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WO1998032005A1 - Procede de radiographie a contraste de phase destine principalement aux objets medico-biologiques et dispositif prevu a cet effet - Google Patents

Procede de radiographie a contraste de phase destine principalement aux objets medico-biologiques et dispositif prevu a cet effet Download PDF

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Publication number
WO1998032005A1
WO1998032005A1 PCT/RU1998/000007 RU9800007W WO9832005A1 WO 1998032005 A1 WO1998032005 A1 WO 1998032005A1 RU 9800007 W RU9800007 W RU 9800007W WO 9832005 A1 WO9832005 A1 WO 9832005A1
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WO
WIPO (PCT)
Prior art keywords
radiation
mοnοκρisτalla
analizaτορa
ρenτgenοvsκοgο
chτο
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PCT/RU1998/000007
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English (en)
Russian (ru)
Inventor
Viktor Natanovich Ingal
Elena Anatolievna Belyaevskaya
Vladimir Alexeevich Bushuev
Original Assignee
Noel, Joseph, M.
Bailey, F., Kenneth, Jr.
Pivovarov, Simon Elievich
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Application filed by Noel, Joseph, M., Bailey, F., Kenneth, Jr., Pivovarov, Simon Elievich filed Critical Noel, Joseph, M.
Priority to AU57845/98A priority Critical patent/AU5784598A/en
Publication of WO1998032005A1 publication Critical patent/WO1998032005A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers

Definitions

  • the invention is subject to radiation methods of the internal products, weakly attenuated radiative radiation. medi ⁇ -bi ⁇ l ⁇ giches ⁇ i ⁇ and ⁇ a ⁇ zhe ⁇ us ⁇ ys ⁇ vam for ⁇ lucheniya ⁇ a ⁇ i ⁇ iz ⁇ b ⁇ azheny.
  • the closest proposed facility is the facility described in [2] (offer).
  • the essence of the method is that, in the case of a two-dimensional X-ray beam, a large amount of radiation is attached to the This multiparticle ensured asymmetric X-ray emission with an asymmetry coefficient L less than unity: where ⁇ is the Bragg angle of the selected system of the negative areas of the manifold, in this case, with the indices of Bill (511); and ⁇ is the angle of inclination of the affected areas of the working area of the multipartite, Fig. 1.
  • the studied object was installed.
  • the target under study was the target. It consists of a plastic sphere, which is included in the main, made up, for example, of 5 ⁇ m layer (UHF) ⁇ , 0.5 ⁇ m layer S and 5 ⁇ m layer S. It was not located directly on the analysis analyzer.
  • UHF 5 ⁇ m layer
  • ⁇ dna ⁇ , g ⁇ azd ⁇ b ⁇ lee ⁇ e ⁇ s ⁇ e ⁇ ivn ⁇ is ⁇ lz ⁇ va ⁇ n ⁇ vy me ⁇ d ⁇ en ⁇ gen ⁇ g ⁇ a ⁇ ii, ⁇ sn ⁇ vanny on ⁇ egis ⁇ atsii ⁇ uch ⁇ v, ⁇ l ⁇ nenny ⁇ ⁇ na ⁇ avleniya ⁇ e ⁇ v ⁇ nachalyyug ⁇ ⁇ as ⁇ s ⁇ aneniya on g ⁇ anitsa ⁇ ⁇ azdela s ⁇ ed for issled ⁇ vaniya b ⁇ lee ⁇ dn ⁇ dny ⁇ ⁇ s ⁇ s ⁇ avu ⁇ be ⁇ v, vnu ⁇ ennyaya s ⁇ u ⁇ u ⁇ a ⁇ y ⁇ not dae ⁇ ⁇ n ⁇ as ⁇ a on abs ⁇ btsi ⁇ nny ⁇ iz ⁇ b ⁇ azheniya ⁇ in chas ⁇ n ⁇ s ⁇
  • the whole of the present invention is the creation of a method of studying the internal structure of the objects that are being processed. on the one hand, weak rejection of the x-ray radiation, and on the other, by small degrees of dampness (or, in the same way, by the coefficient of radiation reduction).
  • the idea is to have a biomedical business.
  • Partial maximums of the Pendelezung are used along with the entire range for the selection of the working analysis method. To do this, it installs the dependency of the differential analysis ( ⁇ ) of the analyzer under the conditions of illumination on it and does not share it with others.
  • ⁇ differential analysis
  • ⁇ is the size of the well-known area in the working area of the territory of the territory of the territory of the region.
  • ⁇ a is the depth of extinction corresponding to the selected output in the analysis; C - factorization; t is an integer non-negative.
  • the multiplexer For radiation paths, install the multiplexer in the position of the b-ray diffraction for the multiplex analysis of the x-ray radiation.
  • the studied object is placed on the path of radiation, which is located in front of the analyzer and conducts the registration of the X-ray radiation. Disposed areas of the selected system of analysis analyzer.
  • the proposed method is distinguished by the fact that, in a known manner, the angular intervals of the ⁇ locations of the analysis analyzer are defined. RELATED TO THE DISTINCT AND THE CORNER WIDTH OF THE DARWIN ST. When weighing it with unexpendable heaps of reactive radiation.
  • Block of monitors 6 ⁇ mi ⁇ uyu ⁇ of ⁇ dn ⁇ g ⁇ m ⁇ i ⁇ is ⁇ alla ⁇ i usl ⁇ vii, ch ⁇ for ⁇ e ⁇ itsisn ⁇ a asimme ⁇ ii eg ⁇ ⁇ azhayushi ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey ud ⁇ vle ⁇ v ⁇ yae ⁇ sya dv ⁇ yn ⁇ e ⁇ e ⁇ avens ⁇ v ⁇ z ⁇ # 2 with / 8 ⁇ 2 (# - ⁇ c), ⁇ b ⁇ ⁇ ( ⁇ / s ⁇ v) 2.
  • the risk of operating inconveniences of a large number of components and analysis should not increase the value of ⁇ / 2, where there is a chance of increasing so that the angular inclination of the rays, which are connected to the analyzer, caused by the exposure through the studied component, is in the case of an open distribution
  • the written method for the second embodiment is also different. in order to register the image of the analysis object, they are installed in the corner provisions, which are turned off by the right angle for the condition ⁇ # ⁇ under ⁇ conditions,
  • the method of phasing an x-ray at a second option is different in that the coefficient of asymmetry of the multiplicity is larger than one.
  • the method of phantom X-ray in the second embodiment may also be different, since the coefficient of asymmetry of the multiplicity is less than one.
  • the method of phasing an x-ray for any of the variants is different. that the object under study is placed at a slow distribution from the analysis analyzer. 7
  • the test facility must be simple and analytically written.
  • the device is small P ⁇ sle e ⁇ g ⁇ ⁇ eguli ⁇ uyu ⁇ vzaimn ⁇ e ⁇ as ⁇ l ⁇ zhenie vse ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v and na ⁇ avlyayuschi ⁇ on ni ⁇ radiation ⁇ iches ⁇ i ⁇ elemen ⁇ v m ⁇ n ⁇ ma ⁇ a and imenn ⁇ , ⁇ usn ⁇ g ⁇ ⁇ ya ⁇ na is ⁇ chni ⁇ a radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ , ⁇ llima ⁇ a, crevices and d ⁇ ugi ⁇ elemen ⁇ v ⁇ a ⁇ im ⁇ b ⁇ az ⁇ m, ch ⁇ by za ⁇ egis ⁇ i ⁇ vann ⁇ e ⁇ as ⁇ edelenie radiation in ⁇ ensivn ⁇ s ⁇ i 8 to the disposal of the test device, as it was, the situation is more exactly the same as that for the settlement
  • P ⁇ sle remove ⁇ es ⁇ v ⁇ g ⁇ ⁇ be ⁇ a and us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a izme ⁇ yayu ⁇ radiation in ⁇ ensivn ⁇ s ⁇ i on vy ⁇ de ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla m ⁇ n ⁇ ma ⁇ a, ⁇ aya m ⁇ gla izmeni ⁇ sya into force ⁇ azlichny ⁇ ⁇ ichi ⁇ , and ⁇ i ⁇ l ⁇ nenii values u ⁇ azanny ⁇ in ⁇ ensivn ⁇ s ⁇ sy, izme ⁇ enny ⁇ ⁇ sle remove ⁇ es ⁇ v ⁇ g ⁇ ⁇ be ⁇ a and us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a ⁇ u ⁇ azanny ⁇ za ⁇ mnenny ⁇ values ⁇ eguli ⁇ uyu ⁇ ⁇ l ⁇ zhenie s ⁇ ve ⁇ s
  • One more method of phantom X-ray is proposed, including the first original manual installation of multiplexes and optical elements of the multipart.
  • the method is affected by the fact that the investigated component is emitted due to radiation, which installs the device in a condition that the device is electrically 9 Distribution of the intensities of the inte- grated space in the light of the exhaustive radiation, of the exhausted airborne systems Ug ⁇ l ⁇ lina ⁇ lin ⁇ vidn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla vybi ⁇ ayu ⁇ ⁇ avnym ⁇ -dV / ⁇ , where ⁇ ⁇ - depth e ⁇ s ⁇ in ⁇ tsii radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ in ⁇ lin ⁇ vidn ⁇ m m ⁇ n ⁇ is ⁇ alle and linear value ⁇ ⁇ ⁇ ⁇ edelyae ⁇ sya of usl ⁇ viya ⁇ > ⁇ ⁇ » ⁇ , where ⁇ and ⁇ , s ⁇ ve ⁇ s ⁇ venn ⁇ ,
  • the last proposed method can be used in such a way that the indicated wedge-shaped microscope installs the installation of the analysis of the radiation, it means that the analysis of the radiation is replaced. After adjusting the installation of the installation and optical components, the wedge-shaped installation is removed; This method also may be differentiated from that indicated by the wedge-shaped multi-part performed in one unit with a small number of components, but it is only a small part of it. In this case, in addition to the exact user installation of the multi-unit, there is a precise installation of the multi-unit analysis. In general, in the form of a phased X-ray, the unit will be reduced to one more labor-intensive operation.
  • the proposed method uses a multi-analysis system, which has two wedge-shaped sections on it.
  • the invention is provided for the receipt of a terrestrial phasic image of the investigated object.
  • ch ⁇ d ⁇ us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a on radiation ⁇ u ⁇ i, ⁇ i ⁇ dyascheg ⁇ ⁇ m ⁇ n ⁇ ma ⁇ a in ⁇ l ⁇ zhenie b ⁇ egg ⁇ vs ⁇ y di ⁇ a ⁇ tsii on ⁇ sve ⁇ us ⁇ anavlivayu ⁇ ⁇ lin ⁇ vidny m ⁇ n ⁇ is ⁇ all, ⁇ y is ⁇ lzuyu ⁇ for ⁇ ve ⁇ i ⁇ aches ⁇ va v ⁇ lny, ⁇ ig ⁇ vlenn ⁇ y m ⁇ n ⁇ ma ⁇ m.
  • the quality of the data is critical for the maintenance of the method of a phantom X-ray, since it does not depend on the detected elements of the product, it is investigated. Characteristics of the image. More likely, if the degree of competitiveness of the acquired wave is insufficient, the phrased image will not be able to be infected.
  • Clia angle of the wedge-shaped mono-crystal selects equal wherein ⁇ - »- depth e ⁇ s ⁇ in ⁇ tsii ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation ⁇ lin ⁇ vidn ⁇ m m ⁇ n ⁇ is ⁇ alle and linear ⁇ azme ⁇ ⁇ ⁇ ⁇ ⁇ edelyae ⁇ sya of ne ⁇ avens ⁇ va ⁇ > 1 ⁇ » ⁇ , ⁇ and where ⁇ , s ⁇ ve ⁇ s ⁇ venn ⁇ .
