[go: up one dir, main page]

WO2018031119A1 - Appareil de test pour la norme new radio - Google Patents

Appareil de test pour la norme new radio Download PDF

Info

Publication number
WO2018031119A1
WO2018031119A1 PCT/US2017/037049 US2017037049W WO2018031119A1 WO 2018031119 A1 WO2018031119 A1 WO 2018031119A1 US 2017037049 W US2017037049 W US 2017037049W WO 2018031119 A1 WO2018031119 A1 WO 2018031119A1
Authority
WO
WIPO (PCT)
Prior art keywords
combination
frequency points
pattern
sensitivity
radiation pattern
Prior art date
Application number
PCT/US2017/037049
Other languages
English (en)
Inventor
Elmar Wagner
Anatoliy IOFFE
Original Assignee
Intel IP Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel IP Corporation filed Critical Intel IP Corporation
Publication of WO2018031119A1 publication Critical patent/WO2018031119A1/fr

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/26—Monitoring; Testing of receivers using historical data, averaging values or statistics
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H04W24/06—Testing, supervising or monitoring using simulated traffic

Definitions

  • Next Generation New Radio Access Technology is currently being studied with regard to the testability of radio-frequency (RF) and performance requirements for the New Radio technology.
  • RF radio-frequency
  • RAT Radio Access Technology
  • GHz gigahertz
  • 3 GPP Third Generation Partnership Project
  • LTE Long-Term Evolution
  • NB-IoT Narrow Band Internet of Things
  • Such highly integrated architectures may feature innovative front-end solutions, multi-element antenna arrays, passive and active feeding networks, and so on, that may not allow for the same testing techniques used to verify RF requirements in devices today.
  • a potential highly integrated 5G device may not be able to physically expose a front-end cable connector to the test equipment.
  • the interface between the front-end and the antenna may be an antenna array feeding network, the interface may be so tightly integrated so as to preclude the possibility of exposing a test connector, and so on.
  • the greater level of integration of high-frequency devices, for example devices operating above 6 GHz, than seen today with LTE is expected to drive over-the-air (OTA) testing of radio frequency (RF), radio resource management (RRM), and/or demodulation performance requirements.
  • OTA over-the-air
  • FIG. 1 is a block diagram of an architecture of a new radio user equipment (UE) in accordance with one or more embodiments;
  • FIG. 2 is a flow diagram of a method of over-the-air testing in accordance with one or more embodiments
  • FIG. 3 is a diagram of an anechoic chamber (AC) test system in accordance with one or more embodiments
  • FIG. 4 is a diagram of a multi-probe anechoic chamber (MP AC) test system in accordance with one or more embodiments
  • AC anechoic chamber
  • MP AC multi-probe anechoic chamber
  • FIG. 5 is a diagram of a reverberation chamber (RC) test system in accordance with one or more embodiments
  • FIG. 6 is a flow diagram of a first phase of a first testing procedure in accordance with one or more embodiments
  • FIG. 7 is a flow diagram of a second phase of the first testing procedure in accordance with one or more embodiments.
  • FIG. 8 is a diagram of a semi-anechoic chamber (SAC) test system in accordance with one or more embodiments;
  • FIG. 9 is a flow diagram of a second testing procedure in accordance with one or more embodiments.
  • FIG. 10 is a block diagram of a near- field chamber (NFC) test system in accordance with one or more embodiments;
  • FIG. 11 is a block diagram of an information handling system capable of implementing a testing procedure for a new radio standard in accordance with one or more embodiments.
  • FIG. 12 illustrates example components of a device in accordance with some embodiments.
  • an apparatus of a user equipment (UE) 100 may include one or more of a baseband processing block 110, an intermediate frequency (I/F) processing block 112 if applicable to UE 100, a radio-frequency (RF) processing block 114, an antenna array matching network 116, and/or an antenna array 118.
  • a reference point defining an RF requirement for testing may be located between RF processing block 114 and matching network 116.
  • An over-the-air (OTA) measurement reference may be obtained at an output of antenna array 118.
  • OTA over-the-air
  • the reference point defining an RF requirement for testing may be defined at an output of antenna array 118 being the same as the OTA measurement reference. It is expected that standardization and regulatory bodies will adopt a reference point for defining RF as well as other applicable requirements at the input/output port of the radio frequency front end (RFFE).
  • RFFE radio frequency front end
  • the Federal Communications Commission (FCC) has provided the following definition of emission limits:
  • the conductive power or the total radiated power of my emissios outside a licensee's freoueacy block shall be -13 dBm/MHz or lower, However, ia the bands immediately outside and adjacent to the licensee's frequency block, having a bandwidth eqeal to 10 pescent of the channel bandwidth, the
  • conductive power or the total radiated power of any emission shall be -5 dBm/MMz or Iower,
  • the nominal carrier frequency shall be adjusted as close to the licensee's frequency block edges as the design permits
  • a potential measurement reference is the over-the-air interface at the antenna or antenna array 118.
  • the apparatus of UE 100 may be tested in accordance with the Third Generation Partnership Project (3 GPP) Technical Report (TR) 37.977 V14.0.0 (2016- 06), although the scope of the claimed subject matter is not limited in this respect. Measurement procedures at the measurement reference point are shown in and described with respect to FIG. 2, below.
  • method 200 for over-the-air (OTA) testing may include selecting a measurement method or process at block 210.
  • An anechoic chamber testing process may be selected at block 212, a multi-probe anechoic chamber testing process may be selected at block 214, or a reverberation chamber testing process may be selected at block 224.
  • Examples of an anechoic chamber test system, a multi-probe anechoic chamber test system, and a reverberation test system are discussed in further detail, below.
  • a test frequency Ft may be selected at block 216, and radiation and/or a sensitivity pattern may be tested at block 218 at the selected test frequency.
  • One or more range corrections may be applied at block 220, and total radiated power (TRP) and/or total radiated sensitivity (TRS) may be calculated at block 222.
  • a test frequency Ft may be selected at block 226, and total isotropic radiation and/or sensitivity may be measured at block 228.
  • One or more range corrections may be applied at block 220, and total radiated power (TRP) and/or total radiated sensitivity (TRS) may be calculated at block 232.
  • TRP total radiated power
  • TRS total radiated sensitivity
  • anechoic chamber (AC) test system 300 may comprise an anechoic chamber 310 in which a device under test 312, for example UE 100 of FIG. 1, may be disposed in a region 322 of the anechoic chamber 310.
  • Anechoic chamber 310 may include a dual-polarized measurement antenna 314 disposed on a dual-axis positioning system 316.
  • System test and control equipment 320 may control the positioning system 316, and may communicate with DUT 312 via communication antenna 318. Measured signals may be obtained via measurement antenna 314.
  • FIG. 4 a diagram of a multi-probe anechoic chamber (MP AC) test system in accordance with one or more embodiments will be discussed.
  • the multi-probe anechoic chamber test system 400 of FIG. 4 is similar to the anechoic chamber (AC) test system 300 of FIG. 3, except that a circular positioning of dual polarized measurement antennas (probes) 410 is utilized. Furthermore, an array of dual-polarized measurement antennas 314 is disposed about the anechoic chamber 410.
  • FIG. 5 a diagram of a reverberation chamber (RC) test system in accordance with one or more embodiments will be discussed.
  • RC reverberation chamber
  • a first testing procedure referred to as Option 1 utilizes a combination of anechoic chamber (AC) in a first phase, Phase 1, semi-anechoic chamber (SAC) test environments in a second phase, Phase 2 (the SAC or AC test environments may be used interchangeably in this phase).
  • the second phase may be utilized to interpolate between the measurements obtained in the first phase at a selected number of testing frequencies.
  • a second testing procedure referred to as Option 2, utilizes a near- field chamber (NFC).
  • NFC near- field chamber
  • a measurement method or procedure may be selected at block 610, for example an anechoic chamber testing procedure may be selected at block 612, or a multi-probe anechoic chamber testing procedure may be selected at block 614.
  • a calibration frequency F0 may be selected at block 616.
  • a radiation pattern and/or a sensitivity pattern may be selected at block 618.
  • a range of corrections may be applied at block 620. Beamforming gain at F0 from Equivalent Isotropically Radiated Power (EIRP) and total radiated power (TRP), and Effective Isotropic Sensitivity (EIS) and total radiated sensitivity (TRS) may be calculated at block 624.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • EIS Effective Isotropic Sensitivity
  • TRS total radiated sensitivity
  • Method 700 shows Option 1 of Phase 2 as follows.
  • a measurement method or procedure may be selected at block 710.
  • an anechoic chamber testing procedure may be selected at block 712
  • a multi-probe anechoic chamber testing procedure may be selected at block 714
  • a semi-anechoic chamber testing procedure may be selected at block 726. If either an anechoic chamber testing procedure is selected, or a multi-probe anechoic chamber testing procedure is selected, a test frequency Ft may be selected at block 716.
  • the device under test (DUT) 312 may be positioned and/or it beam may be optimized to achieve a peak Equivalent Isotropically Radiated Power (EIRP) at block 718. Radiation and/or sensitivity may be measured at block 720. Range and beamforming gain corrections may be applied at block 722, and total radiated power (TRP) and/or total radiated sensitivity (TRS) may be calculated at block 724.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • TRS total radiated sensitivity
  • a test frequency Ft may be selected at block 728.
  • the device under test (DUT) 312 may be positioned and/or it beam may be optimized to achieve a peak Equivalent Isotropically Radiated Power (EIRP) at block 730. Radiation and/or sensitivity may be measured at block 732. Range and beamforming gain corrections may be applied at block 734, and total radiated power (TRP) and/or total radiated sensitivity (TRS) may be calculated at block 736.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • TRS total radiated sensitivity
  • FIG. 8 a diagram of a semi-anechoic chamber (SAC) test system in accordance with one or more embodiments will be discussed.
  • the semi-anechoic test system 500 of FIG. 8 is similar to the anechoic chamber test system 300 of FIG. 3, except that the measurement antenna 314 is disposed in a fixed location in semi-anechoic chamber 810, and a single-axis positioning system is used.
  • a near- field chamber also referred to as an RF isolation chamber testing procedure, at block 910.
  • a test frequency Ft may be selected at block 912.
  • Total coupled radiation and/or sensitivity may be tested at block 914.
  • Near- field coupling corrections may be applied at block 916, and total radiated power (TRP) and/or total radiated sensitivity (TRS) may be calculated at block 918.
  • TRP total radiated power
  • TRS total radiated sensitivity
  • Near-field chamber test system 1000 is similar to the anechoic chamber test system 300 of FIG. 3, except that the measurement antenna comprises a near- field probe disposed in an RF isolation chamber 1010.
  • the measurement procedure implements Option 1, Phase 1 of FIG. 6 by utilizing an anechoic chamber of FIG. 6 to measure the TRP and TRS metrics at test calibration frequency points ⁇ F0_1,F0_2,...,F0_N ⁇ , where the test calibration frequency points may be chosen as a tradeoff between measurement uncertainty of the method and total test time.
  • Phase 2 of FIG. 7 may be implemented in an anechoic chamber by fixing the position of the DUT 312 or by optimizing the DUT's beam peak direction to achieve peak performance.
  • Phase 2 may be implemented in a semi-anechoic chamber as shown in FIG. 8.
  • Phase 1 may be implemented in a multi-probe anechoic chamber as shown in FIG. 4.
  • Phase 1 may be implemented in a multi-probe anechoic chamber as shown in FIG. 4, and Phase 2 may be implemented in a semi- anechoic chamber as shown in FIG. 8.
  • Phase 1 may be omitted in favor of a standardized gain value assumed for the DUT 312, based on the number of antennas utilized by the DUT 312, on a manufacturer's declaration, or on a standardized lookup table utilizing any number of DUT 312 design parameters. This gain value may then be applied as the beamforming gain correction factor in Phase 2, where the Phase 2 measurement may be performed in either an anechoic or semi-anechoic chamber.
  • Option 2 may be implemented in a near-field testing chamber as shown in FIG. 10, where the near-field probe 1012 may be positioned in a limited number of angular positions around the DUT 312, where limited may refer to significantly fewer positions than currently used in anechoic chamber measurements.
  • reduced measurement times may be achieved.
  • 3GPP Third Generation Partnership Project
  • CTIA Cellular Telecommunications and Internet Association
  • GCF Global Certification Forum
  • CCSA China Communications Standards Association
  • the measurement time when compared to current procedures, significantly may be reduced.
  • a further reduction in test time may be implemented by utilizing different testing chambers for Phase 1 and Phase 2.
  • Phase 1 may be implemented in an anechoic chamber, while Phase 2 in a semi-anechoic chamber with a significantly reduced setup complexity.
