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TWI401449B - Semiconductor testing system - Google Patents

Semiconductor testing system

Info

Publication number
TWI401449B
TWI401449B TW97146896A TW97146896A TWI401449B TW I401449 B TWI401449 B TW I401449B TW 97146896 A TW97146896 A TW 97146896A TW 97146896 A TW97146896 A TW 97146896A TW I401449 B TWI401449 B TW I401449B
Authority
TW
Taiwan
Prior art keywords
testing system
semiconductor testing
semiconductor
testing
Prior art date
Application number
TW97146896A
Other languages
Chinese (zh)
Other versions
TW201022691A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW97146896A priority Critical patent/TWI401449B/en
Publication of TW201022691A publication Critical patent/TW201022691A/en
Application granted granted Critical
Publication of TWI401449B publication Critical patent/TWI401449B/en

Links

TW97146896A 2008-12-03 2008-12-03 Semiconductor testing system TWI401449B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97146896A TWI401449B (en) 2008-12-03 2008-12-03 Semiconductor testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97146896A TWI401449B (en) 2008-12-03 2008-12-03 Semiconductor testing system

Publications (2)

Publication Number Publication Date
TW201022691A TW201022691A (en) 2010-06-16
TWI401449B true TWI401449B (en) 2013-07-11

Family

ID=44833079

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97146896A TWI401449B (en) 2008-12-03 2008-12-03 Semiconductor testing system

Country Status (1)

Country Link
TW (1) TWI401449B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5747994A (en) * 1995-04-28 1998-05-05 Advantest Corp. Board exchange mechanism for semiconductor test system
US5986458A (en) * 1996-01-22 1999-11-16 Advantest Corp. Test head for semiconductor tester
TWI220460B (en) * 2002-08-06 2004-08-21 Advanced Semiconductor Eng Connector for testing semiconductor device
TWI275803B (en) * 2005-10-17 2007-03-11 Mjc Probe Inc Probe device of probe card
US7339385B2 (en) * 2005-05-30 2008-03-04 Advantest Corporation Semiconductor test apparatus and interface plate

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5747994A (en) * 1995-04-28 1998-05-05 Advantest Corp. Board exchange mechanism for semiconductor test system
US5986458A (en) * 1996-01-22 1999-11-16 Advantest Corp. Test head for semiconductor tester
TWI220460B (en) * 2002-08-06 2004-08-21 Advanced Semiconductor Eng Connector for testing semiconductor device
US7339385B2 (en) * 2005-05-30 2008-03-04 Advantest Corporation Semiconductor test apparatus and interface plate
TWI275803B (en) * 2005-10-17 2007-03-11 Mjc Probe Inc Probe device of probe card

Also Published As

Publication number Publication date
TW201022691A (en) 2010-06-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees