CN119758023B

CN119758023B - ADC (analog to digital converter) irradiation detection method

Info

Publication number: CN119758023B
Application number: CN202411708504.9A
Authority: CN
Inventors: 莫日根; 薛朋超; 刘景怡
Original assignee: China Academy of Space Technology CAST
Current assignee: China Academy of Space Technology CAST
Priority date: 2024-11-27
Filing date: 2024-11-27
Publication date: 2025-10-03
Anticipated expiration: 2044-11-27
Also published as: CN119758023A

Abstract

The present invention discloses an ADC radiation detection method, which belongs to the field of chip detection. The method first constructs a radiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instruction into an excitation signal, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC. Secondly, a transient pulse test is performed based on the radiation detection circuit to detect whether a transient pulse occurs in the ADC to be tested under an irradiated environment. In addition, functional tests are performed in a non-radiation environment and a radiation environment based on the radiation detection circuit to detect whether the function of the ADC to be tested is normal. Through the application of the present invention, it is possible to accurately determine whether there is a problem with the ADC.

Description

ADC (analog to digital converter) irradiation detection method

Technical Field

The invention relates to an ADC irradiation detection method, and belongs to the field of chip detection.

Background

The analog-to-digital converter is an a/D converter, or ADC for short. Is a chip that converts analog signals to digital signals. The method is mainly used for data acquisition and can be applied to different environments such as temperature, humidity, vibration, irradiation and the like. Wherein the irradiation environment is mainly a special environment in the aerospace field. With the rapid development of aerospace industry, single particle irradiation resistant ADC devices are more and more widely applied to aerospace equipment. Therefore, the evaluation of the irradiation resistance of the ADC is particularly critical, but at present, the domestic irradiation detection result is not accurate enough, and the accurate evaluation of the irradiation resistance of the ADC is difficult.

Disclosure of Invention

The technical problem solved by the invention is to overcome the defects of the prior art, and provide an ADC irradiation detection method for realizing the technical effect of accurately judging whether the ADC has the problem or not.

The technical scheme of the invention is as follows:

an ADC irradiance detection method, comprising:

Constructing an irradiation detection circuit, wherein the irradiation detection circuit comprises a programmable gate array unit, a multi-path switching unit and a matrix switching unit, the programmable gate array unit analyzes a configuration instruction into an excitation signal, and the multi-path switching unit and the matrix switching unit synchronously input the excitation signal to an ADC to be detected and a reference ADC;

the irradiation detection circuit works in an irradiation environment, a non-transient pulse value of a reference ADC is used as a standard value, a programmable gate array unit receives voltage information of the ADC to be detected and the reference ADC, and when the difference value between the transient pulse value of the ADC to be detected and the standard value exceeds a set transient pulse threshold value and the duration exceeds a set pulse width threshold value, the ADC to be detected is judged to have transient pulses once;

The function test is carried out based on the irradiation detection circuit, wherein the irradiation detection circuit works in an irradiation-free environment, the programmable gate array unit records the working current of the ADC to be tested, and then the irradiation detection circuit works in an irradiation environment to carry out the following detection:

In the same period of irradiation, defining the digital quantity difference value acquired by sampling points of the ADC to be detected and the reference ADC to be lower than the set maximum error threshold of the sampling points as normal sampling points, otherwise, as abnormal sampling points, acquiring the total number Y of the sampling points and the number Y1 of the abnormal sampling points in the same period by a programmable gate array unit, and when Y1/Y is greater than the set signal abnormal rate threshold, determining that the function of the ADC to be detected is interrupted, otherwise, determining that the function of the ADC to be detected is normal;

And comparing the working current of the ADC to be tested in the irradiation environment with the working current of the ADC to be tested in the non-irradiation environment by the programmable gate array unit, and if the absolute value of the difference value of the working current and the working current is larger than the set maximum error of the working current, determining that the function of the ADC to be tested is abnormal, otherwise, determining that the function of the ADC to be tested is normal.

Further, the set transient pulse threshold, pulse width threshold, signal abnormality rate threshold, maximum error threshold of the acquisition point of the acquisition signal, working current threshold and maximum error of the working current are configured as a test excitation set, and the programmable gate array unit analyzes the test excitation set to ensure that the information received by the ADC to be tested and the information received by the reference ADC are completely consistent.

