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CN118348286A - Probe assembly for checking aging of display panel - Google Patents

Probe assembly for checking aging of display panel Download PDF

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Publication number
CN118348286A
CN118348286A CN202311424479.7A CN202311424479A CN118348286A CN 118348286 A CN118348286 A CN 118348286A CN 202311424479 A CN202311424479 A CN 202311424479A CN 118348286 A CN118348286 A CN 118348286A
Authority
CN
China
Prior art keywords
probe
block
shaft
display panel
coupling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202311424479.7A
Other languages
Chinese (zh)
Inventor
辛相烈
宋明熙
金珉洪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coat Co
Original Assignee
Coat Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coat Co filed Critical Coat Co
Publication of CN118348286A publication Critical patent/CN118348286A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • General Engineering & Computer Science (AREA)
  • Multimedia (AREA)

Abstract

The present invention relates to a probe assembly for checking for aging of a display panel. The probe assembly includes: the probe fixing block is connected with the probe assembly fixing block of the tray; a probe contact block attachable to and detachable from the probe fixing block; a coupling shaft for connecting the probe fixing block and the probe contact block; and a block lever applying a force to the coupling shaft to attach and detach the probe fixing block and the probe contact block.

Description

Probe assembly for checking aging of display panel
Technical Field
The present invention relates to a probe assembly for detecting aging of a display panel, and more particularly, to a probe assembly which can be relatively firmly fixed while a probe contact block of the probe assembly is coupled with a probe fixing block, and can easily attach and detach the probe fixing block and the probe contact block.
Background
Generally, an aging inspection is performed after manufacturing a display panel to ensure reliability. The burn-in test is to check whether the display panel is operating normally after the display panel contacts the probe and a voltage is applied for a certain time.
The probes required are different depending on the type of display panel, and there is a possibility that the probes may be damaged when used for a long period of time, and therefore, the probes must be frequently replaced, and a method of fixing the probes with a magnet, etc. have been proposed.
However, when the probe is fixed with the magnet, there are disadvantages in that the fixing force is low, if the magnetism of the magnet is increased to increase the fixing force, detachment/attachment becomes difficult, and the magnetism affects the burn-in test.
Prior art documents
Patent document
Korean patent laid-open publication No. 10-1795615
Disclosure of Invention
The invention aims to provide a probe assembly which is easy to attach and detach.
It is another object of the present invention to provide a probe assembly including a probe contact block that is securely connected to a probe securing block when attached.
The objects of the present invention are not limited to the above objects, and other objects and advantages of the present invention, which are not mentioned, can be understood by the following description, and will be more clearly understood by the embodiments of the present invention. Further, it is apparent that the objects and advantages of the present invention can be easily achieved by the means described in the claims and the combination thereof.
To solve the problems, a probe assembly for inspecting aging of a display panel according to some embodiments of the present invention includes: the probe fixing block is connected with the probe assembly fixing block of the tray; a probe contact block attachable to and detachable from the probe fixing block; a coupling shaft for connecting the probe fixing block and the probe contact block; and a block lever applying a force to the coupling shaft to attach and detach the probe fixing block and the probe contact block.
In some embodiments, the probe-securing block may include: the main fixing block is connected with the probe assembly fixing block; and an alignment block aligned with and coupled to the main fixing block.
In some embodiments, the probe contact block may include: the connecting block is connected with the connecting shaft; and a contact block connected with the coupling block and contacting with the display panel.
In some embodiments, the coupling shaft includes a shaft head and a shaft body, and the probe assembly may further include a shaft spring configured in a manner surrounding the shaft body.
In some embodiments, when the block lever is operated in a direction, the block lever may apply a force to the coupling shaft in a first direction to separate the probe-securing block and the probe-contacting block.
