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WO2003012368A1 - Appareil de mesure d'une forme superficielle, procede de mesure d'une forme superficielle et appareil graphique destine a l'etat superficiel - Google Patents

Appareil de mesure d'une forme superficielle, procede de mesure d'une forme superficielle et appareil graphique destine a l'etat superficiel Download PDF

Info

Publication number
WO2003012368A1
WO2003012368A1 PCT/JP2002/007710 JP0207710W WO03012368A1 WO 2003012368 A1 WO2003012368 A1 WO 2003012368A1 JP 0207710 W JP0207710 W JP 0207710W WO 03012368 A1 WO03012368 A1 WO 03012368A1
Authority
WO
WIPO (PCT)
Prior art keywords
surface shape
shape measurement
stereo image
stereo
imaging
Prior art date
Application number
PCT/JP2002/007710
Other languages
English (en)
French (fr)
Inventor
Nobuo Kochi
Hitoshi Otani
Satoru Niimura
Original Assignee
Topcon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001230368A external-priority patent/JP2003042730A/ja
Priority claimed from JP2001234644A external-priority patent/JP2003042732A/ja
Priority claimed from JP2001257832A external-priority patent/JP2003065737A/ja
Application filed by Topcon Corporation filed Critical Topcon Corporation
Priority to US10/485,276 priority Critical patent/US7206080B2/en
Priority to EP02751783A priority patent/EP1422495A4/en
Publication of WO2003012368A1 publication Critical patent/WO2003012368A1/ja

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04Interpretation of pictures
    • G01C11/06Interpretation of pictures by comparison of two or more pictures of the same area
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/55Depth or shape recovery from multiple images
    • G06T7/593Depth or shape recovery from multiple images from stereo images
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/80Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85Stereo camera calibration
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • H04N13/207Image signal generators using stereoscopic image cameras using a single 2D image sensor
    • H04N13/221Image signal generators using stereoscopic image cameras using a single 2D image sensor using the relative movement between cameras and objects
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • H04N13/239Image signal generators using stereoscopic image cameras using two 2D image sensors having a relative position equal to or related to the interocular distance
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • H04N13/243Image signal generators using stereoscopic image cameras using three or more 2D image sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • H04N13/246Calibration of cameras
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/30Image reproducers
    • H04N13/302Image reproducers for viewing without the aid of special glasses, i.e. using autostereoscopic displays
    • H04N13/32Image reproducers for viewing without the aid of special glasses, i.e. using autostereoscopic displays using arrays of controllable light sources; using moving apertures or moving light sources
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • G06T2207/10012Stereo images
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/10Processing, recording or transmission of stereoscopic or multi-view image signals
    • H04N13/189Recording image signals; Reproducing recorded image signals
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N2013/0074Stereoscopic image analysis
    • H04N2013/0081Depth or disparity estimation from stereoscopic image signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PCT/JP2002/007710 2001-07-30 2002-07-30 Appareil de mesure d'une forme superficielle, procede de mesure d'une forme superficielle et appareil graphique destine a l'etat superficiel WO2003012368A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US10/485,276 US7206080B2 (en) 2001-07-30 2002-07-30 Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatus
EP02751783A EP1422495A4 (en) 2001-07-30 2002-07-30 SURFACE MEASUREMENT DEVICE, SURFACE FORMAT METHOD, SURFACE STATE GRAPHIC DEVICE

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2001-230368 2001-07-30
JP2001230368A JP2003042730A (ja) 2001-07-30 2001-07-30 表面形状測定装置、及びその方法、並びに表面状態図化装置
JP2001234644A JP2003042732A (ja) 2001-08-02 2001-08-02 表面形状測定装置及びその方法、表面形状測定プログラム、並びに表面状態図化装置
JP2001-234644 2001-08-02
JP2001-257832 2001-08-28
JP2001257832A JP2003065737A (ja) 2001-08-28 2001-08-28 表面形状測定装置及びその方法、並びに表面状態図化装置

Publications (1)

Publication Number Publication Date
WO2003012368A1 true WO2003012368A1 (fr) 2003-02-13

Family

ID=27347246

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/007710 WO2003012368A1 (fr) 2001-07-30 2002-07-30 Appareil de mesure d'une forme superficielle, procede de mesure d'une forme superficielle et appareil graphique destine a l'etat superficiel

Country Status (3)

Country Link
US (1) US7206080B2 (ja)
EP (1) EP1422495A4 (ja)
WO (1) WO2003012368A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011024895A1 (ja) * 2009-08-28 2011-03-03 株式会社オプトン 3次元形状測定方法及び3次元形状測定システム

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1285224A1 (de) * 2000-05-16 2003-02-26 Steinbichler Optotechnik Gmbh Verfahren und vorrichtung zum bestimmen der 3d-form eines objektes
JP4010753B2 (ja) * 2000-08-08 2007-11-21 株式会社リコー 形状計測システムと撮像装置と形状計測方法及び記録媒体
JP4877891B2 (ja) * 2001-08-03 2012-02-15 株式会社トプコン 校正用被写体
FI111755B (fi) * 2001-11-23 2003-09-15 Mapvision Oy Ltd Menetelmä ja järjestelmä konenäköjärjestelmän kalibroimiseksi
US20050233770A1 (en) * 2002-02-06 2005-10-20 Ramsey Craig C Wireless substrate-like sensor
US7289230B2 (en) * 2002-02-06 2007-10-30 Cyberoptics Semiconductors, Inc. Wireless substrate-like sensor
US20050224902A1 (en) * 2002-02-06 2005-10-13 Ramsey Craig C Wireless substrate-like sensor
TW561241B (en) * 2002-08-22 2003-11-11 Ind Tech Res Inst Method and apparatus for calibrating laser three-dimensional digitizing sensor
JP2005308553A (ja) * 2004-04-21 2005-11-04 Topcon Corp 三次元画像計測装置及び方法
DE102005018336A1 (de) * 2005-02-28 2006-08-31 Osram Opto Semiconductors Gmbh Lichtleiter
DE102005043070B4 (de) * 2005-09-07 2017-01-26 Jenoptik Robot Gmbh Verfahren zur hochgenauen dreidimensionalen Vermessung und/oder Rekonstruktion von Objekten mit Hilfe digitaler Bildaufnahmen, beispielsweise zur Bildauswertung von Verkehrsstrecken
JP2009509582A (ja) * 2005-09-22 2009-03-12 スリーエム イノベイティブ プロパティズ カンパニー 3次元イメージングにおけるアーチファクトの軽減
US7804306B2 (en) * 2006-02-21 2010-09-28 CyterOptics Semiconductor, Inc. Capacitive distance sensing in semiconductor processing tools
US7893697B2 (en) * 2006-02-21 2011-02-22 Cyberoptics Semiconductor, Inc. Capacitive distance sensing in semiconductor processing tools
GB0608841D0 (en) * 2006-05-04 2006-06-14 Isis Innovation Scanner system and method for scanning
CN101517701B (zh) * 2006-09-29 2011-08-10 赛博光学半导体公司 衬底形的粒子传感器
US7778793B2 (en) * 2007-03-12 2010-08-17 Cyberoptics Semiconductor, Inc. Wireless sensor for semiconductor processing systems
JP4915737B2 (ja) * 2007-03-13 2012-04-11 興和株式会社 画像解析システム、及び画像解析プログラム
US20080246493A1 (en) * 2007-04-05 2008-10-09 Gardner Delrae H Semiconductor Processing System With Integrated Showerhead Distance Measuring Device
US20090015268A1 (en) * 2007-07-13 2009-01-15 Gardner Delrae H Device and method for compensating a capacitive sensor measurement for variations caused by environmental conditions in a semiconductor processing environment
US8111907B2 (en) * 2007-07-31 2012-02-07 United Technologies Corporation Method for repeatable optical determination of object geometry dimensions and deviations
US8094321B2 (en) * 2008-02-26 2012-01-10 Caterpillar Inc. Photogrammetric target and related method
JP4440341B2 (ja) * 2008-05-19 2010-03-24 パナソニック株式会社 キャリブレーション方法、キャリブレーション装置及びその装置を備えるキャリブレーションシステム
US8326022B2 (en) * 2008-05-22 2012-12-04 Matrix Electronic Measuring Properties, Llc Stereoscopic measurement system and method
US8345953B2 (en) * 2008-05-22 2013-01-01 Matrix Electronic Measuring Properties, Llc Stereoscopic measurement system and method
US8249332B2 (en) 2008-05-22 2012-08-21 Matrix Electronic Measuring Properties Llc Stereoscopic measurement system and method
US9449378B2 (en) 2008-05-22 2016-09-20 Matrix Electronic Measuring Properties, Llc System and method for processing stereoscopic vehicle information
WO2009143319A1 (en) * 2008-05-22 2009-11-26 Matrix Electronic Measuring, L.P. Stereoscopic measurement system and method
US8526705B2 (en) * 2009-06-10 2013-09-03 Apple Inc. Driven scanning alignment for complex shapes
DE102009032262A1 (de) * 2009-07-08 2011-01-13 Steinbichler Optotechnik Gmbh Verfahren zur Bestimmung der 3D-Koordinaten eines Objekts
DE102009032771B4 (de) * 2009-07-10 2017-06-29 Gom Gmbh Messeinrichtung und Verfahren zum dreidimensionalen optischen Vermessen von Objekten
US9595108B2 (en) * 2009-08-04 2017-03-14 Eyecue Vision Technologies Ltd. System and method for object extraction
US8379224B1 (en) * 2009-09-18 2013-02-19 The Boeing Company Prismatic alignment artifact
TWI394097B (zh) * 2009-10-12 2013-04-21 Nat Univ Tsing Hua 移動物體的偵測方法以及偵測系統
DE202009017401U1 (de) 2009-12-22 2010-05-12 Corpus.E Ag Kalibrationsfreie und genaue optische Erfassung der Raumform
KR101129326B1 (ko) * 2010-06-16 2012-03-27 허성용 영상 촬영용 광축 정렬 장치 및 광축 정렬 방법