Further, the multiple ADCs to be tested are controlled by the multipath switching unit and the matrix switching unit to test, so that the testing sequence of the multiple ADCs to be tested is determined.

Further, the irradiation detection circuit further comprises a precise reference source unit for supplying power to the multiple ADCs to be detected, so that the reference of all the ADCs to be detected is consistent, and the reference source signal error among the ADCs to be detected is reduced.

Further, in the working process of the irradiation detection circuit under the irradiation environment, if the working current of the ADC to be detected is larger than the set working current threshold value and the duration exceeds the working current duration threshold value, the precise reference source unit cuts off the power of the ADC to be detected so as to stop the test.

Further, before the precise reference source unit executes the power-off operation, the precise reference source unit sends a power-off signal to the programmable gate array unit, and the programmable gate array unit acquires the current output waveform, working voltage and working current of the ADC to be tested and records the current output waveform, working voltage and working current to a database for storage.

Further, in the working process of the irradiation detection circuit under the irradiation environment, the n bits of the ADC to be detected are removed from the first 2 bits, 2~n bits are exclusive-or, the sampling number P in a single period is obtained, the total data quantity bit A is obtained according to the irradiation time T and the signal period T, and the turnover number B _n during irradiation is obtained, so that the performance condition of the ADC to be detected is accurately obtained.

Furthermore, if the programmable gate array unit detects that one of the ADCs to be tested is abnormal in function, the test excitation set corresponding to the ADC is used as the test excitation set of the ADC and any one of the ADCs to be tested at the same time, and if only the ADCs with abnormal functions appear in the past, the abnormal functions of the ADCs are confirmed, so that the checking accuracy is improved.

Compared with the prior art, the invention has the advantages that:

(1) According to the invention, an irradiation detection circuit is constructed, the programmable gate array unit analyzes the configuration instruction into the excitation signal, and the multi-channel switching unit and the matrix switching unit synchronously input the excitation signal to the ADC to be detected and the reference ADC so as to ensure the synchronization of the control time sequences of the ADC to be detected and the reference ADC and the synchronization of data return, thereby improving the detection accuracy.

(2) The invention can realize simultaneous detection of a plurality of ADCs to be detected, simultaneously supplies power to the ADCs to be detected through the precise reference source unit, ensures the reference of the ADCs to be detected to be consistent, and reduces the reference source signal error between the ADCs to be detected.

(3) The invention integrates the threshold value of each detection parameter into a test excitation set, and analyzes the test excitation set through the programmable gate array unit to ensure that the information received by the ADC to be tested and the reference ADC are completely consistent.

Drawings

Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to designate like parts throughout the figures. In the drawings:

fig. 1 is a flowchart of an ADC irradiation detection method according to an embodiment of the invention.

Detailed Description

Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

The invention provides an ADC irradiation detection method, as shown in figure 1, which specifically comprises the following steps:

S1, constructing an irradiation detection circuit, wherein the irradiation detection circuit comprises a programmable gate array unit, a multi-path switching unit and a matrix switching unit, the programmable gate array unit analyzes a configuration instruction into an excitation signal, and the multi-path switching unit and the matrix switching unit synchronously input the excitation signal to an ADC to be detected and a reference ADC so as to ensure that two paths of excitation signals of the ADC to be detected and the reference ADC are completely consistent, and control timing sequence synchronization and data feedback synchronization.

S2, presetting a transient pulse threshold value and a pulse width threshold value, taking a non-transient pulse value of the reference ADC as a standard value, and judging that a transient pulse occurs when the difference value between the transient pulse value of the ADC to be detected and the standard value exceeds the transient pulse threshold value and the duration exceeds the pulse width threshold value. The reference ADC and the ADC to be tested are devices of the same type.

S3, presetting a signal abnormal rate threshold X and a maximum error threshold of an acquisition point of an acquisition signal, defining a normal sampling point when the digital quantity difference value of the ADC to be detected and the reference ADC in the same period in the irradiation period is lower than the maximum error threshold of the acquisition point, otherwise, acquiring the total number Y of the sampling points in the same period and the number Y1 of the abnormal sampling points, wherein when Y1/Y is more than X, the function of the ADC to be detected is interrupted, and when Y1/Y is less than or equal to X, the ADC to be detected is normal.