In some embodiments, when the block lever is operated in a direction opposite to the one direction, the shaft spring may apply a force to the coupling shaft in a second direction opposite to the first direction to connect the probe-fixing block and the probe-contact block.
In some embodiments, the shaft spring may be in a contracted state in a state in which the probe-fixing block and the probe-contact block are connected.
In some embodiments, the probe-bearing block includes a main-bearing block having a first through hole, the probe-bearing block includes a coupling block having a coupling hole and a coupling groove, and the coupling shaft may connect the probe-bearing block and the probe-bearing block using the first through hole, the coupling hole, and the coupling groove.
In some embodiments, the coupling shaft includes a shaft head and a shaft body, the first through hole may have a size smaller than a size of the shaft head and larger than a size of the shaft body, the coupling hole may have a size larger than a size of the shaft head, and the coupling groove may have a size smaller than a size of the shaft head.
In some embodiments, a probe bar for operating the connection between the probe contact block and the display panel may be further included.
The beneficial effects are that:
The probe assembly of the invention can easily attach and detach the probe contact block and the probe fixing block only by operating the block lever.
In addition, the probe assembly of the present invention can firmly connect the probe contact block to the probe-securing block using the elastic force of the shaft spring.
In addition to the above effects, specific effects of the present invention will be described below when specific contents for carrying out the invention are described.
Drawings
Fig. 1 is a diagram for explaining an burn-in tray of a burn-in inspection apparatus according to some embodiments of the present invention.
Fig. 2 is an enlarged view of portion a of fig. 1, illustrating a probe assembly according to some embodiments of the invention.
Fig. 3 is a cross-sectional view taken along line I-I' of fig. 2.
Fig. 4 is an exploded perspective view of a portion of a probe assembly according to some embodiments of the invention.
Fig. 5 and 6 are diagrams for explaining attachment and detachment processes of a probe contact block according to some embodiments of the present invention.
Fig. 7 and 8 are diagrams for explaining insertion/extraction of a display panel for burn-in inspection according to some embodiments of the present invention.
Detailed Description
The terms or words used in the present specification and claims should not be construed as being limited by general or dictionary meanings, but should be construed as meaning and concept conforming to the technical idea of the present invention based on the principle that the inventor can properly define the concept of terms or words in order to describe his own invention in an optimal way. The embodiments and the illustrated structures described in the present specification are only one embodiment of the present invention and do not represent all technical ideas of the present invention, and therefore, it should be understood that various equivalents and applicable examples can be substituted for those described above at the time of application of the present invention.
The terms first, second, A, B and the like used in the present specification and the scope of the claims may be used for explaining various constituent elements, but the constituent elements are not limited to the terms. The term may be used with the aim of distinguishing one component from another, for example, a first component may be referred to as a second component, and similarly, a second component may also be referred to as a first component, without departing from the scope of the claims of the present invention. The term 'and/or' includes a combination of a plurality of related items or any of a plurality of related items.
The terms used in the specification and claims are used for the description of specific embodiments only and are not intended to limit the application. Where not explicitly stated in the article, singular references include plural references. In the present application, the terms "comprises" and "comprising" should be interpreted as specifying the presence of the stated features, numbers, steps, actions, components, parts, or combinations thereof, as referred to in the specification, without excluding the presence or addition of more than one other feature, number, step, action, component, part, or combination thereof.
Unless defined otherwise, technical or scientific terms, or even all terms used herein, have the same meaning as commonly understood by one of ordinary skill in the art.
Terms having the same meaning as defined in a dictionary commonly used should be interpreted as having a meaning consistent with the meaning possessed by the article of the related art, and should not be interpreted as ideal or excessively formally defined in the case where it is not explicitly defined in the present application. In addition, each of the components, processes, procedures, methods, or the like included in each of the embodiments of the present application can be shared within a range where technical contradiction is not caused.
