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WO1998005921A1 - Procede pour determiner l'epaisseur de paroi d'une pale de turbine et dispositif pour mettre en oeuvre ledit procede - Google Patents

Procede pour determiner l'epaisseur de paroi d'une pale de turbine et dispositif pour mettre en oeuvre ledit procede Download PDF

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Publication number
WO1998005921A1
WO1998005921A1 PCT/DE1997/001545 DE9701545W WO9805921A1 WO 1998005921 A1 WO1998005921 A1 WO 1998005921A1 DE 9701545 W DE9701545 W DE 9701545W WO 9805921 A1 WO9805921 A1 WO 9805921A1
Authority
WO
WIPO (PCT)
Prior art keywords
temperature
wall thickness
response time
temperature profile
turbine blade
Prior art date
Application number
PCT/DE1997/001545
Other languages
German (de)
English (en)
Inventor
Erich Becker
Volker Carl
Annett Sperling
Original Assignee
Siemens Aktiengesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Aktiengesellschaft filed Critical Siemens Aktiengesellschaft
Publication of WO1998005921A1 publication Critical patent/WO1998005921A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Definitions

  • An adaptation function that contains the wall thickness as a parameter is preferably specified and the wall thickness is calculated by adapting the adaptation function to the measured temperature profile.
  • FIG. 2 shows a flow diagram to illustrate the functional flow when determining the wall thickness and the linking of the functional units used
  • Fig. 4 shows a section along the section line IV-IV
  • the infrared thermography camera 2 works in a temperature range from 0 ° C to 200 ° C with a resolution of up to 0.05 ° C. It is mounted on a cross slide-like manipulator 16, with which the camera 2 along the three spatial axes x , y and z in FIG. 1 can be maneuvered via the control unit 4. Together with the arrangement of the test part holder 3 on a turntable 17, the camera 2 and the gas turbine blade 15 to be tested can be automatically positioned relative to one another via the control unit 4.
  • This control unit 4 is a first computer of the overall system, which also carries out the temperature and voltage regulation and controls the triggering of the camera 2 and the flash lamp unit 1.
  • the personal computer of the control unit 4 is therefore the actual control computer for the system components.
  • thermography camera 2 has an infrared detector with a resolution of 768 x 600 lines, which results in a local resolution of approximately 0.3 mm when the thermographic image of the test part is recorded leads.
  • the recording frequency is 25 Hz, which means that a thermographic image of the test part 15 can be recorded every 40 milliseconds. In total, for example, 30 images are recorded at the specified time interval, which leads to a measuring time of 1.2 seconds.
  • the camera 2 can also operate in a line scan mode, that is, scan an object line by line, which is particularly advantageous for the detection of fast processes.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Radiation Pyrometers (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé et un dispositif conçu de façon appropriée, pour déterminer l'épaisseur de paroi d'une pale de turbine à gaz (15), notamment d'une turbine à gaz stationnaire. Ledit procédé consiste à chauffer la zone de la surface à examiner (i), de façon pulsée par exposition à des éclairs lumineux, à enregistrer les variations temporelles de la répartition de la température sur la zone de la surface à examiner (i), au moyen d'une caméra de thermographie infrarouge (2), puis à calculer l'épaisseur de paroi (di) recherchée.
PCT/DE1997/001545 1996-07-31 1997-07-22 Procede pour determiner l'epaisseur de paroi d'une pale de turbine et dispositif pour mettre en oeuvre ledit procede WO1998005921A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19630952 1996-07-31
DE19630952.2 1996-07-31

Publications (1)

Publication Number Publication Date
WO1998005921A1 true WO1998005921A1 (fr) 1998-02-12

Family

ID=7801409

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1997/001545 WO1998005921A1 (fr) 1996-07-31 1997-07-22 Procede pour determiner l'epaisseur de paroi d'une pale de turbine et dispositif pour mettre en oeuvre ledit procede

Country Status (1)

Country Link
WO (1) WO1998005921A1 (fr)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999024814A1 (fr) * 1997-11-12 1999-05-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Procede et dispositifs d'analyse thermique d'un echantillon
WO2000063642A1 (fr) * 1999-04-16 2000-10-26 General Electric Company Mesurage thermographique transitoire de l'epaisseur d'une couche metallique
WO2001007867A1 (fr) * 1999-07-21 2001-02-01 General Electric Company Technique d'imagerie thermique par resonance
WO2001007902A1 (fr) * 1999-07-21 2001-02-01 General Electric Company Procede d'imagerie thermique a coordonnees synthetiques
US6690016B1 (en) * 1998-02-10 2004-02-10 Philip Morris Incorporated Process control by transient thermography
EP1559500A1 (fr) 2004-01-29 2005-08-03 Siemens Aktiengesellschaft Procédé et dispositif d'usinage mécanique d'un composant creux
WO2006042528A1 (fr) * 2004-10-21 2006-04-27 X-Fab Semiconductor Foundries Ag Determination electrique de l'epaisseur de membranes de semiconducteurs par apport d'energie
EP1923153A1 (fr) 2006-10-30 2008-05-21 United Technologies Corporation Procédé pour vérifier l'épaisseur de la paroi d'une surface portante creuse
US7409313B2 (en) 2005-12-16 2008-08-05 General Electric Company Method and apparatus for nondestructive evaluation of insulative coating
EP1258136B1 (fr) * 1999-12-02 2009-02-25 Thermal Wave Imaging, Inc. Procede et systeme thermographique de detection sans reference de defauts de sous-surfaces au moyen de donnees d'images comprimees
EP2962061A4 (fr) * 2013-03-01 2016-11-30 United Technologies Corp Mesure d'épaisseur de double paroi par thermographie à éclair

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5111046A (en) * 1991-03-18 1992-05-05 General Electric Company Apparatus and method for inspecting cooling holes

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5111046A (en) * 1991-03-18 1992-05-05 General Electric Company Apparatus and method for inspecting cooling holes

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
DING K: "Test of jet engine turbine blades by thermography", OPTICAL ENGINEERING, NOV.-DEC. 1985, USA, vol. 24, no. 6, ISSN 0091-3286, pages 1055 - 1059, XP002045762 *
WALLE G: "Pulse video thermography", MATERIALPRUEFUNG, MARCH 1994, GERMANY, vol. 36, no. 3, ISSN 0025-5300, pages 86 - 88, XP002045761 *
WU D ET AL: "Nondestructive inspection of turbine blades with lock-in thermography", SEVENTH INTERNATIONAL SYMPOSIUM ON NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS, PRAGUE, CZECH REPUBLIC, 19-22 JUNE 1995, vol. 210-213, pt.1, ISSN 0255-5476, MATERIALS SCIENCE FORUM, 1996, TRANS TECH PUBLICATIONS, SWITZERLAND, pages 289 - 294, XP002045760 *

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999024814A1 (fr) * 1997-11-12 1999-05-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Procede et dispositifs d'analyse thermique d'un echantillon
US6515284B1 (en) 1997-11-12 2003-02-04 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschvng E.V. Processes and devices for the photothermal inspection of a test body
US6690016B1 (en) * 1998-02-10 2004-02-10 Philip Morris Incorporated Process control by transient thermography
US6394646B1 (en) 1999-04-16 2002-05-28 General Electric Company Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography
WO2000063642A1 (fr) * 1999-04-16 2000-10-26 General Electric Company Mesurage thermographique transitoire de l'epaisseur d'une couche metallique
CZ302194B6 (cs) * 1999-04-16 2010-12-08 General Electric Company Zpusob infracervené tranzientní termografie pro urcování tlouštky predmetu a zarízení k jeho realizaci
US6367969B1 (en) 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
US6367968B1 (en) 1999-07-21 2002-04-09 General Electric Company Thermal resonance imaging method
WO2001007902A1 (fr) * 1999-07-21 2001-02-01 General Electric Company Procede d'imagerie thermique a coordonnees synthetiques
KR100720214B1 (ko) * 1999-07-21 2007-05-21 제너럴 일렉트릭 캄파니 열 촬영 데이터 프레임 분석 방법, ｉｒ 과도 서모그래피 방법, 피검체 두께 결정 방법 및 적외선 과도 서모그래피 방법
WO2001007867A1 (fr) * 1999-07-21 2001-02-01 General Electric Company Technique d'imagerie thermique par resonance
EP1258136B1 (fr) * 1999-12-02 2009-02-25 Thermal Wave Imaging, Inc. Procede et systeme thermographique de detection sans reference de defauts de sous-surfaces au moyen de donnees d'images comprimees
EP1559500A1 (fr) 2004-01-29 2005-08-03 Siemens Aktiengesellschaft Procédé et dispositif d'usinage mécanique d'un composant creux
WO2006042528A1 (fr) * 2004-10-21 2006-04-27 X-Fab Semiconductor Foundries Ag Determination electrique de l'epaisseur de membranes de semiconducteurs par apport d'energie
US7409313B2 (en) 2005-12-16 2008-08-05 General Electric Company Method and apparatus for nondestructive evaluation of insulative coating
EP1923153A1 (fr) 2006-10-30 2008-05-21 United Technologies Corporation Procédé pour vérifier l'épaisseur de la paroi d'une surface portante creuse
US8087447B2 (en) 2006-10-30 2012-01-03 United Technologies Corporation Method for checking wall thickness of hollow core airfoil
EP2962061A4 (fr) * 2013-03-01 2016-11-30 United Technologies Corp Mesure d'épaisseur de double paroi par thermographie à éclair
US9964404B2 (en) 2013-03-01 2018-05-08 United Technologies Corporation Flash thermography double wall thickness measurement

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