  • the calculated distribution of intensities is calculated for the well-known dynamic diffraction formulas, (see .., for example, 6]).
  • 12 Regulate the mutual use of minerals and impinging optical radiation on the optical elements of such devices. in order to register the distribution of the intensities of the interactions between the receivers as much as possible coincided with the resultant distribution.
  • a beam of X-ray radiation produced by a multiplexer, is used to receive phase-radiation.
  • the variant of this method is different. that they use two wedge-shaped sections, performed in a single unit with a multi-analysis and processing with it a single multi-part, I have two short-form ones.
  • Za ⁇ em ⁇ sle removal ⁇ lin ⁇ vidn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla and us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a izme ⁇ yayu ⁇ in ⁇ ensiv ⁇ s ⁇ i radiation vy ⁇ de ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla m ⁇ n ⁇ ma ⁇ a, ⁇ ye m ⁇ gli izmeni ⁇ sya ⁇ ⁇ a ⁇ y-lib ⁇ ⁇ ichine, and ⁇ i ⁇ l ⁇ nenii values u ⁇ azanny ⁇ in ⁇ ensivn ⁇ s ⁇ ey, izme ⁇ enny ⁇ ⁇ sle removal ⁇ lin ⁇ vidn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla and us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a ⁇ u ⁇ azann ⁇ g ⁇ ⁇ e ⁇ e ⁇ n ⁇ g ⁇ values in ⁇ ensivn ⁇ s ⁇
  • the user-friendly installation of the analyzer is also an integral part of the user’s method of downloading and downloading the product, as well as To ensure that this product is not immediately consumed after the installation of the investigated product, they measure and recall the value of the intensity of the X-ray analysis.
  • the proposed method is carried out in devices of a phase x-ray of essential medical and biological devices.
  • the closest available analogue is the device described in [2] (( ⁇ ⁇ ⁇ ))))).
  • the device provides a convenient dual-circuit and contains a source of radiating and amplifying radiation, which emits an emission that emits no radiation.
  • the studied object is located between the multiplex and the analysis and the non-direct analysis.
  • the recording of the image of the studied object is carried out on the X-ray film, which is installed in the beam of the X-ray radiation, the processed analysis.
  • ⁇ a is the depth of extraction corresponding to the selected output in the analysis analysis
  • the devices for the phantom X-ray in the last version are different and, moreover, the installation of the analysis is installed in the corner. Please note that there is a good condition that the Bragg accessories are in good condition, at least 2
  • devices for phantom x-ray differs in that the analysis is performed with the effect of the simplicity.
  • Any of the proposed devices is used only to accommodate the investigated product, which is installed on a small analyzer. It is possible to explore different sizes and sizes.
  • the devices for phantom radiographs are of any kind that are also considered to be With the aim e ⁇ y m ⁇ n ⁇ is ⁇ all sau ⁇ aSupra, ch ⁇ by eg ⁇ m ⁇ zhn ⁇ byl ⁇ zameni ⁇ ⁇ lin ⁇ vidnym m ⁇ n ⁇ is ⁇ all ⁇ m. Yu ⁇ in ⁇ vidny m ⁇ n ⁇ is ⁇ all us ⁇ anavlivae ⁇ sya in ⁇ l ⁇ zhenie b ⁇ egg ⁇ vs ⁇ y di ⁇ a ⁇ tsii on ⁇ sve ⁇ in de ⁇ zha ⁇ ele sau ⁇ a.
  • an additional measurement system is integrated. 18 in ⁇ ensivn ⁇ s ⁇ i radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ , ⁇ azhenn ⁇ g ⁇ ⁇ l ⁇ s ⁇ s ⁇ yami vyb ⁇ a ⁇ n ⁇ y sis ⁇ emy ⁇ azhayushi ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey m ⁇ n ⁇ is ⁇ alla sau ⁇ a, bl ⁇ s ⁇ avneniya, v ⁇ d ⁇ g ⁇ ⁇ d ⁇ lyuchen ⁇ vy ⁇ du s ⁇ eds ⁇ v izme ⁇ eniya in ⁇ eg ⁇ aln ⁇ y in ⁇ ensivn ⁇ s ⁇ i for s ⁇ avneniya izme ⁇ enny ⁇ values zada ⁇ nymi. and the device is equipped with an analysis input, which is connected to the output of the comparison unit, which is switched off by means of measuring the intensity of the integral.
  • ⁇ lin ⁇ vidnaya Part ⁇ aya not is ⁇ lzue ⁇ sya for ⁇ mi ⁇ vaniya iz ⁇ b ⁇ azheniya issleduem ⁇ g ⁇ ⁇ be ⁇ a, m ⁇ n ⁇ is ⁇ alla imee ⁇ ug ⁇ l ⁇ lina, ⁇ avny ⁇ L P, where ⁇ -, ⁇ - depth e ⁇ s ⁇ in ⁇ tsii radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ in ⁇ lin ⁇ vidn ⁇ m m ⁇ n ⁇ is ⁇ alle, ⁇ > ⁇ ⁇ » ⁇ , and H and £, s ⁇ ve ⁇ s ⁇ venn ⁇ , ⁇ azme ⁇ ⁇ en ⁇ gen ⁇ chuvs ⁇ vi ⁇ eln ⁇ y ⁇ blas ⁇ i in ⁇ l ⁇ s ⁇ s ⁇ i di ⁇ a ⁇ tsii and ⁇ s ⁇ ans ⁇ venn ⁇ e ⁇ az ⁇ eshenie u ⁇ azanny ⁇ s ⁇ eds ⁇
  • the last one should be equipped with X-ray radiation detectors, including a number of multiples for measuring, which are relevant. intensities of X-ray radiation, the affected areas of the selected systems of the corresponding areas of the corresponding multiplexes.
  • Detectors can also be made in the form of initialized cameras. imeyuschi ⁇ ⁇ en ⁇ gen ⁇ z ⁇ achnye and bess ⁇ u ⁇ u ⁇ nye v ⁇ dn ⁇ e and vy ⁇ dn ⁇ e ⁇ na in e ⁇ m case ⁇ ni m ⁇ gu ⁇ by ⁇ us ⁇ an ⁇ vleny for s ⁇ ve ⁇ s ⁇ vuyuschimi m ⁇ n ⁇ is ⁇ allami in chas ⁇ i ⁇ uch ⁇ a ⁇ en ⁇ gen ⁇ vs ⁇ i ⁇ rays is ⁇ lzuyuschi ⁇ sya for ⁇ mi ⁇ vaniya iz ⁇ b ⁇ azheniya issleduem ⁇ g ⁇ ⁇ be ⁇ a.
  • the large portions of the analysis analyzer can also be used for a specific user analysis and tracking.
  • a comparison unit is included, the input to the output of the indicated X-ray emission devices is included in the comparison unit.
  • the comparison box serves for comparing the registered distribution of the intensity of the international environment with the calculated separation thereof.
  • Devices of any of the described options may not be readable, which may result in a medium being scanned from the sample being examined.
  • Devices of any kind from the described variants may also be differentiated from the fact that they are complementary to the exploitation of a foreign part of the foreign company.
  • ⁇ e ⁇ y va ⁇ ian ⁇ us ⁇ ys ⁇ va for ⁇ az ⁇ v ⁇ y ⁇ ei ⁇ gen ⁇ g ⁇ a ⁇ ii ⁇ eimusches ⁇ venn ⁇ medi ⁇ -bi ⁇ l ⁇ giches ⁇ i ⁇ ⁇ be ⁇ v s ⁇ de ⁇ zhi ⁇ is ⁇ chni ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation m ⁇ n ⁇ ma ⁇
  • us ⁇ an ⁇ vlenny on ⁇ u ⁇ i ⁇ is ⁇ chni ⁇ a ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation s ⁇ s ⁇ yaschy ⁇ at me ⁇ e of ⁇ dn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla
  • the device can be distinguished by the fact that the plate of the analysis analyzer has two wedge-shaped parts, which are located in front of it.
  • Devices for the two last options are also distinguished by the fact that many of them are equipped with X-ray radiation detectors, including 21 ⁇ avn ⁇ number m ⁇ n ⁇ is ⁇ all ⁇ v m ⁇ n ⁇ ma ⁇ a for izms ⁇ sniya, s ⁇ vs ⁇ s ⁇ vsnn ⁇ , in ⁇ ensivn ⁇ s ⁇ i radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ , ⁇ azhenn ⁇ g ⁇ ⁇ l ⁇ s ⁇ s ⁇ yami vyb ⁇ ann ⁇ y sis ⁇ smy ⁇ azhayuschi ⁇ ⁇ l ⁇ s ⁇ s ⁇ sy s ⁇ vs ⁇ s ⁇ vuyuschi ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v.
  • Calicia supports the ability to install multiple devices. Detected devices can be executed in the form of scintillating counters and installed in the process of exploitation in the case of
  • devices are encouraged to be implemented in the form of initialized cameras having non-hazardous and non-hazardous non-portable ones. When they can be installed due to the corresponding part-rays, in particular the beam of X-rays used for the production of the investigated product.
  • the large part of the analysis analyzer can also be used for automatic and user-friendly analysis.
  • a comparison unit is included, the input to the output of the indicated devices 22 ⁇ en ⁇ en ⁇ vs ⁇ g ⁇ izluchsniya, ⁇ azhsnn ⁇ g ⁇ ⁇ l ⁇ s ⁇ s ⁇ yami vyb ⁇ ann ⁇ y sis ⁇ emy ⁇ azhayuschi ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey ⁇ lin ⁇ vidn ⁇ y chas ⁇ i ⁇ las ⁇ iny m ⁇ n ⁇ is ⁇ alla sau ⁇ a for s ⁇ avneniya za ⁇ egis ⁇ i ⁇ vann ⁇ g ⁇ ⁇ as ⁇ edeleniya in ⁇ ensivn ⁇ s ⁇ i in ⁇ e ⁇ e ⁇ eiii ⁇ nny ⁇ ⁇ l ⁇ s with ⁇ asche ⁇ nym eg ⁇ ⁇ as ⁇ edeleniem and us ⁇ ys ⁇ v ⁇ ⁇ zishyuni ⁇ vaniya sauvi
  • ⁇ a ⁇ ig. 5 A schematic illustration of a device for phase X-ray analysis with analysis installed in the Bragg geometry. Projection on the area of diffraction.
  • FIG. 23 A schematic illustration of a device for a phase X-ray, in which a user circuit is used, is used.
  • ⁇ a ⁇ ig. 7 A schematic illustration of a device for phasic x-ray analysis with analysis, which has a wedge-shaped involvement, a primary wedge of an endoscopy. Two devices are available for the device.
  • ⁇ a ⁇ ig. 8 An example of performing analysis with wedge-shaped sections is shown.
  • the invention is carried out as follows.
  • the coefficient of asymmetry of the first part of the set is preferable to choose less than one and taking into account the fact that the value of the parameter is not higher.
  • ⁇ a ⁇ ig. 1 ⁇ azan ⁇ ime ⁇ asimme ⁇ ichn ⁇ g ⁇ ⁇ azheniya ⁇ sis ⁇ emy ⁇ is ⁇ all ⁇ g ⁇ a ⁇ iches ⁇ i ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey s ⁇ ve ⁇ shenn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla with inde ⁇ sami k ⁇ ⁇ i usl ⁇ vii b ⁇ ⁇ 1.
  • ⁇ - (2/77 + 1) where ⁇ a is the depth of extraction corresponding to the selected output in the analysis analysis; ⁇ - factorization, equal to 1 for ⁇ -polarization and 2 ⁇ for ⁇ -polarization; t is an integer non-negative.
  • I would also like to choose the thickness of the mono-crystalline analyzer. in order to satisfy the condition of radiation absorption: I ⁇ ⁇ , where ⁇ is the linear coefficient of attenuation in the multiplex. This will increase the efficiency of the registration of the image.
  • ⁇ e ⁇ m va ⁇ ian ⁇ e s ⁇ s ⁇ ba in ⁇ lichie ⁇ s ⁇ s ⁇ ba- ⁇ i ⁇ a, ⁇ edlagae ⁇ sya is ⁇ lz ⁇ va ⁇ in m ⁇ n ⁇ ma ⁇ e ⁇ din m ⁇ n ⁇ is ⁇ all ⁇ i usl ⁇ vii, ch ⁇ for ⁇ e ⁇ itsien ⁇ a asimme ⁇ ii eg ⁇ ⁇ azhayuschi ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey ud ⁇ vle ⁇ v ⁇ yae ⁇ sya dv ⁇ yn ⁇ e ne ⁇ avens ⁇ v ⁇ z ⁇ ⁇ (B) 2 .
  • test is installed on Bragg, so I select this in such a way that more condi- tions are made more
  • the initial option is to use a small amount of At the same time, the initial analysis of the analyzer decreases in comparison with the symmetrical situation in (b) ⁇ ⁇ .
  • ⁇ sli is ⁇ chni ⁇ m radiation yavlyas ⁇ sya sin ⁇ n, d ⁇ bavlyae ⁇ sya ⁇ e ⁇ atsiya yus ⁇ i ⁇ v ⁇ i ze ⁇ al, ⁇ il ⁇ v and d ⁇ ugi ⁇ elemen ⁇ v, ⁇ mi ⁇ uyuschi ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ y ⁇ uch ⁇ , ⁇ adayushy on ⁇ e ⁇ vy m ⁇ n ⁇ is ⁇ all m ⁇ n ⁇ ma ⁇ a.
  • the initial setup of the X-ray circuitry and the production of intermittent signals for the subsequent monitoring may also be carried out by us.
  • the X-ray radiation is from source 1 through the cell 2, which has an input and output gap, falls on a small part, for which there is a small amount (for the light).
  • a handheld unit is damaged, a test unit 5, which has a simple format, can be written analytically, for example, filled in with known weight.
  • the analysis system was installed 6.
  • the analysis of the analysis which is a part of the installation of the installation, is installed on the computer.
  • the registration of the image is made by the registered devices 7. For such an object, it is possible.
  • the measured values of the intensity are different, they are just the same as the first time the user is using the device, After the restoration of the angle of the user’s choice, the large size of the unit changes the intensity of the output by a factor of 11, which is equal to 11 if necessary, the use of an analysis of such a way is regulated, so that a newer measured value is indicated for an increased importance of an increase in importance.
  • the components 10 and 10 ' which are accessible in the operation of the device. This procedure, you can make it available if you have access to an object, when you need to get a good deal of money, and when exploring inanimate objects. When exploring live objects and taking into account the time of operating the device, there is no need to take part in the shooting between the shots.
  • the delayed integration in the area of the interference is calculated on the basis of the diagrams of the dynamic theory of distribution [6] and is recorded in the balance of separation.
  • the two-component detector registers the physical distribution of intensities and sends these data to the consumer components as well.
  • the analyzer can also be operated on with an optional scintillation detector, comparing it to the last one.
  • the indicated wedge-shaped manifold can be completed as a whole with the multi-analysis, having used a single manifold with it, just download the wizard.
  • ⁇ lin ⁇ vidny uchas ⁇ is ⁇ lzuyu ⁇ for ⁇ edeleniya ⁇ aches ⁇ va izg ⁇ vleniya m ⁇ n ⁇ is ⁇ all ⁇ v and ⁇ n ⁇ lya ⁇ aches ⁇ va in ⁇ tsesse e ⁇ s ⁇ lua ⁇ atsii and ⁇ a ⁇ zhe for ⁇ etsizi ⁇ nn ⁇ y yus ⁇ i ⁇ v ⁇ i m ⁇ n ⁇ is ⁇ all ⁇ v and ⁇ iches ⁇ i ⁇ elemen ⁇ v m ⁇ n ⁇ ma ⁇ a, ⁇ a ⁇ e ⁇ ⁇ isan ⁇ above and ne ⁇ lin ⁇ vidny uchas ⁇ - for ⁇ egis ⁇ atsii i
  • the one-time accurate installation of the analysis analyzer is automatic. How to do it. in the case of a phasic X-ray, there will be one less labor-intensive operation. For this reason, the analysis analyzer can be used both in the Laue system and in the Bragg system.
  • the well-known multipartite is a flat plug-in with 34 wedge-shaped, and secondly - plastic, which has a very small edge on the ground, which is worn out with a clip.
  • the proposed method uses a multi-analytic system, which has two wedge-shaped sections on it.
  • P ⁇ sle ⁇ chn ⁇ y yus ⁇ i ⁇ v ⁇ i m ⁇ n ⁇ ma ⁇ a in ⁇ y is ⁇ lzue ⁇ sya ⁇ lin ⁇ vidny m ⁇ n ⁇ is ⁇ all or m ⁇ is ⁇ all Anlagen ⁇ a with ⁇ lin ⁇ vidnymi uchas ⁇ ami on eg ⁇ ⁇ aya ⁇ , and izme ⁇ yayu ⁇ zai ⁇ minago ⁇ values in ⁇ ensivn ⁇ s ⁇ i radiation vy ⁇ de ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla m ⁇ n ⁇ ma ⁇ a for cheg ⁇ for ⁇ azhdym m ⁇ n ⁇ is ⁇ all ⁇ m us ⁇ anavlivayu ⁇ de ⁇ e ⁇ .
  • the memorized values take into account both specific values.
  • the use of the software in the monitor controls all the time. for the installation of the investigated object. After installation and during shooting. comparing the measured values of the intensity with the rapid in the comparison block. When the values of the measured intensities are turned off, the fast signal of the disclosure of the signal is lost on the devices installed in the installation.
  • the components are contained in each unit. The benefit of each of the many systems is to regulate in such a way as to ensure that the measured and external values are protected. It is also possible to enter into the agreement with an alternative operator.
  • phased output can serve as the new basic type of diagnostics - phased access.
  • This type of diagnosis can be carried out as follows: first, a survey of a few investigated objects is carried out at different angles. For this reason, well-known rules are used to eliminate the hazardous area, various sections are selected from the mains and necessary. For this purpose, after the installation of the investigated object, it is processed by one or several other components, which are subject to various radiation conditions, which are impaired. 36
  • the calculated distribution of intensities is calculated for the well-known dynamic dispersion formulas, (see, for example, [6]). Using the result of comparison, they regulate the mutual use of minerals and directing them to the optical elements of such a way. so that the registered distribution of the intensities of the online environment is more likely to be the same as the total distribution. In this case, it could be 37 sure that the beam of radiation, the increased frequency of the radiation, is suitable for the receipt of phase radiation.
  • a variant of the method is provided by the following method.
  • the shaped ones are installed, the wedge-shaped type is installed. It is made from the perfect mono-metal, choosing the angle of the wedge of the wedge-shaped metal equal to ⁇ -, ⁇ // ; ., where is the depth of the X-ray emission in the wedge-shaped microscope.
  • the area goes blank, the component is lost, consequently, the mutual installation of the devices in the multiplex is disturbed 38 and / or the device of the focus of the portable device of the public housing and the multiplex. If the area is exhausted, consequently in one or a few small-scale installations, there is a short-term or difficult installation.
  • the installation of a wedge-shaped manifold can be combined with the installation of a large-scale analysis system, for which the latter is performed with a wedge-shaped part.
