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US20060060602A1 - Flow control feedback system and method of automatically controlling fluid flow - Google Patents

Flow control feedback system and method of automatically controlling fluid flow Download PDF

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Publication number
US20060060602A1
US20060060602A1 US11/233,169 US23316905A US2006060602A1 US 20060060602 A1 US20060060602 A1 US 20060060602A1 US 23316905 A US23316905 A US 23316905A US 2006060602 A1 US2006060602 A1 US 2006060602A1
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Prior art keywords
fluid
dispensed
dispenser
state
sensing
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Abandoned
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US11/233,169
Inventor
Kwang-Chae Jeong
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Samsung Electronics Co Ltd
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Individual
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Assigned to SAMSUNG ELECTRONICS CO., LTD. reassignment SAMSUNG ELECTRONICS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: JEONG, KWANG-CHAE
Publication of US20060060602A1 publication Critical patent/US20060060602A1/en
Abandoned legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05BSPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B12/00Arrangements for controlling delivery; Arrangements for controlling the spray area
    • B05B12/08Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means
    • B05B12/082Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means responsive to a condition of the discharged jet or spray, e.g. to jet shape, spray pattern or droplet size
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05BSPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B15/00Details of spraying plant or spraying apparatus not otherwise provided for; Accessories
    • B05B15/50Arrangements for cleaning; Arrangements for preventing deposits, drying-out or blockage; Arrangements for detecting improper discharge caused by the presence of foreign matter
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner

Definitions

  • the present invention relates to a flow control feedback system, more particularly to a flow control feedback system capable of controlling the flow of a fluid and a method for automatically regulating the flow of the fluid using the same in dispensing photo resist or other fluids used in semiconductor wafer processing.
  • semiconductor devices are manufactured through plural processing steps. Before carrying out an etch process in the semiconductor devices in the various processes, a process for uniformly coating a wafer with a photoresist is generally performed. Such a photoresist coating process is performed by means of a coater unit of spinner equipment.
  • a photoresist coating device such as a coater unit includes a nozzle that dispenses the photoresist on the wafer.
  • a nozzle that dispenses the photoresist on the wafer.
  • the amount of dispensed photoresist can exceed an initially set coating range.
  • an end position of the dispensing is beyond an initial condition, subsequent dispensing of the photoresist is affected, causing the occurrence of a coating deterioration.
  • the present invention is directed to a fluid control feedback system and method capable of controlling the flow of fluids used for manufacturing a semiconductor device.
  • the fluid control feedback system and the fluid flow control method sense a dispensed amount of fluid, and cut off and sucking-back operations by a sensor provided at a nozzle for dispensing the fluid, and feedback sensed data in order to automatically control the fluid.
  • An aspect the present invention is to provide a flow control feedback system comprising: a sensing unit for sensing a dispensed state of a fluid; a monitoring section for monitoring the dispensed state of the fluid sensed by the sensing unit; a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of the fluid according to the compared result to output a corrected value; and a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller.
  • the system further comprises a display section for displaying the dispense state of fluid monitored by the monitoring section that allows a user to visually confirm the dispense state of the fluid.
  • the predetermined device is an air valve for dispensing the fluid at air pressure.
  • the fluid dispensing controller is an air valve controller for controlling the air valve.
  • the sensing unit includes a dispenser for dispensing the fluid, a housing providing a space in which the dispenser resides, and a sensor for sensing the dispensed state of the fluid dispensed in the dispenser.
  • the senor includes a first sensor for dispensed amount of the fluid, a second sensor for sensing a cut-off position of the fluid when the dispenser cuts-off the fluid, and a third sensor for sensing a suck-back position of the fluid when the dispenser sucks back the fluid.
  • at least one of the first, second, and third sensors includes a light emitting section and a light receiving section that are arranged on opposite of the dispenser, respectively.
  • the first sensor is a sensor for sensing a tip position of the dispenser.
  • the dispenser is made of a light permeable material for transmitting light emitted by a photo sensor.
  • the sensor includes a bar shaped light emitting section for emitting light to the dispenser, and a bar shaped light receiving section for sensing light emitted from the shaped light emitting section.
  • the bar shaped light receiving section senses a tip position of the dispenser, a cut-off position of the fluid, and a suck-back position of the fluid.
  • the dispenser is made of a light permeable material for transmitting light emitted by the light emitting section.
  • the fluid includes photoresist.
  • a method for controlling a flow of a fluid comprising: (i) dispensing the fluid using a dispenser; (ii) sensing a state of the dispensed fluid; (iii) comparing a value of the sensed state of the dispensed fluid with a set state value of the fluid; and (iv) correcting a dispensing condition of the dispenser to correspond the sensed state value of the dispensed fluid to the set state value of fluid when the sensed state value of the dispensed fluid is different from the set state value of fluid.
  • step (i) includes periodically dispensing the fluid using the dispenser. More preferably, dispensing the fluid using the dispenser periodically uses a standby time interval before, after, or during dispensing of the fluid using the dispenser in a real process. Most preferably, step (ii) includes a first step of sensing amount of the fluid dispensed to the dispenser, a second step of sensing a position that the dispenser cuts-off the fluid, and a third step of sensing a position that the dispenser sucks back the fluid. In the embodiment, at least one of the first, second, and third steps uses a photo sensor.