In this specification, the first direction, the second direction, and the third direction may be perpendicular to each other.
Fig. 1 is a diagram for explaining an aging pallet of an aging inspection apparatus according to some embodiments of the present invention.
Referring to fig. 1, the burn-in pallet 100 may include: a base 110, a probe assembly fixture 120, and a probe assembly 130.
The chassis 110 may be a plate for placing a display panel to be burn-in checked. In other words, the chassis 110 may be a plate extending in the first direction X and the second direction Y and having the display panel mounted thereon. The base 110 may be coupled to the probe assembly fixture 120. In other words, the base 110 may be connected with the probe assembly fixture 120.
The probe assembly fixture 120 may be coupled to the base 110. The probe assembly fixing part 120 may include a coupling part connected with the base 110, and a receiving part for receiving the probe assembly 130. The probe assembly fixture 120 may be coupled to the probe assembly 130. In other words, the probe assembly fixing part 120 may be connected with the probe assembly 130.
The probe assembly 130 may be coupled to the probe assembly fixture 120. The probe assembly 130 may contact the display panel mounted on the base 110 and provide electrical signals for burn-in inspection to the display panel. The probe assembly 130 may include a number of components, which will be described in detail later.
For a more detailed description of the probe assembly 130, reference is further made to fig. 2 and 3.
Fig. 2 is an enlarged view of portion a of fig. 1, illustrating a probe assembly according to some embodiments of the invention. Fig. 3 is a cross-sectional view taken along line I-I' of fig. 2.
Referring to fig. 2, the probe assembly 130 may include a main fixing block 131, an alignment block 132, a coupling block 133, an FPCB 134, a contact block 135, a block lever 136, a coupling shaft 137, a shaft spring 138, and a probe lever 139. In this specification, the main fixing block 131 and the alignment block 132 may be referred to as a probe fixing block, and the coupling block 133 and the contact block 135 may be referred to as a probe contact block.
The main fixing block 131 may be coupled to the probe assembly fixing part 120. The main fixing block 131 may be connected to the probe assembly fixing part 120 by an LM guide or the like, and may be moved up and down along the probe assembly fixing part 120 by the action of the probe rod 139, for example. As will be described in more detail later. The main fixing block 131 may have a length extending in the first direction X and the third direction ZShape.
The alignment block 132 may be coupled to the main fixing block 131. Specifically, the upper face of the alignment block 132 and the lower face of the main fixing block 131 may be connected to each other. For example, the alignment block 132 may be coupled and fixed to the main fixing block 131 by a screw. In addition, for example, the alignment block 132 may be aligned with the main fixing block 131 using an alignment pin (alignment pin) or the like. In other words, the probe-securing blocks may be coupled and secured to the probe assembly securing part 120. The alignment block 132 may have a plate shape extending in the first direction X and the second direction Y to correspond to the lower face of the main fixing block 131.
The coupling block 133 may be attached to and detached from the alignment block 132. When the coupling piece 133 is attached to the alignment piece 132, an upper face of the coupling piece 133 and a lower face of the alignment piece 132 may be connected to each other. In addition, when the coupling piece 133 is separated from the alignment piece 132, a gap may be generated between an upper face of the coupling piece 133 and a lower face of the alignment piece 132. According to some embodiments, the coupling block 133 may be attached and detached from the alignment block 132 by a coupling shaft 137 and a shaft spring 138. At this time, a shaft spring 138 may be included in the coupling shaft 137. In other words, the shaft spring 138 may be disposed around the peripheral portion of the shaft body 137a of the coupling shaft 137. More specifically, the shaft spring 138 may have a diameter greater than the shaft body 137a and smaller than the shaft head 137b. In addition, for example, the coupling block 133 may be aligned with the alignment block 132 by an alignment pin. The coupling block 133 may have a plate shape extending in the first direction X and the second direction Y to correspond to the lower face of the alignment block 132.
