WO1998037254A2 - Thin films - Google Patents
Thin films Download PDFInfo
- Publication number
- WO1998037254A2 WO1998037254A2 PCT/GB1998/000556 GB9800556W WO9837254A2 WO 1998037254 A2 WO1998037254 A2 WO 1998037254A2 GB 9800556 W GB9800556 W GB 9800556W WO 9837254 A2 WO9837254 A2 WO 9837254A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- thin film
- aluminium
- film
- oxygen
- nitrogen
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 61
- 239000010408 film Substances 0.000 claims abstract description 43
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 36
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims abstract description 33
- 239000010432 diamond Substances 0.000 claims abstract description 26
- 239000004411 aluminium Substances 0.000 claims abstract description 24
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 24
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 24
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 18
- 239000001301 oxygen Substances 0.000 claims abstract description 18
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 18
- 229910017083 AlN Inorganic materials 0.000 claims abstract description 13
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims abstract description 13
- 238000004544 sputter deposition Methods 0.000 claims abstract description 13
- 229910052756 noble gas Inorganic materials 0.000 claims abstract description 11
- 239000000049 pigment Substances 0.000 claims abstract description 10
- 229910003460 diamond Inorganic materials 0.000 claims description 25
- 238000000151 deposition Methods 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 16
- 230000008021 deposition Effects 0.000 claims description 15
- 238000000576 coating method Methods 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 13
- 239000000203 mixture Substances 0.000 claims description 11
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 8
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical group [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 6
- 229910052786 argon Inorganic materials 0.000 claims description 4
- 239000003989 dielectric material Substances 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 150000002739 metals Chemical class 0.000 claims description 4
- 239000003973 paint Substances 0.000 claims description 4
- 239000004033 plastic Substances 0.000 claims description 4
- 229920003023 plastic Polymers 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 239000012876 carrier material Substances 0.000 claims description 3
- 230000003595 spectral effect Effects 0.000 claims description 3
- 239000002245 particle Substances 0.000 claims description 2
- 238000005478 sputtering type Methods 0.000 claims 1
- 239000011253 protective coating Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 description 14
- 230000003287 optical effect Effects 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000005334 plasma enhanced chemical vapour deposition Methods 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000000869 ion-assisted deposition Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 238000005546 reactive sputtering Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000001069 Raman spectroscopy Methods 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 230000001464 adherent effect Effects 0.000 description 1
- 229910000086 alane Inorganic materials 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 229910001567 cementite Inorganic materials 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000005923 long-lasting effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/14—Protective coatings, e.g. hard coatings
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0676—Oxynitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/548—Controlling the composition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0272—Deposition of sub-layers, e.g. to promote the adhesion of the main coating
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
Definitions
- This invention relates to thin films .
- Thin film materials have attractive properties for applications in security printing of banknotes, credit cards, telephone cards, smart cards, etc.
- thin films can have highly individual and characteristic reflection properties which are easily recognised by eye, which makes automated recognition a possibility.
- Thin film pigments can be produced where the colour changes with the viewing angle, making it impossible to duplicate these pigments with normal colour copiers or printers.
- a film which highly reflects light in one given wavelength range while not reflecting light in a different wavelength range.
- the reflecting wavelength range is varied by controlling the growth and composition of the film, allowing different, distinguishable films to be produced.
- Thin film coatings have been used to protect vulnerable surfaces and to extend the lifetime of sharpedged tools such as drill bits and knifes.
- a variety of durable materials have been used for this purpose previously, these materials include titanium nitride and tungsten carbide.
- a limitation of some other materials with desirable properties such as aluminium oxide and aluminium nitride is the tendency to fail as coatings because of inherent stresses in the thin films which lead to cracking or buckling of the coatings.
- the ideal material would be one whose refractive index could be varied continuously over a large range although the so-called "digital" technique in which a high-low pair is used to approximate a continuous index range has been used with success.
- a thin film comprising successive layers of aluminium oxide, aluminium oxynitride and aluminium nitride.
- the thin film is stress matched to a substance to which it is applied.
- the thin film is stress free.
- the layers are such that the composition of the film varies generally sinusoidally with depth.
- the thin film preferably .has a refractive index which varies, preferably sinusoidally between 1.6 and 2.2.
- the refractive index varies between 1.6 and 2.0.
- the thin film is transparent at thicknesses of up to 9 microns .