  • a large-scale analysis system for which the latter is performed with a wedge-shaped part.
  • Za ⁇ em ⁇ sle removal ⁇ lin ⁇ vidn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla, and us ⁇ an ⁇ v ⁇ i yus ⁇ i ⁇ v ⁇ i m ⁇ n ⁇ is ⁇ alla sau ⁇ em ⁇ sle removal ⁇ lin ⁇ vidn ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla, and us ⁇ an ⁇ v ⁇ i yus ⁇ i ⁇ v ⁇ i m ⁇ n ⁇ is ⁇ alla sau ⁇ a and us ⁇ an ⁇ v ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a vn ⁇ v izme ⁇ yayu ⁇ values in ⁇ ensivn ⁇ s ⁇ i izluchsniya on vy ⁇ de ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla m ⁇ n ⁇ ma ⁇ a, ⁇ ye m ⁇ gli izmeii ⁇ sya ⁇ ⁇ a ⁇ y-lib ⁇ ⁇ ichine.
  • This hardware package can be handled as a portable device. Practically, it is also used in the case of a long-term operation of the object, as well as when changing the object.
  • the analysis analyzer For the user to use the analysis analyzer, they install a measurement of the integral intensity of the X-ray radiation.
  • a scintillating detector an automatically integrated intensity
  • a sensitive detector equipped with a standard program for the integration of intensity throughout the entire field of image or its part.
  • the devices under investigation are measured and the voltage is inactive, but they are After a while, the measurement does not change, and if the last value is different, the value of the intensity is changed, then the value of the radiation is at a higher value. equipped with its own detector, since it is obvious that the value of the intensity due to the large-scale analysis of the analyzer depends on the output of the multiprocessor.
  • s ⁇ ve ⁇ s ⁇ vuyushy signal ⁇ ass ⁇ glas ⁇ vaniya ⁇ s ⁇ u ⁇ as ⁇ on us ⁇ ys ⁇ va ⁇ zishyuni ⁇ vaniya s ⁇ ve ⁇ s ⁇ vuyuscheg ⁇ m ⁇ n ⁇ is ⁇ alla, and ⁇ ye ⁇ izv ⁇ dya ⁇ ⁇ eguli ⁇ v ⁇ u i ⁇ ⁇ l ⁇ zheniya d ⁇ v ⁇ ss ⁇ an ⁇ vleniya ⁇ e ⁇ v ⁇ nachalyyu za ⁇ mnenny ⁇ ⁇ e ⁇ e ⁇ ny ⁇ in ⁇ ensivn ⁇ s ⁇ i values.
  • the user manual of the analysis can be manual, manual, and automatic. For automatic regulation of the current signal from the detector, it will be sent to the unit of comparison of the current signal with the reactive signal; Accessible to a low-cost analysis system.
  • the device is equipped with discreet equipment and an accessory system for each X-ray system.
  • the first variant of the device is schematically shown in FIG. 3.
  • v ⁇ lyuchae ⁇ is ⁇ chni ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation 1, ⁇ ym us ⁇ an ⁇ vlen ⁇ llima ⁇ 2 having v ⁇ dnuyu and vy ⁇ dnuyu slit ⁇ g ⁇ anichivayuschie ⁇ uch ⁇ , ⁇ adayuschy ⁇ d s ⁇ lzyaschim ugl ⁇ m on ⁇ e ⁇ vy m ⁇ n ⁇ is ⁇ all m ⁇ n ⁇ ma ⁇ a 3.
  • ⁇ n ⁇ is ⁇ ally m ⁇ n ⁇ ma ⁇ a vy ⁇ lneny with ⁇ e ⁇ itsien ⁇ m asimme ⁇ ii L ⁇ (6 ) - ⁇ ) / ⁇ ( ⁇ + ⁇ ), where ⁇ is the Bragg angle of the selected disturbance system and the angle of failure is viy b> zn _ ⁇ s ), where ⁇ s is the angle of the complete external radiation of the X-ray radiation from the working part of the multiparticle.
  • the device also contains a device for mixing the test unit 5 and the multi-unit analysis of the 6 radiation X-ray (consumer) Registration System 7 is set up for analysis.
  • the proposed device is designed to be equipped with a multi-component that is compatible with other conditions of use.
  • ⁇ ( ⁇ certify ⁇ ) ' ⁇ sli e ⁇ ne ⁇ avens ⁇ v ⁇ ns m ⁇ zhe ⁇ by ⁇ ud ⁇ vle ⁇ v ⁇ en ⁇ s ⁇ vmes ⁇ n ⁇ ne ⁇ avens ⁇ v ⁇ m with b ⁇ ⁇ - ⁇ s), m ⁇ n ⁇ ma ⁇ ⁇ mi ⁇ uyu ⁇ of dvu ⁇ ⁇ sled ⁇ va ⁇ eln ⁇ us ⁇ an ⁇ vlenny ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v ⁇ i usl ⁇ vii, ch ⁇ for ⁇ e ⁇ shien ⁇ a asimme ⁇ ii ⁇ azhayuschi ⁇
  • ⁇ a ⁇ further ⁇ liches ⁇ v ⁇ ⁇ sled ⁇ va ⁇ eln ⁇ us ⁇ ai ⁇ vlenny ⁇ m ⁇ n ⁇ is ⁇ a ⁇ l ⁇ v uvelichivayu ⁇ d ⁇ n, ⁇ a not vy ⁇ lni ⁇ sya usl ⁇ vie for ⁇ e ⁇ i ⁇ ien ⁇ y asimme ⁇ ii ⁇ - ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla z ⁇ 2 ⁇ with ⁇ ⁇ n2 ( ⁇ - ⁇ a), b ⁇ " ⁇ , / (ssch ⁇ 1/2 bt ... b pleasant. ⁇ ).
  • Parameters ⁇ and here are shared ⁇ ⁇ ⁇ ⁇ ⁇ , are similar to those given by ig. 2.
  • the device is intended for the receipt of physical imaging of the medicament-biomedical objects, all elements of the disease are neglected.
  • ⁇ Namely, the accuracy of the operation of the manifolds and the analysis of the analyzer does not increase the value of ⁇ , / 2, where ⁇ . - The size of the suspended area on the working surface of the space in the area of diffraction.
  • the device is offered to use also the “user-friendly” method. For analysis, it is convenient and efficient This effect is manifested in different thicknesses of the analysis analyzer, and it is in the range of 0.75 to 1.25 that is equal to x, which is equal to:
  • ⁇ a is the depth of extraction corresponding to the selected system of flattening surfaces in the analysis analysis system; C - polarized multiplier; and t is not a small non-negative number.
  • I also wish that the thickness of the analysis analyzer group satisfies the condition I ⁇ ⁇ / ⁇ , where ⁇ is the linear coefficient of relaxation of the x-ray radiation in the range.
  • OPTIONAL "OPERATION" You can get there by completing a multi-analysis system with asymmetric contact areas. when the asymmetry coefficient is less than one.
  • s ⁇ s ⁇ i ⁇ is ⁇ chni ⁇ a of 1, 2 ⁇ ym sledue ⁇ ⁇ llima ⁇ having v ⁇ dnuyu and vy ⁇ dnuyu slit ⁇ g ⁇ anichivayuschie ⁇ uch ⁇ , ⁇ adayushy ⁇ d s ⁇ lzyaschim ugl ⁇ m on ⁇ e ⁇ vy m ⁇ i ⁇ is ⁇ all m ⁇ n ⁇ ma ⁇ a 3.
  • ⁇ e ⁇ vym m ⁇ n ⁇ is ⁇ all ⁇ m us ⁇ an ⁇ vlen v ⁇ y m ⁇ n ⁇ is ⁇ all m ⁇ n ⁇ ma ⁇ a 4.
  • ch ⁇ by ⁇ bes ⁇ echi ⁇ ma ⁇ simalnye values ⁇ e ⁇ igshen ⁇ v ⁇ azheniya m ⁇ n ⁇ ma ⁇ v and prom ⁇ a in ⁇ edlagaem ⁇ m us ⁇ ys ⁇ ve us ⁇ anavlivayu ⁇ m ⁇ n ⁇ is ⁇ ally, ⁇ ig ⁇ vlennye with ⁇ lschin ⁇ y d ⁇ s ⁇ a ⁇ chn ⁇ y for ⁇ g ⁇ , ch ⁇ by is ⁇ lyuchi ⁇ zame ⁇ nye ⁇ in ⁇ ensivn ⁇ s ⁇ i ⁇ azheniya ⁇ ⁇ b ⁇ a ⁇ n ⁇ y ⁇ ve ⁇ n ⁇ s ⁇ i ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ alla. For this reason, the thickness of the analysis analyzer additionally satisfies the condition: I> 10 ⁇ a .
  • All X-ray components are installed with the option of installing a free-wheeling device.
  • the device supports a multi-analysis system, which is used with an asymmetry of the flatness of the b> ⁇ .
  • the proposed devices are equipped with a variety of devices and analysis. for use with low-level indices. This condition applies to cases where the elements of the X-ray circuit are manufactured from a multiprocessor having a cubic structure, for example, or.
  • the size of the X-ray sensitivities in the area of dispersion and the dispersion of the resistance to the radiation of the radiation is neglected ⁇
  • the angle ⁇ - * • ⁇ is taken into account, because the practical angle ⁇ does not exceed 10 ° and is more than necessary for the angle of inclination.
  • Devices 8 'and 8" are illustrated in the article for other purposes, so that they are used in some cases. When executed in the form of scintillation counters, or installed in a beam, if executed in the form of initialized cameras. In this latter case, they have X-ray hazardous input and output windows that do not give a direct phase effect.
  • the latest device schematically shown in FIG. 7. It contains a source of X-ray radiation 1, followed by a short 2, which has an entrance and exit slit that limits the beam, which is small (small).
  • the latter is made from a single or a few (in this case, two) multi-functional, consequently impaired X-ray machines.
  • the study is hosted by the analyzer 6. Analysis is based on the fact that it is at a loss of time.
  • the device in the last version can be performed with a multi-analysis system, which includes a one-sided case with an underlying, chronic disease. 8 (a), and then the flow diagram of the beams in the area of diffraction will look like in FIG. 8 (b).
  • the analysis analysis system may include a wedge-shaped area with a base, parallel to the diffraction area, Fig. 8 (c). ⁇ a ⁇ ig. 8 (a) and (c), the wedge-shaped areas are denoted by the Latin letters a, and the flat parallel parts are denoted by the letters b.
  • a variant of the implementation of such a device is available with a multi-analysis system that contains two mutually clinically inclined sites.
