TWI880565B - Test probe - Google Patents

Abstract

Disclosed is a test probe for testing the electrical characteristics of a subject-to-be-tested. The test probe includes a barrel shaped like a cylinder; and a plunger having an inner end portion and a side portion provided inside the barrel. The side portion extends toward the inner end portion with a predetermined curvature in a direction perpendicular to a longitudinal central axis of the barrel.

Description

Test probe

The present disclosure relates to a test probe for testing the electrical characteristics of a semiconductor or a similar object to be tested.

1 shows a conventional test probe 1. The conventional test probe 1 includes a cylindrical barrel 10, a plunger 20 partially inserted into a first end portion of the barrel 10, and a spring 30 inserted in the barrel 10.

The plunger 20 includes a barrel inserting portion 21 and a terminal contacting portion 22, the barrel inserting portion 21 being accommodated in the barrel 10, and the terminal contacting portion 22 being exposed to the outside to contact with the terminal. Depending on the condition of the object to be tested, the terminal contacting portion 22 needs to have a very short shape.

FIG. 2 shows the state of the conventional test probe 1 during testing.

During the test, the terminal contact portion 22 contacts and presses against the terminal of the object to be tested. In this case, as shown in FIG. 2 , the plunger 20 may be stuck in the barrel 10 at a first point CP1 on the inner end side of the barrel insertion portion 21, a second point CP2 diagonally opposite to the first point CP1, and a third point CP3 on the terminal contact portion 22. During the test, the plunger 20 is required to operate to compress the spring 30 and restore the spring 30. However, if the plunger 20 is stuck in the barrel 10 and is not restored, there is a problem that the next test cannot be performed.

One aspect of the present disclosure is to provide a test probe with high test reliability.

According to an embodiment of the present disclosure, a test probe is provided. The test probe tests the electrical properties of an object to be tested. The test probe comprises: a barrel shaped like a cylinder; and a plunger disposed inside the barrel, the plunger having an inner end portion and a side portion. The side portion extends toward the inner end portion with a predetermined curvature in a direction perpendicular to the longitudinal center axis of the barrel.

The plunger may include a barrel insertion portion and a test contact portion, the barrel insertion portion including an inner end portion and a side portion, the test contact portion being integrally formed with the barrel insertion portion and at least partially protruding toward the exterior of the barrel.

The cartridge insert portion may include a truncated sphere having a first diameter.

The test contact portion may include a truncated sphere having a second diameter.

The barrel insertion portion may include a truncated sphere having a first diameter, and the test contact portion may include a truncated sphere having a second diameter smaller than the first diameter.

The first diameter is less than or equal to the inner diameter of the barrel.

The barrel may include an opening portion having a diameter that decreases along a longitudinal center axis of the barrel, and the second diameter is less than or equal to the diameter of the opening portion.

Hereinafter, various embodiments of the present disclosure will be described with reference to the drawings. FIG3 shows a test probe 100 according to an embodiment of the present disclosure, and FIG4 shows an operating state of the test probe 100 shown in FIG3 . Referring to FIG3 , the test probe 100 includes a cylindrical barrel 110, a plunger 120 partially inserted into a first end portion of the barrel 110, and a spring 130 inserted into the barrel 110.

The barrel 110 is made of a conductive material and includes an opening portion 111 that is narrowed by reducing the diameter at a first end portion to prevent the plunger 120 partially inserted into the opening portion 111 from falling out.

The plunger 120 includes a barrel inserting portion 121 inserted into the barrel 110 and a test contact portion 122 at least partially exposed to the outside of the barrel 110 to contact with a first terminal (not shown). The barrel inserting portion 121 and the test contact portion 122 are connected to have a concave portion while having spherical surfaces having different curvatures from each other.

The barrel insertion portion 121 includes an inner end portion 121b that contacts the first side of the spring 130 and a side portion 121a that contacts the inner surface of the barrel 110 and extends toward the inner end portion at a predetermined curvature in a direction perpendicular to the longitudinal center axis O of the barrel 110.