- the invention further provides a method for producing a thin film on a substrate depositing aluminium in an atmosphere of oxygen and/or nitrogen, and varying the oxygen to nitrogen ratio to allow a film of aluminium oxide and/or aluminium nitride and/or aluminium oxynitride to be obtained as necessary.
- oxygen to nitrogen ratio is also present in said atmosphere.
- the deposition is performed at room temperature.
- the deposition may be by sputtering which may be reactive d.c, reactive low frequency or reactive radio frequency sputtering.
- the low frequency sputtering has a power supply operating in the kilohertz region.
- the aluminium atoms may be removed from the aluminium target by a noble gas plasma.
- Optionally reactive sputtering of the aluminium atoms may be achieved solely in the presence of nitrogen and/or oxygen.
- the flow rates of the noble gas may be in the range of 0 - 100 seem.
- the noble gas may be argon.
- the aluminium atoms may react with oxygen and/or nitrogen to form a film or coating on a suitable surface.
- the variation of the oxygen/nitrogen ratio is effected by varying the relative flow rates of the oxygen and nitrogen while maintaining the field strength of the reactive radio frequency.
- the flow rates of the oxygen and nitrogen may be typically in the range of 0 - 10 seem (standard cubic centimetres per minute) .
- the thin film produced by the method of the invention consists solely of aluminium nitride.
- oxygen and nitrogen flow rates are varied generally sinusoidally in anti-phase.
- the deposition rate is in the range of 100-800 nm per hour.
- the deposition rate is in the range of 100-400 nm per hour.
- a pigment comprising a thin film as previously defined.
- the thin film may be ground to a suitable particle size to achieve the desired spectral properties.
- the thin film can be incorporated into a suitable carrier material to form a paint.
- the carrier material is transparent such that the resulting paint retains the same characteristic features of the original films.
- the invention provides a stress matched thin film for coating a diamond surface.
- the diamond surface can be of a natural or man-made diamond.
- the stress matched thin film can be varied in composition to provide a surface with stress characteristics which match those stress characteristics of another material to which the diamond surface can be attached.
- the thin film can be used to allow diamond surfaces to be attached to tools.
- the diamond surface can be coated with a thin film which confers thermal protection to the diamond.
- the invention provides a filter comprising a thin film as previously defined wherein the filter has high transmission except for a narrow region centred on wavelength ⁇ 0 .
- the filter may be used as or in laser goggles , laser rejection filters, laser mirrors, head-up displays or any other suitable application.
- the invention provides the use of a thin film as previously defined to coat and protect vulnerable surfaces from chemical attack and/or to extend the lifetime of tools, for example, tools with sharp working edges .
- the surfaces may include metals, dielectrics, semiconductors and plastics.
- the thin film can be used to allow an additional coating of diamond to be applied to the surface.
- Fig 1 is a graph that illustrates how transmission var i es as ⁇ 0 var j_ es with the number of deposition cycles.
- Fig 2 is a graph that illustrates both the calculated and the measured transmission of the films.
- Figs 3 (a), (b) and (c) are spectra which illustrate depth profiling of a thin film using X-ray Photon Spectroscopy (XPS) of 0 Is, N Is and Al 2p binding energies.
- XPS X-ray Photon Spectroscopy
- Figure 1 shows how the transmission varies as ⁇ 0 varies with the number of cycles deposited for the following parameters , which are in a range appropriate to the aluminium oxynitride films .
- Figure 2 shows the experimental realisation (full line) of such a filter on glass. After measurement of the transmission the films are broken and the thickness measured on a Hitachi S4100 field emission scanning electron microscope (SEM) .
- SEM field emission scanning electron microscope
- the dotted line in Fig. 2 is calculated spectrum, using the measured cycle thickness and the measured ⁇ to calculate n from Equn.2 (see Example 3) and adjusting nrange for a g ⁇ ood fit to the sp*-ectral width.
- the calculation takes into account the glass absorption, but assumes the oxynitride films to be dispersion free.
- the fit to the side lobes is very sensitive to the assumed starting phase of the sine wave, but is also sensitive to the end layer at the film-air boundary (the end phase of the sine wave in a sense) .
- the spectrum in Fig.2 has 35.4 cycles and ⁇ has been adjusted for a good fit to the sidelobes.
- Figure 3 shows that these films are varying continuously in composition and hence in refractive index since alternating layers of aluminium oxide and aluminium nitride with thicknesses close to quarter waves can show similar optical performance.
- X-ray Photon Spectroscopy shows that the oxygen Is and nitrogen Is peaks vary sinusoidally and in antiphase with depth from the surface.