  • information handling system 1100 represents one example of several types of computing platforms, information handling system 1100 may include more or fewer elements and/or different arrangements of elements than shown in FIG. 11, and the scope of the claimed subject matter is not limited in these respects.
  • information handling system 1100 may include one or more applications processors 310 and one or more baseband processors 1112.
  • Applications processor 1110 may be utilized as a general-purpose processor to run applications and the various subsystems for information handling system 1100.
  • Applications processor 1110 may include a single core or alternatively may include multiple processing cores.
  • One or more of the cores may comprise a digital signal processor or digital signal processing (DSP) core.
  • applications processor 1110 may include a graphics processor or coprocessor disposed on the same chip, or alternatively a graphics processor coupled to applications processor 1110 may comprise a separate, discrete graphics chip.
  • Applications processor 1110 may include on board memory such as cache memory, and further may be coupled to external memory devices such as synchronous dynamic random-access memory (SDRAM) 1114 for storing and/or executing applications during operation, and NAND flash 1116 for storing applications and/or data even when information handling system 1100 is powered off.
  • SDRAM synchronous dynamic random-access memory
  • NAND flash 1116 for storing applications and/or data even when information handling system 1100 is powered off.
  • instructions to operate or configure the information handling system 1100 and/or any of its components or subsystems to operate in a manner as described herein may be stored on an article of manufacture comprising a non-transitory storage medium and/or machine- readable medium.
  • the storage medium and/or machine-readable medium may comprise any of the memory devices shown in and described herein, although the scope of the claimed subject matter is not limited in this respect.
  • Baseband processor 1112 may control the broadband radio functions for information handling system 1100.
  • Baseband processor 1112 may store code for controlling such broadband radio functions in a NOR flash 1118.
  • Baseband processor 1112 controls a wireless wide area network (WW AN) transceiver 1120 which is used for modulating and/or demodulating broadband network signals, for example for communicating via a 3GPP LTE or LTE- Advanced network or the like.
  • WW AN wireless wide area network
  • WW AN transceiver 1120 may operate according to any one or more of the following radio communication technologies and/or standards including but not limited to: a Global System for Mobile Communications (GSM) radio communication technology, a General Packet Radio Service (GPRS) radio communication technology, an Enhanced Data Rates for GSM Evolution (EDGE) radio communication technology, and/or a Third Generation Partnership Project (3GPP) radio communication technology, for example Universal Mobile Telecommunications System (UMTS), Freedom of Multimedia Access (FOMA), 3GPP Long Term Evolution (LTE), 3GPP Long Term Evolution Advanced (LTE Advanced), Code division multiple access 2000 (CDMA2000), Cellular Digital Packet Data (CDPD), Mobitex, Third Generation (3G), Circuit Switched Data (CSD), High-Speed Circuit-Switched Data (HSCSD), Universal Mobile Telecommunications System (Third Generation) (UMTS (3G)), Wideband Code Division Multiple Access (Universal Mobile Telecommunications System) (W-CDMA (UMTS)), High Speed Packet Access (HSPA), High Speed Pack
  • 3 GPP Rel. 9 (3rd Generation Partnership Project Release 9), 3 GPP Rel. 10 (3rd Generation Partnership Project Release 10) , 3 GPP Rel. 11 (3rd Generation Partnership Project Release 11), 3GPP Rel. 12 (3rd Generation Partnership Project Release 12), 3 GPP Rel. 13 (3rd Generation Partnership Project Release 12), 3 GPP Rel.
  • the WW AN transceiver 1120 couples to one or more power amps 1122 respectively coupled to one or more antennas 1124 for sending and receiving radio-frequency signals via the WW AN broadband network.
  • the baseband processor 1112 also may control a wireless local area network (WLAN) transceiver 326 coupled to one or more suitable antennas 1128 and which may be capable of communicating via a Wi-Fi, Bluetooth®, and/or an amplitude modulation (AM) or frequency modulation (FM) radio standard including an IEEE 802.11 a/b/g/n standard or the like.
  • WLAN wireless local area network
  • AM amplitude modulation
  • FM frequency modulation
  • any one or more of SDRAM 1114, NAND flash 1116 and/or NOR flash 1118 may comprise other types of memory technology such as magnetic memory, chalcogenide memory, phase change memory, or ovonic memory, and the scope of the claimed subject matter is not limited in this respect.
  • applications processor 1110 may drive a display 1130 for displaying various information or data, and may further receive touch input from a user via a touch screen 1132 for example via a finger or a stylus.
  • An ambient light sensor 1134 may be utilized to detect an amount of ambient light in which information handling system 1100 is operating, for example to control a brightness or contrast value for display 1130 as a function of the intensity of ambient light detected by ambient light sensor 1134.
  • One or more cameras 1136 may be utilized to capture images that are processed by applications processor 1110 and/or at least temporarily stored in NAND flash 1116.
  • applications processor may couple to a gyroscope 1138, accelerometer 1140, magnetometer 1142, audio coder/decoder (CODEC) 1144, and/or global positioning system (GPS) controller 1146 coupled to an appropriate GPS antenna 1148, for detection of various environmental properties including location, movement, and/or orientation of information handling system 1100.
  • controller 1146 may comprise a Global Navigation Satellite System (GNSS) controller.
  • Audio CODEC 1144 may be coupled to one or more audio ports 1150 to provide microphone input and speaker outputs either via internal devices and/or via external devices coupled to information handling system via the audio ports 1150, for example via a headphone and microphone jack.
  • applications processor 1110 may couple to one or more input/output (I/O) transceivers 1152 to couple to one or more I/O ports 1154 such as a universal serial bus (USB) port, a high-definition multimedia interface (HDMI) port, a serial port, and so on.
  • I/O transceivers 1152 may couple to one or more memory slots 1156 for optional removable memory such as secure digital (SD) card or a subscriber identity module (SIM) card, although the scope of the claimed subject matter is not limited in these respects.
  • SD secure digital
  • SIM subscriber identity module
  • circuit may refer to, be part of, or include an Application Specific Integrated Circuit (ASIC), an electronic circuit, a processor (shared, dedicated, or group), and/or memory (shared, dedicated, or group) that execute one or more software or firmware programs, a combinational logic circuit, and/or other suitable hardware components that provide the described functionality.
