TWM464459U - Gas distribution device for metal organic chemical vapor deposition reactor and reactor thereof - Google Patents
Gas distribution device for metal organic chemical vapor deposition reactor and reactor thereof Download PDFInfo
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- TWM464459U TWM464459U TW101225582U TW101225582U TWM464459U TW M464459 U TWM464459 U TW M464459U TW 101225582 U TW101225582 U TW 101225582U TW 101225582 U TW101225582 U TW 101225582U TW M464459 U TWM464459 U TW M464459U
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- 238000009826 distribution Methods 0.000 title claims abstract description 201
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 13
- 239000002184 metal Substances 0.000 title claims abstract description 13
- 238000005229 chemical vapour deposition Methods 0.000 title claims description 10
- 239000007789 gas Substances 0.000 claims abstract description 315
- 238000006243 chemical reaction Methods 0.000 claims abstract description 45
- 238000001816 cooling Methods 0.000 claims abstract description 23
- 239000012495 reaction gas Substances 0.000 claims abstract description 17
- 238000009792 diffusion process Methods 0.000 claims description 13
- 238000004891 communication Methods 0.000 claims description 12
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 230000008021 deposition Effects 0.000 abstract description 4
- 239000000126 substance Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 description 28
- 239000002826 coolant Substances 0.000 description 10
- 239000002243 precursor Substances 0.000 description 10
- 238000000034 method Methods 0.000 description 8
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910002601 GaN Inorganic materials 0.000 description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- 229910052733 gallium Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 239000012159 carrier gas Substances 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 229910021478 group 5 element Inorganic materials 0.000 description 2
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 235000009854 Cucurbita moschata Nutrition 0.000 description 1
- 240000001980 Cucurbita pepo Species 0.000 description 1
- 235000009852 Cucurbita pepo Nutrition 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- XOYLJNJLGBYDTH-UHFFFAOYSA-M chlorogallium Chemical compound [Ga]Cl XOYLJNJLGBYDTH-UHFFFAOYSA-M 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000010574 gas phase reaction Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 238000011112 process operation Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 235000020354 squash Nutrition 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- Chemical Vapour Deposition (AREA)
Abstract
Description
本創作係關於一種生長第Ⅲ族元素和第V族元素化合物薄膜的反應器,特別是關於一種金屬有機化學氣相沉積反應器的氣體分佈裝置及相關反應器。The present invention relates to a reactor for growing a film of a Group III element and a Group V element compound, and more particularly to a gas distribution device and a related reactor for a metal organic chemical vapor deposition reactor.
氮化鎵(GaN)是一種廣泛應用於製造藍光、紫光和白光二極體、紫外線檢測器和高功率微波電晶體的材料。由於GaN在製造適用於大量用途的低能耗裝置(如,LED)中具有實際和潛在的用途,GaN薄膜的生長受到極大的關注。Gallium Nitride (GaN) is a widely used material for the manufacture of blue, violet and white light diodes, UV detectors and high power microwave transistors. The growth of GaN thin films has received great attention due to the practical and potential use of GaN in the fabrication of low energy devices (eg, LEDs) suitable for a wide range of applications.
GaN薄膜能以多種不同的方式生長,包括分子束外延(MBE)法、氫化物蒸氣階段外延(HVPE)法、金屬有機化合物化學氣相沉積(MOCVD)法等。目前,MOCVD法是用於為生產LED得到足夠品質的薄膜的優選的沉積方法。GaN thin films can be grown in a variety of different ways, including molecular beam epitaxy (MBE), hydride vapor phase epitaxy (HVPE), metal organic chemical vapor deposition (MOCVD), and the like. Currently, the MOCVD method is a preferred deposition method for obtaining a film of sufficient quality for the production of LEDs.
MOCVD工藝通常在一個具有溫度控制的環境下的反應腔或反應腔內進行。通常,由包含第III族元素(例如鎵(Ga))的第一前體氣體和一含氮的第二前體氣體(例如氨(NH3 ))被通入反應腔內反應以在基片上形成晶體GaN薄膜。一載流氣體(carrier gas)也可以被用於協助運輸前體氣體至基片上方。這些前體氣體在被加熱的基片表面混合反應,進而形成第III族氮化物薄膜(例如GaN薄膜)而沉積在基片表面並形成晶體外延層。The MOCVD process is typically carried out in a reaction chamber or reaction chamber in a temperature controlled environment. Typically, a first precursor gas comprising a Group III element (eg, gallium (Ga)) and a second precursor gas containing nitrogen (eg, ammonia (NH 3 )) are introduced into the reaction chamber for reaction on the substrate. A crystalline GaN film is formed. A carrier gas can also be used to assist in transporting the precursor gas above the substrate. These precursor gases are mixed and reacted on the surface of the heated substrate to form a Group III nitride film (e.g., a GaN thin film) deposited on the surface of the substrate and form a crystalline epitaxial layer.
前述的第一前體氣體第二前體氣體需要在到達基片時要按 比例均勻混合,但是第一前體氣體和第二前體氣體又不能過早的混合,因為基片被加熱到反應溫度(通常大於1000℃)時基片上方空間受輻射溫度也很高,所以兩種反應氣體的混合氣體在溫度足夠高的其它空間也能發生反應而形成結晶固體。這種結晶固體會隨著氣流擴散形成污染而不會在基片上形成晶體GaN。傳統MOCVD反應氣體供氣形式有多種,其中包括多種氣體水準供氣的方法,如現有技術US5370738中所示含V族元素和III族元素的氣體通過不同層的通道在接近基片附近的空間混合並流過基片表面,並在基片另一端被抽走。用這種方法供氣存在明顯的問題:混合氣體流過基片的上游和下游,若氣體混合度不同則反應氣體成份就不同,這會造成整個基片表面的沉積均一性降低。The foregoing first precursor gas second precursor gas needs to be pressed when reaching the substrate The ratio is uniformly mixed, but the first precursor gas and the second precursor gas cannot be mixed prematurely, because the space above the substrate is also highly irradiated because the substrate is heated to the reaction temperature (usually greater than 1000 ° C), so The mixed gas of the two reaction gases can also react in other spaces having a sufficiently high temperature to form a crystalline solid. This crystalline solid will become contaminated by the diffusion of the gas stream without forming crystalline GaN on the substrate. Conventional MOCVD reaction gas supply forms are various, including a plurality of gas level gas supply methods, such as the gas containing group V elements and group III elements shown in the prior art US 5,370,738, which are mixed in a space close to the substrate through channels of different layers. It flows through the surface of the substrate and is drawn away at the other end of the substrate. There is a significant problem with the gas supply by this method: the mixed gas flows upstream and downstream of the substrate, and if the gas mixing degree is different, the composition of the reaction gas is different, which causes the deposition uniformity of the entire substrate surface to be lowered.
為了解決這個問題Thomas Swan公司提出了利用接近基片的噴淋頭來供氣的方法,如專利EP0687749所示,利用該方法基本可以實現基本表面的均勻處理,但是由於要在整個反應區表面均勻地供應不同的反應氣體,而且在到達反應區前兩種前體氣體要互相隔離,所以氣體噴淋頭的結構非常複雜、難以製造,在使用中的維護和清洗也非常困難。In order to solve this problem, Thomas Swan proposed a method of supplying air by using a shower head close to the substrate. As shown in the patent EP0687749, the basic surface uniform treatment can be basically achieved by this method, but it is uniform on the entire reaction surface. The different reaction gases are supplied to the ground, and the two precursor gases are isolated from each other before reaching the reaction zone, so the structure of the gas shower head is very complicated and difficult to manufacture, and maintenance and cleaning in use are also very difficult.
CN10167849提出了一種層疊的氣體噴淋頭結構,每層氣體分佈板中均包括多個互相隔離的腔體,將多層氣體噴淋頭部件在高溫下壓焊形成一個整體,構成一個完整功能的氣體噴淋頭。這種結構的噴淋頭在工業應用中仍然存在不可彌補的缺陷,由於不同氣體分佈板之間是壓焊的,在每個高溫處理迴圈中氣體噴淋頭都會經歷一次伸縮過程,長時間運行後,不同氣體管道之間不可避免地會發生串擾,在基片的高溫輻射下還會發生化學反應形成沉積物,污染氣體管道。而且由於整個氣體噴淋頭是被整體焊接在一起的,這些污染物很難被清洗掉,嚴重影響後續處理的效果。CN10167849 proposes a laminated gas shower head structure, wherein each gas distribution plate comprises a plurality of mutually isolated cavities, and the multi-layer gas shower head components are pressure-welded at a high temperature to form a whole body to form a complete function gas. Sprinkler. The sprinkler of this structure still has irreparable defects in industrial applications. Since the gas distribution plates are pressure-welded, the gas shower head undergoes a telescopic process in each high temperature processing loop for a long time. After the operation, crosstalk will inevitably occur between different gas pipelines, and a chemical reaction will form a deposit under the high-temperature radiation of the substrate to contaminate the gas pipeline. Moreover, since the entire gas shower head is integrally welded together, these contaminants are difficult to be cleaned, which seriously affects the effect of subsequent treatment.
所以業界需要一種既能實現在整個反應表面均勻供氣,又能 防止不同反應氣體在進入反應區前互相串擾的氣體噴淋頭,而且該氣體噴淋頭要易於製造和維護。Therefore, the industry needs a way to achieve even air supply throughout the reaction surface, but also A gas showerhead that prevents cross-talk of different reactant gases before entering the reaction zone, and the gas showerhead is easy to manufacture and maintain.
緣此,本創作之主要目的即是提供一種,用以提供一種既能實現在整個反應基片表面均勻供氣,又能防止不同反應氣體在進入反應區前互相串擾的氣體分佈裝置及相關反應器,而且該氣體分佈裝置要易於製造和維護、大大節省使用者的成本。Therefore, the main purpose of the present invention is to provide a gas distribution device and related reaction that can achieve uniform gas supply on the entire surface of the reaction substrate while preventing cross-talk of different reaction gases before entering the reaction zone. And the gas distribution device is easy to manufacture and maintain, and the cost of the user is greatly saved.
本創作為解決習知技術之問題所採用之技術手段係一種金屬有機化學氣相沉積反應器的氣體分佈裝置,包括:彼此連接在一起的控溫板、氣體分佈板,其中所述氣體分佈板和控溫板之間通過可拆卸固定裝置固定連接;所述氣體分佈板上包括相互隔離的若干個第一氣體分佈通道與若干個第二氣體分佈通道,所述若干個第一氣體分佈通道與第一反應氣體源相連通,所述若干個第二氣體分佈通道與第二反應氣體源相連通,所述若干第一和第二氣體分佈通道在氣體分佈板下表面形成若干氣體噴出口;所述控溫板上分別預設有若干通道與所述氣體分佈板下表面上的若干氣體噴出口位置對應並且相連通;所述控溫板上還設置有與冷卻源相連接的冷卻腔。The technical means for solving the problems of the prior art is a gas distribution device of a metal organic chemical vapor deposition reactor, comprising: a temperature control plate and a gas distribution plate connected to each other, wherein the gas distribution plate And the temperature control plate is fixedly connected by a detachable fixing device; the gas distribution plate includes a plurality of first gas distribution channels and a plurality of second gas distribution channels separated from each other, and the plurality of first gas distribution channels and a first reaction gas source is in communication, the plurality of second gas distribution channels are in communication with a second reaction gas source, and the plurality of first and second gas distribution channels form a plurality of gas ejection ports on a lower surface of the gas distribution plate; A plurality of channels are respectively arranged on the temperature control plate corresponding to and connected to a plurality of gas ejection port positions on the lower surface of the gas distribution plate; and the temperature control plate is further provided with a cooling cavity connected to the cooling source.
在本創作的一實施例中,所述控溫板包括一上表面和一下表面,所述下表面靠近所述反應器的反應區,並且所述第一反應氣體源與所述第二反應氣體源從所述下表面逸出而進入反應區。In an embodiment of the present invention, the temperature control plate includes an upper surface and a lower surface, the lower surface is adjacent to a reaction zone of the reactor, and the first reactive gas source and the second reactive gas The source escapes from the lower surface and enters the reaction zone.
