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USD642082S1 - Capacitance meter - Google Patents

Capacitance meter Download PDF

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Publication number
USD642082S1
USD642082S1 US29/357,851 US35785110F USD642082S US D642082 S1 USD642082 S1 US D642082S1 US 35785110 F US35785110 F US 35785110F US D642082 S USD642082 S US D642082S
Authority
US
United States
Prior art keywords
capacitance meter
capacitance
meter
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/357,851
Inventor
Lars-Olov Ahlgren
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Schweiz AG
Original Assignee
ABB Technology AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Technology AG filed Critical ABB Technology AG
Assigned to ABB TECHNOLOGY AG reassignment ABB TECHNOLOGY AG ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AHLGREN, LARS-OLOV
Application granted granted Critical
Publication of USD642082S1 publication Critical patent/USD642082S1/en
Assigned to ABB TECHNOLOGY AG reassignment ABB TECHNOLOGY AG CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT RECORDED TO INCORRECT APPLICATION NO. PLEASE BACK OUT FROM 29/375851 PREVIOUSLY RECORDED ON REEL 024102 FRAME 0107. Assignors: AHLGREN, LARS-OLOV
Assigned to ABB SCHWEIZ AG reassignment ABB SCHWEIZ AG MERGER (SEE DOCUMENT FOR DETAILS). Assignors: ABB TECHNOLOGY LTD.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 represents a front perspective view of an embodiment of a capacitance meter showing my new design;
FIG. 2 represents a front view thereof;
FIG. 3 represents a back view thereof;
FIG. 4 represents a left side view thereof;
FIG. 5 represents a right side view thereof;
FIG. 6 represents a tip view thereof; and,
FIG. 7 represents a bottom view thereof.

Claims (1)

  1. The ornamental design for a capacitance meter, as shown and described.
US29/357,851 2009-09-18 2010-03-18 Capacitance meter Expired - Lifetime USD642082S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EM16131750001 2009-09-18
EM001613175-0001 2009-09-18

Publications (1)

Publication Number Publication Date
USD642082S1 true USD642082S1 (en) 2011-07-26

Family

ID=44280394

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/357,851 Expired - Lifetime USD642082S1 (en) 2009-09-18 2010-03-18 Capacitance meter

Country Status (1)

Country Link
US (1) USD642082S1 (en)

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4590421A (en) * 1982-11-10 1986-05-20 Chauvin Arnoux Measuring attachment connectible to a multimeter for measuring earth resistances
US4609789A (en) * 1985-03-04 1986-09-02 Communications Technology Corporation Verification via cable analyzer
USD292177S (en) * 1985-03-08 1987-10-06 Lin Dong-Chang Clamp-on multimeter or similar article
US4849686A (en) 1986-02-13 1989-07-18 Vaisala Oy Method of and arrangement for accurately measuring low capacitances
GB2246639A (en) 1990-08-02 1992-02-05 Farnell Instr Testing and calibrating LCR meters
US5283528A (en) 1991-03-08 1994-02-01 Leica Heerbrugg Ag Circuit arrangement for measuring the ratio of the capacitance values of two capacitors
US5504430A (en) 1994-06-29 1996-04-02 Andersson; Lars Method and apparatus of conductivity measurement
EP0555526B1 (en) 1992-02-08 1998-04-08 VEGA Grieshaber KG Assembly for floating potential capacitance measurement, in particular for capacitive filling level measurement
US20030218473A1 (en) 2002-05-27 2003-11-27 Matsushita Electric Industrial Co., Ltd. Semiconductor device and capacitance measurement method
US6707306B1 (en) 1999-02-08 2004-03-16 I.E.E. International Electronics & Engineering S.A R.L. Measuring method for a capacitive measuring system
US7046017B1 (en) 2003-09-22 2006-05-16 Sun Microsystems, Inc. Full-wave rectifier for capacitance measurements
US20060192568A1 (en) 2004-09-17 2006-08-31 Fondazione Torino Wireless Multi-frequency capacitive measurement device and a method of operating the same
US7173438B2 (en) 2005-05-18 2007-02-06 Seagate Technology Llc Measuring capacitance
US20070194800A1 (en) 2005-12-21 2007-08-23 Novikov Lenny M Micropower voltage-independent capacitance measuring method and circuit
WO2008010634A1 (en) 2006-07-20 2008-01-24 Ad Semiconductor Co., Ltd. Method and apparatus for detecting capacitance using a plurality of time division frequencies
US20080068029A1 (en) 2006-09-15 2008-03-20 Agilent Technologies, Inc. Capacitance measuring apparatus and capacitance measuring method

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4590421A (en) * 1982-11-10 1986-05-20 Chauvin Arnoux Measuring attachment connectible to a multimeter for measuring earth resistances
US4609789A (en) * 1985-03-04 1986-09-02 Communications Technology Corporation Verification via cable analyzer
USD292177S (en) * 1985-03-08 1987-10-06 Lin Dong-Chang Clamp-on multimeter or similar article
US4849686A (en) 1986-02-13 1989-07-18 Vaisala Oy Method of and arrangement for accurately measuring low capacitances
GB2246639A (en) 1990-08-02 1992-02-05 Farnell Instr Testing and calibrating LCR meters
US5283528A (en) 1991-03-08 1994-02-01 Leica Heerbrugg Ag Circuit arrangement for measuring the ratio of the capacitance values of two capacitors
EP0555526B1 (en) 1992-02-08 1998-04-08 VEGA Grieshaber KG Assembly for floating potential capacitance measurement, in particular for capacitive filling level measurement
US5504430A (en) 1994-06-29 1996-04-02 Andersson; Lars Method and apparatus of conductivity measurement
US6707306B1 (en) 1999-02-08 2004-03-16 I.E.E. International Electronics & Engineering S.A R.L. Measuring method for a capacitive measuring system
US20030218473A1 (en) 2002-05-27 2003-11-27 Matsushita Electric Industrial Co., Ltd. Semiconductor device and capacitance measurement method
US7046017B1 (en) 2003-09-22 2006-05-16 Sun Microsystems, Inc. Full-wave rectifier for capacitance measurements
US20060192568A1 (en) 2004-09-17 2006-08-31 Fondazione Torino Wireless Multi-frequency capacitive measurement device and a method of operating the same
US7173438B2 (en) 2005-05-18 2007-02-06 Seagate Technology Llc Measuring capacitance
US20070194800A1 (en) 2005-12-21 2007-08-23 Novikov Lenny M Micropower voltage-independent capacitance measuring method and circuit
WO2008010634A1 (en) 2006-07-20 2008-01-24 Ad Semiconductor Co., Ltd. Method and apparatus for detecting capacitance using a plurality of time division frequencies
US20080068029A1 (en) 2006-09-15 2008-03-20 Agilent Technologies, Inc. Capacitance measuring apparatus and capacitance measuring method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ABB Portable Capacitance Meter Product Brochure, Aug. 2010.

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