  • ASIC Application Specific Integrated Circuit
  • the circuitry may be implemented in, or functions associated with the circuitry may be implemented by, one or more software or firmware modules.
  • circuitry may include logic, at least partially operable in hardware. Embodiments described herein may be implemented into a system using any suitably configured hardware and/or software.
  • FIG. 12 illustrates example components of a device 1200 in accordance with some embodiments.
  • device 1200 may comprise an apparatus of a user equipment such as UE 100 of FIG. 1.
  • the device 1200 may include application circuitry 1202, baseband circuitry 1204, Radio Frequency (RF) circuitry 1206, front-end module (FEM) circuitry 1208, one or more antennas 1210, and power management circuitry (PMC) 1212 coupled together at least as shown.
  • the components of the illustrated device 1200 may be included in a UE or a RAN node.
  • the device 1200 may include less elements (e.g., a RAN node may not utilize application circuitry 1202, and instead include a processor/controller to process IP data received from an EPC).
  • the device 1200 may include additional elements such as, for example, memory/storage, display, camera, sensor, or input/output (I/O) interface.
  • the components described below may be included in more than one device (e.g., said circuitries may be separately included in more than one device for Cloud-RAN (C-RAN) implementations).
  • C-RAN Cloud-RAN
  • the application circuitry 1202 may include one or more application processors.
  • the application circuitry 1202 may include circuitry such as, but not limited to, one or more single-core or multi-core processors.
  • the processor(s) may include any combination of general-purpose processors and dedicated processors (e.g., graphics processors, application processors, etc.).
  • the processors may be coupled with or may include memory/storage and may be configured to execute instructions stored in the memory/storage to enable various applications or operating systems to run on the device 1200.
  • processors of application circuitry 1202 may process IP data packets received from an EPC.
  • the baseband circuitry 1204 may include circuitry such as, but not limited to, one or more single-core or multi-core processors.
  • the baseband circuitry 1204 may include one or more baseband processors or control logic to process baseband signals received from a receive signal path of the RF circuitry 1206 and to generate baseband signals for a transmit signal path of the RF circuitry 1206.
  • Baseband processing circuity 1204 may interface with the application circuitry 1202 for generation and processing of the baseband signals and for controlling operations of the RF circuitry 1206.
  • the baseband circuitry 1204 may include a third generation (3G) baseband processor 1204A, a fourth generation (4G) baseband processor 1204B, a fifth generation (5G) baseband processor 1204C, or other baseband processor(s) 1204D for other existing generations, generations in development or to be developed in the future (e.g., second generation (2G), sil2h generation (6G), etc.).
  • the baseband circuitry 1204 e.g., one or more of baseband processors 1204A-D
  • baseband processors 1204A-D may be included in modules stored in the memory 1204G and executed via a Central Processing Unit (CPU) 1204E.
  • the radio control functions may include, but are not limited to, signal modulation/demodulation, encoding/decoding, radio frequency shifting, etc.
  • modulation/demodulation circuitry of the baseband circuitry 1204 may include Fast-Fourier Transform (FFT), precoding, or constellation mapping/demapping functionality.
  • encoding/decoding circuitry of the baseband circuitry 1204 may include convolution, tail-biting convolution, turbo, Viterbi, or Low Density Parity Check (LDPC) encoder/decoder functionality.
  • LDPC Low Density Parity Check
  • the baseband circuitry 1204 may include one or more audio digital signal processor(s) (DSP) 1204F.
  • the audio DSP(s) 1204F may be include elements for compression/decompression and echo cancellation and may include other suitable processing elements in other embodiments.
  • Components of the baseband circuitry may be suitably combined in a single chip, a single chipset, or disposed on a same circuit board in some embodiments.
  • some or all of the constituent components of the baseband circuitry 1204 and the application circuitry 1202 may be implemented together such as, for example, on a system on a chip (SOC).
  • SOC system on a chip
  • the baseband circuitry 1204 may provide for communication compatible with one or more radio technologies.
  • the baseband circuitry 1204 may support communication with an evolved universal terrestrial radio access network (EUTRAN) or other wireless metropolitan area networks (WMAN), a wireless local area network (WLAN), a wireless personal area network (WPAN).
  • EUTRAN evolved universal terrestrial radio access network
  • WMAN wireless metropolitan area networks
  • WLAN wireless local area network
  • WPAN wireless personal area network
  • Embodiments in which the baseband circuitry 1204 is configured to support radio communications of more than one wireless protocol may be referred to as multi-mode baseband circuitry.
  • RF circuitry 1206 may enable communication with wireless networks using modulated electromagnetic radiation through a non-solid medium.
  • the RF circuitry 1206 may include switches, filters, amplifiers, etc. to facilitate the communication with the wireless network.
  • RF circuitry 1206 may include a receive signal path which may include circuitry to down-convert RF signals received from the FEM circuitry 1208 and provide baseband signals to the baseband circuitry 1204.
  • RF circuitry 1206 may also include a transmit signal path which may include circuitry to up-convert baseband signals provided by the baseband circuitry 1204 and provide RF output signals to the FEM circuitry 1208 for transmission.
  • the receive signal path of the RF circuitry 1206 may include mixer circuitry 1206a, amplifier circuitry 1206b and filter circuitry 1206c.
  • the transmit signal path of the RF circuitry 1206 may include filter circuitry 1206c and mixer circuitry 1206a.
  • RF circuitry 1206 may also include synthesizer circuitry 1206d for synthesizing a frequency for use by the mixer circuitry 1206a of the receive signal path and the transmit signal path.
  • the mixer circuitry 1206a of the receive signal path may be configured to down-convert RF signals received from the FEM circuitry 1208 based on the synthesized frequency provided by synthesizer circuitry 1206d.
  • the amplifier circuitry 1206b may be configured to amplify the down-converted signals and the filter circuitry 1206c may be a low-pass filter (LPF) or band-pass filter (BPF) configured to remove unwanted signals from the down-converted signals to generate output baseband signals.
  • Output baseband signals may be provided to the baseband circuitry 1204 for further processing.
  • the output baseband signals may be zero-frequency baseband signals, although this is not a requirement.