  • ⁇ ig. 8 (g). ⁇ ⁇ a ⁇ m va ⁇ ian ⁇ e ⁇ ed ⁇ s ⁇ avlyae ⁇ sya v ⁇ zm ⁇ zhn ⁇ s ⁇ ⁇ dn ⁇ v ⁇ emenn ⁇ g ⁇ ⁇ n ⁇ lya for ⁇ aches ⁇ v ⁇ m ⁇ uch ⁇ a ( ⁇ dn ⁇ dn ⁇ s ⁇ y ⁇ in ⁇ ensivi ⁇ s ⁇ i and ⁇ as ⁇ dim ⁇ s ⁇ yu) in dvu ⁇ na ⁇ avleniya ⁇ , ⁇ a ⁇ ime ⁇ , and ⁇ a ⁇ alleln ⁇ ⁇ e ⁇ endi ⁇ ulya ⁇ i ⁇ ⁇ l ⁇ s ⁇ s ⁇ i di ⁇ a ⁇ tsii.
  • the last 47 X-ray radiation detectors must be inhibited, including a few equal to the number of multiples used for measurement, which are true. intensities of X-ray radiation, displaced surfaces of the selected systems of the corresponding areas of the corresponding multiparty systems. ⁇ a ⁇ ig. 7 These children are not shown so as not to load the drawing.
  • the installation method is similar to that presented in FIG. 3.
  • ⁇ sli same is ⁇ lz ⁇ va ⁇ for e ⁇ y goal i ⁇ nizatsi ⁇ nnye ⁇ ame ⁇ y, imeyuschi ⁇ ⁇ en ⁇ gen ⁇ z ⁇ achnye and bess ⁇ u ⁇ u ⁇ nye v ⁇ dn ⁇ e and vy ⁇ dn ⁇ e ⁇ na
  • ⁇ i ⁇ us ⁇ anavlivayu ⁇ for s ⁇ ve ⁇ s ⁇ vuyuschimi m ⁇ n ⁇ is ⁇ allami in chas ⁇ i ⁇ uch ⁇ a ⁇ en ⁇ gen ⁇ vs ⁇ i ⁇ rays is ⁇ lzuyushi ⁇ sya for ⁇ mi ⁇ vaniya iz ⁇ b ⁇ azheniya issleduem ⁇ g ⁇ ⁇ be ⁇ a.
  • the large portions of the analysis analysis system can also be used to configure the analysis and tracking of this user.
  • the installed for example, a sensitive sensor 7 on FIG. 7, a quick block of comparison of the registered distribution of intensity with a settlement of 11 is associated with a simple analysis of the volume of the economy.
  • a device of any of the described versions contains a scanning medium for the sample being studied.
  • Devices of any of the described variants additionally contain the components of the investigated part of one or several other systems.
  • the analysis system can also be performed in the form of a plate. having a basic part and a smaller one, a wedge-shaped additional part on the edges of the plate.
  • the main part of the analysis system can be replaced if you install it on a media or if you have installed it, you must install it ⁇
  • the wedge-shaped areas on the plate are installed in Laue (on the light).
  • the latest device is shown in FIG. 7. It contains a source of x-ray radiation 1, followed by a short supply of 2. which has an input and output cable, which is limited to a small amount (small).
  • the follow-up is made from one or several (in this case, two) multi-part systems, the resultant injuries falling on them are X-ray. For a small number of cases, the beam is mixed up 6. The analysis gives rise to a loss of time, which is a loss of evidence. 49
  • FIG. 8 A variant of the execution of such a device with a multi-analysis system comprising two reciprocal clinically active sections is discharged, Fig. 8 (g). ⁇ ⁇ a ⁇ m va ⁇ ian ⁇ e ⁇ ed ⁇ s ⁇ avlyae ⁇ sya v ⁇ zm ⁇ zhn ⁇ s ⁇ ⁇ dn ⁇ v ⁇ emeshyug ⁇ ⁇ n ⁇ lya for ⁇ aches ⁇ v ⁇ m ⁇ uch ⁇ a ( ⁇ dn ⁇ dn ⁇ s ⁇ y ⁇ in ⁇ ensivn ⁇ s ⁇ i and ⁇ as ⁇ dim ⁇ s ⁇ y ⁇ ) in dvu ⁇ na ⁇ avleniya ⁇ , na ⁇ ime ⁇ , and ⁇ a ⁇ alleln ⁇ ⁇ e ⁇ endi ⁇ ulya ⁇ n ⁇ ⁇ l ⁇ s ⁇ s ⁇ i di ⁇ a ⁇ tsii.
  • Sensitive Detector 7 on Fig. 7 a quick comparison of the registration of the distribution of the intelligence with the settlement of 11 is connected with the complexity of the analysis of minority 10.
  • a device of any of the described versions contains a scanning medium for the sample being studied.
  • Devices of any of the described variants additionally contain the components of the investigated part of one or several other systems. Using FIG. 3, We will show how to work with the proposed device at first option.
  • ⁇ en ⁇ gen ⁇ vs ⁇ e radiation ⁇ is ⁇ chni ⁇ a 1 che ⁇ ez ⁇ llima ⁇ 2 ⁇ adae ⁇ on ⁇ e ⁇ vy m ⁇ n ⁇ is ⁇ a ⁇ l m ⁇ n ⁇ ma ⁇ a 3.
  • the usual values ⁇ and ⁇ ⁇ are chosen close to the value of the aspect ratio of the reactive tube on the diffraction bar.
  • the accuracy of the volume does not exceed the value of ⁇ and, 2, where
  • the size of the area described in the front part, included in the block, counts the formula: and the quantity ⁇ blas ⁇ i Lr, ⁇ sveschenn ⁇ y on v ⁇ m m ⁇ n ⁇ is ⁇ alle ⁇ asschi ⁇ yvayu ⁇ ⁇ ⁇ mule: Lx kg ⁇ ( ⁇ - ⁇ g) wherein ⁇ g - ⁇ e ⁇ echny ⁇ azme ⁇ ⁇ uch ⁇ a, ⁇ y ⁇ azhae ⁇ sya ⁇ ⁇ e ⁇ v ⁇ g ⁇ m ⁇ gyu ⁇ ma ⁇ a and ⁇ and ⁇ g - angles s ⁇ lzheniya ⁇ uch ⁇ v, ⁇ adayushi ⁇ , s ⁇ ve ⁇ s ⁇ venn ⁇ on ⁇ e ⁇ vy and second mono-metals.
  • the loud earplugs for analyzing Laue are 5x 10 " - 5x 10 " .
  • the heap can be divided into two: left and diffused. It needs to be phased in, and it may be registered.
  • a conventional scintillation detector (counter) 8 is installed in a separate beam, and a two-dimensional sensitive detector 7 is in the past. You must exchange places.
  • the image is also subject to registration on a tape or photo tape depending on the quality of the image and the transmission of the image.
  • the critical angular char- acteristic used for the selection of long-term parameters of the X-ray optical circuit serves as a width of the analysis. Therefore, the magnitude of the coefficient of asymmetry of the first part of the multiprocessor is selected from the condition: and the value 54 coefficient of asymmetry of the 2nd monocrystal - from the condition: ⁇ Bg ⁇ " ). The disruption to the quality of the process and the lack of flexibility of the system remains the same, as in the case of the device.
  • the wavelength is less than 6, the accuracy of the unit does not exceed the value of ⁇ 2, where
  • ch ⁇ by ⁇ bes ⁇ echi ⁇ ma ⁇ simalnye values ⁇ e ⁇ itsien ⁇ v ⁇ azheniya m ⁇ n ⁇ is ⁇ all ⁇ v m ⁇ n ⁇ ma ⁇ a and prom ⁇ a, m ⁇ n ⁇ is ⁇ ally ⁇ ig ⁇ avlivayu ⁇ with ⁇ lschin ⁇ y d ⁇ s ⁇ a ⁇ chn ⁇ y for ⁇ g ⁇ , ch ⁇ by is ⁇ lyuchi ⁇ zame ⁇ nye ⁇ in ⁇ ensivn ⁇ s ⁇ i ⁇ azheniya ⁇ ⁇ b ⁇ a ⁇ n ⁇ y ⁇ ve ⁇ n ⁇ s ⁇ i ⁇ azhd ⁇ g ⁇ m ⁇ n ⁇ is ⁇ a ⁇ la. For this reason, the thickness of the analysis analyzer additionally satisfies the condition: g> 10 ⁇ a .
  • E ⁇ s ⁇ emy in ⁇ y ⁇ , v ⁇ - ⁇ e ⁇ vy ⁇ is ⁇ lzuyu ⁇ sya ⁇ azheniya ⁇ ⁇ dn ⁇ g ⁇ ⁇ i ⁇ a ⁇ l ⁇ s ⁇ s ⁇ ey, ⁇ ichem, n ⁇ mali ⁇ ⁇ l ⁇ s ⁇ s ⁇ yam in ⁇ sled ⁇ va ⁇ eln ⁇ ⁇ as ⁇ l ⁇ zhenny ⁇ m ⁇ n ⁇ is ⁇ alla ⁇ d ⁇ lzhny by ⁇ an ⁇ i ⁇ a ⁇ a ⁇ lelny, na ⁇ ime ⁇ , 220 - 220, 220, and sled ⁇ va ⁇ elyyu, i ⁇ de ⁇ sy sis ⁇ em ⁇ azhayushi ⁇ ⁇ l ⁇ s ⁇ s ⁇ ey s ⁇ sedni ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v d ⁇ lzhny ime ⁇ useful
  • the X-ray system which is a part of the equipment offered, is free to install in order to benefit from any kind of advantage.
  • the availability of such devices will make it easier to register for different income groups in the world. In the meantime, it is easy to use only with the availability of a sufficient source of radiation.
  • the source of the X-ray radiation source and the multiplier are small and have a small amount of ⁇ lin ⁇ vidny m ⁇ n ⁇ is ⁇ all vy ⁇ lnyayu ⁇ ⁇ a ⁇ im ⁇ b ⁇ az ⁇ m, ch ⁇ by ug ⁇ l ⁇ lina was ⁇ aven ⁇ ⁇ / ⁇ ⁇ , where ⁇ -, ⁇ - depth e ⁇ s ⁇ in ⁇ tsii ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation ⁇ lin ⁇ vidn ⁇ m m ⁇ is ⁇ alle and linear ⁇ azme ⁇ ⁇ ⁇ vybi ⁇ ae ⁇ sya of usl ⁇ viya: ⁇ > ⁇ ⁇ » ⁇ , where H and ⁇ , respectively, is proportional to the extent of the dispersion and is susceptible to the susceptibility When X-ray
  • Spherical, multi-directional radiation is incident on a wedge-shaped multi-mounted system 57 in the Bragegov area, as a result of which, in each of the bundles, it was taken out and left. There is a large area of interest in the area. It is also registered and registered. For registration, it is wise to install a two-dimensional, highly sensitive detector. The online interface is further used for a specialist installation of the drive.
  • De ⁇ e ⁇ y 8 'and 8 "iz ⁇ b ⁇ azheny ⁇ un ⁇ i ⁇ m for ⁇ g ⁇ , ch ⁇ by ⁇ dche ⁇ nu ⁇ , ch ⁇ in ⁇ m case ⁇ gda is ⁇ lzuyu ⁇ sya stsin ⁇ illyatsi ⁇ nnye sche ⁇ chi ⁇ i, i ⁇ us ⁇ anavlivayu ⁇ in chas ⁇ i ⁇ uch ⁇ a, ⁇ azhenn ⁇ g ⁇ s ⁇ ve ⁇ s ⁇ vuyuschim m ⁇ n ⁇ ma ⁇ v, ⁇ aya not is ⁇ lzue ⁇ sya in ⁇ lucheniya iz ⁇ b ⁇ azheniya.
  • the signal the fundamental intensity of the radiation, a coupled with a large analysis of the analyzer, is counted in the block of comparison of the signal from the current signal.
  • the alarm signal is not immediately detected after the installation of the investigated object.
