WO1998051993A1 - Dispositif servant a mesurer une hauteur - Google Patents

Dispositif servant a mesurer une hauteur Download PDF

Info

Publication number: WO1998051993A1
Authority: WO; WIPO (PCT)
Prior art keywords: height; optical; sample; pair; detecting
Prior art date: 1997-05-16

Application number

PCT/JP1998/002160

Other languages

English (en)

French (fr)

Inventor

Masahiro Aoki

Chikara Abe

Original Assignee

Olympus Optical Co., Ltd.

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1997-05-16

Filing date

1998-05-15

Publication date

1998-11-19

1998-05-15 Application filed by Olympus Optical Co., Ltd. filed Critical Olympus Optical Co., Ltd.

1998-05-15 Priority to US09/214,414 priority Critical patent/US6428171B1/en

1998-11-19 Publication of WO1998051993A1 publication Critical patent/WO1998051993A1/ja

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices By Optical Means (AREA)
Measurement Of Optical Distance (AREA)

PCT/JP1998/002160 1997-05-16 1998-05-15 Dispositif servant a mesurer une hauteur WO1998051993A1 (fr)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
US09/214,414 US6428171B1 (en)	1997-05-16	1998-05-15	Height measuring apparatus

Applications Claiming Priority (8)

Application Number	Priority Date	Filing Date	Title
JP9/127189		1997-05-16
JP12718997		1997-05-16
JP9/257284		1997-09-22
JP25728497		1997-09-22
JP9/258550		1997-09-24
JP25855097		1997-09-24
JP6270798		1998-03-13
JP10/62707		1998-03-13

Publications (1)

Publication Number	Publication Date
WO1998051993A1 true WO1998051993A1 (fr)	1998-11-19

Family

ID=27464208

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
PCT/JP1998/002160 WO1998051993A1 (fr)	1997-05-16	1998-05-15	Dispositif servant a mesurer une hauteur

Country Status (2)

Country	Link
US (1)	US6428171B1 (ja)
WO (1)	WO1998051993A1 (ja)

Cited By (9)

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JP2002311388A (ja) *	2001-04-19	2002-10-23	Nikon Corp	光学系
US6572139B2 (en) *	1998-11-27	2003-06-03	Hamamatsu Photonics K.K.	Occupant sensor and airbag control apparatus
US7336833B2 (en)	2004-06-30	2008-02-26	Given Imaging, Ltd.	Device, system, and method for reducing image data captured in-vivo
US7553276B2 (en)	2001-01-16	2009-06-30	Given Imaging Ltd.	Method and device for imaging body lumens
JP2012194085A (ja) *	2011-03-17	2012-10-11	Mitsubishi Electric Corp	エッジ検出装置
US8639314B2 (en)	2003-12-24	2014-01-28	Given Imaging Ltd.	Device, system and method for in-vivo imaging of a body lumen
KR101830785B1 (ko) *	2016-09-30	2018-02-21	기가비스주식회사	3차원 형상 측정장치
WO2018096728A1 (ja) *	2016-11-24	2018-05-31	株式会社新川	ボンディング装置および被写体の高さ検出方法
KR102040016B1 (ko) *	2018-07-19	2019-11-05	한국과학기술연구원	레이저와 거울을 이용한 높이 측정 시스템 및 상기 시스템에 의해 수행되는 높이 측정 방법

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DE10029680B4 (de) *	2000-06-23	2016-06-16	Leica Microsystems Cms Gmbh	Mikroskop-Aufbau
DE10328537B4 (de) *	2003-06-24	2015-03-26	Pixargus Gmbh	Vorrichtung und Verfahren zum Vermessen der Dimension eines Körpers
US7102740B2 (en) *	2003-09-03	2006-09-05	Xyratex Technology Ltd.	Method and system for determining surface feature characteristics using slit detectors
RU2253880C1 (ru) *	2004-03-29	2005-06-10	Военно-космическая академия им. А.Ф. Можайского	Высотомер летательного аппарата
US20050285025A1 (en) *	2004-06-29	2005-12-29	Mikhail Boukhny	Optical noninvasive pressure sensor
GB0416583D0 (en) *	2004-07-23	2004-08-25	Rwl Consultants Ltd	Access monitoring apparatus
JP2009058341A (ja) *	2007-08-31	2009-03-19	Sanyo Electric Co Ltd	ビーム照射装置およびレーザレーダ
KR20090062027A (ko) *	2007-12-12	2009-06-17	삼성전기주식회사	3차원자세측정장치 및 이를 이용한 3차원자세측정방법
EP2344019B1 (en) *	2008-07-25	2013-11-27	Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt (GmbH)	Quantitative multi-spectral opto-acoustic tomography (msot) of tissue biomarkers
JP2010091289A (ja) *	2008-10-03	2010-04-22	Topcon Corp	光波距離測定装置
EP2449362B1 (en)	2009-06-29	2016-09-28	Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt (GmbH)	Thermoacoustic imaging with quantitative extraction of absorption map
EP2459987A1 (en)	2009-07-27	2012-06-06	Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt (GmbH)	Imaging device and method for optoacoustic imaging of small animals
ES2596655T3 (es) *	2010-02-01	2017-01-11	Illumina Inc.	Procedimientos de enfoque y sistemas y conjuntos ópticos que usan los mismos
WO2012030595A2 (en)	2010-08-30	2012-03-08	Alcon Research, Ltd.	Optical sensing system including electronically switched optical magnification
US9219885B2 (en) *	2011-08-24	2015-12-22	Delta Design, Inc.	Imaging system with defocused and aperture-cropped light sources for detecting surface characteristics
RU2501036C1 (ru) *	2012-08-10	2013-12-10	Александр Абрамович Часовской	Высотомер
EP2742854B1 (en)	2012-12-11	2021-03-10	iThera Medical GmbH	Handheld device and method for tomographic optoacoustic imaging of an object
EP2754388B1 (en)	2013-01-15	2020-09-09	Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt GmbH	System and method for quality-enhanced high-rate optoacoustic imaging of an object
US9720218B2 (en) *	2013-08-06	2017-08-01	Howard Hughes Medical Institute	Volume imaging
US9115980B2 (en) *	2013-09-25	2015-08-25	Seagate Technology, Llc	Row bar thickness measurement device, system and methods
JP6358735B2 (ja) *	2014-02-26	2018-07-18	オリンパス株式会社	光音響顕微鏡装置
JP6324113B2 (ja)	2014-02-28	2018-05-16	キヤノン株式会社	光学系および光沢計
JP6324114B2 (ja) *	2014-02-28	2018-05-16	キヤノン株式会社	光学系および光沢計
FI127908B (en) *	2015-09-22	2019-05-15	Teknologian Tutkimuskeskus Vtt Oy	Method and apparatus for measuring the height of a surface
WO2019229826A1 (ja) *	2018-05-29	2019-12-05	株式会社日立ハイテクノロジーズ	高さ測定装置
JP7240139B2 (ja) *	2018-11-09	2023-03-15	株式会社キーエンス	変位測定装置

Citations (6)

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Publication number	Priority date	Publication date	Assignee	Title
JPS6361110A (ja) *	1986-05-27	1988-03-17	シンセテイツク　ヴイジヨン　システムズ　インコ−ポレ−テツド	高速三次元測定方法及び装置
JPH02262004A (ja) *	1989-03-31	1990-10-24	Toshiba Corp	位置検出装置
JPH02306108A (ja) *	1989-05-19	1990-12-19	Hamamatsu Photonics Kk	３次元位置認識装置
JPH06213658A (ja) *	1992-09-02	1994-08-05	Betrieps Forsch Vdeh Inst Angew Forsch Gmbh	距離測定方法及び装置
JPH06221837A (ja) *	1993-01-26	1994-08-12	Toshiba Corp	表面検査装置
JPH08193810A (ja) *	1995-01-13	1996-07-30	Serutetsuku Syst:Kk	変位測定装置

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EP0071667A1 (en) *	1981-08-11	1983-02-16	Karl-Erik Morander	Device for determining the real or the virtual distance of a source of light from a measuring plane
US4767934A (en) *	1986-07-02	1988-08-30	Honeywell Inc.	Active ranging system
JPH03289293A (ja) *	1990-04-04	1991-12-19	Mitsubishi Electric Corp	撮像装置
US5978089A (en) *	1997-04-15	1999-11-02	Nextel Ltd.	Non-contact method for measuring the shape of an object

1998
- 1998-05-15 US US09/214,414 patent/US6428171B1/en not_active Expired - Fee Related
- 1998-05-15 WO PCT/JP1998/002160 patent/WO1998051993A1/ja active Application Filing

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS6361110A (ja) *	1986-05-27	1988-03-17	シンセテイツク　ヴイジヨン　システムズ　インコ−ポレ−テツド	高速三次元測定方法及び装置
JPH02262004A (ja) *	1989-03-31	1990-10-24	Toshiba Corp	位置検出装置
JPH02306108A (ja) *	1989-05-19	1990-12-19	Hamamatsu Photonics Kk	３次元位置認識装置
JPH06213658A (ja) *	1992-09-02	1994-08-05	Betrieps Forsch Vdeh Inst Angew Forsch Gmbh	距離測定方法及び装置
JPH06221837A (ja) *	1993-01-26	1994-08-12	Toshiba Corp	表面検査装置
JPH08193810A (ja) *	1995-01-13	1996-07-30	Serutetsuku Syst:Kk	変位測定装置

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6572139B2 (en) *	1998-11-27	2003-06-03	Hamamatsu Photonics K.K.	Occupant sensor and airbag control apparatus
US7553276B2 (en)	2001-01-16	2009-06-30	Given Imaging Ltd.	Method and device for imaging body lumens
JP2002311388A (ja) *	2001-04-19	2002-10-23	Nikon Corp	光学系
US8639314B2 (en)	2003-12-24	2014-01-28	Given Imaging Ltd.	Device, system and method for in-vivo imaging of a body lumen
US7336833B2 (en)	2004-06-30	2008-02-26	Given Imaging, Ltd.	Device, system, and method for reducing image data captured in-vivo
JP2012194085A (ja) *	2011-03-17	2012-10-11	Mitsubishi Electric Corp	エッジ検出装置
KR101830785B1 (ko) *	2016-09-30	2018-02-21	기가비스주식회사	3차원 형상 측정장치
WO2018096728A1 (ja) *	2016-11-24	2018-05-31	株式会社新川	ボンディング装置および被写体の高さ検出方法
JP2018084504A (ja) *	2016-11-24	2018-05-31	株式会社新川	ボンディング装置およびボンディング対象物の高さ検出方法
US10816322B2 (en)	2016-11-24	2020-10-27	Shinkawa Ltd.	Bonding apparatus and method for detecting height of bonding target
KR102040016B1 (ko) *	2018-07-19	2019-11-05	한국과학기술연구원	레이저와 거울을 이용한 높이 측정 시스템 및 상기 시스템에 의해 수행되는 높이 측정 방법

Also Published As

Publication number	Publication date
US6428171B1 (en)	2002-08-06

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