  • mixer circuitry 1206a of the receive signal path may comprise passive mixers, although the scope of the embodiments is not limited in this respect.
  • the mixer circuitry 1206a of the transmit signal path may be configured to up-convert input baseband signals based on the synthesized frequency provided by the synthesizer circuitry 1206d to generate RF output signals for the FEM circuitry 1208.
  • the baseband signals may be provided by the baseband circuitry 1204 and may be filtered by filter circuitry 1206c.
  • the mixer circuitry 1206a of the receive signal path and the mixer circuitry 1206a of the transmit signal path may include two or more mixers and may be arranged for quadrature downconversion and upconversion, respectively.
  • the mixer circuitry 1206a of the receive signal path and the mixer circuitry 1206a of the transmit signal path may include two or more mixers and may be arranged for image rejection (e.g., Hartley image rejection).
  • the mixer circuitry 1206a of the receive signal path and the mixer circuitry 1206a may be arranged for direct downconversion and direct upconversion, respectively.
  • the mixer circuitry 1206a of the receive signal path and the mixer circuitry 1206a of the transmit signal path may be configured for super-heterodyne operation.
  • the output baseband signals and the input baseband signals may be analog baseband signals, although the scope of the embodiments is not limited in this respect.
  • the output baseband signals and the input baseband signals may be digital baseband signals.
  • the RF circuitry 1206 may include analog-to-digital converter (ADC) and digital-to-analog converter (DAC) circuitry and the baseband circuitry 1204 may include a digital baseband interface to communicate with the RF circuitry 1206.
  • ADC analog-to-digital converter
  • DAC digital-to-analog converter
  • a separate radio IC circuitry may be provided for processing signals for each spectrum, although the scope of the embodiments is not limited in this respect.
  • the synthesizer circuitry 1206d may be a fractional-N synthesizer or a fractional N/N+l synthesizer, although the scope of the embodiments is not limited in this respect as other types of frequency synthesizers may be suitable.
  • synthesizer circuitry 1206d may be a delta-sigma synthesizer, a frequency multiplier, or a synthesizer comprising a phase-locked loop with a frequency divider.
  • the synthesizer circuitry 1206d may be configured to synthesize an output frequency for use by the mixer circuitry 1206a of the RF circuitry 1206 based on a frequency input and a divider control input. In some embodiments, the synthesizer circuitry 1206d may be a fractional N/N+l synthesizer.
  • frequency input may be provided by a voltage controlled oscillator (VCO), although that is not a requirement.
  • VCO voltage controlled oscillator
  • Divider control input may be provided by either the baseband circuitry 1204 or the applications processor 1202 depending on the desired output frequency.
  • a divider control input (e.g., N) may be determined from a look-up table based on a channel indicated by the applications processor 1202.
  • Synthesizer circuitry 1206d of the RF circuitry 1206 may include a divider, a delay- locked loop (DLL), a multiplexer and a phase accumulator.
  • the divider may be a dual modulus divider (DMD) and the phase accumulator may be a digital phase accumulator (DPA).
  • the DMD may be configured to divide the input signal by either N or N+l (e.g., based on a carry out) to provide a fractional division ratio.
  • the DLL may include a set of cascaded, tunable, delay elements, a phase detector, a charge pump and a D-type flip-flop.
  • the delay elements may be configured to break a VCO period up into Nd equal packets of phase, where Nd is the number of delay elements in the delay line.
  • Nd is the number of delay elements in the delay line.
  • synthesizer circuitry 1206d may be configured to generate a carrier frequency as the output frequency, while in other embodiments, the output frequency may be a multiple of the carrier frequency (e.g., twice the carrier frequency, four times the carrier frequency) and used in conjunction with quadrature generator and divider circuitry to generate multiple signals at the carrier frequency with multiple different phases with respect to each other.
  • the output frequency may be a LO frequency (fLO).
  • the RF circuitry 1206 may include an IQ/polar converter.
  • FEM circuitry 1208 may include a receive signal path which may include circuitry configured to operate on RF signals received from one or more antennas 1210, amplify the received signals and provide the amplified versions of the received signals to the RF circuitry 1206 for further processing.
  • FEM circuitry 1208 may also include a transmit signal path which may include circuitry configured to amplify signals for transmission provided by the RF circuitry 1206 for transmission by one or more of the one or more antennas 1210.
  • the amplification through the transmit or receive signal paths may be done solely in the RF circuitry 1206, solely in the FEM 1208, or in both the RF circuitry 1206 and the FEM 1208.
  • the FEM circuitry 1208 may include a TX/RX switch to switch between transmit mode and receive mode operation.
  • the FEM circuitry may include a receive signal path and a transmit signal path.
  • the receive signal path of the FEM circuitry may include an LNA to amplify received RF signals and provide the amplified received RF signals as an output (e.g., to the RF circuitry 1206).
  • the transmit signal path of the FEM circuitry 1208 may include a power amplifier (PA) to amplify input RF signals (e.g., provided by RF circuitry 1206), and one or more filters to generate RF signals for subsequent transmission (e.g., by one or more of the one or more antennas 1210).
  • PA power amplifier
  • the PMC 1212 may manage power provided to the baseband circuitry 1204.
  • the PMC 1212 may control power-source selection, voltage scaling, battery charging, or DC-to-DC conversion.
  • the PMC 1212 may often be included when the device 1200 is capable of being powered by a battery, for example, when the device is included in a UE.
  • the PMC 1212 may increase the power conversion efficiency while providing desirable implementation size and heat dissipation characteristics.
  • FIG. 12 shows the PMC 1212 coupled only with the baseband circuitry 1204.
  • the PMC 12 12 may be additionally or alternatively coupled with, and perform similar power management operations for, other components such as, but not limited to, application circuitry 1202, RF circuitry 1206, or FEM 1208.
  • the PMC 1212 may control, or otherwise be part of, various power saving mechanisms of the device 1200. For example, if the device 1200 is in an RRC_Connected state, where it is still connected to the RAN node as it expects to receive traffic shortly, then it may enter a state known as Discontinuous Reception Mode (DRX) after a period of inactivity.
  • DRX Discontinuous Reception Mode