在本創作的一實施例中,所述氣體分佈板包括相疊的第一氣體分佈板和第二氣體分佈板,第二氣體分佈板位於第一氣體分佈板上方,所述第一氣體分佈板和第二氣體分佈板通過所述可拆卸固定裝置固定連接。In an embodiment of the present invention, the gas distribution plate includes a first gas distribution plate and a second gas distribution plate that are stacked, the second gas distribution plate is located above the first gas distribution plate, and the first gas distribution plate And the second gas distribution plate is fixedly connected by the detachable fixing device.
在本創作的一實施例中,所述氣體分佈板內包括與所述若干 個第一氣體分佈通道或所述若干個第二氣體分佈通道相連通的氣體擴散空間。In an embodiment of the present creation, the gas distribution plate includes the plurality of a first gas distribution channel or a gas diffusion space in which the plurality of second gas distribution channels are in communication.
在本創作的一實施例中,所述控溫板上的若干通道貫穿所述上表面和下表面。In an embodiment of the present creation, a plurality of channels on the temperature control plate extend through the upper surface and the lower surface.
在本創作的一實施例中,所述氣體分佈裝置還包括一個氣密板與所述第二氣體分佈板相鄰並連接在一起,該氣密板上設置有與所述若干個第一氣體分佈通道互相連通的氣體擴散空間。In an embodiment of the present invention, the gas distribution device further includes an airtight plate adjacent to and connected to the second gas distribution plate, and the airtight plate is provided with the plurality of first gases A gas diffusion space in which the distribution channels communicate with each other.
在本創作的一實施例中,所述氣密板與所述氣體分佈板通過可拆卸固定裝置固定連接。In an embodiment of the present invention, the airtight plate and the gas distribution plate are fixedly connected by a detachable fixing device.
在本創作的一實施例中,所述可拆卸固定裝置是螺栓或螺釘。In an embodiment of the present creation, the detachable fixing device is a bolt or a screw.
在本創作的一實施例中,所述控溫板與氣體分佈板通過可拆卸固定裝置固定連接後,在室溫下控溫板上表面的週邊區域到氣體分佈板下表面具有一個間隙。In an embodiment of the present invention, after the temperature control plate and the gas distribution plate are fixedly connected by the detachable fixing device, the peripheral portion of the surface of the temperature control plate has a gap to the lower surface of the gas distribution plate at room temperature.
在本創作的一實施例中,所述控溫板上表面到氣體分佈板下表面之間存在間隙,週邊區域的間隙小於中心區域的間隙。In an embodiment of the present invention, there is a gap between the surface of the temperature control plate and the lower surface of the gas distribution plate, and the gap of the peripheral area is smaller than the gap of the central area.
在本創作的一實施例中,所述控溫板包括一上表面,所述上表面呈一弧形狀。In an embodiment of the present invention, the temperature control plate includes an upper surface, and the upper surface has an arc shape.
本創作為解決習知技術之問題所採用之另一技術手段係一種金屬有機化學氣相沉積反應器,其包括前述所述的氣體分佈裝置。Another technical means employed by the present invention to solve the problems of the prior art is a metal organic chemical vapor deposition reactor comprising the gas distribution device described above.
本創作所採用的具體實施例,將藉由以下之實施例及附呈圖式作進一步之說明。The specific embodiments of the present invention will be further described by the following examples and accompanying drawings.
100‧‧‧反應器100‧‧‧reactor
1‧‧‧第一氣體通道1‧‧‧First gas passage
10‧‧‧第二氣體分佈板10‧‧‧Second gas distribution plate
10’、10”‧‧‧氣密板10', 10" ‧ ‧ airtight panels
101、101a、101b、101c、101d‧‧‧氣體分佈裝置101, 101a, 101b, 101c, 101d‧‧‧ gas distribution devices
1020‧‧‧氣體分佈板1020‧‧‧ gas distribution board
1021‧‧‧第一氣體分佈通道1021‧‧‧First gas distribution channel
1022‧‧‧第二氣體分佈通道1022‧‧‧Second gas distribution channel
1024‧‧‧固定孔1024‧‧‧Fixed holes
103‧‧‧加熱裝置103‧‧‧ heating device
104‧‧‧基片基座104‧‧‧Substrate base
105‧‧‧基片105‧‧‧Substrate
11‧‧‧通道11‧‧‧ channel
110’‧‧‧擴散溝槽110’‧‧‧Diffuse trench
120、120’‧‧‧溝槽120, 120’‧‧‧ trench
14‧‧‧固定孔14‧‧‧Fixed holes
2‧‧‧第二氣體通道2‧‧‧second gas passage
20‧‧‧第一氣體分佈板20‧‧‧First gas distribution plate
20a‧‧‧上表面20a‧‧‧ upper surface
20b‧‧‧下表面20b‧‧‧ lower surface
21‧‧‧通道21‧‧‧ channel
22‧‧‧通道22‧‧‧ channel
230‧‧‧溝槽230‧‧‧ trench
24‧‧‧軸24‧‧‧Axis
30‧‧‧控溫板30‧‧‧temperature control board
30a‧‧‧上表面30a‧‧‧ upper surface
30b‧‧‧下表面30b‧‧‧lower surface
31‧‧‧通道31‧‧‧ channel
32‧‧‧通道32‧‧‧ channel
33‧‧‧冷卻管道33‧‧‧Cooling pipe
34‧‧‧固定孔34‧‧‧Fixed holes
4‧‧‧螺栓4‧‧‧ bolt
41‧‧‧第一氣體源41‧‧‧First gas source
42‧‧‧第二氣體源42‧‧‧second gas source
43‧‧‧管道43‧‧‧ Pipes
44‧‧‧管道44‧‧‧ Pipes
5‧‧‧管道5‧‧‧ Pipes
50‧‧‧冷卻源50‧‧‧ Cooling source
60‧‧‧擴散腔60‧‧‧diffusion chamber
圖1所示為一種使用本創作所提供的氣體分佈裝置的金屬有機化學氣相沉積反應器示意圖;圖2所示為根據本創作第一種實施方式所提供的氣體分佈裝置的零件構成圖;圖3為根據本創作第一種實施方式所提供的氣體分佈裝置的組裝後的結構圖;圖4為根據本創作第一種實施方式包括一個氣密板的氣體分佈裝置結構圖;圖5為根據本創作第一種實施方式所提供的多個氣體分佈板中包括氣體擴散溝槽的氣體分佈裝置結構圖;圖6為根據本創作第二種實施方式所提供的多片組裝氣體分佈裝置結構圖;圖7為根據本創作第三種實施方式所提供的氣體分佈裝置結構圖。1 is a schematic view of a metal organic chemical vapor deposition reactor using the gas distribution device provided by the present creation; FIG. 2 is a view showing the configuration of a gas distribution device according to the first embodiment of the present invention; 3 is an assembled structural view of a gas distribution device according to a first embodiment of the present invention; FIG. 4 is a structural view of a gas distribution device including a gas tight plate according to a first embodiment of the present invention; A gas distribution device structure diagram including a gas diffusion groove in a plurality of gas distribution plates according to the first embodiment of the present invention; and FIG. 6 is a multi-piece assembly gas distribution device structure according to the second embodiment of the present creation. Figure 7 is a structural view of a gas distribution device according to a third embodiment of the present invention.
