元件及基板的連接與底部填充材料的硬化反應的先塗佈方式。作為底部填充材料的賦予方法,可列舉:注塑方式、分配方式、印刷方式等。The details of the semiconductor package are as described above. There are no particular restrictions on the method of filling the gap between the semiconductor element and the substrate with the underfill material, and the method of hardening the underfill material after filling. For example, it can be enumerated: after the semiconductor element and the substrate are connected, an underfill material is applied to the gap between the semiconductor element and the substrate by capillary phenomenon, and then the underfill material is cured; and the semiconductor element and the substrate are first added. At least one of the surfaces is provided with an underfill material, and when the semiconductor element and the substrate are connected by thermocompression bonding, the connection of the semiconductor element and the substrate and the hardening reaction of the underfill material are applied together. As the method of applying the underfill material, an injection method, a dispensing method, a printing method, etc. can be cited.
底部填充材料的硬化條件並無特別限定,例如較佳為於80℃~200℃下加熱1分鐘~150分鐘。 [實施例]The hardening conditions of the underfill material are not particularly limited. For example, heating at 80°C to 200°C for 1 minute to 150 minutes is preferred. [Example]
以下,藉由實施例來對所述實施形態進行具體說明,但本揭示的實施形態的範圍並不限定於該些實施例。Hereinafter, the above-mentioned embodiments will be described in detail with examples, but the scope of the embodiments of the present disclosure is not limited to these examples.
[底部填充材料的製備] 將表1及表2所示的成分以同表所示的調配量混合而製備底部填充材料。各成分的詳細情況如下所述。表1及表2中,空欄表示未調配成分。[Preparation of underfill material] The components shown in Table 1 and Table 2 were mixed in the compounding amounts shown in the same table to prepare an underfill material. The details of each component are as follows. In Table 1 and Table 2, blank columns indicate unmixed ingredients.
環氧樹脂1···液狀雙酚F型環氧樹脂、環氧當量:160 g/eq、商品名「愛普特托(EPOTOTO)YDF-8170C」、日鐵化學與材料(NIPPON STEEL Chemical& Material)股份有限公司 環氧樹脂2···三縮水甘油基-對胺基苯酚、環氧當量:95 g/eq、商品名「jER 630」、三菱化學股份有限公司 環氧樹脂3···1,6-雙(縮水甘油氧基)萘、環氧當量:143 g/eq、商品名「艾比克隆(EPICLON)HP-4032D」、迪愛生(DIC)股份有限公司Epoxy resin 1···Liquid bisphenol F epoxy resin, epoxy equivalent: 160 g/eq, trade name "EPOTOTO YDF-8170C", NIPPON STEEL Chemical& Material) Co., Ltd. Epoxy resin 2···Triglycidyl-p-aminophenol, epoxy equivalent: 95 g/eq, trade name "jER 630", Mitsubishi Chemical Corporation Epoxy resin 3···1,6-bis(glycidyloxy)naphthalene, epoxy equivalent: 143 g/eq, trade name "EPICLON HP-4032D", DIC Co., Ltd. company
硬化劑1···二乙基甲苯二胺、商品名「jER固化(jER cure)W」、活性氫當量:45 g/eq、三菱化學股份有限公司 硬化劑2···3,3'-二乙基-4,4'-二胺基二苯基甲烷、商品名「卡亞哈德(KAYAHARD)A-A」、活性氫當量:63 g/eq、日本化藥股份有限公司 硬化劑3···3,4-二甲基-6-(2-甲基-1-丙烯基)-4-環己烯-1,2-二羧酸酐、商品名「YH-306」、酸酐當量:234 g/eq、三菱化學股份有限公司 硬化劑4···2-烯丙基苯酚-甲醛縮聚物、商品名「MEH-8000H」、活性氫當量:140 g/eq、明和化成股份有限公司Hardener 1···Diethyltoluenediamine, trade name "jER cure (jER cure) W", active hydrogen equivalent: 45 g/eq, Mitsubishi Chemical Corporation Hardener 2···3,3'-diethyl-4,4'-diaminodiphenylmethane, trade name "KAYAHARD AA", active hydrogen equivalent: 63 g/eq, Nippon Kayaku Co., Ltd. Hardener 3···3,4-Dimethyl-6-(2-methyl-1-propenyl)-4-cyclohexene-1,2-dicarboxylic anhydride, trade name "YH-306", Anhydride equivalent: 234 g/eq, Mitsubishi Chemical Corporation Hardener 4···2-allylphenol-formaldehyde polycondensate, trade name "MEH-8000H", active hydrogen equivalent: 140 g/eq, Minghe Chemical Co., Ltd.
硬化促進劑1···三苯基膦 硬化促進劑2···2-苯基-4-甲基-5-羥基甲基咪唑 離子捕捉劑···通式(VI-2)所表示的化合物、商品名:「IXE500」、東亞合成股份有限公司 著色劑···碳黑、商品名「MA-100」、三菱化學股份有限公司 無機填充材料···表面經環氧矽烷偶合劑處理的球狀二氧化矽、商品名「SE2200-SEJ」、體積平均粒子徑0.6 μm、亞都瑪科技(Admatechs)股份有限公司Hardening accelerator 1···Triphenylphosphine Hardening accelerator 2···2-Phenyl-4-methyl-5-hydroxymethylimidazole Ion scavenger···Compound represented by general formula (VI-2), trade name: "IXE500", Toagosei Co., Ltd. Coloring agent···Carbon black, trade name "MA-100", Mitsubishi Chemical Corporation Inorganic fillers···Spherical silicon dioxide whose surface is treated with epoxy silane coupling agent, trade name "SE2200-SEJ", volume average particle diameter 0.6 μm, Admatechs Co., Ltd.
作為試驗化合物,使用可以市售品的形式獲取的以下的化合物。As the test compound, the following compounds, which are commercially available, were used.
化合物1···三嗪衍生物(商品名:VD-5,四國化成工業股份有限公司,下述化合物,R為二價連結基)Compound 1···Triazine derivative (trade name: VD-5, Shikoku Chemical Industry Co., Ltd., the following compound, R is a divalent linking group)
[化2] [化2]
化合物2···三聚氰胺(下述化合物)Compound 2···Melamine (the following compounds)
[化3] [化3]
化合物3···6-苯基-1,3,5-三嗪-2,4-二胺(下述化合物)Compound 3···6-Phenyl-1,3,5-triazine-2,4-diamine (the following compound)
[化4] [化4]
化合物4···3-胺基-1,2,4-三唑(下述化合物)Compound 4···3-Amino-1,2,4-triazole (the following compounds)
[化5] [化5]
化合物5···5-胺基-1H-四唑(下述化合物)Compound 5···5-Amino-1H-tetrazole (the following compound)
[化6] [化6]
化合物6···1,2,3-苯並三唑(商品名:BT-120,城北化學工業股份有限公司,下述化合物)Compound 6···1,2,3-benzotriazole (trade name: BT-120, Chengbei Chemical Industry Co., Ltd., the following compound)
[化7] [化7]
化合物7···1-[N,N-雙(2-乙基己基)胺基甲基]苯並三唑(商品名:BT-LX,城北化學工業股份有限公司,下述化合物)Compound 7···1-[N,N-bis(2-ethylhexyl)aminomethyl]benzotriazole (trade name: BT-LX, Chengbei Chemical Industry Co., Ltd., the following compound)
[化8] [化8]
[表1]
[表2]
表1及表2中,硬化劑的調配量是以將硬化劑的總質量設為100時的質量比來表示。著色劑、無機填充材料及試驗化合物的調配量是以相對於底部填充材料的總質量的含有率(質量%)來表示。硬化促進劑、離子捕捉劑的調配量是以相對於環氧樹脂的合計100質量份的各成分的質量份來表示。 於所述底部填充材料中,硬化劑中的活性氫數相對於環氧樹脂中的環氧基數的比(硬化劑中的活性氫數/環氧樹脂中的環氧基數)為1.0。In Tables 1 and 2, the blending amount of the curing agent is represented by the mass ratio when the total mass of the curing agent is 100. The blending amount of the colorant, the inorganic filler, and the test compound is expressed in terms of the content rate (mass %) relative to the total mass of the underfill material. The blending amounts of the hardening accelerator and the ion scavenger are expressed in parts by mass of each component with respect to 100 parts by mass of the epoxy resin in total. In the underfill material, the ratio of the number of active hydrogens in the curing agent to the number of epoxy groups in the epoxy resin (the number of active hydrogens in the curing agent/the number of epoxy groups in the epoxy resin) is 1.0.
[黏度的評價] 底部填充材料於25℃下的黏度(Pa·s)是使用E型黏度計(東京計器股份有限公司製造,威斯克(VISCONIC)EHD型(商品名))(圓錐角度3°、轉速10轉每分鐘(rpm))來測定。[Evaluation of Viscosity] The viscosity (Pa·s) of the underfill material at 25°C is based on the E-type viscometer (manufactured by Tokyo Keiki Co., Ltd., VISCONIC EHD type (trade name)) (cone angle 3°, rotation speed 10 rpm) Minutes (rpm)) to determine.