  • the device 1200 may power down for brief intervals of time and thus save power. If there is no data traffic activity for an extended period of time, then the device 1200 may transition off to an RRC_Idle state, where it disconnects from the network and does not perform operations such as channel quality feedback, handover, etc. The device 1200 goes into a very low power state and it performs paging where again it periodically wakes up to listen to the network and then powers down again. The device 1200 may not receive data in this state, in order to receive data, it must transition back to RRC_Connected state.
  • An additional power saving mode may allow a device to be unavailable to the network for periods longer than a paging interval (ranging from seconds to a few hours). During this time, the device is totally unreachable to the network and may power down completely. Any data sent during this time incurs a large delay and it is assumed the delay is acceptable.
  • Processors of the application circuitry 1202 and processors of the baseband circuitry 1204 may be used to execute elements of one or more instances of a protocol stack.
  • processors of the baseband circuitry 1204 alone or in combination, may be used execute Layer 3, Layer 2, or Layer 1 functionality, while processors of the application circuitry 1204 may utilize data (e.g., packet data) received from these layers and further execute Layer 4 functionality (e.g., transmission communication protocol (TCP) and user datagram protocol (UDP) layers).
  • Layer 3 may comprise a radio resource control (RRC) layer, described in further detail below.
  • RRC radio resource control
  • Layer 2 may comprise a medium access control (MAC) layer, a radio link control (RLC) layer, and a packet data convergence protocol (PDCP) layer, described in further detail below.
  • Layer 1 may comprise a physical (PHY) layer of a UE/RAN node, described in further detail below.
  • Example one is directed to an apparatus to test a user equipment (UE), the apparatus comprising one or more processors, and a memory coupled to the one or more processors, wherein the one or more processors are to select one or more calibration frequency points, measure a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the selected calibration frequency points, store the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more calibration frequency points in the memory, position the UE or identify an optimal position of the UE to achieve peak Equivalent Isotropically Radiated Power (EIRP) from the beam, and calculate one or more beamforming gains at the one or more calibration frequency points.
  • EIRP Equivalent Isotropically Radiated Power
  • Example two may include the subject matter of example one or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber or a multi-probe anechoic chamber.
  • Example three may include the subject matter of example one or any of the examples described herein, wherein the one or more processors are to calculate the one or more beamforming gains based on at least one of Equivalent Isotropically Radiated Power (EIRP), total radiated power (TRP), Effective Isotropic Sensitivity (EIS), or total radiated sensitivity (TRS), or a combination thereof.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • EIS Effective Isotropic Sensitivity
  • TRS total radiated sensitivity
  • Example four may include the subject matter of example one or any of the examples described herein, wherein the one or more processors are to select one or more test frequency points between the one or more calibration frequency points, measure a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the one or more test frequency points, store the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points in the memory, apply one or more range and beamforming gain corrections to the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points, and calculate TRP or TRS based at least on the corrected measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points.
  • Example five may include the subject matter of example one or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, a multi-probe anechoic chamber, or a semi- anechoic chamber.
  • Example six is directed to an apparatus to test a user equipment (UE), the apparatus comprising one or more processors, and a memory coupled to the one or more processors, wherein the one or more processors are to: select one or more test frequency points, measure a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the one or more test frequency points, store the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points in the memory, apply a standardized gain value for one or beamforming gain corrections to the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points, and calculate total radiated power (TRP) or TRS based at least on the corrected measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points.
  • TRP total radiated power
  • Example seven may include the subject matter of example six or any of the examples described herein, wherein the standardized gain value is based at least in part on a number of antennas of the UE.
  • Example eight may include the subject matter of example six or any of the examples described herein, wherein the standardized gain value is based at least in part on a predetermined standardized gain value stored in the memory.
  • Example nine may include the subject matter of example six or any of the examples described herein, wherein the standardized gain value is based at least in part on a lookup table for the UE stored in the memory.
  • Example ten may include the subject matter of example six or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, in a semi-anechoic chamber, or a near-field chamber.
  • Example eleven is directed to one or more machine-readable media having instructions stored thereon that, if executed, result in selecting one or more calibration frequency points, measuring a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the selected calibration frequency points, storing the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more calibration frequency points in a memory, positioning the UE or identifying an optimal position of the UE to achieve peak EIRP from the beam, and calculating one or more beamforming gains at the one or more calibration frequency points.
  • Example twelve may include the subject matter of example eleven or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber or a multi-probe anechoic chamber.
  • Example thirteen may include the subject matter of example eleven or any of the examples described herein, wherein the instructions, if executed, further result in calculating the one or more beamforming gains based on at least one of Equivalent Isotropically Radiated Power (EIRP), total radiated power (TRP), Effective Isotropic Sensitivity (EIS), or total radiated sensitivity (TRS), or a combination thereof.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • EIS Effective Isotropic Sensitivity
  • TRS total radiated sensitivity