The FPCB 134 may apply an electrical signal to the display panel in contact with the probe assembly 130. For example, the FPCB 134 may apply an electrical signal for checking for aging to the display panel in contact with the POGO pin through a POGO pin (POGO type pin) connected thereto. The FPCB 134 may be disposed between the coupling block 133 and the contact block 135, but the embodiment is not limited thereto. For example, the FPCB 134 may be disposed at a position different from that described in the present specification by one of ordinary skill in the art without departing from the scope of the present invention, and means for applying other electrical signals other than the FPCB 134 may be utilized as needed.
The contact block 135 may be connected with the coupling block 133. The contact block 135 may be a block directly contacting the display panel to be burn-in checked. The contact block 135 may have a plate shape extending in the first direction X and the second direction Y to correspond to the lower face of the alignment block 132.
The block lever 136 organically moves with the coupling shaft 137 and the shaft spring 138, and a gap may be formed between the probe fixing block and the probe contact block to separate the probe contact block according to the movement. In addition, the block lever 136 organically acts with the coupling shaft 137 and the shaft spring 138, so that the probe contact block and the probe fixing block can be attached with the action. As will be described in more detail later.
The probe rod 139 can move the probe assembly 130 up and down according to the up and down motion. For example, the probe bar 139 may move the probe assembly upward to insert a display panel to be burn-in checked or to take out a display panel for which burn-in checking has been completed. In addition, for example, the probe bar 139 may move the probe assembly downward to be in contact with the display panel and the probe assembly to be inspected for burn-in. As will be described in more detail later. The connection relationship of the respective constituent elements is further described in detail with reference to fig. 4.
Fig. 4 is an exploded perspective view of a portion of a probe assembly according to some embodiments of the invention.
Referring to fig. 3 and 4, the main fixing block 131 may include a first through hole 131h, the alignment block 132 may include a second through hole 132h, and the coupling block 133 may include a coupling hole 133h and a coupling groove 133g. At this time, the first through hole 131h has a circular cavity (cavity), and the second through hole 132h extends in the second direction Y, and may have a form in which a side surface of the coupling piece 133 is exposed. In addition, the coupling hole 133h has a chamfered rectangular cavity (cavity), and the coupling groove 133g has a shape extending in the second direction Y. However, the shapes of the first through hole 131h, the second through hole 132h, the coupling hole 133h, and the coupling groove 133g are exemplary, and the embodiment is not limited thereto.
The coupling shaft 137 may be coupled to the coupling groove 133g through the first and second through holes 131h and 132 h. At this time, the first through hole 131h and the coupling groove 133g may have smaller sizes than the shaft head 137b of the coupling shaft 137. That is, since the size of the first through hole 131h is smaller than that of the stub shaft 137b, the coupling shaft 137 cannot pass completely through the first through hole 131h. In addition, since the coupling groove 133g is smaller in size than the shaft head 137b, the coupling shaft 137 cannot completely pass through the coupling groove 133g without passing through the coupling hole 133 h. In addition, the size of the second through hole 132h may be larger than that of the stub shaft 137b, but the embodiment is not limited thereto. In addition, when the probe-contacting block is attached to or detached from the probe-fixing block, the size of the coupling hole 133h may be larger than that of the shaft head 137b, and thus, the shaft head 137b may be easily inserted/removed.
According to some embodiments, when the probe-contact block is attached to the probe-fixing block, the shaft body 137a of the coupling shaft 137 is attached through the first through hole 131h, the second through hole 132h, and the coupling groove 133g, and thus, the sizes of the first through hole 131h, the second through hole 132h, and the coupling groove 133g may be greater than the size of the shaft body 137 b. To illustrate the attachment and detachment process of the probe-contact patch to the probe-immobilization patch, further reference is made to fig. 5 and 6.
Fig. 5 and 6 are diagrams for explaining attachment and detachment processes of a probe contact block according to some embodiments of the present invention.
Referring to fig. 5 and 6, when the block lever 136 is operated downward, the block lever 136 applies a force downward to the coupling shaft 137. At this time, the shaft spring 138 contracts, and the coupling shaft 137 moves downward. In this case, the coupling block 133 connected to the coupling shaft 137 moves downward, and accordingly, a gap may be formed between the probe-fixing block and the probe-contacting block.
