CN110456185A - Electron key test macro and test method - Google Patents
Electron key test macro and test method Download PDFInfo
- Publication number
- CN110456185A CN110456185A CN201910657065.6A CN201910657065A CN110456185A CN 110456185 A CN110456185 A CN 110456185A CN 201910657065 A CN201910657065 A CN 201910657065A CN 110456185 A CN110456185 A CN 110456185A
- Authority
- CN
- China
- Prior art keywords
- test
- electron key
- plugboard
- module
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention discloses a kind of electron key test macro and test methods, including test terminal and test fixture；The test terminal includes test module and mode selection module, for carrying out functional test to electron key；The test fixture includes plugboard, control panel and cable, and plugboard is connect by cable with control panel, tests multiple electron keys for inserting.The present invention connects computer and electron key by the test fixture being made of plugboard and control panel, and test pattern is selected to carry out testing and control to multiple electron keys by test software, the operating ambient temperature range of electron key test macro can be at -45 DEG C~+70 DEG C, storage environment temperature can be at -50 DEG C~+75 DEG C, it can be operated normally in high and low temperature environment, it is applied widely, the production efficiency and the quality of production of product are substantially increased, the generation of problem electron key is avoided.
Description
Technical field
The present invention relates to Electronic Testing field more particularly to electron key test macros and test method.
Background technique
Currently, traditional mechanical key is replaced smart electronics key, electronics key with the fast development of science and technology
Spoon is a kind of digital signal by encryption as unblocking key, realizes the device of unlatching automobile, safety cabinet and various door and windows etc..
Importance based on electron key needs to survey electron key in the last one link of electron key technique production system
Examination, and existing test device can only test Single Electron key, speed is slow, low efficiency.Therefore a kind of electronics is needed
Key test macro can test multiple electron keys, guarantee product quality, improve industrial production efficiency.
Summary of the invention
It is an object of the present invention in view of the above-mentioned problems, propose electron key test macro and test method.
Electron key test macro, including test terminal and test fixture；
In the application, the test terminal includes test module, mode selection module and display module, for electron key into
Row functional test simultaneously shows error message；
The test fixture includes plugboard, control panel and cable, and plugboard is connect by cable with control panel, is surveyed for inserting
Try multiple electron keys.
The plugboard includes bus circuit and plugboard power control circuit；Bus circuit includes usb bus test electricity
Road, iic bus test circuit, carry out USB test to multiple electron keys and EEPROM is tested；Plugboard power control circuit pair
Plugboard is powered control.
The control panel includes single-chip microcontroller, 232 serial ports and USB interface；232 serial ports are sent by connection computer to single-chip microcontroller
Order, with control bus circuit and plugboard power control circuit；USB interface is inserted by HUB connection computer and plugboard
Multiple electron keys.
In the application, the test fixture individually connects 12V power supply.
The test module includes EEPROM test module, USB test module and testing current module；
The EEPROM test module carries out EEPROM functional test to electron key；
The USB test module carries out USB functional test to electron key；
The testing current module is used to record operating current when electron key read-write.
In the application, the mode selection module includes automatic test module and manual test module；
The automatic test module can test all inserting electron keys；
The manual test module tests some electron key by the way that bus is arranged.
The display module is used to show the electronic key information of test errors, including USB error listing, EEPROM mistake
List and operating current.
In the application, the electron key test macro further includes a kind of test method, comprising the following steps:
S1: system initialization and parameter configuration；
S2: test fixture power on self test cuts off the power if there is no problem for fixture and enters S3；
S3: inserting electron key to test fixture and the test that is powered；
S4: test terminal operating test software；
S5: judge that selected number electron key USB or EEPROM are tested whether normally；
S6: enter S4 if test is normal and continue to execute test；If test error, shows and record test errors information, enter
S4 continues to execute test.
Beneficial effects of the present invention: the present invention connects computer and electricity by the test fixture being made of plugboard and control panel
Sub- key, and select test pattern to carry out testing and control to multiple electron keys by test software, substantially increase product
Production efficiency and the quality of production avoid the generation of problem electron key.
Detailed description of the invention
Fig. 1 is test fixture principle block diagram.
Fig. 2 is plugboard structural schematic diagram.
Fig. 3 is the testing process schematic diagram of test macro.
Specific embodiment
For a clearer understanding of the technical characteristics, objects and effects of the present invention, this hair of Detailed description of the invention is now compareed
Bright specific embodiment
Electron key test macro is mainly made of two parts, and a part is computer test terminal, another part is to survey
Fixture hardware system is tried, two parts are connected by interface, and test function is completed in interworking；
In the present embodiment, the test terminal includes test module, mode selection module and display module, for electron key
It carries out functional test and shows error message；
The test fixture includes plugboard, control panel and cable, and plugboard is connect by cable with control panel, is surveyed for inserting
Try multiple electron keys.
The plugboard includes bus circuit and plugboard power control circuit；Bus circuit includes usb bus test electricity
Road, iic bus test circuit, carry out USB test to multiple electron keys and EEPROM is tested；Plugboard power control circuit pair
Plugboard is powered control.
