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WO2008120362A1 - 不良箇所特定装置、不良箇所特定方法および集積回路 - Google Patents

不良箇所特定装置、不良箇所特定方法および集積回路 Download PDF

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Publication number
WO2008120362A1
WO2008120362A1 PCT/JP2007/056903 JP2007056903W WO2008120362A1 WO 2008120362 A1 WO2008120362 A1 WO 2008120362A1 JP 2007056903 W JP2007056903 W JP 2007056903W WO 2008120362 A1 WO2008120362 A1 WO 2008120362A1
Authority
WO
WIPO (PCT)
Prior art keywords
fault
fault locating
locating
scan chain
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/056903
Other languages
English (en)
French (fr)
Inventor
Takashi Otake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to PCT/JP2007/056903 priority Critical patent/WO2008120362A1/ja
Priority to EP07740341A priority patent/EP2133705A4/en
Priority to JP2009507353A priority patent/JPWO2008120362A1/ja
Publication of WO2008120362A1 publication Critical patent/WO2008120362A1/ja
Priority to US12/567,965 priority patent/US20100017666A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318525—Test of flip-flops or latches

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

　複数の順序回路（１３）を連結してなり、複数の順序回路（１３）のそれぞれに設定された設定データをシフトアウトすることにより出力データ列を出力するスキャンチェーン（１２）をそなえた集積回路の不良箇所を特定する不良箇所特定装置（２０）であって、複数の順序回路（１３）のうち少なくとも一つの順序回路（１８）に予め規定した値を設定データとして設定する設定部（２２）と、スキャンチェーン（１２）からの出力データ列と、スキャンチェーン（１２）における少なくとも一つの順序回路（１８）の位置とに基づいて、スキャンチェーン（１２）における不良箇所を特定する特定部（２４）とをそなえることにより、スキャンテストにおいてスキャンチェーンの不良箇所を容易かつ短時間で特定する。
PCT/JP2007/056903 2007-03-29 2007-03-29 不良箇所特定装置、不良箇所特定方法および集積回路 Ceased WO2008120362A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
PCT/JP2007/056903 WO2008120362A1 (ja) 2007-03-29 2007-03-29 不良箇所特定装置、不良箇所特定方法および集積回路
EP07740341A EP2133705A4 (en) 2007-03-29 2007-03-29 ERROR LOCALIZATION DEVICE, ERROR LOCALIZATION PROCEDURE AND INTEGRATED CIRCUIT
JP2009507353A JPWO2008120362A1 (ja) 2007-03-29 2007-03-29 不良箇所特定装置、不良箇所特定方法および集積回路
US12/567,965 US20100017666A1 (en) 2007-03-29 2009-09-28 Faulty site identification apparatus, faulty site identification method, and integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/056903 WO2008120362A1 (ja) 2007-03-29 2007-03-29 不良箇所特定装置、不良箇所特定方法および集積回路

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/567,965 Continuation US20100017666A1 (en) 2007-03-29 2009-09-28 Faulty site identification apparatus, faulty site identification method, and integrated circuit

Publications (1)

Publication Number Publication Date
WO2008120362A1 true WO2008120362A1 (ja) 2008-10-09

Family

ID=39807955

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/056903 Ceased WO2008120362A1 (ja) 2007-03-29 2007-03-29 不良箇所特定装置、不良箇所特定方法および集積回路

Country Status (4)

Country Link
US (1) US20100017666A1 (ja)
EP (1) EP2133705A4 (ja)
JP (1) JPWO2008120362A1 (ja)
WO (1) WO2008120362A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236067A (zh) * 2010-04-22 2011-11-09 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及其调试电路

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010266417A (ja) * 2009-05-18 2010-11-25 Sony Corp 半導体集積回路、情報処理装置、および情報処理方法、並びにプログラム
WO2013084364A1 (ja) * 2011-12-09 2013-06-13 富士通株式会社 スキャン回路及び半導体集積回路
US20150276870A1 (en) * 2012-11-07 2015-10-01 Freescale Semiconductor, Inc. Method and apparatus for performing state retention for at least one functional block within an ic device
US11662382B1 (en) * 2020-09-23 2023-05-30 Marvell Asia Pte, Ltd. Method and apparatus for contemporary test time reduction for JTAG
US11500017B1 (en) * 2021-03-29 2022-11-15 Xilinx, Inc. Testing memory elements using an internal testing interface

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06230075A (ja) * 1993-02-05 1994-08-19 Fujitsu Ltd シリアルスキャンチェーンにおける不良フリップフロップの検出方法
JPH0792230A (ja) * 1992-05-11 1995-04-07 Nec Eng Ltd 集積回路と集積回路の故障検出回路
JP2004012420A (ja) 2002-06-11 2004-01-15 Fujitsu Ltd 集積回路の診断装置および診断方法並びに集積回路
JP2005134180A (ja) 2003-10-29 2005-05-26 Nec Electronics Corp スキャンテスト方法、集積回路及びスキャンテスト回路

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5881067A (en) * 1997-01-28 1999-03-09 Sun Microsystems, Inc. Flip-flop design and technique for scan chain diagnosis
JPH112664A (ja) * 1997-06-13 1999-01-06 Kawasaki Steel Corp バウンダリスキャンレジスタ
JP2000304826A (ja) * 1999-04-26 2000-11-02 Matsushita Electric Ind Co Ltd スキャンチェーン故障位置検出装置
US6785854B1 (en) * 2000-10-02 2004-08-31 Koninklijke Philips Electronics N.V. Test access port (TAP) controller system and method to debug internal intermediate scan test faults
US7131081B2 (en) * 2003-02-14 2006-10-31 Nec Laboratories America, Inc. Scalable scan-path test point insertion technique
US7146551B2 (en) * 2005-01-20 2006-12-05 Hewlett-Packard Development Company, L.P. Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof
JP2007040921A (ja) * 2005-08-05 2007-02-15 Matsushita Electric Ind Co Ltd スキャンチェーンにおける故障位置特定方法
JP2007051936A (ja) * 2005-08-18 2007-03-01 Matsushita Electric Ind Co Ltd スキャンチェーンにおける故障位置特定方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0792230A (ja) * 1992-05-11 1995-04-07 Nec Eng Ltd 集積回路と集積回路の故障検出回路
JPH06230075A (ja) * 1993-02-05 1994-08-19 Fujitsu Ltd シリアルスキャンチェーンにおける不良フリップフロップの検出方法
JP2004012420A (ja) 2002-06-11 2004-01-15 Fujitsu Ltd 集積回路の診断装置および診断方法並びに集積回路
JP2005134180A (ja) 2003-10-29 2005-05-26 Nec Electronics Corp スキャンテスト方法、集積回路及びスキャンテスト回路

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2133705A4

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236067A (zh) * 2010-04-22 2011-11-09 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及其调试电路

Also Published As

Publication number Publication date
EP2133705A1 (en) 2009-12-16
EP2133705A4 (en) 2011-03-30
JPWO2008120362A1 (ja) 2010-07-15
US20100017666A1 (en) 2010-01-21

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