WO1999037919A1 - Dispositif et systeme de piegeage - Google Patents
Dispositif et systeme de piegeage Download PDFInfo
- Publication number
- WO1999037919A1 WO1999037919A1 PCT/JP1999/000204 JP9900204W WO9937919A1 WO 1999037919 A1 WO1999037919 A1 WO 1999037919A1 JP 9900204 W JP9900204 W JP 9900204W WO 9937919 A1 WO9937919 A1 WO 9937919A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- trap
- chamber
- flow path
- exhaust
- vacuum pump
- Prior art date
Links
- 238000011144 upstream manufacturing Methods 0.000 claims abstract description 9
- 230000008929 regeneration Effects 0.000 claims description 38
- 238000011069 regeneration method Methods 0.000 claims description 38
- 238000004519 manufacturing process Methods 0.000 claims description 18
- 239000004065 semiconductor Substances 0.000 claims description 16
- 239000000498 cooling water Substances 0.000 claims description 11
- 238000001816 cooling Methods 0.000 claims description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 9
- 230000008961 swelling Effects 0.000 claims description 2
- 238000001947 vapour-phase growth Methods 0.000 claims description 2
- 230000001965 increasing effect Effects 0.000 abstract description 8
- 239000007789 gas Substances 0.000 description 41
- 238000004140 cleaning Methods 0.000 description 32
- 239000007788 liquid Substances 0.000 description 30
- 238000000034 method Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 9
- 238000010926 purge Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 7
- 239000000047 product Substances 0.000 description 7
- 239000007787 solid Substances 0.000 description 7
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 238000005192 partition Methods 0.000 description 5
- 238000005406 washing Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000002244 precipitate Substances 0.000 description 4
- 230000001172 regenerating effect Effects 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 239000006227 byproduct Substances 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000002826 coolant Substances 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000003507 refrigerant Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000005587 bubbling Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 239000013505 freshwater Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B37/00—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00
- F04B37/10—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use
- F04B37/14—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use to obtain high vacuum
- F04B37/16—Means for nullifying unswept space
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D45/00—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces
- B01D45/04—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces by utilising inertia
- B01D45/08—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces by utilising inertia by impingement against baffle separators
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B37/00—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00
- F04B37/06—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for evacuating by thermal means
- F04B37/08—Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for evacuating by thermal means by condensing or freezing, e.g. cryogenic pumps
Definitions
- the A l C 1 3 is the suction side of the vacuum pump is not deposited because partial pressure is low, pressurized exhaust partial pressure in the course of the gas is increased and solidified precipitated in vacuo Bonn flop, attached to the pump interior wall As a result, the vacuum pump may fail.
- reaction by-products such as (NH 4) 2 Si F 6 and NH 4 C 1 that result from CVD equipment that deposits SiN:
- a second object of the present invention is to provide a trap system capable of regenerating traps while suppressing equipment costs and running costs.
- the water flows while changing its direction to the outside at the upstream flow path portion and toward the inside at the downstream flow path portion, so that the chance of contact with the wall of the trap flow channel is increased, and the trap efficiency is improved. Since the flow path is not excessively complex, the production and maintenance costs do not increase, and the conductance does not decrease excessively, so that the effect on the exhaust system is small.
- the cooling water whose temperature has risen after passing through a predetermined portion of the semiconductor manufacturing equipment is supplied to the regeneration chamber, and the trap section is efficiently cleaned with the hot water.
- stable and continuous operation of the trap device becomes possible.
- no new heat source or cleaning solution is used, resource and energy savings can be improved.
- the invention according to claim 7 is the trap system according to claim 6, wherein the semiconductor manufacturing apparatus is a vapor phase growth apparatus.
- FIG. 7 is a diagram showing the piping of the cleaning solution and the purge gas of the trap device.
- FIG. 8 is a diagram showing another embodiment of the trap unit.
- FIG. 10 is a diagram showing still another embodiment of the trap section.
- FIGS. 1 to 7 show one embodiment of the trap system according to the present invention, in which a CVD reaction chamber (vacuum chamber) 10 constituting a part of a semiconductor manufacturing apparatus is controlled by a vacuum pump 12.
- An exhaust pipe 14 for exhausting air is provided, and a trap device T is provided upstream of the vacuum pump 12.
- a regenerating pipe 16 for circulating a cleaning liquid is disposed adjacent to the exhaust pipe 14, and is disposed in a cylindrical casing 22 formed over the trap pipe 30.
- a regeneration chamber 32 adjacent thereto.
- a bellows 34 is provided between the air cylinder 26 and the casing 22 to maintain airtightness therebetween. Further, an O-ring 35 is disposed at a position where the partition wall 27 and the partition plate 28 are in contact with each other, so that the airtightness between the trap chamber 30 and the regeneration chamber 32 is maintained.
- the partition plate 28 is made of a material having a high heat insulating property so as to prevent heat transfer between the trap chamber 30 and the regeneration chamber 32. ing.
- the cleaning liquid discharge port 62 is connected to a valve 72 and a cleaning liquid discharge path 76 in which a pump or an agitator 74 for urging the discharge of the cleaning liquid is sequentially arranged.
- each gas purge port 64 is connected via a valve 80 to a purge gas flow path 82 communicating with, for example, an N 2 gas source.
- cooling water (cleaning liquid) heated to about 40 ° C. flows into the regeneration chamber from the lower port 60 and is filled, so that the trap 18 is immersed.
- the product adhering to the trap section 18 is dissolved in the cleaning liquid, separated from the trap section 18 by the force of the flow of the cleaning liquid, and floats in the cleaning liquid.
- the washing liquid in which the products are dissolved or suspended is sequentially discharged from the washing liquid discharge port 62. Since the cleaning liquid continuously flows into the regeneration chamber 32, the regeneration chamber 32 is always filled with the new cleaning liquid.
- Table 1 shows a comparison of the trapping efficiencies by performing an experiment for trapping NH 4 C 1 using a conventional trapping device and a trapping device having a baffle according to the embodiment of the present invention.
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Compressors, Vaccum Pumps And Other Relevant Systems (AREA)
- Drying Of Semiconductors (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/485,616 US6368371B1 (en) | 1998-01-22 | 1999-01-21 | Trap device and trap system |
EP99901126A EP1050681A4 (en) | 1998-01-22 | 1999-01-21 | TRAP AND CASE SYSTEM |
KR1019997011854A KR100552643B1 (ko) | 1998-01-22 | 1999-01-21 | 트랩장치 및 트랩시스템 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10/25041 | 1998-01-22 | ||
JP02504198A JP3874524B2 (ja) | 1998-01-22 | 1998-01-22 | トラップ装置及びトラップ方法 |
JP05019498A JP3708322B2 (ja) | 1998-02-16 | 1998-02-16 | トラップシステム |
JP10/50194 | 1998-02-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1999037919A1 true WO1999037919A1 (fr) | 1999-07-29 |
Family
ID=26362635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1999/000204 WO1999037919A1 (fr) | 1998-01-22 | 1999-01-21 | Dispositif et systeme de piegeage |
Country Status (5)
Country | Link |
---|---|
US (1) | US6368371B1 (ja) |
EP (2) | EP1914423A2 (ja) |
KR (1) | KR100552643B1 (ja) |
TW (1) | TW500878B (ja) |
WO (1) | WO1999037919A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1099778A3 (en) * | 1999-11-10 | 2001-09-19 | Ebara Corporation | Trap apparatus |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6554879B1 (en) | 1999-08-03 | 2003-04-29 | Ebara Corporation | Trap apparatus |
JP4046474B2 (ja) | 2000-11-13 | 2008-02-13 | 株式会社荏原製作所 | 連続処理型トラップ装置及び該トラップ装置の運転方法 |
JP4166005B2 (ja) * | 2001-08-10 | 2008-10-15 | 株式会社荏原製作所 | トラップ装置および方法 |
EP2246573B1 (de) * | 2009-04-28 | 2013-02-13 | Hsr Ag | Schutzvorrichtung für Hochvakuumpumpen |
KR200465339Y1 (ko) * | 2011-03-25 | 2013-02-13 | (주)플로우시스템 | 반도체 제조용 챔버 자동제어 시스템 |
JP6150716B2 (ja) * | 2013-12-02 | 2017-06-21 | 住友重機械工業株式会社 | コールドトラップ |
US10119529B2 (en) * | 2015-03-17 | 2018-11-06 | Varian Semiconductor Equipment Associates, Inc. | Cryopump arrangement for improved pump speed |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS606087A (ja) * | 1983-06-23 | 1985-01-12 | Arubatsuku Kuraio Kk | クライオポンプにおけるバツフル装置 |
JPS63299036A (ja) * | 1987-05-29 | 1988-12-06 | Tokyo Electron Ltd | 真空装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH449838A (de) * | 1967-03-14 | 1968-01-15 | Balzers Patent Beteilig Ag | Verfahren zum wahlweisen Betrieb eines Treibmittelfängers für Vakuumtreibmittelpumpen und Vorrichtung zur Durchführung des Verfahrens |
JPS58101723A (ja) * | 1981-12-14 | 1983-06-17 | Hitachi Plant Eng & Constr Co Ltd | オイルミスト捕集装置 |
JPS58106186A (ja) | 1981-12-18 | 1983-06-24 | Hitachi Ltd | トラツプ装置 |
JPS6071002A (ja) | 1983-09-27 | 1985-04-22 | Toshiba Corp | 真空用コ−ルドトラップ |
JPH01266802A (ja) | 1988-04-19 | 1989-10-24 | Seiko Epson Corp | 反応生成物溜付コールドトラップ |
GB2267139B (en) * | 1992-05-14 | 1995-10-25 | Spirax Sarco Ltd | Condensate trap |
US5520002A (en) * | 1995-02-01 | 1996-05-28 | Sony Corporation | High speed pump for a processing vacuum chamber |
US5537833A (en) * | 1995-05-02 | 1996-07-23 | Helix Technology Corporation | Shielded cryogenic trap |
JPH10125607A (ja) | 1996-10-22 | 1998-05-15 | Fujitsu Ltd | 排気システム |
-
1999
- 1999-01-21 EP EP08002135A patent/EP1914423A2/en not_active Withdrawn
- 1999-01-21 US US09/485,616 patent/US6368371B1/en not_active Expired - Fee Related
- 1999-01-21 WO PCT/JP1999/000204 patent/WO1999037919A1/ja active IP Right Grant
- 1999-01-21 KR KR1019997011854A patent/KR100552643B1/ko not_active Expired - Fee Related
- 1999-01-21 EP EP99901126A patent/EP1050681A4/en not_active Withdrawn
- 1999-01-22 TW TW088100937A patent/TW500878B/zh not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS606087A (ja) * | 1983-06-23 | 1985-01-12 | Arubatsuku Kuraio Kk | クライオポンプにおけるバツフル装置 |
JPS63299036A (ja) * | 1987-05-29 | 1988-12-06 | Tokyo Electron Ltd | 真空装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP1050681A4 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1099778A3 (en) * | 1999-11-10 | 2001-09-19 | Ebara Corporation | Trap apparatus |
US6464466B1 (en) | 1999-11-10 | 2002-10-15 | Ebara Corporation | Trap apparatus |
Also Published As
Publication number | Publication date |
---|---|
US6368371B1 (en) | 2002-04-09 |
EP1914423A2 (en) | 2008-04-23 |
KR100552643B1 (ko) | 2006-02-20 |
TW500878B (en) | 2002-09-01 |
EP1050681A1 (en) | 2000-11-08 |
EP1050681A4 (en) | 2006-10-11 |
KR20010013834A (ko) | 2001-02-26 |
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