本創作所提供的氣體分佈裝置應用在如圖1所示的金屬有機化學氣相沉積(MOCVD)反應器100中,反應器100包括基片基座104放置在可旋轉的軸24上。基片基座104下安裝有加熱裝置103對基片基座104和基片基座上放置的基片105進行加熱以達到合適的反應溫度(例如>1000℃)。反應器頂部安裝有氣體分佈裝置101。氣體分佈裝置101通過管道43連接到第一氣體源41,通過管道44連接到第二氣體源42,通過管道5連接到冷卻源50。其中第一氣體源41和第二氣源42可以分別是選自含鎵的金屬有機物氣體如三甲基鎵(TMG)和含氮氣體如氨氣(NH3 )。在本創作中含鎵氣體也可是其它氣體如GaCl3 等。前述兩種反應氣體中還可以選擇性地包括N2 或H2 等載流氣體,以控制反應氣體流量與反應效果。The gas distribution device provided by the present application is applied in a metal organic chemical vapor deposition (MOCVD) reactor 100 as shown in FIG. 1, and the reactor 100 includes a substrate base 104 placed on a rotatable shaft 24. A heating device 103 is mounted under the substrate base 104 to heat the substrate base 104 and the substrate 105 placed on the substrate base to achieve a suitable reaction temperature (e.g., > 1000 ° C). A gas distribution device 101 is installed at the top of the reactor. The gas distribution device 101 is connected to the first gas source 41 via a conduit 43, to the second gas source 42 via a conduit 44, and to the cooling source 50 via a conduit 5. The first gas source 41 and the second gas source 42 may be respectively selected from a gallium-containing metal organic gas such as trimethylgallium (TMG) and a nitrogen-containing gas such as ammonia (NH 3 ). In the present creation, the gallium-containing gas may be other gases such as GaCl 3 or the like. The above two reaction gases may also optionally include a carrier gas such as N 2 or H 2 to control the flow rate of the reaction gas and the reaction effect.
本創作所提供的氣體分佈裝置要實現兩種反應氣體在氣體分佈裝置內部沿互相隔離的路徑傳輸並在分別逸出氣體分佈裝置的下表面後再均一混合,然後向基片表面供氣,所以氣體分佈裝置內兩種不同反應氣體的通道是交替間隔排列的。The gas distribution device provided by the present invention realizes that two kinds of reaction gases are transported along the mutually isolated path inside the gas distributing device and uniformly mixed after respectively escaping the lower surface of the gas distributing device, and then supplying air to the surface of the substrate, so The channels of the two different reactive gases in the gas distribution device are alternately spaced.
本創作所提供的氣體分佈裝置包括彼此連接在一起的控溫板、氣體分佈板,其中所述氣體分佈板和控溫板之間通過可拆卸固定裝置固定連接;所述氣體分佈板上包括相互隔離的若干個第一氣體分佈通道與若干個第二氣體分佈通道,所述若干個第一氣體分佈通道與第一反應氣體源相連通,所述若干個第二氣體分佈通道與第二反應氣體源相連通,所述若干第一和第二氣體分佈通道在氣體分佈板下表面形成若干氣體噴出口;所述控溫板上分別預設有若干通道與所述氣體分佈板下表面上的若干氣體噴出口位置對應並且相連通;所述控溫板上還設置有與冷卻源相連接的冷卻腔。The gas distribution device provided by the present invention includes a temperature control plate and a gas distribution plate which are connected to each other, wherein the gas distribution plate and the temperature control plate are fixedly connected by a detachable fixing device; the gas distribution plate includes each other a plurality of isolated first gas distribution channels and a plurality of second gas distribution channels, wherein the plurality of first gas distribution channels are in communication with the first reactive gas source, the plurality of second gas distribution channels and the second reaction gas The plurality of first and second gas distribution channels form a plurality of gas ejection ports on a lower surface of the gas distribution plate; the temperature control plates are respectively provided with a plurality of channels and a plurality of channels on the lower surface of the gas distribution plate The gas ejection ports are correspondingly and in communication; the temperature control plate is further provided with a cooling chamber connected to the cooling source.
前述氣體分佈板可以為一塊板體,其中設置所需的各種通道,也可以包括多塊板體組合而成。以下舉例說明:如圖2所示,氣體分佈裝置101包括至少3個氣體分佈板,它們為順序疊加、彼此連接在一起的控溫板30、第一氣體分佈板20和第二氣體分佈板10,其中所述控溫板30、第一氣體分佈板20、和第二氣體分佈板10之間通過可拆卸固定裝置4固定連接。The gas distribution plate may be a plate body in which various channels required are provided, or a plurality of plate bodies may be combined. As exemplified below, as shown in FIG. 2, the gas distribution device 101 includes at least three gas distribution plates which are sequentially stacked, connected to each other, a temperature control plate 30, a first gas distribution plate 20, and a second gas distribution plate 10. The temperature control plate 30, the first gas distribution plate 20, and the second gas distribution plate 10 are fixedly connected by a detachable fixing device 4.