  • the comparison unit generates a differential signal, which quickly activates the device of the analysis system, which is part of the system. 58
  • a pre-packaged unit is subject to a small amount of impairment and is subject to a large number of non-existent forms of analysis. 6
  • the main part of it is that it is free of charge or otherwise If the analyzer is installed on a large scale, it is very small that there is a small risk of an increased risk of obstruction.
  • the wedge-shaped areas at the edges of the plate are installed in such a way that Laue diffraction on the light is ensured in them.
  • the analysis analysis system is manufactured with a single wedge-shaped area, for example, with a base, diffuse area, ig. 8 (a). or with a base parallel to the diffraction plane, Fig. 8 (c).
  • the multiphase is installed in the X-ray system, as shown in FIG. 8 (b) ⁇ a ⁇ ig. 8 (a) and (c), the wedge-shaped areas are denoted by the Latin letters a, and the flat parallel parts are denoted by the letters b.
  • the on-site installation is also possible to operate with a few wedge-shaped areas, for example, two. as shown in the movie. 8 (d) or more. 59
  • the large portions of the analysis analysis system can also be used for a specific user analysis and tracking.
  • the size of the diverter may be up to 1: 5 to 1: 10.
  • sv ⁇ em ⁇ as ⁇ yazhenii ⁇ a ⁇ e s ⁇ e ⁇ e ⁇ iz ⁇ b ⁇ azhenie
  • ⁇ en ⁇ gen ⁇ vs ⁇ e radiation ⁇ is ⁇ chni ⁇ a 1 ⁇ g ⁇ anichivae ⁇ sya v ⁇ dn ⁇ y and vy ⁇ dn ⁇ y ⁇ llima ⁇ a slits 2 and ⁇ adae ⁇ ⁇ d s ⁇ lzyaschim ugl ⁇ m on ⁇ e ⁇ vy m ⁇ n ⁇ is ⁇ all m ⁇ n ⁇ ma ⁇ a 3 ⁇ sled ⁇ va ⁇ eln ⁇ ⁇ azhayas ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v 3 and 4 m ⁇ n ⁇ ma ⁇ a.
  • the multiparty drive is subject to a small amount of impractical analysis 6, which is a small part of the total price.
  • the main part is that it is a large, non-profitable external If the analyzer is installed on a small scale, it is very small that there is a small risk of an increased risk of illness. In any case, the wedge-shaped areas at the edges of the plate are installed in such a way that there is no distinction between Laue on the basis of illumination.
  • vybi ⁇ aemy ⁇ of usl ⁇ viya ⁇ sh ⁇ where the magnitude ⁇ ⁇ ud ⁇ vle ⁇ v ⁇ yae ⁇ usl ⁇ viyu: ⁇ > 1 ⁇ » ⁇ , where ⁇ - ⁇ azme ⁇ v ⁇ dn ⁇ g ⁇ ⁇ na ⁇ egis ⁇ i ⁇ uyusheg ⁇ us ⁇ ys ⁇ va, ⁇ a ⁇ ime ⁇ , ⁇ dina ⁇ n ⁇ -chuvs ⁇ vi ⁇ eln ⁇ g ⁇ de ⁇ e ⁇ a 7 ⁇ l ⁇ s ⁇ s ⁇ i di ⁇ a ⁇ tsii and ⁇ - ⁇ s ⁇ ans ⁇ venn ⁇ e ⁇ az ⁇ eshenie u ⁇ myanu ⁇ g ⁇ de ⁇ e ⁇ a.
  • the analysis analyzer is manufactured with a single wedge-shaped part, with an example, with a base, a standard pendulum of diffraction, Fig. 8 (a), or with a base parallel to the diffraction plane, Fig. 8 (c).
  • the multiphase is installed in the X-ray system, as shown in FIG. 8 (b) ⁇ a ⁇ ig. 8 (a) and (c) wedge-shaped areas are denoted by the Latin letters ⁇ , and ' flat-parallel parts are denoted by the letters B.
  • the signal from this detector is memorized in the block of comparison 9. Then, the signal from detector 8 is changed directly and if there is a disclosure of the comparison block, it gives a signal to change the angle of opposition. This change is subject to the operation of the analysis 10. 63
  • the large portions of the analysis system can also be used to provide a specific user experience for monitoring and monitoring this situation.
  • a sensitive sensory detector 7 Fig. 7 for us ⁇ an ⁇ vlenn ⁇ g ⁇ ⁇ lin ⁇ vidnym uchas ⁇ m m ⁇ n ⁇ is ⁇ alla, ⁇ s ⁇ u ⁇ ae ⁇ on bl ⁇ s ⁇ avneniya za ⁇ egis ⁇ i ⁇ vann ⁇ g ⁇ ⁇ as ⁇ edeleniya i ⁇ e ⁇ sivn ⁇ s ⁇ i with ⁇ asche ⁇ nym ⁇ as ⁇ edeleniem 11.
  • nablyudae ⁇ ⁇ a ⁇ inu ⁇ as ⁇ edeleniya ⁇ l ⁇ s and ⁇ ⁇ a ⁇ a ⁇ e ⁇ u is ⁇ azheny ⁇ a ⁇ iny in ⁇ e ⁇ e ⁇ enshyunny ⁇ ⁇ l ⁇ s ⁇ edelyae ⁇ ⁇ edva ⁇ i ⁇ eln ⁇ .
  • P ⁇ i e ⁇ m ⁇ e ⁇ a ⁇ is ⁇ lzuya ⁇ uchn ⁇ e u ⁇ avlenie us ⁇ ys ⁇ v ⁇ m ⁇ zishyuni ⁇ vaniya, medlenn ⁇ ⁇ v ⁇ achivae ⁇ sau ⁇ v ⁇ ug ⁇ si, ⁇ dyaschey che ⁇ ez eg ⁇ tsen ⁇ , and monitors changes in the diffraction pattern.
  • Dense abnormalities are detected when observing, for example, deformations, one of which is a large amount of distortion in the area; Inadmissibility of the total embedding of the manifolds is manifested as an irregular extinction of length over. The most difficult is the inaccurate angular location of each of the small-scale installations in the USA - it can be detected by the comparison of the calculated and aggregate inconvenience. This comparison is reasonable to produce automatically.
  • Us ⁇ ys ⁇ v ⁇ for ⁇ lucheniya ⁇ az ⁇ vy ⁇ ⁇ en ⁇ gen ⁇ g ⁇ amm s ⁇ de ⁇ zhi ⁇ is ⁇ chni ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation - ⁇ en ⁇ gen ⁇ vs ⁇ uyu ⁇ ub ⁇ u c ' ⁇ U an ⁇ d ⁇ m for ⁇ g ⁇ v ⁇ lny length ⁇ ⁇ ⁇ ⁇ -line ⁇ avna 0.209 ⁇ ⁇ a ⁇ a ⁇ e ⁇ is ⁇ iches ⁇ g ⁇ radiation.
  • P ⁇ e ⁇ mu b ⁇ lee ⁇ ealis ⁇ ichn ⁇ vyb ⁇ a ⁇ b 0.043.
  • the size of the illuminated working space in the second unit in the area of the diffraction of the radius is 206 mm.
  • the last size depends on the size and analysis in this direction.
  • the processing of all the components is important.
  • the successive pressure, grinding, polishing and back pressure, including chemical-mechanical, can be completely removed, so that they can be completely removed. 65 bars on plates.
  • the presence of residual voltage is already detected by the initial installation of the devices, and the disclosure of this defect was described above.
  • the product indicates that, in some cases, the direct processing is already ready to give a good result.
  • the width for the image is 12.8 x 150 mm 2 , you will need to scan for the full frame, for example. 150 ⁇ 150 mm.
  • ⁇ a ⁇ ian ⁇ us ⁇ ys ⁇ va is ⁇ lzuyuscheg ⁇ ⁇ a ⁇ a ⁇ e ⁇ is ⁇ iches ⁇ e radiation ⁇ ⁇ ⁇ line" ⁇ Y ⁇ ig ⁇ den for ⁇ lucheniya iz ⁇ b ⁇ azheniya ⁇ a ⁇ iches ⁇ i lyub ⁇ g ⁇ ⁇ gana chel ⁇ veches ⁇ g ⁇ ⁇ ela and m ⁇ zhe ⁇ ⁇ assma ⁇ iva ⁇ sya ⁇ a ⁇ most effective for diagnostic purposes.
  • the unit is identified as a device with analysis. installed in a Bragg location. ⁇
  • ⁇ 0.558 ⁇ .
  • the essential elements of the device are made from a modern multi-unit brown.
  • Corner angle is equal to 1.4 ⁇ 10 "' , therefore the condition b ⁇ 0.01 must be fulfilled.
  • P ⁇ e ⁇ mu b ⁇ was vyb ⁇ an ⁇ avnym 0.02.
  • a white mouse image is shown, which was obtained on a described device using an analysis performed by Laue by means of a phased X-ray analysis.
  • the photograph contains a clear image of the arterial system of the gastric area and partial abdominal aorta, poor and clean arteries. These images were obtained without the use of commercially available products, which are often used to study vessels and are often in danger of injury.
  • the simplest length which corresponds to the simplicity of a short circuit of type (220) in the range of the backlight when it is illuminated with a wavelength of 0.1 mm, is 0.201.
  • the width of the blade section was selected 3.5 mm so that no less than the same area was sold on it.
  • ⁇ a ⁇ ig. 7 is a schematic illustration of the performance of a device with an analysis having wedge-shaped areas at the edge.
  • ⁇ en ⁇ gen ⁇ vs ⁇ y ⁇ uch ⁇ ⁇ dya ⁇ is ⁇ chni ⁇ a 1 che ⁇ ez ⁇ llima ⁇ 2 ⁇ adae ⁇ ⁇ d s ⁇ lzyaschim ugl ⁇ m on ⁇ e ⁇ vy m ⁇ n ⁇ ma ⁇ 3 ⁇ azhayas ⁇ ⁇ g ⁇ , ⁇ adae ⁇ on v ⁇ y m ⁇ n ⁇ ma ⁇ 4.
  • ⁇ dina ⁇ n ⁇ - chuvs ⁇ vi ⁇ elny de ⁇ e ⁇ 7 us ⁇ an ⁇ vlen ⁇ a ⁇ im ⁇ b ⁇ az ⁇ m, ch ⁇ ⁇ n ⁇ dn ⁇ v ⁇ emenn ⁇ ⁇ egis ⁇ i ⁇ ue ⁇ and ⁇ a ⁇ inu ⁇ as ⁇ edeleniya ⁇ l ⁇ s ⁇ avn ⁇ y ⁇ lschiny and iz ⁇ b ⁇ azhenie ⁇ be ⁇ a ⁇ sle us ⁇ an ⁇ v ⁇ i ⁇ sledneg ⁇ in ⁇ en ⁇ gen ⁇ vs ⁇ y ⁇ uch ⁇ (uchas ⁇ ⁇ uch ⁇ a L ( ⁇ .)).
  • the scintillation detector 8 is set up in such a way that it will clean up only a bunch that has passed through a parallel analysis part.
  • the device 11 is connected with the operating mechanisms of all 10, 10 'and 10 "devices.
  • the operating mechanisms provide 68 ⁇ v ⁇ vse ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v v ⁇ ug dvu ⁇ ⁇ sey: v ⁇ ug b ⁇ egg ⁇ vs ⁇ y ⁇ si for vse ⁇ m ⁇ n ⁇ is ⁇ all ⁇ v, v ⁇ ug azimu ⁇ aln ⁇ y ⁇ si for a ⁇ aliza ⁇ a, us ⁇ an ⁇ a ⁇ enn ⁇ g ⁇ ⁇ Laue and v ⁇ ug ⁇ si na ⁇ l ⁇ na for m ⁇ n ⁇ ma ⁇ v and sau ⁇ a, us ⁇ an ⁇ a ⁇ enny ⁇ ⁇ B ⁇ eggu.