JP5472463B2 (ja) * 2010-06-30 2014-04-16 富士通株式会社 画像処理プログラムおよび画像処理装置
US9519976B1 (en) * 2011-01-28 2016-12-13 Lucasfilm Entertainment Company Ltd. Calibrating stereoscopic cameras
US8358333B2 (en) * 2011-03-04 2013-01-22 The Boeing Company Photogrammetry measurement system
JP5775354B2 (ja) 2011-04-28 2015-09-09 株式会社トプコン 離着陸ターゲット装置及び自動離着陸システム
JP5882693B2 (ja) * 2011-11-24 2016-03-09 株式会社トプコン 航空写真撮像方法及び航空写真撮像装置
EP2527787B1 (en) 2011-05-23 2019-09-11 Kabushiki Kaisha TOPCON Aerial photograph image pickup method and aerial photograph image pickup apparatus
DE102011104216A1 (de) * 2011-06-15 2012-12-20 Scanbull Software Gmbh Verfahren und Vorrichtung zum dreidimensionalen Erfassen von Objekten sowie Computerprogrammprodukt
DE102011114674C5 (de) * 2011-09-30 2020-05-28 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zum Bestimmen der 3D-Koordinaten eines Objekts
DE102012100953B4 (de) * 2012-02-06 2020-01-09 A.Tron3D Gmbh Vorrichtung zum Erfassen der dreidimensionalen Geometrie von Objekten und Verfahren zum Betreiben derselben
US9003670B2 (en) 2012-03-08 2015-04-14 United Technologies Corporation System and method for measuring a workpiece relative to a common measurement coordinate system
US20130329012A1 (en) * 2012-06-07 2013-12-12 Liberty Reach Inc. 3-d imaging and processing system including at least one 3-d or depth sensor which is continually calibrated during use
CN103733019B (zh) * 2012-07-24 2017-03-01 精益视觉科技私人有限公司 用于确定集成电路封装的共面性的方法和装置
JP6122591B2 (ja) 2012-08-24 2017-04-26 株式会社トプコン 写真測量用カメラ及び航空写真装置
KR20140099098A (ko) * 2013-02-01 2014-08-11 한국전자통신연구원 능동 스테레오 매칭 방법 및 그 장치
TWI480507B (zh) * 2013-07-12 2015-04-11 Univ Nat Taiwan Science Tech 三維模型重建方法及其系統
NL2011858C2 (en) * 2013-11-28 2015-06-01 Univ Delft Tech Stereo-imaging sensor position localization method and system.
DE102014111656A1 (de) * 2014-08-14 2016-02-18 BIBA - Bremer Institut für Produktion und Logistik GmbH Vorrichtung und Verfahren zur kamerabasierten Konturenkontrolle
CN104243843B (zh) * 2014-09-30 2017-11-03 北京智谷睿拓技术服务有限公司 拍摄光照补偿方法、补偿装置及用户设备
US10666925B2 (en) * 2015-04-29 2020-05-26 Adam S Rowell Stereoscopic calibration using a multi-planar calibration target
US9824453B1 (en) 2015-10-14 2017-11-21 Allstate Insurance Company Three dimensional image scan for vehicle
US10789850B2 (en) * 2016-05-10 2020-09-29 Mitsubishi Electric Corporation Obstacle detection device, driving assistance system, and obstacle detection method
KR102433837B1 (ko) * 2016-12-07 2022-08-18 한국전자통신연구원 3차원 정보 생성 장치
US10657665B2 (en) * 2016-12-07 2020-05-19 Electronics And Telecommunications Research Institute Apparatus and method for generating three-dimensional information
US10841561B2 (en) * 2017-03-24 2020-11-17 Test Research, Inc. Apparatus and method for three-dimensional inspection
US10121237B1 (en) 2017-04-17 2018-11-06 Rohr, Inc. Component inspection method
US10762658B2 (en) * 2017-10-24 2020-09-01 Altek Corporation Method and image pick-up apparatus for calculating coordinates of object being captured using fisheye images
DE102017126495B4 (de) * 2017-11-10 2022-05-05 Zauberzeug Gmbh Kalibrierung eines stationären Kamerasystems zur Positionserfassung eines mobilen Roboters
DE102017128698A1 (de) * 2017-12-04 2019-06-06 Innogy Innovation Gmbh Verfahren und System zur Bestimmung einer Position eines Objektes
RU2693532C1 (ru) * 2018-11-28 2019-07-03 федеральное государственное бюджетное образовательное учреждение высшего образования "Национальный исследовательский университет "МЭИ" (ФГБОУ ВО "НИУ "МЭИ") Способ повышения точности геометрических измерений, проводимых с помощью стереоскопического устройства на основе призменно-линзовой оптической системы
US10816429B2 (en) 2018-12-07 2020-10-27 Raytheon Technologies Corporation Determining a moment weight of a component based on measured surface geometry/solid model of the component
CN109683439B (zh) * 2018-12-13 2024-03-29 深圳阜时科技有限公司 光学投影模组、感测装置、设备及光学投影模组组装方法
CN111609266B (zh) * 2020-06-02 2021-09-24 苏州金迪智能科技有限公司 一种空间拍摄装置
CN112116572A (zh) * 2020-09-14 2020-12-22 景德镇瓷与链智能科技有限公司 一种相机精确定位物体表面位置图像的方法
CN117651905A (zh) * 2021-06-22 2024-03-05 惠普发展公司,有限责任合伙企业 用于彩色成像器的液晶可调谐偏振滤光器
JP2023046978A (ja) * 2021-09-24 2023-04-05 富士フイルムビジネスイノベーション株式会社 照合装置及びプログラム
DE102024200967A1 (de) * 2024-02-02 2025-08-07 Carl Zeiss Meditec Ag Verfahren und System zur Erzeugung eines dreidimensionalen Abbilds zumindest eines Teilabschnitts einer Zahnreihe, Computerprogrammprodukt und Spiegelelement