  • Example fourteen may include the subject matter of example eleven or any of the examples described herein, wherein the instructions, if executed, further result in selecting one or more test frequency points between the one or more calibration frequency points, measuring a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the one or more test frequency points, storing the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points in the memory, applying one or more range and beamforming gain corrections to the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points, and calculating TRP or TRS based at least on the corrected measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points.
  • Example fifteen may include the subject matter of example eleven or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, a multi-probe anechoic chamber, or a semi-anechoic chamber.
  • Example sixteen is directed to one or more machine-readable media having instructions stored thereon that, if executed, result in selecting one or more test frequency points, measuring a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the one or more test frequency points, storing the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points in a memory, applying a standardized gain value for one or beamforming gain corrections to the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points, and calculating total radiated power (TRP) or total radiated sensitivity (TRS), or a combination thereof, based at least on the corrected measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points.
  • TRP total radiated power
  • TRS total radiated sensitivity
  • Example seventeen may include the subject matter of example sixteen or any of the examples described herein, wherein the standardized gain value is based at least in part on a number of antennas of the UE.
  • Example eighteen may include the subject matter of example sixteen or any of the examples described herein, wherein the standardized gain value is based at least in part on a predetermined standardized gain value stored in the memory.
  • Example nineteen may include the subject matter of example sixteen or any of the examples described herein, wherein the standardized gain value is based at least in part on a lookup table for the UE stored in the memory.
  • Example twenty may include the subject matter of example sixteen or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, in a semi- anechoic chamber, or a near- field chamber.
  • Example twenty-one is directed to an apparatus, comprising means for selecting one or more calibration frequency points, means for measuring a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the selected calibration frequency points, means for storing the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more calibration frequency points in a memory, means for positioning the UE or identifying an optimal position of the UE to achieve peak EIRP from the beam, and means for calculating one or more beamforming gains at the one or more calibration frequency points.
  • Example twenty-two may include the subject matter of example twenty-one or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber or a multi-probe anechoic chamber.
  • Example twenty-three may include the subject matter of example twenty-one or any of the examples described herein, further comprising means for calculating the one or more beamforming gains based on at least one of Equivalent Isotropically Radiated Power (EIRP), total radiated power (TRP), Effective Isotropic Sensitivity (EIS), or total radiated sensitivity (TRS), or a combination thereof.
  • EIRP Equivalent Isotropically Radiated Power
  • TRP total radiated power
  • EIS Effective Isotropic Sensitivity
  • TRS total radiated sensitivity
  • Example twenty-five may include the subject matter of example twenty- one or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, a multi-probe anechoic chamber, or a semi-anechoic chamber.
  • Example twenty-six is directed to an apparatus, comprising means for selecting one or more test frequency points, means for measuring a radiation pattern or a sensitivity pattern, or a combination thereof, of one or more beams transmitted by one or more antennas of the UE at the one or more test frequency points, means for storing the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points in a memory, means for applying a standardized gain value for one or beamforming gain corrections to the measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points, and means for calculating total radiated power (TRP) or total radiated sensitivity (TRS), or a combination thereof, based at least on the corrected measured radiation pattern or sensitivity pattern, or a combination thereof, for the one or more test frequency points.
  • TRP total radiated power
  • TRS total radiated sensitivity
  • Example twenty- seven may include the subject matter of example twenty- six or any of the examples described herein, wherein the standardized gain value is based at least in part on a number of antennas of the UE.
  • Example twenty-eight may include the subject matter of example twenty- six or any of the examples described herein, wherein the standardized gain value is based at least in part on a predetermined standardized gain value stored in the memory.
  • Example twenty-nine may include the subject matter of example twenty-six or any of the examples described herein, wherein the standardized gain value is based at least in part on a lookup table for the UE stored in the memory.
  • Example thirty may include the subject matter of example twenty-six or any of the examples described herein, wherein the radiation pattern or sensitivity pattern, or combination thereof, is measured in an anechoic chamber, in a semi-anechoic chamber, or a near-field chamber.
  • Example thirty-one is directed to machine-readable storage including machine-readable instructions, when executed, to realize an apparatus as claimed in any preceding claim.
  • Coupled may mean that two or more elements are in direct physical and/or electrical contact. Coupled, however, also may mean that two or more elements may not be in direct contact with each other, but yet may still cooperate and/or interact with each other.
  • Coupled may mean that two or more elements do not contact each other but are indirectly joined together via another element or intermediate elements.
  • on may be used in the following description and claims.
  • “On,” “overlying,” and “over” may be used to indicate that two or more elements are in direct physical contact with each other. It should be noted, however, that “over” may also mean that two or more elements are not in direct contact with each other. For example, “over” may mean that one element is above another element but not contact each other and may have another element or elements in between the two elements.
  • the term “and/or” may mean “and”, it may mean “or”, it may mean “exclusive-or”, it may mean “one”, it may mean “some, but not all”, it may mean “neither", and/or it may mean “both”, although the scope of claimed subject matter is not limited in this respect.
  • the terms “comprise” and “include,” along with their derivatives, may be used and are intended as synonyms for each other.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Nonlinear Science (AREA)
  • Transceivers (AREA)

