[go: up one dir, main page]

JPS5987309A - Measuring device of inclination of face - Google Patents

Measuring device of inclination of face

Info

Publication number
JPS5987309A
JPS5987309A JP57198617A JP19861782A JPS5987309A JP S5987309 A JPS5987309 A JP S5987309A JP 57198617 A JP57198617 A JP 57198617A JP 19861782 A JP19861782 A JP 19861782A JP S5987309 A JPS5987309 A JP S5987309A
Authority
JP
Japan
Prior art keywords
inclination
measured
light
measuring device
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57198617A
Other languages
Japanese (ja)
Inventor
Hiroyuki Iizuka
裕之 飯塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57198617A priority Critical patent/JPS5987309A/en
Publication of JPS5987309A publication Critical patent/JPS5987309A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To measure the inclination of a face independently of the refractive index, by providing a light beam source, biaxial actuator which makes the advance direction of the light beam orthogonal to each other, and a photodetector which detects the movement of the reflected light from an object to be measured. CONSTITUTION:A face inclination measuring device is provided with a laser light source 21, polarizing beam splitter 22, 1/4 wavelength plate 23, pivoting mirrors 24 and 25, 4-divided photodetector 27, etc. In this case, the deviation of the beam in the X direction and the Z direction appear as outputs A1-A3 and A2-A4. These two outputs are used to change the inclination of pivoting mirrors 24 and 25, and the control is so performed that the beam is placed in the center of the 4-divided photodetector 27. These inclinations are detected by the driving current of pivoting mirrors to detect the inclination of the face of a disc 26 to be measured, and thus, measurement is performed independently of the refractive index of the reflective face.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は鏡面を有する平面の面の傾きを測定する而傾き
測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an inclination measuring device for measuring the inclination of a plane having a mirror surface.

従来例の構成とその問題点 従来の面傾き測定装置を光学式ディスクの面の傾き測定
を例にとり説明する。第1図は従来の面傾き測定装置で
ある。@1図において、(1)はディスク、(2)はデ
ィスクを固定するターンテーブル、(3)はターンテー
ブル駆動用モータ、(4)はHe −Reレーザ、(5
)はスクリーンである。この面傾き測定装置による測定
方法は次の通りである。面の傾きが零の鏡面ディスクに
よって反射された光がスクリーン上に像を結ぶ点を原点
とする。次に被測定ディスク(1)をターンテーブル(
2)にセットし、反射光のスクリーン(5) !:、で
の座標とディスク(1)からスクリーン(5)までの距
離を測定する。座標軸をディスク(1)の径方向と円周
方向にとっておけば、測定点における面の傾きを径方向
、円周方向それぞれ独立に測定できる。
Configuration of a conventional example and its problems A conventional surface inclination measuring device will be explained by taking as an example the measurement of the surface inclination of an optical disk. FIG. 1 shows a conventional surface inclination measuring device. @1 In Figure 1, (1) is a disk, (2) is a turntable that fixes the disk, (3) is a motor for driving the turntable, (4) is a He-Re laser, and (5) is a turntable that fixes the disk.
) is the screen. The measurement method using this surface inclination measuring device is as follows. The origin is the point where the light reflected by the mirrored disk, whose surface has a zero inclination, forms an image on the screen. Next, place the disk to be measured (1) on the turntable (
Set it to 2) and the reflected light screen (5)! : , and measure the distance from the disk (1) to the screen (5). By setting the coordinate axes in the radial direction and the circumferential direction of the disk (1), the inclination of the surface at the measurement point can be measured independently in the radial direction and the circumferential direction.

この測定方法は入射光がディスク(1)に垂直に入射し
ないために以下に示す問題点があった。第2図にディス
クでのレーザの反射の様子を示す。図において、Oυは
ディスクの鏡面(光ビームの反射面)、(2)は鏡面(
11)をおおっている屈折率nの透明な物質、(至)は
レーザ光である。ディスクの表面に入射角θ1で入射し
たレーザ光は屈折率nの物質内を通り鏡面で反射される
。この鏡面αυへの入射角θ2はθ1とnを用いて 、−11 θ2= 8In  (−sinθ1) と表わされる。したがって、屈折率nがわからないと入
射角θ2の測定が不可能であるという問題があった。
This measurement method has the following problems because the incident light does not enter the disk (1) perpendicularly. Figure 2 shows how the laser is reflected on the disk. In the figure, Oυ is the mirror surface of the disk (the surface that reflects the light beam), and (2) is the mirror surface (
11) A transparent substance with a refractive index n covering the laser beam. Laser light incident on the surface of the disk at an incident angle θ1 passes through a substance with a refractive index n and is reflected by a mirror surface. The angle of incidence θ2 on this mirror surface αυ is expressed as −11 θ2=8In (−sin θ1) using θ1 and n. Therefore, there was a problem in that it was impossible to measure the incident angle θ2 unless the refractive index n was known.

発明の目的 本発明は」二記のような従来例の間趙を解決し、屈折率
に関係なく面傾きの測定ができる装置を提供することを
目的とするものである。
OBJECTS OF THE INVENTION It is an object of the present invention to solve the problems of the prior art as described in section 2 and to provide an apparatus capable of measuring surface inclination regardless of the refractive index.

発明の構成 を記目的を達成するために、本発明は、光ビーム光源と
、光ビームの進行方向を互いに直交する2111アクチ
ユエーターと、被測定物からの反射光の移動が検戴でき
る光検出器とを具備し、被測定物への入射光と反射光が
常に同じ経路を通る町うに(被測定物に入射光が常に垂
直にあたるように)アクチュエーターを制御し、この時
の制御量で被測定物の面の傾きを測定するように構成し
たものである。
DESCRIPTION OF THE CONFIGURATION OF THE INVENTION In order to achieve the object, the present invention includes a light beam source, a 2111 actuator whose traveling directions of the light beams are orthogonal to each other, and a light source that can detect the movement of reflected light from an object to be measured. The actuator is controlled so that the incident light and the reflected light on the object to be measured always pass through the same path (so that the incident light always hits the object to be measured perpendicularly), and the control amount at this time is It is configured to measure the inclination of the surface of the object to be measured.

実施例 以下、本発明を、2軸アクチユエーターにビボッテイン
グミラーを用い、入射光と反射光の分離に1/4波長板
と偏光ビームスプリッタを用い、光検出器に4分割フ第
1・テイテクタを用いて、光学式ディスクの面傾きの測
定を例に説明する。
Examples In the following, the present invention will be explained using a pivoting mirror as a two-axis actuator, a quarter-wave plate and a polarizing beam splitter to separate incident light and reflected light, and a 4-split filter as a photodetector.・The measurement of the surface inclination of an optical disc using a Tetector will be explained as an example.

第3図は本発明の一実施例の面傾き測定装飯の構成図で
ある。叱8図にわいて、 c!l)はレーザ光源、C−
Oは偏光ビームスプリッタ、φ)は1/4波長板、(・
φはディスク(ハ)の径方向にレーザ光の向きを変える
ことができるビボツテイングミラー、Cつはディスク(
ト)の円周方向にレーザ光の向きを変えろことができる
ピボツテイングミラー、(ロ)は4分書1jフオトティ
テクタ、(ハ)はターンテーブル駆動用モータ、四はタ
ーンテーブルである。レーザ光源シl)から発せられた
レーザ光は偏光ビームスプリッタ(財)でその進行方向
が1方向から−Y方向に変化する。こノ時レーザ光は直
線偏光となっている。この光は1/4波長板(ハ)に誹
って円偏光になり、ピボツテイングミラー(ハ)(1)
で反射されてディスクに)に達する。
FIG. 3 is a configuration diagram of a surface inclination measuring device according to an embodiment of the present invention. Regarding the scolding figure 8, c! l) is a laser light source, C-
O is a polarizing beam splitter, φ) is a quarter wavelength plate, (・
φ is a pivoting mirror that can change the direction of the laser beam in the radial direction of the disk (C), and C is a pivoting mirror that can change the direction of the laser beam in the radial direction of the disk (C).
(g) is a pivoting mirror that can change the direction of the laser beam in the circumferential direction; (b) is a four-part photodetector; (c) is a turntable driving motor; and (4) is a turntable. The laser light emitted from the laser light source (1) changes its traveling direction from one direction to the -Y direction by a polarizing beam splitter. At this time, the laser beam is linearly polarized. This light is turned into circularly polarized light by the quarter-wave plate (c), and then the pivoting mirror (c) (1)
reflected by the light and reaches the disk).

ディスク(イ)からの反射光は再たび2枚のピポツテイ
ングミラー(ホ)(財)で反射されて、174波長板(
ハ)を通り、円偏光から再たび直線偏光になるが、入射
光とは偏光方向が90°l!ll!J転しているため偏
光ビームスプリッタ(ハ)ではそのY方向の進行方向は
変化せず、4分割フォトディテクタに)に達する。4分
割フォトディテクタに)は面の傾きが零のディスク(ホ
)をターンテーブル(イ)にセットした時に反射光がそ
の中心に像を結ぶ位置にセットされている。この時、デ
ィスク@にはレーザ光が垂直に入射している。
The reflected light from the disk (A) is reflected again by two pivoting mirrors (E) (Incorporated) and passes through a 174 wavelength plate (
C), the circularly polarized light becomes linearly polarized light again, but the polarization direction is 90°l from the incident light! ll! Because of the J-turn, the traveling direction of the beam in the Y direction does not change at the polarizing beam splitter (c), and it reaches the four-split photodetector (c). The 4-split photodetector) is set in such a position that when a disk (e) whose surface has a zero inclination is set on the turntable (a), the reflected light will focus on the center of the disk (e). At this time, the laser beam is perpendicularly incident on the disk @.

4分割フォトディテクタ(ロ)は第4図のように設置さ
れていて、ビボツテイングξラー(ハ)を動かした場合
A l −A 8の出力に変化が現われ、A 2−A 
4の出力には変化がなく、またビボツテイングミラ−(
ハ)を動かした場合、A 2−A 4の出力に変化が現
われ、Al−AJ3の出力には変化がない。
The 4-split photodetector (b) is installed as shown in Figure 4, and when the pivoting ξler (c) is moved, a change appears in the output of A l - A 8, and A 2 - A
There is no change in the output of 4, and the pivoting mirror (
When c) is moved, a change appears in the output of A2-A4, but there is no change in the output of Al-AJ3.

基準面からの傾きが測定点において、径方向でθr、円
周方向でθ(であるディスク(ホ)からの反射光は、4
分割フォトディテクタ@tでそのビーム位置が、ディス
ク(ホ)から4分割フォトディテクタ(財)までの光路
長を!とすれば、2方向でlθt、x方向でlθrだけ
ずれる。工方向、2方向のビームのずれはそれぞれAl
−A3 、A2−A4の出力となって現われる。この2
つの出力を用いて、ビボツティングミラ=(ハ)(イ)
の傾きを変えてビームが4分割フォトディテクタ(ロ)
の中心にくるように制御をかけろ。このときiイス′7
ψ会にはレーザ光は垂直に入射している。■おまび(ハ
)のビボッティングミラーの傾きはそれぞれθr、θt
に等しく、この傾きを例えばピホソティングミラーの駆
動電流で検出すれば、被測定ディスクけpのi?Mの傾
きを知ることができる。
The reflected light from the disk (e) whose inclination from the reference plane is θr in the radial direction and θ( in the circumferential direction at the measuring point) is 4.
The beam position of the split photodetector @t is the optical path length from the disk (E) to the 4-split photodetector (F)! Then, there is a shift of lθt in the two directions and lθr in the x direction. The deviation of the beam in the construction direction and the two directions is Al
-A3 and appears as the output of A2-A4. This 2
Using two outputs, pivoting mirror = (c) (b)
By changing the inclination of the photodetector, the beam is divided into four parts (b)
Control it so that it is centered. At this time, i-chair'7
The laser beam is perpendicularly incident on the ψ-kai. ■The tilts of the bivoting mirror of Omabi (c) are θr and θt, respectively.
If this inclination is detected, for example, using the drive current of a piphosotting mirror, then i? of the disk to be measured is equal to p? You can know the slope of M.

また、@4図に示した4分割フォトディテクタ(ロ)の
設置方法において、これを90.’ lid転し設置す
れば、ディスク(ホ)の傾きは(AI+A2 ) −(
A−3十A4)と(A1+、A4)−(A8+A2 )
の出力となって表オ)れ、この方法でも実施可能である
Also, in the installation method of the 4-split photodetector (b) shown in Figure @4, this is 90. ' If the lid is rotated and installed, the inclination of the disk (E) will be (AI + A2) - (
A-30A4) and (A1+, A4)-(A8+A2)
This method can also be implemented.

また、ピボッティングミラ−(ハ)またに)のどちらか
一方を固定ミラーにした場合でも、光ビームはディスク
に直角に入射し、一方向の而の傾きのみが測定できる。
Furthermore, even if either one of the pivoting mirrors (c) or (c) is a fixed mirror, the light beam is incident on the disk at right angles, and the inclination in only one direction can be measured.

この時光検出器は2分割フォトディテクタでも代用でき
る。
At this time, the photodetector can be replaced by a two-split photodetector.

また、ピボッティングミラーの代りに、ハーフミラ−ま
たはプリズムを用いてもよい。
Furthermore, a half mirror or a prism may be used instead of the pivoting mirror.

発明の効果 以を本発明の而傾き測定装置によれば次のような効果が
得られろ。すなわち、被測定物に常に垂nに光ビームが
入射するため、鈴面(反射面)が屈折率を持った物質で
おおわれていても、その屈折率に関係なく測定が可能で
ある。したがって測定値に含まれる屈折率の誤差をI’
ll!りのぞくことができ、また屈折率が不明な物質で
おおわれている被測定物の鏡面への入射角も測定が可能
である。
Effects of the Invention According to the inclination measuring device of the present invention, the following effects can be obtained. That is, since the light beam always enters the object to be measured vertically, even if the bell surface (reflecting surface) is covered with a material having a refractive index, measurement is possible regardless of the refractive index. Therefore, the error in the refractive index included in the measured value is I'
ll! It is also possible to measure the angle of incidence on the mirror surface of an object covered with a material whose refractive index is unknown.

このJうに本発明の実用的価値は大きいものである。The practical value of this invention is great.

【図面の簡単な説明】[Brief explanation of the drawing]

娼1図は従来の面傾き測定装置の一例を示す概略、構成
図、第2図は従来の面傾き測定装置における鏡面が屈折
率nを持った物質でおおわれた被測定物への光ビームの
入射と反射の様子を示す説明図、帖8図は本発明の一実
施例を示す面傾き測定装置の構成図、第4因は本発明に
おける4分割フォトディテクタの設置例の配置図でゐろ
。 c!1)・・・レーザ光源、(2)・・・偏光ビームス
プリッタ、仏や・・・1/4波長板、h m−・・ビボ
ッオイングミラー、に)・・・ディスク、@6I)・・
・4分割フオトディテ′クタ第1図 第2図 t 2 ビ2 第°図 χ 第4図
Figure 1 shows a schematic diagram and configuration diagram of an example of a conventional surface inclination measuring device, and Figure 2 shows an example of a conventional surface inclination measuring device in which a light beam is directed onto an object whose mirror surface is covered with a material having a refractive index n. An explanatory diagram showing the state of incidence and reflection, Figure 8 is a configuration diagram of a surface inclination measuring device showing one embodiment of the present invention, and the fourth factor is a layout diagram of an example of installing a 4-split photodetector in the present invention. c! 1)... Laser light source, (2)... Polarizing beam splitter, Buddha... 1/4 wavelength plate, h m... Vibration mirror, (2)... Disk, @6I)・・・
・Four-division photo detector Fig. 1 Fig. 2 t 2 B 2 Fig. χ Fig. 4

Claims (1)

【特許請求の範囲】 1、光ビーム光綜と、光ビームの進行方向を互いに直交
する2M方向に変化できる2輔アクチユエーターと、被
測定物からの反射光の移動が検出できる光検出器とを具
備し、前記被測定物・\の入射光と反射光が常に同じ経
路を通るようにha記アクチュエーターを制御し、この
時の制御量で前記被測定物の面の傾きを測定するように
構成した而傾き測定装置。 2.2軸アクチユエーターに、芝う−またはプリズムを
用いた特許請求の範囲第1項記載の面傾き測定装置。 8、被測定物への入射光と被測定物からの反射光の分離
を偏光ビームスプリッタと1/4波長板で行なう特許請
求の範囲第1項記載の血傾き測定装置。 4、光検出器に4分割フォトディテクタを用いた特許請
求の範囲陥1項記載の面傾き測定装−05,2軸アクチ
ユエーターのどちらか一方を固定し、光ビームが常に被
測定物に直角に入射するように前記アクチュエーターを
制御するようにした特許請求の範囲第1項記載のml傾
き測定装置
[Claims] 1. A light beam optical helix, an actuator that can change the traveling direction of the light beam in 2M directions orthogonal to each other, and a photodetector that can detect the movement of reflected light from the object to be measured. and controlling the actuator described above so that the incident light and the reflected light of the object to be measured always pass through the same path, and measuring the inclination of the surface of the object to be measured using the control amount at this time. An inclination measuring device configured as follows. 2. The surface inclination measuring device according to claim 1, wherein the two-axis actuator uses a prism or a prism. 8. The blood slope measuring device according to claim 1, wherein the incident light on the object to be measured and the light reflected from the object to be measured are separated by a polarizing beam splitter and a quarter wavelength plate. 4. Surface inclination measurement device according to claim 1 using a 4-split photodetector as a photodetector - 05. Either one of the two-axis actuators is fixed so that the light beam is always perpendicular to the object to be measured. The ml inclination measuring device according to claim 1, wherein the actuator is controlled so that the ml inclination is incident on the
JP57198617A 1982-11-11 1982-11-11 Measuring device of inclination of face Pending JPS5987309A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57198617A JPS5987309A (en) 1982-11-11 1982-11-11 Measuring device of inclination of face

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57198617A JPS5987309A (en) 1982-11-11 1982-11-11 Measuring device of inclination of face

Publications (1)

Publication Number Publication Date
JPS5987309A true JPS5987309A (en) 1984-05-19

Family

ID=16394166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57198617A Pending JPS5987309A (en) 1982-11-11 1982-11-11 Measuring device of inclination of face

Country Status (1)

Country Link
JP (1) JPS5987309A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63169510A (en) * 1987-01-08 1988-07-13 Fujitsu Ltd Micro angular displacement detection device
WO2003025499A1 (en) * 2001-09-17 2003-03-27 Sharp Kabushiki Kaisha Tilt sensing apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63169510A (en) * 1987-01-08 1988-07-13 Fujitsu Ltd Micro angular displacement detection device
WO2003025499A1 (en) * 2001-09-17 2003-03-27 Sharp Kabushiki Kaisha Tilt sensing apparatus
US7019280B2 (en) 2001-09-17 2006-03-28 Sharp Kabushiki Kaisha Apparatus for detecting the tilt of a light reflector relative to the optical axis of input light

Similar Documents

Publication Publication Date Title
US5469259A (en) Inspection interferometer with scanning autofocus, and phase angle control features
JP2913984B2 (en) Tilt angle measuring device
JPS5885103A (en) Surface profile interferometer
JPS618744A (en) Focus error detector of optical disc device
EP0208276B1 (en) Optical measuring device
JP2001507117A (en) Laser beam splitter producing multiple parallel beams
US5309423A (en) Magneto-optical reproducing device with optical system having two reflective elements and providing phase difference cancellation
JPH0554902B2 (en)
JPH07120213A (en) Tracking laser interferometer
JP2505794B2 (en) Centering error detector
JPS5987309A (en) Measuring device of inclination of face
JP2808713B2 (en) Optical micro displacement measuring device
JPS5897008A (en) Positioning method for semiconductor laser and collimator lens
JP2654366B2 (en) Micro polarimeter and micro polarimeter system
JP2625209B2 (en) Optical micro displacement measuring device
JPH07218220A (en) High-speed tracking laser interferometer
JP3053135B2 (en) High precision coordinate measuring instrument
JPS635208A (en) Apparatus for measuring surface shape
JP3517506B2 (en) Optical displacement measuring device
KR0135859B1 (en) Optical head
KR950000894B1 (en) Focus error retesting method for optical disk driver
JPH07332922A (en) High-speed tracking laser interferometer
JPH0652165B2 (en) Interferometer
JPH0678894B2 (en) Surface shape measuring instrument
JPH07113610A (en) Optical axis direction displacement detector for object surface