- the aluminium 2p peak in contrast, is of constant height but varies in energy with depth. This is consistent with the composition of the film varying continuously from aluminium oxide to aluminium nitride.
- the observed Al 2p shift varies by around 2.9 eV.
- the aluminium peak is a single peak which varies in position rather than two peaks with varying heights which supports the conclusion that aluminium oxynitrides are continuously variable compounds rather than a mixture of phases of aluminium oxide and aluminium nitride.
- This invention relates to the growth of aluminium oxynitride films where the composition is varied continuously from Al 0 to AlN through intermediate compositions A10xNy .
- This material has a number of highly desirable properties being hard, wear-resistant, adhering strongly to a variety of substrates, transparent to around 9 microns with low absorption, resistant to chemical attack and offers a potential refractive index range of 1.6 to over 2.2. Additionally, this invention provides for high quality rugate filters, pigments and durable, chemical resistant coatings in which the refractive index varies sinusoidally with thickness.
- a target of aluminium typically a disk of diameter 200 mm.
- stress-free coatings of hard, wear- resistant, adherent coatings can be deposited on a wide variety of surfaces including metals, dielectrics, semiconductors and plastics by co-depositing aluminium oxide and aluminium nitride whereby inherent stresses are cancelled. This can be done as sequential layers of aluminium oxide and aluminium nitride or as layer of layers of aluminium oxynitride.
- a removable shutter can be positioned between the substrates and the target and/or a means for moving the substrates into and out of the sputtering position is also commonly used.
- the chamber is evacuated by suitable vacuum pumps, preferably to a residual vacuum of the order of 10 " torr.
- the chamber is then filled with a noble gas, typically argon, to a pressure which is typically in the range of 1 - 10 millitorr.
- a plasma discharge is created by means of a radio- frequency power supply, typically 1 kilowatt in power, for a 200 mm diameter aluminium target. After some time, typically 30 minutes with the shutter obscuring the substrates or having moved the substrates out of the sputtering position, the surface of the target will be conditioned by the plasma and suitable amounts of the reactive gases, oxygen and nitrogen can be added to the noble gas to commence reactive sputtering.
- a radio- frequency power supply typically 1 kilowatt in power
- the desired amounts of noble gas, oxygen and nitrogen can be controlled by commonly available mass-flow controllers with mass flows of noble gas, of oxygen and of nitrogen in the range of 0 - 10 seem (standard cubic centimetres per minute) .
- the shutter can be opened or the substrates then moved into the sputtering position for the time necessary to produce the required thickness of deposit.
- a typical system as described can produce film deposition rates in the region of 150 - 800 nm/hr (dependent of film composition and target to substrate distance) . Higher deposition rates can be achieved using reactive d.c. sputtering or preferably "low-frequency" sputtering whereby a power supply operating at a frequency in the kilohertz region is used to reduce the charging effects encountered with d.c. power supplies.
- Pigments can be produced from thin films by depositing onto and subsequently removing the film from, a suitable surface or substrate. The film can then be ground down to produce a pigment which is long lasting, chemically resistant and can be incorporated into a suitable host to form paints which retain the same characteristic features of the original films which can then be applied to surfaces in a variety of ways.
- the colour of pigments manufactured from such films varies with the viewing angle and cannot be reproduced by a photocopier or colour printer.
- the films may be easily removed and recovered if they are deposited onto substrates or surfaces which are flexible or which can be dissolved in a suitable solvent.
- a coating of a suitable material may be layed down onto the steel or iron, for instance, before laying down the diamond.
- a thin film of material may be layed down onto a diamond surface first.
- a thin film of aluminium oxynitride and/or oxide and/or nitride can be deposited by the technique described using the technique described herein.
- the stress properties of the film can be modified to match those of the diamond surface so that the film forms a coherent layer on the diamond surface.
- the composition of the film can then be altered so that the stress properties of the film match those of another material which is to be stuck to the diamond surface via the thin film of aluminium oxynitride and/or oxide and/or nitride.
- This technique can be used for example in the manufacture of tools with diamond components where there are significant difficulties in depositing or attaching diamond films onto certain materials. For instance: in the manufacture of diamond tipped drill- bits, grinding and polishing tools.
- the tool can be treated initially with a thin film of aluminium oxynitride and/or oxide and/or nitride. After this stage is completed the treated tool can be coated with an additional layer of diamond, grown by standard techniques .
- Further applications include providing a thermally stable coating for diamond windows for use in optical, IR or UV sensors .
