USD642082S1 - Capacitance meter - Google Patents
Capacitance meter Download PDFInfo
- Publication number
- USD642082S1 USD642082S1 US29/357,851 US35785110F USD642082S US D642082 S1 USD642082 S1 US D642082S1 US 35785110 F US35785110 F US 35785110F US D642082 S USD642082 S US D642082S
- Authority
- US
- United States
- Prior art keywords
- capacitance meter
- capacitance
- meter
- view
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
Claims (1)
- The ornamental design for a capacitance meter, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EM16131750001 | 2009-09-18 | ||
| EM001613175-0001 | 2009-09-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD642082S1 true USD642082S1 (en) | 2011-07-26 |
Family
ID=44280394
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/357,851 Expired - Lifetime USD642082S1 (en) | 2009-09-18 | 2010-03-18 | Capacitance meter |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD642082S1 (en) |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4590421A (en) * | 1982-11-10 | 1986-05-20 | Chauvin Arnoux | Measuring attachment connectible to a multimeter for measuring earth resistances |
| US4609789A (en) * | 1985-03-04 | 1986-09-02 | Communications Technology Corporation | Verification via cable analyzer |
| USD292177S (en) * | 1985-03-08 | 1987-10-06 | Lin Dong-Chang | Clamp-on multimeter or similar article |
| US4849686A (en) | 1986-02-13 | 1989-07-18 | Vaisala Oy | Method of and arrangement for accurately measuring low capacitances |
| GB2246639A (en) | 1990-08-02 | 1992-02-05 | Farnell Instr | Testing and calibrating LCR meters |
| US5283528A (en) | 1991-03-08 | 1994-02-01 | Leica Heerbrugg Ag | Circuit arrangement for measuring the ratio of the capacitance values of two capacitors |
| US5504430A (en) | 1994-06-29 | 1996-04-02 | Andersson; Lars | Method and apparatus of conductivity measurement |
| EP0555526B1 (en) | 1992-02-08 | 1998-04-08 | VEGA Grieshaber KG | Assembly for floating potential capacitance measurement, in particular for capacitive filling level measurement |
| US20030218473A1 (en) | 2002-05-27 | 2003-11-27 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and capacitance measurement method |
| US6707306B1 (en) | 1999-02-08 | 2004-03-16 | I.E.E. International Electronics & Engineering S.A R.L. | Measuring method for a capacitive measuring system |
| US7046017B1 (en) | 2003-09-22 | 2006-05-16 | Sun Microsystems, Inc. | Full-wave rectifier for capacitance measurements |
| US20060192568A1 (en) | 2004-09-17 | 2006-08-31 | Fondazione Torino Wireless | Multi-frequency capacitive measurement device and a method of operating the same |
| US7173438B2 (en) | 2005-05-18 | 2007-02-06 | Seagate Technology Llc | Measuring capacitance |
| US20070194800A1 (en) | 2005-12-21 | 2007-08-23 | Novikov Lenny M | Micropower voltage-independent capacitance measuring method and circuit |
| WO2008010634A1 (en) | 2006-07-20 | 2008-01-24 | Ad Semiconductor Co., Ltd. | Method and apparatus for detecting capacitance using a plurality of time division frequencies |
| US20080068029A1 (en) | 2006-09-15 | 2008-03-20 | Agilent Technologies, Inc. | Capacitance measuring apparatus and capacitance measuring method |
-
2010
- 2010-03-18 US US29/357,851 patent/USD642082S1/en not_active Expired - Lifetime
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4590421A (en) * | 1982-11-10 | 1986-05-20 | Chauvin Arnoux | Measuring attachment connectible to a multimeter for measuring earth resistances |
| US4609789A (en) * | 1985-03-04 | 1986-09-02 | Communications Technology Corporation | Verification via cable analyzer |
| USD292177S (en) * | 1985-03-08 | 1987-10-06 | Lin Dong-Chang | Clamp-on multimeter or similar article |
| US4849686A (en) | 1986-02-13 | 1989-07-18 | Vaisala Oy | Method of and arrangement for accurately measuring low capacitances |
| GB2246639A (en) | 1990-08-02 | 1992-02-05 | Farnell Instr | Testing and calibrating LCR meters |
| US5283528A (en) | 1991-03-08 | 1994-02-01 | Leica Heerbrugg Ag | Circuit arrangement for measuring the ratio of the capacitance values of two capacitors |
| EP0555526B1 (en) | 1992-02-08 | 1998-04-08 | VEGA Grieshaber KG | Assembly for floating potential capacitance measurement, in particular for capacitive filling level measurement |
| US5504430A (en) | 1994-06-29 | 1996-04-02 | Andersson; Lars | Method and apparatus of conductivity measurement |
| US6707306B1 (en) | 1999-02-08 | 2004-03-16 | I.E.E. International Electronics & Engineering S.A R.L. | Measuring method for a capacitive measuring system |
| US20030218473A1 (en) | 2002-05-27 | 2003-11-27 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and capacitance measurement method |
| US7046017B1 (en) | 2003-09-22 | 2006-05-16 | Sun Microsystems, Inc. | Full-wave rectifier for capacitance measurements |
| US20060192568A1 (en) | 2004-09-17 | 2006-08-31 | Fondazione Torino Wireless | Multi-frequency capacitive measurement device and a method of operating the same |
| US7173438B2 (en) | 2005-05-18 | 2007-02-06 | Seagate Technology Llc | Measuring capacitance |
| US20070194800A1 (en) | 2005-12-21 | 2007-08-23 | Novikov Lenny M | Micropower voltage-independent capacitance measuring method and circuit |
| WO2008010634A1 (en) | 2006-07-20 | 2008-01-24 | Ad Semiconductor Co., Ltd. | Method and apparatus for detecting capacitance using a plurality of time division frequencies |
| US20080068029A1 (en) | 2006-09-15 | 2008-03-20 | Agilent Technologies, Inc. | Capacitance measuring apparatus and capacitance measuring method |
Non-Patent Citations (1)
| Title |
|---|
| ABB Portable Capacitance Meter Product Brochure, Aug. 2010. |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |