WO1993013903A1 - Procede de brasage - Google Patents
Procede de brasage Download PDFInfo
- Publication number
- WO1993013903A1 WO1993013903A1 PCT/JP1992/000032 JP9200032W WO9313903A1 WO 1993013903 A1 WO1993013903 A1 WO 1993013903A1 JP 9200032 W JP9200032 W JP 9200032W WO 9313903 A1 WO9313903 A1 WO 9313903A1
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- WO
- WIPO (PCT)
- Prior art keywords
- probe
- brazing
- contact
- laser beam
- tip
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/067—Dividing the beam into multiple beams, e.g. multifocusing
- B23K26/0676—Dividing the beam into multiple beams, e.g. multifocusing into dependently operating sub-beams, e.g. an array of spots with fixed spatial relationship or for performing simultaneously identical operations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/02—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for soldered or welded connections
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/005—Soldering by means of radiant energy
- B23K1/0056—Soldering by means of radiant energy soldering by means of beams, e.g. lasers, E.B.
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/0604—Shaping the laser beam, e.g. by masks or multi-focusing by a combination of beams
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/02—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for soldered or welded connections
- H01R43/0221—Laser welding
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3494—Heating methods for reflowing of solder
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01025—Manganese [Mn]
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0104—Zirconium [Zr]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01067—Holmium [Ho]
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- H01L2924/01068—Erbium [Er]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01082—Lead [Pb]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3447—Lead-in-hole components
Definitions
- the present invention relates to a method for brazing electronic components and the like.
- Conventional technology
- soldering has been used in the electronics industry.
- soldering in addition to soldering, soldering, flow soldering such as immersion, liquid immersion, ultrasonic immersion, etc .: infrared method, hot air Reflow soldering methods such as the electrical method, electrical resistance method, ultrasonic method, laser method, and high frequency induction method are also used.
- the laser method can focus the laser light as fine spots, so that it can be suitable for miniaturization of electronic equipment and miniaturization of elements, and its output is electrically or optically.
- advantages such as easy control.
- the brazing material is non-contact type, there is an advantage that no impurities are mixed into the brazing material.
- the rate of heat rise is slow, which causes a decrease in the brazing speed.
- the laser beam has high convergence, it has a certain degree of diffusivity. Therefore, as shown in FIGS. 27 and 28, a material that is not desired to be heated, for example, a portion of the base material 1 is heated. This can result in thermal damage to that area.
- a main object of the present invention is to provide a brazing method that can perform brazing sufficiently at a low output and can surely heat only a target heating portion. Disclosure of the invention
- the laser beam is incident on a probe through which the laser beam can pass, and is emitted from a tip portion thereof.
- the tip is brought into substantial contact with a brazing material or a member to be joined.
- the probe since the probe is substantially in contact with the brazing material or the workpiece, there is no energy loss due to the radiation of the laser beam into the air, and the laser beam is transmitted to the brazing forest or the workpiece. As a result, the laser beam can be brazed even at a low output. Further, even if the laser beam is reflected on the filter material or the surface of the member to be joined, the reflected light is reflected on the surface of the probe and is again incident on the brazing material or the member to be joined, so that loss due to reflection is small. In addition, by setting the shape of the probe and the emission site, it is possible to limit the spot of the laser beam, thereby heating only the brazing material or the member to be joined, and preventing the base material from being thermally damaged.
- a recess having substantially the same shape as the contact surface of the brazing material or the member to be joined so that the tip of the probe comes into surface contact with the brazing material or the member to be joined. it can. This makes it possible to make the laser light more efficiently enter the brazing material or the member to be joined.
- a layer having an infrared ray converting means for converting a part of laser light or an infrared ray which is easy to be absorbed by a material to be irradiated may be formed at a contact portion at a tip of the probe. It can. In this case, visible light may be emitted in addition to infrared light.
- the laser light scattering means unlike the conventional non-contact linear irradiation from the same direction in the non-contact method, it is possible to irradiate the brazing material or the surface of the workpiece from all directions. Even in the case of irradiation, the degree of reflection is reduced, and the irradiation efficiency is thereby increased.
- infrared ray conversion means for example, infrared radiation particles are included in the layer, the laser light is absorbed by the infrared radiation particles and converted into infrared light, and the infrared light and the unabsorbed laser light are filtered. Since the laser beam or the member to be joined is irradiated, brazing at a lower output can be performed as compared with the case of simply irradiating a single laser beam.
- a supply hole for supplying the brazing material and a cooling medium passage for supplying the cooling medium, which passes through the inside of the probe and reaches the contact portion, can be formed.
- Detects the amount of laser beam returned from the incident surface of the probe controls the amount of incident laser beam as an index of the temperature of the irradiated area, and passes the brazing material through the probe.
- a temperature probe is placed in contact with or in close proximity to the laser, and based on the temperature signal from this temperature probe, By controlling the gear, appropriate brazing control can be performed.
- FIG. 1 is a cross-sectional view of a brazing start state in the first embodiment
- FIG. 2 is a cross-sectional view of a molten state of the brazing material
- FIG. 3 is a detailed view of FIG. 1
- FIG. 4 is an example of a probe holding structure.
- FIG. 5 is an explanatory view in the case of using a probe having a concave portion
- FIG. 6 is a cross-sectional view of a main portion of the probe having the concave and convex portions
- FIG. 7 is a diagram showing a laser light scattering means and a heat ray emitting means.
- FIG. 8 is a cross-sectional view of a main part of a probe having a layer provided thereon
- FIG. 8 is a cross-sectional view of a main part of a probe having a layer provided thereon
- FIG. 8 is a cross-sectional view of a main part of an embodiment in which irregularities are further formed
- FIG. Fig. 10 is a front view of an example of interconnecting conductors
- Fig. 11 is a longitudinal sectional view
- Fig. 12 is an overall view of the brazing equipment
- Fig. 13 is the return of laser light.
- Fig. 14 is a graph showing its characteristics
- Fig. 15 is a schematic diagram of another temperature detection example
- Figs. 16 to 19 are Perspective view of the example
- Fig. 20 is a schematic view of an example using a semiconductor laser
- Fig. 21 is a vertical cross-sectional view of a handpiece
- Fig. 22 is a state in which electronic components are brazed to a printed board.
- Fig. 10 is a front view of an example of interconnecting conductors
- Fig. 11 is a longitudinal sectional view
- Fig. 12 is an overall view of the brazing equipment
- Fig. 13 is the
- Fig. 23 to Fig. 25 are explanatory diagrams of the brazing mode by the Tayaro method
- Fig. 26 is a schematic diagram of a continuous brazing line
- Fig. 27 is a conventional brazing by laser beam irradiation
- Fig. 28 is a schematic diagram of the brazing method and the molten state of the brazing material.
- FIG. 1 to FIG. 3 and FIG. 12 show the first embodiment, in which a laser beam from a laser beam generator 12 excited by a laser beam generating power supply 11 is emitted.
- Has a half mirror 13 for temperature detection and a condenser lens 14 Then, the light enters the rear end of the optical fiber 15 and is emitted from the front end.
- a contact probe 20 according to the present invention is disposed in front of the tip of the optical fiber 115, and a laser beam is emitted from the rear end of the contact probe 20.
- a workpiece 2 is placed on a base material 1, for example, a metal base material, and a brazing material, for example, a formed brazing material 3 is coated thereon.
- a brazing material for example, a formed brazing material 3 is coated thereon.
- the probe 20 descends, the tip of the probe 20 comes into contact with the brazing material 3, and one laser beam is emitted from the tip of the probe 20.
- the brazing filler metal 3 most of the laser beam is incident on the brazing filler metal 3 and is used as a melting energy.
- the brazing material 3 shows a flow state according to the surface tension of the material.
- the probe 20 can be fixed at the initial contact position, but the contact area can be increased by lowering the probe 20 as the flow proceeds.
- the brazing material 3 is completely melted, move the probe 20 up and away and wait for the next brazing material to be carried in.
- a laser beam is emitted through the probe 20 and a single c- laser light is incident on the probe 20.
- some light is emitted from the outer surface, but is reflected toward the tip. Therefore, as shown in detail in FIG. 3, laser beams are emitted from the tip of the probe 20 in various directions.
- the surface of the brazing filler metal 3 is irradiated with laser light from various directions to the surface of the brazing filler metal 3 in this embodiment, instead of the linear irradiation as in the conventional case.
- the present invention although a part of the laser beam is reflected on the surface of the brazing filler metal 3, Compared to the conventional example, the amount of one laser beam incident along the normal direction As a whole, the amount of reflected laser light is reduced as a whole, and efficient irradiation can be performed.
- FIG. 4 shows an example of a connection structure between the optical fiber 115 and the probe 20.
- the optical fiber 115 is held in the holder 16 and the male end is attached to the tip of the holder 16.
- the connector 17 and the female connector 18 are screwed together, and the probe 20 can be fixed to the end of the female connector 18 by caulking or the like. In this case, since the laser light output is low, it is generally not necessary.
- the holder 16 and the connector 11 ⁇ , 18 and the optical fiber 15 to provide a small gap, and supply air or cooling water W to the gap from the water supply port 16a to cool the rear end of the probe 20. Can be.
- the cooling water W used for cooling flows out from the drain port 18a to the outside.
- the material of the probe according to the present invention is not fundamentally limited as long as it transmits laser light and has heat resistance, but it is not limited to artificial or natural diamond or sapphire.
- inorganic materials such as quartz, single-crystal zirconium oxide, and high-melting glass, translucent heat-resistant plastics may be used.
- the laser beam is scattered from the tip of the probe or converted into infrared light, and the infrared light is emitted.
- the surface of the probe 20 can be processed to have irregularities 20a (clouding).
- a layer containing a scattering powder 22A of laser light may be formed on the uneven surface 20a as shown in FIG.
- a material having a higher refractive index of the laser light than the material of the probe 20 described above or the above-described example material is selected.
- Can be This material can be formed as a layer by means such as coating using a material that transmits laser light as a binder.
- an infrared conversion powder 22B such as carbon, graphite, iron oxide, and manganese oxide can be used.
- a concave portion 21 A having a shape strictly or substantially along the outer surface of the forming filter material 3. It is.
- the above-mentioned diffused infrared ray generating layer 23 can be formed in the concave portion 21A.
- a reflective film of laser light such as gold or aluminum can be formed by plating o
- FIG. 5 shows the inside of the program 21. The relationship between the position along the central longitudinal section line and the intensity (power density) of the laser beam is shown. From this graph, it can be seen that in order to efficiently irradiate the laser beam with a small output, it is effective to form the concave portion of the probe tip shape according to the brazing mode.
- a probe 21 having a concave portion 21A shaped along the outer shape of the conductor 2A is prepared, and a wax molding is formed on both sides of the joint portion of the conductor 2A. It is possible to melt and braze the molded filter media 3A, 3A while preventing the movement of the conductor 2A by the probe 21 in contact with it. it can.
- brazing it is possible to perform brazing by pinching the abutting portions of the conductors 2A and 2A with the probes 21 and 21 having the recesses 21A. it can.
- the brazing material is provided in the abutting portion in advance, and a supply hole 24 for the brazing material is formed in the probe 21 as shown in FIG.
- the brazing can be performed after or while supplying the particulate brazing material.
- the probe 20 can be used to manage brazing.
- a laser beam L preferably a laser beam in the infrared region having a wavelength of 0.7 / im or more, for example, one YAG laser beam (wavelength 1.06 ⁇ m) is converted into a half mirror 1
- the reflected light from the tip returns from the back of the probe 20 to the incident side, and this is used for the wavelength 1.06.
- an optical sensor 52 such as lead sulfide detects the component intensity of the wavelength 2.
- the tip probe temperature can be detected in correlation with the tip probe temperature.
- an insertion hole 25 is formed at an appropriate position of the probe 20, for example, at the center, and a temperature detection sensor 26 such as a thermocouple is inserted into the insertion hole 25.
- a temperature detection sensor 26 such as a thermocouple is inserted into the insertion hole 25.
- the temperature of the brazing material 3 can be directly detected. In this case, as long as the tip diameter of the through-hole 25 is small, the brazing material does not enter the through-hole 25 due to its surface tension.
- Figure 12 shows an example of a brazing system.
- the arithmetic and control unit 50 drives the laser beam generating power supply 11 via the interface 53 and the power supply controller 54, and the laser from the laser light generator 12 is excited by this.
- One light is incident on the rear end of the optical fiber 15 via the temperature detecting half mirror 13 and the condenser lens 14 and is emitted from the front end.
- the contact probe of the above-described embodiment for example, the probe 21, is placed, and a laser beam enters from the rear end of the contact probe 21, and the brazing material enters from the tip. It is emitted to 3 or the member 2 to be joined.
- the brazing material is supplied from the brazing material storage tank 55 to the brazing material supply hole 24 formed in the probe 21. From this brazing material storage tank 55 or another storage tank, flux as well as brazing material can be supplied from the supply holes 24. Controlling the melting and cooling of the brazing material is often preferred for proper brazing. Therefore, a cooling medium supply path 27 is formed in the probe 21 so that, for example, the cool air from the cool air generator 56 is supplied from the supply pipe 57 and the supply path 27 to the tip of the probe 21. it can.
- positioning means 59 for raising and lowering the holding head 58 and moving the holding head 58 to an arbitrary position in the horizontal direction is provided. I have.
- the positioning means 59 is driven via a controller 160 by a signal from the arithmetic and control unit 50.
- a contact or optical non-contact position detector 61 is provided and its position Based on the signal, the positioning means 59 is driven, and the holding head 58 is moved up and down and horizontally positioned.
- a carry-in or supply signal of the base material 1, the workpiece 2 and the brazing material 3, and the like are also taken into the arithmetic and control unit 50.
- 62 is a brazing filler supply controller
- 63 is a cool air supply controller
- 64 is a display means such as a CRT display device.
- cooling medium such as water, or a reducing atmosphere gas such as nitrogen or an inert gas such as argon can be supplied from the supply path 27. In the latter case, it is effective for preventing oxidation of the joint.
- a plurality of probes can be mounted on the holding head, and each probe can be moved in common.
- a means for moving the holiday probe can be provided together with the common means for moving the holding head.
- the shape of the probe according to the present invention is not limited.
- the probe 201 is cylindrical and the tip is flat, and the through hole 20 is cylindrical as shown in Fig. 17 and the center is circular in cross section.
- a probe 204 having a bent portion 204a at the tip of the main body portion of the shape may be mentioned.
- the tips of various probes are flat and As described above, a concave portion may be formed, an arc portion may be formed, or any other appropriate shape may be used according to the purpose.
- the through hole 202a. Can be used as a supply path for a brazing filler metal, an insertion hole for temperature detection means, or a supply path for a cooling medium.
- the laser light from the laser light generator 12 is optically connected to the probe via the optical fiber 15, but as shown in FIGS. 20 and 21,
- the diode laser 130 is driven by the laser light generation power supply 11 to generate laser light, which can be directly incident on the probe 20 directly through the condenser lens 14. it can.
- the diode laser 130 a small one is commercially available, so it should be housed in the holder 131 and be structured to hold the condenser lens 14 and the probe 20. Thus, a very inexpensive and small one can be obtained.
- ⁇ 32> is a conducting wire.
- FIG. 22 shows a mode in which the terminals of electronic components such as the IC chip 35 and the capacitor 36 are brazed to the portions where the printed wiring 34 has been previously formed on the substrate 33.
- FIGS. 23 to 25 show the mode of brazing the IC chip 35 to the base material 1 by the reflow method.
- the (A) stage in each figure shows the mode of supplying the brazing material, and (B) shows the IC mode.
- the set state of the chip 35 is shown, and (C) shows the state of brazing by laser light irradiation.
- Fig. 23 shows the brazing material 3B layer previously formed on the surface of the base material 1 by plating
- Fig. 24 shows the brazing material 3C arranged
- Fig. 24 shows the In this case, 3D brazing material is used.
- the laser beam can be directly applied to the member 3 to be joined.
- the transport table 37 is intermittently fed from the supply table 38 to the board 33, for example.
- the parts to be brazed are set by the parts supply robot 39 installed on the upstream side of the transfer table 37, and the set semi-finished product is supplied onto the transfer table 37.
- the brazing can be performed by a brazing robot 40 provided on the downstream side, and the product can be temporarily stored in the stock yard 41 temporarily.
- the head 39 A of the parts supply port bot 39 and the head 4 OA of the brazing robot 40 can move freely along the X-axis and Y-axis in the horizontal plane as it moves up and down. Has become.
- the laser light used as mentioned above, YAG laser, holo Mi Yuumu YAG laser first light, erbium YAG laser light, other diode laser beam, Yotsute to C 0 2 laser beam of throat purposes It can be selected as appropriate.
- brazing material examples include Sn-Pb, Sn, Pb, Au, In, and A1. Further, an appropriate flux can be used for brazing.
- the optical fiber when the generated laser light is transmitted through an optical fiber as a probe, the optical fiber itself is brought into contact with a filter medium or a member to be joined without using the above-mentioned probe. Since the same effect is obtained even when used in this way, a probe including the optical fiber in this case is used. Further, in this case, a concave portion may be formed at the tip of the optical fiber probe, or the above-mentioned scattering means or infrared conversion means may be provided. By breaking the cladding at the end of the optical fiber to expose the core, the laser beam can be emitted from the side.
- the optical fiber can also be embedded in a separate probe and integrated. Industrial applicability As described above, according to the present invention, it is possible to sufficiently perform brazing at a low output and to surely heat only a target heating portion.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Laser Beam Processing (AREA)
Description
Claims
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019930702220A KR970004225B1 (ko) | 1992-01-17 | 1992-01-17 | 납땜방법 |
RU9293054775A RU2095206C1 (ru) | 1992-01-17 | 1992-01-17 | Способ пайки |
DE69211850T DE69211850T2 (de) | 1992-01-17 | 1992-01-17 | Verfahren zum löten |
DE0584356T DE584356T1 (de) | 1992-01-17 | 1992-01-17 | Verfahren zum löten. |
EP92903329A EP0584356B1 (en) | 1992-01-17 | 1992-01-17 | Method of soldering |
PCT/JP1992/000032 WO1993013903A1 (fr) | 1992-01-17 | 1992-01-17 | Procede de brasage |
AU11690/92A AU662893B2 (en) | 1992-01-17 | 1992-01-17 | Method of brazing |
US07/852,050 US5272310A (en) | 1992-01-17 | 1992-03-16 | Soldering method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1992/000032 WO1993013903A1 (fr) | 1992-01-17 | 1992-01-17 | Procede de brasage |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1993013903A1 true WO1993013903A1 (fr) | 1993-07-22 |
Family
ID=14042129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1992/000032 WO1993013903A1 (fr) | 1992-01-17 | 1992-01-17 | Procede de brasage |
Country Status (7)
Country | Link |
---|---|
US (1) | US5272310A (ja) |
EP (1) | EP0584356B1 (ja) |
KR (1) | KR970004225B1 (ja) |
AU (1) | AU662893B2 (ja) |
DE (2) | DE69211850T2 (ja) |
RU (1) | RU2095206C1 (ja) |
WO (1) | WO1993013903A1 (ja) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6471115B1 (en) | 1990-02-19 | 2002-10-29 | Hitachi, Ltd. | Process for manufacturing electronic circuit devices |
US6227436B1 (en) * | 1990-02-19 | 2001-05-08 | Hitachi, Ltd. | Method of fabricating an electronic circuit device and apparatus for performing the method |
US5904868A (en) * | 1994-06-16 | 1999-05-18 | International Business Machines Corporation | Mounting and/or removing of components using optical fiber tools |
US5847356A (en) * | 1996-08-30 | 1998-12-08 | Hewlett-Packard Company | Laser welded inkjet printhead assembly utilizing a combination laser and fiber optic push connect system |
US6286746B1 (en) * | 1997-08-28 | 2001-09-11 | Axya Medical, Inc. | Fused loop of filamentous material and apparatus for making same |
RU2135338C1 (ru) * | 1998-05-15 | 1999-08-27 | Товарищество с ограниченной ответственностью научно-производственная фирма "МГМ" | Устройство для лазерной обработки материалов |
US6758610B2 (en) | 2001-12-10 | 2004-07-06 | Jds Uniphase Corporation | Optical component attachment to optoelectronic packages |
ITMI20012837A1 (it) * | 2001-12-28 | 2003-06-28 | Abb Service Srl | Metodo per la saldatura di placchette di contatto ed elementi di contatto ottenuti con tale metodo |
KR100688507B1 (ko) * | 2004-12-08 | 2007-03-02 | 삼성전자주식회사 | 반도체 칩 검사 장치 및 이를 이용한 반도체 칩 검사 방법 |
JP2009536044A (ja) * | 2006-04-18 | 2009-10-08 | アクシーア メディカル インコーポレイテッド | 複数材料構成の溶融縫合糸及びその製造用装置 |
DE102008002910A1 (de) * | 2008-06-26 | 2010-01-07 | Reis Lasertec Gmbh | Verfahren und Vorrichtung zum Verbinden von Bauteilen mittels Laserstrahlung |
RU2383416C1 (ru) * | 2008-12-16 | 2010-03-10 | Закрытое акционерное общество Научно-исследовательский институт Электронного специального технологического оборудования | Устройство для лазерной обработки материалов |
DE102009017659A1 (de) | 2009-04-16 | 2010-10-28 | Schott Ag | Verfahren zur leitenden Verbindung eines Bauelementes auf einem transprenten Substrat |
JP2013219404A (ja) * | 2013-08-02 | 2013-10-24 | Sumida Corporation | アンテナ部品の製造方法 |
DE102015013312B4 (de) | 2015-10-13 | 2023-06-15 | Hochschule Mittweida (Fh) | Verfahren und Einrichtung zum schnellen stoffschlüssigen Löten von Körpern odervon Schichten oder von Körpern und Schichten mit Laserstrahlen |
EP3340287B1 (en) * | 2016-12-23 | 2020-10-28 | Huawei Technologies Co., Ltd. | Pattern-based temperature measurement for a bonding device and a bonding system |
RU183152U1 (ru) * | 2017-11-07 | 2018-09-12 | ООО "Евроинтех" | Установка для лазерной пайки |
KR102480461B1 (ko) * | 2017-11-30 | 2022-12-21 | 쌩-고벵 글래스 프랑스 | 차량용 창유리의 터미널 솔더링 장치 및 방법 |
DE102019124334A1 (de) * | 2019-09-11 | 2021-03-11 | Hesse Gmbh | Bondanordnung und Bondwerkzeug |
DE102020102938A1 (de) * | 2020-02-05 | 2021-08-05 | Marelli Automotive Lighting Reutlingen (Germany) GmbH | Schaltungsträgerplatte und Verfahren zum Herstellen einer Schaltungsträgerplatte |
CN114260649B (zh) * | 2021-12-09 | 2024-03-12 | 扬州盛威封头有限公司 | 封头温压成型工艺 |
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JPS58173093A (ja) * | 1982-04-05 | 1983-10-11 | Toshiba Corp | ワイヤボンデイング方法 |
JPS6350867Y2 (ja) * | 1982-09-14 | 1988-12-27 | ||
JPH02213075A (ja) * | 1989-02-14 | 1990-08-24 | Matsushita Electric Ind Co Ltd | リードの接合方法 |
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US3304403A (en) * | 1963-10-14 | 1967-02-14 | Texas Instruments Inc | Laser welding of contacts |
US3463898A (en) * | 1965-07-09 | 1969-08-26 | Tokyo Shibaura Electric Co | Welding device utilizing laser beams |
US4736743A (en) * | 1986-05-12 | 1988-04-12 | Surgical Laser Technology, Inc. | Vaporization contact laser probe |
JPS6350867A (ja) * | 1986-08-21 | 1988-03-03 | Minolta Camera Co Ltd | 静電潜像現像剤用キヤリア |
US4893742A (en) * | 1988-12-21 | 1990-01-16 | Hughes Aircraft Company | Ultrasonic laser soldering |
US4906812A (en) * | 1988-12-22 | 1990-03-06 | General Electric Company | Fiber optic laser joining apparatus |
US4970365A (en) * | 1989-09-28 | 1990-11-13 | International Business Machines Corporation | Method and apparatus for bonding components leads to pads located on a non-rigid substrate |
-
1992
- 1992-01-17 WO PCT/JP1992/000032 patent/WO1993013903A1/ja active IP Right Grant
- 1992-01-17 EP EP92903329A patent/EP0584356B1/en not_active Expired - Lifetime
- 1992-01-17 AU AU11690/92A patent/AU662893B2/en not_active Ceased
- 1992-01-17 DE DE69211850T patent/DE69211850T2/de not_active Expired - Fee Related
- 1992-01-17 KR KR1019930702220A patent/KR970004225B1/ko not_active Expired - Fee Related
- 1992-01-17 RU RU9293054775A patent/RU2095206C1/ru active
- 1992-01-17 DE DE0584356T patent/DE584356T1/de active Pending
- 1992-03-16 US US07/852,050 patent/US5272310A/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58173093A (ja) * | 1982-04-05 | 1983-10-11 | Toshiba Corp | ワイヤボンデイング方法 |
JPS6350867Y2 (ja) * | 1982-09-14 | 1988-12-27 | ||
JPH02213075A (ja) * | 1989-02-14 | 1990-08-24 | Matsushita Electric Ind Co Ltd | リードの接合方法 |
Non-Patent Citations (1)
Title |
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See also references of EP0584356A4 * |
Also Published As
Publication number | Publication date |
---|---|
EP0584356B1 (en) | 1996-06-26 |
AU662893B2 (en) | 1995-09-21 |
DE69211850T2 (de) | 1996-10-24 |
DE69211850D1 (de) | 1996-08-01 |
KR930703722A (ko) | 1993-11-30 |
DE584356T1 (de) | 1994-11-03 |
US5272310A (en) | 1993-12-21 |
KR970004225B1 (ko) | 1997-03-26 |
EP0584356A1 (en) | 1994-03-02 |
RU2095206C1 (ru) | 1997-11-10 |
AU1169092A (en) | 1993-08-03 |
EP0584356A4 (en) | 1994-07-06 |
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