At this time, when the coupling block 133 moves from the coupling groove 133g toward the coupling hole 133h, the shaft head 137b of the coupling shaft 137 may overlap the coupling hole 133 h. At this time, since the size of the coupling hole 133h is larger than the size of the shaft head 137b of the coupling shaft 137, the coupling shaft 137 and the coupling block 133 can be separated. In other words, the probe-contact patch can be separated from the probe-fixing patch when the probe-contact patch is moved along the coupling hole 133h from the coupling groove 133g of the coupling patch 133. In other words, after the block lever 136 is operated downward to form a gap between the probe-securing block and the probe-contacting block, the probe-securing block and the probe-contacting block can be separated while the probe-coupling block is moved in such a manner that the shaft head 137b of the coupling shaft 137 overlaps the coupling hole 133 h.
The process of attaching the probe contact block to the probe-securing block may be performed in reverse of the above. First, in a state where the block lever 136 is operated downward, the shaft head 137b is inserted into the coupling hole 133h of the probe contact block, and then the probe contact block is moved to insert the shaft body 137a into the coupling groove 133g, at which time the coupling shaft 137 is connected with the coupling block 133. In other words, after the shaft head 137b is first inserted into the coupling hole 133h, the probe contact block is moved so that the shaft body 137a overlaps the coupling groove 133g, and at this time, the probe contact block may be connected to the coupling shaft 137. (e.g., as in FIG. 5)
Then, when the block lever 136 is operated upward, the contracted shaft spring 138 is relaxed, and the elastic force of the shaft spring 138 applies a force upward to the coupling shaft 137. Finally, the coupling shaft 137 moves upward due to the elastic force of the shaft spring 138, and as the coupling shaft 137 moves, the coupling block 133 also moves upward to be attached to the alignment block 132. In other words, when the block lever 136 is operated upward, a force is applied upward to the coupling shaft 137 due to the elastic force of the shaft spring 138, and thus, as the probe contact block connected to the coupling shaft 137 moves upward, the probe fixing block and the probe contact block can be attached.
According to some embodiments, the shaft spring 138 may be in a contracted state even in a state where the probe-securing block and the probe-contacting block are attached. In other words, in a state where the probe fixing block and the probe contact block are attached, the shaft spring 138 applies a force to the coupling shaft 137 upward due to its elastic force. In other words, in a state where the probe-fixing block and the probe-contact block are attached, the shaft spring 138 continuously applies a force upward, and therefore, the probe-fixing block and the probe-contact block can be more firmly fixed.
According to some embodiments, a gap is created between the probe-securing block and the probe-contacting block simply by operating the block lever 136 downward, so that the probe-contacting block can be easily separated and replaced.
Fig. 7 and 8 are diagrams for explaining insertion/extraction of a display panel to be inspected for aging according to some embodiments of the present invention.
Referring to fig. 7 and 8, the probe assembly 130 may move upward when the probe rod 139 is operated downward. The probe rod 139 may move the probe assembly 130 upward using, for example, the lever principle. In addition, for example, when the probe rod 139 is downwardly operated, the main fixing block 131 may be upwardly moved along the LM guide connected to the probe assembly fixing part 120.
By operating the probe rod 139 downward, the display panel P may be moved under the probe assembly 130 when the distance between the probe assembly 130 and the base 110 is sufficiently separated. At this time, the display panel P may be aligned by glass included in the chassis 110, but a detailed description thereof will be omitted.
When the probe bar 139 is operated upward with the display panel P and the probe assembly 130 aligned to a desired position, the probe assembly 130 moves downward and contacts the display panel P. Then, the burn-in inspection may be performed by applying an electrical signal through the FPCB 134.
The above description is for the purpose of illustrating the present embodiment, and it is to be understood that various modifications and variations may be made by those skilled in the art to which the present invention pertains without changing the essential characteristics of the present embodiment. Accordingly, the present embodiment is for explaining the technical idea of the present embodiment, and is not limiting. The technical idea scope of the present embodiment is not limited to these embodiments. The scope of the present embodiment should be interpreted by the scope of the claims, and all technical ideas within the scope equivalent thereto are included in the scope of the claims of the present embodiment.

