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WO2008136040A1 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
WO2008136040A1
WO2008136040A1 PCT/JP2007/000417 JP2007000417W WO2008136040A1 WO 2008136040 A1 WO2008136040 A1 WO 2008136040A1 JP 2007000417 W JP2007000417 W JP 2007000417W WO 2008136040 A1 WO2008136040 A1 WO 2008136040A1
Authority
WO
WIPO (PCT)
Prior art keywords
ion
distance
virtual
electrodes
electrode
Prior art date
Application number
PCT/JP2007/000417
Other languages
English (en)
French (fr)
Inventor
Masaru Nishiguchi
Yoshihiro Ueno
Daisuke Okumura
Hiroto Itoi
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/000417 priority Critical patent/WO2008136040A1/ja
Priority to US12/594,450 priority patent/US8134123B2/en
Priority to PCT/JP2008/000043 priority patent/WO2008129751A1/ja
Priority to EP08702784.3A priority patent/EP2139022B1/en
Priority to JP2009510747A priority patent/JP4816792B2/ja
Publication of WO2008136040A1 publication Critical patent/WO2008136040A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4235—Stacked rings or stacked plates

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

　イオン光軸方向に並ぶ複数枚の電極素板により１本の仮想ロッド電極を構成し、この仮想ロッド電極をイオン光軸の周りに４本配置することで仮想四重極ロッド型イオン輸送光学系（３０）を構成する。１本の仮想ロッド電極の中で前半領域（３０Ａ）では隣接する電極素板の間隔を広くし、後半領域（３０Ｂ）では間隔を狭くする。電極間隔が広いほうが高次の多重極場成分が多くなるためにイオンアクセプタンスが大きくなり、前段から到来するイオンを効率良く受け容れることが可能となる。一方、電極間隔が狭いと四重極場成分が相対的に多くなり、イオンビームの収束性が良好になるので後段の例えば四重極質量フィルタに効率良くイオンを導入することができる。それによって、質量分析の感度や精度の向上に寄与する。
PCT/JP2007/000417 2007-04-17 2007-04-17 質量分析装置 WO2008136040A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置
US12/594,450 US8134123B2 (en) 2007-04-17 2008-01-17 Mass spectrometer
PCT/JP2008/000043 WO2008129751A1 (ja) 2007-04-17 2008-01-17 質量分析装置
EP08702784.3A EP2139022B1 (en) 2007-04-17 2008-01-17 Mass spectrometer
JP2009510747A JP4816792B2 (ja) 2007-04-17 2008-01-17 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置

Publications (1)

Publication Number Publication Date
WO2008136040A1 true WO2008136040A1 (ja) 2008-11-13

Family

ID=39875290

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置
PCT/JP2008/000043 WO2008129751A1 (ja) 2007-04-17 2008-01-17 質量分析装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/000043 WO2008129751A1 (ja) 2007-04-17 2008-01-17 質量分析装置

Country Status (3)

Country Link
US (1) US8134123B2 (ja)
EP (1) EP2139022B1 (ja)
WO (2) WO2008136040A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10984998B2 (en) 2017-10-26 2021-04-20 Shimadzu Corporation Mass spectrometer
US11848184B2 (en) 2018-12-19 2023-12-19 Shimadzu Corporation Mass spectrometer

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0608470D0 (en) * 2006-04-28 2006-06-07 Micromass Ltd Mass spectrometer
JP5141505B2 (ja) * 2008-11-14 2013-02-13 株式会社島津製作所 イオンガイド及びそれを備えた質量分析装置
US8193489B2 (en) * 2009-05-28 2012-06-05 Agilent Technologies, Inc. Converging multipole ion guide for ion beam shaping
GB0909292D0 (en) 2009-05-29 2009-07-15 Micromass Ltd Ion tunnelion guide
DE102010001349B9 (de) * 2010-01-28 2014-08-28 Carl Zeiss Microscopy Gmbh Vorrichtung zum Fokussieren sowie zum Speichern von Ionen
DE102010001347A1 (de) * 2010-01-28 2011-08-18 Carl Zeiss NTS GmbH, 73447 Vorrichtung zur Übertragung von Energie und/oder zum Transport eines Ions sowie Teilchenstrahlgerät mit einer solchen Vorrichtung
WO2012081122A1 (ja) * 2010-12-17 2012-06-21 株式会社島津製作所 イオンガイド及び質量分析装置
US8507848B1 (en) * 2012-01-24 2013-08-13 Shimadzu Research Laboratory (Shanghai) Co. Ltd. Wire electrode based ion guide device
JP2016009562A (ja) * 2014-06-24 2016-01-18 株式会社島津製作所 イオン輸送装置及び質量分析装置
US20180350581A1 (en) * 2015-11-27 2018-12-06 Shimadzu Corporation Ion transfer apparatus
GB201608476D0 (en) 2016-05-13 2016-06-29 Micromass Ltd Ion guide
CN116246935A (zh) * 2022-12-28 2023-06-09 中元汇吉生物技术股份有限公司 一种用于低质荷比离子传输的离子漏斗装置及其使用方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087827A (ja) * 1994-06-17 1996-01-12 Jeol Ltd ビームガイド
JP2000149865A (ja) * 1998-09-02 2000-05-30 Shimadzu Corp 質量分析装置
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1278761B (de) * 1963-02-04 1968-09-26 Bell & Howell Co Multipolmassenfilter
GB2341270A (en) * 1998-09-02 2000-03-08 Shimadzu Corp Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes
JP4581184B2 (ja) * 2000-06-07 2010-11-17 株式会社島津製作所 質量分析装置
AU2003213945A1 (en) * 2002-04-29 2003-11-17 Mds Inc., Doing Business As Mds Sciex Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
JP2004014177A (ja) * 2002-06-04 2004-01-15 Shimadzu Corp 質量分析装置
US6992284B2 (en) * 2003-10-20 2006-01-31 Ionwerks, Inc. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US20050242281A1 (en) 2004-04-30 2005-11-03 Gangqiang Li Unevenly segmented multipole
US7557343B2 (en) * 2005-09-13 2009-07-07 Agilent Technologies, Inc. Segmented rod multipole as ion processing cell

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087827A (ja) * 1994-06-17 1996-01-12 Jeol Ltd ビームガイド
JP2000149865A (ja) * 1998-09-02 2000-05-30 Shimadzu Corp 質量分析装置
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10984998B2 (en) 2017-10-26 2021-04-20 Shimadzu Corporation Mass spectrometer
US11848184B2 (en) 2018-12-19 2023-12-19 Shimadzu Corporation Mass spectrometer

Also Published As

Publication number Publication date
US20100116979A1 (en) 2010-05-13
WO2008129751A1 (ja) 2008-10-30
EP2139022A1 (en) 2009-12-30
EP2139022A4 (en) 2012-10-24
US8134123B2 (en) 2012-03-13
EP2139022B1 (en) 2017-07-05

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