The cartridge insertion portion 121 may include a portion of a sphere having a diameter of R1. The cartridge insertion portion 121 may include a portion of an elliptical sphere.

The side surface portion 121a may have a curved surface having a predetermined curvature and extending up to the inner end portion 121b.

The test contact portion 122 may include a portion of a sphere having a diameter R2.

The diameter R1 of the side portion 121a may be equal to or smaller than the inner diameter R4 of the barrel 110. Therefore, as shown in FIG. 4, even if the side portion 121a becomes skewed while the plunger 120 is operating, the side portion 121a is not caught in the barrel 110.

The test contact portion 122 has a diameter R2 that is equal to or smaller than a diameter R3 of the opening of the opening portion 111. Therefore, the test contact portion 122 will not be stuck in the opening of the opening portion 111.

Although not shown in FIGS. 3 and 4 , a terminal (not shown) to be in contact with a second terminal (not shown) may be partially inserted into the second end portion of the barrel 110 .

According to an embodiment of the present disclosure, the test probe includes a plunger, and a barrel insertion portion 121 of the plunger to be inserted into the barrel has a spherical shape, thereby preventing the plunger from being stuck in the barrel.

Although exemplary embodiments of the present disclosure have been shown and described, the present disclosure is not limited to the aforementioned specific embodiments, and a person having ordinary knowledge in this technology may implement various alternative modifications without departing from the scope of the present disclosure claimed in the scope of the accompanying patent applications, and such modified embodiments should not be understood as being separated from the technical spirit or prospects of the present disclosure.

1: Traditional test probe 10, 110: Barrel/cylindrical barrel 20, 120: Plunger 21, 121: Barrel insertion part 22: Terminal contact part 30, 130: Spring 100: Test probe 111: Opening part 121a: Side part 121b: Inner end part 122: Test contact part CP1: First point CP2: Second point CP3: Third point O: Longitudinal center axis R1, R2, R3: Diameter R4: Inner diameter

FIG. 1 shows a conventional test probe. FIG. 2 shows an operating state of the conventional test probe shown in FIG. 1. FIG. 3 shows a test probe according to an embodiment of the present disclosure. FIG. 4 shows an operating state of the test probe shown in FIG. 3.

100:Test probe

110: Cylinder/Cylindrical Cylinder

111: Opening part

120: plunger

121: Tube insertion part

121a: Side part

121b: Inner end portion

122: Test contact parts

130: Spring

O: Longitudinal center axis

R1, R2, R3: Diameter

R4: Inner diameter

Claims (7)

A test probe for testing the electrical characteristics of an object to be tested, the test probe comprising: a barrel shaped like a cylinder; and a plunger having an inner end portion and a side portion disposed inside the barrel, wherein the side portion extends toward the inner end portion with a predetermined curvature in a direction perpendicular to the longitudinal center axis of the barrel. A test probe as described in claim 1, wherein the plunger includes a barrel insertion portion and a test contact portion, the barrel insertion portion includes the inner end portion and the side portion, and the test contact portion is formed integrally with the barrel insertion portion and at least partially protrudes toward the outside of the barrel. A test probe as described in claim 2, wherein the barrel insertion portion includes a truncated sphere having a first diameter. A test probe as described in claim 2, wherein the test contact portion includes a truncated sphere having a second diameter. A test probe as described in claim 2, wherein the barrel insertion portion includes a truncated sphere having a first diameter, and the test contact portion includes a truncated sphere having a second diameter smaller than the first diameter. A test probe as described in claim 3, wherein the first diameter is less than or equal to the inner diameter of the barrel. In the test probe as described in claim 4, the barrel includes an opening portion, the opening portion has a diameter that decreases along the longitudinal center axis of the barrel, and the second diameter is less than or equal to the diameter of the opening portion.

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