所述控溫板30、第一氣體分佈板20和第二氣體分佈板10上分別預設有若干通道(如:11、21、31、22、32),在所述控溫板30、第一氣體分佈板20和第二氣體分佈板10彼此連接後,所述若干通道(如:11、21、31、22、32)相互連通並構成相互隔離的若干個第一氣體分佈通道(參考圖3,標號1,容後詳述)與若干個第二氣體分佈通道(參考圖3,標號2,容後詳述),所述若干個第一氣體分佈通道與第一反應氣體源41相連通,所述若干個第二氣體分佈通道與第二反應氣體源42相連通。The temperature control plate 30, the first gas distribution plate 20 and the second gas distribution plate 10 are respectively provided with a plurality of channels (such as 11, 21, 31, 22, 32), and the temperature control plate 30, After a gas distribution plate 20 and a second gas distribution plate 10 are connected to each other, the plurality of channels (eg, 11, 21, 31, 22, 32) communicate with each other and constitute a plurality of first gas distribution channels that are isolated from each other (reference drawing) 3, reference numeral 1, detailed later) and a plurality of second gas distribution channels (refer to FIG. 3, reference numeral 2, detailed later), the plurality of first gas distribution channels are connected to the first reaction gas source 41 The plurality of second gas distribution channels are in communication with the second reactive gas source 42.
其中,最接近基片反應區的控溫板30包括一上表面30a和一下表面30b,所述下表面30b靠近反應器的反應區(即,圖1中氣體分佈裝置101的下表面與基片基座104之間的區域),並且第一反應氣體源與所 述第二反應氣體源從所述下表面逸出而進入反應區,二者在反應區內混合並在基片表面發生沉積或外延生長反應。控溫板30上還設置包括有多個冷卻腔或冷卻管道33分佈在整個氣體分佈板平面上。冷卻腔或冷卻管道33連接到圖1所示的冷卻劑源冷卻源50,其中冷卻源劑可以是水或氣體。通過這些冷卻腔或冷卻管道可以使控制控溫板30的溫度,從而將其下方反應區輻射上來的熱量導走,因而控溫板30的溫度可以控制在一定的溫度(如100℃)度以下,使其保持較低的溫度,從而可以防止多片板體(30、20、10)之間因為劇烈的溫度變化和不同的熱膨脹係數而發生大幅度的位移和變形,也可以防止反應氣體在高溫影響下在控溫板30的下表面發生分解形成污染物粘附在該下表面上。多片氣體分佈板發生相對位移、變形時還會造成氣體通道變窄甚至堵塞,影響最終反應效果的均一性。控溫板30上還包括多個氣體通孔31、32,其中通孔31、32均勻地分佈和排列在控溫板30上,在反應過程中,用來向反應腔內均勻地提供反應所需的兩種前體氣體。Wherein, the temperature control plate 30 closest to the substrate reaction zone includes an upper surface 30a and a lower surface 30b, which is adjacent to the reaction zone of the reactor (i.e., the lower surface of the gas distribution device 101 of Fig. 1 and the substrate) The area between the pedestals 104) and the first reactive gas source and The second source of reactive gas escapes from the lower surface and enters the reaction zone where they are mixed and deposited or epitaxially grown on the surface of the substrate. The temperature control plate 30 is further provided with a plurality of cooling chambers or cooling ducts 33 distributed over the entire gas distribution plate plane. A cooling chamber or cooling conduit 33 is connected to the coolant source cooling source 50 shown in Figure 1, wherein the cooling source may be water or a gas. The temperature of the temperature control plate 30 can be controlled by these cooling chambers or cooling pipes to guide away the heat radiated from the reaction zone below, so that the temperature of the temperature control plate 30 can be controlled below a certain temperature (for example, 100 ° C). Keeping it at a lower temperature, so as to prevent large displacement and deformation between the multiple plates (30, 20, 10) due to severe temperature changes and different coefficients of thermal expansion, and also to prevent reaction gases from being Under the influence of high temperature, decomposition occurs on the lower surface of the temperature control plate 30 to form a contaminant adhering to the lower surface. When a plurality of gas distribution plates are relatively displaced and deformed, the gas passages are narrowed or even blocked, which affects the uniformity of the final reaction effect. The temperature control plate 30 further includes a plurality of gas through holes 31, 32, wherein the through holes 31, 32 are evenly distributed and arranged on the temperature control plate 30, and are used for uniformly providing a reaction in the reaction chamber during the reaction. The two precursor gases.
所述控溫板30上設置的若干通道31、32貫穿所述上表面30a和下表面30b。優選地,若干通道31、32均勻地分佈在控溫板30上。A plurality of passages 31, 32 provided on the temperature control plate 30 extend through the upper surface 30a and the lower surface 30b. Preferably, the plurality of channels 31, 32 are evenly distributed over the temperature control plate 30.
在控溫板30之上是另一氣體分佈板20(即,前述第一氣體分佈板),其上有與控溫板30上的多個氣體通孔31、32與第一氣體分佈板20的多個氣體通孔21、22位置相對應。第一氣體分佈板20包括一上表面20a和一下表面20b,所述第一氣體分佈板20上的若干通道21、22也貫穿所述第一氣體分佈板20的上表面20a和下表面20b。Above the temperature control plate 30 is another gas distribution plate 20 (i.e., the aforementioned first gas distribution plate) having a plurality of gas passage holes 31, 32 and a first gas distribution plate 20 on the temperature control plate 30. The plurality of gas through holes 21, 22 are correspondingly positioned. The first gas distribution plate 20 includes an upper surface 20a and a lower surface 20b, and a plurality of passages 21, 22 on the first gas distribution plate 20 also penetrate the upper surface 20a and the lower surface 20b of the first gas distribution plate 20.