- Rugate filters have a spectral response similar to that of a rejection filter: having high transmission everywhere except a narrow region centred on wavelength, ⁇ o .
- the refractive index variation is generally given by
- n ( z ) n-. ⁇ ar ⁇ + n rang9 s in ( 4 m mean Z + ⁇ ) 2 ⁇ 0
- n-. aa- is the average refractive index
- n ra ⁇ lg ⁇ is the refractive index range and the geometrical thickness of one sinusoidal cycle, t 0 .
- Equn. (2) t 0 ⁇
- phase factor ⁇ in Equn.(l) is the optical density at ⁇ Q is . important in determining the magnitudes and positions of the sidebands which are observed with this type of filter"
- Equn. 2 shows that the centre wavelength is varied by changing the physical thickness of one cycle and Equn 3 shows that the bandwidth can be varied by changing the refractive index range of the sinusoid.
- the optical density at ⁇ is dependent on the number of cycles deposited.
- Such filters have application in laser goggles for protection of humans and laser rejection filters for instruments, as general purpose laser mirrors, and in head-up displays . They may also be used instead of the holographic filters in the new generations of compact Raman spectrometers.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Chemical & Material Sciences (AREA)
- Optical Filters (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU63011/98A AU6301198A (en) | 1997-02-21 | 1998-02-23 | Thin films |
EP98907020A EP1000182A2 (en) | 1997-02-21 | 1998-02-23 | Thin films |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9703616.4A GB9703616D0 (en) | 1997-02-21 | 1997-02-21 | Thin films |
GB9703616.4 | 1997-02-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1998037254A2 true WO1998037254A2 (en) | 1998-08-27 |
WO1998037254A3 WO1998037254A3 (en) | 1998-11-19 |
Family
ID=10808066
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB1998/000556 WO1998037254A2 (en) | 1997-02-21 | 1998-02-23 | Thin films |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1000182A2 (en) |
AU (1) | AU6301198A (en) |
GB (1) | GB9703616D0 (en) |
WO (1) | WO1998037254A2 (en) |
ZA (1) | ZA981447B (en) |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1970465A2 (en) | 2007-03-13 | 2008-09-17 | JDS Uniphase Corporation | Method and sputter-deposition system for depositing a layer composed of a mixture of materials and having a predetermined refractive index |
US8072561B2 (en) | 2007-04-10 | 2011-12-06 | Jds Uniphase Corporation | Twisted nematic xLCD contrast compensation with tilted-plate retarders |
US8454805B2 (en) | 2008-03-25 | 2013-06-04 | Spts Technologies Limited | Method of depositing amorphus aluminium oxynitride layer by reactive sputtering of an aluminium target in a nitrogen/oxygen atmosphere |
CN104416206A (en) * | 2013-08-30 | 2015-03-18 | 钴碳化钨硬质合金公司 | Refractory coatings for cutting tools |
US9079802B2 (en) | 2013-05-07 | 2015-07-14 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US9366784B2 (en) | 2013-05-07 | 2016-06-14 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US9684097B2 (en) | 2013-05-07 | 2017-06-20 | Corning Incorporated | Scratch-resistant articles with retained optical properties |
US9703011B2 (en) | 2013-05-07 | 2017-07-11 | Corning Incorporated | Scratch-resistant articles with a gradient layer |
US9726786B2 (en) | 2014-05-12 | 2017-08-08 | Corning Incorporated | Durable and scratch-resistant anti-reflective articles |
US9790593B2 (en) | 2014-08-01 | 2017-10-17 | Corning Incorporated | Scratch-resistant materials and articles including the same |
US10160688B2 (en) | 2013-09-13 | 2018-12-25 | Corning Incorporated | Fracture-resistant layered-substrates and articles including the same |
US10416352B2 (en) | 2015-09-14 | 2019-09-17 | Corning Incorporated | High light transmission and scratch-resistant anti-reflective articles |
US10948629B2 (en) | 2018-08-17 | 2021-03-16 | Corning Incorporated | Inorganic oxide articles with thin, durable anti-reflective structures |
US11267973B2 (en) | 2014-05-12 | 2022-03-08 | Corning Incorporated | Durable anti-reflective articles |
US11667565B2 (en) | 2013-05-07 | 2023-06-06 | Corning Incorporated | Scratch-resistant laminates with retained optical properties |
US12352924B2 (en) | 2020-07-09 | 2025-07-08 | Corning Incorporated | Display articles with diffractive, antiglare surfaces and methods of making the same |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5437931A (en) * | 1993-10-20 | 1995-08-01 | Industrial Technology Research Institute | Optically variable multilayer film and optically variable pigment obtained therefrom |