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996034365A1 (en) 1995-04-25 1996-10-31 Cognitens Ltd. Apparatus and method for recreating and manipulating a 3d object based on a 2d projection thereof
JPH0981790A (ja) * 1995-09-19 1997-03-28 Canon Inc 三次元形状復元装置および方法
JPH09119819A (ja) * 1995-10-24 1997-05-06 Olympus Optical Co Ltd 三次元情報再構成装置
GB2314621A (en) 1996-06-25 1998-01-07 Jenoptik Jena Gmbh Calibrating camera image fields
JPH1091790A (ja) * 1996-09-13 1998-04-10 Canon Inc 三次元形状抽出方法及び装置並びに記憶媒体
JPH10221036A (ja) * 1997-02-07 1998-08-21 Hitachi Ltd 部品の品種自動識別方法および装置
JPH1196374A (ja) * 1997-07-23 1999-04-09 Sanyo Electric Co Ltd 3次元モデリング装置、3次元モデリング方法および3次元モデリングプログラムを記録した媒体
JPH11161794A (ja) * 1997-11-28 1999-06-18 Toshiba Corp 3次元情報復元装置及びその方法
JP2000339467A (ja) * 1999-05-31 2000-12-08 Minolta Co Ltd 3次元データ入力装置
JP2001197521A (ja) * 2000-01-06 2001-07-19 Toppan Printing Co Ltd 撮像装置、撮像方法及び撮像条件に係るデータを記録した記録媒体