S4, presetting a working current threshold value IDD1 and a working current maximum error M, recording an ADC working current IDD 0to be measured before irradiation and an ADC working current IDD2 to be measured after irradiation, wherein when the I IDD2-IDD 0I > M, the ADC to be measured is abnormal in function, when the I IDD2-IDD 0I is less than or equal to M, and the ADC to be measured is in a normal function state.

And S5, sending the results of the steps S2-S4 to the programmable gate array unit. Through the judgment mode of S2-S4, whether the ADC to be tested is abnormal or not can be accurately obtained, and if the ADC to be tested is abnormal, abnormal conditions can be accurately obtained.

The n bits of the ADC to be measured are removed from the first 2 bits during irradiation, 2~n bits are exclusive-or, the sampling number P in a single period is obtained, the irradiation time is T, the signal period is T, the total data amount bit is A, A=A= (T/T) x P, the turnover number B _n during irradiation is obtained, and the turnover rate is=B _n/A. And the performance condition of the ADC to be tested is accurately obtained by obtaining the turnover rate of the ADC to be tested.

In the steps, a transient pulse threshold is selected to be 10% of an actual measurement signal output by an ADC to be tested, a pulse width threshold is selected to be us-level and is flexibly defined according to test requirements, and a signal abnormality rate threshold is defined as the number of abnormal periods in sinusoidal signals with n periods. The maximum error threshold of the sampling point of the acquisition signal is defined as the quantity of sampling data of n periods at a certain rate as a basic value, and the error threshold is the allowable error proportion when the quantity of the sampling data is abnormal in the irradiation process. The operating current threshold is defined as the base current and the threshold is defined as 1.5 times the normal current.

In one possible implementation manner, the detection circuit may be connected to a plurality of ADCs to be tested, and the multiplexing unit and the matrix switch unit control the plurality of ADCs to be tested to determine a test sequence of the plurality of ADCs to be tested, and facilitate switching of the test of the plurality of ADCs to be tested.

In one possible implementation, the detection circuit further includes a precision reference source unit for powering the plurality of ADCs to be detected to ensure that the reference references of the plurality of ADCs to be detected are consistent and to reduce reference source signal errors between the plurality of ADCs to be detected. Meanwhile, a working current duration threshold is preset, and when the working current of the ADC to be tested in the irradiation period is larger than IDD1 and the duration exceeds the working current duration threshold, the precision reference source unit stops the power-off of the ADC to be tested for testing.

Further, before the precise reference source unit is powered off, the programmable gate array unit acquires the output waveform, the working voltage and the working current of the ADC to be tested at the moment and records the output waveform, the working voltage and the working current into a database for storage, so that data loss caused by sudden power off is avoided.

In one possible implementation, the required test configuration is preset as a test excitation set, so that data synchronous transmission is facilitated, for example, a transient pulse threshold value, a pulse width threshold value, a signal abnormality rate threshold value X, a maximum error threshold value of a collection point of a collection signal, an operating current threshold IDD1 and a maximum error M of an operating current are configured as the test excitation set, and a programmable gate array unit analyzes the test excitation set to ensure that information received by an ADC to be tested and a reference ADC are completely consistent.

Further, the test excitation set comprises a first test excitation set, a second test excitation set and a third test excitation set, wherein the first test excitation set is input into the first test excitation set by the first ADC to be tested and the first test excitation set are input into the reference ADC at the first time when the first ADC to be tested executes the first test task to obtain a first test result, the second test excitation set is input into the second test excitation set by the second ADC to be tested and the reference ADC at the second time when the first ADC to be tested executes the first test task to obtain a second test result, and the third test excitation set is input into the third test excitation set by the third ADC to be tested and the reference ADC at the third time when the first ADC to be tested executes the first test task to obtain a third test result. By fast switching on the clock, synchronous detection of three types of test tasks and synchronous collection of test results under the same test task are realized, so that a more efficient test process is realized.