在氣體分佈板20之上還有一氣體分佈板10(即,前述第二氣體分佈板),氣體分佈板10上包括與氣體分佈板20上的通孔21位置對應的若干/多個通孔11。第二氣體分佈板10包括一上表面10a和一下表面10b,所述第二氣體分佈板上的若干通道11可以選擇性地貫穿或不貫穿所 述第二氣體分佈板的上表面10a和下表面10b。There is also a gas distribution plate 10 (i.e., the aforementioned second gas distribution plate) above the gas distribution plate 20, and the gas distribution plate 10 includes a plurality of/a plurality of through holes 11 corresponding to the positions of the through holes 21 on the gas distribution plate 20. . The second gas distribution plate 10 includes an upper surface 10a and a lower surface 10b, and the plurality of channels 11 on the second gas distribution plate may selectively penetrate or not penetrate The upper surface 10a and the lower surface 10b of the second gas distribution plate are described.
前述第二氣體分佈板10、第一氣體分佈板20、及控溫板30的材料可以是不銹鋼或者鋁等不會與反應氣體反應的材料製成。The material of the second gas distribution plate 10, the first gas distribution plate 20, and the temperature control plate 30 may be made of a material such as stainless steel or aluminum that does not react with the reaction gas.
如圖3所示,為根據本創作一種實施方式所提供的氣體分佈裝置101組裝後的結構圖。氣體分佈裝置101中的控溫板30、第一氣體分佈板20與第二氣體分佈板10之間通過可拆卸的機械連接方式密封地連接在一起。例如,可以通過螺栓4穿過設置在各分佈板上的固定孔34、24和14來固定,其中螺栓4也可以是螺釘或者其它機械固定裝置。通過機械固定裝置固定後,第二氣體分佈板10、第一氣體分佈板20、及控溫板30就形成一個完整的氣體分佈裝置。氣體通孔11、21、31形成相互連通的第一反應氣體通道1;氣體通孔22、32形成相互連通的第二反應氣體通道2。由於氣體分佈板10與20位於控溫板30之後,遠離高溫的環境,並且控溫板30自身也有冷卻腔或冷卻管道來控溫,因而,第二氣體分佈板10、第一氣體分佈板20、及控溫板30的工作溫度不會太高,因而,直接通過機械固定裝置將它們固定在一起就可以滿足生產的需求,在工作過程中,氣體分佈板10與20不會出現因高溫導致的熱膨脹而出現的變形等問題,此外,這些機械固定裝置能夠保證在氣體分佈裝置使用一段時間後,將第二氣體分佈板10、第一氣體分佈板20、及控溫板30從整個氣體分佈裝置101拆卸開來,分別進行替換或分別進行氣體通道的清洗,以保證氣體分佈裝置101工作在最佳狀態。與現有技術相比,由於本創作的各氣體分佈板可以被拆卸清洗後再投入使用,不會產生浪費,因而可以大大節省使用者的成本。As shown in FIG. 3, it is a structural view of the gas distribution device 101 provided according to an embodiment of the present invention. The temperature control plate 30, the first gas distribution plate 20 and the second gas distribution plate 10 in the gas distribution device 101 are sealingly connected together by a detachable mechanical connection. For example, it can be fixed by bolts 4 through fixing holes 34, 24 and 14 provided on the respective distribution plates, wherein the bolts 4 can also be screws or other mechanical fixing means. After being fixed by the mechanical fixing device, the second gas distribution plate 10, the first gas distribution plate 20, and the temperature control plate 30 form a complete gas distribution device. The gas through holes 11, 21, 31 form a first reaction gas passage 1 that communicates with each other; the gas passage holes 22, 32 form a second reaction gas passage 2 that communicates with each other. Since the gas distribution plates 10 and 20 are located behind the temperature control plate 30, away from the high temperature environment, and the temperature control plate 30 itself has a cooling cavity or a cooling pipe to control the temperature, the second gas distribution plate 10 and the first gas distribution plate 20 are thus provided. And the operating temperature of the temperature control plate 30 is not too high, so that they can be directly fixed by mechanical fixing devices to meet the production requirements, and the gas distribution plates 10 and 20 do not appear to be caused by high temperature during the working process. The problem of deformation such as thermal expansion, in addition, these mechanical fixing means can ensure that the second gas distribution plate 10, the first gas distribution plate 20, and the temperature control plate 30 are distributed from the entire gas after the gas distribution device is used for a period of time. The device 101 is disassembled and replaced or separately cleaned to ensure that the gas distribution device 101 is operating at an optimum state. Compared with the prior art, since the gas distribution plates of the present invention can be disassembled and cleaned before being put into use, no waste is generated, and the cost of the user can be greatly saved.
控溫板30的製造可以是在氣體分佈板的基體上先開設多個容納冷卻液流過的槽,然後在製作能夠覆蓋該冷卻液槽的蓋板,所述槽和蓋板之間的連接可以通過過真空釺焊(vacuum braze welding)或真空熔焊(vacuum fuse welding)的方式在加熱、加壓的條件下焊接。蓋板覆蓋所述容 納冷卻液的槽後,控溫板30形成內含冷卻管道33的的控溫板30。所述多個氣體通孔31,32可以是在冷卻液管道製作後穿孔,也可以先穿孔再製作冷卻液管道33。The temperature control plate 30 may be manufactured by first opening a plurality of grooves for accommodating the coolant flowing through the base of the gas distribution plate, and then making a cover covering the coolant tank, the connection between the groove and the cover plate. It can be welded under heating and pressurization by means of vacuum braze welding or vacuum fuse welding. The cover covers the capacity After the tank of the coolant is passed, the temperature control plate 30 forms a temperature control plate 30 containing the cooling duct 33. The plurality of gas through holes 31, 32 may be perforated after the coolant pipe is made, or may be perforated to form the coolant pipe 33.
圖4中另一個氣體分佈裝置101a的實施例顯示了第一氣體源41從管道43到氣體通道1的方式。圖4中在第二氣體分佈板10上添加一氣密板10”,氣密板10”同樣通過可拆卸的連接方式固定並可拆卸。圖1中所示的管道43將第一氣體源41先輸送到氣密板10”與氣體分佈板10之間形成的擴散腔60中,再通過擴散腔60將氣體均勻分佈到不同的第一反應氣體通道1中。第二反應氣體源42則可以通過氣體分佈板10和20之間開挖的溝槽(容後詳述)與供應第二氣體的管道44相連接。The embodiment of another gas distribution device 101a in Figure 4 shows the manner in which the first gas source 41 is from the conduit 43 to the gas passage 1. In Fig. 4, an airtight plate 10" is added to the second gas distribution plate 10, and the airtight plate 10" is also fixed and detachable by a detachable connection. The pipe 43 shown in Fig. 1 first transports the first gas source 41 to the diffusion chamber 60 formed between the airtight plate 10" and the gas distribution plate 10, and then uniformly distributes the gas to a different first through the diffusion chamber 60. In the reaction gas passage 1, the second reaction gas source 42 can be connected to the conduit 44 for supplying the second gas through a groove (described later in detail) excavated between the gas distribution plates 10 and 20.
圖5中另一個氣體分佈裝置101b顯示了氣體分佈板10與20之間開挖有使多個第一氣體通道1相互聯通的溝槽120,氣體分佈板20與30之間開挖有使多個第二氣體通道2互聯的溝槽230,從而實現了不同反應氣體在整個氣體分佈裝置101b上的均勻分佈。Another gas distribution device 101b in Fig. 5 shows that the gas distribution plates 10 and 20 are excavated with grooves 120 for interconnecting the plurality of first gas passages 1, and the gas distribution plates 20 and 30 are excavated to make more The second gas passage 2 interconnects the grooves 230, thereby achieving uniform distribution of different reaction gases throughout the gas distribution device 101b.
圖6中另一個氣體分佈裝置101c顯示了另一個本創作氣體分佈裝置的實施例,在氣體分佈板10上加了一片包括氣體擴散溝槽110’的氣密板10',通過氣體擴散溝槽將管道43的氣體分佈到第一氣體通道。氣體分佈板10、20之間也有氣體擴散溝槽120’將氣體分佈到第二氣體通道。氣密板10'、第二氣體分佈板10、第一氣體分佈板20、及控溫板30之間通過螺栓4等機械裝置相連接固定。Another gas distribution device 101c in Fig. 6 shows another embodiment of the present gas distribution device, on which a gas-tight plate 10' including a gas diffusion groove 110' is applied, through a gas diffusion groove The gas of the conduit 43 is distributed to the first gas passage. There is also a gas diffusion channel 120' between the gas distribution plates 10, 20 to distribute the gas to the second gas passage. The airtight plate 10', the second gas distribution plate 10, the first gas distribution plate 20, and the temperature control plate 30 are connected and fixed by a mechanical device such as a bolt 4.
本創作除了可以用在圖2-6所示的3-4層氣體分佈板構成的氣體分佈裝置,也可以根據反應氣體擴散的需要設計成更多層氣體分佈板構成的結構,比如5或者6層,均屬於本創作結構適用範圍。In addition to the gas distribution device composed of the 3-4 layer gas distribution plates shown in Fig. 2-6, the creation can also be designed into a structure composed of more layers of gas distribution plates according to the requirements of the diffusion of the reaction gas, such as 5 or 6 The layers are all applicable to the scope of this creation structure.
本創作中的氣體分佈板也可以整合成一個部件,如圖7中氣體分佈裝置101d顯示了本創作氣體分佈裝置的另一個實施例。氣體分佈裝 置101d包括控溫板30,所述控溫板30包括一下表面30b和上表面30a。所述控溫板還包括多個固定孔34和多個冷卻液管道33。氣體分佈裝置101d還包括氣體分佈板1020,氣體分佈板1020中包括若干第一氣體分佈通道1021和第二氣體分佈通道1022。第一氣體分佈通道1021與第一氣源41相連通,第二氣體分佈通道1022與第二氣源42相連通。所述第一氣體通道與第二氣體通道互相隔離,直到氣體分佈板1020的下表面開口向下方的反應區域噴出第一和第二氣源的氣體才會混合。氣體分佈板1020還包括固定孔1024,一個螺栓通過該固定孔1024與下方控溫板上的固定孔34相將氣體分佈板1020與控溫板30相固定。其中氣體分佈板可以是如圖2-6所示是由多片疊加而成的,也可以是由多片氣體分佈板(如10、20)焊接成為一個部件的。由於控溫板30的製造以及組裝是在室溫下,然而在反應腔內工作時溫度會大幅升高,雖然有冷卻液控制溫度,但是仍然遠高於室溫,而且從冷卻液管道下方到受下方反應區熱輻射的下表面30b還有一定厚度的材料,從下表面到冷卻液管道內壁之間存在很大的溫度梯度。所以溫度控制板如果不作特別設計的話,由於控溫板30下表面溫度升高幅度大於上表面,所以會發生邊緣區域向上捲曲的情況。這會造成氣體分佈板1020與控溫板30之間產生應力互相推擠,嚴重地,可造成其中一塊氣體分佈板破裂的嚴重後果。所以本創作在設計時就使控溫板在常溫時具有邊緣向下略微捲曲的形狀,優選地,控溫板的上表面呈如圖所示的弧形狀,以抵消在實際工藝運行中發生向上捲曲的形變,最終在高溫加工過程中上下表面保持較平的表面,不會與其它氣體分佈板互相擠壓。The gas distribution plate in the present creation can also be integrated into one component, as shown in Fig. 7, the gas distribution device 101d shows another embodiment of the present gas distribution device. Gas distribution The 101d includes a temperature control plate 30 including a lower surface 30b and an upper surface 30a. The temperature control plate further includes a plurality of fixing holes 34 and a plurality of coolant pipes 33. The gas distribution device 101d further includes a gas distribution plate 1020 including a plurality of first gas distribution channels 1021 and second gas distribution channels 1022. The first gas distribution channel 1021 is in communication with the first gas source 41, and the second gas distribution channel 1022 is in communication with the second gas source 42. The first gas passage and the second gas passage are isolated from each other until the gas of the first and second gas sources is discharged from the lower surface opening of the gas distribution plate 1020 to the lower reaction zone. The gas distribution plate 1020 further includes a fixing hole 1024 through which a bolt is fixed to the gas distribution plate 1020 and the temperature control plate 30 by the fixing hole 34 of the lower temperature control plate. The gas distribution plate may be formed by stacking a plurality of pieces as shown in FIG. 2-6, or may be welded into a single piece by a plurality of gas distribution plates (such as 10, 20). Since the temperature control plate 30 is manufactured and assembled at room temperature, the temperature rises greatly when operating in the reaction chamber. Although the coolant controls the temperature, it is still much higher than the room temperature, and from the bottom of the coolant pipe to The lower surface 30b thermally irradiated by the lower reaction zone also has a certain thickness of material, and there is a large temperature gradient from the lower surface to the inner wall of the coolant pipe. Therefore, if the temperature control panel is not specially designed, since the temperature of the lower surface of the temperature control panel 30 is increased more than the upper surface, the edge region may be curled upward. This causes stresses between the gas distribution plate 1020 and the temperature control plate 30 to push each other, and severely, a serious consequence of the rupture of one of the gas distribution plates. Therefore, the present design is designed such that the temperature control plate has a slightly curled edge at a normal temperature. Preferably, the upper surface of the temperature control plate has an arc shape as shown in the figure to offset occurrence in actual process operation. The upward curling deformation eventually maintains a flat surface on the upper and lower surfaces during high temperature processing and does not squash with other gas distribution plates.
