WO1993011491A1 - Memory card device - Google Patents
Memory card device Download PDFInfo
- Publication number
- WO1993011491A1 WO1993011491A1 PCT/JP1992/001565 JP9201565W WO9311491A1 WO 1993011491 A1 WO1993011491 A1 WO 1993011491A1 JP 9201565 W JP9201565 W JP 9201565W WO 9311491 A1 WO9311491 A1 WO 9311491A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- block
- data
- area
- rescue
- blocks
- Prior art date
Links
- 230000002950 deficient Effects 0.000 claims abstract description 18
- 238000007726 management method Methods 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 9
- 230000008439 repair process Effects 0.000 claims description 8
- 238000013500 data storage Methods 0.000 claims description 2
- 238000011084 recovery Methods 0.000 claims 1
- 238000009751 slip forming Methods 0.000 claims 1
- 230000007547 defect Effects 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 238000012795 verification Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 2
- 102100039250 Essential MCU regulator, mitochondrial Human genes 0.000 description 1
- 101000813097 Homo sapiens Essential MCU regulator, mitochondrial Proteins 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
Definitions
- the present invention relates to a memory using an EEPROM (Electrically Releasable And Programmable Read Only Memory) as a semiconductor memory.
- EEPROM Electrically Releasable And Programmable Read Only Memory
- Field of the Invention relates to a memory device, and more particularly to a device suitable for use in an electronic still camera device that converts an optical image of a photographed subject into digital image data and records the digital image data in a semiconductor memory. Background technology
- an electronic still camera device that converts an optical image of a photographed subject into an electrical image signal using a solid-state image sensor, converts the image signal into digital image data, and records the digital image data in a semiconductor memory.
- a memory card in which semiconductor memory is housed in a card-shaped case is configured to be detachable from the camera body.
- the handling is equivalent to that of a film in a normal camera.
- the memory card of the electronic still camera device is currently being standardized, and as a built-in semiconductor memory.
- a large storage capacity is required to record multiple digital image data.
- SRAM Static Random
- mask R0M mask R0M
- EEPR0M which can electrically write and erase data
- the memory card using SRAM has the advantage that it can support any format data structure and has the advantage of fast data write and read speeds. Since it is necessary to store the backup battery in the memory power to hold the data, the storage capacity must be reduced by installing the battery storage space, and the cost of the SRAM itself is high and economical It has the problem of causing a serious disadvantage.
- EEPROM has attracted attention as a semiconductor memory used for memory cards.
- This EEPROM is attracting attention as a recording medium that replaces a magnetic disk.It does not require a backup battery to hold data and can reduce the cost of the chip itself. Due to its unique advantages, it has been actively developed for use as a memory card.
- Fig. 1 shows a comparison between the length of a memory card using SRAM (SRAM card) and the length of a memory card using EEPR0M (EEPROM card).
- SRAM card SRAM card
- EEPROM card EEPROM card
- the SRAM has a fast write speed and a fast read speed
- the EEPROM has a slow write speed and a slow read speed.
- EEPR0M writes and reads a large amount of data for one page at a time in page mode, so the data write speed is faster than in random access mode. And the read speed is faster, and the erase mode of comparison item 5 is
- EEPR0M does not erase the previously written data when writing new data to the area where the data is already written, that is, when rewriting data overnight. This data cannot be written when writing new data.
- the mode is to be executed.
- the write verify of the comparison item 6 is a mode unique to the EEPROM, and does not exist in the SRAM. That is, when data is written in the EEPROM, complete writing is not normally performed by one write operation. For this reason, it is necessary to read the written contents of EEPROM 0M every time one write operation is performed to EEPROM, and check whether or not the data is written correctly.This is write verification. .
- the data to be written to the EEPROM is recorded in the buffer memory, the data is transferred from the buffer memory to the EEPR0M, written, and then the contents written to the EEPROM are read and compared with the contents of the buffer memory. To determine whether they match. If it is determined that the data does not match (error) as a result of the write verification, the operation of writing the contents of the buffer memory to the EEPROM again is repeated.
- EEPROM does not require a backup battery, is inexpensive, and can be written and read in units of pages.
- the speed of writing and reading data in random access mode is slow, and there are modes that SRAM does not have, such as erase mode and write verification.
- EEPPR0M is such that when the number of data rewrites exceeds a certain number, the memory cell is rapidly deteriorated and data write failure is likely to occur. That is, EEPROM was developed for the recording of program data and is intended to be able to rewrite data at the time of version up of the program. This is because it is not designed to handle a large number of data rewrites.
- the conventional memory card with built-in EEPR0M treats the entire memory card with built-in EEPROM where a write failure has occurred as a defective product, which is extremely inefficient and economical. It has the disadvantage of being disadvantageous.
- the present invention has been made in consideration of the above circumstances, and it is possible to continuously use i even in an EEPROM where a write failure has occurred in a section, and to make effective use of the storage area of the EEPROM 0 M. It is an object of the present invention to provide an extremely good memory force device that can be planned, is economically advantageous and can be put to practical use. Disclosure of the invention
- an EEPROM having a data area and a relief area each including a plurality of blocks each having a fixed capacity, and a writing failure is detected in a block of the data area of the EEPROM.
- the data to be written to the defective block is written by searching for a free block in the rescue area, and when the rescue area is full and a write error is detected in the block in the data area, Data to write to the block Rescue means for searching for and writing free blocks in the data area, and erasing the data in the free area by erasing the data while the blocks in the data area are being used for rescue by this rescue means.
- control means for detecting the occurrence of the error and transferring the data of the block used for rescue in the data area to the empty block.
- a memory card device includes an EEPROM having a data area composed of a plurality of blocks having a fixed capacity, and a state in which writing failure is detected in a block of the data area of the EEPROM.
- Rescue means for retrieving and writing data to be written to the defective block by searching for an empty block in the data area;
- a first control means for controlling blocks in which data is written by the rescue means so as to be continuously arranged in the data area, and a rescue block is continuously performed by the first control means.
- the data of the block ′ is transferred to an empty block in the data area to maintain the continuity of the rescue block. 2 control means.
- the repair area is not fixedly provided, and the repair means increases the repair block every time a write failure block occurs, so that the data area can be used effectively.
- the rescue block is continuously arranged in the data area by the first and second control means, and when a block in which data has been written is allocated for rescue, the data of the block is rewritten. Free space in the data area, which is relocated to the block to maintain the continuity of the rescue block, so that multiple rescue blocks are not scattered in the storage area, The management of both the data area and the rescue block can be performed easily.
- FIG. 1 is a diagram showing a comparison between the length of an SRAM card and an EEPR0M card.
- FIG. 2 is a block diagram showing an embodiment of a memory card device according to the present invention. The figure shows the storage area of the EEPROM in the embodiment, FIG. 4 shows the details of the management table in the embodiment, and FIG. FIG. 6 is a diagram showing a countermeasure when the rescue area is full in the embodiment, FIG. 6 is a diagram showing a storage area of EEPR0M in another embodiment of the present invention, and FIG. FIG. 8 is a diagram showing details of a management table in the embodiment, and FIG. 8 is a diagram showing a recording operation to the EEPROM in the other embodiment.
- reference numeral 11 denotes a memory card main body, which can be connected to the electronic still camera main body CA via a connector 12 provided at one end thereof.
- a connector 12 provided at one end thereof.
- data to be written to the memory card main body 11, address data indicating the writing location, and the like are supplied from the electronic still camera main body CA.
- the data input / output control circuit 14 has a built-in buffer memory BM capable of high-speed writing and reading of data, and temporarily records the fetched data in the buffer memory BM. After that, the data input / output control circuit 14 writes the data recorded in the buffer memory BM into a plurality (four in the case shown) of the write memory 16 of the EEPROM 16 via the bus line 15. Read at the timing corresponding to the vehicle and record it in EEPROM16.
- the data input / output control circuit 14 For example, every time data is written in page units to 16 for example, EEPR0M reads data written in page units from 16 and determines whether or not it matches the data recorded in the buffer memory BM. Perform verification. If the data read from the EEPR0M16 does not match the data recorded in the buffer memory BM, the data input / output control circuit 14 again outputs the data from the buffer memory BM. When the data read from the EEPROM 16 and the data recorded in the buffer memory BM completely match while this operation is repeated a predetermined number of times, Is completed. Next, when data is read from the EEPR0M16 to the outside of the memory card body 11, the data to be read from the electronic still camera body CA side via the connector 12 is specified.