When the first test result is abnormal, the second ADC to be tested and the reference ADC are simultaneously input into the first test excitation set, and if the test result is normal, the first ADC to be tested is judged to have a problem. By means of comparison, the result is more accurate.

The above examples are only preferred embodiments of the present invention, and ordinary changes and substitutions made by those skilled in the art within the scope of the present invention are intended to be included in the scope of the present invention.

Claims

1. A method for detecting ADC radiation, comprising:

Build an irradiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instructions into excitation signals, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signals to the ADC under test and the reference ADC;

Transient pulse test based on radiation detection circuit: The radiation detection circuit operates in an irradiated environment, using the transient pulse-free value of the reference ADC as the standard value. The programmable gate array unit receives voltage information from the ADC under test and the reference ADC. When the difference between the transient pulse value of the ADC under test and the standard value exceeds the set transient pulse threshold and the duration exceeds the set pulse width threshold, it is determined that a transient pulse has occurred in the ADC under test.

Functional testing based on the radiation detection circuit: The radiation detection circuit operates in a non-irradiated environment, and the programmable gate array unit records the operating current of the ADC under test. Then, the radiation detection circuit operates in an irradiated environment and performs the following tests:

During the same cycle of irradiation, if the difference in digital values collected by the sampling points of the ADC under test and the reference ADC is lower than the set maximum error threshold of the sampling point, it is defined as a normal sampling point; otherwise, it is an abnormal sampling point; the programmable gate array unit obtains the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1/Y is greater than the set signal abnormality rate threshold, it is determined that the ADC under test has a functional interruption; otherwise, it is determined that the ADC under test is functioning normally;

The programmable gate array unit compares the operating current of the ADC under test in the irradiated environment with the operating current of the ADC under test in the non-irradiated environment. If the absolute value of the difference between the two is greater than the set maximum error of the operating current, it is determined that the ADC under test is abnormal; otherwise, it is determined that the ADC under test is normal.

When the radiation detection circuit is working in the radiation environment, the ADC to be tested Remove the first 2 digits of the number, and then Bitwise XOR, get the number of samples in a single cycle , according to the irradiation time , signal period , get the total data bit A, get the flip number during irradiation , in order to accurately obtain the performance status of the ADC to be tested.

2. The ADC radiation detection method according to claim 1 is characterized in that the set transient pulse threshold, pulse width threshold, signal anomaly rate threshold, maximum error threshold of the acquisition point of the acquisition signal, operating current threshold and maximum error of the operating current are configured as a test stimulus set, and the programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC under test and the reference ADC is completely consistent.

3. The ADC radiation detection method according to claim 1, wherein there are multiple ADCs to be tested, and the multi-way switching unit and the matrix switch unit control the multiple ADCs to be tested to determine the test order of the multiple ADCs to be tested.

4. The ADC radiation detection method according to claim 3, characterized in that the radiation detection circuit further includes a precision reference source unit to supply power to the plurality of ADCs to be tested, thereby ensuring that the reference references of all ADCs to be tested are consistent and reducing the reference source signal error between the ADCs to be tested.

5. The ADC radiation detection method according to claim 4 is characterized in that, during the operation of the radiation detection circuit in the radiation environment, if the operating current of the ADC to be tested is greater than a set operating current threshold and the duration exceeds the operating current duration threshold, the precision reference source unit cuts off power to the ADC to stop the test.

6. The ADC radiation detection method according to claim 5 is characterized in that the precision reference source unit sends a power-off signal to the programmable gate array unit before performing the power-off operation, and the programmable gate array unit obtains the current output waveform, operating voltage and operating current of the ADC to be tested and records them in a database for storage.

7. The ADC radiation detection method according to claim 2 is characterized in that if there are multiple ADCs to be tested, the same number of test stimulus sets are set, and each test stimulus set corresponds to one ADC to be tested, thereby improving the data detection rate of the programmable gate array unit; in addition, if the programmable gate array unit detects that one of the ADCs to be tested is malfunctioning, the test stimulus set corresponding to the ADC is used as the test stimulus set for the ADC and any other ADC to be tested. If only the ADC that was previously malfunctioning becomes malfunctioning again, the ADC is confirmed to be malfunctioning, thereby improving the accuracy of the inspection.