  • a flow control feedback system including a sensing unit for sensing a dispensed state of fluid; a monitoring section for monitoring the dispensed state of fluid sensed by the sensing unit; a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of fluid according to the compared result to output a corrected value; and a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller.
  • the fluid includes photoresist.
  • FIG. 1 is a block diagram showing a flow control feedback system according to an embodiment of the present invention
  • FIG. 2 is a view showing the sensing unit shown in FIG. 1 ;
  • FIG. 3 is a view showing an example of the sensing unit having nozzles and sensors shown in FIG. 2 ;
  • FIG. 4 is a view illustrating a sensing operation by the nozzles and the sensors of the sensing unit in FIG. 3 ;
  • FIG. 5 is a view showing another example of the sensing unit having nozzles and sensors shown in FIG. 2 ;
  • FIG. 6 is a view illustrating a sensing operation by the nozzles and the sensors of the sensing unit in FIG. 5 ;
  • FIG. 7 is a flow chart illustrating a method for automatically controlling a flow of fluid according to an embodiment of the present invention.
  • FIG. 1 is a block diagram showing a flow control feedback system according to an embodiment of the present invention.
  • the flow control feedback system according to the present invention includes a sensing unit 100 , a monitoring section 200 , a main controller 300 , an air valve controller 400 , and an air valve 500 .
  • the sensing unit 100 senses the dispensed amount of a fluid used during a manufacturing of semiconductor devices, namely, for example a photoresist used during a photo lithographic process.
  • the sensing unit 100 also senses a cut off operation and a suck-back operation. The description thereof will be given below in more detail.
  • the monitoring section 200 monitors the sensing unit 100 , and collects dispensed amount data, cut-off position data, and suck-back position data of the photoresist sensed by the sensing unit 100 .
  • the monitoring section 200 may include a programmable logic controller.
  • the monitoring section 200 further includes a display section 250 for displaying operations and data monitored by the monitoring section 200 so that a user can visually confirm it in real time.
  • the main controller 300 is a device for controlling an entire photoresist coating process.
  • the main controller 300 receives the collected data from the monitoring section 200 , compares it with initial set data, and corrects a dispensed state of the fluid according the compared result.
  • Amount data, cut-off position data, and sucked-back position data of the photoresist dispensed from the nozzle are previously set by the main controller 300 .
  • Such set data are transferred to the air valve controller 400 . This causes the air valve controller 400 to operate the air valve 500 .
  • the amount, the cut-off position value, or the sucked-back position value of the photoresist dispensed from the nozzle can exceed the initial set values.
  • the main controller 300 receives and compares amount data, cut-off position data, or sucked-back position data of the photoresist dispensed from the nozzle with the amount set value, the cut-off position set value, and the sucked-back position set value, respectively.
  • the main controller 300 corrects the amount set data, the cut-off position set data, and the sucked-back position set data according to the compared result, and provides the corrected data to the air valve controller 400 .
  • the air valve controller 400 operates the air valve 500 based on the corrected data from the main controller 300 .
  • the air valve controller 400 operates the air valve 500 based on set data. That is, the air valve controller 400 controls the air valve 500 that causes the nozzle to dispense the photoresist at a predetermined pressure. Furthermore, this operation causes the dispensing of the photoresist to be cut off at a position away from a nozzle tip by a predetermined distance and causes the photoresist to be sucked back at a position away from the nozzle by a predetermined distance. As stated above, when the dispensing data for the photoresist are corrected, the air valve controller 400 receives the corrected data from the main controller 300 , and controls the air valve 500 to dispense the photoresist based on the corrected data.
  • the air valve 500 is a device for dispensing the photoresist using air pressure by means of a nozzle of the sensing unit 100 . At this time, the nozzle of the sensing unit 100 dispenses the photoresist at constant flow rate.
  • FIG. 2 is a view showing one embodiment of the sensing unit 100 shown in FIG. 1 .
  • the sensing unit 100 includes at least one nozzle 120 a , 120 b , 120 c , and 120 d , and a housing 110 .
  • the housing 110 receives the photoresist dispensed from the nozzle 120 a , 120 b , 120 c , and 120 d and provides spaces in which the cut-off position and the sucking-back position are sensed.
  • the coater equipment is typically provided with a home port. The nozzle dispensing the photoresist on the wafer waits the home port. Accordingly, a home port formed in conventional coater equipment may be used as the housing 110 of the present invention. Otherwise, regardless of usage of the home port, the housing 110 can be additionally provided.
  • the coater equipment includes a plurality of nozzles. According to the process, one of the nozzles dispenses a photoresist containing specific components, another nozzle dispenses a photoresist containing different components from the specific components. Accordingly, it is desired that the housing 110 can receive the nozzles 120 a , 120 b , 120 c , and 120 d capable of dispensing the photoresist having the aforementioned components.
  • Sensors are disposed at both sides of nozzle tips 125 a , 125 b , 125 c , and 125 d that are positioned at respective ends of the nozzles 120 a , 120 b , 120 c , and 120 d . The sensors sense dispensing amount and state of the photoresist.
  • FIG. 3 is a view showing an example of the sensing unit having nozzles and sensors shown in FIG. 2 .
  • a nozzle tip position sensor includes a light emitting section 800 a and a light receiving section 800 b that are arranged on opposite sides of the nozzle tip 125 a and sense an end of the nozzle tip 125 a by using light.