-
1997
- 1997-02-21 GB GBGB9703616.4A patent/GB9703616D0/en active Pending
-
1998
- 1998-02-20 ZA ZA981447A patent/ZA981447B/en unknown
- 1998-02-23 WO PCT/GB1998/000556 patent/WO1998037254A2/en not_active Application Discontinuation
- 1998-02-23 EP EP98907020A patent/EP1000182A2/en not_active Withdrawn
- 1998-02-23 AU AU63011/98A patent/AU6301198A/en not_active Abandoned
Cited By (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1970465A2 (en) | 2007-03-13 | 2008-09-17 | JDS Uniphase Corporation | Method and sputter-deposition system for depositing a layer composed of a mixture of materials and having a predetermined refractive index |
US8864958B2 (en) | 2007-03-13 | 2014-10-21 | Jds Uniphase Corporation | Method and sputter-deposition system for depositing a layer composed of a mixture of materials and having a predetermined refractive index |
US8072561B2 (en) | 2007-04-10 | 2011-12-06 | Jds Uniphase Corporation | Twisted nematic xLCD contrast compensation with tilted-plate retarders |
US8454805B2 (en) | 2008-03-25 | 2013-06-04 | Spts Technologies Limited | Method of depositing amorphus aluminium oxynitride layer by reactive sputtering of an aluminium target in a nitrogen/oxygen atmosphere |
US12195384B2 (en) | 2013-05-07 | 2025-01-14 | Corning Incorporated | Scratch-resistant laminates with retained optical properties |
US9703011B2 (en) | 2013-05-07 | 2017-07-11 | Corning Incorporated | Scratch-resistant articles with a gradient layer |
US9079802B2 (en) | 2013-05-07 | 2015-07-14 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US9359261B2 (en) | 2013-05-07 | 2016-06-07 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US9366784B2 (en) | 2013-05-07 | 2016-06-14 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US10444408B2 (en) | 2013-05-07 | 2019-10-15 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US9684097B2 (en) | 2013-05-07 | 2017-06-20 | Corning Incorporated | Scratch-resistant articles with retained optical properties |
US11667565B2 (en) | 2013-05-07 | 2023-06-06 | Corning Incorporated | Scratch-resistant laminates with retained optical properties |
US11231526B2 (en) | 2013-05-07 | 2022-01-25 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
US11714213B2 (en) | 2013-05-07 | 2023-08-01 | Corning Incorporated | Low-color scratch-resistant articles with a multilayer optical film |
GB2520798A (en) * | 2013-08-30 | 2015-06-03 | Kennametal Inc | Refractory coatings for cutting tools |
CN104416206A (en) * | 2013-08-30 | 2015-03-18 | 钴碳化钨硬质合金公司 | Refractory coatings for cutting tools |
US9427808B2 (en) | 2013-08-30 | 2016-08-30 | Kennametal Inc. | Refractory coatings for cutting tools |
DE102014109652B4 (en) | 2013-08-30 | 2022-05-05 | Kennametal Inc. | Coated cutting tool and method of making a coated cutting tool |
US10160688B2 (en) | 2013-09-13 | 2018-12-25 | Corning Incorporated | Fracture-resistant layered-substrates and articles including the same |
US10436945B2 (en) | 2014-05-12 | 2019-10-08 | Corning Incorporated | Durable and scratch-resistant anti-reflective articles |
US11267973B2 (en) | 2014-05-12 | 2022-03-08 | Corning Incorporated | Durable anti-reflective articles |
US12421398B2 (en) | 2014-05-12 | 2025-09-23 | Corning Incorporated | Durable anti-reflective articles |
US9726786B2 (en) | 2014-05-12 | 2017-08-08 | Corning Incorporated | Durable and scratch-resistant anti-reflective articles |
US9790593B2 (en) | 2014-08-01 | 2017-10-17 | Corning Incorporated | Scratch-resistant materials and articles including the same |
US10837103B2 (en) | 2014-08-01 | 2020-11-17 | Corning Incorporated | Scratch-resistant materials and articles including the same |
US10995404B2 (en) | 2014-08-01 | 2021-05-04 | Corning Incorporated | Scratch-resistant materials and articles including the same |
US10451773B2 (en) | 2015-09-14 | 2019-10-22 | Corning Incorporated | High light transmission and scratch-resistant anti-reflective articles |
US10416352B2 (en) | 2015-09-14 | 2019-09-17 | Corning Incorporated | High light transmission and scratch-resistant anti-reflective articles |
US11698475B2 (en) | 2015-09-14 | 2023-07-11 | Corning Incorporated | Scratch-resistant anti-reflective articles |
US11002885B2 (en) | 2015-09-14 | 2021-05-11 | Corning Incorporated | Scratch-resistant anti-reflective articles |