本創作對多片氣體分佈板採用可拆卸的裝置如螺栓來固定,這樣一來,在氣體分佈裝置運行一段時間之後就可以將多片氣體分佈板拆卸下來清洗後再重新組裝。由於最接近反應區的氣體分佈板包括溫度控制機能,所以其上的遠離反應區的多片氣體分佈板的溫度相對比較低, 即使存在氣體串擾也很少會反應生成沉積物污染下游的反應區。所以本創作的氣體分佈板結構可以在保證反應區內基片上金屬有機物氣相反應沉積品質的情況下,使氣體分佈裝置更易維護與保持長期的沉積效果。The creation of the plurality of gas distribution plates is fixed by a detachable device such as a bolt, so that after the gas distribution device is operated for a period of time, the plurality of gas distribution plates can be removed, cleaned, and reassembled. Since the gas distribution plate closest to the reaction zone includes a temperature control function, the temperature of the plurality of gas distribution plates on the reaction zone away from the reaction zone is relatively low. Even in the presence of gas crosstalk, it rarely reacts to the reaction zone downstream of the deposit contamination. Therefore, the gas distribution plate structure of the present invention can make the gas distribution device easier to maintain and maintain the long-term deposition effect while ensuring the gas phase reaction deposition quality of the metal organic matter on the substrate in the reaction zone.
以上對本創作的各個實施例進行了詳細說明。需要說明的是,上述實施例僅是示範性的,而非對本創作的限制。任何不背離本創作的精神的技術方案均應落入本創作的保護範圍之內。此外,不應將權利要求中的任何附圖標記視為限制所涉及的權利要求。The various embodiments of the present creation have been described in detail above. It should be noted that the above embodiments are merely exemplary and are not intended to limit the present invention. Any technical solution that does not deviate from the spirit of this creation should fall within the scope of this creation. In addition, any reference signs in the claims should not be construed as limitations.
以上之敘述僅為本創作之較佳實施例說明,凡精於此項技藝者當可依據上述之說明而作其它種種之改良,惟這些改變仍屬於本創作之創作精神及以下所界定之專利範圍中。The above description is only for the preferred embodiment of the present invention, and those skilled in the art can make other improvements according to the above description, but these changes still belong to the creative spirit of the creation and the patents defined below. In the scope.
1‧‧‧第一氣體通道1‧‧‧First gas passage
10‧‧‧第二氣體分佈板10‧‧‧Second gas distribution plate
101‧‧‧氣體分佈裝置101‧‧‧ gas distribution device
11‧‧‧通道11‧‧‧ channel
20‧‧‧第一氣體分佈板20‧‧‧First gas distribution plate
2‧‧‧第二氣體通道2‧‧‧second gas passage
21‧‧‧通道21‧‧‧ channel
22‧‧‧通道22‧‧‧ channel
30‧‧‧控溫板30‧‧‧temperature control board
31‧‧‧通道31‧‧‧ channel
32‧‧‧通道32‧‧‧ channel
33‧‧‧冷卻管道33‧‧‧Cooling pipe
4‧‧‧螺栓4‧‧‧ bolt
Claims (12)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220214631 CN202688435U (en) | 2012-05-11 | 2012-05-11 | Gas distributing device for metal organic chemical gas phase deposition reaction device and reaction device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM464459U true TWM464459U (en) | 2013-11-01 |
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ID=47544082
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101225582U TWM464459U (en) | 2012-05-11 | 2012-12-28 | Gas distribution device for metal organic chemical vapor deposition reactor and reactor thereof |
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| CN (1) | CN202688435U (en) |
| TW (1) | TWM464459U (en) |
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|---|---|---|---|---|
| TWI643260B (en) * | 2014-01-20 | 2018-12-01 | 日商東京威力科創股份有限公司 | Plasma processing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104178747B (en) * | 2013-05-24 | 2016-08-24 | 理想晶延半导体设备(上海)有限公司 | Split type gas shower assembly and metal organic chemical vapor deposition device |
| CN103334092B (en) * | 2013-06-13 | 2015-04-22 | 中国电子科技集团公司第四十八研究所 | Pipeline cooled gas distribution device used for metal organic chemical vapour deposition reactor |
-
2012
- 2012-05-11 CN CN 201220214631 patent/CN202688435U/en not_active Expired - Lifetime
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| TWI643260B (en) * | 2014-01-20 | 2018-12-01 | 日商東京威力科創股份有限公司 | Plasma processing device |
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