  • a cut-off position sensor includes a light emitting section 700 a and a light receiving section 800 b that are arranged on opposite sides of the nozzle tip 125 a corresponding to a position higher than the lower most position of nozzle tip 125 , and sense a cut-off position ⁇ of the photoresist by using the light.
  • a sucking-back position sensor 600 a and 600 b includes a light emitting section 600 a and a light receiving section 600 b that are arranged on opposite sides of the nozzle tip 125 a corresponding to a position higher than the cut-off position sensor 700 a and 700 b , and sense a sucking-back position a of the photoresist.
  • a photo sensor senses a dispensing amount, a cut-off position, and a sucking-back position of the photoresist, it is desired that a member formed of material capable of transmitting light (i.e., light permeable) be used as the nozzle tip 125 a.
  • FIG. 4 is a view that illustrates a sensing operation by the nozzles and the sensors of the sensing section in FIG. 3 , in an operation of sensing a sucking-back position of the photoresist PR.
  • a predetermined distance e.g. 3 ⁇ 4 mm
  • the light receiving section 600 b of the sucking-back position sensor does not sense light emitted by the light emitting section 600 a .
  • the light receiving section 600 b senses the light emitted by the light emitting section 600 a . It is discriminated that a normal suck-back operation is performed.
  • a method for sensing dispensed amount of the photoresist is as follows.
  • the light receiving section 800 b of the nozzle tip position sensor should not sense light emitted from the light emitting section 800 a thereof for the time period ⁇ T. If the time period ⁇ T has not yet elapsed, when the light receiving section 800 b senses the light, it indicates that the photoresist is dispensed less than a set dispensed amount. In contrast to this, if the time period ⁇ T has elapsed, when the light receiving section 800 b does not sense the light, it indicates that the photoresist is dispensed in excess of the set dispensed amount.
  • FIG. 5 is a view showing another example of the sensing unit having nozzles and sensors shown in FIG. 2 that senses a dispensed state of the photoresist.
  • a position sensor is composed of a bar shaped light emitting section 900 and a bar shaped light receiving section 900 b that are disposed on opposite sides of the nozzle tip 125 a .
  • the light emitting section 900 a emits the light to a front face of the nozzle tip 125 a
  • the light receiving section 900 b senses the light passed through the nozzle tip 125 a .
  • the light receiving section 900 b senses an end position of the nozzle tip 125 a , a cut-off position ⁇ , and a sucking-back position ⁇ , based on whether or not lights to an area C, an area B, and an area A are sensed, respectively.
  • FIG. 6 is a view that illustrates an operation of sensing a sucking-back position a by the nozzles and the sensors of the sensing unit in FIG. 5 .
  • a sucking-back operation completing a photoresist dispensing is carried out.
  • the light receiving section 900 b senses light to an interval A but does not sense light beyond that interval, it is judged that the sucking-back operation was normally performed.
  • sucking-back time has elapsed, when an area in which the light is not sensed is present within the interval A, it means that the photoresist PR is not sucked-back to the sucking-back position ⁇ for the set sucking-back time. That is, a sufficient sucking-back operation is not performed.
  • sucking-back time has not yet elapsed, when the light receiving section 900 b senses the light beyond the area A, it is judged that the photoresist PR is excessively sucked-back beyond the sucking-back position ⁇ . In the same manner as in the sucking-back operation, it can be discriminated whether or not a cut-off operation is normally performed.
  • the time period ⁇ T has not yet elapsed, when any part of the area C of the light receiving section 900 b senses light, it indicates that the photoresist is dispensed less than the set dispensed amount.
  • the time period ⁇ T has already elapsed, when there is a part of the area C of the light receiving section 900 b that does not sense the light, it indicates that the photoresist is dispensed in excess of the set dispensed amount.
  • FIG. 7 is a flow chart that illustrates a method for automatically controlling a flow of a fluid according to an embodiment of the present invention.
  • the nozzle moves above the wafer at a wait position in the housing 110 .
  • first, second, third, and fourth nozzles 120 a , 120 b , 120 c , and 120 d dispense first, second, third, and fourth photoresists, respectively.
  • the second, third, and fourth nozzles 120 b , 120 c , and 120 d are positioned at a waiting position in the housing 110 .
  • the second, third, and fourth nozzles 120 b , 120 c , and 120 d When the second, third, and fourth nozzles 120 b , 120 c , and 120 d are positioned in a waiting or standby status in the housing 110 , in order to prevent the photoresist from being solidified, the second, third, and fourth nozzles 120 b , 120 c , and 120 d dispense the second, third, and fourth photoresists every predetermined period, respectively. In this case, the photoresist is dispensed at the same condition as that of a real coating process.
  • a current in use nozzle 120 a dispenses the first photoresist every predetermined period (step S 100 ).
  • the photoresist is periodically dispensed through a predetermined nozzle, namely, in a dummy dispense cycle under the same condition as that of the real coating process (step S 100 ).
  • the aforementioned photo sensor senses dispensed amount, a cut-off position, and a sucking-back position of the photoresist (step S 200 ).
  • the air valve controller 400 controls the air valve 500 to be operated.
  • the operation of the air valve 500 causes the sensing unit 100 to sense the dispensed state of the photoresist based on the set data.
  • the monitoring section 200 collects data sensed by the sensing unit 100 and transfers it to the main controller 300 .
  • the main controller 300 compares dispensed amount of the photoresist sensed as a dummy dispensing of photoresist in a set amount (step S 300 ). Furthermore, the main controller 300 compares the sensed cut-off position data and sucking-back position data with set data (step S 300 ). When the sensed data are identical with the set data, the main controller 300 judges that the photoresist dispensing operation was normally performed.
  • the main controller 300 provides a correcting value for the dispensing condition to the air valve controller 400 , thereby correcting a dispensing pressure of the photoresist (step S 400 ). Accordingly, the air valve controller 400 controls the air valve 500 that allows the nozzle to dispense the photoresist according to the corrected dispensing condition.
  • Such a set data correction is applicable to the cut-off position and the sucking-back position of the photoresist in addition to the dispensed amount of the photoresist.
  • a series of procedures as mentioned above repeats every predetermined period, thereby automatically adjusting the photoresist dispensing.
  • the present invention automatically controls a flow of fluid dispensed from a nozzle. Furthermore, the present invention simultaneously monitors cut-off and sucking-back operations of the fluid in addition to an adjustment of dispensed amount of the fluid, and exactly controls a fluid flow by feedbacking the monitored data. Therefore, the deterioration of products is greatly reduced, improving yield and productivity.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

A fluid control feedback system and a fluid flow control method capable of controlling the flow of fluids used during a manufacturing of semiconductor device are disclosed. A sensing unit senses a dispensed state of a fluid. A monitoring section monitors the dispensed state of the fluid sensed by the sensing unit. A main controller compares a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of the fluid according to the compared result to output a corrected value. A fluid dispensing controller controls a predetermined device to dispense the fluid based on the corrected value from the main controller.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • This U.S. non-provisional patent application claims priority under 35 U.S.C. § 119 of Korean Patent Application 2004-75600 filed on Sep. 21, 2004, the entire contents of which are hereby incorporated by reference.
  • BACKGROUND OF THE INVENTION
  • The present invention relates to a flow control feedback system, more particularly to a flow control feedback system capable of controlling the flow of a fluid and a method for automatically regulating the flow of the fluid using the same in dispensing photo resist or other fluids used in semiconductor wafer processing.
  • As generally known in the art, semiconductor devices are manufactured through plural processing steps. Before carrying out an etch process in the semiconductor devices in the various processes, a process for uniformly coating a wafer with a photoresist is generally performed. Such a photoresist coating process is performed by means of a coater unit of spinner equipment.
  • A photoresist coating device such as a coater unit includes a nozzle that dispenses the photoresist on the wafer. When the operation for dispensing the photoresist by the nozzle is terminated, photoresist is sucked into the nozzle by an operation of a valve. Such a sucking-back operation of the photoresist prevents a surface of the photoresist from being solidified to some degree.
  • If the sucking-back operation is abnormally performed, photoresist in the nozzle tip is solidified. When the solidified photoresist is dispensed onto the wafer, a degraded coating occurs. This causes a degradation of the product by lowering yield or peeling of the photoresist, thereby further requiring corrective operations. As a result, yield ability of a product is reduced.
  • Furthermore, upon continuously performing the photoresist coating process, the amount of dispensed photoresist can exceed an initially set coating range. When the dispensing of photoresist is cut off at the nozzle, namely, an end position of the dispensing is beyond an initial condition, subsequent dispensing of the photoresist is affected, causing the occurrence of a coating deterioration. The aforementioned problems occur in all kinds of fluids used during manufacturing of the semiconductor device as well as photoresist.
  • SUMMARY OF THE INVENTION
  • The present invention is directed to a fluid control feedback system and method capable of controlling the flow of fluids used for manufacturing a semiconductor device.
  • In order to achieve the object, the fluid control feedback system and the fluid flow control method sense a dispensed amount of fluid, and cut off and sucking-back operations by a sensor provided at a nozzle for dispensing the fluid, and feedback sensed data in order to automatically control the fluid.
  • An aspect the present invention is to provide a flow control feedback system comprising: a sensing unit for sensing a dispensed state of a fluid; a monitoring section for monitoring the dispensed state of the fluid sensed by the sensing unit; a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of the fluid according to the compared result to output a corrected value; and a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller.
  • Preferably, the system further comprises a display section for displaying the dispense state of fluid monitored by the monitoring section that allows a user to visually confirm the dispense state of the fluid. More preferably, the predetermined device is an air valve for dispensing the fluid at air pressure. Most preferably, the fluid dispensing controller is an air valve controller for controlling the air valve. In one embodiment, the sensing unit includes a dispenser for dispensing the fluid, a housing providing a space in which the dispenser resides, and a sensor for sensing the dispensed state of the fluid dispensed in the dispenser.
  • In one embodiment, the sensor includes a first sensor for dispensed amount of the fluid, a second sensor for sensing a cut-off position of the fluid when the dispenser cuts-off the fluid, and a third sensor for sensing a suck-back position of the fluid when the dispenser sucks back the fluid. In the embodiment, at least one of the first, second, and third sensors includes a light emitting section and a light receiving section that are arranged on opposite of the dispenser, respectively. In the embodiment, the first sensor is a sensor for sensing a tip position of the dispenser.