It is as shown in Figure 1 the control panel schematic illustration of test fixture, control panel is embedded control system, the control
Plate includes single-chip microcontroller, 232 serial ports and USB interface；232 serial ports are sent to single-chip microcontroller by connection computer and are ordered, with control bus
Circuit and plugboard power control circuit；USB interface uses USB2.0 high-speed interface, and highest USB test speed is greater than 20M/s,
Pass through multiple electron keys of HUB connection computer and plugboard inserting.
The plugboard number of plies is set as 3 layers (L1, L2, L3), the electron key socket plane distribution of each layer of plugboard
As shown in Fig. 2, each layer is 6 × 8 arrays, the Wiring port of plugboard is from left to right, from top to bottom interface index, each layer
48 electron keys can be filled, the second layer is numbered from 49, and so on can be achieved to 3 layers of plugboard totally 144 interfaces into
Row number.
In the present embodiment, test fixture individually connects 12V power supply, and computer, computer expert are connected with serial ports by USB interface
Test software is crossed to test the electron key being plugged in test macro；Test macro can directly be put with tested electron key
It is run in high-low temperature chamber, for testing whether electron key is able to satisfy for demand, and can be in technical grade temperature range
Normal use.
In the present embodiment, test software is used to communicate with test fixture, and setting related command controls the movement of hardware, display
Test result, wherein test module includes EEPROM test module, USB test module and testing current module；EEPROM test
Module carries out EEPROM functional test to electron key；USB test module carries out USB functional test to electron key；Electric current is surveyed
Electric current when die trial block test record electron key reading writing working.
The mode selection module includes automatic test module and manual test module；Automatic test module can be inserted to all
Dress electron key is tested；Manual test module tests some electron key by the way that bus is arranged.
The display module is used to show the electronic key information of test errors, including USB error listing, EEPROM mistake
List and operating current.
In the application, the electron key test macro further includes a kind of test method, comprising the following steps:
S1: system initialization and parameter configuration；
S2: test fixture power on self test cuts off the power if there is no problem for fixture and enters S3；
S3: inserting electron key to test fixture and the test that is powered；
S4: test terminal operating test software；
S5: judge that selected number electron key USB or EEPROM are tested whether normally；
S6: enter S4 if test is normal and continue to execute test；If test error, shows and record test errors information, enter
S4 continues to execute test.
The present invention connects computer and electron key by the test fixture being made of plugboard and control panel, and passes through test
Software selects test pattern to carry out testing and control, the operating ambient temperature range of electron key test macro to multiple electron keys
Can be at -45 DEG C~+70 DEG C, storage environment temperature can be operated normally at -50 DEG C~+75 DEG C in high and low temperature environment, be applicable in
Range is wide, substantially increases the production efficiency and the quality of production of product, avoids the generation of problem electron key.
The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.
Claims (7)
1. electron key test macro, which is characterized in that including test terminal and test fixture；
The test terminal includes test module and mode selection module, for carrying out functional test to electron key；
The test fixture includes plugboard, control panel and cable, and plugboard is connect by cable with control panel, is surveyed for inserting
Try multiple electron keys.
2. electron key test macro according to claim 1, which is characterized in that the plugboard include bus circuit and
Plugboard power control circuit；Bus circuit includes usb bus test circuit, iic bus test circuit, to multiple electron keys
Carry out USB test and EEPROM test；Plugboard power control circuit is powered control to plugboard.
3. electron key test macro according to claims 1 and 2, which is characterized in that the control panel include single-chip microcontroller,
232 serial ports and USB interface；232 serial ports are sent to single-chip microcontroller by connection computer and are ordered, with control bus circuit and plugboard electricity
Source control circuit；Multiple electron keys that USB interface passes through HUB connection computer and plugboard inserting.
4. electron key test macro according to claim 1, which is characterized in that the test fixture individually connects 12V confession
Power supply.
5. electron key test macro according to claim 1, which is characterized in that the test module includes that EEPROM is surveyed
Die trial block, USB test module and testing current module；
The EEPROM test module carries out EEPROM functional test to electron key；
The USB test module carries out USB functional test to electron key；
The testing current module is used to record operating current when electron key read-write.
6. electron key test macro according to claim 1, which is characterized in that the mode selection module includes automatic
Test module and manual test module；
The automatic test module can test all inserting electron keys；
The manual test module tests some electron key by the way that bus is arranged.
7. electron key test macro described in -6 any one further includes a kind of test method, feature according to claim 1
It is, comprising the following steps:
S1: system initialization and parameter configuration；
S2: test fixture power on self test cuts off the power if there is no problem for fixture and enters S3；
S3: inserting electron key to test fixture and the test that is powered；
S4: test terminal operating test software；
S5: judge that selected number electron key USB or EEPROM are tested whether normally；
S6: enter S4 if test is normal and continue to execute test；If test error, shows and record test errors information, enter
S4 continues to execute test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910657065.6A CN110456185A (en) | 2019-07-19 | 2019-07-19 | Electron key test macro and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910657065.6A CN110456185A (en) | 2019-07-19 | 2019-07-19 | Electron key test macro and test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110456185A true CN110456185A (en) | 2019-11-15 |
Family
ID=68481589
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910657065.6A Pending CN110456185A (en) | 2019-07-19 | 2019-07-19 | Electron key test macro and test method |
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Application publication date: 20191115 |