- the data input / output control circuit 14 reads the data from the EEPROM 16 based on the input address and temporarily records the data in the buffer memory BM. Thereafter, the data input / output control circuit 14 derives the data recorded in the buffer memory BM to the outside via the read connector 12, and the data is read there.
- the data transfer between the electronic still camera main body CA and the memory card main body 11 is always performed via the buffer memory BM, so that the electronic still camera main body CA To memory card body 1 1 viewed from the side
- the writing speed and reading speed of the data can be improved.
- the write verification unique to EEPR0M1.6 is automatically processed inside the memory card body 11 using the memory memory BM.
- the memory card body 11 can be used for an SRAM drive as a whole.
- the EEPROM 16 has a storage area consisting of addresses 0000 to XXX, and this storage area is a minimum unit for handling data. It is divided into a number of blocks 1 to M of a certain capacity (1 block is usually several kbytes). Of these blocks, blocks 1 to N are data areas for recording normal data. This data area can be accessed directly from the outside of the memory card body 11, and by specifying an address directly through the connector 12, a page consisting of several hundred bytes can be obtained. By repeating data writing and reading in units, data writing and reading can be freely performed in block units.
- Blocks N + 1 to M are rescue areas where data that could not be written to the data area due to a write error is written.
- the rescue area is prohibited from being directly accessed from the outside of the memory card main body 11, and data writing and reading to the rescue area are performed according to instructions of the data input / output control circuit 14.
- FIG. 4 shows a management table of a relief area provided in the EEPROM 16.
- the relief area block It is configured so that the block numbers N10 1 to M correspond one-to-one with the start address of the block in which a write failure has occurred in the data area, and 0 0 before the start address is written. 0 Set to 0.
- the state where blocks N + 1 to Y-1 are already used to remedy write errors is shown, and the top address AAAA to DDDD of the block where the write error occurred in the data area. Are recorded respectively.
- the data input / output control circuit 14 determines that the block X is a write failure if no match is obtained even after performing the write verify process on the block X a predetermined number of times. Then, the data input / output control circuit 14 searches the management table shown in FIG. 4 and searches for a vacant block in the rescue area.
- the data input / output control circuit 14 selects the block Y in the rescue area, writes the data that could not be written in the block X to the block Y, and performs the write verify processing. If the writing is successful, the leading address YYYY of the block X is written in the block number Y of the management table, and the rescue procedure is completed.
- the data input / output control circuit 14 sets the start address of the block in the data area to which reading was requested by an external address. And all the head addresses written in the management table Is controlled so that if a match is found, the data is read out from the block in the rescue area corresponding to the matching start address.
- the data input / output control circuit 14 uses the block of the data area requested to be read externally by an address.
- the head address is compared with all the head addresses written in the management table, and if they match, control is performed so that data is erased from the block in the rescue area corresponding to the matched head address. I do.
- the data input / output control circuit 14 records a use prohibition flag in place of the head address in the block number of the management table where the write failure has occurred.
- the use prohibition flag for example, 111 is selected as an address that does not exist in the data area. Then, if the empty block Y of the retrieved rescue area is badly written, the data input / output control circuit 14 searches the management table for the next empty block Y + 1, and writes the data. It operates so as to perform
- the management table contains, as shown in FIG. 5, all block numbers 1 to including the data area and the rescue area, and the data area. It is configured so that there is a one-to-one correspondence with the leading address of the block where the write failure has occurred, and the use of block numbers that have already been used for regular data recording in the data area is prohibited. 1 11 1 is recorded as a flag, and "0000" is recorded in a block number portion of the data area where data has not yet been recorded.
- the rescue area is full, and data is written to block X in the data area and a write failure occurs. That is, when the data input / output control circuit 14 determines that the block X has a writing failure, the data input / output control circuit 14 searches the management table and searches for empty blocks N + 1 to M in the relief area. When it is determined that there is no free space in the rescue area, the data input / output control circuit 14 searches for empty blocks 1 to N in the data area of the management table.
- the data input / output control circuit 14 writes the data that could not be written to the block X to the block N-1, and the write is verified by the write verify process.
- the head address YYYY of the block X is written in the block number N-1 of the management table, and the rescue procedure is completed here.
- the data area is in the memory card main body 11.
- the area that can be directly accessed from the outside of the memory card that is, the capacity of the data area becomes the entire data recording capacity when the memory card body 11 is viewed from the outside, so the data area is used for rescue.
- the fact that it is used means that the memory card main body 11 has been reduced in total data storage capacity when viewed from the outside, without having to fix it.
- the data input / output control circuit 14 sets the data input / output control circuit 14 to The data in the block (block N-1 in Fig. 5) is automatically transferred to block N + 2 in the vacated relief area, and block N-1 in the data area is vacated. This prevents unnecessary reduction in the total data recording capacity when the memory card body 11 is viewed from the outside.
- the management table is searched for a block having a free area in the rescue area.
- the data that cannot be written to the defective block is transferred to the repair area Since EEPR0M16 in which writing failure has occurred partially can be used as it is, it is economically advantageous and suitable for practical use.
- the rescue area when the rescue area is full, the free block of the data area is used for rescue, and when the block of the rescue area is freed by erasing data, it is used for rescue of the data area.
- the data in the locked block is automatically transferred to the free block in the rescue area, so that more free blocks are secured in the data area, so that the storage area of the EEPROM 16 can be used effectively. Can be.
- FIG. 6 shows another embodiment of the present invention. That is, as shown in FIG. 6, EEPR0M16 has a storage area consisting of addresses 0000 to XXXX, and this storage area is divided into a plurality of blocks 1 to M. I have. In the initial state, each of the blocks 1 to M is a data area for recording normal data. By specifying an address from the outside of the memory card main body 11, the blocks can be freely set in block units. Can write and read data
- FIG. 7 shows a processing table provided in the EEPROM 16. That is, in this management table, the left column in the figure shows block numbers 1 to M, and the right column in the figure shows whether it is a data area or a rescue area. For a block designated as a rescue area, The repair block number corresponds one-to-one with the start address of the defective write block that was rescued by the rescue block. It is configured to be.
- Fig. 7 shows the initial state, and is set to 0 ° 00, indicating that all blocks are unused blocks.
- the data input / output control circuit 14 determines that the block X is a write failure if no match is obtained after performing the write verify process for the block X a predetermined number of times. I do. Then, the data input / output control circuit 14 searches the management table shown in FIG. 7 and searches for an empty block (table content 000000) from the end block number M side.
- the data input / output control circuit 14 selects the block M as the rescue block and writes the block M to the block X.
- the data that did not exist is written, and when the write is completed by the write verify process, the start address YYYY of the block X is written to the block number M of the management tape and written here. Remedy completed o
- the data input / output control circuit 14 selects the block M-1 as a rescue block, and so on. Every time is detected, the blocks with lower numbers, such as -block M-2, M-3,..., are selected as the relief block in order. In this case, the data input / output control circuit 14 determines the position of the block where the write failure block was rescued last, or the next write failure block. If the position of the block where the lock is to be rescued is to be held as a pointer, the process of searching for an empty block can be omitted, which is more efficient.
- Fig. 8 shows the result of performing the above-mentioned remedy for a write-defective block.
- blocks N + 1 to M become relief blocks, and the other blocks 1 to N record data for recording normal data.
- This shows the state of the area.
- data input / output control circuit 14 determines that the block X is a write failure, the data input / output control circuit 14 designates the block N as a rescue block, but the data is already recorded in the block N. I have.
- the data input / output control circuit 14 transfers the data of the block N to the block Y having a free space in the data area, erases the block N, and writes the data to be written to the block X there. Control.
- the data of the last rescued block is transferred to that block, so that an empty block is saved in the multiple rescue blocks. In this way, the storage area of the EEPROM 16 is effectively used by preventing the occurrence of a lock.
- the repair area is not fixedly provided, and the repair blocks are increased each time a write failure block occurs, so that the data area is effectively used. can do.
- the relief block is From block M, the number increases in ascending order, and if there is a block N with data recorded in the middle, the data of block N is transferred to the free block Y in the data area. Since transfer is performed to change block N to a relief block, multiple relief blocks are not scattered in the storage area, and both the data area and the relief block are eliminated. Can be easily managed.
- the data of the last rescued block is transferred to that block, and the EEPROM 16
- the storage area can be used effectively.
- the use state of the block N is checked for the first time, so that the block N-1 is used for rescue before the block N. Check the use status of block N, which will be the next rescue block when it is used, and if it is in use, save the data of block N to another free block. Transferring to a block can be even more efficient.
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP92924030A EP0615193A4 (en) | 1991-11-30 | 1992-11-30 | MEMORY CARD DEVICE. |
US08/211,635 US5483491A (en) | 1991-11-30 | 1992-11-30 | Memory card device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31716991A JP3122201B2 (ja) | 1991-11-30 | 1991-11-30 | メモリカード装置 |
JP3/317169 | 1991-11-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1993011491A1 true WO1993011491A1 (en) | 1993-06-10 |
Family
ID=18085230
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1992/001565 WO1993011491A1 (en) | 1991-11-30 | 1992-11-30 | Memory card device |
Country Status (4)
Country | Link |
---|---|
US (1) | US5483491A (ja) |
EP (1) | EP0615193A4 (ja) |
JP (1) | JP3122201B2 (ja) |
WO (1) | WO1993011491A1 (ja) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0619541A3 (en) * | 1993-04-08 | 1995-03-01 | Hitachi Ltd | Flash memory control method and information processing system therefor. |
US5644539A (en) * | 1991-11-26 | 1997-07-01 | Hitachi, Ltd. | Storage device employing a flash memory |
US6078520A (en) * | 1993-04-08 | 2000-06-20 | Hitachi, Ltd. | Flash memory control method and information processing system therewith |
US6081447A (en) * | 1991-09-13 | 2000-06-27 | Western Digital Corporation | Wear leveling techniques for flash EEPROM systems |
US6347051B2 (en) | 1991-11-26 | 2002-02-12 | Hitachi, Ltd. | Storage device employing a flash memory |
US7120729B2 (en) | 2002-10-28 | 2006-10-10 | Sandisk Corporation | Automated wear leveling in non-volatile storage systems |
US7190617B1 (en) | 1989-04-13 | 2007-03-13 | Sandisk Corporation | Flash EEprom system |
US7447069B1 (en) | 1989-04-13 | 2008-11-04 | Sandisk Corporation | Flash EEprom system |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3154892B2 (ja) * | 1994-05-10 | 2001-04-09 | 株式会社東芝 | Icメモリカードおよびそのicメモリカードの検査方法 |
JP3338755B2 (ja) * | 1996-10-24 | 2002-10-28 | シャープ株式会社 | 半導体記憶装置 |
JP3870486B2 (ja) * | 1997-06-06 | 2007-01-17 | ソニー株式会社 | ハイブリッド記録再生装置及び記録再生方法 |
JP3244031B2 (ja) * | 1997-08-20 | 2002-01-07 | 日本電気株式会社 | 半導体記憶装置 |
TW559814B (en) * | 2001-05-31 | 2003-11-01 | Semiconductor Energy Lab | Nonvolatile memory and method of driving the same |
JP4766781B2 (ja) * | 2001-06-20 | 2011-09-07 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
JP2003338193A (ja) * | 2002-05-21 | 2003-11-28 | Mitsubishi Electric Corp | 半導体メモリモジュール |
US20070272090A1 (en) * | 2006-02-01 | 2007-11-29 | Bommaraju Tilak V | Hydrogen mitigation and energy generation with water-activated chemical heaters |
KR100781976B1 (ko) | 2006-11-02 | 2007-12-06 | 삼성전자주식회사 | 플래시 메모리를 구비하는 반도체 메모리 장치에서의 블록상태 정보 제공방법 |
JP4897524B2 (ja) * | 2007-03-15 | 2012-03-14 | 株式会社日立製作所 | ストレージシステム及びストレージシステムのライト性能低下防止方法 |
US8327066B2 (en) | 2008-09-30 | 2012-12-04 | Samsung Electronics Co., Ltd. | Method of managing a solid state drive, associated systems and implementations |
US8134856B2 (en) * | 2008-11-05 | 2012-03-13 | Qualcomm Incorporated | Data protection scheme during power-up in spin transfer torque magnetoresistive random access memory |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5693198A (en) * | 1979-12-26 | 1981-07-28 | Fujitsu Ltd | Main memory control system |
JPS56163600A (en) * | 1980-05-21 | 1981-12-16 | Fujitsu Ltd | Memory control system |
JPS63219045A (ja) * | 1987-03-09 | 1988-09-12 | Hitachi Ltd | Icカ−ド |
JPS63305444A (ja) * | 1987-06-08 | 1988-12-13 | Mitsubishi Electric Corp | 記憶装置 |
JPH0475152A (ja) * | 1990-07-17 | 1992-03-10 | Fujitsu Ltd | 不揮発メモリシステム |
JPH04123243A (ja) * | 1990-09-14 | 1992-04-23 | Toshiba Corp | データ書込装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0389203A3 (en) * | 1989-03-20 | 1993-05-26 | Fujitsu Limited | Semiconductor memory device having information indicative of presence of defective memory cells |
EP0935255A2 (en) * | 1989-04-13 | 1999-08-11 | SanDisk Corporation | Flash EEPROM system |
JPH05109292A (ja) * | 1991-10-14 | 1993-04-30 | Toshiba Corp | 不揮発性半導体記憶装置 |
-
1991
- 1991-11-30 JP JP31716991A patent/JP3122201B2/ja not_active Expired - Fee Related
-
1992
- 1992-11-30 US US08/211,635 patent/US5483491A/en not_active Expired - Fee Related
- 1992-11-30 EP EP92924030A patent/EP0615193A4/en not_active Withdrawn
- 1992-11-30 WO PCT/JP1992/001565 patent/WO1993011491A1/ja not_active Application Discontinuation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5693198A (en) * | 1979-12-26 | 1981-07-28 | Fujitsu Ltd | Main memory control system |
JPS56163600A (en) * | 1980-05-21 | 1981-12-16 | Fujitsu Ltd | Memory control system |
JPS63219045A (ja) * | 1987-03-09 | 1988-09-12 | Hitachi Ltd | Icカ−ド |
JPS63305444A (ja) * | 1987-06-08 | 1988-12-13 | Mitsubishi Electric Corp | 記憶装置 |
JPH0475152A (ja) * | 1990-07-17 | 1992-03-10 | Fujitsu Ltd | 不揮発メモリシステム |
JPH04123243A (ja) * | 1990-09-14 | 1992-04-23 | Toshiba Corp | データ書込装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP0615193A4 * |
Cited By (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7190617B1 (en) | 1989-04-13 | 2007-03-13 | Sandisk Corporation | Flash EEprom system |
US7447069B1 (en) | 1989-04-13 | 2008-11-04 | Sandisk Corporation | Flash EEprom system |
US6850443B2 (en) | 1991-09-13 | 2005-02-01 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
US6230233B1 (en) | 1991-09-13 | 2001-05-08 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
US7353325B2 (en) | 1991-09-13 | 2008-04-01 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
US6594183B1 (en) | 1991-09-13 | 2003-07-15 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
US6081447A (en) * | 1991-09-13 | 2000-06-27 | Western Digital Corporation | Wear leveling techniques for flash EEPROM systems |
US7002851B2 (en) | 1991-11-26 | 2006-02-21 | Renesas Technology Corp. | Storage device employing a flash memory |
US5644539A (en) * | 1991-11-26 | 1997-07-01 | Hitachi, Ltd. | Storage device employing a flash memory |
US7447072B2 (en) | 1991-11-26 | 2008-11-04 | Solid State Storage Solutions Llc | Storage device employing a flash memory |
US6341085B1 (en) | 1991-11-26 | 2002-01-22 | Hitachi, Ltd. | Storage device employing a flash memory |
US6347051B2 (en) | 1991-11-26 | 2002-02-12 | Hitachi, Ltd. | Storage device employing a flash memory |
US7379379B2 (en) | 1991-11-26 | 2008-05-27 | Solid State Storage Solutions Llc | Storage device employing a flash memory |
US6567334B2 (en) | 1991-11-26 | 2003-05-20 | Hitachi, Ltd. | Storage device employing a flash memory |
US7327624B2 (en) | 1991-11-26 | 2008-02-05 | Solid State Storage Solutions, Llc | Storage device employing a flash memory |
US6788609B2 (en) | 1991-11-26 | 2004-09-07 | Renesas Technology Corp. | Storage device employing a flash memory |
US6130837A (en) * | 1991-11-26 | 2000-10-10 | Hitachi, Ltd. | Storage device employing a flash memory |
US7184320B2 (en) | 1991-11-26 | 2007-02-27 | Renesas Technology Corp. | Storage device employing a flash memory |
US7064995B2 (en) | 1991-11-26 | 2006-06-20 | Renesas Technology Corp. | Storage device employing a flash memory |
US7006386B2 (en) | 1991-11-26 | 2006-02-28 | Renesas Technology Corp. | Storage device employing a flash memory |
US6925012B2 (en) | 1991-11-26 | 2005-08-02 | Renesas Technology Corp. | Storage device employing a flash memory |
US7082510B2 (en) | 1991-11-26 | 2006-07-25 | Renesas Technology Corp. | Storage device employing a flash memory |
US7154805B2 (en) | 1991-11-26 | 2006-12-26 | Renesas Technology Corp. | Storage device employing a flash memory |
US7123519B2 (en) | 1991-11-26 | 2006-10-17 | Renesas Technology Corp. | Storage device employing a flash memory |
EP0619541A3 (en) * | 1993-04-08 | 1995-03-01 | Hitachi Ltd | Flash memory control method and information processing system therefor. |
US5862083A (en) * | 1993-04-08 | 1999-01-19 | Hitachi, Ltd. | Information processing system |
US6078520A (en) * | 1993-04-08 | 2000-06-20 | Hitachi, Ltd. | Flash memory control method and information processing system therewith |
US5973964A (en) * | 1993-04-08 | 1999-10-26 | Hitachi, Ltd. | Flash memory control method and information processing system therewith |
US6421279B1 (en) | 1993-04-08 | 2002-07-16 | Hitachi, Ltd. | Flash memory control method and apparatus processing system therewith |
US5530673A (en) * | 1993-04-08 | 1996-06-25 | Hitachi, Ltd. | Flash memory control method and information processing system therewith |
US6275436B1 (en) | 1993-04-08 | 2001-08-14 | Hitachi, Ltd | Flash memory control method and apparatus processing system therewith |
US7120729B2 (en) | 2002-10-28 | 2006-10-10 | Sandisk Corporation | Automated wear leveling in non-volatile storage systems |
US7552272B2 (en) | 2002-10-28 | 2009-06-23 | Sandisk Corporation | Automated wear leveling in non-volatile storage systems |
Also Published As
Publication number | Publication date |
---|---|
US5483491A (en) | 1996-01-09 |
EP0615193A1 (en) | 1994-09-14 |
EP0615193A4 (en) | 1995-03-08 |
JP3122201B2 (ja) | 2001-01-09 |
JPH05151098A (ja) | 1993-06-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO1993011491A1 (en) | Memory card device | |
US7616485B2 (en) | Semiconductor memory device having faulty cells | |
US6731537B2 (en) | Non-volatile memory device and data storing method | |
EP0907142B1 (en) | Memory card apparatus | |
US7007140B2 (en) | Storage device, storage device controlling method, and program | |
US5724544A (en) | IC memory card utilizing dual eeproms for image and management data | |
JP3122222B2 (ja) | メモリカード装置 | |
JPWO2005083573A1 (ja) | 半導体メモリ装置 | |
JPH05150913A (ja) | フラツシユメモリを記憶媒体としたシリコンデイスク | |
JPH0546490A (ja) | メモリカード装置 | |
JP3117244B2 (ja) | Eepromの制御装置 | |
JP3609739B2 (ja) | 半導体記憶装置 | |
JP3099908B2 (ja) | Eepromの制御装置 | |
JP3163124B2 (ja) | 電子スチルカメラ装置 | |
JPH0546488A (ja) | メモリカード装置 | |
JPH06139138A (ja) | メモリカード装置 | |
JPH04313882A (ja) | メモリカードの記録管理方式 | |
JPH06139131A (ja) | メモリカード装置 | |
JPH05151099A (ja) | メモリカード装置 | |
JPH05151106A (ja) | メモリカード装置 | |
JP3406622B2 (ja) | メモリカード装置 | |
JPH05313989A (ja) | メモリカード装置 | |
JPH05314020A (ja) | メモリカード装置 | |
JPH0547190A (ja) | メモリカード装置 | |
JPH10302483A (ja) | 半導体記憶装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): DE FR GB |
|
WWE | Wipo information: entry into national phase |
Ref document number: 08211635 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1992924030 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 1992924030 Country of ref document: EP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 1992924030 Country of ref document: EP |