Claims (10)

1. A probe assembly for inspecting a display panel for aging, comprising:
the probe fixing block is connected with the probe assembly fixing block of the tray;
a probe contact block attachable to and detachable from the probe fixing block;
A coupling shaft for connecting the probe fixing block and the probe contact block; and
A block lever applying a force to the coupling shaft for attaching and detaching the probe-securing block and the probe-contacting block.
2. The probe assembly for checking for aging of a display panel according to claim 1, wherein the probe fixing block comprises:
the main fixing block is connected with the probe assembly fixing block; and
And the alignment block is aligned with and connected with the main fixing block.
3. The probe assembly for checking for aging of a display panel according to claim 2, wherein the probe contact block comprises:
The connecting block is connected with the connecting shaft; and
And the contact block is connected with the connecting block and is contacted with the display panel.
4. The probe assembly for inspecting an aging of a display panel according to claim 1, wherein the coupling shaft includes a shaft head and a shaft body,
The probe assembly also includes a shaft spring configured to surround the shaft body.
5. The probe assembly for inspecting an aging of a display panel according to claim 4, wherein when the bar is operated in a direction,
The block lever applies a force to the coupling shaft in a first direction to separate the probe-securing block and the probe-contacting block.
6. The probe assembly for checking for aging of a display panel according to claim 5, wherein, when the block lever is operated in a direction opposite to the direction,
The shaft spring applies a force to the coupling shaft in a second direction opposite the first direction to connect the probe-securing block and the probe-contacting block.
7. The probe assembly for checking for aging of a display panel according to claim 4, wherein the shaft spring is in a contracted state in a state in which the probe fixing block and the probe contact block are connected.
8. The probe assembly for inspecting a burn-in of a display panel of claim 1, wherein the probe fixing block comprises a main fixing block provided with a first through hole,
The probe contact block comprises a connecting block which is provided with a connecting hole and a connecting groove,
The coupling shaft connects the probe fixing block and the probe contact block by using the first through hole, the coupling hole and the coupling groove.
9. The probe assembly for inspecting an aging of a display panel according to claim 8, wherein the coupling shaft comprises a shaft head and a shaft body,
The first through hole has a size smaller than the size of the shaft head and larger than the size of the shaft body,
The size of the connecting hole is larger than that of the shaft head,
The size of the connecting groove is smaller than that of the shaft head.
10. The probe assembly for checking for aging of a display panel according to claim 1, further comprising a probe bar for operating connection between the probe contact block and the display panel.
CN202311424479.7A 2023-01-06 2023-10-30 Probe assembly for checking aging of display panel Pending CN118348286A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2023-0002033 2023-01-06
KR1020230002033A KR102542193B1 (en) 2023-01-06 2023-01-06 Neural processor and instruction fetch method thereof

Publications (1)

Publication Number Publication Date
CN118348286A true CN118348286A (en) 2024-07-16

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Application Number Title Priority Date Filing Date
CN202311424479.7A Pending CN118348286A (en) 2023-01-06 2023-10-30 Probe assembly for checking aging of display panel

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102854609B1 (en) * 2023-09-19 2025-09-03 (주) 루켄테크놀러지스 Apparatus for Testing Display Panel

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Publication number Priority date Publication date Assignee Title
JP2010015894A (en) * 2008-07-04 2010-01-21 Asuka Denki Seisakusho:Kk Inspection connector
KR101795615B1 (en) 2017-08-14 2017-11-09 주식회사 프로이천 Probe block for aging test of display panel
KR101961691B1 (en) * 2018-07-30 2019-03-26 주식회사 프로이천 Apparatus for testing display panel

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