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0749937B2 (ja) * 1988-03-22 1995-05-31 工業技術院長 形状測定方法
DE4417872A1 (de) * 1994-05-22 1995-11-23 Robert Prof Dr Ing Massen Optische Digitalisierung von Körperteilen
US5563703A (en) * 1994-06-20 1996-10-08 Motorola, Inc. Lead coplanarity inspection apparatus and method thereof
US5495330A (en) * 1994-09-16 1996-02-27 Emhart Glass Machinery Investments Inc. Container inspection machine having sequentially accessed computer alignment gages
JP3361643B2 (ja) * 1995-02-14 2003-01-07 富士通株式会社 画像処理システム
US5852672A (en) * 1995-07-10 1998-12-22 The Regents Of The University Of California Image system for three dimensional, 360 DEGREE, time sequence surface mapping of moving objects
US5793493A (en) * 1997-04-04 1998-08-11 Milliken Research Corporation System for maintaining the cutting condition of double ground knife blades
US6055054A (en) * 1997-05-05 2000-04-25 Beaty; Elwin M. Three dimensional inspection system
US5909285A (en) * 1997-05-05 1999-06-01 Beaty; Elwin M. Three dimensional inspection system
EP0880010B1 (en) * 1997-05-22 2005-02-23 Kabushiki Kaisha TOPCON Measuring apparatus
US6909513B1 (en) * 1999-05-26 2005-06-21 Sanyo Electric Co., Ltd. Shape measuring device
US7643025B2 (en) * 2003-09-30 2010-01-05 Eric Belk Lange Method and apparatus for applying stereoscopic imagery to three-dimensionally defined substrates

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996034365A1 (en) 1995-04-25 1996-10-31 Cognitens Ltd. Apparatus and method for recreating and manipulating a 3d object based on a 2d projection thereof
JPH0981790A (ja) * 1995-09-19 1997-03-28 Canon Inc 三次元形状復元装置および方法
JPH09119819A (ja) * 1995-10-24 1997-05-06 Olympus Optical Co Ltd 三次元情報再構成装置
GB2314621A (en) 1996-06-25 1998-01-07 Jenoptik Jena Gmbh Calibrating camera image fields
JPH1091790A (ja) * 1996-09-13 1998-04-10 Canon Inc 三次元形状抽出方法及び装置並びに記憶媒体
JPH10221036A (ja) * 1997-02-07 1998-08-21 Hitachi Ltd 部品の品種自動識別方法および装置
JPH1196374A (ja) * 1997-07-23 1999-04-09 Sanyo Electric Co Ltd 3次元モデリング装置、3次元モデリング方法および3次元モデリングプログラムを記録した媒体
JPH11161794A (ja) * 1997-11-28 1999-06-18 Toshiba Corp 3次元情報復元装置及びその方法
JP2000339467A (ja) * 1999-05-31 2000-12-08 Minolta Co Ltd 3次元データ入力装置
JP2001197521A (ja) * 2000-01-06 2001-07-19 Toppan Printing Co Ltd 撮像装置、撮像方法及び撮像条件に係るデータを記録した記録媒体

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"Merging Multiple Stereo Surface Maps Through Camera Self-Calibration", PROCEEDINGS OF SOUTHEASTCON., WILLIAMSBURG, APRIL 7 -10, 1991, NEW YORK, IEEE, US, vol. 1, 1 January 1991 (1991-01-01), pages 356 - 360
See also references of EP1422495A4 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011024895A1 (ja) * 2009-08-28 2011-03-03 株式会社オプトン 3次元形状測定方法及び3次元形状測定システム
JP2011047876A (ja) * 2009-08-28 2011-03-10 Teruaki Yogo 3次元形状測定方法

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US20040234122A1 (en) 2004-11-25
US7206080B2 (en) 2007-04-17
EP1422495A1 (en) 2004-05-26

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