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  • Biochemistry (AREA)
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  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
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  • General Physics & Mathematics (AREA)
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  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)

Abstract

L'invention concerne de nouveaux procédés destiné à obtenir des images radiologiques de la structure interne d'objets à faible absorption, notamment d'objets médico-biologique. A la différence des méthodes traditionnelles de formation d'images de tissus mous, qui utilisent des produits contrastants, les nouvelles méthodes de formation d'images de phase, fondées sur la réfraction d'une onde presque plate, permettent d'obtenir des images de tissus mous à contraste acceptable. On utilise des faisceaux de rayons X faiblement divergents pour éclairer un objet et on forme son image par réflexion de Bragg sur un monocristal analyseur parfait. Dans les méthodes fondées sur l'enregistrement des rapports de phase, les paramètres, l'orientation réciproque, l'ajustage et la précision de maintien de la position angulaire de tous les composants du circuit ainsi que leur perfectionnement influent de manière radicale sur la qualité de l'image. L'invention porte aussi sur des procédés analogues d'optimisation des paramètres visant à augmenter la sensibilité et la qualité d'expression de la méthode de radiographie à contraste de phase ainsi que le contraste et la conformité des images. Sont également proposées des variantes du dispositif permettant la mise en oeuvre du procédé en question, ainsi que des procédés et moyens conçus pour un réglage de procision des circuits optiques à rayons X.
PCT/RU1998/000007 1997-01-16 1998-01-16 Procede de radiographie a contraste de phase destine principalement aux objets medico-biologiques et dispositif prevu a cet effet WO1998032005A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU57845/98A AU5784598A (en) 1997-01-16 1998-01-16 Phase contrast radiographic method intended mainly for medico-biological bjects, and device for applying same

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RU97100573A RU2115943C1 (ru) 1997-01-16 1997-01-16 Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
RU97100573 1997-01-16

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UA59495C2 (uk) * 2000-08-07 2003-09-15 Мурадін Абубєкіровіч Кумахов Рентгенівський вимірювально-випробувальний комплекс
RU2217055C1 (ru) * 2002-05-07 2003-11-27 Щетинин Виктор Васильевич Цифровой сканирующий рентгенодиагностический аппарат
RU2233117C1 (ru) * 2003-01-22 2004-07-27 Черний Александр Николаевич Рентгенографическая установка для медицинской диагностики
RU2312602C2 (ru) * 2005-11-23 2007-12-20 Государственное образовательное учреждение высшего профессионального образования "Московский государственный институт электронной техники" (технический университет) Способ формирования томографических изображений
JP4847568B2 (ja) * 2008-10-24 2011-12-28 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
WO2011070488A1 (fr) * 2009-12-10 2011-06-16 Koninklijke Philips Electronics N.V. Imagerie par contraste de phase
WO2012052881A1 (fr) * 2010-10-19 2012-04-26 Koninklijke Philips Electronics N.V. Imagerie différentielle en contraste de phase
CN103168228B (zh) * 2010-10-19 2015-11-25 皇家飞利浦电子股份有限公司 微分相位对比成像

Citations (5)

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SU1402871A1 (ru) * 1986-11-13 1988-06-15 Предприятие П/Я А-1758 Способ получени теневых картин внутренней структуры объекта с помощью проникающего излучени
EP0466047A2 (fr) * 1990-07-09 1992-01-15 Hitachi, Ltd. Tomographe avec information de phase d'un faisceau de signal transmis à travers un objet à examiner
US5132997A (en) * 1990-09-05 1992-07-21 Rigaku Industrial Corporation X-ray spectroscopic analyzing apparatus
RU2012872C1 (ru) * 1991-05-14 1994-05-15 Виктор Натанович Ингал Способ получения изображения внутренней структуры объекта
WO1995005725A1 (fr) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Optique amelioree pour rayons x destinee notamment a l'imagerie a contraste de phase

Patent Citations (5)

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Publication number Priority date Publication date Assignee Title
SU1402871A1 (ru) * 1986-11-13 1988-06-15 Предприятие П/Я А-1758 Способ получени теневых картин внутренней структуры объекта с помощью проникающего излучени
EP0466047A2 (fr) * 1990-07-09 1992-01-15 Hitachi, Ltd. Tomographe avec information de phase d'un faisceau de signal transmis à travers un objet à examiner
US5132997A (en) * 1990-09-05 1992-07-21 Rigaku Industrial Corporation X-ray spectroscopic analyzing apparatus
RU2012872C1 (ru) * 1991-05-14 1994-05-15 Виктор Натанович Ингал Способ получения изображения внутренней структуры объекта
WO1995005725A1 (fr) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Optique amelioree pour rayons x destinee notamment a l'imagerie a contraste de phase

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RU2115943C1 (ru) 1998-07-20

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