  • In one embodiment, the dispenser is made of a light permeable material for transmitting light emitted by a photo sensor. In the embodiment, the sensor includes a bar shaped light emitting section for emitting light to the dispenser, and a bar shaped light receiving section for sensing light emitted from the shaped light emitting section. In the embodiment, the bar shaped light receiving section senses a tip position of the dispenser, a cut-off position of the fluid, and a suck-back position of the fluid. In the embodiment, the dispenser is made of a light permeable material for transmitting light emitted by the light emitting section. In the embodiment, the fluid includes photoresist.
  • According to another aspect of the present invention, there is provided a method for controlling a flow of a fluid, the method comprising: (i) dispensing the fluid using a dispenser; (ii) sensing a state of the dispensed fluid; (iii) comparing a value of the sensed state of the dispensed fluid with a set state value of the fluid; and (iv) correcting a dispensing condition of the dispenser to correspond the sensed state value of the dispensed fluid to the set state value of fluid when the sensed state value of the dispensed fluid is different from the set state value of fluid.
  • Preferably, step (i) includes periodically dispensing the fluid using the dispenser. More preferably, dispensing the fluid using the dispenser periodically uses a standby time interval before, after, or during dispensing of the fluid using the dispenser in a real process. Most preferably, step (ii) includes a first step of sensing amount of the fluid dispensed to the dispenser, a second step of sensing a position that the dispenser cuts-off the fluid, and a third step of sensing a position that the dispenser sucks back the fluid. In the embodiment, at least one of the first, second, and third steps uses a photo sensor.
  • In one embodiment, at least one of steps (i), (ii), (iii), and (iv) is performed by a flow control feedback system including a sensing unit for sensing a dispensed state of fluid; a monitoring section for monitoring the dispensed state of fluid sensed by the sensing unit; a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of fluid according to the compared result to output a corrected value; and a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller. In the embodiment, the fluid includes photoresist.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate example embodiments of the present invention and, together with the description, serve to explain principles of the present invention. In the drawings:
  • FIG. 1 is a block diagram showing a flow control feedback system according to an embodiment of the present invention;
  • FIG. 2 is a view showing the sensing unit shown in FIG. 1;
  • FIG. 3 is a view showing an example of the sensing unit having nozzles and sensors shown in FIG. 2;
  • FIG. 4 is a view illustrating a sensing operation by the nozzles and the sensors of the sensing unit in FIG. 3;
  • FIG. 5 is a view showing another example of the sensing unit having nozzles and sensors shown in FIG. 2;
  • FIG. 6 is a view illustrating a sensing operation by the nozzles and the sensors of the sensing unit in FIG. 5; and
  • FIG. 7 is a flow chart illustrating a method for automatically controlling a flow of fluid according to an embodiment of the present invention.
  • DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
  • Preferred embodiments of the present invention will be described below in more detail with reference to the accompanying drawings. The present invention may, however, be embodied in different forms and its construction should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Like numerals refer to like elements throughout the specification.
  • EMBODIMENT
  • Hereinafter, described is an exemplary embodiment of the present invention in conjunction with the accompanying drawings.
  • FIG. 1 is a block diagram showing a flow control feedback system according to an embodiment of the present invention. Referring to FIG. 1, the flow control feedback system according to the present invention includes a sensing unit 100, a monitoring section 200, a main controller 300, an air valve controller 400, and an air valve 500.
  • The sensing unit 100 senses the dispensed amount of a fluid used during a manufacturing of semiconductor devices, namely, for example a photoresist used during a photo lithographic process. The sensing unit 100 also senses a cut off operation and a suck-back operation. The description thereof will be given below in more detail.
  • The monitoring section 200 monitors the sensing unit 100, and collects dispensed amount data, cut-off position data, and suck-back position data of the photoresist sensed by the sensing unit 100. In order to do this, the monitoring section 200 may include a programmable logic controller. The monitoring section 200 further includes a display section 250 for displaying operations and data monitored by the monitoring section 200 so that a user can visually confirm it in real time.
  • The main controller 300 is a device for controlling an entire photoresist coating process. The main controller 300 receives the collected data from the monitoring section 200, compares it with initial set data, and corrects a dispensed state of the fluid according the compared result. Amount data, cut-off position data, and sucked-back position data of the photoresist dispensed from the nozzle are previously set by the main controller 300. Such set data are transferred to the air valve controller 400. This causes the air valve controller 400 to operate the air valve 500. As the photoresist coating process continues, the amount, the cut-off position value, or the sucked-back position value of the photoresist dispensed from the nozzle can exceed the initial set values. The main controller 300 receives and compares amount data, cut-off position data, or sucked-back position data of the photoresist dispensed from the nozzle with the amount set value, the cut-off position set value, and the sucked-back position set value, respectively. The main controller 300 corrects the amount set data, the cut-off position set data, and the sucked-back position set data according to the compared result, and provides the corrected data to the air valve controller 400. The air valve controller 400 operates the air valve 500 based on the corrected data from the main controller 300.
  • The air valve controller 400 operates the air valve 500 based on set data. That is, the air valve controller 400 controls the air valve 500 that causes the nozzle to dispense the photoresist at a predetermined pressure. Furthermore, this operation causes the dispensing of the photoresist to be cut off at a position away from a nozzle tip by a predetermined distance and causes the photoresist to be sucked back at a position away from the nozzle by a predetermined distance. As stated above, when the dispensing data for the photoresist are corrected, the air valve controller 400 receives the corrected data from the main controller 300, and controls the air valve 500 to dispense the photoresist based on the corrected data.
  • The air valve 500 is a device for dispensing the photoresist using air pressure by means of a nozzle of the sensing unit 100. At this time, the nozzle of the sensing unit 100 dispenses the photoresist at constant flow rate.
  • FIG. 2 is a view showing one embodiment of the sensing unit 100 shown in FIG. 1. Referring to FIG. 2, the sensing unit 100 includes at least one nozzle 120 a, 120 b, 120 c, and 120 d, and a housing 110. The housing 110 receives the photoresist dispensed from the nozzle 120 a, 120 b, 120 c, and 120 d and provides spaces in which the cut-off position and the sucking-back position are sensed. The coater equipment is typically provided with a home port. The nozzle dispensing the photoresist on the wafer waits the home port. Accordingly, a home port formed in conventional coater equipment may be used as the housing 110 of the present invention. Otherwise, regardless of usage of the home port, the housing 110 can be additionally provided.
  • Typically, the coater equipment includes a plurality of nozzles. According to the process, one of the nozzles dispenses a photoresist containing specific components, another nozzle dispenses a photoresist containing different components from the specific components. Accordingly, it is desired that the housing 110 can receive the nozzles 120 a, 120 b, 120 c, and 120 d capable of dispensing the photoresist having the aforementioned components. Sensors (not shown) are disposed at both sides of nozzle tips 125 a, 125 b, 125 c, and 125 d that are positioned at respective ends of the nozzles 120 a, 120 b, 120 c, and 120 d. The sensors sense dispensing amount and state of the photoresist.
  • FIG. 3 is a view showing an example of the sensing unit having nozzles and sensors shown in FIG. 2. With reference to FIG. 3, a nozzle tip position sensor includes a light emitting section 800 a and a light receiving section 800 b that are arranged on opposite sides of the nozzle tip 125 a and sense an end of the nozzle tip 125 a by using light. A cut-off position sensor includes a light emitting section 700 a and a light receiving section 800 b that are arranged on opposite sides of the nozzle tip 125 a corresponding to a position higher than the lower most position of nozzle tip 125, and sense a cut-off position β of the photoresist by using the light. A sucking- back position sensor 600 a and 600 b includes a light emitting section 600 a and a light receiving section 600 b that are arranged on opposite sides of the nozzle tip 125 a corresponding to a position higher than the cut-off position sensor 700 a and 700 b, and sense a sucking-back position a of the photoresist.
  • On the other hand, since a photo sensor senses a dispensing amount, a cut-off position, and a sucking-back position of the photoresist, it is desired that a member formed of material capable of transmitting light (i.e., light permeable) be used as the nozzle tip 125 a.
  • FIG. 4 is a view that illustrates a sensing operation by the nozzles and the sensors of the sensing section in FIG. 3, in an operation of sensing a sucking-back position of the photoresist PR. Referring to FIG. 4, after the photoresist dispensing is terminated, in order to prevent the photoresist from being solidified, an operation for sucking-back the photoresist from the nozzle tip 125 by a predetermined distance (e.g., 3˜4 mm) is performed. At this time, the photoresist PR should be sucked-back to a set sucking-back position α. However, when the photoresist does not reach the suck-back position α (I) or if an excessive photoresist is sucked-back (II), then during a subsequent dispensing operation, an error occurs in dispensed amount of the photoresist.
  • Since the photoresist interrupts a path of light for a predetermined time during the sucking-back operation, the light receiving section 600 b of the sucking-back position sensor does not sense light emitted by the light emitting section 600 a. However, when a time corresponding to an end of a sucking-back time has elapsed and the light receiving section 600 b senses the light emitted by the light emitting section 600 a, there are no photoresist in a sensing area. It is discriminated that a normal suck-back operation is performed.
  • In case (I), although the time corresponding to the end of the sucking-back time has elapsed, the light receiving section 600 b cannot sense light at a set sucking-back position α, In case (II), although the time corresponding to the end of the sucking-back time has not elapsed, the light receiving section 600 b senses light at a set sucking-back position α. In each case, it is discriminated that a sucking-back operation was abnormally performed. That is, the first case (I) indicates an insufficient sucking-back operation was carried out, whereas the second case (II) indicates that an excessive sucking-back operation was performed. In the same manner, it can be discriminated whether or not a cut-off operation is normally performed.
  • A method for sensing dispensed amount of the photoresist is as follows. The photoresist is dispensed by a predetermined pressure. Accordingly, a constant amount of the photoresist is dispensed for a constant time. Accordingly, dispensed amount of the photoresist is obtained based on a measured dispensing time of the photoresist from the nozzle tip 125 a. For example, so as to obtain a dispensed amount of the photoresist corresponding to the set dispensed amount of the photoresist, the photoresist should be dispensed for a time period ΔT (=T2−T1). That is, the light receiving section 800 b of the nozzle tip position sensor should not sense light emitted from the light emitting section 800 a thereof for the time period ΔT. If the time period ΔT has not yet elapsed, when the light receiving section 800 b senses the light, it indicates that the photoresist is dispensed less than a set dispensed amount. In contrast to this, if the time period ΔT has elapsed, when the light receiving section 800 b does not sense the light, it indicates that the photoresist is dispensed in excess of the set dispensed amount.
  • FIG. 5 is a view showing another example of the sensing unit having nozzles and sensors shown in FIG. 2 that senses a dispensed state of the photoresist. Referring to FIG. 5, a position sensor is composed of a bar shaped light emitting section 900 and a bar shaped light receiving section 900 b that are disposed on opposite sides of the nozzle tip 125 a. The light emitting section 900 a emits the light to a front face of the nozzle tip 125 a, and the light receiving section 900 b senses the light passed through the nozzle tip 125 a. The light receiving section 900 b senses an end position of the nozzle tip 125 a, a cut-off position β, and a sucking-back position α, based on whether or not lights to an area C, an area B, and an area A are sensed, respectively.
  • FIG. 6 is a view that illustrates an operation of sensing a sucking-back position a by the nozzles and the sensors of the sensing unit in FIG. 5. Referring to FIG. 6, a sucking-back operation completing a photoresist dispensing is carried out. At the time corresponding to an end of the sucking-back time, when the light receiving section 900 b senses light to an interval A but does not sense light beyond that interval, it is judged that the sucking-back operation was normally performed.
  • As shown in FIG. 6 case (I), if the sucking-back time has elapsed, when an area in which the light is not sensed is present within the interval A, it means that the photoresist PR is not sucked-back to the sucking-back position α for the set sucking-back time. That is, a sufficient sucking-back operation is not performed. To the contrary, in case (II), if the sucking-back time has not yet elapsed, when the light receiving section 900 b senses the light beyond the area A, it is judged that the photoresist PR is excessively sucked-back beyond the sucking-back position α. In the same manner as in the sucking-back operation, it can be discriminated whether or not a cut-off operation is normally performed.
  • Dispensed amount of the photoresist is measured based on a time of whether or not light is sensed in an area C. For example, so as to obtain dispensed amount of the photoresist corresponding to set dispensed amount, the photoresist should be dispensed for a time period ΔT (=T2−T1). Referring back to FIG. 5, an area C of the light receiving section 900 b should not sense light emitted from the light emitting section 900 a for the time period ΔT. However, if the time period ΔT has not yet elapsed, when any part of the area C of the light receiving section 900 b senses light, it indicates that the photoresist is dispensed less than the set dispensed amount. In contrast to this, if the time period ΔT has already elapsed, when there is a part of the area C of the light receiving section 900 b that does not sense the light, it indicates that the photoresist is dispensed in excess of the set dispensed amount.
  • FIG. 7 is a flow chart that illustrates a method for automatically controlling a flow of a fluid according to an embodiment of the present invention. With reference to FIG. 7, before or during a process of dispensing the photoresist on the wafer, the nozzle moves above the wafer at a wait position in the housing 110. For example, when a plurality of nozzles 120 a˜120 d are installed according to components of the photoresist, it is assumed that first, second, third, and fourth nozzles 120 a, 120 b, 120 c, and 120 d dispense first, second, third, and fourth photoresists, respectively. For example, while the first photoresist is dispensed on the wafer through the first nozzle 102 a, the second, third, and fourth nozzles 120 b, 120 c, and 120 d are positioned at a waiting position in the housing 110.
  • When the second, third, and fourth nozzles 120 b, 120 c, and 120 d are positioned in a waiting or standby status in the housing 110, in order to prevent the photoresist from being solidified, the second, third, and fourth nozzles 120 b, 120 c, and 120 d dispense the second, third, and fourth photoresists every predetermined period, respectively. In this case, the photoresist is dispensed at the same condition as that of a real coating process. In addition to the second, third, and fourth nozzles 120 b, 120 c, and 120 d being in the standby or idle status, a current in use nozzle 120 a dispenses the first photoresist every predetermined period (step S100). In other words, before, after, or during the real coating process, the photoresist is periodically dispensed through a predetermined nozzle, namely, in a dummy dispense cycle under the same condition as that of the real coating process (step S100).
  • During the dummy dispense operation, the aforementioned photo sensor senses dispensed amount, a cut-off position, and a sucking-back position of the photoresist (step S200). At this time, the air valve controller 400 controls the air valve 500 to be operated. The operation of the air valve 500 causes the sensing unit 100 to sense the dispensed state of the photoresist based on the set data. The monitoring section 200 collects data sensed by the sensing unit 100 and transfers it to the main controller 300.
  • The main controller 300 compares dispensed amount of the photoresist sensed as a dummy dispensing of photoresist in a set amount (step S300). Furthermore, the main controller 300 compares the sensed cut-off position data and sucking-back position data with set data (step S300). When the sensed data are identical with the set data, the main controller 300 judges that the photoresist dispensing operation was normally performed. To the contrary, when the sensed data are different from the set data, namely, the dispense amount of the photoresist does not reach the set data or exceeds the set data, the main controller 300 provides a correcting value for the dispensing condition to the air valve controller 400, thereby correcting a dispensing pressure of the photoresist (step S400). Accordingly, the air valve controller 400 controls the air valve 500 that allows the nozzle to dispense the photoresist according to the corrected dispensing condition.
  • Such a set data correction is applicable to the cut-off position and the sucking-back position of the photoresist in addition to the dispensed amount of the photoresist. After the nozzle dispenses the photoresist based on the corrected set data, a series of procedures as mentioned above repeats every predetermined period, thereby automatically adjusting the photoresist dispensing.