[適用期的評價] 將底部填充材料於25℃下放置24小時,然後使用E型黏度計(東京計器股份有限公司製造,威斯克(VISCONIC)EHD型(商品名))(圓錐角度3°、轉速10轉每分鐘(rpm))來測定25℃下的黏度(放置後黏度)。其中,針對因高黏度而無法以轉速10轉每分鐘(rpm)進行測定的試樣,以2.5轉每分鐘(rpm)進行測定。適用期(%)根據下述式而作為放置24小時後的黏度增加率來算出。 適用期(%)={(放置後黏度-初始黏度)/初始黏度}×100[Evaluation of the applicable period] Place the underfill material at 25°C for 24 hours, and then use an E-type viscometer (manufactured by Tokyo Keiki Co., Ltd., VISCONIC EHD type (trade name)) (cone angle 3°, rotation speed 10 revolutions per minute ( rpm)) to determine the viscosity at 25°C (viscosity after storage). Among them, for a sample that cannot be measured at 10 revolutions per minute (rpm) due to high viscosity, the measurement is performed at 2.5 revolutions per minute (rpm). The pot life (%) is calculated according to the following formula as the viscosity increase rate after being left for 24 hours. Pot life (%)={(Viscosity after placement-initial viscosity)/initial viscosity}×100
[25℃或260℃下的接著力的評價] ·相對於銅(Cu)的接著力 製作將底部填充材料以直徑3 mm、高度3 mm成形於銅板表面而成的試驗片,使用黏結強度試驗機(bond tester)DS100型(DAGE製造),於頭速度50 μm/sec、25℃或260℃的條件下施加剪切應力,測定成形品自銅板剝離的強度。[Evaluation of Adhesion at 25°C or 260°C] ·Adhesion to copper (Cu) A test piece is produced by forming an underfill material with a diameter of 3 mm and a height of 3 mm on the surface of a copper plate. Use a bond tester DS100 model (manufactured by DAGE) at a head speed of 50 μm/sec, 25°C or Shear stress was applied at 260°C, and the strength of the molded product peeled from the copper plate was measured.
將評價結果示於表3及表4中。表3及表4中,「-」表示不符合。適用期的評價中的「無法測定」表示增黏大而無法測定。The evaluation results are shown in Table 3 and Table 4. In Table 3 and Table 4, "-" indicates non-compliance. The "unmeasurable" in the evaluation of the pot life means that the viscosity increase is large and cannot be measured.
[表3]
[表4]
如表3及表4所示,含有試驗化合物1的實施例1~實施例6的底部填充材料的適用期及260℃下的對於銅的接著力優異。 另一方面,不含有試驗化合物1的比較例1的底部填充材料雖然25℃下的對於銅的接著力稍高,但260℃下的對於銅的接著力差。含有各種試驗化合物的比較例2~比較例7的底部填充材料中,有適用期大幅差者,或260℃下的對於銅的接著力差。另外,雖含有試驗化合物1但將硬化劑置換為硬化劑3或硬化劑4的比較例8或比較例9的底部填充材料的適用期及260℃下的對於銅的接著力亦差。As shown in Tables 3 and 4, the underfill materials of Examples 1 to 6 containing the test compound 1 have excellent pot life and adhesion to copper at 260°C. On the other hand, the underfill material of Comparative Example 1 that did not contain the test compound 1 had a slightly higher adhesion to copper at 25°C, but poor adhesion to copper at 260°C. Among the underfill materials of Comparative Example 2 to Comparative Example 7 containing various test compounds, some have a significantly poor pot life or poor adhesion to copper at 260°C. In addition, although the test compound 1 was included, the underfill material of Comparative Example 8 or Comparative Example 9 in which the curing agent was replaced with the curing agent 3 or the curing agent 4 also had poor pot life and adhesion to copper at 260°C.
日本專利申請第2020-009238號的揭示的整體內容藉由參照而併入本說明書中。 關於本說明書中所記載的所有文獻、專利申請及技術規格,與具體且分別記載有藉由參照而併入各文獻、專利申請及技術規格的情況相同程度地,引用且併入本說明書中。The entire content of the disclosure of Japanese Patent Application No. 2020-009238 is incorporated into this specification by reference. All documents, patent applications, and technical specifications described in this specification are cited and incorporated into this specification to the same extent as when specifically and separately described incorporation of each document, patent application, and technical specifications by reference.
