Yamabi et al., 2001 - Google Patents
Investigation of the Optimum Growth Conditions of Wide-Bandgap Quaternary InAlGaN for UV-LEDsYamabi et al., 2001
- Document ID
- 13678814042998015063
- Author
- Yamabi T
- Kinoshita A
- Hirayama H
- Ainoya M
- Hirata A
- Araki T
- Nanishi Y
- Aoyagi Y
- Publication year
- Publication venue
- MRS Online Proceedings Library (OPL)
External Links
Snippet
We systematically investigated the optimum growth condition of wide-bandgap quaternary InAlGaN for ultraviolet (UV) light-emitting diodes (LEDs) grown on SiC by metal organic vapor phase epitaxy (MOVPE). We obtained intense UV emission in the wavelength of 315 …
- 238000009114 investigational therapy 0 title description 2
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
- H01L33/32—Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02455—Group 13/15 materials
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well, or supperlattice structures, e.g. single quantum well lasers (SQW lasers), multiple quantum well lasers (MQW lasers), graded index separate confinement hetrostructure lasers (GRINSCH lasers)
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Hirayama et al. | Marked enhancement of 320–360 nm ultraviolet emission in quaternary In x Al y Ga 1− x− y N with In-segregation effect | |
| KR101317469B1 (en) | Non-polar (Al,B,In,Ga)N Quantum Well and Heterostructure Materials and Devices | |
| TWI628809B (en) | Hetero-epitaxial strain management structure and ultraviolet light emitting device | |
| Hirayama et al. | Room-temperature intense 320 nm band ultraviolet emission from quaternary InAlGaN-based multiple-quantum wells | |
| Hirayama et al. | Efficient 230–280 nm emission from high-Al-content AlGaN-based multiquantum wells | |
| EP2270879B1 (en) | Nitride semiconductor light emitting element and manufacturing method thereof | |
| CN101373806B (en) | Zinc-blende nitride semiconductor free-standing substrate, method for fabricating same, and light-emitting device employing same | |
| JP3509260B2 (en) | Group 3-5 compound semiconductor and light emitting device | |
| US7488971B2 (en) | Nitride semiconductor; light-emitting device, light-emitting diode, laser device and lamp using the semiconductor; and production methods thereof | |
| US7675069B2 (en) | InAlGaN emitting light in ultraviolet short-wavelength region and process for preparing the same as well as ultraviolet light-emitting device using the same | |
| CN114420812B (en) | A deep ultraviolet semiconductor light emitting element | |
| US7462505B2 (en) | Growth process of a crystalline gallium nitride based compound and semiconductor device including gallium nitride based compound | |
| JP3605906B2 (en) | Semiconductor device having contact resistance reduction layer | |
| US7682709B1 (en) | Germanium doped n-type aluminum nitride epitaxial layers | |
| Yamabi et al. | Investigation of the Optimum Growth Conditions of Wide-Bandgap Quaternary InAlGaN for UV-LEDs | |
| JP2004087565A (en) | Method for manufacturing gallium nitride-based semiconductor light emitting device | |
| Hirayama et al. | 230 to 250 nm intense emission from AlN/AlGaN quantum wells | |
| Hirayama et al. | Drastic reduction of threading dislocation density of AlGaN on SiC wafer by using highly-Si-incorporated AlGaN superlattice | |
| JPH08213651A (en) | Semiconductor device having contact resistance reduction layer | |
| Hirayama et al. | Growth and optical properties of III-nitride semiconductors for deep UV (230-350 nm) light-emitting diodes (LEDs) and laser diodes (LDs) | |
| JP2006310886A (en) | Group 3-5 compound semiconductor light emitting device | |
| Beccard et al. | Al-Ga-In-Nitride heterostructures: MOVPE growth in production reactors and characterization | |
| KARPOV et al. | AS USIKOV¹, Yu. MELNIK ¹, AI PECHNIKOV', VA SOUKHOVEEV¹, OV KOVALENKOV¹, E. SHAPOVALOVA¹ | |
| SOUKHOVEEV et al. | HVPE-GROWN AlN-GaN BASED STRUCTURES FOR UV SPECTRAL REGION | |
| Mcintosh et al. | AlGaInN Quaternary Alloys by MOCVD |