US11567237B2 (en) | 2018-08-17 | 2023-01-31 | Corning Incorporated | Inorganic oxide articles with thin, durable anti-reflective structures |
US10948629B2 (en) | 2018-08-17 | 2021-03-16 | Corning Incorporated | Inorganic oxide articles with thin, durable anti-reflective structures |
US11906699B2 (en) | 2018-08-17 | 2024-02-20 | Corning Incorporated | Inorganic oxide articles with thin, durable anti reflective structures |
US12352924B2 (en) | 2020-07-09 | 2025-07-08 | Corning Incorporated | Display articles with diffractive, antiglare surfaces and methods of making the same |
Also Published As
Publication number | Publication date |
---|---|
EP1000182A2 (en) | 2000-05-17 |
WO1998037254A3 (en) | 1998-11-19 |
AU6301198A (en) | 1998-09-09 |
ZA981447B (en) | 1998-08-27 |
GB9703616D0 (en) | 1997-04-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1000182A2 (en) | Thin films | |
US5718976A (en) | Erosion resistant diamond-like nanocomposite coatings for optical components | |
Wang et al. | Helicon plasma deposition of a TiO 2/SiO 2 multilayer optical filter with graded refractive index profiles | |
EP0027929B1 (en) | A process for coating an optical element | |
US20100035036A1 (en) | Durable antireflective multispectral infrared coatings | |
EP3776016B1 (en) | Multispectral interference coating with diamond-like carbon (dlc) film | |
Mollart et al. | Transition metal oxide anti-reflection coatings for airborne diamond optics | |
TWI419988B (en) | Method of making durable articles | |
Wolfe et al. | Deposition of durable wideband silver mirror coatings using long-throw low-pressure DC-pulsed magnetron sputtering | |
Lim et al. | Rugate filters grown by plasma-enhanced chemical vapor deposition | |
Brierley et al. | Diamond coatings for large-area IR windows | |
Tang et al. | Fabrication and characteristics of rugate filters deposited by the TSH reactive sputtering method | |
Gibson et al. | Closed field magnetron sputtering: new generation sputtering process for optical coatings | |
Gibson et al. | Deposition of multilayer optical coatings using closed field magnetron sputtering | |
Placido et al. | Graded-index films using aluminum oxynitrides | |
Kim et al. | Structural and optical properties of amorphous hydrogenated carbon nitride films prepared by plasma-enhanced chemical vapor deposition | |
Dixit et al. | Infrared studies of hard hydrogenated amorphous carbon (a C: H) film and the effect of argon plasma treatment | |
Frach et al. | Advanced key technologies for magnetron sputtering and PECVD of inorganic and hybrid transparent coatings | |
Martin et al. | Properties of reactively deposited SiC and GeC alloys | |
Cheng et al. | Optical and structural properties of Nb x Si y O composite films prepared by metallic co-sputtering process | |
Bartzsch et al. | Silicon oxynitride rugate filters grown by reactive pulse magnetron sputtering | |
KR19990048881A (en) | Corrosion-resistant coating layer of infrared optical window using silicon-containing diamond-like hard carbon film and its manufacturing method | |
Vernhes et al. | Properties, growth and filter applications of a-SiNx: H alloys prepared in pulsed radiofrequency plasma | |
Mitura et al. | Antireflection, hard carbon coatings for IR optics | |
Tsai et al. | Optical and physical properties of composite films prepared by co-evaporation of TiO2 and MgF2 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM GW HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN ML MR NE SN TD TG |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
AK | Designated states |
Kind code of ref document: A3 Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM GW HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT GH |
|
AL | Designated countries for regional patents |
Kind code of ref document: A3 Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 1998907020 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 09367984 Country of ref document: US |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
NENP | Non-entry into the national phase |
Ref country code: JP Ref document number: 1998536409 Format of ref document f/p: F |
|
WWP | Wipo information: published in national office |
Ref document number: 1998907020 Country of ref document: EP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 1998907020 Country of ref document: EP |