無without
無without
Claims (6)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020009238 | 2020-01-23 | ||
| JP2020-009238 | 2020-01-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202136355A true TW202136355A (en) | 2021-10-01 |
| TWI883108B TWI883108B (en) | 2025-05-11 |
Family
ID=76992393
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110102030A TWI883108B (en) | 2020-01-23 | 2021-01-20 | Underfill material, semiconductor package and method of manufacturing semiconductor package |
Country Status (3)
| Country | Link |
|---|---|
| JP (2) | JP7673644B2 (en) |
| TW (1) | TWI883108B (en) |
| WO (1) | WO2021149635A1 (en) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4892164B2 (en) * | 2002-12-27 | 2012-03-07 | 日立化成工業株式会社 | Liquid epoxy resin composition and electronic component device |
| JP5321270B2 (en) * | 2009-06-17 | 2013-10-23 | 信越化学工業株式会社 | Silicone underfill material for flip chip type semiconductor device and flip chip type semiconductor device using the same |
| JP6392273B2 (en) * | 2015-06-04 | 2018-09-19 | 四国化成工業株式会社 | Epoxy resin composition and use thereof |
| JP6462539B2 (en) * | 2015-09-04 | 2019-01-30 | 四国化成工業株式会社 | Triazine compound, method for synthesizing the compound and use thereof |
| CN109563352B (en) * | 2016-08-30 | 2021-10-22 | 琳得科株式会社 | Resin composition, resin sheet, and semiconductor device |
| JP7000698B2 (en) * | 2017-03-31 | 2022-01-19 | 昭和電工マテリアルズ株式会社 | Resin composition for underfill, manufacturing method of semiconductor device and semiconductor device |
| JP7167912B2 (en) * | 2017-04-28 | 2022-11-09 | 昭和電工マテリアルズ株式会社 | Liquid encapsulating resin composition, electronic component device, and method for manufacturing electronic component device |
-
2021
- 2021-01-18 WO PCT/JP2021/001475 patent/WO2021149635A1/en not_active Ceased
- 2021-01-18 JP JP2021572717A patent/JP7673644B2/en active Active
- 2021-01-20 TW TW110102030A patent/TWI883108B/en active
-
2025
- 2025-04-22 JP JP2025070898A patent/JP2025100840A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP7673644B2 (en) | 2025-05-09 |
| TWI883108B (en) | 2025-05-11 |
| WO2021149635A1 (en) | 2021-07-29 |
| JPWO2021149635A1 (en) | 2021-07-29 |
| JP2025100840A (en) | 2025-07-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101321799B (en) | Liquid resin composition for electronic element and electronic element device | |
| JP5574237B2 (en) | Epoxy resin composition for sealing electronic parts | |
| JP5277537B2 (en) | Liquid resin composition for electronic components and electronic component device using the same | |
| TWI726921B (en) | Resin composition for underfill, electronic component device, and manufacturing method of electronic component device | |
| KR20170008210A (en) | Liquid sealing material, and electronic component using same | |
| JP5114935B2 (en) | Liquid resin composition for electronic components, and electronic component device using the same | |
| WO2008044496A1 (en) | Liquid resin composition for electronic part sealing and electronic part apparatus utilizing the same | |
| CN110168016B (en) | Liquid epoxy resin sealing material and semiconductor device | |
| JP2007182562A (en) | Liquid resin composition for electronic element and electronic element device | |
| JP7420559B2 (en) | Sealing resin composition | |
| JP2004210901A (en) | Liquid epoxy resin composition and electronic component device | |
| JP5692212B2 (en) | Liquid resin composition for electronic components and electronic component device using the same | |
| TW202026357A (en) | Liquid epoxy resin composition for encapsulation and electronic component device | |
| JP2019083225A (en) | Liquid resin composition for underfill, electronic component device, and method of manufacturing electronic component device | |
| JP2004051734A (en) | Liquid epoxy resin composition and semiconductor device | |
| JP7013790B2 (en) | Epoxy resin composition for encapsulation and electronic component equipment | |
| TW201934652A (en) | Liquid sealing resin composition, electronic component device, and method of producing electronic component device | |
| JP6686433B2 (en) | Underfill resin composition, electronic component device, and method for manufacturing electronic component device | |
| JP2021174939A (en) | Resin composition for underfill and its manufacturing method, semiconductor device manufacturing method, and semiconductor device | |
| JP2017197698A (en) | Particle having core-shell structure and method for producing the same | |
| TW202136355A (en) | Underfill material, semiconductor package and method of manufacturing semiconductor package | |
| JP2019081816A (en) | Liquid resin composition for underfill, electronic part device and method for manufacturing electronic part device | |
| JP7095724B2 (en) | Manufacturing method of resin composition for underfill, electronic component equipment and electronic component equipment | |
| TW202003774A (en) | Underfill material, semiconductor package, and method for producing semiconductor package | |
| JP7715983B2 (en) | Liquid underfill resin composition, electronic component device, and method for manufacturing electronic component device |