  • Although the present invention has been described in connection with the dispensing operation of the photoresist, it is not limited to thereto. It will be apparent to those skilled in the art that the present invention is applicable to flow adjustment of fluids other than the photoresist.
  • Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the scope and spirit of the general inventive concept as defined by the appended claims and their equivalents.
  • As mentioned above, the present invention automatically controls a flow of fluid dispensed from a nozzle. Furthermore, the present invention simultaneously monitors cut-off and sucking-back operations of the fluid in addition to an adjustment of dispensed amount of the fluid, and exactly controls a fluid flow by feedbacking the monitored data. Therefore, the deterioration of products is greatly reduced, improving yield and productivity.

Claims (22)

1. A flow controlling feedback system comprising:
a sensing unit for sensing a dispensed state of a fluid;
a monitoring section for monitoring the dispensed state of the fluid sensed by the sensing unit;
a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of the fluid according to the compared result to output a corrected value; and
a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller.
2. The system as set forth in claim 1, further comprising a display section for displaying the dispense state of fluid monitored by the monitoring section that allows a user to visually confirm the dispense state of the fluid.
3. The system as set forth in claim 1, wherein the predetermined device is an air valve for dispensing the fluid at air pressure.
4. The system as set forth in claim 3, wherein the fluid dispensing controller is an air valve controller for controlling the air valve.
5. The system as set forth in claim 1, wherein the sensing unit includes a dispenser for dispensing the fluid, a housing providing a space in which the dispenser resides, and a sensor for sensing the dispensed state of the fluid dispensed in the dispenser.
6. The system as set forth in claim 5, wherein the sensor includes a first sensor for sensing dispensed amount of the fluid, a second sensor for sensing a cut-off position of the fluid when the dispenser cuts-off the fluid, and a third sensor for sensing a suck-back position of the fluid when the dispenser sucks back the fluid.
7. The system as set forth in claim 6, wherein at least one of the first, second, and third sensors includes a light emitting section and a light receiving section that are arranged on opposite sides of the dispenser, respectively.
8. The system as set forth in claim 6, wherein the first sensor is a sensor for sensing a tip position of the dispenser.
9. The system as set forth in claim 6, wherein the dispenser is made of a light permeable material for transmitting light emitted by the light emitter to a photo sensor.
10. The system as set forth in claim 5, wherein the sensor includes a bar shaped light emitting section for emitting light to the dispenser, and a bar shaped light receiving section for sensing light emitted from the bar shaped light emitting section.
11. The system as set forth in claim 10, wherein the bar shaped light receiving section senses a tip position of the dispenser, a cut-off position of the fluid, and a suck-back position of the fluid.
12. The system as set forth in claim 10, wherein the dispenser is made of a light permeable material for transmitting light emitted by the light emitting section.
13. The system as set forth in claim 1, wherein the fluid includes photoresist.
14. A method for controlling a flow of a fluid, the method comprising the steps of:
(i) dispensing the fluid using a dispenser;
(ii) sensing a state of the dispensed fluid;
(iii) comparing a value of the sensed state of the dispensed fluid with a set state value of the fluid; and
(iv) correcting a dispensing condition of the dispenser to correspond the sensed state value of the dispensed fluid to the set state value of fluid when the sensed state value of the dispensed fluid is different from the set state value of fluid.
15. The method as set forth in claim 14, wherein step (i) includes periodically dispensing the fluid using the dispenser.
16. The method as set forth in claim 15, wherein periodically dispensing the fluid using the dispenser during a standby time interval before, after, or during dispensing of the fluid in a real process.
17. The method as set forth in claim 14, wherein sensing step (ii) includes a first step of sensing an amount of the fluid dispensed from the dispenser, a second step of sensing a position that the dispenser cuts-off the fluid, and a third step of sensing a position that the dispenser sucks back the fluid.
18. The method as set forth in claim 17, wherein at least one of the first, second, and third steps uses a photo sensor.
19. The method as set forth in claim 14, wherein at least one of steps (i), (ii), (iii), and (iv) is performed by a flow control feedback system including a sensing unit for sensing a dispensed state of fluid; a monitoring section for monitoring the dispensed state of fluid sensed by the sensing unit; a main controller for comparing a value of the dispensed state sensed by the sensing unit with a set value and correcting the dispensed state of fluid according to the compared result to output a corrected value; and a fluid dispensing controller for controlling a predetermined device to dispense the fluid based on the corrected value from the main controller.
20. The method as set forth in claim 19, wherein the fluid includes photoresist.
21. A method for controlling a flow of a fluid for a semiconductor manufacturing process, the method comprising:
providing a dispenser structured to dispense a fluid; and
periodically dispensing the fluid using the dispenser during a standby time interval before, after, or during dispensing of the fluid in a real process for preventing the fluid from being solidified.
22. The method of claim 21, further comprising:
(ii) sensing a state of the dispensed fluid;
(iii) comparing a value of the sensed state of the dispensed fluid with a set state value of the fluid; and
(iv) correcting a dispensing condition of the dispenser to correspond the sensed state value of the dispensed fluid to the set state value of fluid when the sensed state value of the dispensed fluid is different from the set state value of fluid.
US11/233,169 2004-09-21 2005-09-21 Flow control feedback system and method of automatically controlling fluid flow Abandoned US20060060602A1 (en)

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