Abstract

En résumé, selon un ou plusieurs modes de réalisation, un appareil de test d'un équipement d'utilisateur (UE) comprend un ou plusieurs processeurs, et une mémoire couplée au processeur ou aux processeurs, le ou les processeurs servant à : sélectionner un ou plusieurs points de fréquence d'étalonnage ; mesurer un modèle de rayonnement ou un modèle de sensibilité ou une combinaison de ceux-ci, d'un ou de plusieurs faisceaux transmis par une ou plusieurs antennes de l'UE aux points de fréquence d'étalonnage sélectionnés ; stocker dans la mémoire le motif de rayonnement mesuré ou le motif de sensibilité mesuré ou une combinaison de ceux-ci, pour le ou les points de fréquence d'étalonnage ; identifier une position optimale de l'UE pour obtenir une puissance rayonnée crête isotropiquement équivalente (EIRP) à partir du faisceau ; et calculer un ou plusieurs gains de formation de faisceau au niveau du ou des points de fréquence d'étalonnage.
PCT/US2017/037049 2016-08-12 2017-06-12 Appareil de test pour la norme new radio WO2018031119A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662374658P 2016-08-12 2016-08-12
US62/374,658 2016-08-12

Publications (1)

Publication Number Publication Date
WO2018031119A1 true WO2018031119A1 (fr) 2018-02-15

Family

ID=59216011

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2017/037049 WO2018031119A1 (fr) 2016-08-12 2017-06-12 Appareil de test pour la norme new radio

Country Status (1)

Country Link
WO (1) WO2018031119A1 (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110531176A (zh) * 2019-08-19 2019-12-03 山东大学 一种有源天线trp快速测量方法
US10554314B1 (en) 2018-11-26 2020-02-04 Rohde & Schwarz Gmbh & Co. Kg Measurement system and method for multiple antenna measurements
CN111579885A (zh) * 2019-02-19 2020-08-25 罗德施瓦兹两合股份有限公司 用于进行测量的测量系统、测量装置及方法
WO2020220878A1 (fr) * 2019-04-29 2020-11-05 深圳市通用测试系统有限公司 Appareil de test d'interface radio de dispositif sans fil à antennes multiples
CN113259969A (zh) * 2021-05-07 2021-08-13 北京必创科技股份有限公司 无线通信与感知化设备辐射性能测试数据优化处理方法
CN113810129A (zh) * 2021-09-15 2021-12-17 深圳市德普华电子测试技术有限公司 一种5g nr测试方法、装置、终端及存储介质

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030003883A1 (en) * 2001-07-02 2003-01-02 Wallace Raymond C. Method and apparatus for testing and evaluating wireless communication devices
US20100273433A1 (en) * 2004-10-25 2010-10-28 Qualcomm Incorporated Systems, methods and apparatus for determining a radiated performance of a wireless device
US20160226601A1 (en) * 2012-03-23 2016-08-04 Alcatel Lucent Method, apparatus and computer program for testing a transceiver device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030003883A1 (en) * 2001-07-02 2003-01-02 Wallace Raymond C. Method and apparatus for testing and evaluating wireless communication devices
US20100273433A1 (en) * 2004-10-25 2010-10-28 Qualcomm Incorporated Systems, methods and apparatus for determining a radiated performance of a wireless device
US20160226601A1 (en) * 2012-03-23 2016-08-04 Alcatel Lucent Method, apparatus and computer program for testing a transceiver device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10554314B1 (en) 2018-11-26 2020-02-04 Rohde & Schwarz Gmbh & Co. Kg Measurement system and method for multiple antenna measurements
CN111579885A (zh) * 2019-02-19 2020-08-25 罗德施瓦兹两合股份有限公司 用于进行测量的测量系统、测量装置及方法
EP3699611A1 (fr) * 2019-02-19 2020-08-26 Rohde & Schwarz GmbH & Co. KG Système de mesure, configuration de mesure ainsi que procédé permettant d'effectuer des mesures
US11280822B2 (en) 2019-02-19 2022-03-22 Rohde & Schwarz Gmbh & Co. Kg Measurement system, measurement setup as well as method for performing measurements
WO2020220878A1 (fr) * 2019-04-29 2020-11-05 深圳市通用测试系统有限公司 Appareil de test d'interface radio de dispositif sans fil à antennes multiples
CN110531176A (zh) * 2019-08-19 2019-12-03 山东大学 一种有源天线trp快速测量方法
CN110531176B (zh) * 2019-08-19 2021-05-11 山东大学 一种有源天线trp快速测量方法
CN113259969A (zh) * 2021-05-07 2021-08-13 北京必创科技股份有限公司 无线通信与感知化设备辐射性能测试数据优化处理方法
CN113259969B (zh) * 2021-05-07 2022-06-17 北京必创科技股份有限公司 无线通信与感知化设备辐射性能测试数据优化处理方法
CN113810129A (zh) * 2021-09-15 2021-12-17 深圳市德普华电子测试技术有限公司 一种5g nr测试方法、装置、终端及存储介质

Similar Documents

Publication Publication Date Title
US12081461B2 (en) User equipment radio frequency and band capability for carrier aggregation measurement gap
US12219567B2 (en) Determination of number of physical uplink control channel repetitions for machine type communications
US10880020B2 (en) UE testing system for RF characteristics for the new radio standard
WO2018031119A1 (fr) Appareil de test pour la norme new radio
US11558886B2 (en) Non-contention based low latency scheduling request transmission
CN112997414B (zh) 用于部分波束对应用户设备的波束管理
KR102386519B1 (ko) Wlan을 통한 음성 긴급 호출을 위해 위치 정보를 제공하기 위한 장치 및 비 일시적 머신 판독가능 매체
US11152997B2 (en) Beam acquisition with receiving beamforming
WO2016033049A1 (fr) Partage de spectre basé sur un accès partagé sous licence
WO2018101915A1 (fr) Mesures de mobilité dans des systèmes 5g
WO2018064124A1 (fr) Interface de test pour la norme nouvelle radio
WO2017023354A1 (fr) Mesure de gestion de ressources radio et protocole de commande de ressources radio pour un accès partagé sous licence
HK1246995B (zh) 用户设备的装置和演进节点b的装置
HK1252875B (zh) 利用接收波束成形的波束采集
HK1249328B (en) Non-contention based low latency scheduling request transmission

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17733238

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17733238

Country of ref document: EP

Kind code of ref document: A1